Microprobes

Industry

CPC
G01R1/06744

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Parent Industries

GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00

Current Industry

G01R1/06744Microprobes

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Multi-beam vertical probes with independent arms formed of a high c...
- Patent number 12,000,865
- Issue date Jun 4, 2024
- Microfabrica Inc.
- Uri Frodis
- G01 - MEASURING TESTING
Information Patent Grant
Methods of forming parts using laser machining
- Patent number 11,999,016
- Issue date Jun 4, 2024
- Microfabrica Inc.
- Arun S. Veeramani
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Probes having improved mechanical and/or electrical properties for...
- Patent number 11,982,689
- Issue date May 14, 2024
- Microfabrica Inc.
- Garret R. Smalley
- G01 - MEASURING TESTING
Information Patent Grant
Probe head for reduced-pitch applications
- Patent number 11,953,522
- Issue date Apr 9, 2024
- Technoprobe S.p.A.
- Roberto Crippa
- G01 - MEASURING TESTING
Information Patent Grant
Buckling beam probe arrays and methods for making such arrays inclu...
- Patent number 11,821,918
- Issue date Nov 21, 2023
- Microfabrica Inc.
- Michael S. Lockard
- G01 - MEASURING TESTING
Information Patent Grant
Small pitch integrated knife edge temporary bonding microstructures
- Patent number 11,555,830
- Issue date Jan 17, 2023
- HRL Laboratories, LLC
- Erik S. Daniel
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Contact probe for a testing head for testing electronic devices
- Patent number 11,307,222
- Issue date Apr 19, 2022
- Technoprobe S.p.A.
- Fabio Morgana
- G01 - MEASURING TESTING
Information Patent Grant
Probes having improved mechanical and/or electrical properties for...
- Patent number 11,262,383
- Issue date Mar 1, 2022
- Microfabrica Inc.
- Garret R. Smalley
- G01 - MEASURING TESTING
Information Patent Grant
Nanowire arrays for trace vapor preconcentration
- Patent number 11,046,579
- Issue date Jun 29, 2021
- The Government of the United States of America, as represented by the Secreta...
- Braden C. Giordano
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Probe card device and rectangular probe thereof
- Patent number 11,041,883
- Issue date Jun 22, 2021
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- Chih-Peng Hsieh
- G01 - MEASURING TESTING
Information Patent Grant
Miniature test probe
- Patent number 10,914,756
- Issue date Feb 9, 2021
- Keysight Technologies, Inc.
- Jason Andrew Swaim
- G01 - MEASURING TESTING
Information Patent Grant
Electrically conductive pins for microcircuit tester
- Patent number 10,877,090
- Issue date Dec 29, 2020
- Johnstech International Corporation
- John E. Nelson
- G01 - MEASURING TESTING
Information Patent Grant
Conical nano-carbon material functionalized needle tip and preparat...
- Patent number 10,823,758
- Issue date Nov 3, 2020
- National Center for Nanoscience and Technology
- Jianxun Xu
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Test probe and method of manufacturing a test probe
- Patent number 10,732,201
- Issue date Aug 4, 2020
- Infineon Technologies AG
- Kok Kiat Koo
- G01 - MEASURING TESTING
Information Patent Grant
Through process flow intra-chip and inter-chip electrical analysis...
- Patent number 10,539,589
- Issue date Jan 21, 2020
- FEI EFA, Inc.
- Vladimir Ukraintsev
- G01 - MEASURING TESTING
Information Patent Grant
Nanowire arrays for trace vapor preconcentration
- Patent number 10,501,316
- Issue date Dec 10, 2019
- The Government of the United States of America, as represented by the Secreta...
- Braden C. Giordano
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Probe module having cantilever MEMS probe and method of making the...
- Patent number 10,436,818
- Issue date Oct 8, 2019
- MPI Corporation
- Yu-Chen Hsu
- G01 - MEASURING TESTING
Information Patent Grant
Manufacturing method of contact probes for a testing head
- Patent number 10,401,387
- Issue date Sep 3, 2019
- Technoprobe S.p.A.
- Raffaele Ubaldo Vallauri
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Contact probe and corresponding testing head
- Patent number 10,386,388
- Issue date Aug 20, 2019
- TECHNOPROBE S.P.A.
- Daniele Acconcia
- G01 - MEASURING TESTING
Information Patent Grant
Electrically conductive pins microcircuit tester
- Patent number 10,302,675
- Issue date May 28, 2019
- Johnstech International Corporation
- John E. Nelson
- Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information Patent Grant
Contactor devices with carbon nanotube probes embedded in a flexibl...
- Patent number 10,266,402
- Issue date Apr 23, 2019
- FormFactor, Inc.
- Onnik Yaglioglu
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Perforated contact electrode on vertical nanowire array
- Patent number 10,167,192
- Issue date Jan 1, 2019
- The United States of America, as represented by the Secretary of the Navy
- Hyun Jin In
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Systems and methods for reliable integrated circuit device test too...
- Patent number 10,094,853
- Issue date Oct 9, 2018
- Essai, Inc.
- Nasser Barabi
- G01 - MEASURING TESTING
Information Patent Grant
Resilient interposer with electrically conductive slide-by pins as...
- Patent number 10,073,117
- Issue date Sep 11, 2018
- Johnstech International Corporation
- John E. Nelson
- G01 - MEASURING TESTING
Information Patent Grant
Insulation of micro structures
- Patent number 9,936,918
- Issue date Apr 10, 2018
- Silex Microsystems AB
- Edvard Kalvesten
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Non-permanent termination structure for microprobe measurements
- Patent number 9,915,682
- Issue date Mar 13, 2018
- International Business Machines Corporation
- Matteo Cocchini
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor probe, testing device and testing method for testing...
- Patent number 9,778,284
- Issue date Oct 3, 2017
- Kabushiki Kaisha Nihon Micronics
- Harutada Dewa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multi-electrode conductive probe, manufacturing method of insulatin...
- Patent number 9,739,802
- Issue date Aug 22, 2017
- National Cheng Kung University
- Bernard Haochih Liu
- G01 - MEASURING TESTING
Information Patent Grant
Designed asperity contactors, including nanospikes, for semiconduct...
- Patent number 9,733,272
- Issue date Aug 15, 2017
- Translarity, Inc.
- Douglas A. Preston
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Non-permanent termination structure for microprobe measurements
- Patent number 9,702,906
- Issue date Jul 11, 2017
- International Business Machines Corporation
- Matteo Cocchini
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
HIGH-BANDWIDTH COAXIAL INTERFACE TEST FIXTURE
- Publication number 20240241191
- Publication date Jul 18, 2024
- NVIDIA Corporation
- Yongwei CHEN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CONTACT PROBE
- Publication number 20240175899
- Publication date May 30, 2024
- ENPLAS CORPORATION
- Ichikawa HIROYUKI
- G01 - MEASURING TESTING
Information Patent Application
Multi-Beam Vertical Probes with Independent Arms Formed of a High C...
- Publication number 20240103040
- Publication date Mar 28, 2024
- Microfabrica Inc.
- Uri Frodis
- G01 - MEASURING TESTING
Information Patent Application
Probes Having Improved Mechanical and/or Electrical Properties for...
- Publication number 20240094253
- Publication date Mar 21, 2024
- Microfabrica Inc.
- Garret R. Smalley
- G01 - MEASURING TESTING
Information Patent Application
COAXIAL WAFER PROBE AND CORRESPONDING MANUFACTURING METHOD
- Publication number 20240085454
- Publication date Mar 14, 2024
- Federal Institute of Metrology METAS
- Johannes Hoffmann
- G01 - MEASURING TESTING
Information Patent Application
PROBE JOINT AND SPRING PROBE COMPRISING THE SAME
- Publication number 20240085458
- Publication date Mar 14, 2024
- AZOTH STUDIO LTD. CO.
- Zhou Yi Lin
- G01 - MEASURING TESTING
Information Patent Application
PROBE HEAD AND PROBE ASSEMBLY
- Publication number 20240036073
- Publication date Feb 1, 2024
- AZOTH STUDIO LTD. CO.
- Zhou Yi Lin
- G01 - MEASURING TESTING
Information Patent Application
BUCKLING BEAM PROBE ARRAYS AND METHODS FOR MAKING SUCH ARRAYS INCLU...
- Publication number 20240019463
- Publication date Jan 18, 2024
- Microfabrica Inc.
- MIchael S. Lockard
- G01 - MEASURING TESTING
Information Patent Application
A LASER ETCHING METHOD FOR MEMS PROBES
- Publication number 20240001485
- Publication date Jan 4, 2024
- MAXONE SEMICONDUCTOR CO., LTD.
- Haichao YU
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
Pin-Type Probes for Contacting Electronic Circuits and Methods for...
- Publication number 20230324435
- Publication date Oct 12, 2023
- Microfabrica Inc.
- Arun S. Veeramani
- G01 - MEASURING TESTING
Information Patent Application
Micromachined Mechanical Part and Methods of Fabrication Thereof
- Publication number 20230296645
- Publication date Sep 21, 2023
- THE UNIVERSITY COURT OF THE UNIVERSITY OF GLASGOW
- Thomas McMullen
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
SPRING PROBE ASSEMBLY FOR A KELVIN TESTING SYSTEM
- Publication number 20230258688
- Publication date Aug 17, 2023
- Johnstech International Corporation
- Valts Treibergs
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR TESTING APPARATUS WITH ADAPTOR
- Publication number 20230024045
- Publication date Jan 26, 2023
- TEST21 TAIWAN CORPORATION
- Shun-Bon HO
- G01 - MEASURING TESTING
Information Patent Application
PROBE HEAD FOR REDUCED-PITCH APPLICATIONS
- Publication number 20230021227
- Publication date Jan 19, 2023
- TECHNOPROBE S.P.A.
- Roberto CRIPPA
- G01 - MEASURING TESTING
Information Patent Application
CONTACTOR BLOCK OF SELF-ALIGNING VERTICAL PROBE CARD AND MANUFACTUR...
- Publication number 20220149555
- Publication date May 12, 2022
- Micro Friend Co., Ltd
- Yong Ho CHO
- G01 - MEASURING TESTING
Information Patent Application
PROBE MODULE HAVING MICROELECTROMECHANICAL PROBE AND METHOD OF MANU...
- Publication number 20220043027
- Publication date Feb 10, 2022
- MPI Corporation
- Yu-Chen HSU
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
SMALL PITCH INTEGRATED KNIFE EDGE TEMPORARY BONDING MICROSTRUCTURES
- Publication number 20210063439
- Publication date Mar 4, 2021
- HRL LABORATORIES, LLC
- Erik S. DANIEL
- G01 - MEASURING TESTING
Information Patent Application
CONTACT PROBE FOR A TESTING HEAD FOR TESTING ELECTRONIC DEVICES
- Publication number 20200379009
- Publication date Dec 3, 2020
- Technoprobe S.p.A.
- Fabio MORGANA
- G01 - MEASURING TESTING
Information Patent Application
TEST PIN CONTACT BUFFER
- Publication number 20200348338
- Publication date Nov 5, 2020
- APEX PROBES TECHNOLOGY CO., LTD.
- MING-DAO WU
- G01 - MEASURING TESTING
Information Patent Application
WAFER LEVEL PROBING OF ELECTRICAL BIOSENSORS
- Publication number 20200292578
- Publication date Sep 17, 2020
- FemtoDx
- Pritiraj Mohanty
- G01 - MEASURING TESTING
Information Patent Application
PROBE MODULE HAVING MICROELECTROMECHANICAL PROBE AND METHOD OF MANU...
- Publication number 20200116758
- Publication date Apr 16, 2020
- MPI Corporation
- Yu-Chen HSU
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
NANOWIRE ARRAYS FOR TRACE VAPOR PRECONCENTRATION
- Publication number 20200109049
- Publication date Apr 9, 2020
- The Government of the United States of America, as represented by the Secreta...
- Braden C. Giordano
- B82 - NANO-TECHNOLOGY
Information Patent Application
MINIATURE TEST PROBE
- Publication number 20200057094
- Publication date Feb 20, 2020
- KEYSIGHT TECHNOLOGIES, INC.
- Jason Andrew Swaim
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
PROBE CARD DEVICE AND RECTANGULAR PROBE THEREOF
- Publication number 20190317131
- Publication date Oct 17, 2019
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- CHIH-PENG HSIEH
- G01 - MEASURING TESTING
Information Patent Application
TAPERED NANO-CARBON MATERIAL FUNCTIONALIZED NEEDLE TIP AND PREPARAT...
- Publication number 20190107556
- Publication date Apr 11, 2019
- National Center for Nanoscience and Technology
- Jianxun Xu
- B82 - NANO-TECHNOLOGY
Information Patent Application
Electrically Conductive Pins Microcircuit Tester
- Publication number 20190004091
- Publication date Jan 3, 2019
- Johnstech International Corporation
- John E. Nelson
- G01 - MEASURING TESTING
Information Patent Application
NANOWIRE ARRAYS FOR TRACE VAPOR PRECONCENTRATION
- Publication number 20180237294
- Publication date Aug 23, 2018
- The Government of the United States of America, as represented by the Secreta...
- Braden C. Giordano
- B82 - NANO-TECHNOLOGY
Information Patent Application
CONTACT PROBE AND CORRESPONDING TESTING HEAD
- Publication number 20180024166
- Publication date Jan 25, 2018
- Technoprobe S.p.A.
- Daniele Acconcia
- G01 - MEASURING TESTING
Information Patent Application
DESIGNED ASPERITY CONTACTORS, INCLUDING NANOSPIKES, FOR SEMICONDUCT...
- Publication number 20180003737
- Publication date Jan 4, 2018
- TRANSLARITY, INC.
- Douglas A. Preston
- G01 - MEASURING TESTING
Information Patent Application
Electrically Conductive Pins For Microcircuit Tester
- Publication number 20170315169
- Publication date Nov 2, 2017
- Johnstech International Corporation
- John E. Nelson
- G01 - MEASURING TESTING

Microprobes

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Multi-beam vertical probes with independent arms formed of a high c...

Methods of forming parts using laser machining

Probes having improved mechanical and/or electrical properties for...

Probe head for reduced-pitch applications

Buckling beam probe arrays and methods for making such arrays inclu...

Small pitch integrated knife edge temporary bonding microstructures

Contact probe for a testing head for testing electronic devices

Probes having improved mechanical and/or electrical properties for...

Nanowire arrays for trace vapor preconcentration

Probe card device and rectangular probe thereof

Miniature test probe

Electrically conductive pins for microcircuit tester

Conical nano-carbon material functionalized needle tip and preparat...

Test probe and method of manufacturing a test probe

Through process flow intra-chip and inter-chip electrical analysis...

Nanowire arrays for trace vapor preconcentration

Probe module having cantilever MEMS probe and method of making the...

Manufacturing method of contact probes for a testing head

Contact probe and corresponding testing head

Electrically conductive pins microcircuit tester

Contactor devices with carbon nanotube probes embedded in a flexibl...

Perforated contact electrode on vertical nanowire array

Systems and methods for reliable integrated circuit device test too...

Resilient interposer with electrically conductive slide-by pins as...

Insulation of micro structures

Non-permanent termination structure for microprobe measurements

Semiconductor probe, testing device and testing method for testing...

Multi-electrode conductive probe, manufacturing method of insulatin...

Designed asperity contactors, including nanospikes, for semiconduct...

Non-permanent termination structure for microprobe measurements

Patents Applicationslast 30 patents

HIGH-BANDWIDTH COAXIAL INTERFACE TEST FIXTURE

CONTACT PROBE

Multi-Beam Vertical Probes with Independent Arms Formed of a High C...

Probes Having Improved Mechanical and/or Electrical Properties for...

COAXIAL WAFER PROBE AND CORRESPONDING MANUFACTURING METHOD

PROBE JOINT AND SPRING PROBE COMPRISING THE SAME

PROBE HEAD AND PROBE ASSEMBLY

BUCKLING BEAM PROBE ARRAYS AND METHODS FOR MAKING SUCH ARRAYS INCLU...

A LASER ETCHING METHOD FOR MEMS PROBES

Pin-Type Probes for Contacting Electronic Circuits and Methods for...

Micromachined Mechanical Part and Methods of Fabrication Thereof

SPRING PROBE ASSEMBLY FOR A KELVIN TESTING SYSTEM

SEMICONDUCTOR TESTING APPARATUS WITH ADAPTOR

PROBE HEAD FOR REDUCED-PITCH APPLICATIONS

CONTACTOR BLOCK OF SELF-ALIGNING VERTICAL PROBE CARD AND MANUFACTUR...

PROBE MODULE HAVING MICROELECTROMECHANICAL PROBE AND METHOD OF MANU...

SMALL PITCH INTEGRATED KNIFE EDGE TEMPORARY BONDING MICROSTRUCTURES

CONTACT PROBE FOR A TESTING HEAD FOR TESTING ELECTRONIC DEVICES

TEST PIN CONTACT BUFFER

WAFER LEVEL PROBING OF ELECTRICAL BIOSENSORS

PROBE MODULE HAVING MICROELECTROMECHANICAL PROBE AND METHOD OF MANU...

NANOWIRE ARRAYS FOR TRACE VAPOR PRECONCENTRATION

MINIATURE TEST PROBE

PROBE CARD DEVICE AND RECTANGULAR PROBE THEREOF

TAPERED NANO-CARBON MATERIAL FUNCTIONALIZED NEEDLE TIP AND PREPARAT...

Electrically Conductive Pins Microcircuit Tester

NANOWIRE ARRAYS FOR TRACE VAPOR PRECONCENTRATION

CONTACT PROBE AND CORRESPONDING TESTING HEAD

DESIGNED ASPERITY CONTACTORS, INCLUDING NANOSPIKES, FOR SEMICONDUCT...

Electrically Conductive Pins For Microcircuit Tester