incident ion beam and measuring X-rays [PIXE]

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CPC
G01N2223/0813

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Parent Industries

GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N2223/00Investigating materials by wave or particle radiation

Current Industry

G01N2223/0813incident ion beam and measuring X-rays [PIXE]

Industries

Patents Grantslast 30 patents

Information Patent Grant
3408496
- Patent number 3,408,496
- Issue date Oct 29, 1968
- G01 - MEASURING TESTING
Information Patent Grant
3351760
- Patent number 3,351,760
- Issue date Nov 7, 1967
- B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL