imaging specifically internal structure

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CPC
G01N2223/41

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GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N2223/00Investigating materials by wave or particle radiation

Current Industry

G01N2223/41imaging specifically internal structure

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Radiation detector unit with three-side buttable read-out integrate...
- Patent number 12,358,735
- Issue date Jul 15, 2025
- Redlen Technologies, Inc.
- Glenn Bindley
- B65 - CONVEYING PACKING STORING HANDLING THIN OR FILAMENTARY MATERIAL
Information Patent Grant
Pulsed neutron apparatus and method for using same to analyze core...
- Patent number 12,332,193
- Issue date Jun 17, 2025
- Core Laboratories LP
- Derek Raymond Beckett
- G01 - MEASURING TESTING
Information Patent Grant
Dynamic spectral acquisition for material studies
- Patent number 12,332,194
- Issue date Jun 17, 2025
- FEI Company
- Darius Koĉár
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Charged particle beam device
- Patent number 12,334,299
- Issue date Jun 17, 2025
- HITACHI HIGH-TECH CORPORATION
- U Oh
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Automatic particle beam focusing
- Patent number 12,327,342
- Issue date Jun 10, 2025
- FEI Company
- Yuchen Deng
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Degradable microsphere and use thereof
- Patent number 12,325,767
- Issue date Jun 10, 2025
- Tsinghua University
- Jianbin Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Quality control evaluation method of cyanate ester matrix resin mat...
- Patent number 12,320,765
- Issue date Jun 3, 2025
- THE AEROSPACE CORPORATION
- Rafael J. Zaldivar
- G01 - MEASURING TESTING
Information Patent Grant
Multiplexed computed tomography x-ray imaging
- Patent number 12,320,761
- Issue date Jun 3, 2025
- Arizona Board of Regents on behalf of the University of Arizona
- Amit Ashok
- G01 - MEASURING TESTING
Information Patent Grant
Customizable axes of rotation for industrial radiography systems
- Patent number 12,298,260
- Issue date May 13, 2025
- Illinois Tool Works Inc.
- Joseph Schlecht
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for automated x-ray inspection
- Patent number 12,298,258
- Issue date May 13, 2025
- Siemens Aktiengesellschaft
- Jochen Bönig
- G01 - MEASURING TESTING
Information Patent Grant
Method for identifying foil position in power storage device and me...
- Patent number 12,276,621
- Issue date Apr 15, 2025
- PRIME PLANET ENERGY & SOLUTIONS, INC.
- Hisataka Fujimaki
- G01 - MEASURING TESTING
Information Patent Grant
System and method for incorporating lidar-based techniques with a c...
- Patent number 12,263,024
- Issue date Apr 1, 2025
- GE Precision Healthcare LLC
- Arka Datta
- G01 - MEASURING TESTING
Information Patent Grant
Estimating scatter in X-ray images caused by imaging system compone...
- Patent number 12,257,088
- Issue date Mar 25, 2025
- SIEMENS HEALTHINEERS INTERNATIONAL AG
- Mathieu Plamondon
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Systems and methods for structurally characterizing compounds
- Patent number 12,259,343
- Issue date Mar 25, 2025
- The Regents of the University of California
- Hosea M. Nelson
- G01 - MEASURING TESTING
Information Patent Grant
X-ray inspection apparatus
- Patent number 12,235,227
- Issue date Feb 25, 2025
- JED CO., LTD
- Osamu Kinoshita
- G01 - MEASURING TESTING
Information Patent Grant
Flow cytometers including laser assessors, and methods for using th...
- Patent number 12,222,277
- Issue date Feb 11, 2025
- Becton, Dickinson and Company
- Ihor Berezhnyy
- G01 - MEASURING TESTING
Information Patent Grant
Performance evaluation method for elastic material
- Patent number 12,203,904
- Issue date Jan 21, 2025
- Sumitomo Rubber Industries, Ltd.
- Ryo Mashita
- G01 - MEASURING TESTING
Information Patent Grant
Two-stage screening technique for prohibited objects at security ch...
- Patent number 12,205,359
- Issue date Jan 21, 2025
- International Business Machines Corporation
- Mohamed Nooman Ahmed
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Device and method for the additive manufacture of a workpiece
- Patent number 12,202,205
- Issue date Jan 21, 2025
- Intom GmbH
- Martin Simon
- B22 - CASTING POWDER METALLURGY
Information Patent Grant
Systems and methods for voltage contrast defect detection
- Patent number 12,196,692
- Issue date Jan 14, 2025
- ASML Netherlands B.V.
- Weiming Ren
- G01 - MEASURING TESTING
Information Patent Grant
Battery module and method of manufacturing the same
- Patent number 12,191,462
- Issue date Jan 7, 2025
- LG ENERGY SOLUTION, LTD.
- Yongjin Cho
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and device for controlling output beam of ray machine in ima...
- Patent number 12,188,882
- Issue date Jan 7, 2025
- Nuctech Company Limited
- Zhiqiang Chen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Utilize machine learning in selecting high quality averaged SEM ima...
- Patent number 12,182,983
- Issue date Dec 31, 2024
- ASML Netherlands B.V.
- Chen Zhang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Transmission imaging detection device and its computerized tomograp...
- Patent number 12,169,181
- Issue date Dec 17, 2024
- Xiamen University
- Zheng Fang
- G01 - MEASURING TESTING
Information Patent Grant
Charged particle beam apparatus
- Patent number 12,169,182
- Issue date Dec 17, 2024
- HITACHI HIGH-TECH CORPORATION
- Wei Chean Tan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Accelerated filtered back projection for computed tomography image...
- Patent number 12,169,883
- Issue date Dec 17, 2024
- SMART ENGINES SERVICE, LLC
- Dmitry Petrovich Nikolaev
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Transmission electron microscope and inspection method using transm...
- Patent number 12,170,184
- Issue date Dec 17, 2024
- HITACHI HIGH-TECH CORPORATION
- Toshie Yaguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Systems and methods for x-ray computed tomography
- Patent number 12,163,901
- Issue date Dec 10, 2024
- Orimtech, Ltd.
- Boris S. Goldberg
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for Schottky TFE inspection
- Patent number 12,165,834
- Issue date Dec 10, 2024
- NUFLARE TECHNOLOGY, INC.
- Victor Katsap
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Low-temperature perovskite scintillators and devices with low-tempe...
- Patent number 12,164,067
- Issue date Dec 10, 2024
- Michael Saliba
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE

Patents Applicationslast 30 patents

Information Patent Application
ESTIMATING SCATTER IN X-RAY IMAGES CAUSED BY IMAGING SYSTEM COMPONE...
- Publication number 20250228509
- Publication date Jul 17, 2025
- Siemens Healthineers International AG
- Mathieu PLAMONDON
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
COUNTER COUNTERFEIT AND EMBEDDED BARCODE TECHNOLOGY
- Publication number 20250231126
- Publication date Jul 17, 2025
- Gold Standard Radiation Detection, Inc.
- Mark DERZON
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
COMPOSITIONAL MAPPING EMPLOYING VARIABLE CHARGED PARTICLE BEAM PARA...
- Publication number 20250208072
- Publication date Jun 26, 2025
- FEI Company
- Cody Levien
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR VOLTAGE CONTRAST DEFECT DETECTION
- Publication number 20250208074
- Publication date Jun 26, 2025
- ASML NETHERLANDS B.V.
- Weiming REN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPARATUS AND METHOD FOR DIAGNOSING BATTERY, AND COMPUTER PROGRAM
- Publication number 20250209585
- Publication date Jun 26, 2025
- Samsung SDI Co., Ltd.
- Seong Ho WOO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
APPARATUS AND METHOD FOR DIAGNOSING BATTERY, AND COMPUTER PROGRAM
- Publication number 20250209586
- Publication date Jun 26, 2025
- Samsung SDI Co., Ltd.
- Seong Ho WOO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MATERIAL WEIGHTING OF PROJECTION BASED SPECTRAL X-RAY IMAGING
- Publication number 20250164416
- Publication date May 22, 2025
- GE Precision Healthcare LLC
- Johannes Loberg
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SCANNING PARTS AT TARGET TEMPERATURES
- Publication number 20250116618
- Publication date Apr 10, 2025
- WEST PHARMACEUTICAL SERVICES, INC.
- Md Abu HASAN
- G01 - MEASURING TESTING
Information Patent Application
IMAGING JIG AND INFORMATION PROCESSING APPARATUS
- Publication number 20250102450
- Publication date Mar 27, 2025
- FUJIFILM CORPORATION
- Eiichi TANAKA
- G01 - MEASURING TESTING
Information Patent Application
UTILIZE MACHINE LEARNING IN SELECTING HIGH QUALITY AVERAGED SEM IMA...
- Publication number 20250078244
- Publication date Mar 6, 2025
- ASML NETHERLANDS B.V.
- Chen ZHANG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
EMISSION COMPUTED TOMOGRAPHY DETECTOR ASSEMBLIES AND METHODS THEREOF
- Publication number 20250076222
- Publication date Mar 6, 2025
- UIH AMERICA, INC.
- Hongdi LI
- G01 - MEASURING TESTING
Information Patent Application
CALIBRATION ASSEMBLY, CALIBRATION PHANTOM AND CALIBRATION METHOD
- Publication number 20250045984
- Publication date Feb 6, 2025
- Nuctech Company Limited
- Li ZHANG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Spectrum Processing Device, Specimen Analyzing Device, and Spectrum...
- Publication number 20250029225
- Publication date Jan 23, 2025
- JEOL Ltd.
- Yuka Ebata
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD FOR DETECTING DEFECTS IN SEMICONDUCTOR STRUCTURE AND METHOD...
- Publication number 20250028253
- Publication date Jan 23, 2025
- Taiwan Semiconductor Manufacturing company Ltd.
- YEN-FONG CHAN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
OBSERVATION DEVICE, AND CROSS-SECTIONAL IMAGE ACQUISITION METHOD
- Publication number 20250027890
- Publication date Jan 23, 2025
- Riken
- Kunihiro FUJITA
- G01 - MEASURING TESTING
Information Patent Application
CROSS-TALK CANCELLATION IN MULTIPLE CHARGED-PARTICLE BEAM INSPECTION
- Publication number 20250006456
- Publication date Jan 2, 2025
- ASML NETHERLANDS B.V.
- Wei FANG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD FOR MONITORING INFLUENCE OF DEFECTS IN FEW-LAYER TWO-DIMENSI...
- Publication number 20250003893
- Publication date Jan 2, 2025
- Tsinghua University
- Dameng Liu
- G01 - MEASURING TESTING
Information Patent Application
DEFECT DEPTH ESTIMATION FOR A SEMICONDUCTOR SPECIMEN
- Publication number 20240410841
- Publication date Dec 12, 2024
- APPLIED MATERIALS ISRAEL LTD.
- Vadim KUCHIK
- G01 - MEASURING TESTING
Information Patent Application
CT IMAGING SYSTEM
- Publication number 20240410839
- Publication date Dec 12, 2024
- Nuctech Company Limited
- Li ZHANG
- G01 - MEASURING TESTING
Information Patent Application
ANATOMICAL IMAGING SYSTEM WITH CENTIPEDE BELT DRIVE
- Publication number 20240398364
- Publication date Dec 5, 2024
- NEUROLOGICA CORP.
- Andrew P. Tybinkowski
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
METHOD TO INVESTIGATE A SEMICONDUCTOR SAMPLE LAYER BY LAYER AND INV...
- Publication number 20240404786
- Publication date Dec 5, 2024
- Carl Zeiss SMT GMBH
- Ivo IHRKE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
HIGH THROUGHPUT 3D X-RAY IMAGING SYSTEM USING A TRANSMISSION X-RAY...
- Publication number 20240393266
- Publication date Nov 28, 2024
- Sigray, Inc.
- David Vine
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DEFORMATION ANALYSIS DEVICE FOR SECONDARY BATTERY AND METHOD THEREOF
- Publication number 20240385127
- Publication date Nov 21, 2024
- Samsung SDI Co.,Ltd.
- Seong Ho WOO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEMS AND METHODS FOR CT DETECTOR CALIBRATION USING A WIRE PHANTOM
- Publication number 20240374223
- Publication date Nov 14, 2024
- GE Precision Healthcare LLC
- Björn Cederström
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
METHOD OF ANALYZING CRYSTAL STRUCTURE, CRYSTAL MORPHOLOGY, OR CRYST...
- Publication number 20240361260
- Publication date Oct 31, 2024
- TOHOKU UNIVERSITY
- Hiroshi JINNAI
- G01 - MEASURING TESTING
Information Patent Application
X-RAY MEASURING METHOD AND X-RAY MEASURING DEVICE FOR MEASURING A S...
- Publication number 20240353355
- Publication date Oct 24, 2024
- CiTEX Holding GmbH
- Arno NEUMEISTER
- G01 - MEASURING TESTING
Information Patent Application
AUGMENTATION OF ELECTRON ENERGY LOSS SPECTROSCOPY IN CHARGED PARTIC...
- Publication number 20240337610
- Publication date Oct 10, 2024
- FEI Company
- Wouter René J. Van den Broek
- G01 - MEASURING TESTING
Information Patent Application
TRAINING SCANNING ELECTRON MICROSCOPY IMAGE SELECTION METHOD AND SE...
- Publication number 20240320816
- Publication date Sep 26, 2024
- Samsung Electronics Co., Ltd.
- Nohong Kwak
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM AND METHOD FOR INSPECTION BY FAILURE MECHANISM CLASSIFICATIO...
- Publication number 20240319123
- Publication date Sep 26, 2024
- ASML NETHERLANDS B.V.
- Achim WOESSNER
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION SYSTEM AND INSPECTION METHOD
- Publication number 20240310304
- Publication date Sep 19, 2024
- TSINGHUA UNIVERSITY
- Zhiqiang CHEN
- G01 - MEASURING TESTING

imaging specifically internal structure

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Radiation detector unit with three-side buttable read-out integrate...

Pulsed neutron apparatus and method for using same to analyze core...

Dynamic spectral acquisition for material studies

Charged particle beam device

Automatic particle beam focusing

Degradable microsphere and use thereof

Quality control evaluation method of cyanate ester matrix resin mat...

Multiplexed computed tomography x-ray imaging

Customizable axes of rotation for industrial radiography systems

Systems and methods for automated x-ray inspection

Method for identifying foil position in power storage device and me...

System and method for incorporating lidar-based techniques with a c...

Estimating scatter in X-ray images caused by imaging system compone...

Systems and methods for structurally characterizing compounds

X-ray inspection apparatus

Flow cytometers including laser assessors, and methods for using th...

Performance evaluation method for elastic material

Two-stage screening technique for prohibited objects at security ch...

Device and method for the additive manufacture of a workpiece

Systems and methods for voltage contrast defect detection

Battery module and method of manufacturing the same

Method and device for controlling output beam of ray machine in ima...

Utilize machine learning in selecting high quality averaged SEM ima...

Transmission imaging detection device and its computerized tomograp...

Charged particle beam apparatus

Accelerated filtered back projection for computed tomography image...

Transmission electron microscope and inspection method using transm...

Systems and methods for x-ray computed tomography

Method and apparatus for Schottky TFE inspection

Low-temperature perovskite scintillators and devices with low-tempe...

Patents Applicationslast 30 patents

ESTIMATING SCATTER IN X-RAY IMAGES CAUSED BY IMAGING SYSTEM COMPONE...

COUNTER COUNTERFEIT AND EMBEDDED BARCODE TECHNOLOGY

COMPOSITIONAL MAPPING EMPLOYING VARIABLE CHARGED PARTICLE BEAM PARA...

SYSTEMS AND METHODS FOR VOLTAGE CONTRAST DEFECT DETECTION

APPARATUS AND METHOD FOR DIAGNOSING BATTERY, AND COMPUTER PROGRAM

APPARATUS AND METHOD FOR DIAGNOSING BATTERY, AND COMPUTER PROGRAM

MATERIAL WEIGHTING OF PROJECTION BASED SPECTRAL X-RAY IMAGING

SCANNING PARTS AT TARGET TEMPERATURES

IMAGING JIG AND INFORMATION PROCESSING APPARATUS

UTILIZE MACHINE LEARNING IN SELECTING HIGH QUALITY AVERAGED SEM IMA...

EMISSION COMPUTED TOMOGRAPHY DETECTOR ASSEMBLIES AND METHODS THEREOF

CALIBRATION ASSEMBLY, CALIBRATION PHANTOM AND CALIBRATION METHOD

Spectrum Processing Device, Specimen Analyzing Device, and Spectrum...

METHOD FOR DETECTING DEFECTS IN SEMICONDUCTOR STRUCTURE AND METHOD...

OBSERVATION DEVICE, AND CROSS-SECTIONAL IMAGE ACQUISITION METHOD

CROSS-TALK CANCELLATION IN MULTIPLE CHARGED-PARTICLE BEAM INSPECTION

METHOD FOR MONITORING INFLUENCE OF DEFECTS IN FEW-LAYER TWO-DIMENSI...

DEFECT DEPTH ESTIMATION FOR A SEMICONDUCTOR SPECIMEN

CT IMAGING SYSTEM

ANATOMICAL IMAGING SYSTEM WITH CENTIPEDE BELT DRIVE

METHOD TO INVESTIGATE A SEMICONDUCTOR SAMPLE LAYER BY LAYER AND INV...

HIGH THROUGHPUT 3D X-RAY IMAGING SYSTEM USING A TRANSMISSION X-RAY...

DEFORMATION ANALYSIS DEVICE FOR SECONDARY BATTERY AND METHOD THEREOF

SYSTEMS AND METHODS FOR CT DETECTOR CALIBRATION USING A WIRE PHANTOM

METHOD OF ANALYZING CRYSTAL STRUCTURE, CRYSTAL MORPHOLOGY, OR CRYST...

X-RAY MEASURING METHOD AND X-RAY MEASURING DEVICE FOR MEASURING A S...

AUGMENTATION OF ELECTRON ENERGY LOSS SPECTROSCOPY IN CHARGED PARTIC...

TRAINING SCANNING ELECTRON MICROSCOPY IMAGE SELECTION METHOD AND SE...

SYSTEM AND METHOD FOR INSPECTION BY FAILURE MECHANISM CLASSIFICATIO...

INSPECTION SYSTEM AND INSPECTION METHOD