Multiple probes

Industry

CPC
G01R1/073

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Parent Industries

GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00

Current Industry

G01R1/073Multiple probes

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Probe position monitoring structure and method of monitoring positi...
- Patent number 12,339,315
- Issue date Jun 24, 2025
- United Semiconductor Japan Co., Ltd.
- Yasunobu Torii
- G01 - MEASURING TESTING
Information Patent Grant
Probe card and method for repairing probe card
- Patent number 12,339,314
- Issue date Jun 24, 2025
- Japan Electronic Materials Corporation
- Yutaka Tomita
- G01 - MEASURING TESTING
Information Patent Grant
Probe card
- Patent number 12,332,278
- Issue date Jun 17, 2025
- Japan Electronic Materials Corporation
- Chikaomi Mori
- G01 - MEASURING TESTING
Information Patent Grant
Method for probe pin retrieval
- Patent number 12,332,291
- Issue date Jun 17, 2025
- Taiwan Semiconductor Manufacturing Company Ltd.
- Ming-Cheng Hsu
- G01 - MEASURING TESTING
Information Patent Grant
Probe pad with built-in interconnect structure
- Patent number 12,327,770
- Issue date Jun 10, 2025
- International Business Machines Corporation
- Ashim Dutta
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Interface board for testing image sensor, test system having the sa...
- Patent number 12,328,424
- Issue date Jun 10, 2025
- Samsung Electronics Co., Ltd.
- Shinki Jeong
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for fabricating test socket
- Patent number 12,320,833
- Issue date Jun 3, 2025
- Leeno Industrial Inc.
- Seungha Baek
- B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information Patent Grant
Injection device, semiconductor testing system and its testing method
- Patent number 12,313,654
- Issue date May 27, 2025
- Hermes Testing Solutions Inc.
- Bo-Lung Chen
- G01 - MEASURING TESTING
Information Patent Grant
Testing head having improved frequency properties
- Patent number 12,313,655
- Issue date May 27, 2025
- Technoprobe S.p.A.
- Flavio Maggioni
- G01 - MEASURING TESTING
Information Patent Grant
Multilayer circuit board with offset connection pads and inclined i...
- Patent number 12,306,210
- Issue date May 20, 2025
- Kyocera Corporation
- Hitoshi Tega
- G01 - MEASURING TESTING
Information Patent Grant
Space transformers configured to be utilized in a probe system, pro...
- Patent number 12,306,243
- Issue date May 20, 2025
- FormFactor, Inc.
- Ernest Gammon McReynolds
- G01 - MEASURING TESTING
Information Patent Grant
Controlling alignment during a thermal cycle
- Patent number 12,298,328
- Issue date May 13, 2025
- AEHR Test Systems
- Scott E. Lindsey
- G01 - MEASURING TESTING
Information Patent Grant
Wedge amplitude-modulation probe card and a main body thereof
- Patent number 12,292,456
- Issue date May 6, 2025
- MAXONE SEMICONDUCTOR CO., LTD.
- Haichao Yu
- G01 - MEASURING TESTING
Information Patent Grant
Flexible membrane adapted to carry high-frequency (RF) power signal...
- Patent number 12,292,457
- Issue date May 6, 2025
- Technoprobe S.p.A.
- Flavio Maggioni
- G01 - MEASURING TESTING
Information Patent Grant
Test system and test device
- Patent number 12,287,364
- Issue date Apr 29, 2025
- LEADPOWER-SEMI CO., LTD.
- Cheng-Jyun Wang
- G01 - MEASURING TESTING
Information Patent Grant
Methods and compositions for increasing the potency of antifungal a...
- Patent number 12,280,032
- Issue date Apr 22, 2025
- Pacific Northwest Research Institute
- Catherine Ludlow
- C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information Patent Grant
Wafer test system, probe card replacing method, and prober
- Patent number 12,282,061
- Issue date Apr 22, 2025
- Tokyo Seimitsu Co., Ltd.
- Akira Yamaguchi
- G01 - MEASURING TESTING
Information Patent Grant
Coupling probe for micro device inspection
- Patent number 12,276,679
- Issue date Apr 15, 2025
- VueReal Inc.
- Gholamreza Chaji
- G01 - MEASURING TESTING
Information Patent Grant
Probe card
- Patent number 12,270,828
- Issue date Apr 8, 2025
- POINT ENGINEERING CO., LTD.
- Bum Mo Ahn
- G01 - MEASURING TESTING
Information Patent Grant
Method for achieving the measuring slip of membrane probes
- Patent number 12,270,830
- Issue date Apr 8, 2025
- MAXONE SEMICONDUCTOR CO., LTD.
- Liangyu Zhao
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for protecting probe card and probes using the...
- Patent number 12,270,831
- Issue date Apr 8, 2025
- Intel Corporation
- Arthur Isakharov
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor wafer configured for single touch-down testing
- Patent number 12,270,853
- Issue date Apr 8, 2025
- SanDisk Technologies, Inc.
- Toru Miwa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Load pull tuner for waveguide wafer probe
- Patent number 12,265,101
- Issue date Apr 1, 2025
- Christos Tsironis
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Contact probe for probe heads of electronic devices
- Patent number 12,259,407
- Issue date Mar 25, 2025
- Technoprobe S.p.A.
- Riccardo Vettori
- G01 - MEASURING TESTING
Information Patent Grant
Test device and probe polishing method
- Patent number 12,259,419
- Issue date Mar 25, 2025
- Tokyo Electron Limited
- Masahito Kobayashi
- B24 - GRINDING POLISHING
Information Patent Grant
Needle block for easy adjustment of tip length of needle unit
- Patent number 12,253,542
- Issue date Mar 18, 2025
- WILLTECHNOLOGY CO., LTD.
- Song Yeon Wi
- G01 - MEASURING TESTING
Information Patent Grant
Lidless BGA socket apparatus for testing semiconductor device
- Patent number 12,248,001
- Issue date Mar 11, 2025
- HICON CO., LTD.
- Dong Weon Hwang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Clustered rigid wafer test probe
- Patent number 12,248,003
- Issue date Mar 11, 2025
- International Business Machines Corporation
- David Michael Audette
- G01 - MEASURING TESTING
Information Patent Grant
Method for producing a probe used for testing integrated electronic...
- Patent number 12,248,012
- Issue date Mar 11, 2025
- STMicroelectronics S.r.l.
- Alberto Pagani
- G01 - MEASURING TESTING
Information Patent Grant
Membrane probe card and its probe head
- Patent number 12,248,004
- Issue date Mar 11, 2025
- MAXONE SEMICONDUCTOR CO., LTD.
- Liangyu Zhao
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
COPLANARITY ASSIST UNIT, SEMICONDUCTOR TESTING APPARATUS INCLUDING...
- Publication number 20250208201
- Publication date Jun 26, 2025
- Taiwan Semiconductor Manufacturing Company Limited
- Jyun-Cheng Huang
- G01 - MEASURING TESTING
Information Patent Application
System-Level Testing of a Processing Device Incorporated in a Silic...
- Publication number 20250208210
- Publication date Jun 26, 2025
- Google LLC
- Bhaskar Narayana Talatam
- G01 - MEASURING TESTING
Information Patent Application
PROBE HEAD, PROBE CARD, TEST EQUIPMENT, AND ELECTRONIC DEVICE TESTE...
- Publication number 20250208168
- Publication date Jun 26, 2025
- MPI CORPORATION
- Chin-Tien YANG
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION METHOD AND INSPECTION DEVICE
- Publication number 20250208169
- Publication date Jun 26, 2025
- TOKYO ELECTRON LIMITED
- Kentaro KONISHI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ONE HANDED TEST LEADS HOLDER TOOL AND TEST LEADS HOLDER OF A TEST I...
- Publication number 20250208166
- Publication date Jun 26, 2025
- John Riccitelli
- G01 - MEASURING TESTING
Information Patent Application
TESTING APPARATUS AND METHOD OF RANGE ADJUSTMENT FOR SAME
- Publication number 20250208170
- Publication date Jun 26, 2025
- CONTEMPORARY AMPEREX TECHNOLOGY (HONG KONG) LIMITED
- Wen XUE
- G01 - MEASURING TESTING
Information Patent Application
PROBE, PROBE CARD, AND PROBE MANUFACTURING METHOD
- Publication number 20250189559
- Publication date Jun 12, 2025
- JAPAN ELECTRONIC MATERIALS CORPORATION
- Chikaomi MORI
- G01 - MEASURING TESTING
Information Patent Application
ANODIZED FILM STRUCTURE AND INSPECTION DEVICE COMPRISING SAME
- Publication number 20250189560
- Publication date Jun 12, 2025
- POINT ENGINEERING CO., LTD.
- Bum Mo AHN
- G01 - MEASURING TESTING
Information Patent Application
CHIP TESTING STRUCTURE
- Publication number 20250180604
- Publication date Jun 5, 2025
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Kuan-Chun CHEN
- G01 - MEASURING TESTING
Information Patent Application
WAFER TEST SYSTEM AND OPERATING METHOD THEREOF
- Publication number 20250180637
- Publication date Jun 5, 2025
- SK HYNIX INC.
- Dong Kil KIM
- G01 - MEASURING TESTING
Information Patent Application
ELECTRO-CONDUCTIVE CONTACT PIN AND VERTICAL PROBE CARD HAVING SAME
- Publication number 20250180603
- Publication date Jun 5, 2025
- POINT ENGINEERING CO., LTD.
- Bum Mo AHN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PROBE CARD
- Publication number 20250172587
- Publication date May 29, 2025
- Unimicron Technology Corp.
- Chih-Peng Hsieh
- G01 - MEASURING TESTING
Information Patent Application
PROBE SYSTEM, PROBE CARD, PROBE HEAD, AND PROBE FOR TESTING ELECTRO...
- Publication number 20250172589
- Publication date May 29, 2025
- MPI CORPORATION
- Chin-Tien YANG
- G01 - MEASURING TESTING
Information Patent Application
PROBE CARD FOR TESTING SEMICONDUCTOR DEVICE
- Publication number 20250172590
- Publication date May 29, 2025
- LX Semicon Co., Ltd.
- Jin Hwan KIM
- G01 - MEASURING TESTING
Information Patent Application
PROBE CARD
- Publication number 20250172588
- Publication date May 29, 2025
- Unimicron Technology Corp.
- Chih-Peng Hsieh
- G01 - MEASURING TESTING
Information Patent Application
A Probe Card Stroke Compensation System and Method
- Publication number 20250164527
- Publication date May 22, 2025
- Shanghai Zenfocus Semi-Tech Co., Ltd.
- Jian Liang
- G01 - MEASURING TESTING
Information Patent Application
WAFER ACCEPTANCE TEST TOOL AND TEST METHOD USING THEREOF
- Publication number 20250155491
- Publication date May 15, 2025
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Jin YAO
- G01 - MEASURING TESTING
Information Patent Application
MULTI-WAFER INSPECTION SYSTEM
- Publication number 20250155492
- Publication date May 15, 2025
- SEMICS INC.
- Ki Tack PARK
- G01 - MEASURING TESTING
Information Patent Application
PROBE CARD HOLDER FOR WAFER TESTING
- Publication number 20250155496
- Publication date May 15, 2025
- Unitest Inc.
- Dae Kyoung KIM
- G01 - MEASURING TESTING
Information Patent Application
PROBE CARD, PROBE HEAD, METHOD FOR MANUFACTURING THE PROBE HEAD, AN...
- Publication number 20250147072
- Publication date May 8, 2025
- MPI CORPORATION
- Chin-Tien YANG
- G01 - MEASURING TESTING
Information Patent Application
PROBE CARD AND METHOD FOR DESIGN PROBE CARD AND MEASURING METHOD AN...
- Publication number 20250147073
- Publication date May 8, 2025
- MPI CORPORATION
- CHIEN-MING LO
- G01 - MEASURING TESTING
Information Patent Application
ELECTRICAL DETECTION METHOD
- Publication number 20250147071
- Publication date May 8, 2025
- Siliconware Precision Industries Co., Ltd.
- Chun-Yi WU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PROBE CARD INCLUDING POWER COMPENSATION CIRCUIT AND TEST SYSTEM INC...
- Publication number 20250138088
- Publication date May 1, 2025
- Samsung Electronics Co., Ltd.
- Seongkwan Lee
- G01 - MEASURING TESTING
Information Patent Application
PROBE CARD PMIC AND SIGNAL SWITCH IC SUPPORTING EFFICIENT CHANNEL C...
- Publication number 20250138051
- Publication date May 1, 2025
- TECHWIDU CO., LTD.
- Hyoung-Suk YOO
- G01 - MEASURING TESTING
Information Patent Application
MANAGEMENT SYSTEM FOR PROBE CARDS
- Publication number 20250130253
- Publication date Apr 24, 2025
- STAR TECHNOLOGIES, INC.
- CHOON LEONG LOU
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS FOR TESTING INTEGRATED CIRCUITS
- Publication number 20250130256
- Publication date Apr 24, 2025
- MEDIATEK INC.
- Jing-Hui Zhuang
- G01 - MEASURING TESTING
Information Patent Application
TESTING SYSTEM, BATTERY PRODUCTION LINE, AND TESTING METHOD
- Publication number 20250123307
- Publication date Apr 17, 2025
- Contemporary Amperex Technology Co., Limited
- Weihong XIE
- G01 - MEASURING TESTING
Information Patent Application
TESTING HEAD WITH VERTICAL PROBES FOR A PROBE CARD AND CORRESPONDIN...
- Publication number 20250123308
- Publication date Apr 17, 2025
- Microtest S.p.A.
- Giuseppe AMELIO
- G01 - MEASURING TESTING
Information Patent Application
APPROACHES AND PROBES FOR EXCITATION, DETECTION, AND SENSING OF DEV...
- Publication number 20250123320
- Publication date Apr 17, 2025
- InZiv Ltd.
- David Judah Lewis
- G01 - MEASURING TESTING
Information Patent Application
PROBE CARD AND INSPECTION SYSTEM
- Publication number 20250123326
- Publication date Apr 17, 2025
- Kabushiki Kaisha Nihon Micronics
- Hisao NARITA
- G01 - MEASURING TESTING

Multiple probes

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Probe position monitoring structure and method of monitoring positi...

Probe card and method for repairing probe card

Probe card

Method for probe pin retrieval

Probe pad with built-in interconnect structure

Interface board for testing image sensor, test system having the sa...

Method for fabricating test socket

Injection device, semiconductor testing system and its testing method

Testing head having improved frequency properties

Multilayer circuit board with offset connection pads and inclined i...

Space transformers configured to be utilized in a probe system, pro...

Controlling alignment during a thermal cycle

Wedge amplitude-modulation probe card and a main body thereof

Flexible membrane adapted to carry high-frequency (RF) power signal...

Test system and test device

Methods and compositions for increasing the potency of antifungal a...

Wafer test system, probe card replacing method, and prober

Coupling probe for micro device inspection

Probe card

Method for achieving the measuring slip of membrane probes

Apparatus and method for protecting probe card and probes using the...

Semiconductor wafer configured for single touch-down testing

Load pull tuner for waveguide wafer probe

Contact probe for probe heads of electronic devices

Test device and probe polishing method

Needle block for easy adjustment of tip length of needle unit

Lidless BGA socket apparatus for testing semiconductor device

Clustered rigid wafer test probe

Method for producing a probe used for testing integrated electronic...

Membrane probe card and its probe head

Patents Applicationslast 30 patents

COPLANARITY ASSIST UNIT, SEMICONDUCTOR TESTING APPARATUS INCLUDING...

System-Level Testing of a Processing Device Incorporated in a Silic...

PROBE HEAD, PROBE CARD, TEST EQUIPMENT, AND ELECTRONIC DEVICE TESTE...

INSPECTION METHOD AND INSPECTION DEVICE

ONE HANDED TEST LEADS HOLDER TOOL AND TEST LEADS HOLDER OF A TEST I...

TESTING APPARATUS AND METHOD OF RANGE ADJUSTMENT FOR SAME

PROBE, PROBE CARD, AND PROBE MANUFACTURING METHOD

ANODIZED FILM STRUCTURE AND INSPECTION DEVICE COMPRISING SAME

CHIP TESTING STRUCTURE

WAFER TEST SYSTEM AND OPERATING METHOD THEREOF

ELECTRO-CONDUCTIVE CONTACT PIN AND VERTICAL PROBE CARD HAVING SAME

PROBE CARD

PROBE SYSTEM, PROBE CARD, PROBE HEAD, AND PROBE FOR TESTING ELECTRO...

PROBE CARD FOR TESTING SEMICONDUCTOR DEVICE

PROBE CARD

A Probe Card Stroke Compensation System and Method

WAFER ACCEPTANCE TEST TOOL AND TEST METHOD USING THEREOF

MULTI-WAFER INSPECTION SYSTEM

PROBE CARD HOLDER FOR WAFER TESTING

PROBE CARD, PROBE HEAD, METHOD FOR MANUFACTURING THE PROBE HEAD, AN...

PROBE CARD AND METHOD FOR DESIGN PROBE CARD AND MEASURING METHOD AN...

ELECTRICAL DETECTION METHOD

PROBE CARD INCLUDING POWER COMPENSATION CIRCUIT AND TEST SYSTEM INC...

PROBE CARD PMIC AND SIGNAL SWITCH IC SUPPORTING EFFICIENT CHANNEL C...

MANAGEMENT SYSTEM FOR PROBE CARDS

APPARATUS FOR TESTING INTEGRATED CIRCUITS

TESTING SYSTEM, BATTERY PRODUCTION LINE, AND TESTING METHOD

TESTING HEAD WITH VERTICAL PROBES FOR A PROBE CARD AND CORRESPONDIN...

APPROACHES AND PROBES FOR EXCITATION, DETECTION, AND SENSING OF DEV...

PROBE CARD AND INSPECTION SYSTEM