Interferometers for determining dimensional properties of, or relations between, measurement objects

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G01B9/02

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GPHYSICS G01Measuring instruments G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS G01B9/00Instruments as specified in the subgroups and characterised by the use of optical measuring means

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G01B9/02Interferometers for determining dimensional properties of, or relations between, measurement objects

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Compact snapshot dual-mode interferometric system
- Patent number 12,203,752
- Issue date Jan 21, 2025
- Arizona Board of Regents on behalf of the University of Arizona
- Rongguang Liang
- G01 - MEASURING TESTING
Information Patent Grant
Methods and apparatus for an adjustable beam directing optical system
- Patent number 12,203,751
- Issue date Jan 21, 2025
- UNITED STATES OF AMERICA AS REPRESENTED BY THE ADMINISTRATOR OF NASA.
- Brett F. Bathel
- G01 - MEASURING TESTING
Information Patent Grant
Photonic quantum networking for large superconducting qubit modules
- Patent number 12,204,997
- Issue date Jan 21, 2025
- Rigetti & Co, LLC
- Matthew J. Reagor
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
OCT device
- Patent number 12,201,358
- Issue date Jan 21, 2025
- Nidek Co., Ltd.
- Taisei Yoshida
- G01 - MEASURING TESTING
Information Patent Grant
Method for measuring the diameter of filament diffraction fringes b...
- Patent number 12,196,540
- Issue date Jan 14, 2025
- Zhejiang University of Technology
- Qiang Lin
- G01 - MEASURING TESTING
Information Patent Grant
Broadband interferometry and method for measurement range extension...
- Patent number 12,196,551
- Issue date Jan 14, 2025
- Automated Precision Inc.
- Yongwoo Park
- G01 - MEASURING TESTING
Information Patent Grant
System and method for determining post bonding overlay
- Patent number 12,197,137
- Issue date Jan 14, 2025
- KLA Corporation
- Franz Zach
- G01 - MEASURING TESTING
Information Patent Grant
Optical measurement system
- Patent number 12,196,550
- Issue date Jan 14, 2025
- National Cheng Kung University
- Chien-Sheng Liu
- G01 - MEASURING TESTING
Information Patent Grant
Defect inspection device and defect inspection method
- Patent number 12,188,769
- Issue date Jan 7, 2025
- Shimadzu Corporation
- Koki Yoshida
- G01 - MEASURING TESTING
Information Patent Grant
Heterodyne two-dimensional grating measuring device and measuring m...
- Patent number 12,188,793
- Issue date Jan 7, 2025
- CHANGCHUN INSTITUTE OF OPTICS, FINE MECHANICS AND PHYSICS, ACADEMY OF SCIENCES
- Wenhao Li
- G01 - MEASURING TESTING
Information Patent Grant
Optical device and method for manufacturing same
- Patent number 12,180,063
- Issue date Dec 31, 2024
- Hamamatsu Photonics K.K.
- Tatsuya Sugimoto
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Laser eye surgery system calibration
- Patent number 12,178,752
- Issue date Dec 31, 2024
- AMO Development, LLC
- Bruce Woodley
- G01 - MEASURING TESTING
Information Patent Grant
Measuring apparatus, on-chip instrumentation device and measuring m...
- Patent number 12,181,278
- Issue date Dec 31, 2024
- Nippon Telegraph and Telephone Corporation
- Katsumasa Yoshioka
- G01 - MEASURING TESTING
Information Patent Grant
Truncated nonlinear interferometer-based sensor system
- Patent number 12,181,773
- Issue date Dec 31, 2024
- UT-Battelle, LLC
- Raphael C. Pooser
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Optical device for heterodyne interferometry
- Patent number 12,181,279
- Issue date Dec 31, 2024
- CHAMARTIN LABORATORIES LLC
- Richard Grote
- G01 - MEASURING TESTING
Information Patent Grant
Quantum network devices, systems, and methods
- Patent number 12,184,769
- Issue date Dec 31, 2024
- The Research Foundation for the State University of New York
- Eden Figueroa
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Laser interferometer
- Patent number 12,181,277
- Issue date Dec 31, 2024
- Seiko Epson Corporation
- Kohei Yamada
- G01 - MEASURING TESTING
Information Patent Grant
Systems, methods, and media for multiple reference arm spectral dom...
- Patent number 12,181,280
- Issue date Dec 31, 2024
- The General Hospital Corporation
- Guillermo J. Tearney
- G01 - MEASURING TESTING
Information Patent Grant
Chip-scale frequency-comb assisted coherent lidar ranging with sub-...
- Patent number 12,174,016
- Issue date Dec 24, 2024
- The Regents of the University of California
- Yoon-Soo Jang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Composite measurement system for measuring nanometer displacement
- Patent number 12,174,017
- Issue date Dec 24, 2024
- National Institute of Metrology, China
- Yushu Shi
- G01 - MEASURING TESTING
Information Patent Grant
Self-configuration and error correction in linear photonic circuits
- Patent number 12,174,018
- Issue date Dec 24, 2024
- Massachusetts Institute of Technology
- Ryan Hamerly
- G01 - MEASURING TESTING
Information Patent Grant
Devices, systems, and methods for imaging in certain endoscopic env...
- Patent number 12,171,524
- Issue date Dec 24, 2024
- Duke University
- Adam Wax
- G01 - MEASURING TESTING
Information Patent Grant
Resolving absolute depth in circular-ranging optical coherence tomo...
- Patent number 12,174,115
- Issue date Dec 24, 2024
- The General Hospital Corporation
- Benjamin Vakoc
- G01 - MEASURING TESTING
Information Patent Grant
Frequency control of orthogonal polarisation modes in an optical ca...
- Patent number 12,174,015
- Issue date Dec 24, 2024
- The University of Birmingham
- Kai Bongs
- G01 - MEASURING TESTING
Information Patent Grant
Frequency-domain optical coherence tomography with extended field-o...
- Patent number 12,169,124
- Issue date Dec 17, 2024
- NINEPOINT MEDICAL, INC.
- Eman Namati
- G01 - MEASURING TESTING
Information Patent Grant
Optical interferometry proximity sensor with temperature variation...
- Patent number 12,169,125
- Issue date Dec 17, 2024
- Apple Inc.
- Mengshu Huang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Device and method for imaging and interferometry measurements
- Patent number 12,163,777
- Issue date Dec 10, 2024
- FOGALE NANOTECH
- Alain Courteville
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Metrology method and apparatus for of determining a complex-valued...
- Patent number 12,164,233
- Issue date Dec 10, 2024
- ASML Netherlands B.V.
- Alexander Prasetya Konijnenberg
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Digital holography for alignment in layer deposition
- Patent number 12,163,783
- Issue date Dec 10, 2024
- Applied Materials, Inc.
- Yeishin Tung
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Device and method for measuring laser displacement
- Patent number 12,158,340
- Issue date Dec 3, 2024
- National Institute of Metrology, China
- Jianjun Cui
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
OPTICAL COHERENCE TOMOGRAPHY APPARATUS, OPTICAL COHERENCE TOMOGRAPH...
- Publication number 20250020447
- Publication date Jan 16, 2025
- DAIKIN INDUSTRIES, LTD.
- Masao NOUMI
- G01 - MEASURING TESTING
Information Patent Application
LASER ARCHITECTURE FOR COMPONENT EFFICIENT ATOMIC INTERFEROMETER GR...
- Publication number 20250020446
- Publication date Jan 16, 2025
- AOSense, Inc.
- Miroslav Y. Shverdin
- G01 - MEASURING TESTING
Information Patent Application
BOND-SELECTIVE FULL-FIELD OPTICAL COHERENCE TOMOGRAPHY
- Publication number 20250012557
- Publication date Jan 9, 2025
- Trustees of Boston University
- Ji-Xin Cheng
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR MEASUREMENT APPARATUS
- Publication number 20250012556
- Publication date Jan 9, 2025
- Samsung Electronics Co., Ltd.
- Younguk Jin
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR QUANTITATIVE EVALUATION OF CONTACT LENS EDGE LIFT BASED...
- Publication number 20250003731
- Publication date Jan 2, 2025
- Alcon Inc.
- Yeming Gu
- G02 - OPTICS
Information Patent Application
PRECISION QUANTUM-INTERFERENCE-BASED NON-LOCAL CONTACTLESS MEASUREMENT
- Publication number 20250003730
- Publication date Jan 2, 2025
- THE BOARD OF TRUSTEES OF THE UNIVERSITY OF ILLINOIS
- Paul G Kwiat
- G01 - MEASURING TESTING
Information Patent Application
REFLECTIVE CO-AXIAL INTERFEROMETER SYSTEMS AND METHODS THEREOF
- Publication number 20240426594
- Publication date Dec 26, 2024
- OptiPro Systems, LLC
- James F. Munro
- G01 - MEASURING TESTING
Information Patent Application
SUPER INTERFEROMETRIC RANGE RESOLUTION
- Publication number 20240418498
- Publication date Dec 19, 2024
- Chapman University
- John Howell
- G01 - MEASURING TESTING
Information Patent Application
Relative intensity noise Cat's-eye swept source laser for OCT and s...
- Publication number 20240418497
- Publication date Dec 19, 2024
- KineoLabs, Inc.
- Walid A. Atia
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
DOUBLE-MIRROR SHEAR INTERFEROMETER
- Publication number 20240418499
- Publication date Dec 19, 2024
- HOCHSCHULE TRIER
- Christopher PETRY
- G01 - MEASURING TESTING
Information Patent Application
MONITORING OBJECTS IN AQUEOUS MEDIA USING OPTICAL COHERENCE TOMOGRAPHY
- Publication number 20240410685
- Publication date Dec 12, 2024
- ChromoLogic LLC
- Matthew BREHOVE
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND DEVICE FOR MEASURING INTERFACES OF AN OPTICAL ELEMENT
- Publication number 20240402039
- Publication date Dec 5, 2024
- FOGALE NANOTECH
- Eric LEGROS
- G01 - MEASURING TESTING
Information Patent Application
DETERMINATION OF A CHANGE OF OBJECT'S SHAPE
- Publication number 20240401928
- Publication date Dec 5, 2024
- Nikon Corporation
- Eric Peter Goodwin
- G01 - MEASURING TESTING
Information Patent Application
SURFACE METROLOGY SYSTEMS AND METHODS THEREOF
- Publication number 20240401938
- Publication date Dec 5, 2024
- OptiPro Systems, LLC
- James Fredric Munro
- G01 - MEASURING TESTING
Information Patent Application
ABSOLUTE MEASUREMENT METHOD FOR THE PHASE OF THE COMPLEX COHERENCE...
- Publication number 20240401927
- Publication date Dec 5, 2024
- SHANGHAI INSTITUTE OF TECHNICAL PHYSICS, CHINESE ACADEMY OF SCIENCES
- Qinghua YU
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF MEASURING BENDING OF AN ELONGATE VERTICALLY ORIENTED CHANNEL
- Publication number 20240401937
- Publication date Dec 5, 2024
- JOINT STOCK COMPANY "ROSENERGOATOM"
- Artyom Nikolaevich FEDOROV
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR THE FUNCTIONAL CHARACTERISATION OF OPTICAL LENSES
- Publication number 20240402040
- Publication date Dec 5, 2024
- FOGALE NANOTECH
- Eric LEGROS
- G01 - MEASURING TESTING
Information Patent Application
META-MATERIAL INTERFEROMETRY SYSTEMS AND METHODS
- Publication number 20240402407
- Publication date Dec 5, 2024
- Danbury Mission Technologies, LLC
- Alexander J. Majewski
- G02 - OPTICS
Information Patent Application
OPTICAL COHERENCE TOMOGRAPH
- Publication number 20240393099
- Publication date Nov 28, 2024
- FURUKAWA ELECTRIC CO., LTD.
- Noritaka MATSUBARA
- G02 - OPTICS
Information Patent Application
THREE-DIMENSIONAL SHAPE MEASURING DEVICE, REFERENCE SURFACE POSITIO...
- Publication number 20240393097
- Publication date Nov 28, 2024
- TOKYO SEIMITSU CO., LTD.
- Yoshiyuki KAWATA
- G01 - MEASURING TESTING
Information Patent Application
ADJUSTMENT METHOD FOR SHAPE MEASURING DEVICE
- Publication number 20240393098
- Publication date Nov 28, 2024
- TOKYO SEIMITSU CO., LTD.
- Yoshiyuki KAWATA
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR MAPPING AND RANGE DETECTION
- Publication number 20240384979
- Publication date Nov 21, 2024
- LIDWAVE LTD.
- Yehuda HAI VIDAL
- G01 - MEASURING TESTING
Information Patent Application
Multi-Channel Self-Mixing Interferometric Sensor
- Publication number 20240384980
- Publication date Nov 21, 2024
- Apple Inc.
- Tong Chen
- G01 - MEASURING TESTING
Information Patent Application
Laser Interferometer And Method Of Adjusting Optical Axis Of Laser...
- Publication number 20240384978
- Publication date Nov 21, 2024
- SEIKO EPSON CORPORATION
- Jun KITAGAWA
- G01 - MEASURING TESTING
Information Patent Application
Three-Wavelengths Interferometric Measuring Device And Method
- Publication number 20240377183
- Publication date Nov 14, 2024
- TAYLOR HOBSON LTD.
- Christian Am Weg
- G01 - MEASURING TESTING
Information Patent Application
Systems and Methods for 1-Micron Frequency Comb Optical Coherence T...
- Publication number 20240377184
- Publication date Nov 14, 2024
- The Regents of the University of California
- Tristan Melton
- G01 - MEASURING TESTING
Information Patent Application
METHOD, INTERFEROMETER AND SIGNAL PROCESSING DEVICE, EACH FOR DETER...
- Publication number 20240369345
- Publication date Nov 7, 2024
- Martin Berz
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL HETERODYNE INTERFERENCE MEASUREMENT DEVICE AND OPTICAL HETE...
- Publication number 20240361120
- Publication date Oct 31, 2024
- Hamamatsu Photonics K.K.
- Naoaki KATO
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL PHASE MEASUREMENT METHOD AND SYSTEM
- Publication number 20240361253
- Publication date Oct 31, 2024
- NOVA LTD
- Gilad BARAK
- G01 - MEASURING TESTING
Information Patent Application
ANGULAR AVERAGING CALIBRATION ON BARE WAFER METROLOGY TOOLS FOR ESF...
- Publication number 20240353219
- Publication date Oct 24, 2024
- KLA Corporation
- Haifeng Wang
- G01 - MEASURING TESTING

Interferometers for determining dimensional properties of, or relations between, measurement objects

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Compact snapshot dual-mode interferometric system

Methods and apparatus for an adjustable beam directing optical system

Photonic quantum networking for large superconducting qubit modules

OCT device

Method for measuring the diameter of filament diffraction fringes b...

Broadband interferometry and method for measurement range extension...

System and method for determining post bonding overlay

Optical measurement system

Defect inspection device and defect inspection method

Heterodyne two-dimensional grating measuring device and measuring m...

Optical device and method for manufacturing same

Laser eye surgery system calibration

Measuring apparatus, on-chip instrumentation device and measuring m...

Truncated nonlinear interferometer-based sensor system

Optical device for heterodyne interferometry

Quantum network devices, systems, and methods

Laser interferometer

Systems, methods, and media for multiple reference arm spectral dom...

Chip-scale frequency-comb assisted coherent lidar ranging with sub-...

Composite measurement system for measuring nanometer displacement

Self-configuration and error correction in linear photonic circuits

Devices, systems, and methods for imaging in certain endoscopic env...

Resolving absolute depth in circular-ranging optical coherence tomo...

Frequency control of orthogonal polarisation modes in an optical ca...

Frequency-domain optical coherence tomography with extended field-o...

Optical interferometry proximity sensor with temperature variation...

Device and method for imaging and interferometry measurements

Metrology method and apparatus for of determining a complex-valued...

Digital holography for alignment in layer deposition

Device and method for measuring laser displacement

Patents Applicationslast 30 patents

OPTICAL COHERENCE TOMOGRAPHY APPARATUS, OPTICAL COHERENCE TOMOGRAPH...

LASER ARCHITECTURE FOR COMPONENT EFFICIENT ATOMIC INTERFEROMETER GR...

BOND-SELECTIVE FULL-FIELD OPTICAL COHERENCE TOMOGRAPHY

SEMICONDUCTOR MEASUREMENT APPARATUS

METHOD FOR QUANTITATIVE EVALUATION OF CONTACT LENS EDGE LIFT BASED...

PRECISION QUANTUM-INTERFERENCE-BASED NON-LOCAL CONTACTLESS MEASUREMENT

REFLECTIVE CO-AXIAL INTERFEROMETER SYSTEMS AND METHODS THEREOF

SUPER INTERFEROMETRIC RANGE RESOLUTION

Relative intensity noise Cat's-eye swept source laser for OCT and s...

DOUBLE-MIRROR SHEAR INTERFEROMETER

MONITORING OBJECTS IN AQUEOUS MEDIA USING OPTICAL COHERENCE TOMOGRAPHY

METHOD AND DEVICE FOR MEASURING INTERFACES OF AN OPTICAL ELEMENT

DETERMINATION OF A CHANGE OF OBJECT'S SHAPE

SURFACE METROLOGY SYSTEMS AND METHODS THEREOF

ABSOLUTE MEASUREMENT METHOD FOR THE PHASE OF THE COMPLEX COHERENCE...

METHOD OF MEASURING BENDING OF AN ELONGATE VERTICALLY ORIENTED CHANNEL

METHOD FOR THE FUNCTIONAL CHARACTERISATION OF OPTICAL LENSES

META-MATERIAL INTERFEROMETRY SYSTEMS AND METHODS

OPTICAL COHERENCE TOMOGRAPH

THREE-DIMENSIONAL SHAPE MEASURING DEVICE, REFERENCE SURFACE POSITIO...

ADJUSTMENT METHOD FOR SHAPE MEASURING DEVICE

METHOD AND SYSTEM FOR MAPPING AND RANGE DETECTION

Multi-Channel Self-Mixing Interferometric Sensor

Laser Interferometer And Method Of Adjusting Optical Axis Of Laser...

Three-Wavelengths Interferometric Measuring Device And Method

Systems and Methods for 1-Micron Frequency Comb Optical Coherence T...

METHOD, INTERFEROMETER AND SIGNAL PROCESSING DEVICE, EACH FOR DETER...

OPTICAL HETERODYNE INTERFERENCE MEASUREMENT DEVICE AND OPTICAL HETE...

OPTICAL PHASE MEASUREMENT METHOD AND SYSTEM

ANGULAR AVERAGING CALIBRATION ON BARE WAFER METROLOGY TOOLS FOR ESF...