Microchannel plates

Industry

CPC
H01J2237/24435

This industry / category may be too specific. Please go to a parent level for more data

Parent Industries

HELECTRICITY H01Electric elements H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS H01J2237/00Discharge tubes exposing object to beam

Current Industry

H01J2237/24435Microchannel plates

Industries

Please log in for detailed analytics

Patents Grantslast 30 patents

Information Patent Grant
Multiple beam secondary ion mass spectrometry device
- Patent number 11,545,352
- Issue date Jan 3, 2023
- LUXEMBOURG INSTITUTE OF SCIENCE AND TECHNOLOGY (LIST)
- Marina Verruno
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion detection system
- Patent number 11,476,104
- Issue date Oct 18, 2022
- Micromass UK Limited
- Martin Raymond Green
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion detection system
- Patent number 11,031,220
- Issue date Jun 8, 2021
- Micromass UK Limited
- Martin Raymond Green
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Phosphor screen for MEMS image intensifiers
- Patent number 10,923,244
- Issue date Feb 16, 2021
- Elbit Systems of America, LLC
- Arlynn W. Smith
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Microchannel plate and electron multiplier tube with improved gain...
- Patent number 10,818,484
- Issue date Oct 27, 2020
- Hamamatsu Photonics K.K.
- Takaaki Nagata
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle detecting device and charged particle beam system...
- Patent number 10,037,862
- Issue date Jul 31, 2018
- Carl Zeiss Microscopy, LLC
- Sybren J. Sijbrandij
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System for recording spatial and temporal properties of ions emitte...
- Patent number 9,685,310
- Issue date Jun 20, 2017
- Thermo Finnigan LLC.
- Johnathan Wayne Smith
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Recording spatial and temporal properties of ions emitted from a qu...
- Patent number 9,355,828
- Issue date May 31, 2016
- Thermo Finnigan LLC.
- Johnathan Wayne Smith
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Particle detection system
- Patent number 9,076,629
- Issue date Jul 7, 2015
- Hermes Microvision Inc.
- Yi-Xiang Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Particle beam system
- Patent number 8,598,525
- Issue date Dec 3, 2013
- Carl Zeiss Microscopy GmbH
- Dirk Zeidler
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Particle detection system
- Patent number 8,552,377
- Issue date Oct 8, 2013
- Hermes Microvision, Inc.
- Yi-Xiang Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
In-chamber electron detector
- Patent number 8,164,059
- Issue date Apr 24, 2012
- FEI Company
- Robert Gerlach
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Layered scanning charged particle microscope package for a charged...
- Patent number 8,110,801
- Issue date Feb 7, 2012
- Agilent Technologies, Inc.
- Scott W. Indermuehle
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle system including segmented detection elements
- Patent number 7,928,383
- Issue date Apr 19, 2011
- Hermes-Microvision, Inc.
- Joe Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle detection devices
- Patent number 7,872,236
- Issue date Jan 18, 2011
- Hermes Microvision, Inc.
- Xu Zhang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Microchannel plate with segmented mounting pads
- Patent number 7,555,185
- Issue date Jun 30, 2009
- Burle Technologies, Inc.
- Bruce N. Laprade
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron beam apparatus
- Patent number 7,176,459
- Issue date Feb 13, 2007
- Ebara Corporation
- Kenji Watanabe
- G01 - MEASURING TESTING
Information Patent Grant
Multi-mode charged particle beam device
- Patent number 7,157,720
- Issue date Jan 2, 2007
- Ropintassco Holdings, L.P.
- Henry Shih-Ming Chao
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Detector using microchannel plates and mass spectrometer
- Patent number 7,049,605
- Issue date May 23, 2006
- Jeol Ltd.
- Takayuki Suzuki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron multiplier with enhanced ion conversion
- Patent number 7,026,177
- Issue date Apr 11, 2006
- Burle Technologies, Inc.
- Bruce Laprade
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Detector for a bipolar time-of-flight mass spectrometer
- Patent number 6,958,474
- Issue date Oct 25, 2005
- Burle Technologies, Inc.
- Bruce Laprade
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Bipolar time-of-flight detector, cartridge and detection method
- Patent number 6,828,729
- Issue date Dec 7, 2004
- Burle Technologies, Inc.
- Kevin G. Owens
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometry detector
- Patent number 6,614,019
- Issue date Sep 2, 2003
- W. Bruce Feller
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mask inspecting apparatus and mask inspecting method which can insp...
- Patent number 6,462,346
- Issue date Oct 8, 2002
- NEC Corporation
- Hideo Kobinata
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle detector
- Patent number 6,236,053
- Issue date May 22, 2001
- E1-MUL Technologies Ltd.
- Isaac Shariv
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus and method for inspecting predetermined region on surface...
- Patent number 6,184,526
- Issue date Feb 6, 2001
- Nikon Corporation
- Yoshiaki Kohama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Particle detection and particle detector devices
- Patent number 5,990,483
- Issue date Nov 23, 1999
- El-Mul Technologies Ltd.
- Isaac Shariv
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron multiplier for scanning electron mircroscopes
- Patent number 5,717,206
- Issue date Feb 10, 1998
- Hamamatsu Photonics K.K.
- Hiroyuki Watanabe
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Fast timing position sensitive detector
- Patent number 5,644,128
- Issue date Jul 1, 1997
- Ionwerks
- Hermann Wollnik
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of processing a sample using a charged beam and reactive gas...
- Patent number 5,447,614
- Issue date Sep 5, 1995
- Hitachi, Ltd.
- Yuuichi Hamamura
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
ION DETECTION SYSTEM
- Publication number 20210327697
- Publication date Oct 21, 2021
- Micromass UK Limited
- Martin Raymond Green
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MICROCHANNEL PLATE AND ELECTRON MULTIPLIER TUBE
- Publication number 20200027709
- Publication date Jan 23, 2020
- Hamamatsu Photonics K.K.
- Takaaki NAGATA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION DETECTION SYSTEM
- Publication number 20190287777
- Publication date Sep 19, 2019
- Micromass UK Limited
- Martin Raymond Green
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PARTICLE DETECTION SYSTEM
- Publication number 20130327953
- Publication date Dec 12, 2013
- YI-XIANG WANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IN-CHAMBER ELECTRON DETECTOR
- Publication number 20120199738
- Publication date Aug 9, 2012
- FEI Company
- ROBERT GERLACH
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Particle Beam System
- Publication number 20120199740
- Publication date Aug 9, 2012
- CARL ZEISS NTS GMBH
- Dirk Zeidler
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PARTICLE DETECTION SYSTEM
- Publication number 20120145898
- Publication date Jun 14, 2012
- HERMES MICROVISION, INC.
- YI-XIANG WANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
LAYERED SCANNING CHARGED PARTICLE MICROSCOPE PACKAGE FOR A CHARGED...
- Publication number 20100224779
- Publication date Sep 9, 2010
- Scott W. Indermuehle
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE DETECTION DEVICES
- Publication number 20090090866
- Publication date Apr 9, 2009
- HERMES MICROVISION, INC., TAIWAN
- Xu ZHANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE DETECTION DEVICES
- Publication number 20080315094
- Publication date Dec 25, 2008
- Joe WANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IN-CHAMBER ELECTRON DETECTOR
- Publication number 20080308742
- Publication date Dec 18, 2008
- FEI Company
- Robert Gerlach
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Microchannel plate with segmented mounting pads
- Publication number 20070236118
- Publication date Oct 11, 2007
- Bruce N. Laprade
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Electron beam apparatus
- Publication number 20050253066
- Publication date Nov 17, 2005
- EBARA CORPORATION
- Kenji Watanabe
- G01 - MEASURING TESTING
Information Patent Application
Sample surface inspection method and inspection system
- Publication number 20050194535
- Publication date Sep 8, 2005
- EBARA CORPORATION
- Nobuharu Noji
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Detector using microchannel plates and mass spectrometer
- Publication number 20050184249
- Publication date Aug 25, 2005
- JEOL Ltd.
- Takayuki Suzuki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Multi-mode charged particle beam device
- Publication number 20050030373
- Publication date Feb 10, 2005
- Henry Shih-Ming Chao
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Detector for a bipolar time-of-flight mass spectrometer
- Publication number 20040211896
- Publication date Oct 28, 2004
- Bruce Laprade
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Bipolar time-of-flight detector, cartridge and detection method
- Publication number 20040206911
- Publication date Oct 21, 2004
- Bruce Laprade
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Mass spectrometry detector
- Publication number 20020020817
- Publication date Feb 21, 2002
- W. Bruce Feller
- H01 - BASIC ELECTRIC ELEMENTS

Microchannel plates

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Multiple beam secondary ion mass spectrometry device

Ion detection system

Ion detection system

Phosphor screen for MEMS image intensifiers

Microchannel plate and electron multiplier tube with improved gain...

Charged particle detecting device and charged particle beam system...

System for recording spatial and temporal properties of ions emitte...

Recording spatial and temporal properties of ions emitted from a qu...

Particle detection system

Particle beam system

Particle detection system

In-chamber electron detector

Layered scanning charged particle microscope package for a charged...

Charged particle system including segmented detection elements

Charged particle detection devices

Microchannel plate with segmented mounting pads

Electron beam apparatus

Multi-mode charged particle beam device

Detector using microchannel plates and mass spectrometer

Electron multiplier with enhanced ion conversion

Detector for a bipolar time-of-flight mass spectrometer

Bipolar time-of-flight detector, cartridge and detection method

Mass spectrometry detector

Mask inspecting apparatus and mask inspecting method which can insp...

Charged particle detector

Apparatus and method for inspecting predetermined region on surface...

Particle detection and particle detector devices

Electron multiplier for scanning electron mircroscopes

Fast timing position sensitive detector

Method of processing a sample using a charged beam and reactive gas...

Patents Applicationslast 30 patents

ION DETECTION SYSTEM

MICROCHANNEL PLATE AND ELECTRON MULTIPLIER TUBE

ION DETECTION SYSTEM

PARTICLE DETECTION SYSTEM

IN-CHAMBER ELECTRON DETECTOR

Particle Beam System

PARTICLE DETECTION SYSTEM

LAYERED SCANNING CHARGED PARTICLE MICROSCOPE PACKAGE FOR A CHARGED...

CHARGED PARTICLE DETECTION DEVICES

CHARGED PARTICLE DETECTION DEVICES

IN-CHAMBER ELECTRON DETECTOR

Microchannel plate with segmented mounting pads

Electron beam apparatus

Sample surface inspection method and inspection system

Detector using microchannel plates and mass spectrometer

Multi-mode charged particle beam device

Detector for a bipolar time-of-flight mass spectrometer

Bipolar time-of-flight detector, cartridge and detection method

Mass spectrometry detector