imaging specifically internal structure

Industry

CPC
G01N2223/41

This industry / category may be too specific. Please go to a parent level for more data

Parent Industries

GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N2223/00Investigating materials by wave or particle radiation

Current Industry

G01N2223/41imaging specifically internal structure

Industries

Please log in for detailed analytics

Patents Grantslast 30 patents

Information Patent Grant
Performance evaluation method for elastic material
- Patent number 12,203,904
- Issue date Jan 21, 2025
- Sumitomo Rubber Industries, Ltd.
- Ryo Mashita
- G01 - MEASURING TESTING
Information Patent Grant
Two-stage screening technique for prohibited objects at security ch...
- Patent number 12,205,359
- Issue date Jan 21, 2025
- International Business Machines Corporation
- Mohamed Nooman Ahmed
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Device and method for the additive manufacture of a workpiece
- Patent number 12,202,205
- Issue date Jan 21, 2025
- Intom GmbH
- Martin Simon
- B22 - CASTING POWDER METALLURGY
Information Patent Grant
Systems and methods for voltage contrast defect detection
- Patent number 12,196,692
- Issue date Jan 14, 2025
- ASML Netherlands B.V.
- Weiming Ren
- G01 - MEASURING TESTING
Information Patent Grant
Battery module and method of manufacturing the same
- Patent number 12,191,462
- Issue date Jan 7, 2025
- LG ENERGY SOLUTION, LTD.
- Yongjin Cho
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and device for controlling output beam of ray machine in ima...
- Patent number 12,188,882
- Issue date Jan 7, 2025
- Nuctech Company Limited
- Zhiqiang Chen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Utilize machine learning in selecting high quality averaged SEM ima...
- Patent number 12,182,983
- Issue date Dec 31, 2024
- ASML Netherlands B.V.
- Chen Zhang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Transmission imaging detection device and its computerized tomograp...
- Patent number 12,169,181
- Issue date Dec 17, 2024
- Xiamen University
- Zheng Fang
- G01 - MEASURING TESTING
Information Patent Grant
Charged particle beam apparatus
- Patent number 12,169,182
- Issue date Dec 17, 2024
- HITACHI HIGH-TECH CORPORATION
- Wei Chean Tan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Transmission electron microscope and inspection method using transm...
- Patent number 12,170,184
- Issue date Dec 17, 2024
- HITACHI HIGH-TECH CORPORATION
- Toshie Yaguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Accelerated filtered back projection for computed tomography image...
- Patent number 12,169,883
- Issue date Dec 17, 2024
- SMART ENGINES SERVICE, LLC
- Dmitry Petrovich Nikolaev
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Systems and methods for x-ray computed tomography
- Patent number 12,163,901
- Issue date Dec 10, 2024
- Orimtech, Ltd.
- Boris S. Goldberg
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for Schottky TFE inspection
- Patent number 12,165,834
- Issue date Dec 10, 2024
- NUFLARE TECHNOLOGY, INC.
- Victor Katsap
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Low-temperature perovskite scintillators and devices with low-tempe...
- Patent number 12,164,067
- Issue date Dec 10, 2024
- Michael Saliba
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Multifunctional and visual rock triaxial testing system
- Patent number 12,123,852
- Issue date Oct 22, 2024
- INSTITUTE OF GEOLOGY AND GEOPHYSICS, CHINESE ACADEMY OF SCIENCES
- Yanzhi Hu
- G01 - MEASURING TESTING
Information Patent Grant
Methods for correlative microscopy
- Patent number 12,123,047
- Issue date Oct 22, 2024
- Leica Mikrosysteme GmbH
- Julia König
- C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information Patent Grant
Serial arrangement having multiple plies of asymmetric filter media...
- Patent number 12,115,502
- Issue date Oct 15, 2024
- Sartorius Stedim Biotech GmbH
- Volkmar Thom
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
Radiation detector and radiography apparatus
- Patent number 12,115,011
- Issue date Oct 15, 2024
- FUJIFILM Corporation
- Hisatsugu Horiuchi
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
System for estimating the occurrence of defects, and computer-reada...
- Patent number 12,111,272
- Issue date Oct 8, 2024
- HITACHI HIGH-TECH CORPORATION
- Hiroshi Fukuda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Radiation detector and radiography apparatus
- Patent number 12,111,430
- Issue date Oct 8, 2024
- FUJIFILM Corporation
- Hisatsugu Horiuchi
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Method and plant for inspecting an animal carcass
- Patent number 12,102,094
- Issue date Oct 1, 2024
- BIOMETIC S.R.L.
- Enrico Ursella
- A22 - BUTCHERING MEAT TREATMENT PROCESSING POULTRY OR FISH
Information Patent Grant
Method and apparatus for monitoring beam profile and power
- Patent number 12,105,036
- Issue date Oct 1, 2024
- ASML Netherlands B.V.
- Jian Zhang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Assessing characteristics of subterranean formations using micro-co...
- Patent number 12,105,077
- Issue date Oct 1, 2024
- Saudi Arabian Oil Company
- Osman Hamid
- G01 - MEASURING TESTING
Information Patent Grant
Devices and methods for high angle liquid electron tomography
- Patent number 12,099,022
- Issue date Sep 24, 2024
- UNIVERSIDAD REY JUAN CARLOS
- Jesus Gonzalez Casablanca
- G01 - MEASURING TESTING
Information Patent Grant
Scan procedure generation systems and methods to generate scan proc...
- Patent number 12,092,591
- Issue date Sep 17, 2024
- Illinois Tool Works Inc.
- Jackson Turner
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Device and method for measuring the relative permeability of proppe...
- Patent number 12,092,592
- Issue date Sep 17, 2024
- SOUTHWEST PETROLEUM UNIVERSITY
- Zhenglan Li
- G01 - MEASURING TESTING
Information Patent Grant
Surface determination using three-dimensional voxel data
- Patent number 12,086,923
- Issue date Sep 10, 2024
- Faro Technologies, Inc.
- Ariane Stiebeiner
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Adaptive specimen image acquisition using an artificial neural network
- Patent number 12,085,523
- Issue date Sep 10, 2024
- FEI Company
- Pavel Potocek
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Cross-talk cancellation in multiple charged-particle beam inspection
- Patent number 12,080,513
- Issue date Sep 3, 2024
- ASML Netherlands B.V.
- Wei Fang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Radiation analysis system, charged particle beam system, and radiat...
- Patent number 12,078,763
- Issue date Sep 3, 2024
- HITACHI HIGH-TECH CORPORATION
- Akira Takano
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
CROSS-TALK CANCELLATION IN MULTIPLE CHARGED-PARTICLE BEAM INSPECTION
- Publication number 20250006456
- Publication date Jan 2, 2025
- ASML NETHERLANDS B.V.
- Wei FANG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD FOR MONITORING INFLUENCE OF DEFECTS IN FEW-LAYER TWO-DIMENSI...
- Publication number 20250003893
- Publication date Jan 2, 2025
- Tsinghua University
- Dameng Liu
- G01 - MEASURING TESTING
Information Patent Application
DEFECT DEPTH ESTIMATION FOR A SEMICONDUCTOR SPECIMEN
- Publication number 20240410841
- Publication date Dec 12, 2024
- APPLIED MATERIALS ISRAEL LTD.
- Vadim KUCHIK
- G01 - MEASURING TESTING
Information Patent Application
CT IMAGING SYSTEM
- Publication number 20240410839
- Publication date Dec 12, 2024
- Nuctech Company Limited
- Li ZHANG
- G01 - MEASURING TESTING
Information Patent Application
ANATOMICAL IMAGING SYSTEM WITH CENTIPEDE BELT DRIVE
- Publication number 20240398364
- Publication date Dec 5, 2024
- NEUROLOGICA CORP.
- Andrew P. Tybinkowski
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
METHOD TO INVESTIGATE A SEMICONDUCTOR SAMPLE LAYER BY LAYER AND INV...
- Publication number 20240404786
- Publication date Dec 5, 2024
- Carl Zeiss SMT GMBH
- Ivo IHRKE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
HIGH THROUGHPUT 3D X-RAY IMAGING SYSTEM USING A TRANSMISSION X-RAY...
- Publication number 20240393266
- Publication date Nov 28, 2024
- Sigray, Inc.
- David Vine
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DEFORMATION ANALYSIS DEVICE FOR SECONDARY BATTERY AND METHOD THEREOF
- Publication number 20240385127
- Publication date Nov 21, 2024
- Samsung SDI Co.,Ltd.
- Seong Ho WOO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEMS AND METHODS FOR CT DETECTOR CALIBRATION USING A WIRE PHANTOM
- Publication number 20240374223
- Publication date Nov 14, 2024
- GE Precision Healthcare LLC
- Björn Cederström
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
METHOD OF ANALYZING CRYSTAL STRUCTURE, CRYSTAL MORPHOLOGY, OR CRYST...
- Publication number 20240361260
- Publication date Oct 31, 2024
- TOHOKU UNIVERSITY
- Hiroshi JINNAI
- G01 - MEASURING TESTING
Information Patent Application
X-RAY MEASURING METHOD AND X-RAY MEASURING DEVICE FOR MEASURING A S...
- Publication number 20240353355
- Publication date Oct 24, 2024
- CiTEX Holding GmbH
- Arno NEUMEISTER
- G01 - MEASURING TESTING
Information Patent Application
AUGMENTATION OF ELECTRON ENERGY LOSS SPECTROSCOPY IN CHARGED PARTIC...
- Publication number 20240337610
- Publication date Oct 10, 2024
- FEI Company
- Wouter René J. Van den Broek
- G01 - MEASURING TESTING
Information Patent Application
TRAINING SCANNING ELECTRON MICROSCOPY IMAGE SELECTION METHOD AND SE...
- Publication number 20240320816
- Publication date Sep 26, 2024
- Samsung Electronics Co., Ltd.
- Nohong Kwak
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM AND METHOD FOR INSPECTION BY FAILURE MECHANISM CLASSIFICATIO...
- Publication number 20240319123
- Publication date Sep 26, 2024
- ASML NETHERLANDS B.V.
- Achim WOESSNER
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION SYSTEM AND INSPECTION METHOD
- Publication number 20240310304
- Publication date Sep 19, 2024
- TSINGHUA UNIVERSITY
- Zhiqiang CHEN
- G01 - MEASURING TESTING
Information Patent Application
MACHINE FOR THE COMPOSITE SCANNING OF OBJECTS
- Publication number 20240295510
- Publication date Sep 5, 2024
- GILARDONI S.P.A.
- Davide Baratto
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR X-RAY FLUORESCENCE IMAGING
- Publication number 20240280519
- Publication date Aug 22, 2024
- SHENZHEN XPECTVISION TECHNOLOGY CO., LTD.
- Yurun LIU
- G01 - MEASURING TESTING
Information Patent Application
CRYSTALLINE RESIN CONTAINING MICROSCOPIC SURFACE RELIEFS AND METHOD...
- Publication number 20240280521
- Publication date Aug 22, 2024
- Ori Lieberman
- G01 - MEASURING TESTING
Information Patent Application
TWO-STAGE PIXEL DEVICE WITH ADAPTIVE FRAME GRABBING FOR X-RAY IMAGI...
- Publication number 20240272094
- Publication date Aug 15, 2024
- Anastasiia Mishchenko
- G01 - MEASURING TESTING
Information Patent Application
TEM Orientation Mapping via Dark-Field Vector Images
- Publication number 20240272097
- Publication date Aug 15, 2024
- Virginia Commonwealth University
- Carl R. Mayer
- G01 - MEASURING TESTING
Information Patent Application
CT SCANNER CALIBRATION
- Publication number 20240272095
- Publication date Aug 15, 2024
- JAMES R. GLIDEWELL DENTAL CERAMICS, INC.
- Sergey Nikolskiy
- G01 - MEASURING TESTING
Information Patent Application
THIN-FILM-BASED ASSEMBLY
- Publication number 20240272042
- Publication date Aug 15, 2024
- VITROTEM B.V.
- Pauline Martha Gerardina VAN DEURSEN
- G01 - MEASURING TESTING
Information Patent Application
Method And Apparatus For Reconstructing Image Projections
- Publication number 20240260914
- Publication date Aug 8, 2024
- Medtronic Navigation, Inc.
- Patrick A. HELM
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
APPARATUS FOR VERTICAL SCREENING
- Publication number 20240264331
- Publication date Aug 8, 2024
- Analogic Corporation
- Sevag Zoboyan
- G01 - MEASURING TESTING
Information Patent Application
RAY SCANNING APPARATUS
- Publication number 20240248048
- Publication date Jul 25, 2024
- Nuctech Company Limited
- Zhiqiang CHEN
- G01 - MEASURING TESTING
Information Patent Application
RAY SCANNING APPARATUS
- Publication number 20240248049
- Publication date Jul 25, 2024
- Nuctech Company Limited
- Zhiqiang CHEN
- G01 - MEASURING TESTING
Information Patent Application
ESTIMATING SCATTER IN X-RAY IMAGES CAUSED BY IMAGING SYSTEM COMPONE...
- Publication number 20240225572
- Publication date Jul 11, 2024
- SIEMENS HEALTHINEERS INTERNATIONAL AG
- Mathieu PLAMONDON
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
SYSTEMS, APPARATUS, ARTICLES OF MANUFACTURE, AND METHODS TO INSPECT...
- Publication number 20240219326
- Publication date Jul 4, 2024
- Intel Corporation
- Oliver Patterson
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR SCANNING OF AN OBJECT IN A SCANNING APPARATUS
- Publication number 20240219321
- Publication date Jul 4, 2024
- Rolls-Royce plc
- Akhil MULLOTH
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR UTILIZATION OF PHOTON COUNTING IN A CABINET X...
- Publication number 20240201110
- Publication date Jun 20, 2024
- KUB TECHNOLOGIES, INC. DBA KUBTEC
- Chester Lowe
- G01 - MEASURING TESTING

imaging specifically internal structure

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Performance evaluation method for elastic material

Two-stage screening technique for prohibited objects at security ch...

Device and method for the additive manufacture of a workpiece

Systems and methods for voltage contrast defect detection

Battery module and method of manufacturing the same

Method and device for controlling output beam of ray machine in ima...

Utilize machine learning in selecting high quality averaged SEM ima...

Transmission imaging detection device and its computerized tomograp...

Charged particle beam apparatus

Transmission electron microscope and inspection method using transm...

Accelerated filtered back projection for computed tomography image...

Systems and methods for x-ray computed tomography

Method and apparatus for Schottky TFE inspection

Low-temperature perovskite scintillators and devices with low-tempe...

Multifunctional and visual rock triaxial testing system

Methods for correlative microscopy

Serial arrangement having multiple plies of asymmetric filter media...

Radiation detector and radiography apparatus

System for estimating the occurrence of defects, and computer-reada...

Radiation detector and radiography apparatus

Method and plant for inspecting an animal carcass

Method and apparatus for monitoring beam profile and power

Assessing characteristics of subterranean formations using micro-co...

Devices and methods for high angle liquid electron tomography

Scan procedure generation systems and methods to generate scan proc...

Device and method for measuring the relative permeability of proppe...

Surface determination using three-dimensional voxel data

Adaptive specimen image acquisition using an artificial neural network

Cross-talk cancellation in multiple charged-particle beam inspection

Radiation analysis system, charged particle beam system, and radiat...

Patents Applicationslast 30 patents

CROSS-TALK CANCELLATION IN MULTIPLE CHARGED-PARTICLE BEAM INSPECTION

METHOD FOR MONITORING INFLUENCE OF DEFECTS IN FEW-LAYER TWO-DIMENSI...

DEFECT DEPTH ESTIMATION FOR A SEMICONDUCTOR SPECIMEN

CT IMAGING SYSTEM

ANATOMICAL IMAGING SYSTEM WITH CENTIPEDE BELT DRIVE

METHOD TO INVESTIGATE A SEMICONDUCTOR SAMPLE LAYER BY LAYER AND INV...

HIGH THROUGHPUT 3D X-RAY IMAGING SYSTEM USING A TRANSMISSION X-RAY...

DEFORMATION ANALYSIS DEVICE FOR SECONDARY BATTERY AND METHOD THEREOF

SYSTEMS AND METHODS FOR CT DETECTOR CALIBRATION USING A WIRE PHANTOM

METHOD OF ANALYZING CRYSTAL STRUCTURE, CRYSTAL MORPHOLOGY, OR CRYST...

X-RAY MEASURING METHOD AND X-RAY MEASURING DEVICE FOR MEASURING A S...

AUGMENTATION OF ELECTRON ENERGY LOSS SPECTROSCOPY IN CHARGED PARTIC...

TRAINING SCANNING ELECTRON MICROSCOPY IMAGE SELECTION METHOD AND SE...

SYSTEM AND METHOD FOR INSPECTION BY FAILURE MECHANISM CLASSIFICATIO...

INSPECTION SYSTEM AND INSPECTION METHOD

MACHINE FOR THE COMPOSITE SCANNING OF OBJECTS

APPARATUS AND METHOD FOR X-RAY FLUORESCENCE IMAGING

CRYSTALLINE RESIN CONTAINING MICROSCOPIC SURFACE RELIEFS AND METHOD...

TWO-STAGE PIXEL DEVICE WITH ADAPTIVE FRAME GRABBING FOR X-RAY IMAGI...

TEM Orientation Mapping via Dark-Field Vector Images

CT SCANNER CALIBRATION

THIN-FILM-BASED ASSEMBLY

Method And Apparatus For Reconstructing Image Projections

APPARATUS FOR VERTICAL SCREENING

RAY SCANNING APPARATUS

RAY SCANNING APPARATUS

ESTIMATING SCATTER IN X-RAY IMAGES CAUSED BY IMAGING SYSTEM COMPONE...

SYSTEMS, APPARATUS, ARTICLES OF MANUFACTURE, AND METHODS TO INSPECT...

METHOD FOR SCANNING OF AN OBJECT IN A SCANNING APPARATUS

SYSTEM AND METHOD FOR UTILIZATION OF PHOTON COUNTING IN A CABINET X...