Interferometers for determining dimensional properties of, or relations between, measurement objects

Industry

CPC
G01B9/02

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GPHYSICS G01Measuring instruments G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS G01B9/00Instruments as specified in the subgroups and characterised by the use of optical measuring means

Current Industry

G01B9/02Interferometers for determining dimensional properties of, or relations between, measurement objects

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Detector or photomultiplier tube (PMT) gain control over time
- Patent number 12,366,441
- Issue date Jul 22, 2025
- Canon U.S.A., Inc.
- Daisuke Yamada
- G01 - MEASURING TESTING
Information Patent Grant
Self-interferometry based sensor systems capable of generating dept...
- Patent number 12,366,442
- Issue date Jul 22, 2025
- Apple Inc.
- Mehmet Mutlu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multi-spectral scattering-matrix tomography
- Patent number 12,360,039
- Issue date Jul 15, 2025
- University of Southern California
- Chia Wei Hsu
- G01 - MEASURING TESTING
Information Patent Grant
Phase correction for optical interferometric imaging
- Patent number 12,359,977
- Issue date Jul 15, 2025
- Lockheed Martin Corporation
- Zachary James DeSantis
- G01 - MEASURING TESTING
Information Patent Grant
Interferometer filters with partial compensation structure
- Patent number 12,359,907
- Issue date Jul 15, 2025
- PSIQUANTUM, CORP.
- Koustuban Ravi
- G02 - OPTICS
Information Patent Grant
Optical metrology system and method
- Patent number 12,360,462
- Issue date Jul 15, 2025
- Nova Ltd.
- Gilad Barak
- G01 - MEASURING TESTING
Information Patent Grant
Filtering for co-sensor fusion in atomic sensors
- Patent number 12,359,905
- Issue date Jul 15, 2025
- VECTOR ATOMIC, INC.
- Jonathan Lynn Kohler
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Three-dimensional measurement device
- Patent number 12,359,906
- Issue date Jul 15, 2025
- CKD Corporation
- Hiroyuki Ishigaki
- G01 - MEASURING TESTING
Information Patent Grant
Contact-type vibration photon sensor using Doppler effect and manuf...
- Patent number 12,359,963
- Issue date Jul 15, 2025
- OTN INTELLIGENT TECHNOLOGY (SUZHOU) CO., LTD
- Xiaohai Liu
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Physical unclonable function from an integrated photonic interferom...
- Patent number 12,352,568
- Issue date Jul 8, 2025
- Clemson University Research Foundation
- Judson D. Ryckman
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Cabin entry-and-exit structure of analysis device, analysis device...
- Patent number 12,352,570
- Issue date Jul 8, 2025
- BEIJING BOE TECHNOLOGY DEVELOPMENT CO., LTD.
- Xiangguo Ma
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
In-situ residual intensity noise measurement method and system
- Patent number 12,352,571
- Issue date Jul 8, 2025
- Emcore Corporation
- Jan Amir Khan
- G01 - MEASURING TESTING
Information Patent Grant
Smartphone-based OCT systems and methods
- Patent number 12,352,622
- Issue date Jul 8, 2025
- Vanderbilt University
- Audrey K. Bowden
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Fiber noise cancellation
- Patent number 12,353,001
- Issue date Jul 8, 2025
- Stable Laser Systems, Inc.
- Josue Davila-Rodriguez
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ophthalmic imaging apparatus and ophthalmic image processing appratus
- Patent number 12,349,974
- Issue date Jul 8, 2025
- Topcon Corporation
- Shinnosuke Azuma
- G01 - MEASURING TESTING
Information Patent Grant
Broadband profiler system and method for constructing a three-dimen...
- Patent number 12,352,569
- Issue date Jul 8, 2025
- AP Infosense Limited
- Kam Chiu Lau
- G01 - MEASURING TESTING
Information Patent Grant
Optical coherence tomography with self-inspecting imaging device
- Patent number 12,345,528
- Issue date Jul 1, 2025
- LightLab Imaging, Inc.
- Steven M. Stromski
- G01 - MEASURING TESTING
Information Patent Grant
Defect inspection apparatus
- Patent number 12,345,653
- Issue date Jul 1, 2025
- Shimadzu Corporation
- Hiroshi Horikawa
- G01 - MEASURING TESTING
Information Patent Grant
Self-mixing interference device for sensing applications
- Patent number 12,345,529
- Issue date Jul 1, 2025
- Apple Inc.
- Fei Tan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Systems and methods for surface profile estimation via optical cohe...
- Patent number 12,336,785
- Issue date Jun 24, 2025
- Mitsubishi Electric Research Laboratories, Inc.
- Joshua Rapp
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Hybrid Raman and optical coherence tomography imaging
- Patent number 12,339,114
- Issue date Jun 24, 2025
- Nokia of America Corporation
- Michael Eggleston
- G01 - MEASURING TESTING
Information Patent Grant
Heterodyne fiber interferometer displacement measuring system and m...
- Patent number 12,332,041
- Issue date Jun 17, 2025
- BEIJING U-PRECISION TECH CO., LTD.
- Guohua Sun
- G01 - MEASURING TESTING
Information Patent Grant
Binocular optical coherence tomography imaging system
- Patent number 12,329,454
- Issue date Jun 17, 2025
- OPTOS PLC
- Lijo Varughese Chacko
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Measurement method for interferometrically determining a surface shape
- Patent number 12,332,043
- Issue date Jun 17, 2025
- Carl Zeiss SMT GmbH
- Hans Michael Stiepan
- G02 - OPTICS
Information Patent Grant
Heterodyne grating interferometry system based on secondary diffrac...
- Patent number 12,332,053
- Issue date Jun 17, 2025
- Tsinghua University
- Yu Zhu
- G02 - OPTICS
Information Patent Grant
Laser interferometer
- Patent number 12,332,054
- Issue date Jun 17, 2025
- Seiko Epson Corporation
- Kohei Yamada
- G02 - OPTICS
Information Patent Grant
Vibration insensitive interferometry for measuring thickness and pr...
- Patent number 12,326,402
- Issue date Jun 10, 2025
- Korean Research Institute of Standard and Science
- Yong-sik Ghim
- G01 - MEASURING TESTING
Information Patent Grant
Optical system and interference objective module therof
- Patent number 12,320,640
- Issue date Jun 3, 2025
- Apollo Medical Optics, Ltd.
- Tuan-Shu Ho
- G01 - MEASURING TESTING
Information Patent Grant
Wearable skin vibration or silent gesture detector
- Patent number 12,320,642
- Issue date Jun 3, 2025
- Apple Inc.
- Mehmet Mutlu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Tunable laser assembly
- Patent number 12,322,926
- Issue date Jun 3, 2025
- Thorlabs Quantum Electronics, Inc.
- Peter J. S. Heim
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
SELF-MIXING INTERFEROMETRY SENSOR MODULE, ELECTRONIC DEVICE AND MET...
- Publication number 20250237491
- Publication date Jul 24, 2025
- ams International AG
- Markus DANTLER
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DUAL-MODE OPTICAL COHERENCE TOMOGRAPHY AND OPTICAL COHERENCE MICROS...
- Publication number 20250237857
- Publication date Jul 24, 2025
- LighTopTech Corp.
- Eric L. Buckland
- G02 - OPTICS
Information Patent Application
SELF-MIXING INTERFERENCE BASED SENSORS FOR CHARACTERIZING TOUCH INPUT
- Publication number 20250237492
- Publication date Jul 24, 2025
- Apple Inc.
- Mark T. Winkler
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Methods and Systems for Characterizing Laser Machining Properties b...
- Publication number 20250229357
- Publication date Jul 17, 2025
- IPG PHOTONICS CORPORATION
- Paul J.L. Webster
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
OPTICAL COHERENCE TOMOGRAPHY SYSTEM FOR OPHTHALMOLOGY
- Publication number 20250231017
- Publication date Jul 17, 2025
- HAAG STREIT AG
- Lucio ROBLEDO
- G01 - MEASURING TESTING
Information Patent Application
Laser Interferometer
- Publication number 20250231018
- Publication date Jul 17, 2025
- SEIKO EPSON CORPORATION
- Jun KITAGAWA
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL MEASURING DEVICE, ACQUISITION METHOD, AND RECORDING MEDIUM
- Publication number 20250224225
- Publication date Jul 10, 2025
- Mitsubishi Electric Corporation
- Nobuki KOTAKE
- G01 - MEASURING TESTING
Information Patent Application
LOW COHERENCE INTERFEROMETER IMAGING SYSTEM
- Publication number 20250224226
- Publication date Jul 10, 2025
- National Taiwan University
- Ting-Hao Chen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CALIBRATION FOR IN-PLANE DISTORTION TOOL-TO-TOOL MATCHING
- Publication number 20250216188
- Publication date Jul 3, 2025
- KLA Corporation
- Wenjiang Guo
- G01 - MEASURING TESTING
Information Patent Application
TUNABLE CASCADED MACH-ZEHNDER INTERFEROMETER STRUCTURES
- Publication number 20250216187
- Publication date Jul 3, 2025
- Intel Corporation
- Saeed Fathololoumi
- G01 - MEASURING TESTING
Information Patent Application
METROLOGY DEVICE WITH WAVELENGTH-FREQUENCY MULTIPLEXING
- Publication number 20250216189
- Publication date Jul 3, 2025
- ONTO INNOVATION INC.
- Alexander George BOOSALIS
- G01 - MEASURING TESTING
Information Patent Application
Systems and Methods for Multi-Surface Profile Estimation via Optica...
- Publication number 20250207906
- Publication date Jun 26, 2025
- Mitsubishi Electric Research Laboratories, Inc.
- Joshua Rapp
- G01 - MEASURING TESTING
Information Patent Application
IMAGING SYSTEM AND METHOD
- Publication number 20250207905
- Publication date Jun 26, 2025
- SCENERA TECHNOLOGIES LTD
- Efraim MIKLATZKY
- G01 - MEASURING TESTING
Information Patent Application
Line-field OCT System with K Space Calibration
- Publication number 20250198742
- Publication date Jun 19, 2025
- KineoLabs, Inc.
- Walid A. Atia
- G01 - MEASURING TESTING
Information Patent Application
DEVICE AND METHOD FOR MEASURING WAFERS
- Publication number 20250198743
- Publication date Jun 19, 2025
- PRECITEC OPTRONIK GMBH
- Stephan Weiß
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR CALIBRATING A MEASUREMENT SCANNER ON A LASER-WORKING OPT...
- Publication number 20250198741
- Publication date Jun 19, 2025
- TRUMPF LASER GMBH
- Jan-Patrick Hermani
- G01 - MEASURING TESTING
Information Patent Application
Measuring Device, Machining System and Method for Adjusting a Measu...
- Publication number 20250189297
- Publication date Jun 12, 2025
- Lessmüller Lasertechnik GmbH
- Eckhard Lessmüller
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
SECOND HARMONIC GENERATION (SHG) MEASUREMENT DEVICE AND MEASUREMENT...
- Publication number 20250189295
- Publication date Jun 12, 2025
- Samsung Electronics Co., Ltd.
- Hidaka Yasuhiro
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT DEVICE
- Publication number 20250189298
- Publication date Jun 12, 2025
- Panasonic Intellectual Property Management Co., Ltd.
- Katsuya NOZAWA
- G01 - MEASURING TESTING
Information Patent Application
Device and Method for Measuring Wafers
- Publication number 20250189299
- Publication date Jun 12, 2025
- PRECITEC OPTRONIK GMBH
- Stephan Weiß
- G01 - MEASURING TESTING
Information Patent Application
NON-CONTACT OPTICAL METROLOGY SYSTEM TO MEASURE SIMULTANEOUSLY THE...
- Publication number 20250189296
- Publication date Jun 12, 2025
- IDOM, S.A.U.
- Gaizka MURGA LLANO
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR COMBINING HEIGHT MAPS AND PROFILOMETER FOR THE SAME
- Publication number 20250189303
- Publication date Jun 12, 2025
- MITUTOYO CORPORATION
- Ruslan Akhmedovich SEPKHANOV
- G01 - MEASURING TESTING
Information Patent Application
NON-INVASIVE MEASURING/DIAGNOSIS/TREATMENT APPARATUS AND METHOD
- Publication number 20250176925
- Publication date Jun 5, 2025
- Weng-Dah Ken
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DETECTION SYSTEM, COMPENSATION METHOD, AND COMPUTER READABLE MEDIUM...
- Publication number 20250172379
- Publication date May 29, 2025
- CHROMA ATE INC.
- HAO-CHIANG HU
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Reconfigurable Optical Sensing Apparatus and Method Thereof
- Publication number 20250172378
- Publication date May 29, 2025
- Artilux, Inc.
- Chih-Wei Yeh
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
OPTICAL DISPLACEMENT SENSOR ARRANGEMENT AND METHOD OF OPERATION
- Publication number 20250172377
- Publication date May 29, 2025
- SensiBel AS
- Hallvard Angelskår
- G01 - MEASURING TESTING
Information Patent Application
DEMODULATION SYSTEM FOR OPTICAL FIBER FABRY-PEROT SENSOR
- Publication number 20250164233
- Publication date May 22, 2025
- BEIJING BYWAVE SENSING TECHNOLOGY CO., LTD.
- Meng QIAO
- G01 - MEASURING TESTING
Information Patent Application
Line-field OCT System with Multi Transverse Mode Laser
- Publication number 20250164234
- Publication date May 22, 2025
- KineoLabs, Inc.
- Yisi Liu
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR DETERMINING THE LOCAL POSITION OF AT LEAST ON...
- Publication number 20250135576
- Publication date May 1, 2025
- Adige S.p.A.
- Simone DONADELLO
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
SURGICAL OPERATING SYSTEM, SURGICAL TOOL AND METHOD FOR SAFEGUARDIN...
- Publication number 20250127587
- Publication date Apr 24, 2025
- Carl Zeiss Meditec AG
- Carolin KLUSMANN
- G01 - MEASURING TESTING

Interferometers for determining dimensional properties of, or relations between, measurement objects

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Detector or photomultiplier tube (PMT) gain control over time

Self-interferometry based sensor systems capable of generating dept...

Multi-spectral scattering-matrix tomography

Phase correction for optical interferometric imaging

Interferometer filters with partial compensation structure

Optical metrology system and method

Filtering for co-sensor fusion in atomic sensors

Three-dimensional measurement device

Contact-type vibration photon sensor using Doppler effect and manuf...

Physical unclonable function from an integrated photonic interferom...

Cabin entry-and-exit structure of analysis device, analysis device...

In-situ residual intensity noise measurement method and system

Smartphone-based OCT systems and methods

Fiber noise cancellation

Ophthalmic imaging apparatus and ophthalmic image processing appratus

Broadband profiler system and method for constructing a three-dimen...

Optical coherence tomography with self-inspecting imaging device

Defect inspection apparatus

Self-mixing interference device for sensing applications

Systems and methods for surface profile estimation via optical cohe...

Hybrid Raman and optical coherence tomography imaging

Heterodyne fiber interferometer displacement measuring system and m...

Binocular optical coherence tomography imaging system

Measurement method for interferometrically determining a surface shape

Heterodyne grating interferometry system based on secondary diffrac...

Laser interferometer

Vibration insensitive interferometry for measuring thickness and pr...

Optical system and interference objective module therof

Wearable skin vibration or silent gesture detector

Tunable laser assembly

Patents Applicationslast 30 patents

SELF-MIXING INTERFEROMETRY SENSOR MODULE, ELECTRONIC DEVICE AND MET...

DUAL-MODE OPTICAL COHERENCE TOMOGRAPHY AND OPTICAL COHERENCE MICROS...

SELF-MIXING INTERFERENCE BASED SENSORS FOR CHARACTERIZING TOUCH INPUT

Methods and Systems for Characterizing Laser Machining Properties b...

OPTICAL COHERENCE TOMOGRAPHY SYSTEM FOR OPHTHALMOLOGY

Laser Interferometer

OPTICAL MEASURING DEVICE, ACQUISITION METHOD, AND RECORDING MEDIUM

LOW COHERENCE INTERFEROMETER IMAGING SYSTEM

CALIBRATION FOR IN-PLANE DISTORTION TOOL-TO-TOOL MATCHING

TUNABLE CASCADED MACH-ZEHNDER INTERFEROMETER STRUCTURES

METROLOGY DEVICE WITH WAVELENGTH-FREQUENCY MULTIPLEXING

Systems and Methods for Multi-Surface Profile Estimation via Optica...

IMAGING SYSTEM AND METHOD

Line-field OCT System with K Space Calibration

DEVICE AND METHOD FOR MEASURING WAFERS

METHOD FOR CALIBRATING A MEASUREMENT SCANNER ON A LASER-WORKING OPT...

Measuring Device, Machining System and Method for Adjusting a Measu...

SECOND HARMONIC GENERATION (SHG) MEASUREMENT DEVICE AND MEASUREMENT...

MEASUREMENT DEVICE

Device and Method for Measuring Wafers

NON-CONTACT OPTICAL METROLOGY SYSTEM TO MEASURE SIMULTANEOUSLY THE...

METHOD FOR COMBINING HEIGHT MAPS AND PROFILOMETER FOR THE SAME

NON-INVASIVE MEASURING/DIAGNOSIS/TREATMENT APPARATUS AND METHOD

DETECTION SYSTEM, COMPENSATION METHOD, AND COMPUTER READABLE MEDIUM...

Reconfigurable Optical Sensing Apparatus and Method Thereof

OPTICAL DISPLACEMENT SENSOR ARRANGEMENT AND METHOD OF OPERATION

DEMODULATION SYSTEM FOR OPTICAL FIBER FABRY-PEROT SENSOR

Line-field OCT System with Multi Transverse Mode Laser

METHOD AND SYSTEM FOR DETERMINING THE LOCAL POSITION OF AT LEAST ON...

SURGICAL OPERATING SYSTEM, SURGICAL TOOL AND METHOD FOR SAFEGUARDIN...