Means for supporting or positioning the objects or the material Means for adjusting diaphragms or lenses associated with the support

Industry

CPC
H01J37/20

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Parent Industries

HELECTRICITY H01Electric elements H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge

Current Industry

H01J37/20Means for supporting or positioning the objects or the material Means for adjusting diaphragms or lenses associated with the support

Industries

Patents Grantslast 30 patents

Information Patent Grant
Sample holder and charged particle beam apparatus
- Patent number 12,198,892
- Issue date Jan 14, 2025
- HITACHI HIGH-TECH CORPORATION
- Shigeru Haneda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Sample holder system with freely settable inclination angles
- Patent number 12,196,941
- Issue date Jan 14, 2025
- Carl Zeiss Microscopy GmbH
- Heiko Stegmann
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Inert gas sample transfer for beam systems
- Patent number 12,183,539
- Issue date Dec 31, 2024
- FEI Company
- Libor Novák
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor manufacturing apparatus, semiconductor device and man...
- Patent number 12,183,538
- Issue date Dec 31, 2024
- Kioxia Corporation
- Takayuki Ito
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method, device and system for reducing off-axial aberration in elec...
- Patent number 12,176,179
- Issue date Dec 24, 2024
- FEI Company
- Maarten Bischoff
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for producing lamella, analysis system and method for analyz...
- Patent number 12,176,180
- Issue date Dec 24, 2024
- HITACHI HIGH-TECH CORPORATION
- Atsushi Sawada
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ribbon beam angle adjustment in an ion implantation system
- Patent number 12,170,182
- Issue date Dec 17, 2024
- Advanced Ion Beam Technology, Inc.
- Zhimin Wan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multiple charged-particle beam apparatus with low crosstalk
- Patent number 12,165,830
- Issue date Dec 10, 2024
- ASML Netherlands B.V.
- Shichen Gu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System and methods for automated processing of multiple samples in...
- Patent number 12,165,833
- Issue date Dec 10, 2024
- FEI Company
- Michal Hrouzek
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System and method for preparation and delivery of biological sample...
- Patent number 12,165,839
- Issue date Dec 10, 2024
- FEI Company
- Marcus Straw
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Systems and methods for performing sample lift-out for highly react...
- Patent number 12,165,832
- Issue date Dec 10, 2024
- FEI Company
- Adam Stokes
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
GridTape for fast nanoscale imaging
- Patent number 12,152,970
- Issue date Nov 26, 2024
- President and Fellows of Harvard College
- David Grant Colburn Hildebrand
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Testing assembly including a multiple degree of freedom stage
- Patent number 12,140,571
- Issue date Nov 12, 2024
- Bruker Nano, Inc.
- Edward Cyrankowski
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Vacuum apparatus
- Patent number 12,142,512
- Issue date Nov 12, 2024
- NuFlare Technology, Inc.
- Yoshiaki Shinohara
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for producing substance with modified carbon allotrope surfa...
- Patent number 12,139,406
- Issue date Nov 12, 2024
- Osaka University
- Tsuyoshi Inoue
- C01 - INORGANIC CHEMISTRY
Information Patent Grant
Apparatus and method for projecting an array of multiple charged pa...
- Patent number 12,123,841
- Issue date Oct 22, 2024
- DELMIC IP B.V.
- Andries Pieter Johan Effting
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Sample holder and charged particle beam system
- Patent number 12,112,917
- Issue date Oct 8, 2024
- Jeol Ltd.
- Shuichi Yuasa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Sample preparation method and sample preparing apparatus
- Patent number 12,111,264
- Issue date Oct 8, 2024
- Nikon Corporation
- Ichiro Sase
- C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information Patent Grant
Systems and methods for pre-aligning samples for more efficient pro...
- Patent number 12,106,931
- Issue date Oct 1, 2024
- FEI Company
- Michal Hrouzek
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Modulation of rolling k vectors of angled gratings
- Patent number 12,106,935
- Issue date Oct 1, 2024
- Applied Materials, Inc.
- Joseph C. Olson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scanned angled etching apparatus and techniques providing separate...
- Patent number 12,106,936
- Issue date Oct 1, 2024
- Applied Materials, Inc.
- Peter F. Kurunczi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus and methods for beam processing of substrates
- Patent number 12,105,423
- Issue date Oct 1, 2024
- Tokyo Electron Limited
- Mirko Vukovic
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Sample fixation mechanism for test with nano-probe, apparatus for t...
- Patent number 12,099,076
- Issue date Sep 24, 2024
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Jiabao Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Target and algorithm to measure overlay by modeling back scattering...
- Patent number 12,100,574
- Issue date Sep 24, 2024
- KLA Corporation
- Nadav Gutman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Specimen imaging systems and methods
- Patent number 12,094,701
- Issue date Sep 17, 2024
- Georgia Tech Research Corporation
- Andrei G. Fedorov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Sample stand and method for manufacturing sample stand
- Patent number 12,090,624
- Issue date Sep 17, 2024
- Kioxia Corporation
- Kazuya Hatano
- B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information Patent Grant
Sample holder, method for using sample holder, projection amount ad...
- Patent number 12,080,511
- Issue date Sep 3, 2024
- HITACHI HIGH-TECH CORPORATION
- Megumi Nakamura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for temperature monitoring in cryo-electron microscopy
- Patent number 12,070,753
- Issue date Aug 27, 2024
- FEI Company
- Jakub Drahotsky
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
Inspection apparatus and method
- Patent number 12,072,181
- Issue date Aug 27, 2024
- ASML Netherlands B.V.
- Yan Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Rotating sample holder for random angle sampling in tomography
- Patent number 12,074,007
- Issue date Aug 27, 2024
- FEI Company
- Bart Jozef Janssen
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
APPARATUS AND METHOD FOR MANIPULATING A MICROSCOPIC SAMPLE
- Publication number 20250022677
- Publication date Jan 16, 2025
- FEI Company
- Joseph M. Lebow
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ENVIRONMENTAL CELL AND ELECTRON MICROSCOPE
- Publication number 20250022678
- Publication date Jan 16, 2025
- Hitachi, Ltd
- Fumiaki ICHIHASHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
GRAPHENE GRID, METHOD FOR PRODUCING GRAPHENE GRID, AND METHOD FOR A...
- Publication number 20250014856
- Publication date Jan 9, 2025
- OSAKA UNIVERSITY
- Haruyasu ASAHARA
- C01 - INORGANIC CHEMISTRY
Information Patent Application
METHOD AND SYSTEM OF REDUCING CHAMBER VIBRATION
- Publication number 20250014857
- Publication date Jan 9, 2025
- ASML NETHERLANDS B.V.
- Shaoqian WANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MAGNETIC LENSES, CHARGED PARTICLE MICROSCOPE SYSTEMS INCLUDING THE...
- Publication number 20250006453
- Publication date Jan 2, 2025
- FEI Company
- Jan Stopka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Sample Milling System and Apparatus and Method for Image Generation
- Publication number 20250006458
- Publication date Jan 2, 2025
- JEOL Ltd.
- Munehiro Kozuka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and System for Sample Preparation
- Publication number 20240426717
- Publication date Dec 26, 2024
- FEI Company
- Jakub Kuba
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SAMPLE HOLDER, ELECTRON MICROSCOPE SYSTEM AND SAMPLE OBSERVATION ME...
- Publication number 20240429020
- Publication date Dec 26, 2024
- Hitachi, Ltd
- Akira SUGAWARA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MAGNETIC ROTATION DEVICE FOR HIGH VACUUM APPLICATIONS SUCH AS ION A...
- Publication number 20240429019
- Publication date Dec 26, 2024
- SHINE Technologies, LLC
- Daniel Martin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
WAFER EDGE INSPECTION OF CHARGED PARTICLE INSPECTION SYSTEM
- Publication number 20240420916
- Publication date Dec 19, 2024
- ASML NETHERLANDS B.V.
- Xiaoyu JI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPARATUS AND METHODS FOR BEAM PROCESSING OF SUBSTRATES
- Publication number 20240419080
- Publication date Dec 19, 2024
- TOKYO ELECTRON LIMITED
- Mirko Vukovic
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Lamella Mounting Method, and Analysis System
- Publication number 20240412941
- Publication date Dec 12, 2024
- Hitachi High-Tech Corporation
- Wei Chean TAN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SPECIMEN IMAGING SYSTEMS AND METHODS
- Publication number 20240412961
- Publication date Dec 12, 2024
- Georgia Tech Research Corporation
- Andrei G. Fedorov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM DEVICES AND MEMBRANE ASSEMBLIES USEFUL THEREIN
- Publication number 20240412940
- Publication date Dec 12, 2024
- AIRSEM TECHNOLOGIES LTD.
- Jenny SHKLOVSKY
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPARATUS FOR PREPARING ELECTRON MICROSCOPY SAMPLES AND METHODS OF...
- Publication number 20240412942
- Publication date Dec 12, 2024
- The Regents of the University of California
- Maxim Armstrong
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
GridTape For Fast Nanoscale Imaging
- Publication number 20240402059
- Publication date Dec 5, 2024
- President and Fellows of Harvard College
- David Grant Colburn HILDEBRAND
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SAMPLE HOLDER AND ELECTRON MICROSCOPE
- Publication number 20240404781
- Publication date Dec 5, 2024
- Hitachi Ltd.
- Toshiaki TANIGAKI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION IMPLANTER AND ION IMPLANTATION METHOD
- Publication number 20240404787
- Publication date Dec 5, 2024
- NISSIN ION EQUIPMENT CO., LTD.
- Yuya HIRAI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM DEVICE
- Publication number 20240404782
- Publication date Dec 5, 2024
- HITACHI HIGH-TECH CORPORATION
- Hirohisa ENOMOTO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEMS, METHODS, AND DEVICES FOR ACHIEVING SUITABLE SAMPLE THICKNE...
- Publication number 20240393215
- Publication date Nov 28, 2024
- MITEGEN, LLC
- Robert E. Thorne
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ORIENTATION TOOL FOR ELECTRON BACKSCATTER DIFFRACTION
- Publication number 20240395498
- Publication date Nov 28, 2024
- GM GLOBAL TECHNOLOGY OPERATIONS LLC
- Chelsea Edge
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
System and Method for Fully Integrated Microcrystal Electron Diffra...
- Publication number 20240387141
- Publication date Nov 21, 2024
- The Regents of the University of California
- Tamir Gonen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD, APPARATUS, AND SYSTEM FOR WAFER GROUNDING
- Publication number 20240371599
- Publication date Nov 7, 2024
- ASML Netheriands B. V.
- Yixiang WANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
HIGH RESOLUTION IMAGING APPARATUS AND METHOD
- Publication number 20240371622
- Publication date Nov 7, 2024
- Standard BioTools Canada Inc.
- Paul Corkum
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INSPECTION APPARATUS AND METHOD
- Publication number 20240369356
- Publication date Nov 7, 2024
- ASML NETHERLANDS B.V.
- Yan WANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SUBSTRATE SUPPORT PLATE, SUBSTRATE PROCESSING APPARATUS INCLUDING T...
- Publication number 20240363331
- Publication date Oct 31, 2024
- ASM IP HOLDING B.V.
- DaeYoun Kim
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
STAGE DEVICE
- Publication number 20240363305
- Publication date Oct 31, 2024
- HITACHI HIGH-TECH CORPORATION
- Motohiro TAKAHASHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
HEIGHT SENSING SYSTEM FOR ELECTRON BEAM METROLOGY TOOL
- Publication number 20240355579
- Publication date Oct 24, 2024
- KLA Corporation
- Yeishin Tung
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
EDGE RING ARRANGEMENT WITH MOVEABLE EDGE RINGS
- Publication number 20240355667
- Publication date Oct 24, 2024
- LAM RESEARCH CORPORATION
- Haoquan Yan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DEVICE AND METHOD FOR PREPARING MICROSCOPIC SAMPLES VIA BACKSIDE TH...
- Publication number 20240347312
- Publication date Oct 17, 2024
- CARL ZEISS MICROSCOPY GMBH
- Heiko Stegmann
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL

Means for supporting or positioning the objects or the material Means for adjusting diaphragms or lenses associated with the support

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Sample holder and charged particle beam apparatus

Sample holder system with freely settable inclination angles

Inert gas sample transfer for beam systems

Semiconductor manufacturing apparatus, semiconductor device and man...

Method, device and system for reducing off-axial aberration in elec...

Method for producing lamella, analysis system and method for analyz...

Ribbon beam angle adjustment in an ion implantation system

Multiple charged-particle beam apparatus with low crosstalk

System and methods for automated processing of multiple samples in...

System and method for preparation and delivery of biological sample...

Systems and methods for performing sample lift-out for highly react...

GridTape for fast nanoscale imaging

Testing assembly including a multiple degree of freedom stage

Vacuum apparatus

Method for producing substance with modified carbon allotrope surfa...

Apparatus and method for projecting an array of multiple charged pa...

Sample holder and charged particle beam system

Sample preparation method and sample preparing apparatus

Systems and methods for pre-aligning samples for more efficient pro...

Modulation of rolling k vectors of angled gratings

Scanned angled etching apparatus and techniques providing separate...

Apparatus and methods for beam processing of substrates

Sample fixation mechanism for test with nano-probe, apparatus for t...

Target and algorithm to measure overlay by modeling back scattering...

Specimen imaging systems and methods

Sample stand and method for manufacturing sample stand

Sample holder, method for using sample holder, projection amount ad...

Method for temperature monitoring in cryo-electron microscopy

Inspection apparatus and method

Rotating sample holder for random angle sampling in tomography

Patents Applicationslast 30 patents

APPARATUS AND METHOD FOR MANIPULATING A MICROSCOPIC SAMPLE

ENVIRONMENTAL CELL AND ELECTRON MICROSCOPE

GRAPHENE GRID, METHOD FOR PRODUCING GRAPHENE GRID, AND METHOD FOR A...

METHOD AND SYSTEM OF REDUCING CHAMBER VIBRATION

MAGNETIC LENSES, CHARGED PARTICLE MICROSCOPE SYSTEMS INCLUDING THE...

Sample Milling System and Apparatus and Method for Image Generation

Method and System for Sample Preparation

SAMPLE HOLDER, ELECTRON MICROSCOPE SYSTEM AND SAMPLE OBSERVATION ME...

MAGNETIC ROTATION DEVICE FOR HIGH VACUUM APPLICATIONS SUCH AS ION A...

WAFER EDGE INSPECTION OF CHARGED PARTICLE INSPECTION SYSTEM

APPARATUS AND METHODS FOR BEAM PROCESSING OF SUBSTRATES

Lamella Mounting Method, and Analysis System

SPECIMEN IMAGING SYSTEMS AND METHODS

CHARGED PARTICLE BEAM DEVICES AND MEMBRANE ASSEMBLIES USEFUL THEREIN

APPARATUS FOR PREPARING ELECTRON MICROSCOPY SAMPLES AND METHODS OF...

GridTape For Fast Nanoscale Imaging

SAMPLE HOLDER AND ELECTRON MICROSCOPE

ION IMPLANTER AND ION IMPLANTATION METHOD

CHARGED PARTICLE BEAM DEVICE

SYSTEMS, METHODS, AND DEVICES FOR ACHIEVING SUITABLE SAMPLE THICKNE...

ORIENTATION TOOL FOR ELECTRON BACKSCATTER DIFFRACTION

System and Method for Fully Integrated Microcrystal Electron Diffra...

METHOD, APPARATUS, AND SYSTEM FOR WAFER GROUNDING

HIGH RESOLUTION IMAGING APPARATUS AND METHOD

INSPECTION APPARATUS AND METHOD

SUBSTRATE SUPPORT PLATE, SUBSTRATE PROCESSING APPARATUS INCLUDING T...

STAGE DEVICE

HEIGHT SENSING SYSTEM FOR ELECTRON BEAM METROLOGY TOOL

EDGE RING ARRANGEMENT WITH MOVEABLE EDGE RINGS

DEVICE AND METHOD FOR PREPARING MICROSCOPIC SAMPLES VIA BACKSIDE TH...