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incident ion beam and measuring X-rays [PIXE]

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Industry

  • CPC
  • G01N2223/0813
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Parent Industries

GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N2223/00Investigating materials by wave or particle radiation

Current Industry

G01N2223/0813incident ion beam and measuring X-rays [PIXE]
Industries

Patents Grantslast 30 patents

  • Information Patent Grant

    Spectrometer
    • Patent number 12,235,228
    • Issue date Feb 25, 2025
    • EasyXAFS, LLC
    • William Holden
    • G01 - MEASURING TESTING
  • Information Patent Grant

    3408496
    • Patent number 3,408,496
    • Issue date Oct 29, 1968
    • G01 - MEASURING TESTING
  • Information Patent Grant

    3351760
    • Patent number 3,351,760
    • Issue date Nov 7, 1967
    • B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL

Patents Applicationslast 30 patents