imaging specifically internal structure

Industry

CPC
G01N2223/41

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Parent Industries

GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N2223/00Investigating materials by wave or particle radiation

Current Industry

G01N2223/41imaging specifically internal structure

Industries

Patents Grantslast 30 patents

Information Patent Grant
Multifunctional and visual rock triaxial testing system
- Patent number 12,123,852
- Issue date Oct 22, 2024
- INSTITUTE OF GEOLOGY AND GEOPHYSICS, CHINESE ACADEMY OF SCIENCES
- Yanzhi Hu
- G01 - MEASURING TESTING
Information Patent Grant
Methods for correlative microscopy
- Patent number 12,123,047
- Issue date Oct 22, 2024
- Leica Mikrosysteme GmbH
- Julia König
- C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information Patent Grant
Serial arrangement having multiple plies of asymmetric filter media...
- Patent number 12,115,502
- Issue date Oct 15, 2024
- Sartorius Stedim Biotech GmbH
- Volkmar Thom
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
Radiation detector and radiography apparatus
- Patent number 12,115,011
- Issue date Oct 15, 2024
- FUJIFILM Corporation
- Hisatsugu Horiuchi
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
System for estimating the occurrence of defects, and computer-reada...
- Patent number 12,111,272
- Issue date Oct 8, 2024
- HITACHI HIGH-TECH CORPORATION
- Hiroshi Fukuda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Radiation detector and radiography apparatus
- Patent number 12,111,430
- Issue date Oct 8, 2024
- FUJIFILM Corporation
- Hisatsugu Horiuchi
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Method and plant for inspecting an animal carcass
- Patent number 12,102,094
- Issue date Oct 1, 2024
- BIOMETIC S.R.L.
- Enrico Ursella
- A22 - BUTCHERING MEAT TREATMENT PROCESSING POULTRY OR FISH
Information Patent Grant
Method and apparatus for monitoring beam profile and power
- Patent number 12,105,036
- Issue date Oct 1, 2024
- ASML Netherlands B.V.
- Jian Zhang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Assessing characteristics of subterranean formations using micro-co...
- Patent number 12,105,077
- Issue date Oct 1, 2024
- Saudi Arabian Oil Company
- Osman Hamid
- G01 - MEASURING TESTING
Information Patent Grant
Devices and methods for high angle liquid electron tomography
- Patent number 12,099,022
- Issue date Sep 24, 2024
- UNIVERSIDAD REY JUAN CARLOS
- Jesus Gonzalez Casablanca
- G01 - MEASURING TESTING
Information Patent Grant
Scan procedure generation systems and methods to generate scan proc...
- Patent number 12,092,591
- Issue date Sep 17, 2024
- Illinois Tool Works Inc.
- Jackson Turner
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Device and method for measuring the relative permeability of proppe...
- Patent number 12,092,592
- Issue date Sep 17, 2024
- SOUTHWEST PETROLEUM UNIVERSITY
- Zhenglan Li
- G01 - MEASURING TESTING
Information Patent Grant
Surface determination using three-dimensional voxel data
- Patent number 12,086,923
- Issue date Sep 10, 2024
- Faro Technologies, Inc.
- Ariane Stiebeiner
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Adaptive specimen image acquisition using an artificial neural network
- Patent number 12,085,523
- Issue date Sep 10, 2024
- FEI Company
- Pavel Potocek
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Cross-talk cancellation in multiple charged-particle beam inspection
- Patent number 12,080,513
- Issue date Sep 3, 2024
- ASML Netherlands B.V.
- Wei Fang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Radiation analysis system, charged particle beam system, and radiat...
- Patent number 12,078,763
- Issue date Sep 3, 2024
- HITACHI HIGH-TECH CORPORATION
- Akira Takano
- G01 - MEASURING TESTING
Information Patent Grant
Estimating background radiation from unknown sources
- Patent number 12,066,390
- Issue date Aug 20, 2024
- Varex Imaging Corporation
- Mingshan Sun
- G01 - MEASURING TESTING
Information Patent Grant
Defect characterization method and apparatus
- Patent number 12,067,704
- Issue date Aug 20, 2024
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Ning Huang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Rotational X-ray inspection system and method
- Patent number 12,061,156
- Issue date Aug 13, 2024
- VIKEN DETECTION CORPORATION
- Peter J. Rothschild
- G01 - MEASURING TESTING
Information Patent Grant
Estimating heights of defects in a wafer by scaling a 3D model usin...
- Patent number 12,057,336
- Issue date Aug 6, 2024
- Samsung Electronics Co., Ltd.
- Shashank Shrikant Agashe
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Inspection method, inspection system, and semiconductor fabrication...
- Patent number 12,055,861
- Issue date Aug 6, 2024
- Samsung Electronics Co., Ltd.
- Kihyun Kim
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Airfoil tip cleaning and assessment systems and methods
- Patent number 12,044,632
- Issue date Jul 23, 2024
- RTX Corporation
- Christopher James Pelliccione
- G08 - SIGNALLING
Information Patent Grant
Entropy-diffusion method for fracture identification and labelling...
- Patent number 12,038,547
- Issue date Jul 16, 2024
- Halliburton Energy Services, Inc.
- Rafael March Castaneda Neto
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Crystal defect observation method for compound semiconductor
- Patent number 12,038,396
- Issue date Jul 16, 2024
- Mitsubishi Electric Corporation
- Hajime Sasaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Structured detectors and detector systems for radiation imaging
- Patent number 12,019,194
- Issue date Jun 25, 2024
- MINNESOTA IMAGING AND ENGINEERING LLC
- Robert Sigurd Nelson
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
CT scanner calibration
- Patent number 11,988,616
- Issue date May 21, 2024
- James R. Glidewell Dental Ceramics, Inc.
- Sergey Nikolskiy
- G01 - MEASURING TESTING
Information Patent Grant
Method to use artificial intelligence to enhance visual inspection...
- Patent number 11,988,630
- Issue date May 21, 2024
- Robert Bosch GmbH
- Craig Magera
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Adaptive specimen image acquisition
- Patent number 11,982,634
- Issue date May 14, 2024
- FEI Company
- Pavel Potocek
- G01 - MEASURING TESTING
Information Patent Grant
Material properties from two-dimensional image
- Patent number 11,982,635
- Issue date May 14, 2024
- BP Corporation North America Inc.
- Glen L. Gettemy
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for determining variability of cryo-EM protein...
- Patent number 11,977,039
- Issue date May 7, 2024
- Ali Punjani
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
X-RAY MEASURING METHOD AND X-RAY MEASURING DEVICE FOR MEASURING A S...
- Publication number 20240353355
- Publication date Oct 24, 2024
- CiTEX Holding GmbH
- Arno NEUMEISTER
- G01 - MEASURING TESTING
Information Patent Application
AUGMENTATION OF ELECTRON ENERGY LOSS SPECTROSCOPY IN CHARGED PARTIC...
- Publication number 20240337610
- Publication date Oct 10, 2024
- FEI Company
- Wouter René J. Van den Broek
- G01 - MEASURING TESTING
Information Patent Application
TRAINING SCANNING ELECTRON MICROSCOPY IMAGE SELECTION METHOD AND SE...
- Publication number 20240320816
- Publication date Sep 26, 2024
- Samsung Electronics Co., Ltd.
- Nohong Kwak
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM AND METHOD FOR INSPECTION BY FAILURE MECHANISM CLASSIFICATIO...
- Publication number 20240319123
- Publication date Sep 26, 2024
- ASML NETHERLANDS B.V.
- Achim WOESSNER
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION SYSTEM AND INSPECTION METHOD
- Publication number 20240310304
- Publication date Sep 19, 2024
- TSINGHUA UNIVERSITY
- Zhiqiang CHEN
- G01 - MEASURING TESTING
Information Patent Application
MACHINE FOR THE COMPOSITE SCANNING OF OBJECTS
- Publication number 20240295510
- Publication date Sep 5, 2024
- GILARDONI S.P.A.
- Davide Baratto
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR X-RAY FLUORESCENCE IMAGING
- Publication number 20240280519
- Publication date Aug 22, 2024
- SHENZHEN XPECTVISION TECHNOLOGY CO., LTD.
- Yurun LIU
- G01 - MEASURING TESTING
Information Patent Application
CRYSTALLINE RESIN CONTAINING MICROSCOPIC SURFACE RELIEFS AND METHOD...
- Publication number 20240280521
- Publication date Aug 22, 2024
- Ori Lieberman
- G01 - MEASURING TESTING
Information Patent Application
TWO-STAGE PIXEL DEVICE WITH ADAPTIVE FRAME GRABBING FOR X-RAY IMAGI...
- Publication number 20240272094
- Publication date Aug 15, 2024
- Anastasiia Mishchenko
- G01 - MEASURING TESTING
Information Patent Application
TEM Orientation Mapping via Dark-Field Vector Images
- Publication number 20240272097
- Publication date Aug 15, 2024
- Virginia Commonwealth University
- Carl R. Mayer
- G01 - MEASURING TESTING
Information Patent Application
CT SCANNER CALIBRATION
- Publication number 20240272095
- Publication date Aug 15, 2024
- JAMES R. GLIDEWELL DENTAL CERAMICS, INC.
- Sergey Nikolskiy
- G01 - MEASURING TESTING
Information Patent Application
THIN-FILM-BASED ASSEMBLY
- Publication number 20240272042
- Publication date Aug 15, 2024
- VITROTEM B.V.
- Pauline Martha Gerardina VAN DEURSEN
- G01 - MEASURING TESTING
Information Patent Application
Method And Apparatus For Reconstructing Image Projections
- Publication number 20240260914
- Publication date Aug 8, 2024
- Medtronic Navigation, Inc.
- Patrick A. HELM
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
APPARATUS FOR VERTICAL SCREENING
- Publication number 20240264331
- Publication date Aug 8, 2024
- Analogic Corporation
- Sevag Zoboyan
- G01 - MEASURING TESTING
Information Patent Application
RAY SCANNING APPARATUS
- Publication number 20240248048
- Publication date Jul 25, 2024
- Nuctech Company Limited
- Zhiqiang CHEN
- G01 - MEASURING TESTING
Information Patent Application
RAY SCANNING APPARATUS
- Publication number 20240248049
- Publication date Jul 25, 2024
- Nuctech Company Limited
- Zhiqiang CHEN
- G01 - MEASURING TESTING
Information Patent Application
ESTIMATING SCATTER IN X-RAY IMAGES CAUSED BY IMAGING SYSTEM COMPONE...
- Publication number 20240225572
- Publication date Jul 11, 2024
- SIEMENS HEALTHINEERS INTERNATIONAL AG
- Mathieu PLAMONDON
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
SYSTEMS, APPARATUS, ARTICLES OF MANUFACTURE, AND METHODS TO INSPECT...
- Publication number 20240219326
- Publication date Jul 4, 2024
- Intel Corporation
- Oliver Patterson
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR SCANNING OF AN OBJECT IN A SCANNING APPARATUS
- Publication number 20240219321
- Publication date Jul 4, 2024
- Rolls-Royce plc
- Akhil MULLOTH
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR UTILIZATION OF PHOTON COUNTING IN A CABINET X...
- Publication number 20240201110
- Publication date Jun 20, 2024
- KUB TECHNOLOGIES, INC. DBA KUBTEC
- Chester Lowe
- G01 - MEASURING TESTING
Information Patent Application
Systems and Methods for X-Ray Computed Tomography
- Publication number 20240192150
- Publication date Jun 13, 2024
- Orimtech Ltd.
- Boris S. GOLDBERG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
QUALITY CONTROL EVALUATION METHOD OF CYANATE ESTER MATRIX RESIN MAT...
- Publication number 20240183805
- Publication date Jun 6, 2024
- The Aerospace Corporation
- Rafael J. ZALDIVAR
- G01 - MEASURING TESTING
Information Patent Application
X-RAY INSPECTION APPARATUS
- Publication number 20240183804
- Publication date Jun 6, 2024
- JED CO., LTD
- Osamu KINOSHITA
- G01 - MEASURING TESTING
Information Patent Application
CHARGED PARTICLE BEAM SYSTEM, CORRECTOR FOR ABERRATION CORRECTION O...
- Publication number 20240170249
- Publication date May 23, 2024
- ICT Integrated Circuit Testing Gesellschaft fur Halbleiterpruftechnik mbH
- Pieter Kruit
- G01 - MEASURING TESTING
Information Patent Application
Simulating Dissolution of Scale in Wells
- Publication number 20240167997
- Publication date May 23, 2024
- Saudi Arabian Oil Company
- Mohammed Sayed
- G01 - MEASURING TESTING
Information Patent Application
LOW-TEMPERATURE PEROVSKITE SCINTILLATORS AND DEVICES WITH LOW-TEMPE...
- Publication number 20240168182
- Publication date May 23, 2024
- Michael Saliba
- G01 - MEASURING TESTING
Information Patent Application
DEVICE AND METHOD FOR MEASURING THE RELATIVE PERMEABILITY OF PROPPE...
- Publication number 20240159692
- Publication date May 16, 2024
- SOUTHWEST PETROLEUM UNIVERSITY
- Zhenglan LI
- G01 - MEASURING TESTING
Information Patent Application
X-RAY COMPUTED TOMOGRAPHY (CT) SCANNER
- Publication number 20240142392
- Publication date May 2, 2024
- MULTICT IMAGING LTD
- Nathan HERMONY
- G01 - MEASURING TESTING
Information Patent Application
Calibration Method and Device Therefor
- Publication number 20240134083
- Publication date Apr 25, 2024
- Rapiscan Holdings, Inc.
- Emmanuel St-Aubin
- G01 - MEASURING TESTING
Information Patent Application
Method and System for Determining the Location of Artefacts and/or...
- Publication number 20240133822
- Publication date Apr 25, 2024
- The Australian National University
- Roland Fleddermann
- G06 - COMPUTING CALCULATING COUNTING

imaging specifically internal structure

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Multifunctional and visual rock triaxial testing system

Methods for correlative microscopy

Serial arrangement having multiple plies of asymmetric filter media...

Radiation detector and radiography apparatus

System for estimating the occurrence of defects, and computer-reada...

Radiation detector and radiography apparatus

Method and plant for inspecting an animal carcass

Method and apparatus for monitoring beam profile and power

Assessing characteristics of subterranean formations using micro-co...

Devices and methods for high angle liquid electron tomography

Scan procedure generation systems and methods to generate scan proc...

Device and method for measuring the relative permeability of proppe...

Surface determination using three-dimensional voxel data

Adaptive specimen image acquisition using an artificial neural network

Cross-talk cancellation in multiple charged-particle beam inspection

Radiation analysis system, charged particle beam system, and radiat...

Estimating background radiation from unknown sources

Defect characterization method and apparatus

Rotational X-ray inspection system and method

Estimating heights of defects in a wafer by scaling a 3D model usin...

Inspection method, inspection system, and semiconductor fabrication...

Airfoil tip cleaning and assessment systems and methods

Entropy-diffusion method for fracture identification and labelling...

Crystal defect observation method for compound semiconductor

Structured detectors and detector systems for radiation imaging

CT scanner calibration

Method to use artificial intelligence to enhance visual inspection...

Adaptive specimen image acquisition

Material properties from two-dimensional image

Methods and systems for determining variability of cryo-EM protein...

Patents Applicationslast 30 patents

X-RAY MEASURING METHOD AND X-RAY MEASURING DEVICE FOR MEASURING A S...

AUGMENTATION OF ELECTRON ENERGY LOSS SPECTROSCOPY IN CHARGED PARTIC...

TRAINING SCANNING ELECTRON MICROSCOPY IMAGE SELECTION METHOD AND SE...

SYSTEM AND METHOD FOR INSPECTION BY FAILURE MECHANISM CLASSIFICATIO...

INSPECTION SYSTEM AND INSPECTION METHOD

MACHINE FOR THE COMPOSITE SCANNING OF OBJECTS

APPARATUS AND METHOD FOR X-RAY FLUORESCENCE IMAGING

CRYSTALLINE RESIN CONTAINING MICROSCOPIC SURFACE RELIEFS AND METHOD...

TWO-STAGE PIXEL DEVICE WITH ADAPTIVE FRAME GRABBING FOR X-RAY IMAGI...

TEM Orientation Mapping via Dark-Field Vector Images

CT SCANNER CALIBRATION

THIN-FILM-BASED ASSEMBLY

Method And Apparatus For Reconstructing Image Projections

APPARATUS FOR VERTICAL SCREENING

RAY SCANNING APPARATUS

RAY SCANNING APPARATUS

ESTIMATING SCATTER IN X-RAY IMAGES CAUSED BY IMAGING SYSTEM COMPONE...

SYSTEMS, APPARATUS, ARTICLES OF MANUFACTURE, AND METHODS TO INSPECT...

METHOD FOR SCANNING OF AN OBJECT IN A SCANNING APPARATUS

SYSTEM AND METHOD FOR UTILIZATION OF PHOTON COUNTING IN A CABINET X...

Systems and Methods for X-Ray Computed Tomography

QUALITY CONTROL EVALUATION METHOD OF CYANATE ESTER MATRIX RESIN MAT...

X-RAY INSPECTION APPARATUS

CHARGED PARTICLE BEAM SYSTEM, CORRECTOR FOR ABERRATION CORRECTION O...

Simulating Dissolution of Scale in Wells

LOW-TEMPERATURE PEROVSKITE SCINTILLATORS AND DEVICES WITH LOW-TEMPE...

DEVICE AND METHOD FOR MEASURING THE RELATIVE PERMEABILITY OF PROPPE...

X-RAY COMPUTED TOMOGRAPHY (CT) SCANNER

Calibration Method and Device Therefor

Method and System for Determining the Location of Artefacts and/or...