Means for supporting or positioning the objects or the material Means for adjusting diaphragms or lenses associated with the support

Industry

CPC
H01J37/20

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Parent Industries

HELECTRICITY H01Electric elements H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge

Current Industry

H01J37/20Means for supporting or positioning the objects or the material Means for adjusting diaphragms or lenses associated with the support

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Sample supports and sample cooling systems for cryo-electron micros...
- Patent number 12,366,509
- Issue date Jul 22, 2025
- MiTeGen, LLC
- David Closs
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method, apparatus, and system for dynamically controlling an electr...
- Patent number 12,368,067
- Issue date Jul 22, 2025
- ASML Netherlands B.V.
- Yixiang Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam apparatus and focus adjusting method therefor
- Patent number 12,368,017
- Issue date Jul 22, 2025
- HITACHI HIGH-TECH CORPORATION
- Keisuke Igarashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System and method for uniform ion milling
- Patent number 12,362,130
- Issue date Jul 15, 2025
- E. A. Fischione Instruments, Inc.
- Paul E Fischione
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for inspecting a specimen and charged particle beam device
- Patent number 12,362,131
- Issue date Jul 15, 2025
- Applied Materials Israel Ltd.
- Pieter Kruit
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Transport device and charged particle beam system
- Patent number 12,362,133
- Issue date Jul 15, 2025
- Jeol Ltd.
- Shuichi Yuasa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Graphene oxide affinity sample grids for Cyro-EM
- Patent number 12,360,021
- Issue date Jul 15, 2025
- The Regents of the University of California
- Feng Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor analysis system
- Patent number 12,347,707
- Issue date Jul 1, 2025
- HITACHI HIGH-TECH CORPORATION
- Yudai Kubo
- G05 - CONTROLLING REGULATING
Information Patent Grant
Charged particle beam pattern forming device and charged particle b...
- Patent number 12,347,641
- Issue date Jul 1, 2025
- Kabushiki Kaisha Toshiba
- Hiroko Nakamura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Graphene functionalization method, apparatus, and functionalized gr...
- Patent number 12,344,527
- Issue date Jul 1, 2025
- MEDICAL RESEARCH COUNCIL AS PART OF UNITED KINGDOM RESEARCH AND INNOVATION
- Christopher Russo
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Microscope stage fixture for horizontal rotation
- Patent number 12,340,971
- Issue date Jun 24, 2025
- Gabriel Demeneghi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for depositing target material in deposition chamber with ti...
- Patent number 12,341,042
- Issue date Jun 24, 2025
- Taiwan Semiconductor Manufacturing Co., Ltd
- Hsuan-Chih Chu
- B05 - SPRAYING OR ATOMISING IN GENERAL APPLYING LIQUIDS OR OTHER FLUENT MATER...
Information Patent Grant
Charged particle gun, charged particle beam system, and lock nut
- Patent number 12,334,298
- Issue date Jun 17, 2025
- HITACHI HIGH-TECH CORPORATION
- Teruaki Hasegawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Auto-focus sensor implementation for multi-column microscopes
- Patent number 12,322,568
- Issue date Jun 3, 2025
- KLA Corporation
- Nicholas Petrone
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Sample holder, intermembrane distance adjustment mechanism, and cha...
- Patent number 12,315,695
- Issue date May 27, 2025
- HITACHI HIGH-TECH CORPORATION
- Michio Hatano
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Device for observing permeation and diffusion path of observation t...
- Patent number 12,315,696
- Issue date May 27, 2025
- National Institute for Materials Science
- Akiko Nakamura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multi-electron beam inspection apparatus, multipole array control m...
- Patent number 12,308,202
- Issue date May 20, 2025
- NuFlare Technology, Inc.
- Yuichi Maekawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for positioning objects in a particle beam microscope with t...
- Patent number 12,300,459
- Issue date May 13, 2025
- Carl Zeiss Microscopy GmbH
- Josef Biberger
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multiple electron beam image acquisition method, multiple electron...
- Patent number 12,288,666
- Issue date Apr 29, 2025
- NuFlare Technology, Inc.
- Koichi Ishii
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Live-assisted image acquisition method and system with charged part...
- Patent number 12,288,667
- Issue date Apr 29, 2025
- FEI Company
- Pavel Potocek
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Substrate processing apparatus and substrate transfer position adju...
- Patent number 12,288,678
- Issue date Apr 29, 2025
- Tokyo Electron Limited
- Joji Takayoshi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Sample display method
- Patent number 12,288,665
- Issue date Apr 29, 2025
- TESCAN BRNO s.r.o
- Jiri Dluhos
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Material processing method and material processing system for perfo...
- Patent number 12,280,445
- Issue date Apr 22, 2025
- Carl Zeiss Microscopy GmbH
- Stephan Hiller
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Automated application of drift correction to sample studied under e...
- Patent number 12,284,445
- Issue date Apr 22, 2025
- PROTOCHIPS, INC.
- Franklin Stampley Walden
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Nanofluidic cell and loading platform
- Patent number 12,283,459
- Issue date Apr 22, 2025
- Germán Sciaini
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Stage and plasma processing apparatus
- Patent number 12,278,131
- Issue date Apr 15, 2025
- Tokyo Electron Limited
- Naoki Sugawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Substrate holder state detection device and substrate holder state...
- Patent number 12,278,083
- Issue date Apr 15, 2025
- SCREEN Holdings Co., Ltd.
- Yuji Okita
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Systems and methods for performing sample lift-out for highly react...
- Patent number 12,278,087
- Issue date Apr 15, 2025
- FEI Company
- Christopher Thompson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High resolution imaging apparatus and method
- Patent number 12,278,098
- Issue date Apr 15, 2025
- STANDARD BIOTOOLS CANADA INC.
- Paul Corkum
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Nanofluidic carrier
- Patent number 12,272,517
- Issue date Apr 8, 2025
- Germán Sciaini
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
CHARGED PARTICLE BEAM DEVICE
- Publication number 20250239430
- Publication date Jul 24, 2025
- HITACHI HIGH-TECH CORPORATION
- Takafumi MIWA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MULTIPLE PARTICLE BEAM SYSTEM WITH PROLONGED MAINTENANCE INTERVAL
- Publication number 20250232943
- Publication date Jul 17, 2025
- Carl Zeiss MultiSEM GmbH
- Ticia Buhr
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Shield for an Ion Implanter
- Publication number 20250232949
- Publication date Jul 17, 2025
- Applied Materials, Inc.
- Tseh-Jen Hsieh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
WAFER EDGE INSPECTION OF CHARGED PARTICLE INSPECTION SYSTEM
- Publication number 20250232941
- Publication date Jul 17, 2025
- ASML NETHERLANDS B.V.
- Zizhou GONG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IN-SITU, PRE-IMPLANT WAFER CHARACTERIZATION SYSTEM AND METHOD
- Publication number 20250226266
- Publication date Jul 10, 2025
- Axcelis Technologies, Inc.
- Scott Edwin Galica
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF WAFER GROUNDING UTILIZING WAFER EDGE BACKSIDE COATING EXC...
- Publication number 20250218720
- Publication date Jul 3, 2025
- ASML NETHERLANDS B.V.
- Yinglong LI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SUBSTRATE STRESS MANAGEMENT USING DIRECT SELECTIVE AREA PROCESSING
- Publication number 20250218788
- Publication date Jul 3, 2025
- Applied Materials, Inc.
- Morgan EVANS
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
GRAPHENE LAYER TRANSFER METHOD
- Publication number 20250214331
- Publication date Jul 3, 2025
- UNIVERSITEIT ANTWERPEN
- Adrian Pedrazo Tardajos
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
High-Volume Transmission Electron Microscopy Grid
- Publication number 20250201509
- Publication date Jun 19, 2025
- Yale University
- Cong Su
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
LIVE-ASSISTED IMAGE ACQUISITION METHOD AND SYSTEM WITH CHARGED PART...
- Publication number 20250201512
- Publication date Jun 19, 2025
- FEI Company
- Pavel Potocek
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
VACUUM CHAMBER SYSTEM INCLUDING TEMPERATURE CONDITIONING PLATE
- Publication number 20250191875
- Publication date Jun 12, 2025
- ASML NETHERLANDS B.V.
- Dongchi YU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
STABLE ELECTRON MICROSCOPY SPECIMEN HOLDER OPERATING AT LOW TEMPERA...
- Publication number 20250191876
- Publication date Jun 12, 2025
- President and Fellows of Harvard College
- Ismail EL BAGGARI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM DEVICE ADJUSTMENT METHOD AND CHARGED PARTICLE...
- Publication number 20250157785
- Publication date May 15, 2025
- HITACHI HIGH-TECH CORPORATION
- Hidenori MACHIYA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Ion Milling Device
- Publication number 20250149287
- Publication date May 8, 2025
- Hitachi High-Tech Corporation
- Shota AIDA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Ion Milling Device, and Inspection System
- Publication number 20250149288
- Publication date May 8, 2025
- Hitachi High-Tech Corporation
- Naohiro FUJITA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION MILLING DEVICE
- Publication number 20250149289
- Publication date May 8, 2025
- HITACHI HIGH-TECH CORPORATION
- Shota AIDA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MULTIPLE-BEAM IMAGE ACQUISITION APPARATUS AND MULTIPLE-BEAM IMAGE A...
- Publication number 20250149290
- Publication date May 8, 2025
- NuFlare Technology, Inc.
- Koichi ISHII
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION BEAM ETCHING MACHINE AND LOWER ELECTRODE STRUCTURE THEREOF
- Publication number 20250140512
- Publication date May 1, 2025
- JIANGSU LEUVEN INSTRUMENTS CO., LTD.
- Huaidong ZHANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM DEVICE
- Publication number 20250140513
- Publication date May 1, 2025
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Satoshi TOMIMATSU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MULTIPLE CHARGED PARTICLE BEAM WRITING METHOD AND MULTIPLE CHARGED...
- Publication number 20250140521
- Publication date May 1, 2025
- NuFlare Technology, Inc.
- Hiroshi MATSUMOTO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Liquid cells for the study of electrochemical processes using trans...
- Publication number 20250140514
- Publication date May 1, 2025
- The Regents of the University of California
- Haimei Zheng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF ADJUSTING CHARGED PARTICLE BEAM WRITING APPARATUS, CHARGE...
- Publication number 20250140519
- Publication date May 1, 2025
- NuFlare Technology, Inc.
- Michihiko IKEDA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DEVICE AND METHOD FOR VIBRATION FREE LOW TEMPERATURE SAMPLE HOLDER...
- Publication number 20250132120
- Publication date Apr 24, 2025
- Ohio State Innovation Foundation
- Alexander REIFSNYDER
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ASSESSMENT APPARATUS AND METHODS
- Publication number 20250132122
- Publication date Apr 24, 2025
- ASML NETHERLANDS B.V.
- Thomas Izaak Fred HAARTSEN
- G01 - MEASURING TESTING
Information Patent Application
Charged Particle Beam Device
- Publication number 20250132123
- Publication date Apr 24, 2025
- Hitachi High-Tech Corporation
- Hiroyuki YAMAMOTO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method for investigating a nanoscale biological specimen in an elec...
- Publication number 20250123223
- Publication date Apr 17, 2025
- Bruker AXS SE
- Niels DE JONGE
- G01 - MEASURING TESTING
Information Patent Application
LENS DESIGNS
- Publication number 20250125120
- Publication date Apr 17, 2025
- ASML NETHERLANDS B.V.
- Laura DEL TIN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TESTING ASSEMBLY INCLUDING A MULTIPLE DEGREE OF FREEDOM STAGE
- Publication number 20250123192
- Publication date Apr 17, 2025
- Bruker Nano, Inc.
- Edward Cyrankowski
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF ASSESSING A SAMPLE, APPARATUS FOR ASSESSING A SAMPLE
- Publication number 20250116587
- Publication date Apr 10, 2025
- ASML NETHERLANDS B.V.
- Marco Jan-Jaco WIELAND
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PARTICLE BEAM SYSTEM WITH COOLING SYSTEM
- Publication number 20250118527
- Publication date Apr 10, 2025
- CARL ZEISS MICROSCOPY GMBH
- Andreas Schmaunz
- H01 - BASIC ELECTRIC ELEMENTS

Means for supporting or positioning the objects or the material Means for adjusting diaphragms or lenses associated with the support

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Sample supports and sample cooling systems for cryo-electron micros...

Method, apparatus, and system for dynamically controlling an electr...

Charged particle beam apparatus and focus adjusting method therefor

System and method for uniform ion milling

Method for inspecting a specimen and charged particle beam device

Transport device and charged particle beam system

Graphene oxide affinity sample grids for Cyro-EM

Semiconductor analysis system

Charged particle beam pattern forming device and charged particle b...

Graphene functionalization method, apparatus, and functionalized gr...

Microscope stage fixture for horizontal rotation

Method for depositing target material in deposition chamber with ti...

Charged particle gun, charged particle beam system, and lock nut

Auto-focus sensor implementation for multi-column microscopes

Sample holder, intermembrane distance adjustment mechanism, and cha...

Device for observing permeation and diffusion path of observation t...

Multi-electron beam inspection apparatus, multipole array control m...

Method for positioning objects in a particle beam microscope with t...

Multiple electron beam image acquisition method, multiple electron...

Live-assisted image acquisition method and system with charged part...

Substrate processing apparatus and substrate transfer position adju...

Sample display method

Material processing method and material processing system for perfo...

Automated application of drift correction to sample studied under e...

Nanofluidic cell and loading platform

Stage and plasma processing apparatus

Substrate holder state detection device and substrate holder state...

Systems and methods for performing sample lift-out for highly react...

High resolution imaging apparatus and method

Nanofluidic carrier

Patents Applicationslast 30 patents

CHARGED PARTICLE BEAM DEVICE

MULTIPLE PARTICLE BEAM SYSTEM WITH PROLONGED MAINTENANCE INTERVAL

Shield for an Ion Implanter

WAFER EDGE INSPECTION OF CHARGED PARTICLE INSPECTION SYSTEM

IN-SITU, PRE-IMPLANT WAFER CHARACTERIZATION SYSTEM AND METHOD

METHOD OF WAFER GROUNDING UTILIZING WAFER EDGE BACKSIDE COATING EXC...

SUBSTRATE STRESS MANAGEMENT USING DIRECT SELECTIVE AREA PROCESSING

GRAPHENE LAYER TRANSFER METHOD

High-Volume Transmission Electron Microscopy Grid

LIVE-ASSISTED IMAGE ACQUISITION METHOD AND SYSTEM WITH CHARGED PART...

VACUUM CHAMBER SYSTEM INCLUDING TEMPERATURE CONDITIONING PLATE

STABLE ELECTRON MICROSCOPY SPECIMEN HOLDER OPERATING AT LOW TEMPERA...

CHARGED PARTICLE BEAM DEVICE ADJUSTMENT METHOD AND CHARGED PARTICLE...

Ion Milling Device

Ion Milling Device, and Inspection System

ION MILLING DEVICE

MULTIPLE-BEAM IMAGE ACQUISITION APPARATUS AND MULTIPLE-BEAM IMAGE A...

ION BEAM ETCHING MACHINE AND LOWER ELECTRODE STRUCTURE THEREOF

CHARGED PARTICLE BEAM DEVICE

MULTIPLE CHARGED PARTICLE BEAM WRITING METHOD AND MULTIPLE CHARGED...

Liquid cells for the study of electrochemical processes using trans...

METHOD OF ADJUSTING CHARGED PARTICLE BEAM WRITING APPARATUS, CHARGE...

DEVICE AND METHOD FOR VIBRATION FREE LOW TEMPERATURE SAMPLE HOLDER...

ASSESSMENT APPARATUS AND METHODS

Charged Particle Beam Device

Method for investigating a nanoscale biological specimen in an elec...

LENS DESIGNS

TESTING ASSEMBLY INCLUDING A MULTIPLE DEGREE OF FREEDOM STAGE

METHOD OF ASSESSING A SAMPLE, APPARATUS FOR ASSESSING A SAMPLE

PARTICLE BEAM SYSTEM WITH COOLING SYSTEM