Interferometers for determining dimensional properties of, or relations between, measurement objects

Industry

CPC
G01B9/02

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Parent Industries

GPHYSICS G01Measuring instruments G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS G01B9/00Instruments as specified in the subgroups and characterised by the use of optical measuring means

Current Industry

G01B9/02Interferometers for determining dimensional properties of, or relations between, measurement objects

Industries

Patents Grantslast 30 patents

Information Patent Grant
Self-referencing interferometer and dual self-referencing interfero...
- Patent number 12,292,697
- Issue date May 6, 2025
- ASML Holding N.V.
- Douglas C. Cappelli
- G01 - MEASURING TESTING
Information Patent Grant
Optical device
- Patent number 12,292,620
- Issue date May 6, 2025
- Mitutoyo Corporation
- Yuki Tanaka
- G01 - MEASURING TESTING
Information Patent Grant
Dual-mode optical coherence tomography and optical coherence micros...
- Patent number 12,292,558
- Issue date May 6, 2025
- LighTopTech Corp.
- Eric L. Buckland
- G01 - MEASURING TESTING
Information Patent Grant
Method and device for characterizing the surface shape of an optica...
- Patent number 12,292,281
- Issue date May 6, 2025
- Carl Zeiss SMT GmbH
- Regina Christ
- G01 - MEASURING TESTING
Information Patent Grant
Heterodyne laser interferometer based on integrated dual polarizati...
- Patent number 12,287,198
- Issue date Apr 29, 2025
- Harbin Institute of Technology
- Haijin Fu
- G01 - MEASURING TESTING
Information Patent Grant
Identifying desirable T lymphocytes by change in mass responses
- Patent number 12,287,325
- Issue date Apr 29, 2025
- The Regents of the University of California
- Michael A. Teitell
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for measurement of optical workpieces
- Patent number 12,285,215
- Issue date Apr 29, 2025
- ARIZONA OPTICAL METROLOGY LLC
- James Burge
- G01 - MEASURING TESTING
Information Patent Grant
Biometric identification systems and associated devices
- Patent number 12,289,413
- Issue date Apr 29, 2025
- Tesseract Health, Inc.
- Lawrence C. West
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Micro-optomechanical system and method for the production thereof
- Patent number 12,282,040
- Issue date Apr 22, 2025
- Karlsruher Institut für Technologie
- Philipp-Immanuel Dietrich
- G01 - MEASURING TESTING
Information Patent Grant
Device for measuring diameter error of roller for threaded pair tra...
- Patent number 12,276,491
- Issue date Apr 15, 2025
- Shanhai Jiao Tong University
- Yi Cui
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for system self-diagnosis
- Patent number 12,277,731
- Issue date Apr 15, 2025
- Canon U.S.A., Inc.
- Badr Elmaanaoui
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Broadband interferometric confocal microscope
- Patent number 12,270,646
- Issue date Apr 8, 2025
- University of Rochester
- Arturo Alejandro Canales Benavides
- G02 - OPTICS
Information Patent Grant
High-resolution phase detection method and system based on plane gr...
- Patent number 12,270,645
- Issue date Apr 8, 2025
- Tsinghua University
- Yu Zhu
- G01 - MEASURING TESTING
Information Patent Grant
Method for calibration of an optical measurement system and optical...
- Patent number 12,270,647
- Issue date Apr 8, 2025
- ASML Netherlands B.V.
- Maarten Jozef Jansen
- G01 - MEASURING TESTING
Information Patent Grant
Compact dual pass interferometer for a plane mirror interferometer
- Patent number 12,270,644
- Issue date Apr 8, 2025
- ASML Netherlands B.V.
- Maarten Jozef Jansen
- G02 - OPTICS
Information Patent Grant
Optical coherence tomography device, optical coherence tomography m...
- Patent number 12,265,026
- Issue date Apr 1, 2025
- UNIVERSITY OF TSUKUBA
- Yoshiaki Yasuno
- G01 - MEASURING TESTING
Information Patent Grant
Device and method for measuring wafers
- Patent number 12,264,914
- Issue date Apr 1, 2025
- Precitec Optronik GmbH
- Stephan Weiß
- G01 - MEASURING TESTING
Information Patent Grant
Distance measurement device and method based on secondary mixing of...
- Patent number 12,259,240
- Issue date Mar 25, 2025
- Harbin Institute of Technology
- Ruitao Yang
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for characterizing laser machining properties b...
- Patent number 12,257,644
- Issue date Mar 25, 2025
- IPG Photonics Corporation
- Paul J. L. Webster
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Systems, methods and computer program products for optimizing optic...
- Patent number 12,259,241
- Issue date Mar 25, 2025
- LEICA MICROSYSTEMS NC, INC.
- Eric Lynch
- G01 - MEASURING TESTING
Information Patent Grant
Tunable laser assembly and method of control
- Patent number 12,261,413
- Issue date Mar 25, 2025
- Thorlabs Quantum Electronics, Inc.
- Peter J. S. Heim
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Three-dimensional measurement device
- Patent number 12,259,230
- Issue date Mar 25, 2025
- CKD Corporation
- Hiroyuki Ishigaki
- G01 - MEASURING TESTING
Information Patent Grant
Image analysis
- Patent number 12,254,627
- Issue date Mar 18, 2025
- MERIT CRO, INC.
- Yijun Huang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Laser device
- Patent number 12,255,438
- Issue date Mar 18, 2025
- NKT Photonics A/S
- Jens E. Pedersen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Interferometric measurement system using time-correlated photons
- Patent number 12,253,357
- Issue date Mar 18, 2025
- Qubit Moving and Storage, LLC
- Gary Vacon
- G01 - MEASURING TESTING
Information Patent Grant
Heterodyne interferometer based on multi-target opposite displaceme...
- Patent number 12,247,824
- Issue date Mar 11, 2025
- Harbin Institute of Technology
- Haijin Fu
- G01 - MEASURING TESTING
Information Patent Grant
Wavelength tracking system, method to calibrate a wavelength tracki...
- Patent number 12,247,883
- Issue date Mar 11, 2025
- ASML Netherlands B.V.
- Engelbertus Antonius Fransiscus Van Der Pasch
- G01 - MEASURING TESTING
Information Patent Grant
Stabilized frequency generator
- Patent number 12,247,835
- Issue date Mar 11, 2025
- Nexus Photonics Inc
- Tin Komljenovic
- G02 - OPTICS
Information Patent Grant
Handheld optical imaging devices and methods
- Patent number 12,239,376
- Issue date Mar 4, 2025
- The University of Washington
- Ruikang K. Wang
- G01 - MEASURING TESTING
Information Patent Grant
2D material detector for activity monitoring of single living micro...
- Patent number 12,239,413
- Issue date Mar 4, 2025
- SOUNDCELL HOLDING B.V.
- Farbod Alijani
- C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...

Patents Applicationslast 30 patents

Information Patent Application
METHOD AND SYSTEM FOR DETERMINING THE LOCAL POSITION OF AT LEAST ON...
- Publication number 20250135576
- Publication date May 1, 2025
- Adige S.p.A.
- Simone DONADELLO
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
IMAGE PROCESSING APPARATUS, IMAGE PROCESSING METHOD, AND NON-TRANSI...
- Publication number 20250131764
- Publication date Apr 24, 2025
- NEC Corporation
- Shigeru NAKAMURA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SURGICAL OPERATING SYSTEM, SURGICAL TOOL AND METHOD FOR SAFEGUARDIN...
- Publication number 20250127587
- Publication date Apr 24, 2025
- Carl Zeiss Meditec AG
- Carolin KLUSMANN
- G01 - MEASURING TESTING
Information Patent Application
DYNAMIC INTERFEROMETER ILLUMINATOR
- Publication number 20250123095
- Publication date Apr 17, 2025
- Zygo Corporation
- Leslie L. Deck
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR INTERFEROMETRIC MEASUREMENT ALIGNMENT
- Publication number 20250123094
- Publication date Apr 17, 2025
- ARIZONA OPTICAL METROLOGY LLC
- James Howard Burge
- G01 - MEASURING TESTING
Information Patent Application
INTERFEROMETRIC METHOD FOR MEASURING OPTICAL DISTANCE
- Publication number 20250123093
- Publication date Apr 17, 2025
- Zygo Corporation
- Leslie L. Deck
- G01 - MEASURING TESTING
Information Patent Application
Self-Aligning Interferometric End Point Housing
- Publication number 20250116500
- Publication date Apr 10, 2025
- Trishul BYREGOWDA SHIVALINGAIAH
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF CALCULATING OPTICAL AERIAL IMAGE
- Publication number 20250116501
- Publication date Apr 10, 2025
- National Tsing-Hua University
- Tsai-Sheng Gau
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
POSITION DETECTION SYSTEM USING LASER LIGHT INTERFEROMETRY
- Publication number 20250116499
- Publication date Apr 10, 2025
- VDL Enabling Technologies Group B.V.
- Francesco PATTI
- G01 - MEASURING TESTING
Information Patent Application
MULTI-PHASE INTERFEROMETER FOR 3D METROLOGY
- Publication number 20250109934
- Publication date Apr 3, 2025
- ORBOTECH LTD.
- Yuri Paskover
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND SYSTEMS FOR CONFOCAL FUNCTION DETERMINATION AND CORRECT...
- Publication number 20250102289
- Publication date Mar 27, 2025
- HEIDELBERG ENGINEERING GMBH
- Johannes KÜBLER
- G01 - MEASURING TESTING
Information Patent Application
Optical Coherence Tomography System for Subsurface Inspection
- Publication number 20250102290
- Publication date Mar 27, 2025
- Hamamatsu Photonics K. K.
- Qingsong Wang
- G01 - MEASURING TESTING
Information Patent Application
TECHNIQUES FOR ROBUST MACHINE VISION SYSTEMS
- Publication number 20250093514
- Publication date Mar 20, 2025
- COGNEX CORPORATION
- Thomas Ruhnau
- G01 - MEASURING TESTING
Information Patent Application
QUANTUM NETWORK DEVICES, SYSTEMS, AND METHODS
- Publication number 20250097021
- Publication date Mar 20, 2025
- The Research Foundation for the State University of New York
- Eden Figueroa
- G01 - MEASURING TESTING
Information Patent Application
DETERMINING ELECTROMAGNETIC WAVE CONTROL FOR MATTER-WAVE INTERFEROM...
- Publication number 20250085099
- Publication date Mar 13, 2025
- ColdQuanta, Inc.
- Lennart Maximilian Seifert
- G01 - MEASURING TESTING
Information Patent Application
Self-Configuration and Error Correction in Linear Photonic Circuits
- Publication number 20250085100
- Publication date Mar 13, 2025
- Massachusetts Institute of Technology
- Ryan HAMERLY
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR MATCHING FREQUENCIES OF LASERS IN A QUANTUM C...
- Publication number 20250080234
- Publication date Mar 6, 2025
- Joshua Alexander Slater
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
DEVICE, SYSTEM, AND METHOD FOR IN-SITU MEASUREMENT OF THREE-DIMENSI...
- Publication number 20250076031
- Publication date Mar 6, 2025
- WUHAN UNIVERSITY
- Hui LI
- B22 - CASTING POWDER METALLURGY
Information Patent Application
RESOLVING ABSOLUTE DEPTH IN CIRCULAR-RANGING OPTICAL COHERENCE TOMO...
- Publication number 20250076194
- Publication date Mar 6, 2025
- The General Hospital Corporation
- Benjamin Vakoc
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED ELECTRONIC SYSTEM FOR OPTICAL COHERENCE TOMOGRAPHY
- Publication number 20250067551
- Publication date Feb 27, 2025
- Myriad Advanced Technologies LLC
- Muhammad Al-Qaisi
- G01 - MEASURING TESTING
Information Patent Application
Frequency-Domain Optical Coherence Tomography with Extended Field-o...
- Publication number 20250067553
- Publication date Feb 27, 2025
- NINEPOINT MEDICAL, INC.
- Eman NAMATI
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
SYSTEMS, METHODS, AND MEDIA FOR MULTIPLE BEAM OPTICAL COHERENCE TOM...
- Publication number 20250067552
- Publication date Feb 27, 2025
- The General Hospital Corporation
- Benjamin Vakoc
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR CALIBRATING A SELF-MIXING INTERFEROMETER AND SELF-MIXING...
- Publication number 20250067555
- Publication date Feb 27, 2025
- ams International AG
- Goran Stojanovic
- G01 - MEASURING TESTING
Information Patent Application
SELF-MIXING INTERFEROMETRY
- Publication number 20250067554
- Publication date Feb 27, 2025
- Dyson Technology Limited
- David James GRAHAM
- G01 - MEASURING TESTING
Information Patent Application
LED LIGHT SOURCE FOR MEDICAL OPTICAL COHERENCE TOMOGRAPHY WITH HIGH...
- Publication number 20250063864
- Publication date Feb 20, 2025
- Lumileds LLC
- Peter Josef Schmidt
- C09 - DYES PAINTS POLISHES NATURAL RESINS ADHESIVES MISCELLANEOUS COMPOSITION...
Information Patent Application
DYNAMIC AUTOFOCUS METHOD AND SYSTEM FOR ASSAY IMAGER
- Publication number 20250052999
- Publication date Feb 13, 2025
- Illumina, Inc.
- Darren Robert Segale
- C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information Patent Application
MEASURING PARALLELISM
- Publication number 20250052559
- Publication date Feb 13, 2025
- Samsung Electronics Co., Ltd.
- Minhwan Seo
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR HIGH-RESOLUTION REFLECTION TOMOGRAPHIC IMAGING
- Publication number 20250052560
- Publication date Feb 13, 2025
- Korea Advanced Institute of Science and Techno logy
- YongKeun PARK
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
MIRROR UNIT AND OPTICAL MODULE
- Publication number 20250044074
- Publication date Feb 6, 2025
- HAMAMATSU PHOTONICS K. K.
- Tomofumi Suzuki
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
METHODS AND SYSTEMS FOR THREE-DIMENSIONAL IMAGING OF A TRANSPARENT...
- Publication number 20250044075
- Publication date Feb 6, 2025
- Centre National de la Recherche Scientifique
- Albert Claude BOCCARA
- G01 - MEASURING TESTING

Interferometers for determining dimensional properties of, or relations between, measurement objects

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Self-referencing interferometer and dual self-referencing interfero...

Optical device

Dual-mode optical coherence tomography and optical coherence micros...

Method and device for characterizing the surface shape of an optica...

Heterodyne laser interferometer based on integrated dual polarizati...

Identifying desirable T lymphocytes by change in mass responses

Systems and methods for measurement of optical workpieces

Biometric identification systems and associated devices

Micro-optomechanical system and method for the production thereof

Device for measuring diameter error of roller for threaded pair tra...

Methods and systems for system self-diagnosis

Broadband interferometric confocal microscope

High-resolution phase detection method and system based on plane gr...

Method for calibration of an optical measurement system and optical...

Compact dual pass interferometer for a plane mirror interferometer

Optical coherence tomography device, optical coherence tomography m...

Device and method for measuring wafers

Distance measurement device and method based on secondary mixing of...

Methods and systems for characterizing laser machining properties b...

Systems, methods and computer program products for optimizing optic...

Tunable laser assembly and method of control

Three-dimensional measurement device

Image analysis

Laser device

Interferometric measurement system using time-correlated photons

Heterodyne interferometer based on multi-target opposite displaceme...

Wavelength tracking system, method to calibrate a wavelength tracki...

Stabilized frequency generator

Handheld optical imaging devices and methods

2D material detector for activity monitoring of single living micro...

Patents Applicationslast 30 patents

METHOD AND SYSTEM FOR DETERMINING THE LOCAL POSITION OF AT LEAST ON...

IMAGE PROCESSING APPARATUS, IMAGE PROCESSING METHOD, AND NON-TRANSI...

SURGICAL OPERATING SYSTEM, SURGICAL TOOL AND METHOD FOR SAFEGUARDIN...

DYNAMIC INTERFEROMETER ILLUMINATOR

SYSTEM AND METHOD FOR INTERFEROMETRIC MEASUREMENT ALIGNMENT

INTERFEROMETRIC METHOD FOR MEASURING OPTICAL DISTANCE

Self-Aligning Interferometric End Point Housing

METHOD OF CALCULATING OPTICAL AERIAL IMAGE

POSITION DETECTION SYSTEM USING LASER LIGHT INTERFEROMETRY

MULTI-PHASE INTERFEROMETER FOR 3D METROLOGY

METHODS AND SYSTEMS FOR CONFOCAL FUNCTION DETERMINATION AND CORRECT...

Optical Coherence Tomography System for Subsurface Inspection

TECHNIQUES FOR ROBUST MACHINE VISION SYSTEMS

QUANTUM NETWORK DEVICES, SYSTEMS, AND METHODS

DETERMINING ELECTROMAGNETIC WAVE CONTROL FOR MATTER-WAVE INTERFEROM...

Self-Configuration and Error Correction in Linear Photonic Circuits

METHOD AND SYSTEM FOR MATCHING FREQUENCIES OF LASERS IN A QUANTUM C...

DEVICE, SYSTEM, AND METHOD FOR IN-SITU MEASUREMENT OF THREE-DIMENSI...

RESOLVING ABSOLUTE DEPTH IN CIRCULAR-RANGING OPTICAL COHERENCE TOMO...

INTEGRATED ELECTRONIC SYSTEM FOR OPTICAL COHERENCE TOMOGRAPHY

Frequency-Domain Optical Coherence Tomography with Extended Field-o...

SYSTEMS, METHODS, AND MEDIA FOR MULTIPLE BEAM OPTICAL COHERENCE TOM...

METHOD FOR CALIBRATING A SELF-MIXING INTERFEROMETER AND SELF-MIXING...

SELF-MIXING INTERFEROMETRY

LED LIGHT SOURCE FOR MEDICAL OPTICAL COHERENCE TOMOGRAPHY WITH HIGH...

DYNAMIC AUTOFOCUS METHOD AND SYSTEM FOR ASSAY IMAGER

MEASURING PARALLELISM

SYSTEM AND METHOD FOR HIGH-RESOLUTION REFLECTION TOMOGRAPHIC IMAGING

MIRROR UNIT AND OPTICAL MODULE

METHODS AND SYSTEMS FOR THREE-DIMENSIONAL IMAGING OF A TRANSPARENT...