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G01B9/02051

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GPHYSICS G01Measuring instruments G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS G01B9/00Instruments as specified in the subgroups and characterised by the use of optical measuring means

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G01B9/02051Integrated design

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Measuring apparatus, on-chip instrumentation device and measuring m...
- Patent number 12,181,278
- Issue date Dec 31, 2024
- Nippon Telegraph and Telephone Corporation
- Katsumasa Yoshioka
- G01 - MEASURING TESTING
Information Patent Grant
Optical device for heterodyne interferometry
- Patent number 12,181,279
- Issue date Dec 31, 2024
- CHAMARTIN LABORATORIES LLC
- Richard Grote
- G01 - MEASURING TESTING
Information Patent Grant
Mirror unit and optical module
- Patent number 12,152,878
- Issue date Nov 26, 2024
- Hamamatsu Photonics K.K.
- Tomofumi Suzuki
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Optical coherence tomography system
- Patent number 12,140,426
- Issue date Nov 12, 2024
- AIT Austrian Institute of Technology GmbH
- Rainer Hainberger
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for optical coherence tomography within integrated optoel...
- Patent number 12,064,210
- Issue date Aug 20, 2024
- Nokia Technologies Oy
- Michael Eggleston
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Polarization-separated, phase-shifted interferometer
- Patent number 12,000,698
- Issue date Jun 4, 2024
- Massachusetts Institute of Technology
- Noah Gilbert
- G01 - MEASURING TESTING
Information Patent Grant
Interferometer and optical instrument with integrated optical compo...
- Patent number 11,933,609
- Issue date Mar 19, 2024
- Yokogawa Electric Corporation
- Nobuhide Yamada
- G01 - MEASURING TESTING
Information Patent Grant
Mirror unit and optical module
- Patent number 11,879,731
- Issue date Jan 23, 2024
- Hamamatsu Photonics K.K.
- Tomofumi Suzuki
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Optical systems with controlled mirror arrangements
- Patent number 11,841,223
- Issue date Dec 12, 2023
- Lockheed Martin Corporation
- Brian James Howley
- G01 - MEASURING TESTING
Information Patent Grant
Interferometry assembly having optical paths through different mate...
- Patent number 11,835,337
- Issue date Dec 5, 2023
- Lumentum Technology UK Limited
- Adrian Perrin Janssen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus with cantilever light guide
- Patent number 11,828,592
- Issue date Nov 28, 2023
- Nokia Technologies Oy
- David Bitauld
- G01 - MEASURING TESTING
Information Patent Grant
Multi-environment Rayleigh interferometer
- Patent number 11,761,750
- Issue date Sep 19, 2023
- Aaron Pung
- G01 - MEASURING TESTING
Information Patent Grant
Optical component for an ATR interferometric imaging device
- Patent number 11,747,134
- Issue date Sep 5, 2023
- Commissariat a l'Energie Atomique et Aux Energies Alternatives
- Cyrielle Monpeurt
- G01 - MEASURING TESTING
Information Patent Grant
Methods and apparatus for decomposition to account for imperfect be...
- Patent number 11,747,132
- Issue date Sep 5, 2023
- Xanadu Quantum Technologies Inc.
- Ish Dhand
- G01 - MEASURING TESTING
Information Patent Grant
Heterodyne photonic integrated circuit for absolute metrology
- Patent number 11,703,317
- Issue date Jul 18, 2023
- Raytheon Company
- Richard Lee Kendrick
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for monitoring the output of an optical system
- Patent number 11,681,110
- Issue date Jun 20, 2023
- Lumentum Technology UK Limited
- Adrian Perrin Janssen
- G01 - MEASURING TESTING
Information Patent Grant
Optical module
- Patent number 11,635,290
- Issue date Apr 25, 2023
- Hamamatsu Photonics K.K.
- Tomofumi Suzuki
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Optical device
- Patent number 11,629,947
- Issue date Apr 18, 2023
- Hamamatsu Photonics K.K.
- Tomofumi Suzuki
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Mirror unit and optical module
- Patent number 11,629,946
- Issue date Apr 18, 2023
- Hamamatsu Photonics K.K.
- Tomofumi Suzuki
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Mirror unit and optical module
- Patent number 11,624,605
- Issue date Apr 11, 2023
- Hamamatsu Photonics K.K.
- Tomofumi Suzuki
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Integrated optical system with wavelength tuning and spatial switching
- Patent number 11,579,356
- Issue date Feb 14, 2023
- Eric Swanson
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Optical coherence tomography receiver
- Patent number 11,490,804
- Issue date Nov 8, 2022
- Alcon Inc.
- Muhammad K Al-Qaisi
- G01 - MEASURING TESTING
Information Patent Grant
Photonic integrated receiver
- Patent number 11,397,075
- Issue date Jul 26, 2022
- Eric Swanson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Optical delay line device with fixed or variable delay
- Patent number 11,353,660
- Issue date Jun 7, 2022
- KYLIA
- Aurélien Boutin
- G02 - OPTICS
Information Patent Grant
Swept frequency photonic integrated circuit for absolute metrology
- Patent number 11,320,255
- Issue date May 3, 2022
- Raytheon Company
- Richard Lee Kendrick
- G02 - OPTICS
Information Patent Grant
Two-degree-of-freedom heterodyne grating interferometry measurement...
- Patent number 11,307,018
- Issue date Apr 19, 2022
- Tsinghua University
- Yu Zhu
- G01 - MEASURING TESTING
Information Patent Grant
Interferometric optical fiber measurement system with multicore opt...
- Patent number 11,243,346
- Issue date Feb 8, 2022
- Eric Swanson
- G01 - MEASURING TESTING
Information Patent Grant
Optical fiber system with photonic integrated circuit coupled to mu...
- Patent number 11,243,347
- Issue date Feb 8, 2022
- Eric Swanson
- G01 - MEASURING TESTING
Information Patent Grant
Optical microphone assembly
- Patent number 11,240,607
- Issue date Feb 1, 2022
- SINTEF TTO AS
- Hallvard Angelskår
- G01 - MEASURING TESTING
Information Patent Grant
Heterodyne photonic integrated circuit for absolute metrology
- Patent number 11,221,204
- Issue date Jan 11, 2022
- Raytheon Company
- Richard Lee Kendrick
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
OPTICAL COHERENCE TOMOGRAPH
- Publication number 20240393099
- Publication date Nov 28, 2024
- FURUKAWA ELECTRIC CO., LTD.
- Noritaka MATSUBARA
- G02 - OPTICS
Information Patent Application
PIEZOELECTRIC INTERFEROMETER
- Publication number 20240175673
- Publication date May 30, 2024
- Murata Manufacturing Co., Ltd.
- Ville KAAJAKARI
- G01 - MEASURING TESTING
Information Patent Application
On-Chip Opto-Digital Wavelength Meter
- Publication number 20240175672
- Publication date May 30, 2024
- Axalume, Inc.
- Yossef Ehrlichman
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL LOCKER
- Publication number 20240110778
- Publication date Apr 4, 2024
- Lumentum Technology UK Limited
- Adrian Perrin JANSSEN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MIRROR UNIT AND OPTICAL MODULE
- Publication number 20240110779
- Publication date Apr 4, 2024
- HAMAMATSU PHOTONICS K. K.
- Tomofumi Suzuki
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
CABIN ENTRY-AND-EXIT STRUCTURE OF ANALYSIS DEVICE, ANALYSIS DEVICE...
- Publication number 20240035802
- Publication date Feb 1, 2024
- Beijing BOE Technology Development Co., Ltd.
- Xiangguo MA
- G01 - MEASURING TESTING
Information Patent Application
QUANTUM SENSOR AND SYNXAPPS ARRAY
- Publication number 20240011763
- Publication date Jan 11, 2024
- Demond Adams
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
LASER PROCESSING SYSTEM HAVING OPTICAL DIFFRACTION TOMOGRAPHY FUNCTION
- Publication number 20230356324
- Publication date Nov 9, 2023
- INNOFOCUS PHOTONICS TECHNOLOGY PTY LTD
- Baohua JIA
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
OPTICAL DEVICE
- Publication number 20230221106
- Publication date Jul 13, 2023
- HAMAMATSU PHOTONICS K. K.
- Tomofumi Suzuki
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
Measuring Apparatus, On-Chip Instrumentation Device and Measuring M...
- Publication number 20230077185
- Publication date Mar 9, 2023
- Nippon Telegraph and Telephone Corporation
- Katsumasa Yoshioka
- G01 - MEASURING TESTING
Information Patent Application
In-Situ Residual Intensity Noise Measurement Method And System
- Publication number 20230049259
- Publication date Feb 16, 2023
- KVH Industries, Inc.
- Jan Amir Khan
- G01 - MEASURING TESTING
Information Patent Application
FREQUENCY SHIFTER FOR HETERODYNE INTERFEROMETRY MEASUREMENTS AND DE...
- Publication number 20230046152
- Publication date Feb 16, 2023
- ROCKLEY PHOTONICS LIMITED
- Richard GROTE
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL COHERENCE TOMOGRAPHY RECEIVER
- Publication number 20230021386
- Publication date Jan 26, 2023
- Alcon Inc.
- Muhammad K. Al-Qaisi
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL DEVICE FOR HETERODYNE INTERFEROMETRY
- Publication number 20230019946
- Publication date Jan 19, 2023
- ROCKLEY PHOTONICS LIMITED
- Richard GROTE
- G02 - OPTICS
Information Patent Application
MIRROR UNIT AND OPTICAL MODULE
- Publication number 20230003504
- Publication date Jan 5, 2023
- HAMAMATSU PHOTONICS K. K.
- Tomofumi Suzuki
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
OPTICAL COHERENCE TOMOGRAPHY SYSTEM
- Publication number 20220290970
- Publication date Sep 15, 2022
- AIT AUSTRIAN INSTITUTE OF TECHNOLOGY GMBH
- Rainer HAINBERGER
- G01 - MEASURING TESTING
Information Patent Application
HETERODYNE PHOTONIC INTEGRATED CIRCUIT FOR ABSOLUTE METROLOGY
- Publication number 20220187055
- Publication date Jun 16, 2022
- Raytheon Company
- Richard Lee Kendrick
- G02 - OPTICS
Information Patent Application
APPARATUS FOR MONITORING THE OUTPUT OF AN OPTICAL SYSTEM
- Publication number 20220113481
- Publication date Apr 14, 2022
- Lumentum Technology UK Limited
- Adrian Perrin JANSSEN
- G01 - MEASURING TESTING
Information Patent Application
Interferometric Cartridge System and Related Methods
- Publication number 20220090908
- Publication date Mar 24, 2022
- Salvus, LLC
- Ron LEVIN
- G01 - MEASURING TESTING
Information Patent Application
SWEPT FREQUENCY PHOTONIC INTEGRATED CIRCUIT FOR ABSOLUTE METROLOGY
- Publication number 20220049945
- Publication date Feb 17, 2022
- Raytheon Company
- Richard Lee Kendrick
- G01 - MEASURING TESTING
Information Patent Application
Photonic Integrated Receiver
- Publication number 20210278196
- Publication date Sep 9, 2021
- Eric Swanson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
OPTICAL MODULE
- Publication number 20210278274
- Publication date Sep 9, 2021
- HAMAMATSU PHOTONICS K. K.
- Tomofumi SUZUKI
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
OPTICAL MICROPHONE ASSEMBLY
- Publication number 20210274291
- Publication date Sep 2, 2021
- SINTEF TTO AS
- Hallvard Angelskår
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS FOR OPTICAL COHERENCE TOMOGRAPHY
- Publication number 20210085184
- Publication date Mar 25, 2021
- Nokia Technologies Oy
- Michael EGGLESTON
- G01 - MEASURING TESTING
Information Patent Application
Interferometric Optical Fiber Measurement System with Multicore Opt...
- Publication number 20210088438
- Publication date Mar 25, 2021
- Eric Swanson
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
Optical Fiber System with Photonic Integrated Circuit Coupled to Mu...
- Publication number 20210063302
- Publication date Mar 4, 2021
- Eric Swanson
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
COMMON-PATH INTEGRATED LOW COHERENCE INTERFEROMETRY SYSTEM AND METH...
- Publication number 20200340797
- Publication date Oct 29, 2020
- ACADEMISCH MEDISCH CENTRUM
- Antonius van Leeuwen
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL DELAY LINE DEVICE WITH FIXED OR VARIABLE DELAY
- Publication number 20200166708
- Publication date May 28, 2020
- KYLIA
- Aurélien BOUTIN
- G02 - OPTICS
Information Patent Application
SPACE DIVISION MULTIPLEXING OPTICAL COHERENCE TOMOGRAPHY USING AN I...
- Publication number 20200166328
- Publication date May 28, 2020
- LEHIGH UNIVERSITY
- Chao Zhou
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
Wavelength Tunable Laser Device
- Publication number 20200149865
- Publication date May 14, 2020
- Eric Swanson
- H01 - BASIC ELECTRIC ELEMENTS

Integrated design

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Measuring apparatus, on-chip instrumentation device and measuring m...

Optical device for heterodyne interferometry

Mirror unit and optical module

Optical coherence tomography system

Apparatus for optical coherence tomography within integrated optoel...

Polarization-separated, phase-shifted interferometer

Interferometer and optical instrument with integrated optical compo...

Mirror unit and optical module

Optical systems with controlled mirror arrangements

Interferometry assembly having optical paths through different mate...

Apparatus with cantilever light guide

Multi-environment Rayleigh interferometer

Optical component for an ATR interferometric imaging device

Methods and apparatus for decomposition to account for imperfect be...

Heterodyne photonic integrated circuit for absolute metrology

Apparatus for monitoring the output of an optical system

Optical module

Optical device

Mirror unit and optical module

Mirror unit and optical module

Integrated optical system with wavelength tuning and spatial switching

Optical coherence tomography receiver

Photonic integrated receiver

Optical delay line device with fixed or variable delay

Swept frequency photonic integrated circuit for absolute metrology

Two-degree-of-freedom heterodyne grating interferometry measurement...

Interferometric optical fiber measurement system with multicore opt...

Optical fiber system with photonic integrated circuit coupled to mu...

Optical microphone assembly

Heterodyne photonic integrated circuit for absolute metrology

Patents Applicationslast 30 patents

OPTICAL COHERENCE TOMOGRAPH

PIEZOELECTRIC INTERFEROMETER

On-Chip Opto-Digital Wavelength Meter

OPTICAL LOCKER

MIRROR UNIT AND OPTICAL MODULE

CABIN ENTRY-AND-EXIT STRUCTURE OF ANALYSIS DEVICE, ANALYSIS DEVICE...

QUANTUM SENSOR AND SYNXAPPS ARRAY

LASER PROCESSING SYSTEM HAVING OPTICAL DIFFRACTION TOMOGRAPHY FUNCTION

OPTICAL DEVICE

Measuring Apparatus, On-Chip Instrumentation Device and Measuring M...

In-Situ Residual Intensity Noise Measurement Method And System

FREQUENCY SHIFTER FOR HETERODYNE INTERFEROMETRY MEASUREMENTS AND DE...

OPTICAL COHERENCE TOMOGRAPHY RECEIVER

OPTICAL DEVICE FOR HETERODYNE INTERFEROMETRY

MIRROR UNIT AND OPTICAL MODULE

OPTICAL COHERENCE TOMOGRAPHY SYSTEM

HETERODYNE PHOTONIC INTEGRATED CIRCUIT FOR ABSOLUTE METROLOGY

APPARATUS FOR MONITORING THE OUTPUT OF AN OPTICAL SYSTEM

Interferometric Cartridge System and Related Methods

SWEPT FREQUENCY PHOTONIC INTEGRATED CIRCUIT FOR ABSOLUTE METROLOGY

Photonic Integrated Receiver

OPTICAL MODULE

OPTICAL MICROPHONE ASSEMBLY

APPARATUS FOR OPTICAL COHERENCE TOMOGRAPHY

Interferometric Optical Fiber Measurement System with Multicore Opt...

Optical Fiber System with Photonic Integrated Circuit Coupled to Mu...

COMMON-PATH INTEGRATED LOW COHERENCE INTERFEROMETRY SYSTEM AND METH...

OPTICAL DELAY LINE DEVICE WITH FIXED OR VARIABLE DELAY

SPACE DIVISION MULTIPLEXING OPTICAL COHERENCE TOMOGRAPHY USING AN I...

Wavelength Tunable Laser Device