Multiple probes

Industry

CPC
G01R1/073

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Parent Industries

GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00

Current Industry

G01R1/073Multiple probes

Industries

Patents Grantslast 30 patents

Information Patent Grant
Maintaining the shape of a circuit board
- Patent number 12,127,334
- Issue date Oct 22, 2024
- Dis Tech America, LLC
- Heng-Kit Too
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Test device
- Patent number 12,117,484
- Issue date Oct 15, 2024
- TECAT TECHNOLOGIES (SUZHOU) LIMITED
- Choon Leong Lou
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor substrate yield prediction based on spectra data from...
- Patent number 12,111,355
- Issue date Oct 8, 2024
- Onto Innovation Inc.
- Xin Song
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Modular vertical probe card
- Patent number 12,111,336
- Issue date Oct 8, 2024
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- Wei-Jhih Su
- G01 - MEASURING TESTING
Information Patent Grant
Coaxial probe
- Patent number 12,111,343
- Issue date Oct 8, 2024
- Xcerra Corporation
- Yukang Feng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Circuit board and probe card
- Patent number 12,114,423
- Issue date Oct 8, 2024
- Kyocera Corporation
- Youichiro Honda
- G01 - MEASURING TESTING
Information Patent Grant
Electrical component inspection instrument
- Patent number 12,105,117
- Issue date Oct 1, 2024
- Japan Aviation Electronics Industry, Limited
- Junji Oosaka
- G01 - MEASURING TESTING
Information Patent Grant
Method for fabricating test socket
- Patent number 12,105,133
- Issue date Oct 1, 2024
- Leeno Industrial Inc.
- Seungha Baek
- G01 - MEASURING TESTING
Information Patent Grant
Testing substrate and manufacturing method thereof and probe card
- Patent number 12,108,543
- Issue date Oct 1, 2024
- Hermes Testing Solutions Inc.
- Chiao-Pei Chen
- G01 - MEASURING TESTING
Information Patent Grant
Method for determining material parameters of a multilayer test sample
- Patent number 12,105,136
- Issue date Oct 1, 2024
- KLA Corporation
- Alberto Cagliani
- G01 - MEASURING TESTING
Information Patent Grant
Electrical contactor and electrical connecting apparatus
- Patent number 12,105,119
- Issue date Oct 1, 2024
- Kabushiki Kaisha Nihon Micronics
- Tomoaki Kuga
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Test socket
- Patent number 12,105,138
- Issue date Oct 1, 2024
- Leeno Industrial Inc.
- Young taek Shin
- G01 - MEASURING TESTING
Information Patent Grant
Testing head with an improved contact between contact probes and gu...
- Patent number 12,105,118
- Issue date Oct 1, 2024
- Technoprobe S.p.A.
- Roberto Crippa
- G01 - MEASURING TESTING
Information Patent Grant
Probe card and wafer testing assembly thereof
- Patent number 12,099,078
- Issue date Sep 24, 2024
- MPI Corporation
- Yi-Chien Tsai
- G01 - MEASURING TESTING
Information Patent Grant
Detection apparatus and anti-bending device thereof
- Patent number 12,099,083
- Issue date Sep 24, 2024
- JTRON TECHNOLOGY CORP.
- Chen-Nan Chen
- G01 - MEASURING TESTING
Information Patent Grant
Safety system for needle probe card for high-voltage and high-curre...
- Patent number 12,092,659
- Issue date Sep 17, 2024
- CREA COLLAUDI ELETTRONICI AUTOMATIZZATI S.R.L.
- Marco Marcinno′
- G01 - MEASURING TESTING
Information Patent Grant
Probe card
- Patent number 12,092,660
- Issue date Sep 17, 2024
- NHK Spring Co., Ltd.
- Naruhiko Nishiwaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Cantilever probe card device and elastic probe thereof
- Patent number 12,092,661
- Issue date Sep 17, 2024
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- Wei-Jhih Su
- G01 - MEASURING TESTING
Information Patent Grant
Fine pitch probe card
- Patent number 12,085,589
- Issue date Sep 10, 2024
- Xallent Inc.
- Kwame Amponsah
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Vertical probe head with improved contact properties towards a devi...
- Patent number 12,085,588
- Issue date Sep 10, 2024
- Technoprobe S.p.A.
- Stefano Felici
- G01 - MEASURING TESTING
Information Patent Grant
Compliant pin probes with extension springs, methods for making, an...
- Patent number 12,078,657
- Issue date Sep 3, 2024
- Microfabrica Inc.
- Ming Ting Wu
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor probe
- Patent number 12,078,658
- Issue date Sep 3, 2024
- Chien Cheng Tien
- G01 - MEASURING TESTING
Information Patent Grant
Method of inspecting semiconductor device, semiconductor device, an...
- Patent number 12,078,659
- Issue date Sep 3, 2024
- Renesas Electronics Corporation
- Masaaki Tanimura
- G01 - MEASURING TESTING
Information Patent Grant
Inspection jig and inspection device
- Patent number 12,072,352
- Issue date Aug 27, 2024
- Nidec-Read Corporation
- Michio Kaida
- G01 - MEASURING TESTING
Information Patent Grant
Probes with planar unbiased spring elements for electronic componen...
- Patent number 12,066,462
- Issue date Aug 20, 2024
- Microfabrica Inc.
- Arun S. Veeramani
- G01 - MEASURING TESTING
Information Patent Grant
Sensor device, water amount measurement device, water amount measur...
- Patent number 12,066,461
- Issue date Aug 20, 2024
- Sony Group Corporation
- Atsushi Yamada
- G01 - MEASURING TESTING
Information Patent Grant
Inspection jig and circuit board inspection apparatus including the...
- Patent number 12,055,579
- Issue date Aug 6, 2024
- Nidec-Read Corporation
- Kohei Tsumura
- G01 - MEASURING TESTING
Information Patent Grant
Contact terminal, inspection jig, and inspection device
- Patent number 12,055,561
- Issue date Aug 6, 2024
- Nidec-Read Corporation
- Norihiro Ota
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Contact terminal, inspection jig, and inspection apparatus
- Patent number 12,055,562
- Issue date Aug 6, 2024
- Nidec-Read Corporation
- Yusuke Yokota
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Probe card, apparatus and method for detecting contact force of pro...
- Patent number 12,055,563
- Issue date Aug 6, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd
- Ming-Cheng Hsu
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
PROBE CARD
- Publication number 20240353445
- Publication date Oct 24, 2024
- NHK Spring Co., Ltd.
- Naruhiko Nishiwaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PROBE MODULE FOR TESTING OF ELECTRICAL RESISTIVITY OF CONDUCTIVE FI...
- Publication number 20240345131
- Publication date Oct 17, 2024
- NATIONAL INSTITUTE OF METROLOGY, CHINA
- Senlin JIN
- G01 - MEASURING TESTING
Information Patent Application
PROBE CARD MONITORING SYSTEM AND MONITORING METHOD THEREOF
- Publication number 20240345134
- Publication date Oct 17, 2024
- HERMES TESTING SOLUTIONS INC.
- Wei-Ting Chen
- G01 - MEASURING TESTING
Information Patent Application
Roller Tap Down Technique for Probe Arrays
- Publication number 20240345133
- Publication date Oct 17, 2024
- Sterling Tadashi Collins
- G01 - MEASURING TESTING
Information Patent Application
PROBE CARD AND CALIBRATION METHOD FOR PROBER
- Publication number 20240337678
- Publication date Oct 10, 2024
- United Microelectronics Corp.
- Huan-Chen Peng
- G01 - MEASURING TESTING
Information Patent Application
APPARATUSES AND METHODS FOR ELECTROCHEMICAL IMPEDANCE SPECTROSCOPY...
- Publication number 20240329084
- Publication date Oct 3, 2024
- Analog Devices International Unlimited Company
- Claire LEVEUGLE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PROBE CARD
- Publication number 20240329085
- Publication date Oct 3, 2024
- YOKOWO CO., LTD.
- Takeshi TODOROKI
- G01 - MEASURING TESTING
Information Patent Application
PROBER AND TEMPERATURE MEASUREMENT METHOD
- Publication number 20240329118
- Publication date Oct 3, 2024
- TOKYO SEIMITSU CO., LTD.
- Hiroo Tamura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
STATIONARY PROBE, MOVABLE PROBE, AND PROBING DEVICE CAPABLE OF ADJU...
- Publication number 20240329083
- Publication date Oct 3, 2024
- MPI CORPORATION
- CHIA-NAN CHOU
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS FOR TESTING AND/OR OPERATING ELECTRONIC DEVICES
- Publication number 20240329121
- Publication date Oct 3, 2024
- KIUTRA GMBH
- Jan Spallek
- G01 - MEASURING TESTING
Information Patent Application
TEST FIXTURE AND EARLY WARNING SYSTEM
- Publication number 20240329079
- Publication date Oct 3, 2024
- TRIPLE WIN TECHNOLOGY(SHENZHEN) CO.LTD.
- YING-QUAN ZHAO
- G01 - MEASURING TESTING
Information Patent Application
PROBE CARD, AND SUPPORTING STRUCTURE AND PROBE STRUCTURE THEREOF
- Publication number 20240319230
- Publication date Sep 26, 2024
- STAR TECHNOLOGIES, INC.
- HUNG-CHAN HUANG
- G01 - MEASURING TESTING
Information Patent Application
WAFER TESTING APPARATUS AND CONTROL METHOD THEREOF
- Publication number 20240319229
- Publication date Sep 26, 2024
- Samsung Electronics Co., LTD
- Chunghyun KIM
- G01 - MEASURING TESTING
Information Patent Application
UNIVERSAL PROBE CARD AND TESTING METHOD
- Publication number 20240310412
- Publication date Sep 19, 2024
- PANJIT INTERNATIONAL INC.
- CHUNG-HSIUNG HO
- G01 - MEASURING TESTING
Information Patent Application
TEST DEVICE AND TEST METHOD IMPLEMENTING THE SAME
- Publication number 20240310439
- Publication date Sep 19, 2024
- Samsung Electronics Co., Ltd.
- Gyuyeol KIM
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT UNIT
- Publication number 20240302409
- Publication date Sep 12, 2024
- NHK Spring Co, Ltd.
- Tsuyoshi Inuma
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR WAFER TESTING APPARATUS, SEMICONDUCTOR WAFER TESTING...
- Publication number 20240302411
- Publication date Sep 12, 2024
- Advantest Corporation
- Yuto Mori
- G01 - MEASURING TESTING
Information Patent Application
TEST SYSTEM AND TEST DEVICE
- Publication number 20240302427
- Publication date Sep 12, 2024
- Leadpower-semi CO., LTD.
- Cheng-Jyun WANG
- G01 - MEASURING TESTING
Information Patent Application
Electrical Testing Device with Probe Having an Adjustable Angle
- Publication number 20240288473
- Publication date Aug 29, 2024
- Snap-on Incorporated
- Nicholas A. Gabbey
- G01 - MEASURING TESTING
Information Patent Application
PROBE CARD
- Publication number 20240280610
- Publication date Aug 22, 2024
- JAPAN ELECTRONIC MATERIALS CORPORATION
- Tatsunori SHIMIZU
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATIC BOARD PROBING STATION
- Publication number 20240280629
- Publication date Aug 22, 2024
- NVIDIA Corporation
- Akhilesh Sandeep Thakur
- G01 - MEASURING TESTING
Information Patent Application
PROBE CARD FOR FINE PITCH CIRCUIT PROBE TESTING OF SEMICONDUCTOR IN...
- Publication number 20240272200
- Publication date Aug 15, 2024
- Taiwan Semiconductor Manufacturing Company Limited
- Yuan-Li LIN
- G01 - MEASURING TESTING
Information Patent Application
CONTACT PROBE AND PROBE UNIT
- Publication number 20240264200
- Publication date Aug 8, 2024
- NHK Spring Co., Ltd.
- Kazuya Soma
- G01 - MEASURING TESTING
Information Patent Application
PROBE POSITION MONITORING STRUCTURE AND METHOD OF MONITORING POSITI...
- Publication number 20240264225
- Publication date Aug 8, 2024
- United Semiconductor Japan Co., Ltd.
- Yasunobu Torii
- G01 - MEASURING TESTING
Information Patent Application
PROBE CARD
- Publication number 20240264038
- Publication date Aug 8, 2024
- SK HYNIX INC.
- Sung Wook CHO
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND TECHNIQUES FOR DETERMINING WHEN A PROBE TIP IS PROXIMAT...
- Publication number 20240255571
- Publication date Aug 1, 2024
- Xallent Inc.
- Kwame Amponsah
- G01 - MEASURING TESTING
Information Patent Application
PROBE CARD AND TEST APPARATUS INCLUDING PROBE CARD
- Publication number 20240255545
- Publication date Aug 1, 2024
- LX Semicon Co., Ltd.
- Min Suk KIM
- G01 - MEASURING TESTING
Information Patent Application
TEST SOCKET AND METHOD FOR FABRICATING THE SAME
- Publication number 20240248118
- Publication date Jul 25, 2024
- LEENO INDUSTRIAL INC.
- Geunsu KIM
- G01 - MEASURING TESTING
Information Patent Application
SPRING PROBE CONTACT ASSEMBLY
- Publication number 20240241153
- Publication date Jul 18, 2024
- Johnstech International Corporation
- Valts Treibergs
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
BATTERY TEST ASSEMBLY, BATTERY ASSEMBLY, CHARGING ASSEMBLY, AND ELE...
- Publication number 20240243372
- Publication date Jul 18, 2024
- CONTEMPORARY AMPEREX TECHNOLOGY CO., LIMITED
- Zehong HE
- H01 - BASIC ELECTRIC ELEMENTS

Multiple probes

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Maintaining the shape of a circuit board

Test device

Semiconductor substrate yield prediction based on spectra data from...

Modular vertical probe card

Coaxial probe

Circuit board and probe card

Electrical component inspection instrument

Method for fabricating test socket

Testing substrate and manufacturing method thereof and probe card

Method for determining material parameters of a multilayer test sample

Electrical contactor and electrical connecting apparatus

Test socket

Testing head with an improved contact between contact probes and gu...

Probe card and wafer testing assembly thereof

Detection apparatus and anti-bending device thereof

Safety system for needle probe card for high-voltage and high-curre...

Probe card

Cantilever probe card device and elastic probe thereof

Fine pitch probe card

Vertical probe head with improved contact properties towards a devi...

Compliant pin probes with extension springs, methods for making, an...

Semiconductor probe

Method of inspecting semiconductor device, semiconductor device, an...

Inspection jig and inspection device

Probes with planar unbiased spring elements for electronic componen...

Sensor device, water amount measurement device, water amount measur...

Inspection jig and circuit board inspection apparatus including the...

Contact terminal, inspection jig, and inspection device

Contact terminal, inspection jig, and inspection apparatus

Probe card, apparatus and method for detecting contact force of pro...

Patents Applicationslast 30 patents

PROBE CARD

PROBE MODULE FOR TESTING OF ELECTRICAL RESISTIVITY OF CONDUCTIVE FI...

PROBE CARD MONITORING SYSTEM AND MONITORING METHOD THEREOF

Roller Tap Down Technique for Probe Arrays

PROBE CARD AND CALIBRATION METHOD FOR PROBER

APPARATUSES AND METHODS FOR ELECTROCHEMICAL IMPEDANCE SPECTROSCOPY...

PROBE CARD

PROBER AND TEMPERATURE MEASUREMENT METHOD

STATIONARY PROBE, MOVABLE PROBE, AND PROBING DEVICE CAPABLE OF ADJU...

APPARATUS FOR TESTING AND/OR OPERATING ELECTRONIC DEVICES

TEST FIXTURE AND EARLY WARNING SYSTEM

PROBE CARD, AND SUPPORTING STRUCTURE AND PROBE STRUCTURE THEREOF

WAFER TESTING APPARATUS AND CONTROL METHOD THEREOF

UNIVERSAL PROBE CARD AND TESTING METHOD

TEST DEVICE AND TEST METHOD IMPLEMENTING THE SAME

MEASUREMENT UNIT

SEMICONDUCTOR WAFER TESTING APPARATUS, SEMICONDUCTOR WAFER TESTING...

TEST SYSTEM AND TEST DEVICE

Electrical Testing Device with Probe Having an Adjustable Angle

PROBE CARD

AUTOMATIC BOARD PROBING STATION

PROBE CARD FOR FINE PITCH CIRCUIT PROBE TESTING OF SEMICONDUCTOR IN...

CONTACT PROBE AND PROBE UNIT

PROBE POSITION MONITORING STRUCTURE AND METHOD OF MONITORING POSITI...

PROBE CARD

METHODS AND TECHNIQUES FOR DETERMINING WHEN A PROBE TIP IS PROXIMAT...

PROBE CARD AND TEST APPARATUS INCLUDING PROBE CARD

TEST SOCKET AND METHOD FOR FABRICATING THE SAME

SPRING PROBE CONTACT ASSEMBLY

BATTERY TEST ASSEMBLY, BATTERY ASSEMBLY, CHARGING ASSEMBLY, AND ELE...