Measuring noise figure Measuring signal-to-noise ratio Measuring jitter

Industry

CPC
G01R29/26

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Parent Industries

GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R29/00Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00

Current Industry

G01R29/26Measuring noise figure Measuring signal-to-noise ratio Measuring jitter

Industries

Patents Grantslast 30 patents

Information Patent Grant
Measurement individual difference correction system in ground volta...
- Patent number 12,163,987
- Issue date Dec 10, 2024
- Nippon Telegraph and Telephone Corporation
- Naruto Arai
- G01 - MEASURING TESTING
Information Patent Grant
Broadband lossless partial discharge detection and noise removal de...
- Patent number 12,130,316
- Issue date Oct 29, 2024
- ECOTOMORROW KOREA CO., LTD.
- Kwang Sik Choi
- G01 - MEASURING TESTING
Information Patent Grant
Measuring device
- Patent number 12,130,320
- Issue date Oct 29, 2024
- Osaka University
- Tsuyoshi Sekitani
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for utilizing intrinsic current noise to measur...
- Patent number 12,089,953
- Issue date Sep 17, 2024
- Meta Platforms Technologies, LLC
- Ning Guo
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Jitter noise detector
- Patent number 12,072,365
- Issue date Aug 27, 2024
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Tien-Chien Huang
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Sub-sampled based instrument noise correction for jitter measurements
- Patent number 12,055,585
- Issue date Aug 6, 2024
- Skyworks Solutions, Inc.
- Daniel de Godoy Peixoto
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor-based chemical detection device
- Patent number 12,038,406
- Issue date Jul 16, 2024
- Life Technologies Corporation
- Kim L. Johnson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electronic apparatus, switching system, and control method
- Patent number 12,040,790
- Issue date Jul 16, 2024
- Kabushiki Kaisha Toshiba
- Hidenori Okuni
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Systems and methods for modeling noise sequences and calibrating qu...
- Patent number 12,039,465
- Issue date Jul 16, 2024
- D-Wave Systems Inc.
- Jack R. Raymond
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Drive sense circuit
- Patent number 12,025,646
- Issue date Jul 2, 2024
- SIGMASENSE, LLC.
- Phuong Huynh
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Connected device adapted to measure at least a physical quantity
- Patent number 11,921,893
- Issue date Mar 5, 2024
- THALES DIS FRANCE SAS
- Yannick Teglia
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Analog and digital frequency domain data sensing circuit
- Patent number 11,906,564
- Issue date Feb 20, 2024
- SIGMASENSE, LLC.
- Daniel Keith Van Ostrand
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Receiving device, mobile terminal test apparatus provided with rece...
- Patent number 11,892,498
- Issue date Feb 6, 2024
- Anritsu Corporation
- Takasumi Ikebe
- G01 - MEASURING TESTING
Information Patent Grant
Accelerometer apparatuses and systems for noise rejection
- Patent number 11,885,647
- Issue date Jan 30, 2024
- Rohm Co., Ltd.
- Jonah Dewall
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Phase noise measurement method and measurement system
- Patent number 11,874,312
- Issue date Jan 16, 2024
- Rohde & Schwarz GmbH & Co. KG
- Andreas Lagler
- G01 - MEASURING TESTING
Information Patent Grant
Spur cancellation for spur measurement
- Patent number 11,855,649
- Issue date Dec 26, 2023
- Skyworks Solutions, Inc.
- Timothy A. Monk
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Electrical prospecting signal transmission device capable of suppre...
- Patent number 11,846,744
- Issue date Dec 19, 2023
- Hunan University of Science and Technology
- Guohong Fu
- G01 - MEASURING TESTING
Information Patent Grant
Test and measurement instrument accessory with reconfigurable proce...
- Patent number 11,815,548
- Issue date Nov 14, 2023
- Tektronix, Inc.
- Charles W. Case
- G01 - MEASURING TESTING
Information Patent Grant
System and method for noise measurement
- Patent number 11,815,540
- Issue date Nov 14, 2023
- Keysight Technologies, Inc.
- Junichi Iwai
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Jitter noise detector
- Patent number 11,808,798
- Issue date Nov 7, 2023
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Tien-Chien Huang
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Portable device with removably attachable measuring leg
- Patent number 11,802,900
- Issue date Oct 31, 2023
- Merlin Technology Inc.
- Loc Viet Lam
- G01 - MEASURING TESTING
Information Patent Grant
Frequency mapping using drive-sense circuits
- Patent number 11,796,581
- Issue date Oct 24, 2023
- SIGMASENSE, LLC.
- Daniel Keith Van Ostrand
- G01 - MEASURING TESTING
Information Patent Grant
Vehicle control device and control method thereof
- Patent number 11,799,598
- Issue date Oct 24, 2023
- Hitachi Astemo, Ltd.
- Tsunamichi Tsukidate
- B60 - VEHICLES IN GENERAL
Information Patent Grant
Jitter self-test using timestamps
- Patent number 11,764,913
- Issue date Sep 19, 2023
- Skyworks Solutions, Inc.
- Raghunandan K. Ranganathan
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Noise parameter determination of scalable devices
- Patent number 11,747,384
- Issue date Sep 5, 2023
- The Government of the United States of America, as represented by the Secreta...
- Luciano Boglione
- G01 - MEASURING TESTING
Information Patent Grant
Charged particle beam device and method of measuring electrical noise
- Patent number 11,735,395
- Issue date Aug 22, 2023
- HITACHI HIGH-TECH CORPORATION
- Takayasu Iwatsuka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
On-chip spread spectrum characterization
- Patent number 11,714,127
- Issue date Aug 1, 2023
- International Business Machines Corporation
- Christopher W. Steffen
- G01 - MEASURING TESTING
Information Patent Grant
Instrument noise correction for jitter measurements
- Patent number 11,709,201
- Issue date Jul 25, 2023
- Skyworks Solutions, Inc.
- Daniel De Godoy Peixoto
- G01 - MEASURING TESTING
Information Patent Grant
Self-test procedure for a control device
- Patent number 11,700,681
- Issue date Jul 11, 2023
- Lutron Technology Company LLC
- Richard S. Camden
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Remote attestation of system integrity
- Patent number 11,693,992
- Issue date Jul 4, 2023
- ARM Limited
- Milosch Meriac
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
Diagnostic Circuit
- Publication number 20240418762
- Publication date Dec 19, 2024
- The Boeing Company
- Ian M. Dayton
- G01 - MEASURING TESTING
Information Patent Application
IDENTIFYING FAULT IN TORQUE SIGNAL / TORQUE SENSOR FOR AIRCRAFT SYSTEM
- Publication number 20240385234
- Publication date Nov 21, 2024
- Pratt & Whitney Canada Corp.
- Andrew Ghattas
- B64 - AIRCRAFT AVIATION COSMONAUTICS
Information Patent Application
REMOVING TEST EQUIPMENT INTERMODULATION INTERFERENCE AND NOISE FROM...
- Publication number 20240361367
- Publication date Oct 31, 2024
- LitePoint Corporation
- Chen CAO
- G01 - MEASURING TESTING
Information Patent Application
SPECTRAL INFORMATION SEPARATION AND AGGREGATION METHOD
- Publication number 20240345149
- Publication date Oct 17, 2024
- North China Institute of Aerospace Engineering
- Yancang Wang
- G01 - MEASURING TESTING
Information Patent Application
DIRECT CURRENT- 40 GIGAHERTZ COAX-BASED CRYOGENIC VARIABLE TEMPERAT...
- Publication number 20240345150
- Publication date Oct 17, 2024
- California Institute of Technology
- Jacob W. Kooi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SIGNAL PROCESSING METHOD, MEASUREMENT INSTRUMENT AND MEASUREMENT SY...
- Publication number 20240319248
- Publication date Sep 26, 2024
- ROHDE &SCHWARZ GMBH & CO. KG
- Florian Ramian
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE AND EVALUATION SYSTEM
- Publication number 20240319271
- Publication date Sep 26, 2024
- Rohm Co., Ltd.
- Hideki Miyoshi
- G01 - MEASURING TESTING
Information Patent Application
INFORMATION PROCESSING DEVICE, MEASUREMENT SYSTEM, AND NON-TRANSITO...
- Publication number 20240288513
- Publication date Aug 29, 2024
- TDK Corporation
- Masafumi KURISU
- G01 - MEASURING TESTING
Information Patent Application
Discharge Detection System
- Publication number 20240258788
- Publication date Aug 1, 2024
- NITTO KOGYO CORPORATION
- Atsushi Miyamoto
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
TEST AND MEASUREMENT INSTRUMENT HAVING TAILORED JITTER COMPENSATION
- Publication number 20240255572
- Publication date Aug 1, 2024
- Tektronix, Inc.
- Muhammad Saad Chughtai
- G01 - MEASURING TESTING
Information Patent Application
ELECTRIC VEHICLE NOISE SNIFFER AND METHODS OF MITIGATING PACKET FLO...
- Publication number 20240243774
- Publication date Jul 18, 2024
- ACCELERATED SYSTEMS INC.
- Peter MANKOWSKI
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
MEASUREMENT DEVICE FOR PERFORMING MEASUREMENTS WITH RESPECT TO A DUT
- Publication number 20240219442
- Publication date Jul 4, 2024
- ROHDE & SCHWARZ GMBH & CO. KG
- Florian RAMIAN
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor-Based Chemical Detection Device
- Publication number 20240201127
- Publication date Jun 20, 2024
- Life Technologies Corporation
- Kim L. JOHNSON
- C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information Patent Application
METHODS AND SYSTEMS FOR OPERATING AN ELECTRIC VEHICLE
- Publication number 20240204823
- Publication date Jun 20, 2024
- ACCELERATED SYSTEMS INC.
- Peter MANKOWSKI
- B60 - VEHICLES IN GENERAL
Information Patent Application
JITTER MEASURING CIRCUIT, JITTER ANALYZING APPARATUS INCLUDING THE...
- Publication number 20240201254
- Publication date Jun 20, 2024
- Samsung Electronics Co., Ltd.
- Hyeon Gwan Oh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SPUR CANCELLATION FOR SPUR MEASUREMENT
- Publication number 20240195423
- Publication date Jun 13, 2024
- Skyworks Solutions, Inc.
- Timothy A. Monk
- G01 - MEASURING TESTING
Information Patent Application
ADAPTIVE INSTRUMENT NOISE REMOVAL
- Publication number 20240125837
- Publication date Apr 18, 2024
- Tektronix, Inc.
- Kan Tan
- G01 - MEASURING TESTING
Information Patent Application
PERIODIC JITTER DETERMINATION FOR A PHASE NOISE MEASUREMENT
- Publication number 20240110963
- Publication date Apr 4, 2024
- KEYSIGHT TECHNOLOGIES, INC.
- Rishi Mohindra
- G01 - MEASURING TESTING
Information Patent Application
INFORMATION PROCESSING APPARATUS, NON-TRANSITORY COMPUTER READABLE...
- Publication number 20240103060
- Publication date Mar 28, 2024
- FUJIFILM Business Innovation Corp.
- Masahito KUBONO
- G01 - MEASURING TESTING
Information Patent Application
HARDWARE NOISE FILTERING
- Publication number 20240077526
- Publication date Mar 7, 2024
- Oura Health Oy
- Mika Petteri Kangas
- G01 - MEASURING TESTING
Information Patent Application
SPECIFIC ABSORPTION RATE DETECTION ASSEMBLY, SPECIFIC ABSORPTION RA...
- Publication number 20240069084
- Publication date Feb 29, 2024
- GUANGDONG OPPO MOBILE TELECOMMUNICATIONS CORP., LTD.
- Yizhou LUO
- G01 - MEASURING TESTING
Information Patent Application
TEST AND MEASUREMENT INSTRUMENT ACCESSORY WITH RECONFIGURABLE PROCE...
- Publication number 20240069094
- Publication date Feb 29, 2024
- Tektronix, Inc.
- Charles W. Case
- G01 - MEASURING TESTING
Information Patent Application
ELECTRONIC APPARATUS, SWITCHING SYSTEM, AND CONTROL METHOD
- Publication number 20240072797
- Publication date Feb 29, 2024
- Kabushiki Kaisha Toshiba
- Hidenori OKUNI
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
SIGNAL PROCESSING CIRCUIT AND MEASUREMENT INSTRUMENT
- Publication number 20240019477
- Publication date Jan 18, 2024
- ROHDE & SCHWARZ GMBH & CO. KG
- Wolfgang WENDLER
- G01 - MEASURING TESTING
Information Patent Application
SIGNAL/NOISE DETERMINATION APPARATUS, METHOD, AND RECORDING MEDIUM
- Publication number 20230417812
- Publication date Dec 28, 2023
- Advantest Corporation
- Yuji OGATA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Hybrid Filter Circuit and System with Hybrid Filter Circuit
- Publication number 20230412151
- Publication date Dec 21, 2023
- TDK Electronics AG
- Yasin Karinca
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
NOVEL JITTER NOISE DETECTOR
- Publication number 20230400494
- Publication date Dec 14, 2023
- Taiwan Semiconductor Manufacturing Co., LTD
- Tien-Chien HUANG
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
DEVICE AND METHODS FOR PHASE NOISE MEASUREMENT
- Publication number 20230393184
- Publication date Dec 7, 2023
- MICROCHIP TECHNOLOGY INCORPORATED
- Gary Qu Jin
- G01 - MEASURING TESTING
Information Patent Application
SUB-SAMPLED BASED INSTRUMENT NOISE CORRECTION FOR JITTER MEASUREMENTS
- Publication number 20230366928
- Publication date Nov 16, 2023
- Skyworks Solutions, Inc.
- Daniel de Godoy Peixoto
- G01 - MEASURING TESTING
Information Patent Application
Discharge Detector
- Publication number 20230358800
- Publication date Nov 9, 2023
- NITTO KOGYO CORPORATION
- Atsushi Miyamoto
- G01 - MEASURING TESTING

Measuring noise figure Measuring signal-to-noise ratio Measuring jitter

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Measurement individual difference correction system in ground volta...

Broadband lossless partial discharge detection and noise removal de...

Measuring device

Systems and methods for utilizing intrinsic current noise to measur...

Jitter noise detector

Sub-sampled based instrument noise correction for jitter measurements

Semiconductor-based chemical detection device

Electronic apparatus, switching system, and control method

Systems and methods for modeling noise sequences and calibrating qu...

Drive sense circuit

Connected device adapted to measure at least a physical quantity

Analog and digital frequency domain data sensing circuit

Receiving device, mobile terminal test apparatus provided with rece...

Accelerometer apparatuses and systems for noise rejection

Phase noise measurement method and measurement system

Spur cancellation for spur measurement

Electrical prospecting signal transmission device capable of suppre...

Test and measurement instrument accessory with reconfigurable proce...

System and method for noise measurement

Jitter noise detector

Portable device with removably attachable measuring leg

Frequency mapping using drive-sense circuits

Vehicle control device and control method thereof

Jitter self-test using timestamps

Noise parameter determination of scalable devices

Charged particle beam device and method of measuring electrical noise

On-chip spread spectrum characterization

Instrument noise correction for jitter measurements

Self-test procedure for a control device

Remote attestation of system integrity

Patents Applicationslast 30 patents

Diagnostic Circuit

IDENTIFYING FAULT IN TORQUE SIGNAL / TORQUE SENSOR FOR AIRCRAFT SYSTEM

REMOVING TEST EQUIPMENT INTERMODULATION INTERFERENCE AND NOISE FROM...

SPECTRAL INFORMATION SEPARATION AND AGGREGATION METHOD

DIRECT CURRENT- 40 GIGAHERTZ COAX-BASED CRYOGENIC VARIABLE TEMPERAT...

SIGNAL PROCESSING METHOD, MEASUREMENT INSTRUMENT AND MEASUREMENT SY...

SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE AND EVALUATION SYSTEM

INFORMATION PROCESSING DEVICE, MEASUREMENT SYSTEM, AND NON-TRANSITO...

Discharge Detection System

TEST AND MEASUREMENT INSTRUMENT HAVING TAILORED JITTER COMPENSATION

ELECTRIC VEHICLE NOISE SNIFFER AND METHODS OF MITIGATING PACKET FLO...

MEASUREMENT DEVICE FOR PERFORMING MEASUREMENTS WITH RESPECT TO A DUT

Semiconductor-Based Chemical Detection Device

METHODS AND SYSTEMS FOR OPERATING AN ELECTRIC VEHICLE

JITTER MEASURING CIRCUIT, JITTER ANALYZING APPARATUS INCLUDING THE...

SPUR CANCELLATION FOR SPUR MEASUREMENT

ADAPTIVE INSTRUMENT NOISE REMOVAL

PERIODIC JITTER DETERMINATION FOR A PHASE NOISE MEASUREMENT

INFORMATION PROCESSING APPARATUS, NON-TRANSITORY COMPUTER READABLE...

HARDWARE NOISE FILTERING

SPECIFIC ABSORPTION RATE DETECTION ASSEMBLY, SPECIFIC ABSORPTION RA...

TEST AND MEASUREMENT INSTRUMENT ACCESSORY WITH RECONFIGURABLE PROCE...

ELECTRONIC APPARATUS, SWITCHING SYSTEM, AND CONTROL METHOD

SIGNAL PROCESSING CIRCUIT AND MEASUREMENT INSTRUMENT

SIGNAL/NOISE DETERMINATION APPARATUS, METHOD, AND RECORDING MEDIUM

Hybrid Filter Circuit and System with Hybrid Filter Circuit

NOVEL JITTER NOISE DETECTOR

DEVICE AND METHODS FOR PHASE NOISE MEASUREMENT

SUB-SAMPLED BASED INSTRUMENT NOISE CORRECTION FOR JITTER MEASUREMENTS

Discharge Detector