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CPC
H01J37/14

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Parent Industries

HELECTRICITY H01Electric elements H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge

Current Industry

H01J37/14magnetic

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Optimized saddle nozzle design for gas injection system
- Patent number 12,368,019
- Issue date Jul 22, 2025
- Applied Materials Israel Ltd.
- Yehuda Zur
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
System and method for uniform ion milling
- Patent number 12,362,130
- Issue date Jul 15, 2025
- E. A. Fischione Instruments, Inc.
- Paul E Fischione
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for inspecting a specimen and charged particle beam device
- Patent number 12,362,131
- Issue date Jul 15, 2025
- Applied Materials Israel Ltd.
- Pieter Kruit
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Particle beam column
- Patent number 12,362,129
- Issue date Jul 15, 2025
- Carl Zeiss Microscopy GmbH
- Erik Essers
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor inspection apparatus and semiconductor inspection met...
- Patent number 12,362,139
- Issue date Jul 15, 2025
- Samsung Electronics Co., Ltd.
- Yujin Cho
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Pattern inspection apparatus and pattern inspection method
- Patent number 12,354,831
- Issue date Jul 8, 2025
- NuFlare Technology, Inc.
- Masataka Shiratsuchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multiple landing energy scanning electron microscopy systems and me...
- Patent number 12,354,833
- Issue date Jul 8, 2025
- ASML Netherlands B.V.
- Wei Fang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam apparatus
- Patent number 12,354,826
- Issue date Jul 8, 2025
- HITACHI HIGH-TECH CORPORATION
- Tomonori Nakano
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scanning electron microscope
- Patent number 12,347,642
- Issue date Jul 1, 2025
- TASMIT, INC.
- Naoya Saitoh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron beam apparatus
- Patent number 12,347,640
- Issue date Jul 1, 2025
- HITACHI HIGH-TECH CORPORATION
- Yu Yamazawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multiple charged-particle beam apparatus and methods of operating t...
- Patent number 12,347,643
- Issue date Jul 1, 2025
- ASML Netherlands B.V.
- Weiming Ren
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device, and method for controlling charged pa...
- Patent number 12,340,970
- Issue date Jun 24, 2025
- HITACHI HIGH-TECH CORPORATION
- Shingo Hayashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Particle beam system including a multi-beam deflection device and a...
- Patent number 12,340,973
- Issue date Jun 24, 2025
- Carl Zeiss MultiSEM GmbH
- Stefan Schubert
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Low-voltage electron beam control of conductive state at a complex-...
- Patent number 12,322,522
- Issue date Jun 3, 2025
- University of Pittsburgh of the Commonwealth System of Higher Education
- Jeremy Levy
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Electron beam system
- Patent number 12,315,694
- Issue date May 27, 2025
- Focus-eBeam Technology (Beijing) Co., Ltd.
- Shuai Li
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multi-electron beam inspection apparatus, multipole array control m...
- Patent number 12,308,202
- Issue date May 20, 2025
- NuFlare Technology, Inc.
- Yuichi Maekawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Optical auto-focus unit and a method for auto-focus
- Patent number 12,308,204
- Issue date May 20, 2025
- Applied Materials Israel Ltd.
- Sissi Lachmi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Objective lens system for fast scanning large FOV
- Patent number 12,300,458
- Issue date May 13, 2025
- ASML Netherlands B.V.
- Shuai Li
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam system, method of operating a charged particl...
- Patent number 12,293,895
- Issue date May 6, 2025
- Carl Zeiss SMT GmbH
- Eugen Foca
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Particle beam system
- Patent number 12,293,896
- Issue date May 6, 2025
- Carl Zeiss MultiSEM GmbH
- Dirk Zeidler
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Particle beam device having a deflection unit
- Patent number 12,288,664
- Issue date Apr 29, 2025
- Carl Zeiss Microscopy GmbH
- Dirk Preikszas
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multiple electron beam image acquisition method, multiple electron...
- Patent number 12,288,666
- Issue date Apr 29, 2025
- NuFlare Technology, Inc.
- Koichi Ishii
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Sample display method
- Patent number 12,288,665
- Issue date Apr 29, 2025
- TESCAN BRNO s.r.o
- Jiri Dluhos
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Creating multiple electron beams with a photocathode film
- Patent number 12,283,453
- Issue date Apr 22, 2025
- KLA Corporation
- Xinrong Jiang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Monochromator device and methods of use thereof
- Patent number 12,283,455
- Issue date Apr 22, 2025
- Cornell University
- Duncan Cameron
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System and method for alignment of secondary beams in multi-beam in...
- Patent number 12,278,081
- Issue date Apr 15, 2025
- ASML Netherlands B.V.
- Qingpo Xi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scanning electron microscope and objective lens
- Patent number 12,261,014
- Issue date Mar 25, 2025
- Jeol Ltd.
- Motohiro Nakamura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Transmission charged particle microscope with an electron energy lo...
- Patent number 12,255,045
- Issue date Mar 18, 2025
- FEI Company
- Peter Christiaan Tiemeijer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multi-beam particle beam system and method for operating same
- Patent number 12,255,040
- Issue date Mar 18, 2025
- Carl Zeiss MultiSEM GmbH
- Dirk Zeidler
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Microscopy feedback for improved milling accuracy
- Patent number 12,249,482
- Issue date Mar 11, 2025
- FEI Company
- Thomas Gary Miller
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
APPARATUS OF PLURAL CHARGED-PARTICLE BEAMS
- Publication number 20250232945
- Publication date Jul 17, 2025
- ASML NETHERLANDS B.V.
- Weiming REN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MULTIPOLE LENS AND CHARGED PARTICLE BEAM DEVICE
- Publication number 20250232944
- Publication date Jul 17, 2025
- HITACHI HIGH-TECH CORPORATION
- Shun KIZAWA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Beam System
- Publication number 20250232947
- Publication date Jul 17, 2025
- Hitachi High-Tech Corporation
- Naoto ITO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PARTICLE BEAM SYSTEM
- Publication number 20250232951
- Publication date Jul 17, 2025
- Carl Zeiss MultiSEM GmbH
- Dirk Zeidler
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
A MULTI-MODE LOW-VOLTAGE ELECTRON MICROSCOPE
- Publication number 20250226173
- Publication date Jul 10, 2025
- DELONG INSTRUMENTS A.S.
- Tomas Bejdak
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MULTI-BEAM PARTICLE MICROSCOPE WITH IMPROVED BEAM TUBE
- Publication number 20250218719
- Publication date Jul 3, 2025
- Carl Zeiss MultiSEM GmbH
- Michael Kelp
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PARTICLE-OPTICAL ARRANGEMENT, IN PARTICULAR MULTI-BEAM PARTICLE MIC...
- Publication number 20250210300
- Publication date Jun 26, 2025
- Carl Zeiss MultiSEM GmbH
- Dirk ZEIDLER
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PARTICLE BEAM TREATMENT APPARATUS, DEFLECTION MAGNET APPARATUS, AND...
- Publication number 20250210299
- Publication date Jun 26, 2025
- Sumitomo Heavy Industries, Ltd.
- Yuta EBARA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TECHNIQUES FOR GUIDE STAR ALIGNMENT OF AN ION IMPLANTER
- Publication number 20250201513
- Publication date Jun 19, 2025
- Applied Materials, Inc.
- Richard Allen SPRENKLE
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Radiation Heating to Clean Deposits from Air Bearing Shaft
- Publication number 20250201514
- Publication date Jun 19, 2025
- Applied Materials, Inc.
- Roger B. Fish
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Natural Frequency Adjuster For Extraction Electrodes
- Publication number 20250201508
- Publication date Jun 19, 2025
- Applied Materials, Inc.
- Adam M. McLaughlin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
OPTICAL SYSTEM FOR A PLURALITY OF PRIMARY BEAMLETS, CHARGED PARTICL...
- Publication number 20250191874
- Publication date Jun 12, 2025
- ICT Integrated Circuit Testing Gesellschaft fur Halbleiterpruftechnik mbH
- Pieter Kruit
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SIGNAL ELECTRON BEAM DEFLECTOR FOR AN ELECTRON BEAM APPARATUS, ELEC...
- Publication number 20250182998
- Publication date Jun 5, 2025
- ICT Integrated Circuit Testing Gesellschaft fur Halbleiterpruftechnik mbH
- Pieter Kruit
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CALIBRATION OF AN EXAMINATION SYSTEM
- Publication number 20250183001
- Publication date Jun 5, 2025
- APPLIED MATERIALS ISRAEL LTD.
- Rafael BISTRITZER
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TRANSMISSION ELECTRON MICROSCOPE WITH VARIABLE EFFECTIVE FOCAL LENGTH
- Publication number 20250182997
- Publication date Jun 5, 2025
- FEI Company
- Bart Buijsse
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
OBJECTIVE LENS COVER AND CHARGED PARTICLE BEAM APPARATUS INCLUDING...
- Publication number 20250174426
- Publication date May 29, 2025
- Korea Research Institute of Standards and Science
- Takashi OGAWA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTROMAGNETIC LENS, SCANNING ELECTRON MICROSCOPE, AND MULTI-ELECT...
- Publication number 20250174425
- Publication date May 29, 2025
- NuFlare Technology, Inc.
- Takahiro MURATA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND DEVICE FOR CORRECTING IMAGE ERRORS WHEN SCANNING A CHARG...
- Publication number 20250174429
- Publication date May 29, 2025
- Carl Zeiss SMT GMBH
- Michael Budach
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DEFLECTOR FOR A CHARGED PARTICLE BEAM APPARATUS, DEFLECTING SYSTEM,...
- Publication number 20250166958
- Publication date May 22, 2025
- ICT Integrated Circuit Testing Gesellschaft fur Halbleiterpruftechnik mbH
- Pavel Adamec
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
HIGH BANDWIDTH VARIABLE DOSE ION IMPLANTATION SYSTEM AND METHOD
- Publication number 20250166959
- Publication date May 22, 2025
- Axcelis Technologies, Inc.
- Andy Ray
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and System for Imaging a Sample
- Publication number 20250166963
- Publication date May 22, 2025
- Milos Malínský
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION ANGLE SENSOR
- Publication number 20250157784
- Publication date May 15, 2025
- Applied Materials, Inc.
- Chuang-Chia Lin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR OPERATING A PARTICLE BEAM APPARATUS, COMPUTER PROGRAM PR...
- Publication number 20250157781
- Publication date May 15, 2025
- CARL ZEISS MICROSCOPY GMBH
- Bjoern Gamm
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPARATUS USING MULTIPLE BEAMS OF CHARGED PARTICLES
- Publication number 20250157783
- Publication date May 15, 2025
- ASML NETHERLANDS B.V.
- Xuerang HU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MINIMIZATION OF ENERGY SPREAD IN FOCUSED ION BEAM (FIB) SYSTEMS
- Publication number 20250157779
- Publication date May 15, 2025
- FEI Company
- Radovan Vašina
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR OPERATING A PARTICLE BEAM APPARATUS, COMPUTER PROGRAM PR...
- Publication number 20250157782
- Publication date May 15, 2025
- CARL ZEISS MICROSCOPY GMBH
- Bjoern Gamm
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MULTIPLE-BEAM IMAGE ACQUISITION APPARATUS AND MULTIPLE-BEAM IMAGE A...
- Publication number 20250149290
- Publication date May 8, 2025
- NuFlare Technology, Inc.
- Koichi ISHII
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF CHARACTERIZING A DETECTION PATH OF A CHARGED PARTICLE BEA...
- Publication number 20250140511
- Publication date May 1, 2025
- ICT Integrated Circuit Testing Gesellschaft fur Halbleiterpruftechnik mbH
- John Breuer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
LOCALIZED STRESS MODULATION BY IMPLANT TO BACK OF WAFER
- Publication number 20250140569
- Publication date May 1, 2025
- Applied Materials, Inc.
- Sony Varghese
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MULTI-ELECTRON BEAM IMAGE ACQUISITION APPARATUS, MULTI-ELECTRON BEA...
- Publication number 20250132119
- Publication date Apr 24, 2025
- NuFlare Technology, Inc.
- Kazuhiko INOUE
- H01 - BASIC ELECTRIC ELEMENTS

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Optimized saddle nozzle design for gas injection system

System and method for uniform ion milling

Method for inspecting a specimen and charged particle beam device

Particle beam column

Semiconductor inspection apparatus and semiconductor inspection met...

Pattern inspection apparatus and pattern inspection method

Multiple landing energy scanning electron microscopy systems and me...

Charged particle beam apparatus

Scanning electron microscope

Electron beam apparatus

Multiple charged-particle beam apparatus and methods of operating t...

Charged particle beam device, and method for controlling charged pa...

Particle beam system including a multi-beam deflection device and a...

Low-voltage electron beam control of conductive state at a complex-...

Electron beam system

Multi-electron beam inspection apparatus, multipole array control m...

Optical auto-focus unit and a method for auto-focus

Objective lens system for fast scanning large FOV

Charged particle beam system, method of operating a charged particl...

Particle beam system

Particle beam device having a deflection unit

Multiple electron beam image acquisition method, multiple electron...

Sample display method

Creating multiple electron beams with a photocathode film

Monochromator device and methods of use thereof

System and method for alignment of secondary beams in multi-beam in...

Scanning electron microscope and objective lens

Transmission charged particle microscope with an electron energy lo...

Multi-beam particle beam system and method for operating same

Microscopy feedback for improved milling accuracy

Patents Applicationslast 30 patents

APPARATUS OF PLURAL CHARGED-PARTICLE BEAMS

MULTIPOLE LENS AND CHARGED PARTICLE BEAM DEVICE

Charged Particle Beam System

PARTICLE BEAM SYSTEM

A MULTI-MODE LOW-VOLTAGE ELECTRON MICROSCOPE

MULTI-BEAM PARTICLE MICROSCOPE WITH IMPROVED BEAM TUBE

PARTICLE-OPTICAL ARRANGEMENT, IN PARTICULAR MULTI-BEAM PARTICLE MIC...

PARTICLE BEAM TREATMENT APPARATUS, DEFLECTION MAGNET APPARATUS, AND...

TECHNIQUES FOR GUIDE STAR ALIGNMENT OF AN ION IMPLANTER

Radiation Heating to Clean Deposits from Air Bearing Shaft

Natural Frequency Adjuster For Extraction Electrodes

OPTICAL SYSTEM FOR A PLURALITY OF PRIMARY BEAMLETS, CHARGED PARTICL...

SIGNAL ELECTRON BEAM DEFLECTOR FOR AN ELECTRON BEAM APPARATUS, ELEC...

CALIBRATION OF AN EXAMINATION SYSTEM

TRANSMISSION ELECTRON MICROSCOPE WITH VARIABLE EFFECTIVE FOCAL LENGTH

OBJECTIVE LENS COVER AND CHARGED PARTICLE BEAM APPARATUS INCLUDING...

ELECTROMAGNETIC LENS, SCANNING ELECTRON MICROSCOPE, AND MULTI-ELECT...

METHOD AND DEVICE FOR CORRECTING IMAGE ERRORS WHEN SCANNING A CHARG...

DEFLECTOR FOR A CHARGED PARTICLE BEAM APPARATUS, DEFLECTING SYSTEM,...

HIGH BANDWIDTH VARIABLE DOSE ION IMPLANTATION SYSTEM AND METHOD

Method and System for Imaging a Sample

ION ANGLE SENSOR

METHOD FOR OPERATING A PARTICLE BEAM APPARATUS, COMPUTER PROGRAM PR...

APPARATUS USING MULTIPLE BEAMS OF CHARGED PARTICLES

MINIMIZATION OF ENERGY SPREAD IN FOCUSED ION BEAM (FIB) SYSTEMS

METHOD FOR OPERATING A PARTICLE BEAM APPARATUS, COMPUTER PROGRAM PR...

MULTIPLE-BEAM IMAGE ACQUISITION APPARATUS AND MULTIPLE-BEAM IMAGE A...

METHOD OF CHARACTERIZING A DETECTION PATH OF A CHARGED PARTICLE BEA...

LOCALIZED STRESS MODULATION BY IMPLANT TO BACK OF WAFER

MULTI-ELECTRON BEAM IMAGE ACQUISITION APPARATUS, MULTI-ELECTRON BEA...