The present application is related to and claims the priority benefit of European Patent Application No. 21173703.6, filed May 12, 2021, the entire contents of which are incorporated herein by reference.
The present disclosure relates to a method of operating an inductively coupled plasma mass spectrometry apparatus for analyzing a molecular analyte substance or a mixture of at least two substances.
Inductively coupled plasma mass spectrometers (ICP-MS) are, e.g., used for trace element analysis. Typically, an ICP-MS analysis involves the complete atomization and subsequent ionization of the test sample by means of a plasma source before the resulting elemental ions are quantified by the spectrometer. Up to now, several different types of ICP-MS are available, such as, e.g., the quadrupole ICP-MS or time-of-flight ICP-MS.
A common problem of any ICP-MS analysis is the possible occurrence of interferences caused by newly forming polyatomic ions or molecules. Such interferences are often addressed by means of reaction/collision cells in the respective ICP-MS system, whereby reagent gases are added to the reaction/collision cell to provide for a separation of analyte ions from interferences based upon their energy differences. An exemplary ICP-MS system for improved attenuation of interferences is described in U.S. Pat. No. 7,329,863 B2 and U.S. Pat. No. 7,119,330 B2.
ICP-MS systems are less suitable or even unsuitable for the analysis of molecules, which are typically investigated by mass spectrometers employing different types of ionization sources, e.g., electrospray-ionization (ESI) or atmospheric pressure chemical ionization (APCI). Such methods are optimized for the ionization of molecules and do not lead to an atomization of them.
Other mass spectrometry systems suitable for molecular analysis are, e.g., the selected-ion flow-tube mass spectrometer (SIFT-MS) or the proton-transfer-reaction mass spectrometer (PTR-MS)
However, up to now, no mass spectrometry system is available, which allows for the analysis of atomized and ionized molecules in one single device.
Therefore, the objective technical problem underlying the present disclosure is to provide such possibility for analyzing atomized and ionized molecules in one single device. This object is achieved by the method and by the use according to the present disclosure.
Regarding the method, the object is achieved by a method of operating an inductively coupled plasma mass spectrometry apparatus for analyzing an analyte sample, the mass spectrometry apparatus including a plasma ion source, a mass analyzer and an interface arrangement positioned between the plasma ion source and the mass analyzer of the mass spectrometer, the interface arrangement at least comprising an interface structure in the form of a cone, e.g., a sampling cone or a skimmer cone, and at least one passage with an inlet and an outlet, the passage leading from an outside of the interface structure into a reaction zone formed in an area surrounding the outlet of the passage.
The method comprises the steps of: generating a plasma using the plasma ion source and forming a plasma flux to flow towards the mass analyzer; supplying the analyte sample into the reaction zone via the passage such that the analyte sample interacts with the plasma flux; and analyzing the analyte sample using the mass analyzer.
The molecular analyte substance or mixture may initially be provided in the form of a gas, a vapor or a liquid. The analyte sample preferably is a molecular analyte substance or a mixture of at least two substances.
The interface structure may comprise one or more cones, e.g., it can comprise a sampler and a skimmer cone, or a sampler cone, a skimmer cone and at least one additional cone.
The passage used for introducing the substance or mixture may, e.g., be such as described in U.S. Pat. No. 7,329,863 B2 and U.S. Pat. No. 7,119,330 B2. In the context of the present disclosure full reference is made to both references. The passages in the references given, however are used for an entirely different purpose, which is attenuating interferences. The same set-up can however also be used to facilitate molecular analysis by means of an ICP-MS, as suggested by the present disclosure.
The present disclosure advantageously allows to analyze analyte samples, in particular a molecular sample, by means of an ICP-MS utilizing an entrance-based collision/reaction cell. The analyte sample is supplied via the at least one passage such that an ion beam is formed in the reaction zone which proceeds towards the mass analyzer.
In case of a conventional ICP-MS, the plasma into which the analyte sample is introduced, generally has a relatively high pressure (e.g., atmospheric pressure). The plasma vaporizes and ionizes the sample, and the ions are subsequently extracted and transferred to a mass analyzer via a differentially-pumped interface, the mass analyzer generally operated at a relatively low pressure, typically at <10−5 Torr. The space between succeeding cones decreases in a stepwise manner. By introducing the analyte sample into the passage instead of directly providing it to the area where the plasma is produced, an ionization process of the analyte sample becomes possible which is much softer and does not lead to a, especially complete, decomposition of the molecules, compared to the standard procedures used in ICP-MS. The disclosed procedure further enables parallel ionization of polar and nonpolar analytes, as well as ionization of gaseous and liquid analytes and also for fragmentation of molecules on purpose.
In one embodiment of the present disclosure, at least one reagent substance is added which serves for producing specific ions of the analyte sample by chemical ionization. The reagent substance may, e.g., be added via the at least one passage.
Advantageously, the reagent substance is one of H2, O2, H2O, NH3, NO3 or any ionized, protonated or deprotonated derivative therefrom.
Another embodiment comprises that a microwave induced plasma source is used as plasma ion source. Using an ion source which includes a microwave generator has the advantage that high field strengths can be achieved along with low power dissipation. A uniform and energy efficient plasma can thus be achieved in a straightforward manner. In this regard reference is made to DE 202020106423 U1 U.S. Pat. No. 2016/0026747 A1 and WO 2017/176131 A1. In particular, such microwave based plasma ion source may comprise a dielectric resonator.
It is of advantage if argon, nitrogen, krypton, xenon, neon, helium or any mixture of at least two gases is used as a carrier gas for the plasma ion source. The choice of carrier gas depends on the reactions that are to be induced. In this regard, nitrogen particularly leads to additional reactions with reagent gases or molecules, it can be used as a carrier gas and for ionization.
One embodiment comprises that the analyte sample is split into at least two sub-parts based on at least one physical and/or chemical property of its components, e.g., size or electrical charge, before being supplied into reaction zone via the passage, wherein the sub-parts are separately supplied into the reaction zone one after the other. Such splitting can advantageously be achieved by various separation and/or fractionation methods, such as gas or liquid chromatography or, e.g., capillary, electrophoresis. For this purpose, the mass spectrometry apparatus can include appropriate means for separating, splitting or fractionation of an analyte sample, e.g., a gas or liquid chromatography or electrophoresis unit.
A further embodiment comprises that the mass spectrometer is provided with an ion optical system establishing a reflecting electrostatic field for reflecting ions along a desired path towards the mass analyzer. Such ion optical system may include any arrangement capable of deflecting a quantity of ions between two non-parallel planes, e.g., ion mirrors, reflectors, deflectors, quadrupole ion deflectors, electrostatic energy analyzers, magnetic ion optics, ion multiple guides, and the like. One preferred embodiment employs an arrangement of an ion optics “IonMirror” devices, as described in U.S. Pat. No. 6,614,021 (incorporated herein by reference), or those disclosed in U.S. Pat. Nos. 5,559,337, 5,773,823, 5,804,821, 6,031,579, 6,815,667, 6,630,665, or 6,6306,651. Using an ion mirror further increases the sensitivity of the ICP-MS device.
In another embodiment of the method, the interface structure:
The analyte sample thus is directed into the reaction zone where it interacts with the plasma which is already at a lower pressure compared to the pressure in the area of the plasma ion source. This makes the ionization much softer and leads to notably less fragmentation processes.
One embodiment comprises that the interface arrangement at least comprises a sampling cone and a skimmer cone, the skimmer cone being arranged behind the sampling cone.
Yet, in another embodiment, at least two passages are provided in the interface arrangement. The at least two passages may be provided in the same cone or in two different cones, e.g., one in the skimmer cone and one in the sampling cone. By providing more than one passage, more than one reaction zone is created enabling for multi-reactions.
In one embodiment, the passage is completely located within at least one cone, e.g., the sampler, the skimmer cone or any other cone. Such device is, e.g., suggested in U.S. Pat. No. 7,329,863 B2.
In another embodiment however, the passage is located behind the sampler cone, the skimmer cone or any other cone, as described in U.S. Pat. No. 7,119,330 B2.
In a further embodiment the analyte sample and/or the reagent substance is/are supplied via the passage at least during a first time interval and supplied to an area of the plasma ion source, where the plasma is formed, at least during a second time interval. By this procedure, a conventional ICP-MS analysis relating to a structural analysis can be combined with a molecular analysis. The first and second time interval can be carried out alternately, or can be initiated on demand.
The object of the present disclosure is further achieved by use of an inductively coupled mass spectrometry apparatus, the mass spectrometry apparatus including a plasma ion source, a mass analyzer and an interface arrangement positioned between the plasma ion source and the mass analyzer of the mass spectrometer, the interface arrangement at least comprising an interface structure in the form of a cone of the interface arrangement, e.g., a sampling cone or a skimmer cone, and at least one passage with an inlet and an outlet, the passage leading from an outside of the interface structure into a reaction zone formed in an area surrounding the outlet of the passage, for analyzing a molecular analyte sample. The mass spectrometry apparatus is in particular used for molecular analysis by carrying out a method according to at least one of the embodiments described above.
The present disclosure as well as its preferred embodiments will be further explained based on the figures, which include:
In the figures, same elements are provided with the same reference numbers.
The mass spectrometer further comprises an interface arrangement 32 for transferring the analyte sample and plasma flux 28 into the analyzing part of the ICP-MS including an interface structure comprising a sampling cone 34 and a skimmer cone 40. Both cones 34, 40 each have a hole 36, 42 at its apex through which the plasma flux 28 passes from the ion source 20 into a fist 38 and second 44 vacuum region. The cones 34, 40 are typically water-cooled. The second vacuum region 44 in the embodiment shown further comprises an ion extraction electrode 46 and other ion optics [not shown] all being part of the ion optical system, which serves for extracting an ion beam from the plasma flux 28 into a third pumped vacuum region 48 and towards mass analyzer 50 which separates the ions according to their mass-to-charge-ratio and towards detector 52, where the detected ions are read out by recording means 54. Different mass analyzers 50, such as a quadrupole or time-of-flight (TOF) mass analyzer 50 may be employed. Utilizing a TOF analyzer has the advantage of being capable of discriminating resulting polyatomic ions.
The interface arrangement 32 used for carrying out the method according to the present disclosure comprises at least one passage with an inlet and an outlet, the passage leading from an outside of the interface structure into a reaction zone formed in an area surrounding the outlet of the passage as illustrated in
The interface arrangement 32 shown in
A second preferred embodiment of the interface arrangement 32 is shown in
A third preferred embodiment for an interface arrangement 32 is shown in
Finally, another preferred embodiment of the interface arrangement 32 is subject to
It shall be noted that the different embodiments for the interface arrangement 32 shown can arbitrarily combined with each other. Further, it shall be noted that the present disclosure is by no means limited to the embodiments shown. For instance, any embodiment for an interface arrangement 32 or interface structure 32, 40 e.g., as disclosed in U.S. Pat. No. 7,329,863 B2 and U.S. Pat. No. 7,119,330 B2.
In summary, the present disclosure provides for a possibility to combine conventional ICP-MS for elemental analysis with organic analysis of molecules in one single device. To achieve this, passages 60, 74, 88, 94 conventionally provided for reducing interferences by supplying collision gases, now and for the first time, are used to supply the analyte sample AS into the mass spectrometry device. The analyte sample AS, in particular a molecular sample, are either ionized by the incoming already cooled down plasma, the residual plasma, or by a carrier gas, e.g., stemming from the ion source 20.
It is furthermore possible to add additional reagent substances RD via the at least one passage 60, 74, 88, 94 to produce specific product ions by chemical ionization, that can be analyzed by the subsequent mass spectrometry analyzing section.
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