Means for supporting or positioning the objects or the material Means for adjusting diaphragms or lenses associated with the support

Industry

CPC
H01J37/20

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Parent Industries

HELECTRICITY H01Electric elements H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge

Current Industry

H01J37/20Means for supporting or positioning the objects or the material Means for adjusting diaphragms or lenses associated with the support

Industries

Patents Grantslast 30 patents

Information Patent Grant
Systems and methods for performing sample lift-out for highly react...
- Patent number 11,972,923
- Issue date Apr 30, 2024
- FEI Company
- Christopher Thompson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Grid coatings for capture of proteins and other compounds
- Patent number 11,965,851
- Issue date Apr 23, 2024
- Purdue Research Foundation
- David H. Thompson
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Charged particle beam device
- Patent number 11,967,482
- Issue date Apr 23, 2024
- HITACHI HIGH-TECH CORPORATION
- Wen Li
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High resolution imaging apparatus and method
- Patent number 11,967,496
- Issue date Apr 23, 2024
- Standard BioTools Canada Inc.
- Paul Corkum
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Plasma processing apparatus
- Patent number 11,967,511
- Issue date Apr 23, 2024
- Tokyo Electron Limited
- Akira Ishikawa
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Substrate treating apparatus, ion implantation apparatus, and ion i...
- Patent number 11,961,695
- Issue date Apr 16, 2024
- Semes Co., Ltd.
- Doyeon Kim
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Replaceable module for a charged particle apparatus
- Patent number 11,961,698
- Issue date Apr 16, 2024
- ASML Netherlands B.V.
- Christiaan Otten
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Height measuring device and beam irradiation device
- Patent number 11,959,735
- Issue date Apr 16, 2024
- Hitachi High-Technologies Corporation
- Naoya Nakai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Manufacturing method of sample collection component
- Patent number 11,959,834
- Issue date Apr 16, 2024
- Materials Analysis Technology Inc.
- Pin Chang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Transmission charged particle microscope with an electron energy lo...
- Patent number 11,955,310
- Issue date Apr 9, 2024
- FEI Company
- Peter Christiaan Tiemeijer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Physical analysis method, sample for physical analysis and preparin...
- Patent number 11,955,312
- Issue date Apr 9, 2024
- Materials Analysis Technology Inc.
- Chien-Wei Wu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Systems and methods for real time stereo imaging using multiple ele...
- Patent number 11,942,303
- Issue date Mar 26, 2024
- ASML Netherlands B.V.
- Yan Ren
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor wafer
- Patent number 11,929,229
- Issue date Mar 12, 2024
- MI2-FACTORY GMBH
- Florian Krippendorf
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Charged particle beam device
- Patent number 11,929,231
- Issue date Mar 12, 2024
- HITACHI HIGH-TECH CORPORATION
- Akito Tanokuchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Wafer supporting device
- Patent number 11,929,266
- Issue date Mar 12, 2024
- NISSIN ION EQUIPMENT CO., LTD.
- Takashi Sakamoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Support unit and substrate treating apparatus including the same
- Patent number 11,915,905
- Issue date Feb 27, 2024
- Semes Co., Ltd.
- Hyoungkyu Son
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Wafer scanning apparatus and method for focused beam processing
- Patent number 11,915,906
- Issue date Feb 27, 2024
- TEL MANUFACTURING AND ENGINEERING OF AMERICA, INC.
- Matthew Gwinn
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Method and apparatus for an imaging system
- Patent number 11,915,909
- Issue date Feb 27, 2024
- Frederick A. Flitsch
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Cryotransfer holder and workstation
- Patent number 11,908,655
- Issue date Feb 20, 2024
- Gatan, Inc.
- Alexander Jozef Gubbens
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Stage apparatus suitable for a particle beam apparatus
- Patent number 11,908,656
- Issue date Feb 20, 2024
- ASML Netherlands B.V.
- Han Willem Hendrik Severt
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Automated application of drift correction to sample studied under e...
- Patent number 11,902,665
- Issue date Feb 13, 2024
- PROTOCHIPS, INC.
- Franklin Stampley Walden
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Ion milling device
- Patent number 11,894,213
- Issue date Feb 6, 2024
- HITACHI HIGH-TECH CORPORATION
- Asako Kaneko
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Auto-tuning stage settling time with feedback in charged particle m...
- Patent number 11,887,809
- Issue date Jan 30, 2024
- FEI Company
- Yuchen Deng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Hybrid high-temperature electrostatic clamp for improved workpiece...
- Patent number 11,887,808
- Issue date Jan 30, 2024
- Axcelis Technologies, Inc.
- Atul Gupta
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Reduced charging by low negative voltage in FIB systems
- Patent number 11,887,810
- Issue date Jan 30, 2024
- Applied Materials Israel Ltd.
- Yehuda Zur
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Automated multi-grid handling apparatus
- Patent number 11,881,377
- Issue date Jan 23, 2024
- Richard Joseph Pickreign
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Build material handling unit for a powder module for an apparatus f...
- Patent number 11,878,463
- Issue date Jan 23, 2024
- CONCEPT LASER GMBH
- Dominik Eideloth
- B22 - CASTING POWDER METALLURGY
Information Patent Grant
System apparatus and method for enhancing electrical clamping of su...
- Patent number 11,875,967
- Issue date Jan 16, 2024
- Applied Materials, Inc.
- Qin Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron microscope sample holder fluid handling with independent p...
- Patent number 11,869,744
- Issue date Jan 9, 2024
- PROTOCHIPS, INC.
- Franklin Stampley Walden
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Embedding medium of biological sample for its imaging by light and/...
- Patent number 11,860,074
- Issue date Jan 2, 2024
- CRYOCAPCELL
- Xavier Heiligenstein
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
ROTATABLE TEM GRID HOLDER FOR IMPROVED FIB THINNING PROCESS
- Publication number 20240128046
- Publication date Apr 18, 2024
- SANDISK TECHNOLOGIES LLC
- Xiaochen Zhu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Sample Inspection Apparatus, Inspection System, Thin Piece Sample F...
- Publication number 20240128047
- Publication date Apr 18, 2024
- Hitachi High-Tech Corporation
- Masahiro YOSHIDA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Microscope and Stage
- Publication number 20240120169
- Publication date Apr 11, 2024
- Hitachi High-Tech Corporation
- Kazuki ISHIZAWA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE MICROSCOPE HAVING VACUUM IN SPECIMEN CHAMBER
- Publication number 20240112878
- Publication date Apr 4, 2024
- FEI Company
- Pleun Dona
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEM FOR REMOTELY CONTROLLING MICROSCOPIC MACHINERY AND METHOD TH...
- Publication number 20240114239
- Publication date Apr 4, 2024
- V5 TECHNOLOGIES CO., LTD.
- TZU-KUEI SHEN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Systems And Methods For Transferring A Sample
- Publication number 20240112879
- Publication date Apr 4, 2024
- FEI Company
- Maarten Bischoff
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SUBSTRATE ANALYSIS SYSTEM
- Publication number 20240112881
- Publication date Apr 4, 2024
- Samsung Electronics Co., Ltd.
- Jonghyeok PARK
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE HOLDER OF TRANSMISSION ELECTRON MICROSCOPE AND SEMICONDUCTOR...
- Publication number 20240105417
- Publication date Mar 28, 2024
- Samsung Electronics Co., Ltd.
- Yeoseon Choi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DISTORTION OPTIMIZED MULTI-BEAM SCANNING SYSTEM
- Publication number 20240096587
- Publication date Mar 21, 2024
- Carl Zeiss MultiSEM GmbH
- Dirk Zeidler
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM WRITING APPARATUS, CHARGED PARTICLE BEAM WRIT...
- Publication number 20240096590
- Publication date Mar 21, 2024
- NuFlare Technology, Inc.
- Yasutaka SATO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MANAGING BEAM POWER EFFECTS BY VARYING BASE EMISSIVITY
- Publication number 20240087839
- Publication date Mar 14, 2024
- Applied Materials, Inc.
- Dawei Sun
- G02 - OPTICS
Information Patent Application
Electron Microscope and Specimen Orientation Alignment Method
- Publication number 20240087840
- Publication date Mar 14, 2024
- JEOL Ltd.
- Motofumi Saitoh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SAMPLE PIECE RELOCATING DEVICE
- Publication number 20240087841
- Publication date Mar 14, 2024
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Tatsuya ASAHATA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEMS AND METHODS FOR THERMALLY CONDITIONING A WAFER IN A CHARGED...
- Publication number 20240079202
- Publication date Mar 7, 2024
- ASML NETHERLANDS B.V.
- Martijn Petrus, Christianus VAN HEUMEN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Sample Holder, Intermembrane Distance Adjustment Mechanism, and Cha...
- Publication number 20240079201
- Publication date Mar 7, 2024
- Hitachi High-Tech Corporation
- Michio HATANO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
AUTO-FOCUS SENSOR IMPLEMENTATION FOR MULTI-COLUMN MICROSCOPES
- Publication number 20240079203
- Publication date Mar 7, 2024
- KLA Corporation
- Nicholas Petrone
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION BEAM DEPOSITION APPARATUS AND ION BEAM DEPOSITION METHOD USING...
- Publication number 20240071712
- Publication date Feb 29, 2024
- Samsung Electronics Co., Ltd.
- SeungWan YOO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND SYSTEM FOR PREPARING A SPECIMEN
- Publication number 20240071720
- Publication date Feb 29, 2024
- FEI Company
- Jamie Dee Gravell
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Focused Ion Beam Apparatus
- Publication number 20240071718
- Publication date Feb 29, 2024
- JEOL Ltd.
- Yusuke Kagaya
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE ASSESSMENT SYSTEM AND METHOD
- Publication number 20240071716
- Publication date Feb 29, 2024
- ASML NETHERLANDS B.V.
- Marco Jan-Jaco WIELAND
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DUAL FOCUS SOLUTON FOR SEM METROLOGY TOOLS
- Publication number 20240071713
- Publication date Feb 29, 2024
- ASML NETHERLANDS B.V.
- Niels Johannes Maria BOSCH
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
BEAM DETECTOR, MULTI CHARGED PARTICLE BEAM IRRADIATION APPARATUS, A...
- Publication number 20240071714
- Publication date Feb 29, 2024
- NuFlare Technology, Inc.
- Yasutaka SATO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IN SITU BIASING AND FREEZING OF CYROGENIC ELECTRON MICROSCOPY SAMPLES
- Publication number 20240060864
- Publication date Feb 22, 2024
- ALLIANCE FOR SUSTAINABLE ENERGY, LLC
- Nikita Susan Dutta FITZCHARLES
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
MACHINE VISION-BASED AUTOMATIC FOCUSING AND AUTOMATIC CENTERING MET...
- Publication number 20240062988
- Publication date Feb 22, 2024
- East China University of Science and Technology
- Yabin YAN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Charged Particle Beam Device
- Publication number 20240055220
- Publication date Feb 15, 2024
- Hitachi High-Tech Corporation
- Yuka II
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CLAMPING MECHANISM
- Publication number 20240047172
- Publication date Feb 8, 2024
- FEI Company
- Nick VERWIMP
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
LIQUID CELL FOR ELECTRON MICROSCOPE AND MANUFACTURING METHOD THEREOF
- Publication number 20240038487
- Publication date Feb 1, 2024
- DAEGU GYEONGBUK INSTITUTE OF SCIENCE & TECHNOLOGY
- Jiwoong YANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE MICROSCOPY MEMS SAMPLE SUPPORT
- Publication number 20240038483
- Publication date Feb 1, 2024
- UNIVERSITEIT ANTWERPEN
- Adrian Pedrazo Tardajos
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
Fastening an object to a manipulator and/or to an object holder in...
- Publication number 20240038484
- Publication date Feb 1, 2024
- CARL ZEISS MICROSCOPY GMBH
- Andreas Schertel
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PLASMA PROCESSING APPARATUS
- Publication number 20240038505
- Publication date Feb 1, 2024
- Samsung Electronics Co., Ltd.
- Donghyeon Na
- H01 - BASIC ELECTRIC ELEMENTS

Means for supporting or positioning the objects or the material Means for adjusting diaphragms or lenses associated with the support

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Systems and methods for performing sample lift-out for highly react...

Grid coatings for capture of proteins and other compounds

Charged particle beam device

High resolution imaging apparatus and method

Plasma processing apparatus

Substrate treating apparatus, ion implantation apparatus, and ion i...

Replaceable module for a charged particle apparatus

Height measuring device and beam irradiation device

Manufacturing method of sample collection component

Transmission charged particle microscope with an electron energy lo...

Physical analysis method, sample for physical analysis and preparin...

Systems and methods for real time stereo imaging using multiple ele...

Semiconductor wafer

Charged particle beam device

Wafer supporting device

Support unit and substrate treating apparatus including the same

Wafer scanning apparatus and method for focused beam processing

Method and apparatus for an imaging system

Cryotransfer holder and workstation

Stage apparatus suitable for a particle beam apparatus

Automated application of drift correction to sample studied under e...

Ion milling device

Auto-tuning stage settling time with feedback in charged particle m...

Hybrid high-temperature electrostatic clamp for improved workpiece...

Reduced charging by low negative voltage in FIB systems

Automated multi-grid handling apparatus

Build material handling unit for a powder module for an apparatus f...

System apparatus and method for enhancing electrical clamping of su...

Electron microscope sample holder fluid handling with independent p...

Embedding medium of biological sample for its imaging by light and/...

Patents Applicationslast 30 patents

ROTATABLE TEM GRID HOLDER FOR IMPROVED FIB THINNING PROCESS

Sample Inspection Apparatus, Inspection System, Thin Piece Sample F...

Charged Particle Microscope and Stage

CHARGED PARTICLE MICROSCOPE HAVING VACUUM IN SPECIMEN CHAMBER

SYSTEM FOR REMOTELY CONTROLLING MICROSCOPIC MACHINERY AND METHOD TH...

Systems And Methods For Transferring A Sample

SUBSTRATE ANALYSIS SYSTEM

SAMPLE HOLDER OF TRANSMISSION ELECTRON MICROSCOPE AND SEMICONDUCTOR...

DISTORTION OPTIMIZED MULTI-BEAM SCANNING SYSTEM

CHARGED PARTICLE BEAM WRITING APPARATUS, CHARGED PARTICLE BEAM WRIT...

MANAGING BEAM POWER EFFECTS BY VARYING BASE EMISSIVITY

Electron Microscope and Specimen Orientation Alignment Method

SAMPLE PIECE RELOCATING DEVICE

SYSTEMS AND METHODS FOR THERMALLY CONDITIONING A WAFER IN A CHARGED...

Sample Holder, Intermembrane Distance Adjustment Mechanism, and Cha...

AUTO-FOCUS SENSOR IMPLEMENTATION FOR MULTI-COLUMN MICROSCOPES

ION BEAM DEPOSITION APPARATUS AND ION BEAM DEPOSITION METHOD USING...

METHOD AND SYSTEM FOR PREPARING A SPECIMEN

Focused Ion Beam Apparatus

CHARGED PARTICLE ASSESSMENT SYSTEM AND METHOD

DUAL FOCUS SOLUTON FOR SEM METROLOGY TOOLS

BEAM DETECTOR, MULTI CHARGED PARTICLE BEAM IRRADIATION APPARATUS, A...

IN SITU BIASING AND FREEZING OF CYROGENIC ELECTRON MICROSCOPY SAMPLES

MACHINE VISION-BASED AUTOMATIC FOCUSING AND AUTOMATIC CENTERING MET...

Charged Particle Beam Device

CLAMPING MECHANISM

LIQUID CELL FOR ELECTRON MICROSCOPE AND MANUFACTURING METHOD THEREOF

CHARGED PARTICLE MICROSCOPY MEMS SAMPLE SUPPORT

Fastening an object to a manipulator and/or to an object holder in...

PLASMA PROCESSING APPARATUS