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PHYSICS
G01
Measuring instruments
G01R
MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES
G01R33/00
Arrangements or instruments for measuring magnetic variables
Current Industry
G01R33/09
Magnetoresistive devices
Industries
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Patents Grants
last 30 patents
Information
Patent Grant
Magnetic sensor unit
Patent number
11,982,525
Issue date
May 14, 2024
PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD.
G01 - MEASURING TESTING
Information
Patent Grant
Magnetic sensor
Patent number
11,977,136
Issue date
May 7, 2024
TDK Corporation
Hirokazu Takahashi
G01 - MEASURING TESTING
Information
Patent Grant
Sensor having protruding surface
Patent number
11,971,461
Issue date
Apr 30, 2024
TDK Corporation
Hiromichi Umehara
G01 - MEASURING TESTING
Information
Patent Grant
Magnetic field sensor with increased SNR
Patent number
11,971,462
Issue date
Apr 30, 2024
EVERSPIN TECHNOLOGIES, INC.
Phillip G. Mather
G01 - MEASURING TESTING
Information
Patent Grant
Temperature compensated MTJ-based sensing circuit for measuring an...
Patent number
11,971,463
Issue date
Apr 30, 2024
ALLEGRO MICROSYSTEMS, LLC
Anuraag Mohan
G01 - MEASURING TESTING
Information
Patent Grant
Magnetoresistance effect element containing Heusler alloy with addi...
Patent number
11,967,348
Issue date
Apr 23, 2024
TDK Corporation
Katsuyuki Nakada
G11 - INFORMATION STORAGE
Information
Patent Grant
Magnetic sensor
Patent number
11,965,941
Issue date
Apr 23, 2024
TDK Corporation
Yuta Saito
G01 - MEASURING TESTING
Information
Patent Grant
Current sensor
Patent number
11,959,944
Issue date
Apr 16, 2024
Denso Corporation
Takuma Esaka
G01 - MEASURING TESTING
Information
Patent Grant
Magnetic field detection apparatus and current detection apparatus
Patent number
11,959,943
Issue date
Apr 16, 2024
TDK Corporation
Norikazu Ota
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Image blur correction device, imaging device, and lens device
Patent number
11,962,904
Issue date
Apr 16, 2024
FUJIFILM Corporation
Kouhei Awazu
G01 - MEASURING TESTING
Information
Patent Grant
Sensor unit
Patent number
11,959,979
Issue date
Apr 16, 2024
TDK Corporation
Kunihiro Ueda
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Electrical offset compensating in a bridge using more than four mag...
Patent number
11,953,565
Issue date
Apr 9, 2024
ALLEGRO MICROSYSTEMS, LLC
Hernán D. Romero
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Magnetic multi-turn sensor and method of manufacture
Patent number
11,953,567
Issue date
Apr 9, 2024
Analog Devices International Unlimited Company
Peter Meehan
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Wide-range perpendicular sensitive magnetic sensor and method for m...
Patent number
11,953,568
Issue date
Apr 9, 2024
DIGITAL GRID RES. INST., CHINA SOUTHERN PWR. GRID
Peng Li
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus and methods for virtually linear and temperature-independ...
Patent number
11,953,566
Issue date
Apr 9, 2024
The United States of America, as represented by the Secretary of the Navy
Paymon Shirazi
G01 - MEASURING TESTING
Information
Patent Grant
Magnetic sensor device and magnetic sensor system
Patent number
11,946,989
Issue date
Apr 2, 2024
TDK Corporation
Norikazu Ota
G01 - MEASURING TESTING
Information
Patent Grant
Vehicle battery current sensing system
Patent number
11,946,988
Issue date
Apr 2, 2024
Purdue Research Foundation
Kaushik Roy
G01 - MEASURING TESTING
Information
Patent Grant
Magnetic sensor
Patent number
11,940,506
Issue date
Mar 26, 2024
TDK Corporation
Kenzo Makino
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Magnetic sensor with an elongated element
Patent number
11,940,300
Issue date
Mar 26, 2024
TDK Corporation
Keisuke Uchida
G01 - MEASURING TESTING
Information
Patent Grant
Magnetic memory device and magnetic memory apparatus
Patent number
11,942,127
Issue date
Mar 26, 2024
Samsung Electronics Co., Ltd.
Yoshiaki Sonobe
G11 - INFORMATION STORAGE
Information
Patent Grant
Non-contact electrical parameter measurement device with radial dua...
Patent number
11,933,821
Issue date
Mar 19, 2024
Fluke Corporation
Ronald Steuer
G01 - MEASURING TESTING
Information
Patent Grant
Magnetic sensor
Patent number
11,927,648
Issue date
Mar 12, 2024
TDK Corporation
Kei Tanabe
G01 - MEASURING TESTING
Information
Patent Grant
Current measurement device, current measurement method, and non-tra...
Patent number
11,927,647
Issue date
Mar 12, 2024
Yokogawa Electric Corporation
Kazuma Takenaka
G01 - MEASURING TESTING
Information
Patent Grant
Magnetic-field closed-loop sensors with diagnostics
Patent number
11,927,650
Issue date
Mar 12, 2024
ALLEGRO MICROSYSTEMS, LLC
Hernan D. Romero
G01 - MEASURING TESTING
Information
Patent Grant
Semiconductor structure integrated with magnetic tunneling junction
Patent number
11,930,645
Issue date
Mar 12, 2024
Taiwan Semiconductor Manufacturing Company Ltd.
Alexander Kalnitsky
G11 - INFORMATION STORAGE
Information
Patent Grant
Magnetic field measuring apparatus
Patent number
11,927,646
Issue date
Mar 12, 2024
Asahi Kasei Microdevices Corporation
Shigeki Okatake
G01 - MEASURING TESTING
Information
Patent Grant
Magnetoresistance effect element
Patent number
11,927,649
Issue date
Mar 12, 2024
TDK Corporation
Shogo Yonemura
G01 - MEASURING TESTING
Information
Patent Grant
Sensor front-end and method for operating a sensor device
Patent number
11,920,958
Issue date
Mar 5, 2024
ams AG
Matteo Colombo
H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information
Patent Grant
Magnetic sensor, detection device and detection system
Patent number
11,921,111
Issue date
Mar 5, 2024
TDK Corporation
Keisuke Takasugi
G01 - MEASURING TESTING
Information
Patent Grant
Magnetoresistive sensor element with synthetic antiferromagnet biasing
Patent number
11,921,172
Issue date
Mar 5, 2024
NVE Corporation
Joe Davies
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
MAGNETORESISTIVE MAGNETIC FIELD SENSOR HAVING A FREELY SELECTABLE M...
Publication number
20240151786
Publication date
May 9, 2024
INFINEON TECHNOLOGIES AG
Armin SATZ
G01 - MEASURING TESTING
Information
Patent Application
MAGNETIC SENSOR
Publication number
20240151785
Publication date
May 9, 2024
TDK Corporation
Taiju AKUSHICHI
G01 - MEASURING TESTING
Information
Patent Application
MAGNETIC SENSOR AND MAGNETIC SENSOR SYSTEM
Publication number
20240142548
Publication date
May 2, 2024
TDK Corporation
Keisuke UCHIDA
G01 - MEASURING TESTING
Information
Patent Application
MAGNETIC SENSOR AND METHOD OF MANUFACTURING MAGNETIC SENSOR
Publication number
20240142550
Publication date
May 2, 2024
Panasonic Holdings Corporation
Naoki KOHARA
G01 - MEASURING TESTING
Information
Patent Application
COMPACT CURRENT SENSING FOR PROTECTION AND WIRING DEVICES
Publication number
20240142500
Publication date
May 2, 2024
SCHNEIDER ELECTRIC USA, INC.
Andi Jakupi
G01 - MEASURING TESTING
Information
Patent Application
MAGNETIC SENSOR ELEMENT, MAGNETIC SENSOR, AND MAGNETIC SENSOR DEVICE
Publication number
20240142549
Publication date
May 2, 2024
Mitsubishi Electric Corporation
Kaito TAKESHIMA
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR IMMUNOSENSING ON A LIPID LAYER USING MAGNETIC TUNNEL JUN...
Publication number
20240142441
Publication date
May 2, 2024
Roche Diagnostics Operations, Inc.
Regina Baranowski
G01 - MEASURING TESTING
Information
Patent Application
METHOD OF MANUFACTURING MAGNETORESISTANCE ELEMENT USING LASER PINNI...
Publication number
20240133977
Publication date
Apr 25, 2024
ALLEGRO MICROSYSTEMS, LLC
Samridh Jaiswal
G01 - MEASURING TESTING
Information
Patent Application
SPIN VALVE DEVICE AND METHOD FOR FORMING A SPIN VALVE DEVICE
Publication number
20240133982
Publication date
Apr 25, 2024
INFINEON TECHNOLOGIES AG
Dieter SUESS
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
MAGNETIC SENSOR
Publication number
20240125873
Publication date
Apr 18, 2024
TDK Corporation
Hidekazu KOJIMA
G01 - MEASURING TESTING
Information
Patent Application
MAGNETIZATION ROTATIONAL ELEMENT AND MAGNETORESISTIVE EFFECT ELEMENT
Publication number
20240130247
Publication date
Apr 18, 2024
TDK Corporation
Tomoyuki SASAKI
G01 - MEASURING TESTING
Information
Patent Application
MAGNETORESISTIVE SENSOR
Publication number
20240125872
Publication date
Apr 18, 2024
Analog Devices International Unlimited Company
Fernando Franco
G01 - MEASURING TESTING
Information
Patent Application
LASER WRITING APPARATUS AND METHOD FOR PROGRAMMING MAGNETORESISTIVE...
Publication number
20240118317
Publication date
Apr 11, 2024
Multidimension Technology Co., Ltd
James Geza Deak
G11 - INFORMATION STORAGE
Information
Patent Application
LINEAR TUNNEL MAGNETORESISTIVE SENSOR INCLUDING AN INTEGRATED BACK-...
Publication number
20240118111
Publication date
Apr 11, 2024
INFINEON TECHNOLOGIES AG
Simon HAINZ
G01 - MEASURING TESTING
Information
Patent Application
COMPENSATING A HARMONIC
Publication number
20240118354
Publication date
Apr 11, 2024
TDK - Micronas GmbH
Jörg Franke
G01 - MEASURING TESTING
Information
Patent Application
WIDE-RANGE PERPENDICULAR SENSITIVE MAGNETIC SENSOR AND METHOD FOR M...
Publication number
20240118355
Publication date
Apr 11, 2024
DIGITAL GRID RES. INST., CHINA SOUTHERN PWR. GRID
Peng LI
G01 - MEASURING TESTING
Information
Patent Application
MAGNETIC FIELD DETECTION APPARATUS AND CURRENT DETECTION APPARATUS
Publication number
20240110951
Publication date
Apr 4, 2024
TDK Corporation
Takafumi KOBAYASHI
G01 - MEASURING TESTING
Information
Patent Application
MAGNETIC CURRENT SENSOR CALIBRATION
Publication number
20240110999
Publication date
Apr 4, 2024
TEXAS INSTRUMENTS INCORPORATED
Lei Ding
G01 - MEASURING TESTING
Information
Patent Application
TUNNEL MAGNETORESISTIVE MULTI-TURN SENSOR
Publication number
20240111005
Publication date
Apr 4, 2024
Analog Devices International Unlimited Company
Onur Necdet Urs
G01 - MEASURING TESTING
Information
Patent Application
METHODS FOR TUNNEL MAGNETORESISTANCE MULTI-TURN SENSOR MANUFACTURE...
Publication number
20240111006
Publication date
Apr 4, 2024
Analog Devices International Unlimited Company
Onur Necdet Urs
G01 - MEASURING TESTING
Information
Patent Application
Magnetoresistive Devices Comprising A Synthetic Antiferromagnetic C...
Publication number
20240107893
Publication date
Mar 28, 2024
Western Digital Technologies, Inc.
Susumu OKAMURA
G11 - INFORMATION STORAGE
Information
Patent Application
MAGNETIC SENSOR AND METHOD OF MANUFACTURING SUCH, AND MAGNETIC DETE...
Publication number
20240103101
Publication date
Mar 28, 2024
TDK Corporation
Keisuke TAKASUGI
G01 - MEASURING TESTING
Information
Patent Application
OFFSET CORRECTION IN A VOLTAGE CONTROLLED MAGNETORESISTIVE SENSOR
Publication number
20240103102
Publication date
Mar 28, 2024
INFINEON TECHNOLOGIES AG
Bernhard ENDRES
G01 - MEASURING TESTING
Information
Patent Application
MAGNETIC FIELD SENSING DEVICE
Publication number
20240103099
Publication date
Mar 28, 2024
Isentek Inc.
KAORU TAKASUKA
G01 - MEASURING TESTING
Information
Patent Application
YOKE STRUCTURES FOR IMPROVED MAGNETOMETER PERFORMANCE
Publication number
20240103100
Publication date
Mar 28, 2024
Apple Inc.
Jason Janesky
G01 - MEASURING TESTING
Information
Patent Application
BARRIER LAYERS FOR ANISOTROPIC MAGNETO-RESISTIVE SENSORS
Publication number
20240102830
Publication date
Mar 28, 2024
TEXAS INSTRUMENTS INCORPORATED
Fuchao Wang
G01 - MEASURING TESTING
Information
Patent Application
MAGNETORESISTANCE SENSOR WITH BIASED FREE LAYER FOR IMPROVED STABIL...
Publication number
20240107892
Publication date
Mar 28, 2024
Apple Inc.
Jason Janesky
G11 - INFORMATION STORAGE
Information
Patent Application
MAGNETIC SENSOR
Publication number
20240094315
Publication date
Mar 21, 2024
TDK Corporation
Hirokazu TAKAHASHI
G01 - MEASURING TESTING
Information
Patent Application
MAGNETIC SENSOR
Publication number
20240094312
Publication date
Mar 21, 2024
TDK Corporation
Hidekazu KOJIMA
G01 - MEASURING TESTING
Information
Patent Application
SENSOR
Publication number
20240094313
Publication date
Mar 21, 2024
TDK Corporation
Hiromichi UMEHARA
G01 - MEASURING TESTING