Measurement of the fringe pattern

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GPHYSICS G01Measuring instruments G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT COLORIMETRY RADIATION PYROMETRY

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G01J2009/0234Measurement of the fringe pattern

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Patents Grantslast 30 patents

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Device and method for measuring wavelength for laser device
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Spectroscope, wavelength measuring device, and spectrum measuring m...
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- Osaka University
- Tsuyoshi Konishi
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Three-dimensional shape, displacement, and strain measurement devic...
- Patent number 10,655,954
- Issue date May 19, 2020
- National Institute of Advanced Industrial Science and Technology
- Qinghua Wang
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Collimation evaluation device and collimation evaluation method
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- Issue date Jun 4, 2019
- Hamamatsu Photonics K.K.
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Imprint apparatus, imprint method, detecting method, and method of...
- Patent number 10,303,050
- Issue date May 28, 2019
- Canon Kabushiki Kaisha
- Hiroshi Sato
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Imprint apparatus to detect a contact state between a mold and a su...
- Patent number 10,042,249
- Issue date Aug 7, 2018
- Canon Kabushiki Kaisha
- Hiroshi Sato
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
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Uses of electromagnetic interference patterns
- Patent number 9,618,369
- Issue date Apr 11, 2017
- The University Court of the University of Glasgow
- Jonathan Mark Ralph Weaver
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
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Surface shape measurement apparatus and method
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- Issue date Oct 23, 2012
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Optical communications using spectral interferometry
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- Issue date Sep 14, 2010
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Phase shift amount measurement apparatus and transmittance measurem...
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Laser system
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Phase shifting interferometry with multiple accumulation
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Scanning simultaneous phase-shifting interferometer
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Heterodyne array detector
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Method and apparatus for feedback control of tunable laser wavelength
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Optical pulse correlator having an interferometer array
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Optical image measuring apparatus for forming an image of an object...
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- Kinpui Chan
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Information Patent Grant
Direct phase shift measurement between interference patterns using...
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- International Business Machines Corporation
- Michael Straight Hibbs
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Parallel light ray measuring apparatus
- Patent number 5,170,221
- Issue date Dec 8, 1992
- Okuma Corp.
- Keiji Matsui
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Fringe pattern phase detection system
- Patent number 4,836,681
- Issue date Jun 6, 1989
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- John G. Van Saders
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Real-time diffraction interferometer
- Patent number 4,624,569
- Issue date Nov 25, 1986
- Lockheed Missiles & Space Company, Inc.
- Osuk Y. Kwon
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Phase-measuring interferometer
- Patent number 4,575,247
- Issue date Mar 11, 1986
- Rockwell International Corporation
- Richard J. Tansey
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Information Patent Grant
Method for measuring an optical length of light path and a laser in...
- Patent number 4,558,952
- Issue date Dec 17, 1985
- Vladimir P. Kulesh
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Patents Applicationslast 30 patents

Information Patent Application
DEVICE AND METHOD FOR MEASURING WAVELENGTH FOR LASER DEVICE
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- Beijing Rslaser Opto-Electronics Technology Co., Ltd.
- Guangyi LIU
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SPECTROSCOPE, WAVELENGTH MEASURING DEVICE, AND SPECTRUM MEASURING M...
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- OSAKA UNIVERSITY
- Tsuyoshi KONISHI
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THREE-DIMENSIONAL SHAPE, DISPLACEMENT, AND STRAIN MEASUREMENT DEVIC...
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- NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY
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IMPRINT APPARATUS, IMPRINT METHOD, DETECTING METHOD, AND METHOD OF...
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- Canon Kabushiki Kaisha
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- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
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COLLIMATION EVALUATION DEVICE AND COLLIMATION EVALUATION METHOD
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- Publication date Jul 13, 2017
- HAMAMATSU PHOTONICS K. K.
- Junji OKUMA
- G01 - MEASURING TESTING
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Uses of Electromagnetic Interference Patterns
- Publication number 20110157599
- Publication date Jun 30, 2011
- THE UNIVERSITY COURT OF THE UNIVERSITY OF GLASGOW
- Jonathan Mark Ralph Weaver
- G01 - MEASURING TESTING
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SURFACE SHAPE MEASUREMENT APPARATUS AND METHOD
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- Publication date Dec 9, 2010
- Hirotoshi Oikaze
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EVALUATION METHOD, EVALUATION APPARATUS, AND EXPOSURE APPARATUS
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Optical Communications Using Spectral Interferometry
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LASER SYSTEM
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Phase shift amount measurement apparatus and transmittance measurem...
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SCANNING SIMULTANEOUS PHASE-SHIFTING INTERFEROMETER
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Phase Shifting Interferometry With Multiple Accumulation
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- Publication date Sep 6, 2007
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Optical readhead
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- Publication date Aug 2, 2007
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Heterodyne array detector
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- Publication date Feb 1, 2007
- The Boeing Company
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Method and apparatus for feedback control of tunable laser wavelength
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- Publication date Jan 12, 2006
- James J. Snyder
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Optical image measuring apparatus
- Publication number 20050206906
- Publication date Sep 22, 2005
- KABUSHIKI KAISHA TOPCON
- Kinpui Chan
- G01 - MEASURING TESTING

Measurement of the fringe pattern

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Device and method for measuring wavelength for laser device

Spectroscope, wavelength measuring device, and spectrum measuring m...

Three-dimensional shape, displacement, and strain measurement devic...

Collimation evaluation device and collimation evaluation method

Imprint apparatus, imprint method, detecting method, and method of...

Imprint apparatus to detect a contact state between a mold and a su...

Uses of electromagnetic interference patterns

Surface shape measurement apparatus and method

Optical communications using spectral interferometry

Phase shift amount measurement apparatus and transmittance measurem...

Laser system

Phase shifting interferometry with multiple accumulation

Scanning simultaneous phase-shifting interferometer

Heterodyne array detector

Method and apparatus for feedback control of tunable laser wavelength

Optical pulse correlator having an interferometer array

Optical image measuring apparatus for forming an image of an object...

Direct phase shift measurement between interference patterns using...

Parallel light ray measuring apparatus

Fringe pattern phase detection system

Real-time diffraction interferometer

Phase-measuring interferometer

Method for measuring an optical length of light path and a laser in...

Patents Applicationslast 30 patents

DEVICE AND METHOD FOR MEASURING WAVELENGTH FOR LASER DEVICE

SPECTROSCOPE, WAVELENGTH MEASURING DEVICE, AND SPECTRUM MEASURING M...

THREE-DIMENSIONAL SHAPE, DISPLACEMENT, AND STRAIN MEASUREMENT DEVIC...

IMPRINT APPARATUS, IMPRINT METHOD, DETECTING METHOD, AND METHOD OF...

COLLIMATION EVALUATION DEVICE AND COLLIMATION EVALUATION METHOD

Uses of Electromagnetic Interference Patterns

SURFACE SHAPE MEASUREMENT APPARATUS AND METHOD

EVALUATION METHOD, EVALUATION APPARATUS, AND EXPOSURE APPARATUS

Optical Communications Using Spectral Interferometry

LASER SYSTEM

Phase shift amount measurement apparatus and transmittance measurem...

SCANNING SIMULTANEOUS PHASE-SHIFTING INTERFEROMETER

Phase Shifting Interferometry With Multiple Accumulation

Optical readhead

Heterodyne array detector

Method and apparatus for feedback control of tunable laser wavelength

Optical image measuring apparatus