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Monitoring the movement or position of the probe
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PHYSICS
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Measuring instruments
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SCANNING-PROBE TECHNIQUES OR APPARATUS APPLICATIONS OF SCANNING-PROBE TECHNIQUES
Current Industry
G01Q20/00
Monitoring the movement or position of the probe
Sub Industries
G01Q20/02
by optical means
G01Q20/04
Self-detecting probes, i.e. wherein the probe itself generates a signal representative of its position
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last 30 patents
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Patent Grant
Debris removal from high aspect structures
Patent number
11,964,310
Issue date
Apr 23, 2024
Bruker Nano, Inc.
Tod Evan Robinson
B08 - CLEANING
Information
Patent Grant
Method and control unit for demodulation
Patent number
11,946,949
Issue date
Apr 2, 2024
Technische Universitat Wien
Dominik Kohl
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Nanoscale dynamic mechanical analysis via atomic force microscopy (...
Patent number
11,940,461
Issue date
Mar 26, 2024
BRUKER NANO, INC.
Sergey Osechinskiy
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Coated active cantilever probes for use in topography imaging in op...
Patent number
11,906,546
Issue date
Feb 20, 2024
Massachusetts Institute of Technology
Fangzhou Xia
G01 - MEASURING TESTING
Information
Patent Grant
Method and device for simultaneous independent motion measurement o...
Patent number
11,892,471
Issue date
Feb 6, 2024
Shenyang Institute of Automation, Chinese Academy of Sciences
Lianqing Liu
G01 - MEASURING TESTING
Information
Patent Grant
Cantilever with a collocated piezoelectric actuator-sensor pair
Patent number
11,852,654
Issue date
Dec 26, 2023
Board of Regents, The University of Texas System
Seyed Omid Reza Moheimani
G01 - MEASURING TESTING
Information
Patent Grant
Scanning probe microscope and method for resonance-enhanced detecti...
Patent number
11,846,653
Issue date
Dec 19, 2023
MOLECULAR VISTA, INC.
William Morrison
G01 - MEASURING TESTING
Information
Patent Grant
Systems, method and computer-accessible medium for providing balanc...
Patent number
11,835,545
Issue date
Dec 5, 2023
The Trustees of Columbia University In the City of New York
Alexander Swinton McLeod
Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information
Patent Grant
3D multipurpose scanning microscopy probes
Patent number
11,815,527
Issue date
Nov 14, 2023
New York University
Mohammad A. Qasaimeh
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus and method for a scanning probe microscope
Patent number
11,796,563
Issue date
Oct 24, 2023
Carl Zeiss SMT GmbH
Ulrich Matejka
G01 - MEASURING TESTING
Information
Patent Grant
Integrated dual-probe rapid in-situ switching measurement method an...
Patent number
11,789,037
Issue date
Oct 17, 2023
Shenyang Institute of Automation, Chinese Academy of Sciences
Lianqing Liu
G01 - MEASURING TESTING
Information
Patent Grant
Method of imaging a surface using a scanning probe microscope
Patent number
11,733,265
Issue date
Aug 22, 2023
INFINITESIMA LIMITED
Andrew Humphris
G01 - MEASURING TESTING
Information
Patent Grant
Cantilever, scanning probe microscope, and measurement method using...
Patent number
11,733,264
Issue date
Aug 22, 2023
HITACHI HIGH-TECH CORPORATION
Kaifeng Zhang
G01 - MEASURING TESTING
Information
Patent Grant
AFM imaging with creep correction
Patent number
11,714,104
Issue date
Aug 1, 2023
Bruker Nano, Inc.
Jason Osborne
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Atomic force microscope using artificial intelligence object recogn...
Patent number
11,709,180
Issue date
Jul 25, 2023
Chungbuk National University Industry-Academic Cooperation Foundation
Man Hee Lee
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method and apparatus for examining a measuring tip of a scanning pr...
Patent number
11,680,963
Issue date
Jun 20, 2023
Carl Zeiss SMT GmbH
Kinga Kornilov
G01 - MEASURING TESTING
Information
Patent Grant
High speed atomic force profilometry of large areas
Patent number
11,668,730
Issue date
Jun 6, 2023
Bruker Nano, Inc.
Jason Osborne
G01 - MEASURING TESTING
Information
Patent Grant
Method and device for measuring dimension of semiconductor structure
Patent number
11,656,245
Issue date
May 23, 2023
Changxin Memory Technologies, Inc.
Zheng Li
G01 - MEASURING TESTING
Information
Patent Grant
Automated optimization of AFM light source positioning
Patent number
11,644,478
Issue date
May 9, 2023
Oxford Instruments Asylum Research, Inc.
Jason Bemis
G01 - MEASURING TESTING
Information
Patent Grant
Atomic force microscopy cantilever, system and method
Patent number
11,644,481
Issue date
May 9, 2023
Nederlandse Organisatie voor toegepast-nataurwetenschappelijk onderzoek TNO
Maarten Hubertus Van Es
G01 - MEASURING TESTING
Information
Patent Grant
Heterodyne scanning probe microscopy method and scanning probe micr...
Patent number
11,635,448
Issue date
Apr 25, 2023
Nederlandse Organisatie voor toegepast-natuurwetenschappelijk onderzoek TNO
Sri Ram Shankar Rajadurai
G01 - MEASURING TESTING
Information
Patent Grant
Nanoscale dynamic mechanical analysis via atomic force microscopy (...
Patent number
11,635,449
Issue date
Apr 25, 2023
BRUKER NANO, INC.
Sergey Osechinskiy
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Apparatus and method for examining and/or processing a sample
Patent number
11,592,461
Issue date
Feb 28, 2023
Carl Zeiss SMT GmbH
Christof Baur
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Scanning probe microscope, scan head and method
Patent number
11,592,460
Issue date
Feb 28, 2023
Nederlandse Organisatie voor toegepast-natuurwetenschappelijk onderzoek TNO
Roelof Willem Herfst
G01 - MEASURING TESTING
Information
Patent Grant
Probe for detecting near field and near-field detecting system incl...
Patent number
11,579,168
Issue date
Feb 14, 2023
Samsung Electronics Co., Ltd.
Ikseon Jeon
G01 - MEASURING TESTING
Information
Patent Grant
Debris removal in high aspect structures
Patent number
11,577,286
Issue date
Feb 14, 2023
Bruker Nano, Inc.
Tod Evan Robinson
B08 - CLEANING
Information
Patent Grant
Truncated non-linear interferometer-based sensor system
Patent number
11,561,453
Issue date
Jan 24, 2023
UT-Battelle, LLC
Raphael C. Pooser
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Torsion wing probe assembly
Patent number
11,555,827
Issue date
Jan 17, 2023
Bruker Nano, Inc.
Shuiqing Hu
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for aligning a probe for scanning probe micros...
Patent number
11,549,963
Issue date
Jan 10, 2023
Imec VZW
Kristof Paredis
G01 - MEASURING TESTING
Information
Patent Grant
Scanning probe microscope and scanning probe microscope optical axi...
Patent number
11,519,936
Issue date
Dec 6, 2022
Shimadzu Corporation
Masato Hirade
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
DEVICE FOR MEASURING AND/OR MODIFYING A SURFACE
Publication number
20240118310
Publication date
Apr 11, 2024
Paris Sciences et Lettres
Antoine Niguès
G01 - MEASURING TESTING
Information
Patent Application
AUTOMATED LANDING METHOD OF A SCANNING PROBE MICROSCOPY SYSTEM AND...
Publication number
20240110939
Publication date
Apr 4, 2024
Nearfield Instruments B.V.
Hamed SADEGHIAN MARNANI
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM, METHOD, COMPUTER-ACCESSIBLE MEDIUM AND APPARATUS FOR DNA MA...
Publication number
20240077516
Publication date
Mar 7, 2024
Virginia Commonwealth University
Jason REED
C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information
Patent Application
DEFECT DETECTION USING THERMAL LASER STIMULATION AND ATOMIC FORCE M...
Publication number
20240069095
Publication date
Feb 29, 2024
Intel Corporation
Huei Hao YAP
G01 - MEASURING TESTING
Information
Patent Application
ATOMIC FORCE MICROSCOPE
Publication number
20240012021
Publication date
Jan 11, 2024
Oxford Instruments Asylum Research, Inc.
Aleks Labuda
G01 - MEASURING TESTING
Information
Patent Application
ARRANGEMENT FOR AND METHOD OF DETERMINING CANTILEVER DEFLECTION IN...
Publication number
20230393169
Publication date
Dec 7, 2023
Nearfield Instruments B.V.
Hamed SADEGHIAN MARNANI
G01 - MEASURING TESTING
Information
Patent Application
NANO ROBOTIC SYSTEM FOR HIGH THROUGHPUT SINGLE CELL DNA SEQUENCING
Publication number
20230358782
Publication date
Nov 9, 2023
Versitech Limited
Ning Xi
C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information
Patent Application
METHOD FOR MEASURING, BY MEASUREMENT DEVICE, CHARACTERISTICS OF SUR...
Publication number
20230324433
Publication date
Oct 12, 2023
PARK SYSTEMS CORP.
Ahjin JO
G01 - MEASURING TESTING
Information
Patent Application
AUTOMATED OPTIMIZATION OF AFM LIGHT SOURCE POSITIONING
Publication number
20230251284
Publication date
Aug 10, 2023
Oxford Instruments Asylum Research, Inc.
Jason Bemis
G01 - MEASURING TESTING
Information
Patent Application
Nanoscale Dynamic Mechanical Analysis via Atomic Force Microscopy (...
Publication number
20230243867
Publication date
Aug 3, 2023
Bruker Nano, Inc.
Sergey Osechinskiy
B82 - NANO-TECHNOLOGY
Information
Patent Application
APPARATUS AND METHOD FOR IDENTIFYING TARGET POSITION IN ATOMIC FORC...
Publication number
20230204624
Publication date
Jun 29, 2023
Park Systems Corp.
JeongHun AN
G01 - MEASURING TESTING
Information
Patent Application
PROBE TIP X-Y LOCATION IDENTIFICATION USING A CHARGED PARTICLE BEAM
Publication number
20230168274
Publication date
Jun 1, 2023
Innovatum Instruments Inc.
Richard E Stallcup
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
TRUNCATED NONLINEAR INTERFEROMETER-BASED SENSOR SYSTEM
Publication number
20230161220
Publication date
May 25, 2023
UT-Battelle, LLC
Raphael C. Pooser
B82 - NANO-TECHNOLOGY
Information
Patent Application
Debris Removal From High Aspect Structures
Publication number
20230158555
Publication date
May 25, 2023
Bruker Nano, Inc.
Tod Evan Robinson
G01 - MEASURING TESTING
Information
Patent Application
METHOD OF IMAGING A SURFACE USING A SCANNING PROBE MICROSCOPE
Publication number
20230030991
Publication date
Feb 2, 2023
INFINITESIMA LIMITED
Andrew Humphris
G01 - MEASURING TESTING
Information
Patent Application
SCANNING PROBE MICROSCOPE AND METHOD FOR RESONANCE-ENHANCED DETECTI...
Publication number
20230018874
Publication date
Jan 19, 2023
MOLECULAR VISTA, INC.
William Morrison
G01 - MEASURING TESTING
Information
Patent Application
INTEGRATED DUAL-PROBE RAPID IN-SITU SWITCHING MEASUREMENT METHOD AN...
Publication number
20230019239
Publication date
Jan 19, 2023
Shenyang Institute of Automation, Chinese Academy of Sciences
Lianqing LIU
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND DEVICE FOR SIMULTANEOUS INDEPENDENT MOTION MEASUREMENT O...
Publication number
20230020068
Publication date
Jan 19, 2023
Shenyang Institute of Automation, Chinese Academy of Sciences
Lianqing LIU
G01 - MEASURING TESTING
Information
Patent Application
AFM Imaging with Creep Correction
Publication number
20220381803
Publication date
Dec 1, 2022
Bruker Nano, Inc.
Jason Osborne
B82 - NANO-TECHNOLOGY
Information
Patent Application
ATOMIC FORCE MICROSCOPE USING ARTIFICIAL INTELLIGENCE OBJECT RECOGN...
Publication number
20220373575
Publication date
Nov 24, 2022
CHUNGBUK NATIONAL UNIVERSITY INDUSTRY-ACADEMIC COOPERATION FOUNDATION
Man Hee LEE
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
INFORMATION PROVIDING SYSTEM, SERVER DEVICE, AND ANALYZER
Publication number
20220357359
Publication date
Nov 10, 2022
Shimadzu Corporation
Kazuma WATANABE
G01 - MEASURING TESTING
Information
Patent Application
CANTILEVER, SCANNING PROBE MICROSCOPE, AND MEASUREMENT METHOD USING...
Publication number
20220260611
Publication date
Aug 18, 2022
HITACHI HIGH-TECH CORPORATION
Kaifeng ZHANG
G01 - MEASURING TESTING
Information
Patent Application
Nanoscale Dynamic Mechanical Analysis via Atomic Force Microscopy (...
Publication number
20220252638
Publication date
Aug 11, 2022
Bruker Nano, Inc.
Sergey Osechinskiy
B82 - NANO-TECHNOLOGY
Information
Patent Application
COATED ACTIVE CANTILEVER PROBES FOR USE IN TOPOGRAPHY IMAGING IN OP...
Publication number
20220244288
Publication date
Aug 4, 2022
Massachusetts Institute of Technology
Fangzhou XIA
G01 - MEASURING TESTING
Information
Patent Application
AUTOMATED OPTIMIZATION OF AFM LIGHT SOURCE POSITIONING
Publication number
20220244289
Publication date
Aug 4, 2022
Oxford Instruments Asylum Research, Inc.
Jason Bemis
G01 - MEASURING TESTING
Information
Patent Application
HETERODYNE SCANNING PROBE MICROSCOPY METHOD AND SCANNING PROBE MICR...
Publication number
20220229088
Publication date
Jul 21, 2022
NEDERLANDSE ORGANISATIE VOOR TOEGEPAST- NATUURWETENSCHAPPELIJK ONDERZOEK TNO
Sri Ram Shankar RAJADURAI
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND DEVICE FOR MEASURING DIMENSION OF SEMICONDUCTOR STRUCTURE
Publication number
20220229087
Publication date
Jul 21, 2022
CHANGXIN MEMORY TECHNOLOGIES, INC
Zheng LI
G01 - MEASURING TESTING
Information
Patent Application
APPARATUS AND METHOD FOR EXAMINING AND/OR PROCESSING A SAMPLE
Publication number
20220178965
Publication date
Jun 9, 2022
Carl Zeiss SMT GMBH
Christof Baur
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
PROBE FOR DETECTING NEAR FIELD AND NEAR-FIELD DETECTING SYSTEM INCL...
Publication number
20220155340
Publication date
May 19, 2022
Samsung Electronics Co., Ltd.
Ikseon Jeon
G01 - MEASURING TESTING
Information
Patent Application
3D MULTIPURPOSE SCANNING MICROSCOPY PROBES
Publication number
20220146549
Publication date
May 12, 2022
New York University in Abu Dhabi corporation
Mohammad A. Qasaimeh
G01 - MEASURING TESTING