Multiple probes

Industry

CPC
G01R1/073

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Parent Industries

GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00

Current Industry

G01R1/073Multiple probes

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Wedge amplitude-modulation probe card and a main body thereof
- Patent number 12,292,456
- Issue date May 6, 2025
- MAXONE SEMICONDUCTOR CO., LTD.
- Haichao Yu
- G01 - MEASURING TESTING
Information Patent Grant
Flexible membrane adapted to carry high-frequency (RF) power signal...
- Patent number 12,292,457
- Issue date May 6, 2025
- Technoprobe S.p.A.
- Flavio Maggioni
- G01 - MEASURING TESTING
Information Patent Grant
Test system and test device
- Patent number 12,287,364
- Issue date Apr 29, 2025
- LEADPOWER-SEMI CO., LTD.
- Cheng-Jyun Wang
- G01 - MEASURING TESTING
Information Patent Grant
Methods and compositions for increasing the potency of antifungal a...
- Patent number 12,280,032
- Issue date Apr 22, 2025
- Pacific Northwest Research Institute
- Catherine Ludlow
- C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information Patent Grant
Wafer test system, probe card replacing method, and prober
- Patent number 12,282,061
- Issue date Apr 22, 2025
- Tokyo Seimitsu Co., Ltd.
- Akira Yamaguchi
- G01 - MEASURING TESTING
Information Patent Grant
Coupling probe for micro device inspection
- Patent number 12,276,679
- Issue date Apr 15, 2025
- VueReal Inc.
- Gholamreza Chaji
- G01 - MEASURING TESTING
Information Patent Grant
Probe card
- Patent number 12,270,828
- Issue date Apr 8, 2025
- POINT ENGINEERING CO., LTD.
- Bum Mo Ahn
- G01 - MEASURING TESTING
Information Patent Grant
Method for achieving the measuring slip of membrane probes
- Patent number 12,270,830
- Issue date Apr 8, 2025
- MAXONE SEMICONDUCTOR CO., LTD.
- Liangyu Zhao
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for protecting probe card and probes using the...
- Patent number 12,270,831
- Issue date Apr 8, 2025
- Intel Corporation
- Arthur Isakharov
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor wafer configured for single touch-down testing
- Patent number 12,270,853
- Issue date Apr 8, 2025
- SanDisk Technologies, Inc.
- Toru Miwa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Load pull tuner for waveguide wafer probe
- Patent number 12,265,101
- Issue date Apr 1, 2025
- Christos Tsironis
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Contact probe for probe heads of electronic devices
- Patent number 12,259,407
- Issue date Mar 25, 2025
- Technoprobe S.p.A.
- Riccardo Vettori
- G01 - MEASURING TESTING
Information Patent Grant
Test device and probe polishing method
- Patent number 12,259,419
- Issue date Mar 25, 2025
- Tokyo Electron Limited
- Masahito Kobayashi
- B24 - GRINDING POLISHING
Information Patent Grant
Needle block for easy adjustment of tip length of needle unit
- Patent number 12,253,542
- Issue date Mar 18, 2025
- WILLTECHNOLOGY CO., LTD.
- Song Yeon Wi
- G01 - MEASURING TESTING
Information Patent Grant
Lidless BGA socket apparatus for testing semiconductor device
- Patent number 12,248,001
- Issue date Mar 11, 2025
- HICON CO., LTD.
- Dong Weon Hwang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Clustered rigid wafer test probe
- Patent number 12,248,003
- Issue date Mar 11, 2025
- International Business Machines Corporation
- David Michael Audette
- G01 - MEASURING TESTING
Information Patent Grant
Method for producing a probe used for testing integrated electronic...
- Patent number 12,248,012
- Issue date Mar 11, 2025
- STMicroelectronics S.r.l.
- Alberto Pagani
- G01 - MEASURING TESTING
Information Patent Grant
Membrane probe card and its probe head
- Patent number 12,248,004
- Issue date Mar 11, 2025
- MAXONE SEMICONDUCTOR CO., LTD.
- Liangyu Zhao
- G01 - MEASURING TESTING
Information Patent Grant
Electrical connecting apparatus
- Patent number 12,244,083
- Issue date Mar 4, 2025
- Kabushiki Kaisha Nihon Micronics
- Shou Harako
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Test apparatus
- Patent number 12,241,926
- Issue date Mar 4, 2025
- Advantest Corporation
- Naoyoshi Watanabe
- G01 - MEASURING TESTING
Information Patent Grant
Wafer test system and operating method thereof
- Patent number 12,241,930
- Issue date Mar 4, 2025
- SK hynix Inc.
- Dong Kil Kim
- G01 - MEASURING TESTING
Information Patent Grant
Probe card device and circuit protection assembly thereof
- Patent number 12,243,703
- Issue date Mar 4, 2025
- Global Unichip Corporation
- Chih-Chieh Liao
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Composite intermediary device using vertical probe for wafer testing
- Patent number 12,235,313
- Issue date Feb 25, 2025
- SYU GUANG TECHNOLOGY CO., LTD.
- Kun Yu Wu
- G01 - MEASURING TESTING
Information Patent Grant
Wafer probe device
- Patent number 12,228,590
- Issue date Feb 18, 2025
- Winbond Electronics Corp.
- Ting-Ming Fu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Contact pins for test sockets and test sockets comprising the same
- Patent number 12,222,367
- Issue date Feb 11, 2025
- Okins Electronics Co., Ltd.
- Jin Kook Jun
- G01 - MEASURING TESTING
Information Patent Grant
MEMS probe card
- Patent number 12,222,369
- Issue date Feb 11, 2025
- MAXONE SEMICONDUCTOR CO., LTD.
- Liangyu Zhao
- G01 - MEASURING TESTING
Information Patent Grant
Probe head and probe card having same
- Patent number 12,222,370
- Issue date Feb 11, 2025
- POINT ENGINEERING CO., LTD.
- Bum Mo Ahn
- G01 - MEASURING TESTING
Information Patent Grant
Tilt calibration for probe systems
- Patent number 12,216,140
- Issue date Feb 4, 2025
- The Boeing Company
- Peter D. Brewer
- G01 - MEASURING TESTING
Information Patent Grant
Vascular sap measurement sensor
- Patent number 12,216,076
- Issue date Feb 4, 2025
- National University Corporation Kagawa University
- Fusao Shimokawa
- G01 - MEASURING TESTING
Information Patent Grant
Method of manufacturing a probe tip and a probe tip manufactured by...
- Patent number 12,210,038
- Issue date Jan 28, 2025
- TSE CO., LTD.
- Young Min Lee
- C25 - ELECTROLYTIC OR ELECTROPHORETIC PROCESSES APPARATUS THEREFOR

Patents Applicationslast 30 patents

Information Patent Application
PROBE CARD INCLUDING POWER COMPENSATION CIRCUIT AND TEST SYSTEM INC...
- Publication number 20250138088
- Publication date May 1, 2025
- Samsung Electronics Co., Ltd.
- Seongkwan Lee
- G01 - MEASURING TESTING
Information Patent Application
PROBE CARD PMIC AND SIGNAL SWITCH IC SUPPORTING EFFICIENT CHANNEL C...
- Publication number 20250138051
- Publication date May 1, 2025
- TECHWIDU CO., LTD.
- Hyoung-Suk YOO
- G01 - MEASURING TESTING
Information Patent Application
MANAGEMENT SYSTEM FOR PROBE CARDS
- Publication number 20250130253
- Publication date Apr 24, 2025
- STAR TECHNOLOGIES, INC.
- CHOON LEONG LOU
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS FOR TESTING INTEGRATED CIRCUITS
- Publication number 20250130256
- Publication date Apr 24, 2025
- MEDIATEK INC.
- Jing-Hui Zhuang
- G01 - MEASURING TESTING
Information Patent Application
TESTING SYSTEM, BATTERY PRODUCTION LINE, AND TESTING METHOD
- Publication number 20250123307
- Publication date Apr 17, 2025
- Contemporary Amperex Technology Co., Limited
- Weihong XIE
- G01 - MEASURING TESTING
Information Patent Application
TESTING HEAD WITH VERTICAL PROBES FOR A PROBE CARD AND CORRESPONDIN...
- Publication number 20250123308
- Publication date Apr 17, 2025
- Microtest S.p.A.
- Giuseppe AMELIO
- G01 - MEASURING TESTING
Information Patent Application
APPROACHES AND PROBES FOR EXCITATION, DETECTION, AND SENSING OF DEV...
- Publication number 20250123320
- Publication date Apr 17, 2025
- InZiv Ltd.
- David Judah Lewis
- G01 - MEASURING TESTING
Information Patent Application
PROBE CARD AND INSPECTION SYSTEM
- Publication number 20250123326
- Publication date Apr 17, 2025
- Kabushiki Kaisha Nihon Micronics
- Hisao NARITA
- G01 - MEASURING TESTING
Information Patent Application
MEASURING DEVICE
- Publication number 20250116686
- Publication date Apr 10, 2025
- FUJI CORPORATION
- Toshiyuki SAWADA
- G01 - MEASURING TESTING
Information Patent Application
PROBE STORAGE JIG, PROBE STORAGE SYSTEM, AND PROBE STORAGE METHOD
- Publication number 20250116685
- Publication date Apr 10, 2025
- Kabushiki Kaisha Nihon Micronics
- Toshinaga TAKEYA
- G01 - MEASURING TESTING
Information Patent Application
CHARGE/DISCHARGE INSPECTION DEVICE AND CHARGE/DISCHARGE INSPECTION...
- Publication number 20250110177
- Publication date Apr 3, 2025
- NIPPON STEEL TEXENG. CO., LTD.
- Shigeru SAITO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PROBE CARD AND THERMAL CONDUCTION DEVICE THEREOF
- Publication number 20250110153
- Publication date Apr 3, 2025
- STAR TECHNOLOGIES, INC.
- Choon Leong LOU
- G01 - MEASURING TESTING
Information Patent Application
PROBE CARD DEVICE
- Publication number 20250110154
- Publication date Apr 3, 2025
- teCat Technologies (Suzhou) Limited
- CHOON LEONG LOU
- G01 - MEASURING TESTING
Information Patent Application
PROBE ASSEMBLY WITH MULTIPLE SPACERS AND METHODS OF ASSEMBLING THE...
- Publication number 20250102540
- Publication date Mar 27, 2025
- Taiwan Semiconductor Manufacturing Company Limited
- Ming-Cheng HSU
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF HAVING GOOD THERMAL ISOLATION IN WAFER TEST CASSETTE
- Publication number 20250093407
- Publication date Mar 20, 2025
- XINGR TECHNOLOGIES (ZHEJIANG) LIMITED
- CHOON LEONG LOU
- G01 - MEASURING TESTING
Information Patent Application
PROBER, PERFORMANCE BOARD, PROBE CARD, AND SUBSTRATE INSPECTING APP...
- Publication number 20250093384
- Publication date Mar 20, 2025
- KIOXIA Corporation
- Hiroki KAMATA
- G01 - MEASURING TESTING
Information Patent Application
PROBE HEAD STRUCTURES FOR CIRCUIT PROBE TEST SYSTEMS AND METHODS OF...
- Publication number 20250093385
- Publication date Mar 20, 2025
- Taiwan Semiconductor Manufacturing Company Limited
- Kuan Chun CHEN
- G01 - MEASURING TESTING
Information Patent Application
WAFER TESTING CASSETTE
- Publication number 20250093386
- Publication date Mar 20, 2025
- XINGR TECHNOLOGIES (ZHEJIANG) LIMITED
- CHOON LEONG LOU
- G01 - MEASURING TESTING
Information Patent Application
PROBE STRUCTURE FOR MICRO DEVICE INSPECTION
- Publication number 20250093412
- Publication date Mar 20, 2025
- VueReal Inc.
- Gholamreza CHAJI
- G01 - MEASURING TESTING
Information Patent Application
COMPOSITE PROBE, METHOD FOR ATTACHING PROBE, AND METHOD FOR MANUFAC...
- Publication number 20250085311
- Publication date Mar 13, 2025
- JAPAN ELECTRONIC MATERIALS CORPORATION
- Kazuo YOKOYAMA
- G01 - MEASURING TESTING
Information Patent Application
LOW CROSS-TALK INTERCONNECTION DEVICE WITH IMPEDANCE-TUNED HYBRID S...
- Publication number 20250085309
- Publication date Mar 13, 2025
- ESSAI, INC.
- Nasser Barabi
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR MANUFACTURING APPARATUS
- Publication number 20250087526
- Publication date Mar 13, 2025
- Kabushiki Kaisha Toshiba
- Shun HASEBE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR WAFER HANDLING APPARATUS AND SEMICONDUCTOR WAFER TEST...
- Publication number 20250076366
- Publication date Mar 6, 2025
- Advantest Corporation
- Aritomo Kikuchi
- G01 - MEASURING TESTING
Information Patent Application
Apparatus, System and Method for Repairing a Test Contact Arrangement
- Publication number 20250076342
- Publication date Mar 6, 2025
- Pac Tech - Packaging Technologies GmbH
- Thorsten Krause
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION METHOD AND INSPECTION APPARATUS
- Publication number 20250076372
- Publication date Mar 6, 2025
- TOKYO ELECTRON LIMITED
- Sooraj RAJENDRAN
- G01 - MEASURING TESTING
Information Patent Application
FLEXIBLE CIRCUIT BOARD
- Publication number 20250071889
- Publication date Feb 27, 2025
- Chipbond Technology Corporation
- Kung-Tzu Tu
- G01 - MEASURING TESTING
Information Patent Application
PROBE DEVICES AND PROBE CONTROL APPARATUS
- Publication number 20250067776
- Publication date Feb 27, 2025
- Parcan Nanotech Co., Ltd.
- Xiangqian ZHOU
- G01 - MEASURING TESTING
Information Patent Application
MULTILAYER SUBSTRATE AND JIG
- Publication number 20250063660
- Publication date Feb 20, 2025
- NIDEC ADVANCE TECHNOLOGY CORPORATION
- Shigeki SAKAI
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
TESTING MODULE
- Publication number 20250060405
- Publication date Feb 20, 2025
- NANYA TECHNOLOGY CORPORATION
- Wei-Zhong LI
- G01 - MEASURING TESTING
Information Patent Application
CONTACT PROBE FOR PROBE HEADS OF ELECTRONIC DEVICES AND CORRESPONDI...
- Publication number 20250052783
- Publication date Feb 13, 2025
- TECHNOPROBE S.P.A.
- Riccardo VETTORI
- G01 - MEASURING TESTING

Multiple probes

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Wedge amplitude-modulation probe card and a main body thereof

Flexible membrane adapted to carry high-frequency (RF) power signal...

Test system and test device

Methods and compositions for increasing the potency of antifungal a...

Wafer test system, probe card replacing method, and prober

Coupling probe for micro device inspection

Probe card

Method for achieving the measuring slip of membrane probes

Apparatus and method for protecting probe card and probes using the...

Semiconductor wafer configured for single touch-down testing

Load pull tuner for waveguide wafer probe

Contact probe for probe heads of electronic devices

Test device and probe polishing method

Needle block for easy adjustment of tip length of needle unit

Lidless BGA socket apparatus for testing semiconductor device

Clustered rigid wafer test probe

Method for producing a probe used for testing integrated electronic...

Membrane probe card and its probe head

Electrical connecting apparatus

Test apparatus

Wafer test system and operating method thereof

Probe card device and circuit protection assembly thereof

Composite intermediary device using vertical probe for wafer testing

Wafer probe device

Contact pins for test sockets and test sockets comprising the same

MEMS probe card

Probe head and probe card having same

Tilt calibration for probe systems

Vascular sap measurement sensor

Method of manufacturing a probe tip and a probe tip manufactured by...

Patents Applicationslast 30 patents

PROBE CARD INCLUDING POWER COMPENSATION CIRCUIT AND TEST SYSTEM INC...

PROBE CARD PMIC AND SIGNAL SWITCH IC SUPPORTING EFFICIENT CHANNEL C...

MANAGEMENT SYSTEM FOR PROBE CARDS

APPARATUS FOR TESTING INTEGRATED CIRCUITS

TESTING SYSTEM, BATTERY PRODUCTION LINE, AND TESTING METHOD

TESTING HEAD WITH VERTICAL PROBES FOR A PROBE CARD AND CORRESPONDIN...

APPROACHES AND PROBES FOR EXCITATION, DETECTION, AND SENSING OF DEV...

PROBE CARD AND INSPECTION SYSTEM

MEASURING DEVICE

PROBE STORAGE JIG, PROBE STORAGE SYSTEM, AND PROBE STORAGE METHOD

CHARGE/DISCHARGE INSPECTION DEVICE AND CHARGE/DISCHARGE INSPECTION...

PROBE CARD AND THERMAL CONDUCTION DEVICE THEREOF

PROBE CARD DEVICE

PROBE ASSEMBLY WITH MULTIPLE SPACERS AND METHODS OF ASSEMBLING THE...

METHOD OF HAVING GOOD THERMAL ISOLATION IN WAFER TEST CASSETTE

PROBER, PERFORMANCE BOARD, PROBE CARD, AND SUBSTRATE INSPECTING APP...

PROBE HEAD STRUCTURES FOR CIRCUIT PROBE TEST SYSTEMS AND METHODS OF...

WAFER TESTING CASSETTE

PROBE STRUCTURE FOR MICRO DEVICE INSPECTION

COMPOSITE PROBE, METHOD FOR ATTACHING PROBE, AND METHOD FOR MANUFAC...

LOW CROSS-TALK INTERCONNECTION DEVICE WITH IMPEDANCE-TUNED HYBRID S...

SEMICONDUCTOR MANUFACTURING APPARATUS

SEMICONDUCTOR WAFER HANDLING APPARATUS AND SEMICONDUCTOR WAFER TEST...

Apparatus, System and Method for Repairing a Test Contact Arrangement

INSPECTION METHOD AND INSPECTION APPARATUS

FLEXIBLE CIRCUIT BOARD

PROBE DEVICES AND PROBE CONTROL APPARATUS

MULTILAYER SUBSTRATE AND JIG

TESTING MODULE

CONTACT PROBE FOR PROBE HEADS OF ELECTRONIC DEVICES AND CORRESPONDI...