High voltage probes

Industry

CPC
G01R1/06777

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Parent Industries

GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00

Current Industry

G01R1/06777High voltage probes

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Probe card for testing power devices under high temperature and hig...
- Patent number 12,158,481
- Issue date Dec 3, 2024
- MAXONE SEMICONDUCTOR (SUZHOU) CO., LTD.
- Liangyu Zhao
- G01 - MEASURING TESTING
Information Patent Grant
Coaxial contact having an open-curve shape
- Patent number 11,855,376
- Issue date Dec 26, 2023
- Teradyne, Inc.
- Roger A. Sinsheimer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Voltage sensing mechanism
- Patent number 11,655,792
- Issue date May 23, 2023
- Trillium Worldwide, Inc.
- Ai Wei Zhou
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus for providing a test signal from a device under test (DUT...
- Patent number 11,573,249
- Issue date Feb 7, 2023
- Keysight Technologies, Inc.
- Ryan Scott
- G02 - OPTICS
Information Patent Grant
High voltage assembly and detector
- Patent number 11,536,752
- Issue date Dec 27, 2022
- NEUSOFT MEDICAL SYSTEMS CO., LTD.
- Shuangxue Li
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Voltage and current alert system for aerial device
- Patent number 11,447,380
- Issue date Sep 20, 2022
- Altec Industries, Inc.
- Jesse Thompson
- G01 - MEASURING TESTING
Information Patent Grant
Probe systems and methods including electric contact detection
- Patent number 11,181,550
- Issue date Nov 23, 2021
- FormFactor, lnc.
- Sia Choon Beng
- G01 - MEASURING TESTING
Information Patent Grant
Electrical test probe and testing system using the same
- Patent number 11,119,119
- Issue date Sep 14, 2021
- Telefonaktiebolaget LM Ericsson (publ)
- Jun Huang
- G01 - MEASURING TESTING
Information Patent Grant
Transducer for high-voltage measuring technology
- Patent number 10,837,984
- Issue date Nov 17, 2020
- Knick Elektronische Messgeräte GmbH & Co. KG
- Jens-Hendrik Schiffer
- G01 - MEASURING TESTING
Information Patent Grant
Probe card and contact inspection device
- Patent number 10,775,411
- Issue date Sep 15, 2020
- KABUSHIKI KAISHA NIHON MICRONICS
- Tetsuya Yoshioka
- G01 - MEASURING TESTING
Information Patent Grant
Shrouded test probe
- Patent number 10,705,119
- Issue date Jul 7, 2020
- Fluke Corporation
- Christopher D. Corrigan
- G01 - MEASURING TESTING
Information Patent Grant
System and method for stripline electrodes for thin-film characteri...
- Patent number 10,529,674
- Issue date Jan 7, 2020
- Northwestern University
- Matthew Grayson
- G01 - MEASURING TESTING
Information Patent Grant
Failure estimation apparatus and failure estimation method
- Patent number 10,365,320
- Issue date Jul 30, 2019
- Renesas Electronics Corporation
- Yuji Takehara
- G01 - MEASURING TESTING
Information Patent Grant
System and method for detecting a contact between an aerial device...
- Patent number 10,338,107
- Issue date Jul 2, 2019
- Altec Industries, Inc.
- Aaron Beck
- G01 - MEASURING TESTING
Information Patent Grant
Probe systems and methods including electric contact detection
- Patent number 10,330,703
- Issue date Jun 25, 2019
- FormFactor Beaverton, Inc.
- Sia Choon Beng
- G01 - MEASURING TESTING
Information Patent Grant
Probe card for high voltage testing
- Patent number 10,168,359
- Issue date Jan 1, 2019
- MPI CORPORATION
- Chin-Yi Tsai
- G01 - MEASURING TESTING
Information Patent Grant
Method of implementation of peak hold in a phasing voltmeter
- Patent number 9,804,204
- Issue date Oct 31, 2017
- Honeywell International Inc.
- Anil Nagpal
- G01 - MEASURING TESTING
Information Patent Grant
System and method for monitoring a power line
- Patent number 9,746,498
- Issue date Aug 29, 2017
- Cleaveland/Price Inc.
- Hershel Roberson
- G01 - MEASURING TESTING
Information Patent Grant
System comprising a probe and a measuring device
- Patent number 9,709,610
- Issue date Jul 18, 2017
- Rohde & Schwarz GmbH & Co. KG
- Markus Freidhof
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor evaluation apparatus
- Patent number 9,678,143
- Issue date Jun 13, 2017
- Mitsubishi Electric Corporation
- Akira Okada
- G01 - MEASURING TESTING
Information Patent Grant
Measurement device
- Patent number 9,562,929
- Issue date Feb 7, 2017
- Mitsubishi Electric Corporation
- Takaya Noguchi
- G01 - MEASURING TESTING
Information Patent Grant
Current application device and manufacturing method of semiconducto...
- Patent number 9,541,577
- Issue date Jan 10, 2017
- Honda Motor Co., Ltd.
- Satoshi Hasegawa
- G01 - MEASURING TESTING
Information Patent Grant
Prober
- Patent number 9,519,009
- Issue date Dec 13, 2016
- Tokyo Seimitsu Co., Ltd.
- Konosuke Murakami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Probe card for power device
- Patent number 9,322,844
- Issue date Apr 26, 2016
- Tokyo Electron Limited
- Eiichi Shinohara
- G01 - MEASURING TESTING
Information Patent Grant
Connector / cable assembly
- Patent number 9,297,830
- Issue date Mar 29, 2016
- Xcerra Corporation
- Richard McCarthy
- G01 - MEASURING TESTING
Information Patent Grant
System and method for testing an electronic device
- Patent number 9,213,048
- Issue date Dec 15, 2015
- Texas Instruments Incorporated
- Robert Matthew Mertens
- G01 - MEASURING TESTING
Information Patent Grant
Indirect non-contact high voltage measurement on electrical power line
- Patent number 9,170,280
- Issue date Oct 27, 2015
- Honeywell International Inc.
- Vasu Mogaveera
- G01 - MEASURING TESTING
Information Patent Grant
Electrostatic shielding technique on high voltage resistor
- Patent number 9,164,128
- Issue date Oct 20, 2015
- Honeywell International Inc.
- Vasu Mogaveera
- G01 - MEASURING TESTING
Information Patent Grant
High voltage interrogator plug with external grounding
- Patent number 9,146,255
- Issue date Sep 29, 2015
- BAE Systems Land & Armaments, L.P.
- Randall J. Appleton
- G01 - MEASURING TESTING
Information Patent Grant
Probe assembly for inspecting power semiconductor devices and inspe...
- Patent number 9,146,256
- Issue date Sep 29, 2015
- KABUSHIKI KAISHA NIHON MICRONICS
- Katsuo Yasuta
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
TEST DEVICE
- Publication number 20240069067
- Publication date Feb 29, 2024
- QUANTA COMPUTER INC.
- Wei-Chih HUNG
- G01 - MEASURING TESTING
Information Patent Application
A PROBE CARD FOR TESTING POWER DEVICES UNDER HIGH TEMPERATURE AND H...
- Publication number 20230258690
- Publication date Aug 17, 2023
- MAXONE SEMICONDUCTOR CO., LTD.
- Liangyu ZHAO
- G01 - MEASURING TESTING
Information Patent Application
COAXIAL CONTACT
- Publication number 20220311166
- Publication date Sep 29, 2022
- Teradyne, Inc.
- Roger A. Sinsheimer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
HIGH VOLTAGE ASSEMBLY AND DETECTOR
- Publication number 20210223294
- Publication date Jul 22, 2021
- NEUSOFT MEDICAL SYSTEMS CO., LTD.
- Shuangxue LI
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
APPARATUS FOR PROVIDING A TEST SIGNAL FROM A DEVICE UNDER TEST (DUT...
- Publication number 20210190830
- Publication date Jun 24, 2021
- KEYSIGHT TECHNOLOGIES, INC.
- Ryan Scott
- G02 - OPTICS
Information Patent Application
Electrical Test Probe and Testing System using the Same
- Publication number 20200300891
- Publication date Sep 24, 2020
- Jun Huang
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR AN IMPROVED VOLTAGE DETECTOR
- Publication number 20200292593
- Publication date Sep 17, 2020
- Myron Jones
- G01 - MEASURING TESTING
Information Patent Application
PROBE SYSTEMS AND METHODS INCLUDING ELECTRIC CONTACT DETECTION
- Publication number 20190277885
- Publication date Sep 12, 2019
- FormFactor Beaverton, Inc.
- Sia Choon Beng
- G01 - MEASURING TESTING
Information Patent Application
SHROUDED TEST PROBE
- Publication number 20190257857
- Publication date Aug 22, 2019
- FLUKE CORPORATION
- Christopher D. Corrigan
- G01 - MEASURING TESTING
Information Patent Application
Transducer for High-Voltage Measuring Technology
- Publication number 20190250192
- Publication date Aug 15, 2019
- Knick Elektronische Messgeräte GmbH & Co. KG
- Jens-Hendrik Schiffer
- G01 - MEASURING TESTING
Information Patent Application
PROBE SYSTEMS AND METHODS INCLUDING ELECTRIC CONTACT DETECTION
- Publication number 20180284155
- Publication date Oct 4, 2018
- Cascade Microtech, Inc.
- Sia Choon Beng
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR STRIPLINE ELECTRODES FOR THIN-FILM CHARACTERI...
- Publication number 20180151515
- Publication date May 31, 2018
- Northwestern University
- Matthew Grayson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRICAL PROBE AND JIG FOR THE SAME
- Publication number 20170370965
- Publication date Dec 28, 2017
- CHROMA ATE INC.
- Hsu-Chang HSU
- G01 - MEASURING TESTING
Information Patent Application
PROBE CARD
- Publication number 20170299629
- Publication date Oct 19, 2017
- MPI Corporation
- Chin-Yi TSAI
- G01 - MEASURING TESTING
Information Patent Application
System comprising a probe and a measuring device
- Publication number 20150247885
- Publication date Sep 3, 2015
- ROHDE & SCHWARZ GMBH & CO. KG
- Markus Freidhof
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR ON-WAFER DYNAMIC TESTING OF ELECTRONIC DEVICES
- Publication number 20150241472
- Publication date Aug 27, 2015
- Cascade Microtech, Inc.
- Kazuki Negishi
- G01 - MEASURING TESTING
Information Patent Application
CIRCUIT BOARD TESTING SYSTEM
- Publication number 20150168452
- Publication date Jun 18, 2015
- Primax Electronics Ltd.
- Pei-Ming Chang
- G01 - MEASURING TESTING
Information Patent Application
High-Voltage Detector Montioring System
- Publication number 20150091735
- Publication date Apr 2, 2015
- HD Electric Company
- William J. McNulty
- G01 - MEASURING TESTING
Information Patent Application
HIGH VOLTAGE INTERROGATOR PLUG WITH EXTERNAL GROUNDING
- Publication number 20140266151
- Publication date Sep 18, 2014
- Randall J. Appleton
- G01 - MEASURING TESTING
Information Patent Application
CONNECTOR / CABLE ASSEMBLY
- Publication number 20140203833
- Publication date Jul 24, 2014
- LTX-Credence Corporation
- Richard McCarthy
- G01 - MEASURING TESTING
Information Patent Application
System and Method for Monitoring a Power Line
- Publication number 20140207399
- Publication date Jul 24, 2014
- Hershel Roberson
- G01 - MEASURING TESTING
Information Patent Application
CURRENT APPLICATION DEVICE AND MANUFACTURING METHOD OF SEMICONDUCTO...
- Publication number 20140193928
- Publication date Jul 10, 2014
- Honda Motor Co., Ltd.
- Satoshi Hasegawa
- G01 - MEASURING TESTING
Information Patent Application
PROBE CARD FOR POWER DEVICE
- Publication number 20140176173
- Publication date Jun 26, 2014
- TOKYO ELECTRON LIMITED
- Eiichi Shinohara
- G01 - MEASURING TESTING
Information Patent Application
MEASURING DEVICE, MEASURING METHOD, AND ELEMENT MANUFACTURING METHO...
- Publication number 20140070830
- Publication date Mar 13, 2014
- Sumitomo Electric Industries, Ltd.
- Mitsuhiko Sakai
- G01 - MEASURING TESTING
Information Patent Application
ADJUSTABLE MEASUREMENT DEVICE
- Publication number 20140062518
- Publication date Mar 6, 2014
- HON HAI PRECISION INDUSTRY CO., LTD.
- YUN-WEN SU
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR TESTING AN ELECTRONIC DEVICE
- Publication number 20140035608
- Publication date Feb 6, 2014
- TEXAS INSTRUMENTS INCORPORATED
- Robert Matthew Mertens
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD TO PROVIDE TALKING FEATURE AND INTERACTIVE VOICE...
- Publication number 20130257414
- Publication date Oct 3, 2013
- Adishesha CS
- G01 - MEASURING TESTING
Information Patent Application
PROBE ASSEMBLY FOR INSPECTING POWER SEMICONDUCTOR DEVICES AND INSPE...
- Publication number 20130141127
- Publication date Jun 6, 2013
- KABUSHIKI KAISHA NIHON MICRONICS
- Katsuo YASUTA
- G01 - MEASURING TESTING
Information Patent Application
High voltage detection in power system electrical high voltage line
- Publication number 20130119976
- Publication date May 16, 2013
- Vasu MOGAVEERA
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF IMPLEMENTATION OF PEAK HOLD IN A PHASING VOLTMETER
- Publication number 20130069629
- Publication date Mar 21, 2013
- Anil NAGPAL
- G01 - MEASURING TESTING

High voltage probes

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Probe card for testing power devices under high temperature and hig...

Coaxial contact having an open-curve shape

Voltage sensing mechanism

Apparatus for providing a test signal from a device under test (DUT...

High voltage assembly and detector

Voltage and current alert system for aerial device

Probe systems and methods including electric contact detection

Electrical test probe and testing system using the same

Transducer for high-voltage measuring technology

Probe card and contact inspection device

Shrouded test probe

System and method for stripline electrodes for thin-film characteri...

Failure estimation apparatus and failure estimation method

System and method for detecting a contact between an aerial device...

Probe systems and methods including electric contact detection

Probe card for high voltage testing

Method of implementation of peak hold in a phasing voltmeter

System and method for monitoring a power line

System comprising a probe and a measuring device

Semiconductor evaluation apparatus

Measurement device

Current application device and manufacturing method of semiconducto...

Prober

Probe card for power device

Connector / cable assembly

System and method for testing an electronic device

Indirect non-contact high voltage measurement on electrical power line

Electrostatic shielding technique on high voltage resistor

High voltage interrogator plug with external grounding

Probe assembly for inspecting power semiconductor devices and inspe...

Patents Applicationslast 30 patents

TEST DEVICE

A PROBE CARD FOR TESTING POWER DEVICES UNDER HIGH TEMPERATURE AND H...

COAXIAL CONTACT

HIGH VOLTAGE ASSEMBLY AND DETECTOR

APPARATUS FOR PROVIDING A TEST SIGNAL FROM A DEVICE UNDER TEST (DUT...

Electrical Test Probe and Testing System using the Same

APPARATUS AND METHOD FOR AN IMPROVED VOLTAGE DETECTOR

PROBE SYSTEMS AND METHODS INCLUDING ELECTRIC CONTACT DETECTION

SHROUDED TEST PROBE

Transducer for High-Voltage Measuring Technology

PROBE SYSTEMS AND METHODS INCLUDING ELECTRIC CONTACT DETECTION

SYSTEM AND METHOD FOR STRIPLINE ELECTRODES FOR THIN-FILM CHARACTERI...

ELECTRICAL PROBE AND JIG FOR THE SAME

PROBE CARD

System comprising a probe and a measuring device

SYSTEMS AND METHODS FOR ON-WAFER DYNAMIC TESTING OF ELECTRONIC DEVICES

CIRCUIT BOARD TESTING SYSTEM

High-Voltage Detector Montioring System

HIGH VOLTAGE INTERROGATOR PLUG WITH EXTERNAL GROUNDING

CONNECTOR / CABLE ASSEMBLY

System and Method for Monitoring a Power Line

CURRENT APPLICATION DEVICE AND MANUFACTURING METHOD OF SEMICONDUCTO...

PROBE CARD FOR POWER DEVICE

MEASURING DEVICE, MEASURING METHOD, AND ELEMENT MANUFACTURING METHO...

ADJUSTABLE MEASUREMENT DEVICE

SYSTEM AND METHOD FOR TESTING AN ELECTRONIC DEVICE

SYSTEM AND METHOD TO PROVIDE TALKING FEATURE AND INTERACTIVE VOICE...

PROBE ASSEMBLY FOR INSPECTING POWER SEMICONDUCTOR DEVICES AND INSPE...

High voltage detection in power system electrical high voltage line

METHOD OF IMPLEMENTATION OF PEAK HOLD IN A PHASING VOLTMETER