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SEMICONDUCTOR DEVICES ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
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Testing or measuring during manufacture or treatment; Reliability measurements
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Measuring as part of the manufacturing process
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Patents Grants
last 30 patents
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Patent Grant
Adaptive modeling misregistration measurement system and method
Patent number
12,165,930
Issue date
Dec 10, 2024
KLA Corporation
Amnon Manassen
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Semiconductor apparatus and manufacturing method of semiconductor a...
Patent number
12,119,227
Issue date
Oct 15, 2024
Fuji Electric Co., Ltd.
Kosuke Yoshida
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Detection method of metal impurity in wafer
Patent number
12,107,016
Issue date
Oct 1, 2024
ZING SEMICONDUCTOR CORPORATION
Lanlin Wen
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Control of liquid delivery in auto-refill systems
Patent number
12,084,771
Issue date
Sep 10, 2024
Applied Materials, Inc.
Zohreh Razavi Hesabi
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information
Patent Grant
System and method for annealing die and wafer
Patent number
12,051,603
Issue date
Jul 30, 2024
Taiwan Semiconductor Manufacturing Company, Ltd
Hsin-Hao Yeh
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method of manufacturing semiconductor device and non-transitory com...
Patent number
12,014,943
Issue date
Jun 18, 2024
Kokusai Electric Corporation
Akinori Tanaka
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Methods for processing a semiconductor substrate
Patent number
11,972,935
Issue date
Apr 30, 2024
Taiwan Semiconductor Manufacturing Co., Ltd
Yu-Hsiang Cheng
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information
Patent Grant
Damage prevention during wafer edge trimming
Patent number
11,951,569
Issue date
Apr 9, 2024
Taiwan Semiconductor Manufacturing Company, Ltd
Kuo-Ming Wu
B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
System for non radial temperature control for rotating substrates
Patent number
11,942,381
Issue date
Mar 26, 2024
Applied Materials, Inc.
Wolfgang R. Aderhold
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Emissive element harvest
Patent number
11,929,356
Issue date
Mar 12, 2024
eLux, Inc.
Kenji Sasaki
H01 - BASIC ELECTRIC ELEMENTS
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Patent Grant
Manufacturing method of semiconductor device and semiconductor proc...
Patent number
11,899,368
Issue date
Feb 13, 2024
Taiwan Semiconductor Manufacturing Company, Ltd
Yu-Kai Chen
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
System, apparatus, and method for spectral filtering
Patent number
11,885,682
Issue date
Jan 30, 2024
Verity Instruments, Inc.
Chris D. Pylant
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Test circuit and test method
Patent number
11,876,021
Issue date
Jan 16, 2024
Kabushiki Kaisha Toshiba
Daiki Kiribuchi
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
System for the characterization of emissive elements
Patent number
11,855,051
Issue date
Dec 26, 2023
eLux, Inc.
Kenji Sasaki
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Semiconductor processing apparatus and method utilizing electrostat...
Patent number
11,854,860
Issue date
Dec 26, 2023
Taiwan Semiconductor Manufacturing Co., Ltd
Tsai-Hao Hung
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Robot arm device and method for transferring wafer
Patent number
11,837,484
Issue date
Dec 5, 2023
Taiwan Semiconductor Manufacturing Co., Ltd
Wei-Hua Houng
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method of manufacturing and packaging silicon photonics integrated...
Patent number
11,837,509
Issue date
Dec 5, 2023
MARVELL ASIA PTE. LTD.
Hsu-Feng Chou
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method for analyzing silicon substrate
Patent number
11,837,510
Issue date
Dec 5, 2023
Kioxia Corporation
Jiahong Wu
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Process management method and apparatus
Patent number
11,823,926
Issue date
Nov 21, 2023
SAMSUNG SDS CO., LTD.
Ji Hoon Kang
G05 - CONTROLLING REGULATING
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Patent Grant
Apparatus for inspecting light emitting elements, method of inspect...
Patent number
11,810,829
Issue date
Nov 7, 2023
Samsung Display Co., Ltd.
Seung Cheol Ko
H01 - BASIC ELECTRIC ELEMENTS
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Patent Grant
Method, electronic apparatus, and system for defect detection
Patent number
11,778,911
Issue date
Oct 3, 2023
OHIO STATE INNOVATION FOUNDATION
Shailesh N. Joshi
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Integrated circuit filler and method thereof
Patent number
11,776,948
Issue date
Oct 3, 2023
Taiwan Semiconductor Manufacturing Co., Ltd
Tseng Chin Lo
G06 - COMPUTING CALCULATING COUNTING
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Patent Grant
Methods and apparatus for vacuum processing a substrate
Patent number
11,756,925
Issue date
Sep 12, 2023
Applied Materials, Inc.
Ying Wang
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Substrate processing method and substrate processing system
Patent number
11,742,228
Issue date
Aug 29, 2023
Tokyo Electron Limited
Risako Matsuda
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
System for detecting LED
Patent number
11,739,890
Issue date
Aug 29, 2023
CHONGQING KONKA PHOTOELECTRIC TECHNOLOGY RESEARCH INSTITUTE CO., LTD.
Shiyuan Xu
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Substrate processing apparatus and substrate processing method
Patent number
11,735,457
Issue date
Aug 22, 2023
Ebara Corporation
Nobuyuki Takada
B24 - GRINDING POLISHING
Information
Patent Grant
Process monitor device having a plurality of sensors arranged in co...
Patent number
11,735,486
Issue date
Aug 22, 2023
Applied Materials, Inc.
Leonard Tedeschi
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Acoustic measurement of fabrication equipment clearance
Patent number
11,709,153
Issue date
Jul 25, 2023
Taiwan Semiconductor Manufacturing Company, Ltd
Jun-Hao Deng
B08 - CLEANING
Information
Patent Grant
Structures for aligning a semiconductor wafer for singulation
Patent number
11,676,863
Issue date
Jun 13, 2023
SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
Michael J. Seddon
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method to manufacture semiconductor device
Patent number
11,652,011
Issue date
May 16, 2023
AP Memory Technology Corp.
Wen Liang Chen
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
SYSTEM AND METHOD FOR DETECTING SEMICONDUCTOR PROCESSING ERROR
Publication number
20240421005
Publication date
Dec 19, 2024
Taiwan Semiconductor Manufacturing Company Limited
Chen TSENG
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
APPARATUS AND METHODS FOR DETERMINING FLUID DYNAMICS OF LIQUID FILM...
Publication number
20240387212
Publication date
Nov 21, 2024
Taiwan Semiconductor Manufacturing Company, Ltd.
Chung-Pin CHOU
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Acoustic Measurement of Fabrication Equipment Clearance
Publication number
20240377364
Publication date
Nov 14, 2024
Taiwan Semiconductor Manufacturing Company, Ltd.
Jun-Hao Deng
B08 - CLEANING
Information
Patent Application
SEMICONDUCTOR DEVICE PACKAGE AND METHOD OF MANUFACTURING THE SAME
Publication number
20240379636
Publication date
Nov 14, 2024
nD-HI Technologies Lab, Inc.
HO-MING TONG
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHOD FOR FORMING A SEMICONDUCTOR STRUCTURE USING DEHYDRATING CHEM...
Publication number
20240379447
Publication date
Nov 14, 2024
Taiwan Semiconductor Manufacturing company Ltd.
CHUNG-CHIEH LEE
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
CONTROL OF LIQUID DELIVERY IN AUTO-REFILL SYSTEMS
Publication number
20240360561
Publication date
Oct 31, 2024
Applied Materials, Inc.
Zohreh Razavi Hesabi
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information
Patent Application
METHOD FOR USING A SYSTEM FOR ANNEALING A WAFER AND SYSTEM FOR ANNE...
Publication number
20240347355
Publication date
Oct 17, 2024
Taiwan Semiconductor Manufacturing Company, Ltd.
Hsin-Hao YEH
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHODS AND APPARATUS FOR CHARACTERIZING A SEMICONDUCTOR MANUFACTUR...
Publication number
20240231233
Publication date
Jul 11, 2024
ASML NETHERLANDS B.V.
Niek Willem KLEIN KOERKAMP
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHODS FOR PROCESSING A SEMICONDUCTOR SUBSTRATE
Publication number
20240222097
Publication date
Jul 4, 2024
Taiwan Semiconductor Manufacturing Company, Ltd.
Yu-Hsiang CHENG
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information
Patent Application
DAMAGE PREVENTION DURING WAFER EDGE TRIMMING
Publication number
20240198455
Publication date
Jun 20, 2024
Taiwan Semiconductor Manufacturing Company, Ltd.
Kuo-Ming Wu
B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information
Patent Application
PROBE HEAD AND METHOD OF PRODUCING TESTED SEMICONDUCTOR DIE AND VER...
Publication number
20240175900
Publication date
May 30, 2024
MPI Corporation
CHIN-YI LIN
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHODS AND APPARATUS FOR CHARACTERIZING A SEMICONDUCTOR MANUFACTUR...
Publication number
20240134283
Publication date
Apr 25, 2024
ASML NETHERLANDS B.V.
Niek Willem KLEIN KOERKAMP
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
VERTICAL SEMICONDUCTOR COMPONENT ON THE BASIS OF GALLIUM NITRIDE W...
Publication number
20240128133
Publication date
Apr 18, 2024
ROBERT BOSCH GmbH
Jens Baringhaus
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
PHOTORESIST CHARACTERISTICS ANALYSIS METHOD AND CHARACTERISTICS ANA...
Publication number
20240102927
Publication date
Mar 28, 2024
FEMTO Deployments Inc.
Akira WATANABE
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SEMICONDUCTOR PROCESSING APPARATUS AND METHOD UTILIZING ELECTROSTAT...
Publication number
20240087945
Publication date
Mar 14, 2024
Taiwan Semiconductor Manufacturing Co., Ltd.
Tsai-Hao HUNG
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
IC FABRICATION FLOW WITH CONTINUOUS DYNAMIC SAMPLING FOR AUTO-VISUA...
Publication number
20240071837
Publication date
Feb 29, 2024
TEXAS INSTRUMENTS INCORPORATED
Bin Liu
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
USING SEQUENCE MINING TO PREDICT QUALITY AND YIELD
Publication number
20240047279
Publication date
Feb 8, 2024
International Business Machines Corporation
Robert Jeffrey Baseman
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
CAPACITIVE SENSOR SYSTEM FOR PRECURSOR LEVEL MEASUREMENT AND METHOD...
Publication number
20240035872
Publication date
Feb 1, 2024
ASM IP HOLDING, B.V.
Vincent Vandalon
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
MODEL-BASED PARAMETER ADJUSTMENTS FOR DEPOSITION PROCESSES
Publication number
20230411222
Publication date
Dec 21, 2023
Applied Materials, Inc.
Sam K. Lee
C25 - ELECTROLYTIC OR ELECTROPHORETIC PROCESSES APPARATUS THEREFOR
Information
Patent Application
SYSTEM FOR NON RADIAL TEMPERATURE CONTROL FOR ROTATING SUBSTRATES
Publication number
20230402331
Publication date
Dec 14, 2023
Applied Materials, Inc.
Wolfgang R. ADERHOLD
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SEMICONDUCTOR PACKAGES AND METHODS FOR FORMING THE SAME
Publication number
20230378099
Publication date
Nov 23, 2023
Taiwan Semiconductor Manufacturing Company, Ltd.
Shau-Lin SHUE
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Acoustic Measurement of Fabrication Equipment Clearance
Publication number
20230366857
Publication date
Nov 16, 2023
Taiwan Semiconductor Manufacturing Company, Ltd.
Jun-Hao Deng
B08 - CLEANING
Information
Patent Application
INTEGRATED CIRCUIT FILLER AND METHOD THEREOF
Publication number
20230369309
Publication date
Nov 16, 2023
Taiwan Semiconductor Manufacturing Co., Ltd.
Tseng Chin LO
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
WAFER TREATMENT METHOD
Publication number
20230317527
Publication date
Oct 5, 2023
NISSAN CHEMICAL CORPORATION
Tomoya OHASHI
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
OPERATION METHOD OF ETCHING APPARATUS AND METHOD OF MANUFACTURING S...
Publication number
20230307217
Publication date
Sep 28, 2023
Samsung Electronics Co., Ltd.
Dooyoung Gwak
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
DEVICE FOR SUPPLYING A SOLUTION, APPARATUS FOR PROCESSING A SUBSTRA...
Publication number
20230207336
Publication date
Jun 29, 2023
SEMES CO., LTD.
Chulnam KIM
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METROLOGY DEVICE, SYSTEM AND METHOD
Publication number
20230209661
Publication date
Jun 29, 2023
Matthias Imboden
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SYSTEM, APPARATUS, AND METHOD FOR SPECTRAL FILTERING
Publication number
20230194342
Publication date
Jun 22, 2023
Verity Instruments, Inc.
Chris D. Pylant
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SYSTEM AND METHOD FOR MONITORING CHEMICAL MECHANICAL POLISHING
Publication number
20230182257
Publication date
Jun 15, 2023
Taiwan Semiconductor Manufacturing Company, Ltd.
Chih-Yu WANG
B24 - GRINDING POLISHING
Information
Patent Application
SCANNING RADICAL SENSOR USABLE FOR MODEL TRAINING
Publication number
20230178346
Publication date
Jun 8, 2023
Applied Materials, Inc.
Stephen Moffatt
G06 - COMPUTING CALCULATING COUNTING