Measuring-systems or electronic circuits

Industry

CPC
G01R27/2623

This industry / category may be too specific. Please go to a parent level for more data

Parent Industries

GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R27/00Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom

Current Industry

G01R27/2623Measuring-systems or electronic circuits

Industries

Please log in for detailed analytics

Patents Grantslast 30 patents

Information Patent Grant
Measurement device and measurement method
- Patent number 12,174,231
- Issue date Dec 24, 2024
- Yokogawa Electric Corporation
- Jun Katsuyama
- G01 - MEASURING TESTING
Information Patent Grant
Radome measuring system and method
- Patent number 12,050,240
- Issue date Jul 30, 2024
- Perisens GmbH
- Florian Pfeiffer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Determining capacitance and resistance-capacitance time constant
- Patent number 11,674,989
- Issue date Jun 13, 2023
- Cadence Design Systems, Inc.
- Mark A. Summers
- G01 - MEASURING TESTING
Information Patent Grant
Insulation detection circuit and detection method thereof for two-w...
- Patent number 11,604,217
- Issue date Mar 14, 2023
- SHENZHEN VMAX NEW ENERGY CO., LTD.
- Jun Liu
- G01 - MEASURING TESTING
Information Patent Grant
Composition ratio estimation device/ composition ratio estimation m...
- Patent number 11,561,121
- Issue date Jan 24, 2023
- Musasino Co., Ltd.
- Hideto Oura
- G01 - MEASURING TESTING
Information Patent Grant
Specific conductivity measurement method, recording medium recordin...
- Patent number 11,435,385
- Issue date Sep 6, 2022
- Fujitsu Limited
- Kazuki Takahashi
- G01 - MEASURING TESTING
Information Patent Grant
Fingerprint sensor with impedance detection
- Patent number 11,328,536
- Issue date May 10, 2022
- IDEMIA IDENTITY & SECURITY FRANCE
- Sylvain Maillard
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Measuring device, measuring system, and measuring method for liquid...
- Patent number 11,215,654
- Issue date Jan 4, 2022
- BOE Technology Group Co., Ltd.
- Yongchun Lu
- G01 - MEASURING TESTING
Information Patent Grant
Ground fault detection device
- Patent number 11,187,759
- Issue date Nov 30, 2021
- Yazaki Corporation
- Yoshihiro Kawamura
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Measuring device for liquid crystal dielectric constant, measuring...
- Patent number 11,112,440
- Issue date Sep 7, 2021
- BOE Technology Group Co., Ltd.
- Yongchun Lu
- G01 - MEASURING TESTING
Information Patent Grant
Multi-phase flow decomposition using electrical capacitance volume...
- Patent number 10,806,366
- Issue date Oct 20, 2020
- TECH4IMAGING LLC
- Qussai Marashdeh
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Apparatus and method for monitoring dielectric constant of a substrate
- Patent number 10,725,076
- Issue date Jul 28, 2020
- Veoneer US, Inc.
- Majid Ahmadloo
- G01 - MEASURING TESTING
Information Patent Grant
Sensor device
- Patent number 10,718,730
- Issue date Jul 21, 2020
- SHARP KABUSHIKI KAISHA
- Nobuyuki Ashida
- G01 - MEASURING TESTING
Information Patent Grant
Dielectric measurement probe for curved surfaces
- Patent number 10,649,016
- Issue date May 12, 2020
- The United States of America as represented by the Secretary of the Navy
- David F Rivera
- G01 - MEASURING TESTING
Information Patent Grant
Plant water sensor
- Patent number 10,605,746
- Issue date Mar 31, 2020
- United Arab Emirates University
- Rashad Ramzan
- G01 - MEASURING TESTING
Information Patent Grant
Multi-phase flow decomposition using electrical capacitance volume...
- Patent number 10,512,415
- Issue date Dec 24, 2019
- TECH4IMAGING LLC
- Qussai Marashdeh
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Multi-phase flow decomposition using electrical capacitance volume...
- Patent number 10,244,962
- Issue date Apr 2, 2019
- TECH4IMAGING LLC
- Qussai Marashdeh
- G01 - MEASURING TESTING
Information Patent Grant
Measurement of complex dielectric constant and permeability
- Patent number 9,952,269
- Issue date Apr 24, 2018
- Kerim Akel
- G01 - MEASURING TESTING
Information Patent Grant
General four-port on-wafer high frequency de-embedding method
- Patent number 9,922,888
- Issue date Mar 20, 2018
- Tsinghua University
- Jun Fu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multi-phase flow decomposition using electrical capacitance volume...
- Patent number 9,901,282
- Issue date Feb 27, 2018
- TECH4IMAGING LLC
- Qussai Marashdeh
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Dielectric constant measurement circuit and dielectric constant mea...
- Patent number 9,423,438
- Issue date Aug 23, 2016
- NATIONAL TAIWAN UNIVERSITY
- Chii-Wann Lin
- G01 - MEASURING TESTING
Information Patent Grant
Ferroelectric analyzing device and method for adjusting ferroelectr...
- Patent number 9,354,192
- Issue date May 31, 2016
- Fudan University
- Anquan Jiang
- G01 - MEASURING TESTING
Information Patent Grant
Tester for measuring insulating properties of cross-linked polyethy...
- Patent number 9,347,902
- Issue date May 24, 2016
- TIANJIN ELECTRIC POWER CORPORATION
- Xiaohui Zhu
- G01 - MEASURING TESTING
Information Patent Grant
Electrode for use in measuring dielectric properties of parts
- Patent number 9,322,795
- Issue date Apr 26, 2016
- Lam Research Corporation
- Jaehyun Kim
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for the measurement of radio-frequency electri...
- Patent number 9,151,787
- Issue date Oct 6, 2015
- The United States of America as represented by the Secretary of the Army
- Gregory J. Mazzaro
- G01 - MEASURING TESTING
Information Patent Grant
Detection cell with controlled power dissipation
- Patent number 9,081,044
- Issue date Jul 14, 2015
- Agilent Technologies, Inc.
- Klaus Witt
- G01 - MEASURING TESTING
Information Patent Grant
Determining a dielectric property of a capacitor
- Patent number 8,957,688
- Issue date Feb 17, 2015
- Uster Technologies, AG
- Reto Gehrig
- B65 - CONVEYING PACKING STORING HANDLING THIN OR FILAMENTARY MATERIAL
Information Patent Grant
Signal processing in guided wave cutoff spectroscopy
- Patent number 8,914,242
- Issue date Dec 16, 2014
- Thermo Ramsey, Inc.
- Tom Lee Erb
- G01 - MEASURING TESTING
Information Patent Grant
Electrode for use in measuring dielectric properties of parts
- Patent number 8,519,724
- Issue date Aug 27, 2013
- Lam Research Corporation
- Jaehyun Kim
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for measuring dielectric properties of parts
- Patent number 8,269,510
- Issue date Sep 18, 2012
- Lam Research Corporation
- Jaehyun Kim
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
CALCULATION METHOD AND CALCULATION DEVICE
- Publication number 20240142504
- Publication date May 2, 2024
- Sumitomo Electric Industries, Ltd.
- Takeshi Kawasaki
- G01 - MEASURING TESTING
Information Patent Application
NON-INVASIVE CONTINUOUS CAPACITANCE LEVEL DETECTOR
- Publication number 20230103467
- Publication date Apr 6, 2023
- Merck Sharp & Dohme LLC
- William Blincoe
- G01 - MEASURING TESTING
Information Patent Application
SINGLE-ENDED TEST METHOD FOR WAVE-ABSORBING CHARACTERISTIC OF MATERIAL
- Publication number 20230065531
- Publication date Mar 2, 2023
- LANZHOU UNIVERSITY
- Xiling LI
- G01 - MEASURING TESTING
Information Patent Application
TESTING DEVICE FOR DETERMINING A DIELECTRIC VALUE
- Publication number 20220082513
- Publication date Mar 17, 2022
- Endress+Hauser SE+Co. KG
- Thomas Blödt
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT DEVICE AND MEASUREMENT METHOD
- Publication number 20220034951
- Publication date Feb 3, 2022
- Yokogawa Electric Corporation
- Jun KATSUYAMA
- G01 - MEASURING TESTING
Information Patent Application
Radome Measuring System and Method
- Publication number 20210349138
- Publication date Nov 11, 2021
- Perisens GmbH
- Florian PFEIFFER
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INSULATION RESISTANCE MEASUREMENT DEVICE AND INSULATION RESISTANCE...
- Publication number 20210231719
- Publication date Jul 29, 2021
- NHK Spring Co., Ltd.
- Ryosuke NAGANO
- G01 - MEASURING TESTING
Information Patent Application
FINGERPRINT SENSOR WITH IMPEDANCE DETECTION
- Publication number 20210166046
- Publication date Jun 3, 2021
- IDEMIA IDENTITY & SECURITY FRANCE
- Sylvain MAILLARD
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM AND METHOD FOR DETECTING POTHOLE SIGN OF ROAD PAVEMENT USING...
- Publication number 20210116487
- Publication date Apr 22, 2021
- KOREA EXPRESSWAY CORP.
- Ji Young RHEE
- B60 - VEHICLES IN GENERAL
Information Patent Application
Methodology for measuring dielectric and magnetic material properties
- Publication number 20210088568
- Publication date Mar 25, 2021
- Microhortone LLC
- Pingshan Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SPECIFIC CONDUCTIVITY MEASUREMENT METHOD, RECORDING MEDIUM RECORDIN...
- Publication number 20200341042
- Publication date Oct 29, 2020
- Fujitsu Limited
- Kazuki TAKAHASHI
- G01 - MEASURING TESTING
Information Patent Application
INSULATION DETECTION CIRCUIT AND DETECTION METHOD THEREOF FOR TWO-W...
- Publication number 20200249269
- Publication date Aug 6, 2020
- SHENZHEN VMAX NEW ENERGY CO., LTD.
- Jun LIU
- G01 - MEASURING TESTING
Information Patent Application
MEASURING DEVICE FOR LIQUID CRYSTAL DIELECTRIC CONSTANT, MEASURING...
- Publication number 20200209294
- Publication date Jul 2, 2020
- Yongchun Lu
- G01 - MEASURING TESTING
Information Patent Application
GROUND FAULT DETECTION DEVICE
- Publication number 20200191881
- Publication date Jun 18, 2020
- YAZAKI CORPORATION
- Yoshihiro KAWAMURA
- G01 - MEASURING TESTING
Information Patent Application
MEASURING DEVICE, MEASURING SYSTEM, AND MEASURING METHOD FOR LIQUID...
- Publication number 20200174050
- Publication date Jun 4, 2020
- BOE TECHNOLOGY GROUP CO., LTD.
- YONGCHUN LU
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and Method for Monitoring Dielectric Constant of a Substrate
- Publication number 20200150167
- Publication date May 14, 2020
- Veoneer US, Inc.
- Majid Ahmadloo
- G01 - MEASURING TESTING
Information Patent Application
COMPOSITION RATIO ESTIMATION DEVICE/ COMPOSITION RATIO ESTIMATION M...
- Publication number 20200072652
- Publication date Mar 5, 2020
- Musasino Co., Ltd.
- Hideto OURA
- G01 - MEASURING TESTING
Information Patent Application
MULTI-PHASE FLOW DECOMPOSITION USING ELECTRICAL CAPACITANCE VOLUME...
- Publication number 20200037920
- Publication date Feb 6, 2020
- Tech4Imaging LLC
- Qussai Marashdeh
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
MULTI-PHASE FLOW DECOMPOSITION USING ELECTRICAL CAPACITANCE VOLUME...
- Publication number 20190223752
- Publication date Jul 25, 2019
- Tech4Imaging LLC
- Qussai Marashdeh
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
PLANT WATER SENSOR
- Publication number 20190187072
- Publication date Jun 20, 2019
- UNITED ARAB EMIRATES UNIVERSITY
- Rashad Ramzan
- G01 - MEASURING TESTING
Information Patent Application
Method and Device for Analyzing an Electrical Circuit
- Publication number 20180292457
- Publication date Oct 11, 2018
- WISTRON NEWEB CORPORATION
- Yuan-Chia Hsu
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
MULTI-PHASE FLOW DECOMPOSITION USING ELECTRICAL CAPACITANCE VOLUME...
- Publication number 20180153433
- Publication date Jun 7, 2018
- Tech4Imaging LLC
- Qussai Marashdeh
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
MEASUREMENT OF COMPLEX DIELECTRIC CONSTANT AND PERMEABILITY
- Publication number 20170336452
- Publication date Nov 23, 2017
- Kerim Akel
- G01 - MEASURING TESTING
Information Patent Application
GENERAL FOUR-PORT ON-WAFER HIGH FREQUENCY DE-EMBEDDING METHOD
- Publication number 20170287792
- Publication date Oct 5, 2017
- TSINGHUA UNIVERSITY
- Jun FU
- G01 - MEASURING TESTING
Information Patent Application
System and Method for Determining Structure of Material
- Publication number 20170261538
- Publication date Sep 14, 2017
- Mitsubishi Electric Research Laboratories, Inc.
- Ulugbek Kamilov
- G01 - MEASURING TESTING
Information Patent Application
DIELECTRIC CONSTANT DETECTION METHOD AND DEVICE USING ANOMALOUS PHA...
- Publication number 20170131334
- Publication date May 11, 2017
- UNITED ARAB EMIRATES UNIVERSITY
- Rashad Ramzan
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DEVICE, MEASUREMENT APPARATUS, AND MEASUREMENT METHOD...
- Publication number 20160329255
- Publication date Nov 10, 2016
- Semiconductor Energy Laboratory Co., Ltd.
- Akiharu MIYANAGA
- G01 - MEASURING TESTING
Information Patent Application
Multi-Phase Flow Decomposition Using Electrical Capacitance Volume...
- Publication number 20160310040
- Publication date Oct 27, 2016
- Tech4Imaging LLC
- Qussai Marashdeh
- G01 - MEASURING TESTING
Information Patent Application
TEMPERATURE COMPENSATED DIELECTRIC CHARACTERIZATION OF SUBSTANCES
- Publication number 20160313259
- Publication date Oct 27, 2016
- Vayyar Imaging Ltd.
- Shachar SHAYOVITZ
- G01 - MEASURING TESTING
Information Patent Application
Dielectric Constant Measurement Circuit and Dielectric Constant Mea...
- Publication number 20150042358
- Publication date Feb 12, 2015
- NATIONAL TAIWAN UNIVERSITY OF SCIENCE AND TECHNOLOGY
- Chii-Wann LIN
- G01 - MEASURING TESTING

Measuring-systems or electronic circuits

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Measurement device and measurement method

Radome measuring system and method

Determining capacitance and resistance-capacitance time constant

Insulation detection circuit and detection method thereof for two-w...

Composition ratio estimation device/ composition ratio estimation m...

Specific conductivity measurement method, recording medium recordin...

Fingerprint sensor with impedance detection

Measuring device, measuring system, and measuring method for liquid...

Ground fault detection device

Measuring device for liquid crystal dielectric constant, measuring...

Multi-phase flow decomposition using electrical capacitance volume...

Apparatus and method for monitoring dielectric constant of a substrate

Sensor device

Dielectric measurement probe for curved surfaces

Plant water sensor

Multi-phase flow decomposition using electrical capacitance volume...

Multi-phase flow decomposition using electrical capacitance volume...

Measurement of complex dielectric constant and permeability

General four-port on-wafer high frequency de-embedding method

Multi-phase flow decomposition using electrical capacitance volume...

Dielectric constant measurement circuit and dielectric constant mea...

Ferroelectric analyzing device and method for adjusting ferroelectr...

Tester for measuring insulating properties of cross-linked polyethy...

Electrode for use in measuring dielectric properties of parts

Method and apparatus for the measurement of radio-frequency electri...

Detection cell with controlled power dissipation

Determining a dielectric property of a capacitor

Signal processing in guided wave cutoff spectroscopy

Electrode for use in measuring dielectric properties of parts

Apparatus for measuring dielectric properties of parts

Patents Applicationslast 30 patents

CALCULATION METHOD AND CALCULATION DEVICE

NON-INVASIVE CONTINUOUS CAPACITANCE LEVEL DETECTOR

SINGLE-ENDED TEST METHOD FOR WAVE-ABSORBING CHARACTERISTIC OF MATERIAL

TESTING DEVICE FOR DETERMINING A DIELECTRIC VALUE

MEASUREMENT DEVICE AND MEASUREMENT METHOD

Radome Measuring System and Method

INSULATION RESISTANCE MEASUREMENT DEVICE AND INSULATION RESISTANCE...

FINGERPRINT SENSOR WITH IMPEDANCE DETECTION

SYSTEM AND METHOD FOR DETECTING POTHOLE SIGN OF ROAD PAVEMENT USING...

Methodology for measuring dielectric and magnetic material properties

SPECIFIC CONDUCTIVITY MEASUREMENT METHOD, RECORDING MEDIUM RECORDIN...

INSULATION DETECTION CIRCUIT AND DETECTION METHOD THEREOF FOR TWO-W...

MEASURING DEVICE FOR LIQUID CRYSTAL DIELECTRIC CONSTANT, MEASURING...

GROUND FAULT DETECTION DEVICE

MEASURING DEVICE, MEASURING SYSTEM, AND MEASURING METHOD FOR LIQUID...

Apparatus and Method for Monitoring Dielectric Constant of a Substrate

COMPOSITION RATIO ESTIMATION DEVICE/ COMPOSITION RATIO ESTIMATION M...

MULTI-PHASE FLOW DECOMPOSITION USING ELECTRICAL CAPACITANCE VOLUME...

MULTI-PHASE FLOW DECOMPOSITION USING ELECTRICAL CAPACITANCE VOLUME...

PLANT WATER SENSOR

Method and Device for Analyzing an Electrical Circuit

MULTI-PHASE FLOW DECOMPOSITION USING ELECTRICAL CAPACITANCE VOLUME...

MEASUREMENT OF COMPLEX DIELECTRIC CONSTANT AND PERMEABILITY

GENERAL FOUR-PORT ON-WAFER HIGH FREQUENCY DE-EMBEDDING METHOD

System and Method for Determining Structure of Material

DIELECTRIC CONSTANT DETECTION METHOD AND DEVICE USING ANOMALOUS PHA...

SEMICONDUCTOR DEVICE, MEASUREMENT APPARATUS, AND MEASUREMENT METHOD...

Multi-Phase Flow Decomposition Using Electrical Capacitance Volume...

TEMPERATURE COMPENSATED DIELECTRIC CHARACTERIZATION OF SUBSTANCES

Dielectric Constant Measurement Circuit and Dielectric Constant Mea...