Interferometers for determining dimensional properties of, or relations between, measurement objects

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CPC
G01B9/02

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GPHYSICS G01Measuring instruments G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS G01B9/00Instruments as specified in the subgroups and characterised by the use of optical measuring means

Current Industry

G01B9/02Interferometers for determining dimensional properties of, or relations between, measurement objects

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Method of processing optical coherence tomography (OCT) data, metho...
- Patent number 12,226,160
- Issue date Feb 18, 2025
- Topcon Corporation
- Yasufumi Fukuma
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Ultra-precision timing clock method
- Patent number 12,226,246
- Issue date Feb 18, 2025
- Weng-Dah Ken
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Polarizing Fizeau interferometer
- Patent number 12,228,400
- Issue date Feb 18, 2025
- Mitutoyo Corporation
- Shimpei Matsuura
- G01 - MEASURING TESTING
Information Patent Grant
Heterodyne light source for use in metrology system
- Patent number 12,228,399
- Issue date Feb 18, 2025
- Mitutoyo Corporation
- Nick Hartmann
- G01 - MEASURING TESTING
Information Patent Grant
Systems, methods, and media for multiple beam optical coherence tom...
- Patent number 12,222,202
- Issue date Feb 11, 2025
- The General Hospital Corporation
- Benjamin Vakoc
- G01 - MEASURING TESTING
Information Patent Grant
Optical coherence tomography (OCT) apparatus and method for control...
- Patent number 12,213,763
- Issue date Feb 4, 2025
- NEC Corporation
- Shigeru Nakamura
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Optical measurement apparatus, measuring method using the same, and...
- Patent number 12,215,974
- Issue date Feb 4, 2025
- Samsung Electronics Co., Ltd.
- Seung Woo Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and system for determining the local position of at least on...
- Patent number 12,214,441
- Issue date Feb 4, 2025
- ADIGE S.P.A.
- Simone Donadello
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Frequency shifter for heterodyne interferometry measurements and de...
- Patent number 12,209,861
- Issue date Jan 28, 2025
- CHAMARTIN LABORATORIES LLC
- Richard Grote
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for polarization-sensitive optical coherence to...
- Patent number 12,209,952
- Issue date Jan 28, 2025
- Singapore Health Services Pte Ltd.
- Leopold Schmetterer
- G01 - MEASURING TESTING
Information Patent Grant
Method and device for analog in situ laser process monitoring
- Patent number 12,209,860
- Issue date Jan 28, 2025
- UNIVERSITAET BAYREUTH
- Georg Herink
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Compact snapshot dual-mode interferometric system
- Patent number 12,203,752
- Issue date Jan 21, 2025
- Arizona Board of Regents on behalf of the University of Arizona
- Rongguang Liang
- G01 - MEASURING TESTING
Information Patent Grant
Photonic quantum networking for large superconducting qubit modules
- Patent number 12,204,997
- Issue date Jan 21, 2025
- Rigetti & Co, LLC
- Matthew J. Reagor
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Methods and apparatus for an adjustable beam directing optical system
- Patent number 12,203,751
- Issue date Jan 21, 2025
- UNITED STATES OF AMERICA AS REPRESENTED BY THE ADMINISTRATOR OF NASA.
- Brett F. Bathel
- G01 - MEASURING TESTING
Information Patent Grant
OCT device
- Patent number 12,201,358
- Issue date Jan 21, 2025
- Nidek Co., Ltd.
- Taisei Yoshida
- G01 - MEASURING TESTING
Information Patent Grant
Method for measuring the diameter of filament diffraction fringes b...
- Patent number 12,196,540
- Issue date Jan 14, 2025
- Zhejiang University of Technology
- Qiang Lin
- G01 - MEASURING TESTING
Information Patent Grant
Broadband interferometry and method for measurement range extension...
- Patent number 12,196,551
- Issue date Jan 14, 2025
- Automated Precision Inc.
- Yongwoo Park
- G01 - MEASURING TESTING
Information Patent Grant
System and method for determining post bonding overlay
- Patent number 12,197,137
- Issue date Jan 14, 2025
- KLA Corporation
- Franz Zach
- G01 - MEASURING TESTING
Information Patent Grant
Optical measurement system
- Patent number 12,196,550
- Issue date Jan 14, 2025
- National Cheng Kung University
- Chien-Sheng Liu
- G01 - MEASURING TESTING
Information Patent Grant
Defect inspection device and defect inspection method
- Patent number 12,188,769
- Issue date Jan 7, 2025
- Shimadzu Corporation
- Koki Yoshida
- G01 - MEASURING TESTING
Information Patent Grant
Heterodyne two-dimensional grating measuring device and measuring m...
- Patent number 12,188,793
- Issue date Jan 7, 2025
- CHANGCHUN INSTITUTE OF OPTICS, FINE MECHANICS AND PHYSICS, ACADEMY OF SCIENCES
- Wenhao Li
- G01 - MEASURING TESTING
Information Patent Grant
Optical device and method for manufacturing same
- Patent number 12,180,063
- Issue date Dec 31, 2024
- Hamamatsu Photonics K.K.
- Tatsuya Sugimoto
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Laser eye surgery system calibration
- Patent number 12,178,752
- Issue date Dec 31, 2024
- AMO Development, LLC
- Bruce Woodley
- G01 - MEASURING TESTING
Information Patent Grant
Measuring apparatus, on-chip instrumentation device and measuring m...
- Patent number 12,181,278
- Issue date Dec 31, 2024
- Nippon Telegraph and Telephone Corporation
- Katsumasa Yoshioka
- G01 - MEASURING TESTING
Information Patent Grant
Truncated nonlinear interferometer-based sensor system
- Patent number 12,181,773
- Issue date Dec 31, 2024
- UT-Battelle, LLC
- Raphael C. Pooser
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Optical device for heterodyne interferometry
- Patent number 12,181,279
- Issue date Dec 31, 2024
- CHAMARTIN LABORATORIES LLC
- Richard Grote
- G01 - MEASURING TESTING
Information Patent Grant
Quantum network devices, systems, and methods
- Patent number 12,184,769
- Issue date Dec 31, 2024
- The Research Foundation for the State University of New York
- Eden Figueroa
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Laser interferometer
- Patent number 12,181,277
- Issue date Dec 31, 2024
- Seiko Epson Corporation
- Kohei Yamada
- G01 - MEASURING TESTING
Information Patent Grant
Systems, methods, and media for multiple reference arm spectral dom...
- Patent number 12,181,280
- Issue date Dec 31, 2024
- The General Hospital Corporation
- Guillermo J. Tearney
- G01 - MEASURING TESTING
Information Patent Grant
Chip-scale frequency-comb assisted coherent lidar ranging with sub-...
- Patent number 12,174,016
- Issue date Dec 24, 2024
- The Regents of the University of California
- Yoon-Soo Jang
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
LED LIGHT SOURCE FOR MEDICAL OPTICAL COHERENCE TOMOGRAPHY WITH HIGH...
- Publication number 20250063864
- Publication date Feb 20, 2025
- Lumileds LLC
- Peter Josef Schmidt
- C09 - DYES PAINTS POLISHES NATURAL RESINS ADHESIVES MISCELLANEOUS COMPOSITION...
Information Patent Application
DYNAMIC AUTOFOCUS METHOD AND SYSTEM FOR ASSAY IMAGER
- Publication number 20250052999
- Publication date Feb 13, 2025
- Illumina, Inc.
- Darren Robert Segale
- C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information Patent Application
MEASURING PARALLELISM
- Publication number 20250052559
- Publication date Feb 13, 2025
- Samsung Electronics Co., Ltd.
- Minhwan Seo
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR HIGH-RESOLUTION REFLECTION TOMOGRAPHIC IMAGING
- Publication number 20250052560
- Publication date Feb 13, 2025
- Korea Advanced Institute of Science and Techno logy
- YongKeun PARK
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
MIRROR UNIT AND OPTICAL MODULE
- Publication number 20250044074
- Publication date Feb 6, 2025
- HAMAMATSU PHOTONICS K. K.
- Tomofumi Suzuki
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
METHODS AND SYSTEMS FOR THREE-DIMENSIONAL IMAGING OF A TRANSPARENT...
- Publication number 20250044075
- Publication date Feb 6, 2025
- Centre National de la Recherche Scientifique
- Albert Claude BOCCARA
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHODS FOR HIGH-SPEED AND LONG DEPTH RANGE IMAGING U...
- Publication number 20250044516
- Publication date Feb 6, 2025
- The General Hospital Corporation
- Benjamin Vakoc
- G01 - MEASURING TESTING
Information Patent Application
THIN FILM THICKNESS ADJUSTMENTS FOR THREE-DIMENSIONAL INTERFEROMETR...
- Publication number 20250044073
- Publication date Feb 6, 2025
- ORBOTECH LTD.
- Yulia Lovsky
- G01 - MEASURING TESTING
Information Patent Application
INTRAORAL OCT APPARATUS
- Publication number 20250031970
- Publication date Jan 30, 2025
- Dental Imaging Technologies Corporation
- Victor C. WONG
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
OPTICAL INTERFERENCE MEASUREMENT DEVICE
- Publication number 20250035427
- Publication date Jan 30, 2025
- Panasonic Intellectual Property Management Co., Ltd.
- YASUHIRO KABETANI
- G01 - MEASURING TESTING
Information Patent Application
THREE-DIMENSIONAL SHAPE MEASURING DEVICE AND THREE-DIMENSIONAL SHAP...
- Publication number 20250035426
- Publication date Jan 30, 2025
- TOKYO SEIMITSU CO., LTD.
- Takashi OGURA
- G01 - MEASURING TESTING
Information Patent Application
INTERFEROMETRIC WAVEMETER FOR BROADBAND SENSORS IN PHOTONIC SYSTEMS
- Publication number 20250035425
- Publication date Jan 30, 2025
- Intel Corporation
- Wenhua Lin
- G01 - MEASURING TESTING
Information Patent Application
MACHINE TOOL
- Publication number 20250035435
- Publication date Jan 30, 2025
- Mitsubishi Electric Corporation
- Hiroki GOTO
- G01 - MEASURING TESTING
Information Patent Application
IMAGE CAPTURE DEVICE AND OPERATION METHOD THEREOF
- Publication number 20250030961
- Publication date Jan 23, 2025
- National Taiwan University
- Hao-Li LIU
- G01 - MEASURING TESTING
Information Patent Application
INFEROMETRIC MEASURING APPARATUS
- Publication number 20250027764
- Publication date Jan 23, 2025
- Carl Zeiss SMT GMBH
- Steffen SIEGLER
- G01 - MEASURING TESTING
Information Patent Application
OPTOELECTRONIC DEVICE, SELF-MIXING INTERFEROMETER AND METHOD FOR OP...
- Publication number 20250027763
- Publication date Jan 23, 2025
- ams International AG
- Matthias STEINER
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
OPTICAL COHERENCE TOMOGRAPHY APPARATUS, OPTICAL COHERENCE TOMOGRAPH...
- Publication number 20250020447
- Publication date Jan 16, 2025
- DAIKIN INDUSTRIES, LTD.
- Masao NOUMI
- G01 - MEASURING TESTING
Information Patent Application
LASER ARCHITECTURE FOR COMPONENT EFFICIENT ATOMIC INTERFEROMETER GR...
- Publication number 20250020446
- Publication date Jan 16, 2025
- AOSense, Inc.
- Miroslav Y. Shverdin
- G01 - MEASURING TESTING
Information Patent Application
BOND-SELECTIVE FULL-FIELD OPTICAL COHERENCE TOMOGRAPHY
- Publication number 20250012557
- Publication date Jan 9, 2025
- Trustees of Boston University
- Ji-Xin Cheng
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR MEASUREMENT APPARATUS
- Publication number 20250012556
- Publication date Jan 9, 2025
- Samsung Electronics Co., Ltd.
- Younguk Jin
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR QUANTITATIVE EVALUATION OF CONTACT LENS EDGE LIFT BASED...
- Publication number 20250003731
- Publication date Jan 2, 2025
- Alcon Inc.
- Yeming Gu
- G02 - OPTICS
Information Patent Application
PRECISION QUANTUM-INTERFERENCE-BASED NON-LOCAL CONTACTLESS MEASUREMENT
- Publication number 20250003730
- Publication date Jan 2, 2025
- THE BOARD OF TRUSTEES OF THE UNIVERSITY OF ILLINOIS
- Paul G Kwiat
- G01 - MEASURING TESTING
Information Patent Application
REFLECTIVE CO-AXIAL INTERFEROMETER SYSTEMS AND METHODS THEREOF
- Publication number 20240426594
- Publication date Dec 26, 2024
- OptiPro Systems, LLC
- James F. Munro
- G01 - MEASURING TESTING
Information Patent Application
SUPER INTERFEROMETRIC RANGE RESOLUTION
- Publication number 20240418498
- Publication date Dec 19, 2024
- Chapman University
- John Howell
- G01 - MEASURING TESTING
Information Patent Application
Relative intensity noise Cat's-eye swept source laser for OCT and s...
- Publication number 20240418497
- Publication date Dec 19, 2024
- KineoLabs, Inc.
- Walid A. Atia
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
DOUBLE-MIRROR SHEAR INTERFEROMETER
- Publication number 20240418499
- Publication date Dec 19, 2024
- HOCHSCHULE TRIER
- Christopher PETRY
- G01 - MEASURING TESTING
Information Patent Application
MONITORING OBJECTS IN AQUEOUS MEDIA USING OPTICAL COHERENCE TOMOGRAPHY
- Publication number 20240410685
- Publication date Dec 12, 2024
- ChromoLogic LLC
- Matthew BREHOVE
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND DEVICE FOR MEASURING INTERFACES OF AN OPTICAL ELEMENT
- Publication number 20240402039
- Publication date Dec 5, 2024
- FOGALE NANOTECH
- Eric LEGROS
- G01 - MEASURING TESTING
Information Patent Application
DETERMINATION OF A CHANGE OF OBJECT'S SHAPE
- Publication number 20240401928
- Publication date Dec 5, 2024
- Nikon Corporation
- Eric Peter Goodwin
- G01 - MEASURING TESTING
Information Patent Application
SURFACE METROLOGY SYSTEMS AND METHODS THEREOF
- Publication number 20240401938
- Publication date Dec 5, 2024
- OptiPro Systems, LLC
- James Fredric Munro
- G01 - MEASURING TESTING

Interferometers for determining dimensional properties of, or relations between, measurement objects

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Method of processing optical coherence tomography (OCT) data, metho...

Ultra-precision timing clock method

Polarizing Fizeau interferometer

Heterodyne light source for use in metrology system

Systems, methods, and media for multiple beam optical coherence tom...

Optical coherence tomography (OCT) apparatus and method for control...

Optical measurement apparatus, measuring method using the same, and...

Method and system for determining the local position of at least on...

Frequency shifter for heterodyne interferometry measurements and de...

Methods and systems for polarization-sensitive optical coherence to...

Method and device for analog in situ laser process monitoring

Compact snapshot dual-mode interferometric system

Photonic quantum networking for large superconducting qubit modules

Methods and apparatus for an adjustable beam directing optical system

OCT device

Method for measuring the diameter of filament diffraction fringes b...

Broadband interferometry and method for measurement range extension...

System and method for determining post bonding overlay

Optical measurement system

Defect inspection device and defect inspection method

Heterodyne two-dimensional grating measuring device and measuring m...

Optical device and method for manufacturing same

Laser eye surgery system calibration

Measuring apparatus, on-chip instrumentation device and measuring m...

Truncated nonlinear interferometer-based sensor system

Optical device for heterodyne interferometry

Quantum network devices, systems, and methods

Laser interferometer

Systems, methods, and media for multiple reference arm spectral dom...

Chip-scale frequency-comb assisted coherent lidar ranging with sub-...

Patents Applicationslast 30 patents

LED LIGHT SOURCE FOR MEDICAL OPTICAL COHERENCE TOMOGRAPHY WITH HIGH...

DYNAMIC AUTOFOCUS METHOD AND SYSTEM FOR ASSAY IMAGER

MEASURING PARALLELISM

SYSTEM AND METHOD FOR HIGH-RESOLUTION REFLECTION TOMOGRAPHIC IMAGING

MIRROR UNIT AND OPTICAL MODULE

METHODS AND SYSTEMS FOR THREE-DIMENSIONAL IMAGING OF A TRANSPARENT...

APPARATUS AND METHODS FOR HIGH-SPEED AND LONG DEPTH RANGE IMAGING U...

THIN FILM THICKNESS ADJUSTMENTS FOR THREE-DIMENSIONAL INTERFEROMETR...

INTRAORAL OCT APPARATUS

OPTICAL INTERFERENCE MEASUREMENT DEVICE

THREE-DIMENSIONAL SHAPE MEASURING DEVICE AND THREE-DIMENSIONAL SHAP...

INTERFEROMETRIC WAVEMETER FOR BROADBAND SENSORS IN PHOTONIC SYSTEMS

MACHINE TOOL

IMAGE CAPTURE DEVICE AND OPERATION METHOD THEREOF

INFEROMETRIC MEASURING APPARATUS

OPTOELECTRONIC DEVICE, SELF-MIXING INTERFEROMETER AND METHOD FOR OP...

OPTICAL COHERENCE TOMOGRAPHY APPARATUS, OPTICAL COHERENCE TOMOGRAPH...

LASER ARCHITECTURE FOR COMPONENT EFFICIENT ATOMIC INTERFEROMETER GR...

BOND-SELECTIVE FULL-FIELD OPTICAL COHERENCE TOMOGRAPHY

SEMICONDUCTOR MEASUREMENT APPARATUS

METHOD FOR QUANTITATIVE EVALUATION OF CONTACT LENS EDGE LIFT BASED...

PRECISION QUANTUM-INTERFERENCE-BASED NON-LOCAL CONTACTLESS MEASUREMENT

REFLECTIVE CO-AXIAL INTERFEROMETER SYSTEMS AND METHODS THEREOF

SUPER INTERFEROMETRIC RANGE RESOLUTION

Relative intensity noise Cat's-eye swept source laser for OCT and s...

DOUBLE-MIRROR SHEAR INTERFEROMETER

MONITORING OBJECTS IN AQUEOUS MEDIA USING OPTICAL COHERENCE TOMOGRAPHY

METHOD AND DEVICE FOR MEASURING INTERFACES OF AN OPTICAL ELEMENT

DETERMINATION OF A CHANGE OF OBJECT'S SHAPE

SURFACE METROLOGY SYSTEMS AND METHODS THEREOF