Measuring characteristics of individual pulses

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CPC
G01R29/02

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GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R29/00Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00

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G01R29/02Measuring characteristics of individual pulses

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Event-driven transmission method and device
- Patent number 12,283,166
- Issue date Apr 22, 2025
- Stichting IMEC Nederland
- Yao-Hong Liu
- G08 - SIGNALLING
Information Patent Grant
Spatter detection method
- Patent number 12,214,438
- Issue date Feb 4, 2025
- Honda Motor Co., Ltd.
- Hiroki Toyoda
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Clock duty cycle measurement
- Patent number 12,184,286
- Issue date Dec 31, 2024
- Cadence Design Systems, Inc.
- Prakash Kumar Lenka
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Apparatus, method, system and medium for measuring pulse signal width
- Patent number 12,174,232
- Issue date Dec 24, 2024
- Lemon Inc.
- Junmou Zhang
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Pulse edge detection circuit
- Patent number 12,135,345
- Issue date Nov 5, 2024
- Denso Corporation
- Takasuke Ito
- G01 - MEASURING TESTING
Information Patent Grant
Broadband lossless partial discharge detection and noise removal de...
- Patent number 12,130,316
- Issue date Oct 29, 2024
- ECOTOMORROW KOREA CO., LTD.
- Kwang Sik Choi
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for analysing currents in an electrical load, and load ha...
- Patent number 12,099,079
- Issue date Sep 24, 2024
- Elmos Semiconductor SE
- Jörg Krupar
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Jitter noise detector
- Patent number 12,072,365
- Issue date Aug 27, 2024
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Tien-Chien Huang
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Systems and methods for duty cycle measurement
- Patent number 12,066,476
- Issue date Aug 20, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd
- Tsung-Hsien Tsai
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
System and method for multi-rate concurrent waveform capture and st...
- Patent number 12,061,218
- Issue date Aug 13, 2024
- EI Electronics LLC
- Joseph Spanier
- G01 - MEASURING TESTING
Information Patent Grant
Pulse-width modulation signal observation circuit and hardware-in-t...
- Patent number 12,039,232
- Issue date Jul 16, 2024
- Industrial Technology Research Institute
- Chun-An Lin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Extended pulse sampling system and method
- Patent number 11,994,547
- Issue date May 28, 2024
- Photonic Systems, Inc.
- Charles H. Cox
- G01 - MEASURING TESTING
Information Patent Grant
RF vector measurement system with one or more entangled quantum sen...
- Patent number 11,982,697
- Issue date May 14, 2024
- Rohde & Schwarz GmbH & Co. KG
- Julius Seeger
- G01 - MEASURING TESTING
Information Patent Grant
Joint denoising and delay estimation for the extraction of pulse-wi...
- Patent number 11,982,698
- Issue date May 14, 2024
- BAE Systems Information and Electronic Systems Integration Inc.
- Masoud Farshchian
- G01 - MEASURING TESTING
Information Patent Grant
Clock anomaly detection
- Patent number 11,962,306
- Issue date Apr 16, 2024
- NVIDIA Corporation
- Kedar Rajpathak
- G01 - MEASURING TESTING
Information Patent Grant
Method and device for sampling a pulse signal, and computer program...
- Patent number 11,944,470
- Issue date Apr 2, 2024
- RAYCAN TECHNOLOGY CO., LTD (SUZHOU)
- Kezhang Zhu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Testing circuit, testing device and testing method thereof
- Patent number 11,948,650
- Issue date Apr 2, 2024
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Liang Zhang
- G11 - INFORMATION STORAGE
Information Patent Grant
Signal processing device as well as method of applying a zone trigger
- Patent number 11,933,819
- Issue date Mar 19, 2024
- Rohde & Schwarz GmbH & Co. KG
- Markus Breunig
- G01 - MEASURING TESTING
Information Patent Grant
Input voltage ripple compensation of interleaved boost converter us...
- Patent number 11,870,349
- Issue date Jan 9, 2024
- NXP USA, INC.
- Wilhelmus Hinderikus Maria Langeslag
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Circuit and method for width measurement of digital pulse signals
- Patent number 11,852,666
- Issue date Dec 26, 2023
- HUNAN GREAT-LEO MICROELECTRONICS CO., LTD.
- Hu Chen
- G01 - MEASURING TESTING
Information Patent Grant
Jitter noise detector
- Patent number 11,808,798
- Issue date Nov 7, 2023
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Tien-Chien Huang
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Baseline pulse value calculation method and hematology analyzer par...
- Patent number 11,754,489
- Issue date Sep 12, 2023
- LEADWAY (HK) LIMITED
- Haibing Guan
- G01 - MEASURING TESTING
Information Patent Grant
Wireless threat detection device, system, and methods to detect sig...
- Patent number 11,743,277
- Issue date Aug 29, 2023
- Skycope Technologies, Inc.
- Naga Raghavendra Surya Vara Prasad Koppisetti
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Device of measuring duty cycle and compensation circuit utilizing t...
- Patent number 11,703,532
- Issue date Jul 18, 2023
- Richwave Technology Corp.
- Po-Wei Wu
- G01 - MEASURING TESTING
Information Patent Grant
Method and device for measuring a pulse signal with high dynamic range
- Patent number 11,692,879
- Issue date Jul 4, 2023
- The Secretary of State for Defence
- David Lanto Hillier
- G01 - MEASURING TESTING
Information Patent Grant
Single-shunt current measurement
- Patent number 11,658,597
- Issue date May 23, 2023
- ALLEGRO MICROSYSTEMS, LLC
- Anton Babushkin
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Demodulation phase calibration using external input
- Patent number 11,650,078
- Issue date May 16, 2023
- Invensense, Inc.
- Doruk Senkal
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
System and method for selecting a clock
- Patent number 11,644,504
- Issue date May 9, 2023
- STMicroelectronics S.r.l.
- Mirko Dondini
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Duty timing detector for detecting duty timing of toggle signal, de...
- Patent number 11,598,797
- Issue date Mar 7, 2023
- Samsung Electronics Co., Ltd.
- Hyun Seok Nam
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Apparatus for monitoring pulsed high-frequency power and substrate...
- Patent number 11,545,340
- Issue date Jan 3, 2023
- Semes Co., Ltd.
- Jong Hwan An
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
HIGH-PRECISION PULSE WIDTH MEASUREMENT CIRCUIT AND MEASUREMENT METHOD
- Publication number 20250172596
- Publication date May 29, 2025
- HUNAN GREAT-LEO MICROELECTRONICS CO., LTD.
- Hu CHEN
- G01 - MEASURING TESTING
Information Patent Application
Method for Acquiring Pulse Width Modulation Signal, Computer Device...
- Publication number 20250147087
- Publication date May 8, 2025
- Beijing CHJ Information Technology Co., Ltd.
- Hongshan Shao
- G01 - MEASURING TESTING
Information Patent Application
SPATTER DETECTION METHOD
- Publication number 20250135572
- Publication date May 1, 2025
- Honda Motor Co., Ltd.
- Hiroki TOYODA
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
SYSTEMS AND METHODS FOR DUTY CYCLE CHARACTERIZATION
- Publication number 20250123313
- Publication date Apr 17, 2025
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Chung-Ting LU
- G01 - MEASURING TESTING
Information Patent Application
HIGH VOLTAGE/FREQUENCY TAMPER DETECTION CIRCUIT IN UTILITY METERS
- Publication number 20240369606
- Publication date Nov 7, 2024
- Honeywell International Inc.
- Nikhil Pokkandath SWAMINADHAN
- G01 - MEASURING TESTING
Information Patent Application
Systems and Methods for Duty Cycle Measurement
- Publication number 20240361371
- Publication date Oct 31, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Tsung-Hsien Tsai
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
METHOD FOR PREDICTIVE MAINTENANCE OF EQUIPMENT BY USING ANGLES TO PEAK
- Publication number 20240353457
- Publication date Oct 24, 2024
- ITS CO., LTD.
- Young Kyu LEE
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR MULTI-RATE CONCURRENT WAVEFORM CAPTURE AND ST...
- Publication number 20240329102
- Publication date Oct 3, 2024
- EI Electronics LLC, d/b/a Electro Industries/Gauge Tech
- Joseph Spanier
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
VOLTAGE AND CURRENT-SENSING-LESS SHORT-CIRCUIT PROTECTION AND LOCAL...
- Publication number 20240288508
- Publication date Aug 29, 2024
- The Florida State University Research Foundation, Inc.
- Hui Li
- G01 - MEASURING TESTING
Information Patent Application
DARK TEST METHOD AND ABNORMALITY DIAGNOSIS APPARATUS
- Publication number 20240210455
- Publication date Jun 27, 2024
- OKUMA CORPORATION
- Yoshimasa EGI
- G01 - MEASURING TESTING
Information Patent Application
TIMER-BASED AMPLITUDE CORRECTION METHOD FOR PHOTON COUNTING COMPUTE...
- Publication number 20240188918
- Publication date Jun 13, 2024
- Analog Devices, Inc.
- Sunrita PODDAR
- G01 - MEASURING TESTING
Information Patent Application
FAULT DETECTION CIRCUIT
- Publication number 20240151760
- Publication date May 9, 2024
- Toyota Jidosha Kabushiki Kaisha
- Hiroyuki IYAMA
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR TESTING SWITCH SIGNALS OF AN INVERTER OF AN ELECTRIC MAC...
- Publication number 20240142505
- Publication date May 2, 2024
- SCHAEFFLER TECHNOLOGIES AG & CO. KG
- Huan Fu
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
EXTENDED PULSE SAMPLING SYSTEM AND METHOD
- Publication number 20240053393
- Publication date Feb 15, 2024
- Photonic Systems, Inc.
- Charles H. Cox
- G01 - MEASURING TESTING
Information Patent Application
NOVEL JITTER NOISE DETECTOR
- Publication number 20230400494
- Publication date Dec 14, 2023
- Taiwan Semiconductor Manufacturing Co., LTD
- Tien-Chien HUANG
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
BROADBAND LOSSLESS PARTIAL DISCHARGE DETECTION AND NOISE REMOVAL DE...
- Publication number 20230314496
- Publication date Oct 5, 2023
- ECOTOMORROW KOREA CO., LTD.
- Kwang Sik CHOI
- G01 - MEASURING TESTING
Information Patent Application
SPATTER DETECTION METHOD
- Publication number 20230311234
- Publication date Oct 5, 2023
- Honda Motor Co., Ltd.
- Hiroki TOYODA
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
Device of Measuring Duty Cycle and Compensation Circuit Utilizing t...
- Publication number 20230296655
- Publication date Sep 21, 2023
- RICHWAVE TECHNOLOGY CORP.
- Po-Wei Wu
- G01 - MEASURING TESTING
Information Patent Application
RF VECTOR MEASUREMENT SYSTEM WITH ONE OR MORE ENTANGLED QUANTUM SEN...
- Publication number 20230204645
- Publication date Jun 29, 2023
- ROHDE & SCHWARZ GMBH & CO. KG
- Julius SEEGER
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ELECTRICAL PARAMETER MONITORING
- Publication number 20230121793
- Publication date Apr 20, 2023
- Elspec Engineering Ltd.
- Yoram HARARY
- G01 - MEASURING TESTING
Information Patent Application
INPUT VOLTAGE RIPPLE COMPENSATION OF INTERLEAVED BOOST CONVERTER US...
- Publication number 20230069460
- Publication date Mar 2, 2023
- NXP USA, Inc.
- Wilhelmus Hinderikus Maria Langeslag
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
Device of Measuring Duty Cycle and Compensation Circuit Utilizing t...
- Publication number 20230060339
- Publication date Mar 2, 2023
- RICHWAVE TECHNOLOGY CORP.
- Po-Wei Wu
- G01 - MEASURING TESTING
Information Patent Application
NOVEL JITTER NOISE DETECTOR
- Publication number 20230040034
- Publication date Feb 9, 2023
- Taiwan Semiconductor Manufacturing Co., LTD
- Tien-Chien HUANG
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
LIDAR SYSTEM WITH PULSE-ENERGY MEASUREMENT
- Publication number 20230028608
- Publication date Jan 26, 2023
- LUMINAR, LLC
- Lawrence Shah
- G01 - MEASURING TESTING
Information Patent Application
PULSE EDGE DETECTION CIRCUIT
- Publication number 20230003780
- Publication date Jan 5, 2023
- DENSO CORPORATION
- TAKASUKE ITO
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS, METHOD, SYSTEM AND MEDIUM FOR MEASURING PULSE SIGNAL WIDTH
- Publication number 20230003781
- Publication date Jan 5, 2023
- Lemon Inc.
- Junmou ZHANG
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
DUTY TIMING DETECTOR FOR DETECTING DUTY TIMING OF TOGGLE SIGNAL, DE...
- Publication number 20220404410
- Publication date Dec 22, 2022
- Samsung Electronics Co., Ltd.
- Hyun Seok Nam
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
METHOD FOR ANALYZING FLOW REGIME ALTERATIONS FROM RESERVOIR INFLOW...
- Publication number 20220398514
- Publication date Dec 15, 2022
- SUN YAT-SEN UNIVERSITY
- Tongtiegang ZHAO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
FILTERING MEASUREMENT DATA OF AN ACTIVE OPTICAL SENSOR SYSTEM
- Publication number 20220373660
- Publication date Nov 24, 2022
- VALEO Schalter und Sensoren GmbH
- Sergio Fernandez
- G01 - MEASURING TESTING
Information Patent Application
DEMODULATION PHASE CALIBRATION USING EXTERNAL INPUT
- Publication number 20220326045
- Publication date Oct 13, 2022
- InvenSense, Inc.
- Doruk Senkal
- B81 - MICRO-STRUCTURAL TECHNOLOGY

Measuring characteristics of individual pulses

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Event-driven transmission method and device

Spatter detection method

Clock duty cycle measurement

Apparatus, method, system and medium for measuring pulse signal width

Pulse edge detection circuit

Broadband lossless partial discharge detection and noise removal de...

Apparatus for analysing currents in an electrical load, and load ha...

Jitter noise detector

Systems and methods for duty cycle measurement

System and method for multi-rate concurrent waveform capture and st...

Pulse-width modulation signal observation circuit and hardware-in-t...

Extended pulse sampling system and method

RF vector measurement system with one or more entangled quantum sen...

Joint denoising and delay estimation for the extraction of pulse-wi...

Clock anomaly detection

Method and device for sampling a pulse signal, and computer program...

Testing circuit, testing device and testing method thereof

Signal processing device as well as method of applying a zone trigger

Input voltage ripple compensation of interleaved boost converter us...

Circuit and method for width measurement of digital pulse signals

Jitter noise detector

Baseline pulse value calculation method and hematology analyzer par...

Wireless threat detection device, system, and methods to detect sig...

Device of measuring duty cycle and compensation circuit utilizing t...

Method and device for measuring a pulse signal with high dynamic range

Single-shunt current measurement

Demodulation phase calibration using external input

System and method for selecting a clock

Duty timing detector for detecting duty timing of toggle signal, de...

Apparatus for monitoring pulsed high-frequency power and substrate...

Patents Applicationslast 30 patents

HIGH-PRECISION PULSE WIDTH MEASUREMENT CIRCUIT AND MEASUREMENT METHOD

Method for Acquiring Pulse Width Modulation Signal, Computer Device...

SPATTER DETECTION METHOD

SYSTEMS AND METHODS FOR DUTY CYCLE CHARACTERIZATION

HIGH VOLTAGE/FREQUENCY TAMPER DETECTION CIRCUIT IN UTILITY METERS

Systems and Methods for Duty Cycle Measurement

METHOD FOR PREDICTIVE MAINTENANCE OF EQUIPMENT BY USING ANGLES TO PEAK

SYSTEM AND METHOD FOR MULTI-RATE CONCURRENT WAVEFORM CAPTURE AND ST...

VOLTAGE AND CURRENT-SENSING-LESS SHORT-CIRCUIT PROTECTION AND LOCAL...

DARK TEST METHOD AND ABNORMALITY DIAGNOSIS APPARATUS

TIMER-BASED AMPLITUDE CORRECTION METHOD FOR PHOTON COUNTING COMPUTE...

FAULT DETECTION CIRCUIT

METHOD FOR TESTING SWITCH SIGNALS OF AN INVERTER OF AN ELECTRIC MAC...

EXTENDED PULSE SAMPLING SYSTEM AND METHOD

NOVEL JITTER NOISE DETECTOR

BROADBAND LOSSLESS PARTIAL DISCHARGE DETECTION AND NOISE REMOVAL DE...

SPATTER DETECTION METHOD

Device of Measuring Duty Cycle and Compensation Circuit Utilizing t...

RF VECTOR MEASUREMENT SYSTEM WITH ONE OR MORE ENTANGLED QUANTUM SEN...

ELECTRICAL PARAMETER MONITORING

INPUT VOLTAGE RIPPLE COMPENSATION OF INTERLEAVED BOOST CONVERTER US...

Device of Measuring Duty Cycle and Compensation Circuit Utilizing t...

NOVEL JITTER NOISE DETECTOR

LIDAR SYSTEM WITH PULSE-ENERGY MEASUREMENT

PULSE EDGE DETECTION CIRCUIT

APPARATUS, METHOD, SYSTEM AND MEDIUM FOR MEASURING PULSE SIGNAL WIDTH

DUTY TIMING DETECTOR FOR DETECTING DUTY TIMING OF TOGGLE SIGNAL, DE...

METHOD FOR ANALYZING FLOW REGIME ALTERATIONS FROM RESERVOIR INFLOW...

FILTERING MEASUREMENT DATA OF AN ACTIVE OPTICAL SENSOR SYSTEM

DEMODULATION PHASE CALIBRATION USING EXTERNAL INPUT