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G01B9/02051
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Parent Industries
G
PHYSICS
G01
Measuring instruments
G01B
MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
G01B9/00
Instruments as specified in the subgroups and characterised by the use of optical measuring means
Current Industry
G01B9/02051
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Patents Grants
last 30 patents
Information
Patent Grant
Interferometer and optical instrument with integrated optical compo...
Patent number
11,933,609
Issue date
Mar 19, 2024
Yokogawa Electric Corporation
Nobuhide Yamada
G01 - MEASURING TESTING
Information
Patent Grant
Mirror unit and optical module
Patent number
11,879,731
Issue date
Jan 23, 2024
Hamamatsu Photonics K.K.
Tomofumi Suzuki
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Optical systems with controlled mirror arrangements
Patent number
11,841,223
Issue date
Dec 12, 2023
Lockheed Martin Corporation
Brian James Howley
G01 - MEASURING TESTING
Information
Patent Grant
Interferometry assembly having optical paths through different mate...
Patent number
11,835,337
Issue date
Dec 5, 2023
Lumentum Technology UK Limited
Adrian Perrin Janssen
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Apparatus with cantilever light guide
Patent number
11,828,592
Issue date
Nov 28, 2023
Nokia Technologies Oy
David Bitauld
G01 - MEASURING TESTING
Information
Patent Grant
Multi-environment Rayleigh interferometer
Patent number
11,761,750
Issue date
Sep 19, 2023
Aaron Pung
G01 - MEASURING TESTING
Information
Patent Grant
Optical component for an ATR interferometric imaging device
Patent number
11,747,134
Issue date
Sep 5, 2023
Commissariat a l'Energie Atomique et Aux Energies Alternatives
Cyrielle Monpeurt
G01 - MEASURING TESTING
Information
Patent Grant
Methods and apparatus for decomposition to account for imperfect be...
Patent number
11,747,132
Issue date
Sep 5, 2023
Xanadu Quantum Technologies Inc.
Ish Dhand
G01 - MEASURING TESTING
Information
Patent Grant
Heterodyne photonic integrated circuit for absolute metrology
Patent number
11,703,317
Issue date
Jul 18, 2023
Raytheon Company
Richard Lee Kendrick
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus for monitoring the output of an optical system
Patent number
11,681,110
Issue date
Jun 20, 2023
Lumentum Technology UK Limited
Adrian Perrin Janssen
G01 - MEASURING TESTING
Information
Patent Grant
Optical module
Patent number
11,635,290
Issue date
Apr 25, 2023
Hamamatsu Photonics K.K.
Tomofumi Suzuki
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Optical device
Patent number
11,629,947
Issue date
Apr 18, 2023
Hamamatsu Photonics K.K.
Tomofumi Suzuki
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Mirror unit and optical module
Patent number
11,629,946
Issue date
Apr 18, 2023
Hamamatsu Photonics K.K.
Tomofumi Suzuki
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Mirror unit and optical module
Patent number
11,624,605
Issue date
Apr 11, 2023
Hamamatsu Photonics K.K.
Tomofumi Suzuki
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Integrated optical system with wavelength tuning and spatial switching
Patent number
11,579,356
Issue date
Feb 14, 2023
Eric Swanson
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Grant
Optical coherence tomography receiver
Patent number
11,490,804
Issue date
Nov 8, 2022
Alcon Inc.
Muhammad K Al-Qaisi
G01 - MEASURING TESTING
Information
Patent Grant
Photonic integrated receiver
Patent number
11,397,075
Issue date
Jul 26, 2022
Eric Swanson
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Optical delay line device with fixed or variable delay
Patent number
11,353,660
Issue date
Jun 7, 2022
KYLIA
Aurélien Boutin
G02 - OPTICS
Information
Patent Grant
Swept frequency photonic integrated circuit for absolute metrology
Patent number
11,320,255
Issue date
May 3, 2022
Raytheon Company
Richard Lee Kendrick
G02 - OPTICS
Information
Patent Grant
Two-degree-of-freedom heterodyne grating interferometry measurement...
Patent number
11,307,018
Issue date
Apr 19, 2022
Tsinghua University
Yu Zhu
G01 - MEASURING TESTING
Information
Patent Grant
Interferometric optical fiber measurement system with multicore opt...
Patent number
11,243,346
Issue date
Feb 8, 2022
Eric Swanson
G01 - MEASURING TESTING
Information
Patent Grant
Optical fiber system with photonic integrated circuit coupled to mu...
Patent number
11,243,347
Issue date
Feb 8, 2022
Eric Swanson
G01 - MEASURING TESTING
Information
Patent Grant
Optical microphone assembly
Patent number
11,240,607
Issue date
Feb 1, 2022
SINTEF TTO AS
Hallvard Angelskår
G01 - MEASURING TESTING
Information
Patent Grant
Heterodyne photonic integrated circuit for absolute metrology
Patent number
11,221,204
Issue date
Jan 11, 2022
Raytheon Company
Richard Lee Kendrick
G01 - MEASURING TESTING
Information
Patent Grant
Optical module having high-accuracy spectral analysis
Patent number
11,209,260
Issue date
Dec 28, 2021
Hamamatsu Photonics K.K.
Tomofumi Suzuki
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Coherent receiver array
Patent number
11,187,517
Issue date
Nov 30, 2021
Acacia Communications, Inc.
Christopher Doerr
G01 - MEASURING TESTING
Information
Patent Grant
Optical device
Patent number
11,187,579
Issue date
Nov 30, 2021
Hamamatsu Photonics K.K.
Tomofumi Suzuki
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Housing system for Michelson interferometer
Patent number
11,162,775
Issue date
Nov 2, 2021
Agency for Defense Development
Jongmin Lee
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus for monitoring the output of an optical system and to acc...
Patent number
11,137,556
Issue date
Oct 5, 2021
Lumentum Technology UK Limited
Adrian Perrin Janssen
G02 - OPTICS
Information
Patent Grant
Space division multiplexing optical coherence tomography using an i...
Patent number
11,079,214
Issue date
Aug 3, 2021
Lehigh University
Chao Zhou
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
OPTICAL LOCKER
Publication number
20240110778
Publication date
Apr 4, 2024
Lumentum Technology UK Limited
Adrian Perrin JANSSEN
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
MIRROR UNIT AND OPTICAL MODULE
Publication number
20240110779
Publication date
Apr 4, 2024
HAMAMATSU PHOTONICS K. K.
Tomofumi Suzuki
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
CABIN ENTRY-AND-EXIT STRUCTURE OF ANALYSIS DEVICE, ANALYSIS DEVICE...
Publication number
20240035802
Publication date
Feb 1, 2024
Beijing BOE Technology Development Co., Ltd.
Xiangguo MA
G01 - MEASURING TESTING
Information
Patent Application
QUANTUM SENSOR AND SYNXAPPS ARRAY
Publication number
20240011763
Publication date
Jan 11, 2024
Demond Adams
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
LASER PROCESSING SYSTEM HAVING OPTICAL DIFFRACTION TOMOGRAPHY FUNCTION
Publication number
20230356324
Publication date
Nov 9, 2023
INNOFOCUS PHOTONICS TECHNOLOGY PTY LTD
Baohua JIA
B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information
Patent Application
OPTICAL DEVICE
Publication number
20230221106
Publication date
Jul 13, 2023
HAMAMATSU PHOTONICS K. K.
Tomofumi Suzuki
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
Measuring Apparatus, On-Chip Instrumentation Device and Measuring M...
Publication number
20230077185
Publication date
Mar 9, 2023
Nippon Telegraph and Telephone Corporation
Katsumasa Yoshioka
G01 - MEASURING TESTING
Information
Patent Application
In-Situ Residual Intensity Noise Measurement Method And System
Publication number
20230049259
Publication date
Feb 16, 2023
KVH Industries, Inc.
Jan Amir Khan
G01 - MEASURING TESTING
Information
Patent Application
FREQUENCY SHIFTER FOR HETERODYNE INTERFEROMETRY MEASUREMENTS AND DE...
Publication number
20230046152
Publication date
Feb 16, 2023
ROCKLEY PHOTONICS LIMITED
Richard GROTE
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL COHERENCE TOMOGRAPHY RECEIVER
Publication number
20230021386
Publication date
Jan 26, 2023
Alcon Inc.
Muhammad K. Al-Qaisi
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL DEVICE FOR HETERODYNE INTERFEROMETRY
Publication number
20230019946
Publication date
Jan 19, 2023
ROCKLEY PHOTONICS LIMITED
Richard GROTE
G02 - OPTICS
Information
Patent Application
MIRROR UNIT AND OPTICAL MODULE
Publication number
20230003504
Publication date
Jan 5, 2023
HAMAMATSU PHOTONICS K. K.
Tomofumi Suzuki
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
OPTICAL COHERENCE TOMOGRAPHY SYSTEM
Publication number
20220290970
Publication date
Sep 15, 2022
AIT AUSTRIAN INSTITUTE OF TECHNOLOGY GMBH
Rainer HAINBERGER
G01 - MEASURING TESTING
Information
Patent Application
HETERODYNE PHOTONIC INTEGRATED CIRCUIT FOR ABSOLUTE METROLOGY
Publication number
20220187055
Publication date
Jun 16, 2022
Raytheon Company
Richard Lee Kendrick
G02 - OPTICS
Information
Patent Application
APPARATUS FOR MONITORING THE OUTPUT OF AN OPTICAL SYSTEM
Publication number
20220113481
Publication date
Apr 14, 2022
Lumentum Technology UK Limited
Adrian Perrin JANSSEN
G01 - MEASURING TESTING
Information
Patent Application
Interferometric Cartridge System and Related Methods
Publication number
20220090908
Publication date
Mar 24, 2022
Salvus, LLC
Ron LEVIN
G01 - MEASURING TESTING
Information
Patent Application
SWEPT FREQUENCY PHOTONIC INTEGRATED CIRCUIT FOR ABSOLUTE METROLOGY
Publication number
20220049945
Publication date
Feb 17, 2022
Raytheon Company
Richard Lee Kendrick
G01 - MEASURING TESTING
Information
Patent Application
Photonic Integrated Receiver
Publication number
20210278196
Publication date
Sep 9, 2021
Eric Swanson
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
OPTICAL MODULE
Publication number
20210278274
Publication date
Sep 9, 2021
HAMAMATSU PHOTONICS K. K.
Tomofumi SUZUKI
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
OPTICAL MICROPHONE ASSEMBLY
Publication number
20210274291
Publication date
Sep 2, 2021
SINTEF TTO AS
Hallvard Angelskår
G01 - MEASURING TESTING
Information
Patent Application
APPARATUS FOR OPTICAL COHERENCE TOMOGRAPHY
Publication number
20210085184
Publication date
Mar 25, 2021
Nokia Technologies Oy
Michael EGGLESTON
G01 - MEASURING TESTING
Information
Patent Application
Interferometric Optical Fiber Measurement System with Multicore Opt...
Publication number
20210088438
Publication date
Mar 25, 2021
Eric Swanson
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Application
Optical Fiber System with Photonic Integrated Circuit Coupled to Mu...
Publication number
20210063302
Publication date
Mar 4, 2021
Eric Swanson
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Application
COMMON-PATH INTEGRATED LOW COHERENCE INTERFEROMETRY SYSTEM AND METH...
Publication number
20200340797
Publication date
Oct 29, 2020
ACADEMISCH MEDISCH CENTRUM
Antonius van Leeuwen
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL DELAY LINE DEVICE WITH FIXED OR VARIABLE DELAY
Publication number
20200166708
Publication date
May 28, 2020
KYLIA
Aurélien BOUTIN
G02 - OPTICS
Information
Patent Application
SPACE DIVISION MULTIPLEXING OPTICAL COHERENCE TOMOGRAPHY USING AN I...
Publication number
20200166328
Publication date
May 28, 2020
LEHIGH UNIVERSITY
Chao Zhou
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Application
Wavelength Tunable Laser Device
Publication number
20200149865
Publication date
May 14, 2020
Eric Swanson
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
FOURIER-TRANSFORM INTERFEROMETER USING META SURFACE
Publication number
20200110323
Publication date
Apr 9, 2020
Samsung Electronics Co., Ltd.
Yeonsang PARK
G02 - OPTICS
Information
Patent Application
APPARATUS FOR MONITORING THE OUTPUT OF AN OPTICAL SYSTEM
Publication number
20200110232
Publication date
Apr 9, 2020
Adrian Perrin JANSSEN
G02 - OPTICS
Information
Patent Application
Wavelength Tunable Laser Device
Publication number
20190368859
Publication date
Dec 5, 2019
Eric Swanson
G01 - MEASURING TESTING