Measuring quality factor or dielectric loss

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CPC
G01R27/2688

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GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R27/00Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom

Current Industry

G01R27/2688Measuring quality factor or dielectric loss

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Patents Grantslast 30 patents

Information Patent Grant
Deriving a capacitance-ratio information, device and method
- Patent number 12,196,793
- Issue date Jan 14, 2025
- NXP B.V.
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Method for determining a quality factor and wireless charger
- Patent number 11,990,781
- Issue date May 21, 2024
- NXP USA, INC.
- Dechang Wang
- G01 - MEASURING TESTING
Information Patent Grant
Method of measuring a graphite article, apparatus for a measurement...
- Patent number 11,856,678
- Issue date Dec 26, 2023
- SENIC INC.
- Eun Su Yang
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Systems and methods for PLP capacitor health check
- Patent number 11,656,257
- Issue date May 23, 2023
- Kioxia Corporation
- Timothy Simon Butler
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Coupling circuit with switching function for coupling an insulation...
- Patent number 11,515,701
- Issue date Nov 29, 2022
- Bender GmbH & Co. KG
- Andreas Herber
- G01 - MEASURING TESTING
Information Patent Grant
Pseudo-differential phase measurement and quality factor compensation
- Patent number 11,507,199
- Issue date Nov 22, 2022
- Cirrus Logic, Inc.
- John L. Melanson
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Q-factor determination of coil select
- Patent number 11,336,119
- Issue date May 17, 2022
- Integrated Device Technology, Inc.
- Nicholaus Wayne Smith
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Q-factor determination in wireless charging system having complex r...
- Patent number 11,336,118
- Issue date May 17, 2022
- NXP USA, INC.
- Dengyu Jiang
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Determination of harmonic pollution on an electrical distribution n...
- Patent number 11,029,350
- Issue date Jun 8, 2021
- Universite de Poitiers
- Laurent Rambault
- G01 - MEASURING TESTING
Information Patent Grant
Wireless charging system with machine-learning-based foreign object...
- Patent number 11,025,098
- Issue date Jun 1, 2021
- Apple Inc.
- Behrooz Shahsavari
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for calculating model parameters for a coil to be...
- Patent number 10,901,015
- Issue date Jan 26, 2021
- MINDCET BVBA
- Mike Irena Georges Wens
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
RF cable and cable-bound path loss determination method
- Patent number 10,837,992
- Issue date Nov 17, 2020
- Rohde & Schwarz GmbH & Co. KG
- Markus Gallhauser
- G01 - MEASURING TESTING
Information Patent Grant
Q-factor determination for foreign object detection circuit in wire...
- Patent number 10,833,540
- Issue date Nov 10, 2020
- NXP USA, INC.
- Fei Chen
- G01 - MEASURING TESTING
Information Patent Grant
Q-factor detection method
- Patent number 10,804,750
- Issue date Oct 13, 2020
- Integrated Device Technology, Inc.
- Rui Liu
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Foreign object detection in wireless charging systems with multiple...
- Patent number 10,797,534
- Issue date Oct 6, 2020
- Apple Inc.
- Behrooz Shahsavari
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Techniques for testing PLP capacitors
- Patent number 10,705,129
- Issue date Jul 7, 2020
- TOSHIBA MEMORY CORPORATION
- Paul Abrahams
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for determining a microwave beam and a power sett...
- Patent number 10,622,843
- Issue date Apr 14, 2020
- MOTOROLA SOLUTIONS, INC.
- Giorgi G. Bit-Babik
- G01 - MEASURING TESTING
Information Patent Grant
Quality factor estimation of a reverberant cavity
- Patent number 10,585,971
- Issue date Mar 10, 2020
- The Boeing Company
- Jason P. Bommer
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for determining the quality factor of an oscillator
- Patent number 10,578,661
- Issue date Mar 3, 2020
- Commissariat a l'Energie Atomique et Aux Energies Alternatives
- Antoine Nowodzinski
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Apparatus and methods for testing patch antennas
- Patent number 10,505,644
- Issue date Dec 10, 2019
- Skyworks Solutions, Inc.
- John Christopher Deriso
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for diagnosing state of power cable and measur...
- Patent number 10,393,788
- Issue date Aug 27, 2019
- Korea Electric Power Corporation
- Sung-Min Kim
- G01 - MEASURING TESTING
Information Patent Grant
Method for monitoring transformer bushings and a system therefor
- Patent number 10,345,366
- Issue date Jul 9, 2019
- ABB Schweiz AG
- Nilanga Abeywickrama
- G01 - MEASURING TESTING
Information Patent Grant
Noncontact power transmission system to detect presence of a metall...
- Patent number 10,330,743
- Issue date Jun 25, 2019
- Sony Corporation
- Shinji Komiyama
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Determination of Q-factor of resonant tank network
- Patent number 10,218,211
- Issue date Feb 26, 2019
- NXP USA, INC.
- Gang Li
- G01 - MEASURING TESTING
Information Patent Grant
Measurement of complex dielectric constant and permeability
- Patent number 9,952,269
- Issue date Apr 24, 2018
- Kerim Akel
- G01 - MEASURING TESTING
Information Patent Grant
Indicators for a power meter
- Patent number 9,804,211
- Issue date Oct 31, 2017
- Veris Industries, LLC
- Aaron Parker
- G01 - MEASURING TESTING
Information Patent Grant
Power loss capacitor test using voltage ripple
- Patent number 9,646,657
- Issue date May 9, 2017
- Intel Corporation
- Kai-Uwe Schmidt
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
System and method for evaluating a capacitive interface
- Patent number 9,547,037
- Issue date Jan 17, 2017
- NXP USA, INC.
- Divya Pratap
- G01 - MEASURING TESTING
Information Patent Grant
Measuring power consumption of circuit component operating in ultra...
- Patent number 9,470,725
- Issue date Oct 18, 2016
- Atmel Corporation
- Ingar Hanssen
- G01 - MEASURING TESTING
Information Patent Grant
Filter capacitor degradation identification using measured and expe...
- Patent number 9,389,263
- Issue date Jul 12, 2016
- Rockwell Automation Technologies, Inc.
- Christian Sartler
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER

Patents Applicationslast 30 patents

Information Patent Application
CAPACITOR TEST
- Publication number 20240288480
- Publication date Aug 29, 2024
- Micron Technology, Inc.
- Marco REDAELLI
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR PLP CAPACITOR HEALTH CHECK
- Publication number 20230288464
- Publication date Sep 14, 2023
- KIOXIA Corporation
- Timothy Simon Butler
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DERIVING A CAPACITANCE-RATIO INFORMATION, DEVICE AND METHOD
- Publication number 20230176103
- Publication date Jun 8, 2023
- NXP B.V.
- Harish Kundur Subramaniyan
- G01 - MEASURING TESTING
Information Patent Application
Device and method for measuring microwave surface resistance of die...
- Publication number 20230152360
- Publication date May 18, 2023
- University of Electronic Science and Technology of China
- Cheng Zeng
- G01 - MEASURING TESTING
Information Patent Application
PSEUDO-DIFFERENTIAL PHASE MEASUREMENT AND QUALITY FACTOR COMPENSATION
- Publication number 20220317778
- Publication date Oct 6, 2022
- Cirrus Logic International Semiconductor Ltd.
- John L. MELANSON
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEMS AND METHODS FOR PLP CAPACITOR HEALTH CHECK
- Publication number 20210231720
- Publication date Jul 29, 2021
- KIOXIA Corporation
- Timothy Simon Butler
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR DETERMINING A QUALITY FACTOR AND WIRELESS CHARGER
- Publication number 20210175728
- Publication date Jun 10, 2021
- NXP USA, Inc.
- Dechang Wang
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF MESURING A GRAPHITE ARTICLE, APPARATUS FOR A MEASURMENT,...
- Publication number 20210127462
- Publication date Apr 29, 2021
- SKC CO., LTD.
- Eun Su YANG
- G01 - MEASURING TESTING
Information Patent Application
TECHNIQUES FOR TESTING PLP CAPACITORS
- Publication number 20200393504
- Publication date Dec 17, 2020
- Toshiba Memory Corporation
- Paul Abrahams
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Q-FACTOR DETERMINATION OF COIL SELECT
- Publication number 20200274396
- Publication date Aug 27, 2020
- Renesas Electronics America Inc.
- Nicholaus Wayne SMITH
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Q-FACTOR DETERMINATION IN WIRELESS CHARGING SYSTEM HAVING COMPLEX R...
- Publication number 20200212713
- Publication date Jul 2, 2020
- NXP USA, Inc.
- Dengyu Jiang
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
Q-FACTOR DETERMINATION FOR FOREIGN OBJECT DETECTION CIRCUIT IN WIRE...
- Publication number 20200185974
- Publication date Jun 11, 2020
- NXP USA, Inc.
- Fei Chen
- G01 - MEASURING TESTING
Information Patent Application
RF CABLE AND CABLE-BOUND PATH LOSS DETERMINATION METHOD
- Publication number 20200049749
- Publication date Feb 13, 2020
- Rohde& Schwarz GmbH & Co. KG
- Markus Gallhauser
- G01 - MEASURING TESTING
Information Patent Application
COUPLING CIRCUIT WITH SWITCHING FUNCTION FOR COUPLING AN INSULATION...
- Publication number 20190339314
- Publication date Nov 7, 2019
- BENDER GMBH & CO. KG
- Andreas Herber
- G01 - MEASURING TESTING
Information Patent Application
Q-factor detection method
- Publication number 20190140489
- Publication date May 9, 2019
- Integrated Device Technology, Inc.
- Rui LIU
- G01 - MEASURING TESTING
Information Patent Application
Techniques for Testing PLP Capacitors
- Publication number 20190079125
- Publication date Mar 14, 2019
- Toshiba Memory Corporation
- Paul Abrahams
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Foreign Object Detection in Wireless Charging Systems with Multiple...
- Publication number 20190081516
- Publication date Mar 14, 2019
- Apple Inc.
- Behrooz Shahsavari
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
Wireless Charging System With Machine-Learning-Based Foreign Object...
- Publication number 20190074730
- Publication date Mar 7, 2019
- Apple Inc.
- Behrooz Shahsavari
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DETERMINATION OF HARMONIC POLLUTION ON AN ELECTRICAL DISTRIBUTION N...
- Publication number 20180313879
- Publication date Nov 1, 2018
- Universite De Poitiers
- Laurent RAMBAULT
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
SYSTEM AND METHOD FOR DETERMINING A MICROWAVE BEAM AND A POWER SETT...
- Publication number 20180069438
- Publication date Mar 8, 2018
- MOTOROLA SOLUTIONS, INC.
- Giorgi G. Bit-Babik
- G01 - MEASURING TESTING
Information Patent Application
DETERMINATION OF Q-FACTOR OF RESONANT TANK NETWORK
- Publication number 20170271908
- Publication date Sep 21, 2017
- NXP USA, Inc.
- GANG LI
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR HIGH RESOLUTION COMPLEX PERMITTIVITY SENSI...
- Publication number 20160091544
- Publication date Mar 31, 2016
- The Governors of the University of Alberta
- Mojgan DANESHMAND
- G01 - MEASURING TESTING
Information Patent Application
TOUCH DETECTION APPARATUS HAVING FUNCTION FOR CONTROLLING PARASITIC...
- Publication number 20150116261
- Publication date Apr 30, 2015
- IP CITY CO., LTD.
- Byung Cik Ahn
- G01 - MEASURING TESTING
Information Patent Application
MEASURING POWER CONSUMPTION OF CIRUIT COMPONENT OPERATING IN ULTRA-...
- Publication number 20150028887
- Publication date Jan 29, 2015
- ATMEL CORPORATION
- Ingar Hanssen
- G01 - MEASURING TESTING
Information Patent Application
Method and System for Calculating Model Parameters for a Coil to be...
- Publication number 20140372059
- Publication date Dec 18, 2014
- MINDCET BVBA
- Mike Irena Georges Wens
- G01 - MEASURING TESTING
Information Patent Application
PLANAR STRUCTURE CHARACTERISTICS OBTAINED WITH LOOK UP TABLES
- Publication number 20140236512
- Publication date Aug 21, 2014
- Hewlett-Packard Development Company, L.P.
- John Yan
- G01 - MEASURING TESTING
Information Patent Application
DETECTING DEVICE, DETECTING SYSTEM, POWER TRANSMITTING DEVICE, NONC...
- Publication number 20130176023
- Publication date Jul 11, 2013
- SONY CORPORATION
- Shinji Komiyama
- G01 - MEASURING TESTING
Information Patent Application
Yield Improvement for Josephson Junction Test Device Formation
- Publication number 20110012619
- Publication date Jan 20, 2011
- International Business Machines Corporation
- Mark B. Ketchen
- G01 - MEASURING TESTING
Information Patent Application
High voltage sensor circuit
- Publication number 20090224774
- Publication date Sep 10, 2009
- Andrew L. Smith
- G01 - MEASURING TESTING
Information Patent Application
System for Detecting an Interface Between First and Second Strata o...
- Publication number 20080018346
- Publication date Jan 24, 2008
- Mehrdad Mehdizadeh
- G01 - MEASURING TESTING

Measuring quality factor or dielectric loss

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Deriving a capacitance-ratio information, device and method

Method for determining a quality factor and wireless charger

Method of measuring a graphite article, apparatus for a measurement...

Systems and methods for PLP capacitor health check

Coupling circuit with switching function for coupling an insulation...

Pseudo-differential phase measurement and quality factor compensation

Q-factor determination of coil select

Q-factor determination in wireless charging system having complex r...

Determination of harmonic pollution on an electrical distribution n...

Wireless charging system with machine-learning-based foreign object...

Method and system for calculating model parameters for a coil to be...

RF cable and cable-bound path loss determination method

Q-factor determination for foreign object detection circuit in wire...

Q-factor detection method

Foreign object detection in wireless charging systems with multiple...

Techniques for testing PLP capacitors

System and method for determining a microwave beam and a power sett...

Quality factor estimation of a reverberant cavity

Method for determining the quality factor of an oscillator

Apparatus and methods for testing patch antennas

Apparatus and method for diagnosing state of power cable and measur...

Method for monitoring transformer bushings and a system therefor

Noncontact power transmission system to detect presence of a metall...

Determination of Q-factor of resonant tank network

Measurement of complex dielectric constant and permeability

Indicators for a power meter

Power loss capacitor test using voltage ripple

System and method for evaluating a capacitive interface

Measuring power consumption of circuit component operating in ultra...

Filter capacitor degradation identification using measured and expe...

Patents Applicationslast 30 patents

CAPACITOR TEST

SYSTEMS AND METHODS FOR PLP CAPACITOR HEALTH CHECK

DERIVING A CAPACITANCE-RATIO INFORMATION, DEVICE AND METHOD

Device and method for measuring microwave surface resistance of die...

PSEUDO-DIFFERENTIAL PHASE MEASUREMENT AND QUALITY FACTOR COMPENSATION

SYSTEMS AND METHODS FOR PLP CAPACITOR HEALTH CHECK

METHOD FOR DETERMINING A QUALITY FACTOR AND WIRELESS CHARGER

METHOD OF MESURING A GRAPHITE ARTICLE, APPARATUS FOR A MEASURMENT,...

TECHNIQUES FOR TESTING PLP CAPACITORS

Q-FACTOR DETERMINATION OF COIL SELECT

Q-FACTOR DETERMINATION IN WIRELESS CHARGING SYSTEM HAVING COMPLEX R...

Q-FACTOR DETERMINATION FOR FOREIGN OBJECT DETECTION CIRCUIT IN WIRE...

RF CABLE AND CABLE-BOUND PATH LOSS DETERMINATION METHOD

COUPLING CIRCUIT WITH SWITCHING FUNCTION FOR COUPLING AN INSULATION...

Q-factor detection method

Techniques for Testing PLP Capacitors

Foreign Object Detection in Wireless Charging Systems with Multiple...

Wireless Charging System With Machine-Learning-Based Foreign Object...

DETERMINATION OF HARMONIC POLLUTION ON AN ELECTRICAL DISTRIBUTION N...

SYSTEM AND METHOD FOR DETERMINING A MICROWAVE BEAM AND A POWER SETT...

DETERMINATION OF Q-FACTOR OF RESONANT TANK NETWORK

APPARATUS AND METHOD FOR HIGH RESOLUTION COMPLEX PERMITTIVITY SENSI...

TOUCH DETECTION APPARATUS HAVING FUNCTION FOR CONTROLLING PARASITIC...

MEASURING POWER CONSUMPTION OF CIRUIT COMPONENT OPERATING IN ULTRA-...

Method and System for Calculating Model Parameters for a Coil to be...

PLANAR STRUCTURE CHARACTERISTICS OBTAINED WITH LOOK UP TABLES

DETECTING DEVICE, DETECTING SYSTEM, POWER TRANSMITTING DEVICE, NONC...

Yield Improvement for Josephson Junction Test Device Formation

High voltage sensor circuit

System for Detecting an Interface Between First and Second Strata o...