Lateral single gate silicon transistors

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H01L29/66568

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HELECTRICITY H01Electric elements H01LSEMICONDUCTOR DEVICES ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR H01L29/00Semiconductor devices adapted for rectifying, amplifying, oscillating or switching, or capacitors or resistors with at least one potential-jump barrier or surface barrier

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H01L29/66568Lateral single gate silicon transistors

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Semiconductor device and manufacturing method thereof
- Patent number 12,170,314
- Issue date Dec 17, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd
- Chun Hsiung Tsai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods for forming a semiconductor device structure and related se...
- Patent number 12,166,099
- Issue date Dec 10, 2024
- ASM IP Holding B.V.
- Chiyu Zhu
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
MOS transistor having substantially parallelepiped-shaped insulatin...
- Patent number 12,125,899
- Issue date Oct 22, 2024
- STMicroelectronics (Rousset) SAS
- Arnaud Regnier
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Silicon carbide semiconductor device, power converter, and method o...
- Patent number 11,984,492
- Issue date May 14, 2024
- Mitsubishi Electric Corporation
- Yuji Ebiike
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Strained semiconductor using elastic edge relaxation of a stressor...
- Patent number 11,978,800
- Issue date May 7, 2024
- ACORN SEMI, LLC
- Paul A. Clifton
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor with through-substrate interconnect
- Patent number 11,978,656
- Issue date May 7, 2024
- Micron Technology, Inc.
- Kyle K. Kirby
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Self-protective layer formed on high-K dielectric layer
- Patent number 11,923,201
- Issue date Mar 5, 2024
- Taiwan Semiconductor Manufacturing Co., Ltd
- Ju-Li Huang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device and manufacturing method thereof
- Patent number 11,916,107
- Issue date Feb 27, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd
- Chun Hsiung Tsai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of manufacturing semiconductor device
- Patent number 11,915,975
- Issue date Feb 27, 2024
- Renesas Electronics Corporation
- Tetsuya Yoshida
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Manufacturing method of semiconductor device and semiconductor proc...
- Patent number 11,899,368
- Issue date Feb 13, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd
- Yu-Kai Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Diffusion barrier layer for source and drain structures to increase...
- Patent number 11,901,413
- Issue date Feb 13, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd
- Kuei-Ming Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electronic devices and systems, and methods for making and using th...
- Patent number 11,887,895
- Issue date Jan 30, 2024
- United Semiconductor Japan Co., Ltd.
- Scott E. Thompson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of making a plurality of high density logic elements with ad...
- Patent number 11,876,125
- Issue date Jan 16, 2024
- Tokyo Electron Limited
- Mark I. Gardner
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Field-effect transistor, method of manufacturing the same, and radi...
- Patent number 11,810,861
- Issue date Nov 7, 2023
- Sony Group Corporation
- Naoki Saka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor-on-insulator field effect transistor with performance...
- Patent number 11,810,951
- Issue date Nov 7, 2023
- GLOBALFOUNDRIES U.S. Inc.
- Jianwei Peng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for making semiconductor device with selective etching of su...
- Patent number 11,721,546
- Issue date Aug 8, 2023
- ATOMERA INCORPORATED
- Marek Hytha
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor structure and manufacturing method thereof
- Patent number 11,710,642
- Issue date Jul 25, 2023
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Qinghua Han
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
1T1R resistive random access memory, and manufacturing method there...
- Patent number 11,706,932
- Issue date Jul 18, 2023
- Shenzhen Goodix Technology Co., Ltd.
- Guofeng Yao
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods for forming a semiconductor device structure and related se...
- Patent number 11,695,054
- Issue date Jul 4, 2023
- ASM IP Holding B.V.
- Chiyu Zhu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device having contact plug
- Patent number 11,694,924
- Issue date Jul 4, 2023
- Taiwan Semiconductor Manufacturing Co., Ltd
- Wen-Jia Hsieh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Transistor level interconnection methodologies utilizing 3D interco...
- Patent number 11,688,776
- Issue date Jun 27, 2023
- Adeia Semiconductor Inc.
- Javier A. Delacruz
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device and method for fabricating the same including...
- Patent number 11,670,511
- Issue date Jun 6, 2023
- SK Hynix Inc.
- Seon-Haeng Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor structure and manufacturing method thereof
- Patent number 11,640,981
- Issue date May 2, 2023
- United Microelectronics Corp.
- Shin-Hung Li
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for fabricating semiconductor device with programmable element
- Patent number 11,637,202
- Issue date Apr 25, 2023
- NANYA TECHNOLOGY CORPORATION
- Chang-Chieh Lin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods of forming dislocation enhanced strain in NMOS and PMOS str...
- Patent number 11,610,995
- Issue date Mar 21, 2023
- Daedalus Prime LLC
- Michael Jackson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device and manufacturing method thereof
- Patent number 11,557,650
- Issue date Jan 17, 2023
- Taiwan Semiconductor Manufacturing Co., Ltd
- Chun Hsiung Tsai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for forming stressor, semiconductor device having stressor,...
- Patent number 11,538,938
- Issue date Dec 27, 2022
- Taiwan Semiconductor Manufacturing Co., Ltd
- Che-Wei Yang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Metal gate modulation to improve kink effect
- Patent number 11,532,621
- Issue date Dec 20, 2022
- Taiwan Semiconductor Manufacturing Company, Ltd
- Meng-Han Lin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Diffusion barrier layer for source and drain structures to increase...
- Patent number 11,522,049
- Issue date Dec 6, 2022
- Taiwan Semiconductor Manufacturing Company, Ltd
- Kuei-Ming Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for preparing transistor device
- Patent number 11,482,419
- Issue date Oct 25, 2022
- NANYA TECHNOLOGY CORPORATION
- Jhen-Yu Tsai
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR APPARATUS AND METHOD OF MANUFACTURING SEMICONDUCTOR A...
- Publication number 20240371936
- Publication date Nov 7, 2024
- ASAHI KASEI MICRODEVICES CORPORATION
- Shuntaro Fujii
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE
- Publication number 20240321948
- Publication date Sep 26, 2024
- SK HYNIX INC.
- Nam Jae LEE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR WITH THROUGH-SUBSTRATE INTERCONNECT
- Publication number 20240282620
- Publication date Aug 22, 2024
- Micron Technology, Inc.
- Kyle K. Kirby
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DEVICE HAVING HYBRID CELL REGIONS AND METHOD OF MANUFACTURING SAME
- Publication number 20240274592
- Publication date Aug 15, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Han-Chung CHANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
STRAINED SEMICONDUCTOR USING ELASTIC EDGE RELAXATION OF A STRESSOR...
- Publication number 20240250172
- Publication date Jul 25, 2024
- Acorn Semi, LLC
- Paul A. Clifton
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DIFFUSION BARRIER LAYER FOR SOURCE AND DRAIN STRUCTURES TO INCREASE...
- Publication number 20240243174
- Publication date Jul 18, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Kuei-Ming Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF
- Publication number 20240213314
- Publication date Jun 27, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Chun Hsiung TSAI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SELF-PROTECTIVE LAYER FORMED ON HIGH-K DIELECTRIC LAYER
- Publication number 20240203740
- Publication date Jun 20, 2024
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Ju-Li Huang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR MAKING SEMICONDUCTOR DEVICE WITH SELECTIVE ETCHING OF SU...
- Publication number 20240194482
- Publication date Jun 13, 2024
- ATOMERA INCORPORATED
- Marek Hytha
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INTEGRATION OF LOW AND HIGH VOLTAGE DEVICES ON SUBSTRATE
- Publication number 20230387209
- Publication date Nov 30, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Hsin Fu Lin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHODS FOR FORMING A SEMICONDUCTOR DEVICE STRUCTURE AND RELATED SE...
- Publication number 20230352556
- Publication date Nov 2, 2023
- ASM IP HOLDING B.V.
- Chiyu Zhu
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING SAME
- Publication number 20230290854
- Publication date Sep 14, 2023
- Kabushiki Kaisha Toshiba
- Kouta TOMITA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHODS OF FORMING DISLOCATION ENHANCED STRAIN IN NMOS AND PMOS STR...
- Publication number 20230197848
- Publication date Jun 22, 2023
- Daedalus Prime LLC
- Michael Jackson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR-ON-INSULATOR FIELD EFFECT TRANSISTOR WITH PERFORMANCE...
- Publication number 20230197783
- Publication date Jun 22, 2023
- GLOBALFOUNDRIES U.S. Inc.
- Jianwei Peng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF
- Publication number 20230154980
- Publication date May 18, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Chun Hsiung TSAI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TRANSISTOR LEVEL INTERCONNECTION METHODOLOGIES UTILIZING 3D INTERCO...
- Publication number 20230138732
- Publication date May 4, 2023
- Adeia Semiconductor Inc.
- Javier A. DeLaCruz
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR MAKING SEMICONDUCTOR DEVICE WITH SELECTIVE ETCHING OF SU...
- Publication number 20230136797
- Publication date May 4, 2023
- ATOMERA INCORPORATED
- Marek Hytha
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR FORMING A SEMICONDUCTOR STRUCTURE
- Publication number 20230138009
- Publication date May 4, 2023
- United Semiconductor (Xiamen) Co., Ltd.
- Jun Wu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
STRAINED SEMICONDUCTOR USING ELASTIC EDGE RELAXATION OF A STRESSOR...
- Publication number 20230020403
- Publication date Jan 19, 2023
- Acorn Semi, LLC
- Paul A. Clifton
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INTEGRATION OF LOW AND HIGH VOLTAGE DEVICES ON SUBSTRATE
- Publication number 20230011246
- Publication date Jan 12, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Hsin Fu Lin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHODS OF FORMING DISLOCATION ENHANCED STRAIN IN NMOS AND PMOS STR...
- Publication number 20230006063
- Publication date Jan 5, 2023
- Daedalus Prime LLC
- Michael Jackson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FIELD-EFFECT TRANSISTOR, METHOD OF MANUFACTURING THE SAME, AND RADI...
- Publication number 20220384349
- Publication date Dec 1, 2022
- SONY GROUP CORPORATION
- Naoki Saka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE AND SEMICONDUCTOR PROC...
- Publication number 20220382161
- Publication date Dec 1, 2022
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Yu-Kai Chen
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
EPITAXIAL GROWTH METHODS AND STRUCTURES THEREOF
- Publication number 20220367639
- Publication date Nov 17, 2022
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Tesuji UENO
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
Semiconductor structure and manufacturing method thereof
- Publication number 20220367653
- Publication date Nov 17, 2022
- UNITED MICROELECTRONICS CORP.
- Shin-Hung LI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DIFFUSION BARRIER LAYER FOR SOURCE AND DRAIN STRUCTURES TO INCREASE...
- Publication number 20220367631
- Publication date Nov 17, 2022
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Kuei-Ming Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE
- Publication number 20220344477
- Publication date Oct 27, 2022
- FLOSFIA INC.
- Isao TAKAHASHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR STRUCTURE AND MANUFACTURING METHOD THEREOF
- Publication number 20220310400
- Publication date Sep 29, 2022
- CHANGXIN MEMORY TECHNOLOGIES, INC
- Qinghua HAN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SILICON CARBIDE SEMICONDUCTOR DEVICE, POWER CONVERTER, AND METHOD O...
- Publication number 20220254904
- Publication date Aug 11, 2022
- Mitsubishi Electric Corporation
- Yuji EBIIKE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHODS OF FORMING DISLOCATION ENHANCED STRAIN IN NMOS AND PMOS STR...
- Publication number 20220238714
- Publication date Jul 28, 2022
- Intel Corporation
- Michael JACKSON
- H01 - BASIC ELECTRIC ELEMENTS

Lateral single gate silicon transistors

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Semiconductor device and manufacturing method thereof

Methods for forming a semiconductor device structure and related se...

MOS transistor having substantially parallelepiped-shaped insulatin...

Silicon carbide semiconductor device, power converter, and method o...

Strained semiconductor using elastic edge relaxation of a stressor...

Semiconductor with through-substrate interconnect

Self-protective layer formed on high-K dielectric layer

Semiconductor device and manufacturing method thereof

Method of manufacturing semiconductor device

Manufacturing method of semiconductor device and semiconductor proc...

Diffusion barrier layer for source and drain structures to increase...

Electronic devices and systems, and methods for making and using th...

Method of making a plurality of high density logic elements with ad...

Field-effect transistor, method of manufacturing the same, and radi...

Semiconductor-on-insulator field effect transistor with performance...

Method for making semiconductor device with selective etching of su...

Semiconductor structure and manufacturing method thereof

1T1R resistive random access memory, and manufacturing method there...

Methods for forming a semiconductor device structure and related se...

Semiconductor device having contact plug

Transistor level interconnection methodologies utilizing 3D interco...

Semiconductor device and method for fabricating the same including...

Semiconductor structure and manufacturing method thereof

Method for fabricating semiconductor device with programmable element

Methods of forming dislocation enhanced strain in NMOS and PMOS str...

Semiconductor device and manufacturing method thereof

Method for forming stressor, semiconductor device having stressor,...

Metal gate modulation to improve kink effect

Diffusion barrier layer for source and drain structures to increase...

Method for preparing transistor device

Patents Applicationslast 30 patents

SEMICONDUCTOR APPARATUS AND METHOD OF MANUFACTURING SEMICONDUCTOR A...

SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE

SEMICONDUCTOR WITH THROUGH-SUBSTRATE INTERCONNECT

DEVICE HAVING HYBRID CELL REGIONS AND METHOD OF MANUFACTURING SAME

STRAINED SEMICONDUCTOR USING ELASTIC EDGE RELAXATION OF A STRESSOR...

DIFFUSION BARRIER LAYER FOR SOURCE AND DRAIN STRUCTURES TO INCREASE...

SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF

SELF-PROTECTIVE LAYER FORMED ON HIGH-K DIELECTRIC LAYER

METHOD FOR MAKING SEMICONDUCTOR DEVICE WITH SELECTIVE ETCHING OF SU...

INTEGRATION OF LOW AND HIGH VOLTAGE DEVICES ON SUBSTRATE

METHODS FOR FORMING A SEMICONDUCTOR DEVICE STRUCTURE AND RELATED SE...

SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING SAME

METHODS OF FORMING DISLOCATION ENHANCED STRAIN IN NMOS AND PMOS STR...

SEMICONDUCTOR-ON-INSULATOR FIELD EFFECT TRANSISTOR WITH PERFORMANCE...

SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF

TRANSISTOR LEVEL INTERCONNECTION METHODOLOGIES UTILIZING 3D INTERCO...

METHOD FOR MAKING SEMICONDUCTOR DEVICE WITH SELECTIVE ETCHING OF SU...

METHOD FOR FORMING A SEMICONDUCTOR STRUCTURE

STRAINED SEMICONDUCTOR USING ELASTIC EDGE RELAXATION OF A STRESSOR...

INTEGRATION OF LOW AND HIGH VOLTAGE DEVICES ON SUBSTRATE

METHODS OF FORMING DISLOCATION ENHANCED STRAIN IN NMOS AND PMOS STR...

FIELD-EFFECT TRANSISTOR, METHOD OF MANUFACTURING THE SAME, AND RADI...

MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE AND SEMICONDUCTOR PROC...

EPITAXIAL GROWTH METHODS AND STRUCTURES THEREOF

Semiconductor structure and manufacturing method thereof

DIFFUSION BARRIER LAYER FOR SOURCE AND DRAIN STRUCTURES TO INCREASE...

SEMICONDUCTOR DEVICE

SEMICONDUCTOR STRUCTURE AND MANUFACTURING METHOD THEREOF

SILICON CARBIDE SEMICONDUCTOR DEVICE, POWER CONVERTER, AND METHOD O...

METHODS OF FORMING DISLOCATION ENHANCED STRAIN IN NMOS AND PMOS STR...