Magnetic force probe

Industry

CPC
Y10S977/865

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YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS Y10USPC classification Y10STECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS Y10S977/00Nanotechnology

Current Industry

Y10S977/865Magnetic force probe

Industries

Patents Grantslast 30 patents

Information Patent Grant
Large-capacity magnetic memory using carbon nano-tube
- Patent number 7,379,326
- Issue date May 27, 2008
- UMK Technologies Co., Ltd.
- Takashi Ushida
- G11 - INFORMATION STORAGE
Information Patent Grant
Hybrid Hall vector magnetometer
- Patent number 7,064,542
- Issue date Jun 20, 2006
- The United States of America as represented by the Secretary of the Navy
- Mark B. Johnson
- G01 - MEASURING TESTING
Information Patent Grant
Hybrid hall vector magnetometer
- Patent number 6,917,198
- Issue date Jul 12, 2005
- The United States of America as represented by the Secretary of the Navy
- Mark B. Johnson
- G01 - MEASURING TESTING
Information Patent Grant
Cantilever-free magnetic resonance force microscope
- Patent number 6,836,112
- Issue date Dec 28, 2004
- Michael J. Hennessy
- G01 - MEASURING TESTING
Information Patent Grant
Scanning probe microscope for ultra sensitive electro-magnetic fiel...
- Patent number 6,817,231
- Issue date Nov 16, 2004
- Seiko Instruments Inc.
- Masatoshi Yasutake
- G01 - MEASURING TESTING
Information Patent Grant
Hybrid Hall vector magnetometer
- Patent number 6,800,913
- Issue date Oct 5, 2004
- The United States of America as represented by the Secretary of the Navy
- Mark B. Johnson
- G01 - MEASURING TESTING
Information Patent Grant
Scanning magnetism detector and probe
- Patent number 6,750,450
- Issue date Jun 15, 2004
- Hokkaido University
- Koichi Mukasa
- G01 - MEASURING TESTING
Information Patent Grant
Nano-magnetic head and nano-magnetic head device using the same
- Patent number 6,735,046
- Issue date May 11, 2004
- Daiken Chemical Co., Ltd.
- Yoshikazu Nakayama
- G11 - INFORMATION STORAGE
Information Patent Grant
Assembly comprising a plurality of media probes for writing/reading...
- Patent number 6,702,186
- Issue date Mar 9, 2004
- Hitachi Global Storage Technologies, Netherlands B.V.
- Hendrik F. Hamann
- G11 - INFORMATION STORAGE
Information Patent Grant
Magnetic resonance force microscope for the study of biological sys...
- Patent number 6,683,451
- Issue date Jan 27, 2004
- Wayne State University
- Gregory J. Moore
- G01 - MEASURING TESTING
Information Patent Grant
Technology for fabrication of a micromagnet on a tip of a MFM/MRFM...
- Patent number 6,676,813
- Issue date Jan 13, 2004
- The Regents of the University of California
- Denis V. Pelekhov
- G01 - MEASURING TESTING
Information Patent Grant
Sensor apparatus with magnetically deflected cantilever
- Patent number 6,668,627
- Issue date Dec 30, 2003
- Swiss Federal Institute of Technology Zurich
- Dirk Lange
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for measuring magnetic head
- Patent number 6,639,400
- Issue date Oct 28, 2003
- Kabushiki Kaisha Toshiba
- Masayuki Abe
- G11 - INFORMATION STORAGE
Information Patent Grant
Method and apparatus for measuring characteristic of specimen and i...
- Patent number 6,605,941
- Issue date Aug 12, 2003
- Kabushiki Kaisha Toshiba
- Masayuki Abe
- G11 - INFORMATION STORAGE
Information Patent Grant
Scanning evanescent electro-magnetic microscope
- Patent number 6,532,806
- Issue date Mar 18, 2003
- The Regents of the University of California
- Xiao-Dong Xiang
- G01 - MEASURING TESTING
Information Patent Grant
Method for alleviating symptoms of certain types of disorders using...
- Patent number 6,527,697
- Issue date Mar 4, 2003
- MS Relief Ltd.
- Grant Ernest Bashford
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Magnetic force microscope
- Patent number 6,504,365
- Issue date Jan 7, 2003
- Jeol Ltd.
- Shinichi Kitamura
- G01 - MEASURING TESTING
Information Patent Grant
Calibration of magnetic force or scanning hall probe microscopes by...
- Patent number 6,486,654
- Issue date Nov 26, 2002
- Triple-O Microscopy GmbH
- Hans Josef Hug
- G11 - INFORMATION STORAGE
Information Patent Grant
Method and device for tunnel microscopy
- Patent number 6,476,386
- Issue date Nov 5, 2002
- Max-Planck- Gesselschaft zur Forderung der Wissenschaften e.V.
- Jürgen Kirschner
- G11 - INFORMATION STORAGE
Information Patent Grant
Microscopic tips having stable magnetic moments and disposed on can...
- Patent number 6,448,765
- Issue date Sep 10, 2002
- Read-Rite Corporation
- Hong Chen
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method of imaging a magnetic field emanating from a surface using a...
- Patent number 6,448,766
- Issue date Sep 10, 2002
- International Business Machines Corporation
- Ruediger Berger
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Magnetic field characteristics evaluation apparatus and magnetic fi...
- Patent number 6,437,562
- Issue date Aug 20, 2002
- Kabushiki Kaisha Toshiba
- Masayuki Abe
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Cantilever magnetic force sensor for magnetic force microscopy and...
- Patent number 6,373,246
- Issue date Apr 16, 2002
- Seiko Instruments Inc.
- Eisuke Tomita
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Fullerene contrast agent for magnetic resonance imaging and spectro...
- Patent number 6,355,225
- Issue date Mar 12, 2002
- Wm. Marsh Rice University TDA Research, Inc.
- John M. Alford
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Method and apparatus for imaging acoustic fields in high-frequency...
- Patent number 6,305,226
- Issue date Oct 23, 2001
- Agere Systems Guardian Corp.
- Bradley Paul Barber
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for force control of a scanning probe
- Patent number 6,297,502
- Issue date Oct 2, 2001
- Angstrom Technology Partnership
- Suzanne Philippa Jarvis
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Detection and characterization of defects on surfaces of magnetic d...
- Patent number 6,292,316
- Issue date Sep 18, 2001
- International Business Machines Corporation
- Andreas Dietzel
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method of producing magnetic force image and scanning probe microscope
- Patent number 6,281,495
- Issue date Aug 28, 2001
- Jeol Ltd.
- Shinichi Kitamura
- B82 - NANO-TECHNOLOGY
Information Patent Grant
High density magnetic thermal recording and reproducing assembly
- Patent number 6,233,206
- Issue date May 15, 2001
- International Business Machines Corporation
- Hendrik F. Hamann
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Apparatus for use in magnetic-field detection and generation devices
- Patent number 6,211,673
- Issue date Apr 3, 2001
- International Business Machines Corporation
- Christoph Gerber
- B82 - NANO-TECHNOLOGY

Patents Applicationslast 30 patents

Information Patent Application
Large-capacity magnetic memory using carbon nano-tube
- Publication number 20060092542
- Publication date May 4, 2006
- UMK Technologies Co., Ltd.
- Takashi Ushida
- G11 - INFORMATION STORAGE
Information Patent Application
Hybrid hall vector magnetometer
- Publication number 20050258828
- Publication date Nov 24, 2005
- Mark B. Johnson
- G01 - MEASURING TESTING
Information Patent Application
Hybrid hall vector magnetometer
- Publication number 20040217756
- Publication date Nov 4, 2004
- Mark B. Johnson
- G01 - MEASURING TESTING
Information Patent Application
Hybrid Hall vector magnetometer
- Publication number 20040085065
- Publication date May 6, 2004
- Mark B. Johnson
- G01 - MEASURING TESTING
Information Patent Application
Cantilever-free magnetic resonance force microscope
- Publication number 20040056657
- Publication date Mar 25, 2004
- Michael J. Hennessy
- G01 - MEASURING TESTING
Information Patent Application
Scanning probe microscope for ultra sensitive electro-magnetic fiel...
- Publication number 20030172726
- Publication date Sep 18, 2003
- Masatoshi Yasutake
- G01 - MEASURING TESTING
Information Patent Application
Nano-magnetic head and nano-magnetic head device using the same
- Publication number 20030095356
- Publication date May 22, 2003
- YOSHIKAZU NAKAYAMA and DAIKEN CHEMICAL CO., LTD.
- Yoshikazu Nakayama
- G11 - INFORMATION STORAGE
Information Patent Application
Method and apparatus for measuring magnetic head
- Publication number 20030042896
- Publication date Mar 6, 2003
- Masayuki Abe
- B82 - NANO-TECHNOLOGY
Information Patent Application
Scanning magnetism detector and probe
- Publication number 20020149362
- Publication date Oct 17, 2002
- Koichi Mukasa
- B82 - NANO-TECHNOLOGY
Information Patent Application
Magnetic force microscope
- Publication number 20020097046
- Publication date Jul 25, 2002
- JEOL Ltd.
- Shinichi Kitamura
- B82 - NANO-TECHNOLOGY
Information Patent Application
Sensor apparatus and cantilever for it
- Publication number 20020092359
- Publication date Jul 18, 2002
- Dirk Lange
- B82 - NANO-TECHNOLOGY
Information Patent Application
Method and apparatus for alleviating symptoms of certain types of d...
- Publication number 20020082465
- Publication date Jun 27, 2002
- Grant Ernest Bashford
- Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information Patent Application
Method and apparatus for measuring characteristic of specimen and i...
- Publication number 20010038282
- Publication date Nov 8, 2001
- Masayuki Abe
- B82 - NANO-TECHNOLOGY
Information Patent Application
Magnetic field characteristics evaluation apparatus and magnetic fi...
- Publication number 20010030536
- Publication date Oct 18, 2001
- Masayuki Abe
- B82 - NANO-TECHNOLOGY

Magnetic force probe

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Large-capacity magnetic memory using carbon nano-tube

Hybrid Hall vector magnetometer

Hybrid hall vector magnetometer

Cantilever-free magnetic resonance force microscope

Scanning probe microscope for ultra sensitive electro-magnetic fiel...

Hybrid Hall vector magnetometer

Scanning magnetism detector and probe

Nano-magnetic head and nano-magnetic head device using the same

Assembly comprising a plurality of media probes for writing/reading...

Magnetic resonance force microscope for the study of biological sys...

Technology for fabrication of a micromagnet on a tip of a MFM/MRFM...

Sensor apparatus with magnetically deflected cantilever

Method and apparatus for measuring magnetic head

Method and apparatus for measuring characteristic of specimen and i...

Scanning evanescent electro-magnetic microscope

Method for alleviating symptoms of certain types of disorders using...

Magnetic force microscope

Calibration of magnetic force or scanning hall probe microscopes by...

Method and device for tunnel microscopy

Microscopic tips having stable magnetic moments and disposed on can...

Method of imaging a magnetic field emanating from a surface using a...

Magnetic field characteristics evaluation apparatus and magnetic fi...

Cantilever magnetic force sensor for magnetic force microscopy and...

Fullerene contrast agent for magnetic resonance imaging and spectro...

Method and apparatus for imaging acoustic fields in high-frequency...

Method and apparatus for force control of a scanning probe

Detection and characterization of defects on surfaces of magnetic d...

Method of producing magnetic force image and scanning probe microscope

High density magnetic thermal recording and reproducing assembly

Apparatus for use in magnetic-field detection and generation devices

Patents Applicationslast 30 patents

Large-capacity magnetic memory using carbon nano-tube

Hybrid hall vector magnetometer

Hybrid hall vector magnetometer

Hybrid Hall vector magnetometer

Cantilever-free magnetic resonance force microscope

Scanning probe microscope for ultra sensitive electro-magnetic fiel...

Nano-magnetic head and nano-magnetic head device using the same

Method and apparatus for measuring magnetic head

Scanning magnetism detector and probe

Magnetic force microscope

Sensor apparatus and cantilever for it

Method and apparatus for alleviating symptoms of certain types of d...

Method and apparatus for measuring characteristic of specimen and i...

Magnetic field characteristics evaluation apparatus and magnetic fi...