Measuring characteristics of individual pulses

Industry

CPC
G01R29/02

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Parent Industries

GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R29/00Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00

Current Industry

G01R29/02Measuring characteristics of individual pulses

Industries

Patents Grantslast 30 patents

Information Patent Grant
RF vector measurement system with one or more entangled quantum sen...
- Patent number 11,982,697
- Issue date May 14, 2024
- Rohde & Schwarz GmbH & Co. KG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Joint denoising and delay estimation for the extraction of pulse-wi...
- Patent number 11,982,698
- Issue date May 14, 2024
- BAE Systems Information and Electronic Systems Integration Inc.
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Clock anomaly detection
- Patent number 11,962,306
- Issue date Apr 16, 2024
- NVIDIA Corporation
- Kedar Rajpathak
- G01 - MEASURING TESTING
Information Patent Grant
Method and device for sampling a pulse signal, and computer program...
- Patent number 11,944,470
- Issue date Apr 2, 2024
- RAYCAN TECHNOLOGY CO., LTD (SUZHOU)
- Kezhang Zhu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Testing circuit, testing device and testing method thereof
- Patent number 11,948,650
- Issue date Apr 2, 2024
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Liang Zhang
- G11 - INFORMATION STORAGE
Information Patent Grant
Signal processing device as well as method of applying a zone trigger
- Patent number 11,933,819
- Issue date Mar 19, 2024
- Rohde & Schwarz GmbH & Co. KG
- Markus Breunig
- G01 - MEASURING TESTING
Information Patent Grant
Input voltage ripple compensation of interleaved boost converter us...
- Patent number 11,870,349
- Issue date Jan 9, 2024
- NXP USA, INC.
- Wilhelmus Hinderikus Maria Langeslag
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Circuit and method for width measurement of digital pulse signals
- Patent number 11,852,666
- Issue date Dec 26, 2023
- HUNAN GREAT-LEO MICROELECTRONICS CO., LTD.
- Hu Chen
- G01 - MEASURING TESTING
Information Patent Grant
Jitter noise detector
- Patent number 11,808,798
- Issue date Nov 7, 2023
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Tien-Chien Huang
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Baseline pulse value calculation method and hematology analyzer par...
- Patent number 11,754,489
- Issue date Sep 12, 2023
- LEADWAY (HK) LIMITED
- Haibing Guan
- G01 - MEASURING TESTING
Information Patent Grant
Wireless threat detection device, system, and methods to detect sig...
- Patent number 11,743,277
- Issue date Aug 29, 2023
- Skycope Technologies, Inc.
- Naga Raghavendra Surya Vara Prasad Koppisetti
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Device of measuring duty cycle and compensation circuit utilizing t...
- Patent number 11,703,532
- Issue date Jul 18, 2023
- Richwave Technology Corp.
- Po-Wei Wu
- G01 - MEASURING TESTING
Information Patent Grant
Method and device for measuring a pulse signal with high dynamic range
- Patent number 11,692,879
- Issue date Jul 4, 2023
- The Secretary of State for Defence
- David Lanto Hillier
- G01 - MEASURING TESTING
Information Patent Grant
Single-shunt current measurement
- Patent number 11,658,597
- Issue date May 23, 2023
- ALLEGRO MICROSYSTEMS, LLC
- Anton Babushkin
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Demodulation phase calibration using external input
- Patent number 11,650,078
- Issue date May 16, 2023
- Invensense, Inc.
- Doruk Senkal
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
System and method for selecting a clock
- Patent number 11,644,504
- Issue date May 9, 2023
- STMicroelectronics S.r.l.
- Mirko Dondini
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Duty timing detector for detecting duty timing of toggle signal, de...
- Patent number 11,598,797
- Issue date Mar 7, 2023
- Samsung Electronics Co., Ltd.
- Hyun Seok Nam
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Apparatus for monitoring pulsed high-frequency power and substrate...
- Patent number 11,545,340
- Issue date Jan 3, 2023
- Semes Co., Ltd.
- Jong Hwan An
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System and method for arc detection using a bias RF generator signal
- Patent number 11,536,755
- Issue date Dec 27, 2022
- MKS Instruments, Inc.
- Larry J. Fisk
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Jitter noise detector
- Patent number 11,513,147
- Issue date Nov 29, 2022
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Tien-Chien Huang
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Wireless threat detection device, system, and methods to detect sig...
- Patent number 11,374,947
- Issue date Jun 28, 2022
- Naga Raghavendra Surya Vara Prasad Koppisetti
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Demodulation phase calibration using external input
- Patent number 11,365,983
- Issue date Jun 21, 2022
- Invensense, Inc.
- Doruk Senkal
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
High speed digital transient waveform detection system and method f...
- Patent number 11,307,227
- Issue date Apr 19, 2022
- Electro Industries/Gauge Tech
- Joseph Spanier
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and system for measuring power-on reset time
- Patent number 11,287,453
- Issue date Mar 29, 2022
- Shenzhen Goodix Technology Co., Ltd.
- Qingbin Li
- G01 - MEASURING TESTING
Information Patent Grant
Tamper monitoring circuitry
- Patent number 11,275,401
- Issue date Mar 15, 2022
- ARM Limited
- Ivan Michael Lowe
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Radiation measurement device
- Patent number 11,269,085
- Issue date Mar 8, 2022
- Mitsubishi Electric Corporation
- Hidetaka Yahata
- G01 - MEASURING TESTING
Information Patent Grant
Method of determining correction function
- Patent number 11,249,126
- Issue date Feb 15, 2022
- Tokyo Electron Limited
- Kazushi Kaneko
- G01 - MEASURING TESTING
Information Patent Grant
Method to estimate the rise-time of a pulse for single and multi-ch...
- Patent number 11,156,647
- Issue date Oct 26, 2021
- BAE Systems Information and Electronic Systems Integration Inc.
- Masoud Farshchian
- G01 - MEASURING TESTING
Information Patent Grant
Multi-input power supply system and method of using the same
- Patent number 11,044,791
- Issue date Jun 22, 2021
- ERP Power, LLC
- Steven C. Krattiger
- G01 - MEASURING TESTING
Information Patent Grant
Detection of pulse width tampering of signals
- Patent number 11,022,637
- Issue date Jun 1, 2021
- ARM Limited
- Subbayya Chowdary Yanamadala
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
FAULT DETECTION CIRCUIT
- Publication number 20240151760
- Publication date May 9, 2024
- Toyota Jidosha Kabushiki Kaisha
- Hiroyuki IYAMA
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR TESTING SWITCH SIGNALS OF AN INVERTER OF AN ELECTRIC MAC...
- Publication number 20240142505
- Publication date May 2, 2024
- SCHAEFFLER TECHNOLOGIES AG & CO. KG
- Huan Fu
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
EXTENDED PULSE SAMPLING SYSTEM AND METHOD
- Publication number 20240053393
- Publication date Feb 15, 2024
- Photonic Systems, Inc.
- Charles H. Cox
- G01 - MEASURING TESTING
Information Patent Application
NOVEL JITTER NOISE DETECTOR
- Publication number 20230400494
- Publication date Dec 14, 2023
- Taiwan Semiconductor Manufacturing Co., LTD
- Tien-Chien HUANG
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
BROADBAND LOSSLESS PARTIAL DISCHARGE DETECTION AND NOISE REMOVAL DE...
- Publication number 20230314496
- Publication date Oct 5, 2023
- ECOTOMORROW KOREA CO., LTD.
- Kwang Sik CHOI
- G01 - MEASURING TESTING
Information Patent Application
SPATTER DETECTION METHOD
- Publication number 20230311234
- Publication date Oct 5, 2023
- Honda Motor Co., Ltd.
- Hiroki TOYODA
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
Device of Measuring Duty Cycle and Compensation Circuit Utilizing t...
- Publication number 20230296655
- Publication date Sep 21, 2023
- RICHWAVE TECHNOLOGY CORP.
- Po-Wei Wu
- G01 - MEASURING TESTING
Information Patent Application
RF VECTOR MEASUREMENT SYSTEM WITH ONE OR MORE ENTANGLED QUANTUM SEN...
- Publication number 20230204645
- Publication date Jun 29, 2023
- ROHDE & SCHWARZ GMBH & CO. KG
- Julius SEEGER
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ELECTRICAL PARAMETER MONITORING
- Publication number 20230121793
- Publication date Apr 20, 2023
- Elspec Engineering Ltd.
- Yoram HARARY
- G01 - MEASURING TESTING
Information Patent Application
INPUT VOLTAGE RIPPLE COMPENSATION OF INTERLEAVED BOOST CONVERTER US...
- Publication number 20230069460
- Publication date Mar 2, 2023
- NXP USA, Inc.
- Wilhelmus Hinderikus Maria Langeslag
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
Device of Measuring Duty Cycle and Compensation Circuit Utilizing t...
- Publication number 20230060339
- Publication date Mar 2, 2023
- RICHWAVE TECHNOLOGY CORP.
- Po-Wei Wu
- G01 - MEASURING TESTING
Information Patent Application
NOVEL JITTER NOISE DETECTOR
- Publication number 20230040034
- Publication date Feb 9, 2023
- Taiwan Semiconductor Manufacturing Co., LTD
- Tien-Chien HUANG
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
LIDAR SYSTEM WITH PULSE-ENERGY MEASUREMENT
- Publication number 20230028608
- Publication date Jan 26, 2023
- LUMINAR, LLC
- Lawrence Shah
- G01 - MEASURING TESTING
Information Patent Application
PULSE EDGE DETECTION CIRCUIT
- Publication number 20230003780
- Publication date Jan 5, 2023
- DENSO CORPORATION
- TAKASUKE ITO
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS, METHOD, SYSTEM AND MEDIUM FOR MEASURING PULSE SIGNAL WIDTH
- Publication number 20230003781
- Publication date Jan 5, 2023
- Lemon Inc.
- Junmou ZHANG
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
DUTY TIMING DETECTOR FOR DETECTING DUTY TIMING OF TOGGLE SIGNAL, DE...
- Publication number 20220404410
- Publication date Dec 22, 2022
- Samsung Electronics Co., Ltd.
- Hyun Seok Nam
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
METHOD FOR ANALYZING FLOW REGIME ALTERATIONS FROM RESERVOIR INFLOW...
- Publication number 20220398514
- Publication date Dec 15, 2022
- SUN YAT-SEN UNIVERSITY
- Tongtiegang ZHAO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
FILTERING MEASUREMENT DATA OF AN ACTIVE OPTICAL SENSOR SYSTEM
- Publication number 20220373660
- Publication date Nov 24, 2022
- VALEO Schalter und Sensoren GmbH
- Sergio Fernandez
- G01 - MEASURING TESTING
Information Patent Application
DEMODULATION PHASE CALIBRATION USING EXTERNAL INPUT
- Publication number 20220326045
- Publication date Oct 13, 2022
- InvenSense, Inc.
- Doruk Senkal
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
Wireless threat detection device, system, and methods to detect sig...
- Publication number 20220311788
- Publication date Sep 29, 2022
- Skycope Technologies, Inc.
- Naga Raghavendra Surya Vara Prasad Koppisetti
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CIRCUIT AND METHOD FOR WIDTH MEASUREMENT OF DIGITAL PULSE SIGNALS
- Publication number 20220308102
- Publication date Sep 29, 2022
- HUNAN GREAT-LEO MICROELECTRONICS CO., LTD.
- Hu CHEN
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS FOR ANALYSING CURRENTS IN AN ELECTRICAL LOAD, AND LOAD HA...
- Publication number 20220163567
- Publication date May 26, 2022
- Elmos Semiconductor SE
- Jörg Krupar
- G01 - MEASURING TESTING
Information Patent Application
PULSE-WIDTH MODULATION SIGNAL OBSERVATION CIRCUIT AND HARDWARE-IN-T...
- Publication number 20220114303
- Publication date Apr 14, 2022
- Industrial Technology Research Institute
- CHUN-AN LIN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND DEVICE FOR MEASURING A PULSE SIGNAL WITH HIGH DYNAMIC RANGE
- Publication number 20220107224
- Publication date Apr 7, 2022
- The Secretary of State for Defence
- David Lanto Hillier
- G01 - MEASURING TESTING
Information Patent Application
PULSE PROCESSING DEVICE AND METHOD OF ASSOCIATING PULSE-RELATED WAV...
- Publication number 20220026477
- Publication date Jan 27, 2022
- Universite Laval
- Gabriel GAGNON-TURCOTTE
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
System and Method for Arc Detection Using a Bias RF Generator Signal
- Publication number 20210373054
- Publication date Dec 2, 2021
- MKS Instruments, Inc.
- Larry J. FISK
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND DEVICE FOR SAMPLING A PULSE SIGNAL, AND COMPUTER PROGRAM...
- Publication number 20210275114
- Publication date Sep 9, 2021
- Raycan Technology Co., Ltd. (Suzhou)
- Kezhang Zhu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Systems and Methods for Duty Cycle Measurement
- Publication number 20210270879
- Publication date Sep 2, 2021
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Tsung-Hsien Tsai
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Tamper Monitoring Circuitry
- Publication number 20210216096
- Publication date Jul 15, 2021
- ARM Limited
- Ivan Michael Lowe
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
RADIATION MEASUREMENT DEVICE
- Publication number 20210173099
- Publication date Jun 10, 2021
- MITSUBISHI ELECTRIC CORPORATION
- Hidetaka YAHATA
- G01 - MEASURING TESTING

Measuring characteristics of individual pulses

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

RF vector measurement system with one or more entangled quantum sen...

Joint denoising and delay estimation for the extraction of pulse-wi...

Clock anomaly detection

Method and device for sampling a pulse signal, and computer program...

Testing circuit, testing device and testing method thereof

Signal processing device as well as method of applying a zone trigger

Input voltage ripple compensation of interleaved boost converter us...

Circuit and method for width measurement of digital pulse signals

Jitter noise detector

Baseline pulse value calculation method and hematology analyzer par...

Wireless threat detection device, system, and methods to detect sig...

Device of measuring duty cycle and compensation circuit utilizing t...

Method and device for measuring a pulse signal with high dynamic range

Single-shunt current measurement

Demodulation phase calibration using external input

System and method for selecting a clock

Duty timing detector for detecting duty timing of toggle signal, de...

Apparatus for monitoring pulsed high-frequency power and substrate...

System and method for arc detection using a bias RF generator signal

Jitter noise detector

Wireless threat detection device, system, and methods to detect sig...

Demodulation phase calibration using external input

High speed digital transient waveform detection system and method f...

Method and system for measuring power-on reset time

Tamper monitoring circuitry

Radiation measurement device

Method of determining correction function

Method to estimate the rise-time of a pulse for single and multi-ch...

Multi-input power supply system and method of using the same

Detection of pulse width tampering of signals

Patents Applicationslast 30 patents

FAULT DETECTION CIRCUIT

METHOD FOR TESTING SWITCH SIGNALS OF AN INVERTER OF AN ELECTRIC MAC...

EXTENDED PULSE SAMPLING SYSTEM AND METHOD

NOVEL JITTER NOISE DETECTOR

BROADBAND LOSSLESS PARTIAL DISCHARGE DETECTION AND NOISE REMOVAL DE...

SPATTER DETECTION METHOD

Device of Measuring Duty Cycle and Compensation Circuit Utilizing t...

RF VECTOR MEASUREMENT SYSTEM WITH ONE OR MORE ENTANGLED QUANTUM SEN...

ELECTRICAL PARAMETER MONITORING

INPUT VOLTAGE RIPPLE COMPENSATION OF INTERLEAVED BOOST CONVERTER US...

Device of Measuring Duty Cycle and Compensation Circuit Utilizing t...

NOVEL JITTER NOISE DETECTOR

LIDAR SYSTEM WITH PULSE-ENERGY MEASUREMENT

PULSE EDGE DETECTION CIRCUIT

APPARATUS, METHOD, SYSTEM AND MEDIUM FOR MEASURING PULSE SIGNAL WIDTH

DUTY TIMING DETECTOR FOR DETECTING DUTY TIMING OF TOGGLE SIGNAL, DE...

METHOD FOR ANALYZING FLOW REGIME ALTERATIONS FROM RESERVOIR INFLOW...

FILTERING MEASUREMENT DATA OF AN ACTIVE OPTICAL SENSOR SYSTEM

DEMODULATION PHASE CALIBRATION USING EXTERNAL INPUT

Wireless threat detection device, system, and methods to detect sig...

CIRCUIT AND METHOD FOR WIDTH MEASUREMENT OF DIGITAL PULSE SIGNALS

APPARATUS FOR ANALYSING CURRENTS IN AN ELECTRICAL LOAD, AND LOAD HA...

PULSE-WIDTH MODULATION SIGNAL OBSERVATION CIRCUIT AND HARDWARE-IN-T...

METHOD AND DEVICE FOR MEASURING A PULSE SIGNAL WITH HIGH DYNAMIC RANGE

PULSE PROCESSING DEVICE AND METHOD OF ASSOCIATING PULSE-RELATED WAV...

System and Method for Arc Detection Using a Bias RF Generator Signal

METHOD AND DEVICE FOR SAMPLING A PULSE SIGNAL, AND COMPUTER PROGRAM...

Systems and Methods for Duty Cycle Measurement

Tamper Monitoring Circuitry

RADIATION MEASUREMENT DEVICE