Measuring in transmission

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CPC
G01B9/02024

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GPHYSICS G01Measuring instruments G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS G01B9/00Instruments as specified in the subgroups and characterised by the use of optical measuring means

Current Industry

G01B9/02024Measuring in transmission

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Spatially filtered talbot interferometer for wafer distortion measu...
- Patent number 12,104,891
- Issue date Oct 1, 2024
- Daniel Gene Smith
- G01 - MEASURING TESTING
Information Patent Grant
Interferometric speckle visibility spectroscopy
- Patent number 11,867,505
- Issue date Jan 9, 2024
- California Institute of Technology
- Joshua Brake
- G01 - MEASURING TESTING
Information Patent Grant
Optical systems with controlled mirror arrangements
- Patent number 11,841,223
- Issue date Dec 12, 2023
- Lockheed Martin Corporation
- Brian James Howley
- G01 - MEASURING TESTING
Information Patent Grant
Interferometric speckle visibility spectroscopy
- Patent number 11,346,650
- Issue date May 31, 2022
- California Institute of Technology
- Joshua Brake
- G01 - MEASURING TESTING
Information Patent Grant
Two-dimensional second harmonic dispersion interferometer
- Patent number 11,221,293
- Issue date Jan 11, 2022
- Frank Joseph Wessel
- G01 - MEASURING TESTING
Information Patent Grant
Optical measurement apparatus and optical measurement method
- Patent number 11,215,443
- Issue date Jan 4, 2022
- Otsuka Electronics Co., Ltd.
- Kunikazu Taguchi
- G01 - MEASURING TESTING
Information Patent Grant
Interferometric waviness detection systems
- Patent number 11,143,503
- Issue date Oct 12, 2021
- Kimball Electronics Indiana, Inc.
- Sangtaek Kim
- G01 - MEASURING TESTING
Information Patent Grant
Interferometer system and use thereof
- Patent number 11,143,498
- Issue date Oct 12, 2021
- Nederlandse Organisatie voor toegepast-natuurwetenschappelijk onderzoek TNO
- Huibert Visser
- G01 - MEASURING TESTING
Information Patent Grant
Distance measuring arrangement for determining a distance from an o...
- Patent number 11,015,916
- Issue date May 25, 2021
- TAYLOR HOBSON LTD.
- Christian Am Weg
- G01 - MEASURING TESTING
Information Patent Grant
Methods and apparatus for high resolution imaging with reflectors a...
- Patent number 11,016,309
- Issue date May 25, 2021
- Massachusetts Institute of Technology
- Barmak Heshmat Dehkordi
- G01 - MEASURING TESTING
Information Patent Grant
Interferometry system and associated methods
- Patent number 11,009,341
- Issue date May 18, 2021
- University of Utah Research Foundation
- Clayton C. Williams
- G01 - MEASURING TESTING
Information Patent Grant
Ophthalmic apparatus
- Patent number 10,881,288
- Issue date Jan 5, 2021
- Tomey Corporation
- Yuji Nozawa
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Testing device
- Patent number 10,773,478
- Issue date Sep 15, 2020
- TRIPLE WIN TECHNOLOGY (SHENZHEN) CO. LTD.
- Ying-Quan Zhao
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Three-dimensional measurement device
- Patent number 10,704,888
- Issue date Jul 7, 2020
- CKD Corporation
- Hiroyuki Ishigaki
- G01 - MEASURING TESTING
Information Patent Grant
Multiple beam scanning system for measuring machine
- Patent number 10,648,797
- Issue date May 12, 2020
- QUALITY VISION INTERNATIONAL INC.
- Daniel James Lawler Williams
- G01 - MEASURING TESTING
Information Patent Grant
Interferometry system and associated methods
- Patent number 10,422,630
- Issue date Sep 24, 2019
- University of Utah Research Foundation
- Clayton C. Williams
- G01 - MEASURING TESTING
Information Patent Grant
Methods and apparatus for high resolution imaging with reflectors a...
- Patent number 10,386,650
- Issue date Aug 20, 2019
- Massachusetts Institute of Technology
- Barmak Heshmat Dehkordi
- G01 - MEASURING TESTING
Information Patent Grant
Light pulse atom interferometer velocity reference
- Patent number 10,330,459
- Issue date Jun 25, 2019
- AOSense, Inc.
- Michael R. Matthews
- G01 - MEASURING TESTING
Information Patent Grant
Optical measurement apparatus and optical measurement method
- Patent number 10,309,767
- Issue date Jun 4, 2019
- Otsuka Electronics Co., Ltd.
- Nobuyuki Inoue
- G01 - MEASURING TESTING
Information Patent Grant
Optical measurement apparatus and optical measurement method
- Patent number 10,288,412
- Issue date May 14, 2019
- Otsuka Electronics Co., Ltd.
- Nobuyuki Inoue
- G01 - MEASURING TESTING
Information Patent Grant
Method and arrangement for determining the heating condition of a m...
- Patent number 10,161,808
- Issue date Dec 25, 2018
- Carl Zeiss SMT GmbH
- Peter Vogt
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Particle counter
- Patent number 9,983,113
- Issue date May 29, 2018
- Rion Co., Ltd.
- Tomonobu Matsuda
- G01 - MEASURING TESTING
Information Patent Grant
Method and device for determining optical properties by simultaneou...
- Patent number 9,733,063
- Issue date Aug 15, 2017
- Biametrics GmbH
- Günther Proll
- G01 - MEASURING TESTING
Information Patent Grant
Portable interferometric device
- Patent number 9,574,868
- Issue date Feb 21, 2017
- Ramot at Tel Aviv University Ltd.
- Natan Tzvi Shaked
- G02 - OPTICS
Information Patent Grant
Light reflection mechanism, optical interferometer and spectrometri...
- Patent number 9,291,444
- Issue date Mar 22, 2016
- Konica Minolta Holdings, Inc.
- Shinya Matsuda
- G01 - MEASURING TESTING
Information Patent Grant
System for tomographic imaging using coherent light that has a rand...
- Patent number 9,176,054
- Issue date Nov 3, 2015
- Canon Kabushiki Kaisha
- Isao Matsubara
- G01 - MEASURING TESTING
Information Patent Grant
Observation device and method of observing
- Patent number 9,080,974
- Issue date Jul 14, 2015
- SEVENTH DIMENSION DESIGN, INC.
- Hiroto Kuroda
- G01 - MEASURING TESTING
Information Patent Grant
Metrology of optics with high aberrations
- Patent number 8,743,373
- Issue date Jun 3, 2014
- Applied Science Innovations, Inc.
- Mikhail Gutin
- G01 - MEASURING TESTING
Information Patent Grant
Mass gauging demonstrator for any gravitational conditions
- Patent number 8,537,365
- Issue date Sep 17, 2013
- The United States of America as represented by the administrator of the Natio...
- Valentin Korman
- G01 - MEASURING TESTING
Information Patent Grant
Talbot interferometer, its adjustment method, and measurement method
- Patent number 8,520,217
- Issue date Aug 27, 2013
- Canon Kabushiki Kaisha
- Toshiyuki Naoi
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
INTERFEROMETRIC SPECKLE VISIBILITY SPECTROSCOPY
- Publication number 20240302158
- Publication date Sep 12, 2024
- California Institute of Technology
- Joshua Brake
- G01 - MEASURING TESTING
Information Patent Application
THREE-DIMENSIONAL MEASUREMENT DEVICE
- Publication number 20230366668
- Publication date Nov 16, 2023
- CKD CORPORATION
- Hiroyuki Ishigaki
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL SYSTEMS WITH CONTROLLED MIRROR ARRANGEMENTS
- Publication number 20230266116
- Publication date Aug 24, 2023
- Lockheed Martin Corporation
- Brian James HOWLEY
- G01 - MEASURING TESTING
Information Patent Application
THREE-DIMENSIONAL MEASUREMENT DEVICE
- Publication number 20230243643
- Publication date Aug 3, 2023
- CKD CORPORATION
- Hiroyuki Ishigaki
- G01 - MEASURING TESTING
Information Patent Application
In-Situ Residual Intensity Noise Measurement Method And System
- Publication number 20230049259
- Publication date Feb 16, 2023
- KVH Industries, Inc.
- Jan Amir Khan
- G01 - MEASURING TESTING
Information Patent Application
INTERFEROMETRIC SPECKLE VISIBILITY SPECTROSCOPY
- Publication number 20220341723
- Publication date Oct 27, 2022
- California Institute of Technology
- Joshua Brake
- G01 - MEASURING TESTING
Information Patent Application
Two-Dimensional Second Harmonic Dispersion Interferometer
- Publication number 20220091032
- Publication date Mar 24, 2022
- Frank Joseph Wessel
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL MEASUREMENT APPARATUS AND OPTICAL MEASUREMENT METHOD
- Publication number 20210123721
- Publication date Apr 29, 2021
- Otsuka Electronics Co., Ltd.
- Kunikazu TAGUCHI
- G01 - MEASURING TESTING
Information Patent Application
INTERFEROMETRIC SPECKLE VISIBILITY SPECTROSCOPY
- Publication number 20200386535
- Publication date Dec 10, 2020
- California Institute of Technology
- Joshua Brake
- G01 - MEASURING TESTING
Information Patent Application
OPHTHALMIC APPARATUS
- Publication number 20200205654
- Publication date Jul 2, 2020
- TOMEY CORPORATION
- Yuji Nozawa
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
DISTANCE MEASURING ARRANGEMENT FOR DETERMINING A DISTANCE FROM AN O...
- Publication number 20200200523
- Publication date Jun 25, 2020
- TAYLOR HOBSON LTD.
- Christian Am Weg
- G02 - OPTICS
Information Patent Application
DEVICE FOR MEASURING THE PARAMETERS OF PHASE ELEMENTS AND OPTICAL F...
- Publication number 20200191551
- Publication date Jun 18, 2020
- POLSKIE CENTRUM FOTONIKI I SWIATLOWODÓW
- Karol STEPIEÑ
- G01 - MEASURING TESTING
Information Patent Application
SURFACE MEASURING DEVICE AND SURFACE MEASURING METHOD
- Publication number 20200158502
- Publication date May 21, 2020
- CHROMA ATE INC.
- Cheng-Ting TSAI
- G01 - MEASURING TESTING
Information Patent Application
Vehicle size measurement apparatus and vehicle size measuring method
- Publication number 20200047779
- Publication date Feb 13, 2020
- HITACHI HIGH-TECH FINE SYSTEMS CORPORATION
- UENO TAKETO
- G01 - MEASURING TESTING
Information Patent Application
INTERFEROMETRY SYSTEM AND ASSOCIATED METHODS
- Publication number 20190353474
- Publication date Nov 21, 2019
- University of Utah Research Foundation
- Clayton C. Williams
- G01 - MEASURING TESTING
Information Patent Application
Methods and apparatus for high resolution imaging with reflectors a...
- Publication number 20190331932
- Publication date Oct 31, 2019
- Massachusetts Institute of Technology
- Barmak Heshmat Dehkordi
- G01 - MEASURING TESTING
Information Patent Application
INTERFEROMETER SYSTEM AND USE THEREOF
- Publication number 20190323821
- Publication date Oct 24, 2019
- NEDERLANDSE ORGANISATIE VOOR TOEGEPAST-NATUURWETENSCHAPPELIJK ONDERZOEK TNO
- Huibert VISSER
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL MEASUREMENT APPARATUS AND OPTICAL MEASUREMENT METHOD
- Publication number 20180347965
- Publication date Dec 6, 2018
- Otsuka Electronics Co., Ltd.
- Nobuyuki INOUE
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL MEASUREMENT APPARATUS AND OPTICAL MEASUREMENT METHOD
- Publication number 20180347964
- Publication date Dec 6, 2018
- Otsuka Electronics Co., Ltd.
- Nobuyuki INOUE
- G01 - MEASURING TESTING
Information Patent Application
PARTICLE COUNTER
- Publication number 20170160178
- Publication date Jun 8, 2017
- Rion Co., Ltd.
- Tomonobu MATSUDA
- G01 - MEASURING TESTING
Information Patent Application
INTERFEROMETRIC METHOD AND APPARATUS FOR SPATIO-TEMPORAL OPTICAL CO...
- Publication number 20160290784
- Publication date Oct 6, 2016
- AM2M SP Z O.O. SP KOM
- Maciej Wojtkowski
- G01 - MEASURING TESTING
Information Patent Application
SENSOR BASED ON LASER
- Publication number 20160238369
- Publication date Aug 18, 2016
- Shenzhen University
- Qiao WEN
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM WITH DIFFUSED ILLUMINATION FOR TOMOGRAPHIC IMAGING
- Publication number 20130329226
- Publication date Dec 12, 2013
- The Arizona Board of Regents on behalf of the University of Arizona
- Isao Matsubara
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND DEVICE FOR DETERMINING OPTICAL PROPERTIES BY SIMULTANEOU...
- Publication number 20130314712
- Publication date Nov 28, 2013
- BIAMETRICS GMBH
- Günther Proll
- G01 - MEASURING TESTING
Information Patent Application
Method and arrangement for determining the heating condition of a m...
- Publication number 20130230073
- Publication date Sep 5, 2013
- Peter Vogt
- G02 - OPTICS
Information Patent Application
APPARATUS, METHOD, AND TALBOT INTERFEROMETER FOR CALCULATING ABERRA...
- Publication number 20130157202
- Publication date Jun 20, 2013
- Canon Kabushiki Kaisha
- Naoki Kohara
- G01 - MEASURING TESTING
Information Patent Application
Observation Device and Method of Observing
- Publication number 20130087724
- Publication date Apr 11, 2013
- Hiroto Kuroda
- G01 - MEASURING TESTING
Information Patent Application
Light Reflection Mechanism, Optical Interferometer and Spectrometri...
- Publication number 20120038927
- Publication date Feb 16, 2012
- Shinya Matsuda
- G02 - OPTICS
Information Patent Application
Apparatus and method for optical interrogation
- Publication number 20110292401
- Publication date Dec 1, 2011
- Giovanni Barbarossa
- G01 - MEASURING TESTING
Information Patent Application
INTERFEROMETRIC SYSTEMS HAVING REFLECTIVE CHAMBERS AND RELATED METHODS
- Publication number 20110242543
- Publication date Oct 6, 2011
- DUKE UNIVERSITY
- Adam Wax
- G01 - MEASURING TESTING

Measuring in transmission

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Spatially filtered talbot interferometer for wafer distortion measu...

Interferometric speckle visibility spectroscopy

Optical systems with controlled mirror arrangements

Interferometric speckle visibility spectroscopy

Two-dimensional second harmonic dispersion interferometer

Optical measurement apparatus and optical measurement method

Interferometric waviness detection systems

Interferometer system and use thereof

Distance measuring arrangement for determining a distance from an o...

Methods and apparatus for high resolution imaging with reflectors a...

Interferometry system and associated methods

Ophthalmic apparatus

Testing device

Three-dimensional measurement device

Multiple beam scanning system for measuring machine

Interferometry system and associated methods

Methods and apparatus for high resolution imaging with reflectors a...

Light pulse atom interferometer velocity reference

Optical measurement apparatus and optical measurement method

Optical measurement apparatus and optical measurement method

Method and arrangement for determining the heating condition of a m...

Particle counter

Method and device for determining optical properties by simultaneou...

Portable interferometric device

Light reflection mechanism, optical interferometer and spectrometri...

System for tomographic imaging using coherent light that has a rand...

Observation device and method of observing

Metrology of optics with high aberrations

Mass gauging demonstrator for any gravitational conditions

Talbot interferometer, its adjustment method, and measurement method

Patents Applicationslast 30 patents

INTERFEROMETRIC SPECKLE VISIBILITY SPECTROSCOPY

THREE-DIMENSIONAL MEASUREMENT DEVICE

OPTICAL SYSTEMS WITH CONTROLLED MIRROR ARRANGEMENTS

THREE-DIMENSIONAL MEASUREMENT DEVICE

In-Situ Residual Intensity Noise Measurement Method And System

INTERFEROMETRIC SPECKLE VISIBILITY SPECTROSCOPY

Two-Dimensional Second Harmonic Dispersion Interferometer

OPTICAL MEASUREMENT APPARATUS AND OPTICAL MEASUREMENT METHOD

INTERFEROMETRIC SPECKLE VISIBILITY SPECTROSCOPY

OPHTHALMIC APPARATUS

DISTANCE MEASURING ARRANGEMENT FOR DETERMINING A DISTANCE FROM AN O...

DEVICE FOR MEASURING THE PARAMETERS OF PHASE ELEMENTS AND OPTICAL F...

SURFACE MEASURING DEVICE AND SURFACE MEASURING METHOD

Vehicle size measurement apparatus and vehicle size measuring method

INTERFEROMETRY SYSTEM AND ASSOCIATED METHODS

Methods and apparatus for high resolution imaging with reflectors a...

INTERFEROMETER SYSTEM AND USE THEREOF

OPTICAL MEASUREMENT APPARATUS AND OPTICAL MEASUREMENT METHOD

OPTICAL MEASUREMENT APPARATUS AND OPTICAL MEASUREMENT METHOD

PARTICLE COUNTER

INTERFEROMETRIC METHOD AND APPARATUS FOR SPATIO-TEMPORAL OPTICAL CO...

SENSOR BASED ON LASER

SYSTEM WITH DIFFUSED ILLUMINATION FOR TOMOGRAPHIC IMAGING

METHOD AND DEVICE FOR DETERMINING OPTICAL PROPERTIES BY SIMULTANEOU...

Method and arrangement for determining the heating condition of a m...

APPARATUS, METHOD, AND TALBOT INTERFEROMETER FOR CALCULATING ABERRA...

Observation Device and Method of Observing

Light Reflection Mechanism, Optical Interferometer and Spectrometri...

Apparatus and method for optical interrogation

INTERFEROMETRIC SYSTEMS HAVING REFLECTIVE CHAMBERS AND RELATED METHODS