Marginal testing

Industry

CPC
G01R31/3161

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Parent Industries

GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R31/00Arrangements for testing electric properties Arrangements for locating electric faults Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

Current Industry

G01R31/3161Marginal testing

Industries

Patents Grantslast 30 patents

Information Patent Grant
Apparatuses and methods involving error detection and correction of...
- Patent number 10,591,536
- Issue date Mar 17, 2020
- NXP B.V.
- Jan-Peter Schat
- G01 - MEASURING TESTING
Information Patent Grant
Analog circuit fault diagnosis method using single testable node
- Patent number 10,539,613
- Issue date Jan 21, 2020
- HEFEI UNIVERSITY OF TECHNOLOGY
- Yigang He
- G01 - MEASURING TESTING
Information Patent Grant
Test machine and the test method for light emitting diode backlight...
- Patent number 9,151,805
- Issue date Oct 6, 2015
- Wistron Corp.
- Tia-Jing Liu
- G01 - MEASURING TESTING
Information Patent Grant
Methodology for assessing degradation due to radio frequency excita...
- Patent number 7,974,595
- Issue date Jul 5, 2011
- Texas Instruments Incorporated
- Vijay Kumar Reddy
- G01 - MEASURING TESTING
Information Patent Grant
Probeless DC testing of CMOS I/O circuits
- Patent number 7,932,735
- Issue date Apr 26, 2011
- Dialog Semiconductor GmbH
- Hans Martin Von Staudt
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device with a plurality of ground planes
- Patent number 7,808,092
- Issue date Oct 5, 2010
- Rambus Inc.
- Fan Ho
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Probeless DC testing of CMOS I/O circuits
- Patent number 7,609,079
- Issue date Oct 27, 2009
- Dialog Semiconductor GmbH
- Hans Martin Von Staudt
- G01 - MEASURING TESTING
Information Patent Grant
Testing radio frequency and analogue circuits
- Patent number 7,539,589
- Issue date May 26, 2009
- NXP B.V.
- Jose De Jesus Pineda De Gyvez
- G01 - MEASURING TESTING
Information Patent Grant
Method and device for testing a phase locked loop
- Patent number 7,477,110
- Issue date Jan 13, 2009
- NXP B.V.
- Jose De Jesus Pineda De Gyvez
- G01 - MEASURING TESTING
Information Patent Grant
Sub-circuit voltage manipulation
- Patent number 7,321,482
- Issue date Jan 22, 2008
- Hewlett-Packard Development Company, L.P.
- Don Douglas Josephson
- G01 - MEASURING TESTING
Information Patent Grant
Inspection method and inspection equipment
- Patent number 7,301,357
- Issue date Nov 27, 2007
- Tokyo Electron Limited
- Dai Shinozaki
- G01 - MEASURING TESTING
Information Patent Grant
Device speed alteration by electron-hole pair injection and device...
- Patent number 6,882,170
- Issue date Apr 19, 2005
- Intel Corporation
- Travis Eiles
- G01 - MEASURING TESTING
Information Patent Grant
Sag generator with plurality of switch technologies
- Patent number 6,759,765
- Issue date Jul 6, 2004
- Power Standards Lab.
- Alexander McEachern
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Testing method and apparatus assuring semiconductor device quality...
- Patent number 6,574,760
- Issue date Jun 3, 2003
- Texas Instruments Incorporated
- Marc Mydill
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor chip ground noise immunity testing system and tester
- Patent number 6,429,676
- Issue date Aug 6, 2002
- Samsung Electronics Co., Ltd.
- Chan-Woong Chun
- G01 - MEASURING TESTING
Information Patent Grant
Methods for predicting reliability of semiconductor devices using v...
- Patent number 6,414,508
- Issue date Jul 2, 2002
- Adaptec, Inc.
- Arnie London
- G01 - MEASURING TESTING
Information Patent Grant
Power sensor module for microwave test systems
- Patent number 6,397,160
- Issue date May 28, 2002
- Teradyne, Inc.
- Thomas Michael Craig
- G01 - MEASURING TESTING
Information Patent Grant
Method for determining proximity effects on electrical characterist...
- Patent number 6,188,233
- Issue date Feb 13, 2001
- Advanced Micro Devices, Inc.
- Mark W. Michael
- G01 - MEASURING TESTING
Information Patent Grant
Method for testing integrated circuit devices
- Patent number 5,761,214
- Issue date Jun 2, 1998
- International Business Machines Corporation
- Christopher Joseph Ford
- G01 - MEASURING TESTING
Information Patent Grant
Test socket and method for producing known good dies using the test...
- Patent number 5,644,247
- Issue date Jul 1, 1997
- Samsung Electronics Co., Ltd.
- In Ho Hyun
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor memory having a voltage stress applying circuit
- Patent number 5,357,193
- Issue date Oct 18, 1994
- Kabushiki Kaisha Toshiba
- Hiroaki Tanaka
- G11 - INFORMATION STORAGE
Information Patent Grant
Pad arrangement for a semiconductor device
- Patent number 5,347,145
- Issue date Sep 13, 1994
- Kabushiki Kaisha Toshiba
- Hiroaki Tanaka
- G01 - MEASURING TESTING
Information Patent Grant
Low temperature IC handling apparatus
- Patent number 5,247,247
- Issue date Sep 21, 1993
- NEC Corporation
- Seiichi Kase
- G01 - MEASURING TESTING
Information Patent Grant
Method and circuit for testing integrated circuit modules
- Patent number 4,947,105
- Issue date Aug 7, 1990
- Siemens Aktiengesellschaft
- Bernhard Unger
- G01 - MEASURING TESTING
Information Patent Grant
High voltage impulse wave generator for testing equipment
- Patent number 4,868,505
- Issue date Sep 19, 1989
- George J. Stahl
- G01 - MEASURING TESTING
Information Patent Grant
Method of in-circuit testing
- Patent number 4,862,069
- Issue date Aug 29, 1989
- GenRad, Inc.
- Alan J. Albee
- G01 - MEASURING TESTING
Information Patent Grant
Method of and apparatus for testing semiconductor device for electr...
- Patent number 4,823,088
- Issue date Apr 18, 1989
- Oki Electric Industry Co., Ltd.
- Yasuhiro Fukuda
- G01 - MEASURING TESTING
Information Patent Grant
Device for translating a test sequence to a burn-in sequence for a...
- Patent number 4,689,791
- Issue date Aug 25, 1987
- Thomson-CSF
- Eric Ciuciu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for examining electrostatic discharge damage t...
- Patent number 4,636,724
- Issue date Jan 13, 1987
- Oki Electric Industry Co., Ltd.
- Yasuhiro Fukuda
- G01 - MEASURING TESTING
Information Patent Grant
Method and device for determining the threshold of resistance of an...
- Patent number 4,463,309
- Issue date Jul 31, 1984
- Societe Nationale Industrielle et Aerospatiale
- Michel H. Crochet
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
TEST MACHINE AND THE TEST METHOD FOR LIGHT EMITTING DIODE BACKLIGHT...
- Publication number 20140009161
- Publication date Jan 9, 2014
- WISTRON CORP.
- Tia-Jing Liu
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor device with test structure and semiconductor device t...
- Publication number 20100315114
- Publication date Dec 16, 2010
- NXP B.V.
- Marcel Pelgrom
- G01 - MEASURING TESTING
Information Patent Application
Probeless DC testing of CMOS I/O circuits
- Publication number 20100045329
- Publication date Feb 25, 2010
- Dialog Semiconductor GmbH
- Hans Martin Von Staudt
- G01 - MEASURING TESTING
Information Patent Application
METHODOLOGY FOR ASSESSING DEGRADATION DUE TO RADIO FREQUENCY EXCITA...
- Publication number 20090167429
- Publication date Jul 2, 2009
- TEXAS INSTRUMENTS INCORPORATED
- Vijay Kumar Reddy
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor Device With a Plurality of Ground Planes
- Publication number 20090108393
- Publication date Apr 30, 2009
- Fan Ho
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and Method for Detecting Output Power From an Amplifier
- Publication number 20090021300
- Publication date Jan 22, 2009
- Antonio Romano
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
CIRCUITRY FOR RELIABILITY TESTING AS A FUNCTION OF SLEW
- Publication number 20080089126
- Publication date Apr 17, 2008
- TEXAS INSTRUMENTS INCORPORATED
- Andrew Marshall
- G01 - MEASURING TESTING
Information Patent Application
Probeless DC testing of CMOS I/O circuits
- Publication number 20070208526
- Publication date Sep 6, 2007
- Dialog Semiconductor GmbH
- Hans Martin Vos Staudt
- G01 - MEASURING TESTING
Information Patent Application
Testing radio frequency and analogue circuits
- Publication number 20070143643
- Publication date Jun 21, 2007
- Koninklijke Philips Electronics N.V.
- Jose De Jesus Pineda De Gyvez
- G01 - MEASURING TESTING
Information Patent Application
Method and device for testing a phase locked loop
- Publication number 20070132525
- Publication date Jun 14, 2007
- KONINKLIJKE PHILIPS ELECTRONICS N.C.
- Jose De Jesus Pineda de Gyvez
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Inspection method and inspection equipment
- Publication number 20060061374
- Publication date Mar 23, 2006
- Dai Shinozaki
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor device with a plurality of ground planes
- Publication number 20050224942
- Publication date Oct 13, 2005
- Fan Ho
- G01 - MEASURING TESTING
Information Patent Application
Sub-circuit voltage manipulation
- Publication number 20050207076
- Publication date Sep 22, 2005
- Don Douglas Josephson
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Device speed alteration by electron-hole pair injection and device...
- Publication number 20040108868
- Publication date Jun 10, 2004
- Travis Eiles
- G01 - MEASURING TESTING
Information Patent Application
Sag generator with plurality of switch technologies
- Publication number 20030230937
- Publication date Dec 18, 2003
- Alexander McEachern
- G01 - MEASURING TESTING

Marginal testing

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Apparatuses and methods involving error detection and correction of...

Analog circuit fault diagnosis method using single testable node

Test machine and the test method for light emitting diode backlight...

Methodology for assessing degradation due to radio frequency excita...

Probeless DC testing of CMOS I/O circuits

Semiconductor device with a plurality of ground planes

Probeless DC testing of CMOS I/O circuits

Testing radio frequency and analogue circuits

Method and device for testing a phase locked loop

Sub-circuit voltage manipulation

Inspection method and inspection equipment

Device speed alteration by electron-hole pair injection and device...

Sag generator with plurality of switch technologies

Testing method and apparatus assuring semiconductor device quality...

Semiconductor chip ground noise immunity testing system and tester

Methods for predicting reliability of semiconductor devices using v...

Power sensor module for microwave test systems

Method for determining proximity effects on electrical characterist...

Method for testing integrated circuit devices

Test socket and method for producing known good dies using the test...

Semiconductor memory having a voltage stress applying circuit

Pad arrangement for a semiconductor device

Low temperature IC handling apparatus

Method and circuit for testing integrated circuit modules

High voltage impulse wave generator for testing equipment

Method of in-circuit testing

Method of and apparatus for testing semiconductor device for electr...

Device for translating a test sequence to a burn-in sequence for a...

Method and apparatus for examining electrostatic discharge damage t...

Method and device for determining the threshold of resistance of an...

Patents Applicationslast 30 patents

TEST MACHINE AND THE TEST METHOD FOR LIGHT EMITTING DIODE BACKLIGHT...

Semiconductor device with test structure and semiconductor device t...

Probeless DC testing of CMOS I/O circuits

METHODOLOGY FOR ASSESSING DEGRADATION DUE TO RADIO FREQUENCY EXCITA...

Semiconductor Device With a Plurality of Ground Planes

Apparatus and Method for Detecting Output Power From an Amplifier

CIRCUITRY FOR RELIABILITY TESTING AS A FUNCTION OF SLEW

Probeless DC testing of CMOS I/O circuits

Testing radio frequency and analogue circuits

Method and device for testing a phase locked loop

Inspection method and inspection equipment

Semiconductor device with a plurality of ground planes

Sub-circuit voltage manipulation

Device speed alteration by electron-hole pair injection and device...

Sag generator with plurality of switch technologies