Means for supporting or positioning the objects or the material Means for adjusting diaphragms or lenses associated with the support

Industry

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H01J37/20

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Parent Industries

HELECTRICITY H01Electric elements H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge

Current Industry

H01J37/20Means for supporting or positioning the objects or the material Means for adjusting diaphragms or lenses associated with the support

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Multiple electron beam image acquisition method, multiple electron...
- Patent number 12,288,666
- Issue date Apr 29, 2025
- NuFlare Technology, Inc.
- Koichi Ishii
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Live-assisted image acquisition method and system with charged part...
- Patent number 12,288,667
- Issue date Apr 29, 2025
- FEI Company
- Pavel Potocek
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Substrate processing apparatus and substrate transfer position adju...
- Patent number 12,288,678
- Issue date Apr 29, 2025
- Tokyo Electron Limited
- Joji Takayoshi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Sample display method
- Patent number 12,288,665
- Issue date Apr 29, 2025
- TESCAN BRNO s.r.o
- Jiri Dluhos
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Material processing method and material processing system for perfo...
- Patent number 12,280,445
- Issue date Apr 22, 2025
- Carl Zeiss Microscopy GmbH
- Stephan Hiller
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Automated application of drift correction to sample studied under e...
- Patent number 12,284,445
- Issue date Apr 22, 2025
- PROTOCHIPS, INC.
- Franklin Stampley Walden
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Nanofluidic cell and loading platform
- Patent number 12,283,459
- Issue date Apr 22, 2025
- Germán Sciaini
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Stage and plasma processing apparatus
- Patent number 12,278,131
- Issue date Apr 15, 2025
- Tokyo Electron Limited
- Naoki Sugawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Substrate holder state detection device and substrate holder state...
- Patent number 12,278,083
- Issue date Apr 15, 2025
- SCREEN Holdings Co., Ltd.
- Yuji Okita
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Systems and methods for performing sample lift-out for highly react...
- Patent number 12,278,087
- Issue date Apr 15, 2025
- FEI Company
- Christopher Thompson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High resolution imaging apparatus and method
- Patent number 12,278,098
- Issue date Apr 15, 2025
- STANDARD BIOTOOLS CANADA INC.
- Paul Corkum
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Nanofluidic carrier
- Patent number 12,272,517
- Issue date Apr 8, 2025
- Germán Sciaini
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Nanopositioning systems and associated methods
- Patent number 12,266,501
- Issue date Apr 1, 2025
- The Texas A&M University System
- ChaBum Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Sample milling apparatus and method of adjustment therefor
- Patent number 12,266,502
- Issue date Apr 1, 2025
- Jeol Ltd.
- Munehiro Kozuka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam system and control method therefor
- Patent number 12,261,013
- Issue date Mar 25, 2025
- Jeol Ltd.
- Takeshi Kaneko
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron beam inspection apparatus
- Patent number 12,261,015
- Issue date Mar 25, 2025
- NuFlare Technology, Inc.
- Atsushi Ando
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
3D fiducial for precision 3D NAND channel tilt/shift analysis
- Patent number 12,260,583
- Issue date Mar 25, 2025
- FEI Company
- Mark Najarian
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Transmission charged particle microscope with an electron energy lo...
- Patent number 12,255,045
- Issue date Mar 18, 2025
- FEI Company
- Peter Christiaan Tiemeijer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Substrate holding device
- Patent number 12,249,479
- Issue date Mar 11, 2025
- Nissin Ion Equipment Co., Ltd.
- Yusuke Otsuki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Fluid transfer system in a charged particle system
- Patent number 12,249,480
- Issue date Mar 11, 2025
- ASML Netherlands B.V.
- Marcus Adrianus Van De Kerkhof
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
Lens designs
- Patent number 12,243,714
- Issue date Mar 4, 2025
- ASML Netherlands B.V.
- Laura Del Tin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Broad ion beam (BIB) systems for more efficient processing of multi...
- Patent number 12,228,484
- Issue date Feb 18, 2025
- FEI Company
- Michal Hrouzek
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Temperature-controlled surface with a cryo-nanomanipulator for impr...
- Patent number 12,230,473
- Issue date Feb 18, 2025
- Applied Materials Israel Ltd.
- Yehuda Zur
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Ion milling device
- Patent number 12,224,155
- Issue date Feb 11, 2025
- HITACHI HIGH-TECH CORPORATION
- Shota Aida
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Stage apparatus and electron beam lithography system
- Patent number 12,222,658
- Issue date Feb 11, 2025
- Jeol Ltd.
- Hirofumi Miyao
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Systems and methods for thermally conditioning a wafer in a charged...
- Patent number 12,217,930
- Issue date Feb 4, 2025
- ASML Netherlands B.V.
- Martijn Petrus Christianus Van Heumen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Detachable column unit of scanning electron microscope, and method...
- Patent number 12,217,933
- Issue date Feb 4, 2025
- COXEM CO., LTD
- Jun Hee Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multiple charged-particle beam apparatus with low crosstalk
- Patent number 12,211,669
- Issue date Jan 28, 2025
- ASML Netherlands B.V.
- Weiming Ren
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron microscope imaging adaptor
- Patent number 12,211,664
- Issue date Jan 28, 2025
- University of Kansas
- Eduardo Rosa-Molinar
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device
- Patent number 12,211,665
- Issue date Jan 28, 2025
- HITACHI HIGH-TECH CORPORATION
- Akito Tanokuchi
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Ion Milling Device
- Publication number 20250149287
- Publication date May 8, 2025
- Hitachi High-Tech Corporation
- Shota AIDA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Ion Milling Device, and Inspection System
- Publication number 20250149288
- Publication date May 8, 2025
- Hitachi High-Tech Corporation
- Naohiro FUJITA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION MILLING DEVICE
- Publication number 20250149289
- Publication date May 8, 2025
- HITACHI HIGH-TECH CORPORATION
- Shota AIDA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MULTIPLE-BEAM IMAGE ACQUISITION APPARATUS AND MULTIPLE-BEAM IMAGE A...
- Publication number 20250149290
- Publication date May 8, 2025
- NuFlare Technology, Inc.
- Koichi ISHII
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION BEAM ETCHING MACHINE AND LOWER ELECTRODE STRUCTURE THEREOF
- Publication number 20250140512
- Publication date May 1, 2025
- JIANGSU LEUVEN INSTRUMENTS CO., LTD.
- Huaidong ZHANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM DEVICE
- Publication number 20250140513
- Publication date May 1, 2025
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Satoshi TOMIMATSU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MULTIPLE CHARGED PARTICLE BEAM WRITING METHOD AND MULTIPLE CHARGED...
- Publication number 20250140521
- Publication date May 1, 2025
- NuFlare Technology, Inc.
- Hiroshi MATSUMOTO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Liquid cells for the study of electrochemical processes using trans...
- Publication number 20250140514
- Publication date May 1, 2025
- The Regents of the University of California
- Haimei Zheng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF ADJUSTING CHARGED PARTICLE BEAM WRITING APPARATUS, CHARGE...
- Publication number 20250140519
- Publication date May 1, 2025
- NuFlare Technology, Inc.
- Michihiko IKEDA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DEVICE AND METHOD FOR VIBRATION FREE LOW TEMPERATURE SAMPLE HOLDER...
- Publication number 20250132120
- Publication date Apr 24, 2025
- Ohio State Innovation Foundation
- Alexander REIFSNYDER
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ASSESSMENT APPARATUS AND METHODS
- Publication number 20250132122
- Publication date Apr 24, 2025
- ASML NETHERLANDS B.V.
- Thomas Izaak Fred HAARTSEN
- G01 - MEASURING TESTING
Information Patent Application
Charged Particle Beam Device
- Publication number 20250132123
- Publication date Apr 24, 2025
- Hitachi High-Tech Corporation
- Hiroyuki YAMAMOTO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method for investigating a nanoscale biological specimen in an elec...
- Publication number 20250123223
- Publication date Apr 17, 2025
- Bruker AXS SE
- Niels DE JONGE
- G01 - MEASURING TESTING
Information Patent Application
LENS DESIGNS
- Publication number 20250125120
- Publication date Apr 17, 2025
- ASML NETHERLANDS B.V.
- Laura DEL TIN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TESTING ASSEMBLY INCLUDING A MULTIPLE DEGREE OF FREEDOM STAGE
- Publication number 20250123192
- Publication date Apr 17, 2025
- Bruker Nano, Inc.
- Edward Cyrankowski
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF ASSESSING A SAMPLE, APPARATUS FOR ASSESSING A SAMPLE
- Publication number 20250116587
- Publication date Apr 10, 2025
- ASML NETHERLANDS B.V.
- Marco Jan-Jaco WIELAND
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PARTICLE BEAM SYSTEM WITH COOLING SYSTEM
- Publication number 20250118527
- Publication date Apr 10, 2025
- CARL ZEISS MICROSCOPY GMBH
- Andreas Schmaunz
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PARTICLE BEAM SYSTEM WITH COOLING SYSTEM
- Publication number 20250118525
- Publication date Apr 10, 2025
- CARL ZEISS MICROSCOPY GMBH
- Andreas Schmaunz
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PARTICLE BEAM SYSTEM WITH COOLING SYSTEM
- Publication number 20250118526
- Publication date Apr 10, 2025
- CARL ZEISS MICROSCOPY GMBH
- Andreas Schmaunz
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
BETA TILT SAMPLE HOLDER
- Publication number 20250112020
- Publication date Apr 3, 2025
- FEI Company
- Albert Visscher
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ADAPTIVE SLICE DEPTH IN SLICE & VIEW WORKFLOW
- Publication number 20250112024
- Publication date Apr 3, 2025
- FEI Company
- Jirí Vítecek
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SAMPLE CARRIER AND USES THEREOF
- Publication number 20250104962
- Publication date Mar 27, 2025
- FEI Company
- Christopher Thompson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
OPERANDO SCANNING ELECTRON MICROSCOPY PLATFORM AND METHODS OF USING...
- Publication number 20250104960
- Publication date Mar 27, 2025
- Board of Regents, The University of Texas System
- Wen Song
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CONOSCOPIC WAFER ORIENTATION APPARATUS AND ION IMPLANTER INCLUDING...
- Publication number 20250095952
- Publication date Mar 20, 2025
- Applied Materials, Inc.
- Ori Noked
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEMS AND METHODS FOR PERFORMING SAMPLE LIFT-OUT FOR HIGHLY REACT...
- Publication number 20250095953
- Publication date Mar 20, 2025
- FEI Company
- Adam STOKES
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Beam Apparatus and Sample Analysis Method
- Publication number 20250087447
- Publication date Mar 13, 2025
- Hitachi High-Tech Corporation
- Yuya SUZUKI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
NANOFLUIDIC CELL FOR CHARACTERIZATION OF NANO-BUBBLES IN A SIMULATE...
- Publication number 20250087443
- Publication date Mar 13, 2025
- Saudi Arabian Oil Company
- Dong Kyu Cha
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
LIQUID SPECIMEN GRID FOR TRANSMISSION ELECTRON MICROSCOPE
- Publication number 20250076159
- Publication date Mar 6, 2025
- FEI Company
- Jolet de Ruiter
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
In-Vacuum Rotatable RF Component
- Publication number 20250079116
- Publication date Mar 6, 2025
- Applied Materials, Inc.
- Michael Mason Carrell
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TEM GRIDS WITH LIQUID SPREADING LANES
- Publication number 20250079117
- Publication date Mar 6, 2025
- FEI Company
- Jolet de Ruiter
- H01 - BASIC ELECTRIC ELEMENTS

Means for supporting or positioning the objects or the material Means for adjusting diaphragms or lenses associated with the support

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Multiple electron beam image acquisition method, multiple electron...

Live-assisted image acquisition method and system with charged part...

Substrate processing apparatus and substrate transfer position adju...

Sample display method

Material processing method and material processing system for perfo...

Automated application of drift correction to sample studied under e...

Nanofluidic cell and loading platform

Stage and plasma processing apparatus

Substrate holder state detection device and substrate holder state...

Systems and methods for performing sample lift-out for highly react...

High resolution imaging apparatus and method

Nanofluidic carrier

Nanopositioning systems and associated methods

Sample milling apparatus and method of adjustment therefor

Charged particle beam system and control method therefor

Electron beam inspection apparatus

3D fiducial for precision 3D NAND channel tilt/shift analysis

Transmission charged particle microscope with an electron energy lo...

Substrate holding device

Fluid transfer system in a charged particle system

Lens designs

Broad ion beam (BIB) systems for more efficient processing of multi...

Temperature-controlled surface with a cryo-nanomanipulator for impr...

Ion milling device

Stage apparatus and electron beam lithography system

Systems and methods for thermally conditioning a wafer in a charged...

Detachable column unit of scanning electron microscope, and method...

Multiple charged-particle beam apparatus with low crosstalk

Electron microscope imaging adaptor

Charged particle beam device

Patents Applicationslast 30 patents

Ion Milling Device

Ion Milling Device, and Inspection System

ION MILLING DEVICE

MULTIPLE-BEAM IMAGE ACQUISITION APPARATUS AND MULTIPLE-BEAM IMAGE A...

ION BEAM ETCHING MACHINE AND LOWER ELECTRODE STRUCTURE THEREOF

CHARGED PARTICLE BEAM DEVICE

MULTIPLE CHARGED PARTICLE BEAM WRITING METHOD AND MULTIPLE CHARGED...

Liquid cells for the study of electrochemical processes using trans...

METHOD OF ADJUSTING CHARGED PARTICLE BEAM WRITING APPARATUS, CHARGE...

DEVICE AND METHOD FOR VIBRATION FREE LOW TEMPERATURE SAMPLE HOLDER...

ASSESSMENT APPARATUS AND METHODS

Charged Particle Beam Device

Method for investigating a nanoscale biological specimen in an elec...

LENS DESIGNS

TESTING ASSEMBLY INCLUDING A MULTIPLE DEGREE OF FREEDOM STAGE

METHOD OF ASSESSING A SAMPLE, APPARATUS FOR ASSESSING A SAMPLE

PARTICLE BEAM SYSTEM WITH COOLING SYSTEM

PARTICLE BEAM SYSTEM WITH COOLING SYSTEM

PARTICLE BEAM SYSTEM WITH COOLING SYSTEM

BETA TILT SAMPLE HOLDER

ADAPTIVE SLICE DEPTH IN SLICE & VIEW WORKFLOW

SAMPLE CARRIER AND USES THEREOF

OPERANDO SCANNING ELECTRON MICROSCOPY PLATFORM AND METHODS OF USING...

CONOSCOPIC WAFER ORIENTATION APPARATUS AND ION IMPLANTER INCLUDING...

SYSTEMS AND METHODS FOR PERFORMING SAMPLE LIFT-OUT FOR HIGHLY REACT...

Charged Particle Beam Apparatus and Sample Analysis Method

NANOFLUIDIC CELL FOR CHARACTERIZATION OF NANO-BUBBLES IN A SIMULATE...

LIQUID SPECIMEN GRID FOR TRANSMISSION ELECTRON MICROSCOPE

In-Vacuum Rotatable RF Component

TEM GRIDS WITH LIQUID SPREADING LANES