Interferometers for determining dimensional properties of, or relations between, measurement objects

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CPC
G01B9/02

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GPHYSICS G01Measuring instruments G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS G01B9/00Instruments as specified in the subgroups and characterised by the use of optical measuring means

Current Industry

G01B9/02Interferometers for determining dimensional properties of, or relations between, measurement objects

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Optical system and interference objective module therof
- Patent number 12,320,640
- Issue date Jun 3, 2025
- Apollo Medical Optics, Ltd.
- Tuan-Shu Ho
- G01 - MEASURING TESTING
Information Patent Grant
Wearable skin vibration or silent gesture detector
- Patent number 12,320,642
- Issue date Jun 3, 2025
- Apple Inc.
- Mehmet Mutlu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Tunable laser assembly
- Patent number 12,322,926
- Issue date Jun 3, 2025
- Thorlabs Quantum Electronics, Inc.
- Peter J. S. Heim
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Jogbox with 3D scanner
- Patent number 12,320,627
- Issue date Jun 3, 2025
- Hexagon Metrology, Inc.
- Milan Kocic
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for measuring distance
- Patent number 12,320,639
- Issue date Jun 3, 2025
- Loughborough University
- Jonathan Huntley
- G01 - MEASURING TESTING
Information Patent Grant
Method for compensating the artifacts generated by moving measureme...
- Patent number 12,313,402
- Issue date May 27, 2025
- Carl Zeiss Meditec LLP
- Rainer Leitgeb
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for calibrating one or more optical sensors of a laser machi...
- Patent number 12,313,463
- Issue date May 27, 2025
- Precitec GmbH & Co. KG
- Rüdiger Moser
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Level sensor and substrate processing apparatus including the same
- Patent number 12,313,393
- Issue date May 27, 2025
- Samsung Electronics Co., Ltd.
- Sungho Jang
- G01 - MEASURING TESTING
Information Patent Grant
Laser interferometer
- Patent number 12,313,448
- Issue date May 27, 2025
- Seiko Epson Corporation
- Kohei Yamada
- G01 - MEASURING TESTING
Information Patent Grant
Interferometer system and lithographic apparatus
- Patent number 12,305,979
- Issue date May 20, 2025
- ASML Netherlands B.V.
- Maarten Jozef Jansen
- G01 - MEASURING TESTING
Information Patent Grant
Low-coherence interferometer with surface power compensation
- Patent number 12,305,981
- Issue date May 20, 2025
- Corning Incorporated
- Joshua Monroe Cobb
- G01 - MEASURING TESTING
Information Patent Grant
Methods and apparatus for measuring a feature of glass-based substrate
- Patent number 12,305,983
- Issue date May 20, 2025
- Corning Incorporated
- Earle William Gillis
- G01 - MEASURING TESTING
Information Patent Grant
Structured light three-dimensional measurement method based on join...
- Patent number 12,307,696
- Issue date May 20, 2025
- Hangzhou Chengguang Medical Technology Co., Ltd.
- Mengyu Jia
- G01 - MEASURING TESTING
Information Patent Grant
Holographic microscope
- Patent number 12,306,584
- Issue date May 20, 2025
- Korea Photonics Technology Institute
- Seon Kyu Yoon
- G01 - MEASURING TESTING
Information Patent Grant
Optical system using enhanced static fringe capture
- Patent number 12,305,976
- Issue date May 20, 2025
- Curtis Blake LaPlante
- G01 - MEASURING TESTING
Information Patent Grant
Self-mixing interference based sensors for characterizing touch input
- Patent number 12,305,982
- Issue date May 20, 2025
- Apple Inc.
- Mark T. Winkler
- G01 - MEASURING TESTING
Information Patent Grant
Positioning system, a lithographic apparatus, an absolute position...
- Patent number 12,306,548
- Issue date May 20, 2025
- ASML Netherlands B.V.
- Maarten Jozef Jansen
- G01 - MEASURING TESTING
Information Patent Grant
Optical contact metrology
- Patent number 12,305,980
- Issue date May 20, 2025
- Zygo Corporation
- Leslie L. Deck
- G01 - MEASURING TESTING
Information Patent Grant
Optical interference range sensor
- Patent number 12,298,117
- Issue date May 13, 2025
- Omron Corporation
- Yusuke Nagasaki
- G01 - MEASURING TESTING
Information Patent Grant
Optical coherence tomography system for ophthalmology
- Patent number 12,298,129
- Issue date May 13, 2025
- Haag-Streit AG
- Lucio Robledo
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Optical device
- Patent number 12,298,132
- Issue date May 13, 2025
- Hamamatsu Photonics K.K.
- Tomofumi Suzuki
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
High-resolution handheld OCT imaging system
- Patent number 12,298,133
- Issue date May 13, 2025
- Shuixing Zhang
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Method of measuring electro-optic characteristic of a traveling wav...
- Patent number 12,298,650
- Issue date May 13, 2025
- Taiwan Semiconductor Manufacturing Company, Ltd
- Ming Yang Jung
- G01 - MEASURING TESTING
Information Patent Grant
Tunable laser and method to tune a wavelength of a light emitted by...
- Patent number 12,298,130
- Issue date May 13, 2025
- Politecnico di Milano
- Aldo Righetti
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and system for determining the position of an element of an...
- Patent number 12,298,131
- Issue date May 13, 2025
- ADIGE S.P.A.
- Simone Donadello
- G01 - MEASURING TESTING
Information Patent Grant
Self-referencing interferometer and dual self-referencing interfero...
- Patent number 12,292,697
- Issue date May 6, 2025
- ASML Holding N.V.
- Douglas C. Cappelli
- G01 - MEASURING TESTING
Information Patent Grant
Optical device
- Patent number 12,292,620
- Issue date May 6, 2025
- Mitutoyo Corporation
- Yuki Tanaka
- G01 - MEASURING TESTING
Information Patent Grant
Dual-mode optical coherence tomography and optical coherence micros...
- Patent number 12,292,558
- Issue date May 6, 2025
- LighTopTech Corp.
- Eric L. Buckland
- G01 - MEASURING TESTING
Information Patent Grant
Method and device for characterizing the surface shape of an optica...
- Patent number 12,292,281
- Issue date May 6, 2025
- Carl Zeiss SMT GmbH
- Regina Christ
- G01 - MEASURING TESTING
Information Patent Grant
Heterodyne laser interferometer based on integrated dual polarizati...
- Patent number 12,287,198
- Issue date Apr 29, 2025
- Harbin Institute of Technology
- Haijin Fu
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
NON-INVASIVE MEASURING/DIAGNOSIS/TREATMENT APPARATUS AND METHOD
- Publication number 20250176925
- Publication date Jun 5, 2025
- Weng-Dah Ken
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DETECTION SYSTEM, COMPENSATION METHOD, AND COMPUTER READABLE MEDIUM...
- Publication number 20250172379
- Publication date May 29, 2025
- CHROMA ATE INC.
- HAO-CHIANG HU
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Reconfigurable Optical Sensing Apparatus and Method Thereof
- Publication number 20250172378
- Publication date May 29, 2025
- Artilux, Inc.
- Chih-Wei Yeh
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
OPTICAL DISPLACEMENT SENSOR ARRANGEMENT AND METHOD OF OPERATION
- Publication number 20250172377
- Publication date May 29, 2025
- SensiBel AS
- Hallvard Angelskår
- G01 - MEASURING TESTING
Information Patent Application
DEMODULATION SYSTEM FOR OPTICAL FIBER FABRY-PEROT SENSOR
- Publication number 20250164233
- Publication date May 22, 2025
- BEIJING BYWAVE SENSING TECHNOLOGY CO., LTD.
- Meng QIAO
- G01 - MEASURING TESTING
Information Patent Application
Line-field OCT System with Multi Transverse Mode Laser
- Publication number 20250164234
- Publication date May 22, 2025
- KineoLabs, Inc.
- Yisi Liu
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR DETERMINING THE LOCAL POSITION OF AT LEAST ON...
- Publication number 20250135576
- Publication date May 1, 2025
- Adige S.p.A.
- Simone DONADELLO
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
IMAGE PROCESSING APPARATUS, IMAGE PROCESSING METHOD, AND NON-TRANSI...
- Publication number 20250131764
- Publication date Apr 24, 2025
- NEC Corporation
- Shigeru NAKAMURA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SURGICAL OPERATING SYSTEM, SURGICAL TOOL AND METHOD FOR SAFEGUARDIN...
- Publication number 20250127587
- Publication date Apr 24, 2025
- Carl Zeiss Meditec AG
- Carolin KLUSMANN
- G01 - MEASURING TESTING
Information Patent Application
DYNAMIC INTERFEROMETER ILLUMINATOR
- Publication number 20250123095
- Publication date Apr 17, 2025
- Zygo Corporation
- Leslie L. Deck
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR INTERFEROMETRIC MEASUREMENT ALIGNMENT
- Publication number 20250123094
- Publication date Apr 17, 2025
- ARIZONA OPTICAL METROLOGY LLC
- James Howard Burge
- G01 - MEASURING TESTING
Information Patent Application
INTERFEROMETRIC METHOD FOR MEASURING OPTICAL DISTANCE
- Publication number 20250123093
- Publication date Apr 17, 2025
- Zygo Corporation
- Leslie L. Deck
- G01 - MEASURING TESTING
Information Patent Application
Self-Aligning Interferometric End Point Housing
- Publication number 20250116500
- Publication date Apr 10, 2025
- Trishul BYREGOWDA SHIVALINGAIAH
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF CALCULATING OPTICAL AERIAL IMAGE
- Publication number 20250116501
- Publication date Apr 10, 2025
- National Tsing-Hua University
- Tsai-Sheng Gau
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
POSITION DETECTION SYSTEM USING LASER LIGHT INTERFEROMETRY
- Publication number 20250116499
- Publication date Apr 10, 2025
- VDL Enabling Technologies Group B.V.
- Francesco PATTI
- G01 - MEASURING TESTING
Information Patent Application
MULTI-PHASE INTERFEROMETER FOR 3D METROLOGY
- Publication number 20250109934
- Publication date Apr 3, 2025
- ORBOTECH LTD.
- Yuri Paskover
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND SYSTEMS FOR CONFOCAL FUNCTION DETERMINATION AND CORRECT...
- Publication number 20250102289
- Publication date Mar 27, 2025
- HEIDELBERG ENGINEERING GMBH
- Johannes KÜBLER
- G01 - MEASURING TESTING
Information Patent Application
Optical Coherence Tomography System for Subsurface Inspection
- Publication number 20250102290
- Publication date Mar 27, 2025
- Hamamatsu Photonics K. K.
- Qingsong Wang
- G01 - MEASURING TESTING
Information Patent Application
QUANTUM NETWORK DEVICES, SYSTEMS, AND METHODS
- Publication number 20250097021
- Publication date Mar 20, 2025
- The Research Foundation for the State University of New York
- Eden Figueroa
- G01 - MEASURING TESTING
Information Patent Application
TECHNIQUES FOR ROBUST MACHINE VISION SYSTEMS
- Publication number 20250093514
- Publication date Mar 20, 2025
- COGNEX CORPORATION
- Thomas Ruhnau
- G01 - MEASURING TESTING
Information Patent Application
DETERMINING ELECTROMAGNETIC WAVE CONTROL FOR MATTER-WAVE INTERFEROM...
- Publication number 20250085099
- Publication date Mar 13, 2025
- ColdQuanta, Inc.
- Lennart Maximilian Seifert
- G01 - MEASURING TESTING
Information Patent Application
Self-Configuration and Error Correction in Linear Photonic Circuits
- Publication number 20250085100
- Publication date Mar 13, 2025
- Massachusetts Institute of Technology
- Ryan HAMERLY
- G01 - MEASURING TESTING
Information Patent Application
DEVICE, SYSTEM, AND METHOD FOR IN-SITU MEASUREMENT OF THREE-DIMENSI...
- Publication number 20250076031
- Publication date Mar 6, 2025
- WUHAN UNIVERSITY
- Hui LI
- B22 - CASTING POWDER METALLURGY
Information Patent Application
METHOD AND SYSTEM FOR MATCHING FREQUENCIES OF LASERS IN A QUANTUM C...
- Publication number 20250080234
- Publication date Mar 6, 2025
- Joshua Alexander Slater
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
RESOLVING ABSOLUTE DEPTH IN CIRCULAR-RANGING OPTICAL COHERENCE TOMO...
- Publication number 20250076194
- Publication date Mar 6, 2025
- The General Hospital Corporation
- Benjamin Vakoc
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED ELECTRONIC SYSTEM FOR OPTICAL COHERENCE TOMOGRAPHY
- Publication number 20250067551
- Publication date Feb 27, 2025
- Myriad Advanced Technologies LLC
- Muhammad Al-Qaisi
- G01 - MEASURING TESTING
Information Patent Application
Frequency-Domain Optical Coherence Tomography with Extended Field-o...
- Publication number 20250067553
- Publication date Feb 27, 2025
- NINEPOINT MEDICAL, INC.
- Eman NAMATI
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
SYSTEMS, METHODS, AND MEDIA FOR MULTIPLE BEAM OPTICAL COHERENCE TOM...
- Publication number 20250067552
- Publication date Feb 27, 2025
- The General Hospital Corporation
- Benjamin Vakoc
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR CALIBRATING A SELF-MIXING INTERFEROMETER AND SELF-MIXING...
- Publication number 20250067555
- Publication date Feb 27, 2025
- ams International AG
- Goran Stojanovic
- G01 - MEASURING TESTING
Information Patent Application
SELF-MIXING INTERFEROMETRY
- Publication number 20250067554
- Publication date Feb 27, 2025
- Dyson Technology Limited
- David James GRAHAM
- G01 - MEASURING TESTING

Interferometers for determining dimensional properties of, or relations between, measurement objects

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Optical system and interference objective module therof

Wearable skin vibration or silent gesture detector

Tunable laser assembly

Jogbox with 3D scanner

Method and apparatus for measuring distance

Method for compensating the artifacts generated by moving measureme...

Method for calibrating one or more optical sensors of a laser machi...

Level sensor and substrate processing apparatus including the same

Laser interferometer

Interferometer system and lithographic apparatus

Low-coherence interferometer with surface power compensation

Methods and apparatus for measuring a feature of glass-based substrate

Structured light three-dimensional measurement method based on join...

Holographic microscope

Optical system using enhanced static fringe capture

Self-mixing interference based sensors for characterizing touch input

Positioning system, a lithographic apparatus, an absolute position...

Optical contact metrology

Optical interference range sensor

Optical coherence tomography system for ophthalmology

Optical device

High-resolution handheld OCT imaging system

Method of measuring electro-optic characteristic of a traveling wav...

Tunable laser and method to tune a wavelength of a light emitted by...

Method and system for determining the position of an element of an...

Self-referencing interferometer and dual self-referencing interfero...

Optical device

Dual-mode optical coherence tomography and optical coherence micros...

Method and device for characterizing the surface shape of an optica...

Heterodyne laser interferometer based on integrated dual polarizati...

Patents Applicationslast 30 patents

NON-INVASIVE MEASURING/DIAGNOSIS/TREATMENT APPARATUS AND METHOD

DETECTION SYSTEM, COMPENSATION METHOD, AND COMPUTER READABLE MEDIUM...

Reconfigurable Optical Sensing Apparatus and Method Thereof

OPTICAL DISPLACEMENT SENSOR ARRANGEMENT AND METHOD OF OPERATION

DEMODULATION SYSTEM FOR OPTICAL FIBER FABRY-PEROT SENSOR

Line-field OCT System with Multi Transverse Mode Laser

METHOD AND SYSTEM FOR DETERMINING THE LOCAL POSITION OF AT LEAST ON...

IMAGE PROCESSING APPARATUS, IMAGE PROCESSING METHOD, AND NON-TRANSI...

SURGICAL OPERATING SYSTEM, SURGICAL TOOL AND METHOD FOR SAFEGUARDIN...

DYNAMIC INTERFEROMETER ILLUMINATOR

SYSTEM AND METHOD FOR INTERFEROMETRIC MEASUREMENT ALIGNMENT

INTERFEROMETRIC METHOD FOR MEASURING OPTICAL DISTANCE

Self-Aligning Interferometric End Point Housing

METHOD OF CALCULATING OPTICAL AERIAL IMAGE

POSITION DETECTION SYSTEM USING LASER LIGHT INTERFEROMETRY

MULTI-PHASE INTERFEROMETER FOR 3D METROLOGY

METHODS AND SYSTEMS FOR CONFOCAL FUNCTION DETERMINATION AND CORRECT...

Optical Coherence Tomography System for Subsurface Inspection

QUANTUM NETWORK DEVICES, SYSTEMS, AND METHODS

TECHNIQUES FOR ROBUST MACHINE VISION SYSTEMS

DETERMINING ELECTROMAGNETIC WAVE CONTROL FOR MATTER-WAVE INTERFEROM...

Self-Configuration and Error Correction in Linear Photonic Circuits

DEVICE, SYSTEM, AND METHOD FOR IN-SITU MEASUREMENT OF THREE-DIMENSI...

METHOD AND SYSTEM FOR MATCHING FREQUENCIES OF LASERS IN A QUANTUM C...

RESOLVING ABSOLUTE DEPTH IN CIRCULAR-RANGING OPTICAL COHERENCE TOMO...

INTEGRATED ELECTRONIC SYSTEM FOR OPTICAL COHERENCE TOMOGRAPHY

Frequency-Domain Optical Coherence Tomography with Extended Field-o...

SYSTEMS, METHODS, AND MEDIA FOR MULTIPLE BEAM OPTICAL COHERENCE TOM...

METHOD FOR CALIBRATING A SELF-MIXING INTERFEROMETER AND SELF-MIXING...

SELF-MIXING INTERFEROMETRY