Non-contact-making probes

Industry

CPC
G01R1/07

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Parent Industries

GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00

Current Industry

G01R1/07Non-contact-making probes

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Needle block for easy adjustment of tip length of needle unit
- Patent number 12,253,542
- Issue date Mar 18, 2025
- WILLTECHNOLOGY CO., LTD.
- Song Yeon Wi
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for detecting failure of spring contacts
- Patent number 12,253,575
- Issue date Mar 18, 2025
- Waymo LLC
- Yi-Heng Sen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Lidless BGA socket apparatus for testing semiconductor device
- Patent number 12,248,001
- Issue date Mar 11, 2025
- HICON CO., LTD.
- Dong Weon Hwang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Clustered rigid wafer test probe
- Patent number 12,248,003
- Issue date Mar 11, 2025
- International Business Machines Corporation
- David Michael Audette
- G01 - MEASURING TESTING
Information Patent Grant
Method for producing a probe used for testing integrated electronic...
- Patent number 12,248,012
- Issue date Mar 11, 2025
- STMicroelectronics S.r.l.
- Alberto Pagani
- G01 - MEASURING TESTING
Information Patent Grant
Membrane probe card and its probe head
- Patent number 12,248,004
- Issue date Mar 11, 2025
- MAXONE SEMICONDUCTOR CO., LTD.
- Liangyu Zhao
- G01 - MEASURING TESTING
Information Patent Grant
Electrical connecting apparatus
- Patent number 12,244,083
- Issue date Mar 4, 2025
- Kabushiki Kaisha Nihon Micronics
- Shou Harako
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Test apparatus
- Patent number 12,241,926
- Issue date Mar 4, 2025
- Advantest Corporation
- Naoyoshi Watanabe
- G01 - MEASURING TESTING
Information Patent Grant
Wafer test system and operating method thereof
- Patent number 12,241,930
- Issue date Mar 4, 2025
- SK hynix Inc.
- Dong Kil Kim
- G01 - MEASURING TESTING
Information Patent Grant
Probe card device and circuit protection assembly thereof
- Patent number 12,243,703
- Issue date Mar 4, 2025
- Global Unichip Corporation
- Chih-Chieh Liao
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Substrate processing apparatus
- Patent number 12,235,287
- Issue date Feb 25, 2025
- Samsung Electronics Co., Ltd.
- Daesung Jung
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Composite intermediary device using vertical probe for wafer testing
- Patent number 12,235,313
- Issue date Feb 25, 2025
- SYU GUANG TECHNOLOGY CO., LTD.
- Kun Yu Wu
- G01 - MEASURING TESTING
Information Patent Grant
Wafer probe device
- Patent number 12,228,590
- Issue date Feb 18, 2025
- Winbond Electronics Corp.
- Ting-Ming Fu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Contact pins for test sockets and test sockets comprising the same
- Patent number 12,222,367
- Issue date Feb 11, 2025
- Okins Electronics Co., Ltd.
- Jin Kook Jun
- G01 - MEASURING TESTING
Information Patent Grant
MEMS probe card
- Patent number 12,222,369
- Issue date Feb 11, 2025
- MAXONE SEMICONDUCTOR CO., LTD.
- Liangyu Zhao
- G01 - MEASURING TESTING
Information Patent Grant
Probe head and probe card having same
- Patent number 12,222,370
- Issue date Feb 11, 2025
- POINT ENGINEERING CO., LTD.
- Bum Mo Ahn
- G01 - MEASURING TESTING
Information Patent Grant
Tilt calibration for probe systems
- Patent number 12,216,140
- Issue date Feb 4, 2025
- The Boeing Company
- Peter D. Brewer
- G01 - MEASURING TESTING
Information Patent Grant
Vascular sap measurement sensor
- Patent number 12,216,076
- Issue date Feb 4, 2025
- National University Corporation Kagawa University
- Fusao Shimokawa
- G01 - MEASURING TESTING
Information Patent Grant
Method of manufacturing a probe tip and a probe tip manufactured by...
- Patent number 12,210,038
- Issue date Jan 28, 2025
- TSE CO., LTD.
- Young Min Lee
- C25 - ELECTROLYTIC OR ELECTROPHORETIC PROCESSES APPARATUS THEREFOR
Information Patent Grant
Illumination device, optical camera and method for monitoring an op...
- Patent number 12,213,229
- Issue date Jan 28, 2025
- Infineon Technologies AG
- Thomas Thurner
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Manufacturing fixture and process for electrode of neuromodulation...
- Patent number 12,203,960
- Issue date Jan 21, 2025
- Industrial Technology Research Institute
- Jo-Ping Lee
- G01 - MEASURING TESTING
Information Patent Grant
Vertical probe card device and fence-like probe thereof
- Patent number 12,203,961
- Issue date Jan 21, 2025
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- Wei-Jhih Su
- G01 - MEASURING TESTING
Information Patent Grant
Contacting module for contacting optoelectronic chips
- Patent number 12,203,983
- Issue date Jan 21, 2025
- Jenoptik Optical Systems GmbH
- Robert Buettner
- G01 - MEASURING TESTING
Information Patent Grant
Probe assembly with multiple spacers and methods of assembling the...
- Patent number 12,196,780
- Issue date Jan 14, 2025
- Taiwan Semiconductor Manufacturing Company Limited
- Ming-Cheng Hsu
- G01 - MEASURING TESTING
Information Patent Grant
Probes with planar unbiased spring elements for electronic componen...
- Patent number 12,196,782
- Issue date Jan 14, 2025
- Microfabrica Inc.
- Arun S. Veeramani
- G01 - MEASURING TESTING
Information Patent Grant
Probes with planar unbiased spring elements for electronic componen...
- Patent number 12,196,781
- Issue date Jan 14, 2025
- Microfabrica Inc.
- Arun S. Veeramani
- G01 - MEASURING TESTING
Information Patent Grant
Amplitude-modulating probe card and its probe and amplitude-modulat...
- Patent number 12,188,962
- Issue date Jan 7, 2025
- MAXONE SEMICONDUCTOR CO., LTD.
- Ailin Wang
- G01 - MEASURING TESTING
Information Patent Grant
Method for testing light-emitting devices
- Patent number 12,188,974
- Issue date Jan 7, 2025
- Epistar Corporation
- Sheng Jie Hsu
- G01 - MEASURING TESTING
Information Patent Grant
Probe structure for micro device inspection
- Patent number 12,188,978
- Issue date Jan 7, 2025
- VueReal Inc.
- Gholamreza Chaji
- G01 - MEASURING TESTING
Information Patent Grant
Contact probe, probe holder and probe unit
- Patent number 12,188,977
- Issue date Jan 7, 2025
- NHK Spring Co., Ltd.
- Tsuyoshi Inuma
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD OF HAVING GOOD THERMAL ISOLATION IN WAFER TEST CASSETTE
- Publication number 20250093407
- Publication date Mar 20, 2025
- XINGR TECHNOLOGIES (ZHEJIANG) LIMITED
- CHOON LEONG LOU
- G01 - MEASURING TESTING
Information Patent Application
PROBER, PERFORMANCE BOARD, PROBE CARD, AND SUBSTRATE INSPECTING APP...
- Publication number 20250093384
- Publication date Mar 20, 2025
- KIOXIA Corporation
- Hiroki KAMATA
- G01 - MEASURING TESTING
Information Patent Application
PROBE HEAD STRUCTURES FOR CIRCUIT PROBE TEST SYSTEMS AND METHODS OF...
- Publication number 20250093385
- Publication date Mar 20, 2025
- Taiwan Semiconductor Manufacturing Company Limited
- Kuan Chun CHEN
- G01 - MEASURING TESTING
Information Patent Application
WAFER TESTING CASSETTE
- Publication number 20250093386
- Publication date Mar 20, 2025
- XINGR TECHNOLOGIES (ZHEJIANG) LIMITED
- CHOON LEONG LOU
- G01 - MEASURING TESTING
Information Patent Application
PROBE STRUCTURE FOR MICRO DEVICE INSPECTION
- Publication number 20250093412
- Publication date Mar 20, 2025
- VueReal Inc.
- Gholamreza CHAJI
- G01 - MEASURING TESTING
Information Patent Application
COMPOSITE PROBE, METHOD FOR ATTACHING PROBE, AND METHOD FOR MANUFAC...
- Publication number 20250085311
- Publication date Mar 13, 2025
- JAPAN ELECTRONIC MATERIALS CORPORATION
- Kazuo YOKOYAMA
- G01 - MEASURING TESTING
Information Patent Application
LOW CROSS-TALK INTERCONNECTION DEVICE WITH IMPEDANCE-TUNED HYBRID S...
- Publication number 20250085309
- Publication date Mar 13, 2025
- ESSAI, INC.
- Nasser Barabi
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR MANUFACTURING APPARATUS
- Publication number 20250087526
- Publication date Mar 13, 2025
- Kabushiki Kaisha Toshiba
- Shun HASEBE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR WAFER HANDLING APPARATUS AND SEMICONDUCTOR WAFER TEST...
- Publication number 20250076366
- Publication date Mar 6, 2025
- Advantest Corporation
- Aritomo Kikuchi
- G01 - MEASURING TESTING
Information Patent Application
Apparatus, System and Method for Repairing a Test Contact Arrangement
- Publication number 20250076342
- Publication date Mar 6, 2025
- Pac Tech - Packaging Technologies GmbH
- Thorsten Krause
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION METHOD AND INSPECTION APPARATUS
- Publication number 20250076372
- Publication date Mar 6, 2025
- TOKYO ELECTRON LIMITED
- Sooraj RAJENDRAN
- G01 - MEASURING TESTING
Information Patent Application
FLEXIBLE CIRCUIT BOARD
- Publication number 20250071889
- Publication date Feb 27, 2025
- Chipbond Technology Corporation
- Kung-Tzu Tu
- G01 - MEASURING TESTING
Information Patent Application
PROBE DEVICES AND PROBE CONTROL APPARATUS
- Publication number 20250067776
- Publication date Feb 27, 2025
- Parcan Nanotech Co., Ltd.
- Xiangqian ZHOU
- G01 - MEASURING TESTING
Information Patent Application
MULTILAYER SUBSTRATE AND JIG
- Publication number 20250063660
- Publication date Feb 20, 2025
- NIDEC ADVANCE TECHNOLOGY CORPORATION
- Shigeki SAKAI
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
TESTING MODULE
- Publication number 20250060405
- Publication date Feb 20, 2025
- NANYA TECHNOLOGY CORPORATION
- Wei-Zhong LI
- G01 - MEASURING TESTING
Information Patent Application
TEST DEVICE FOR OPTOELECTRONIC INTEGRATED CIRCUIT
- Publication number 20250060407
- Publication date Feb 20, 2025
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- Jhih-Hong CHENG
- G01 - MEASURING TESTING
Information Patent Application
CONTACT PROBE FOR PROBE HEADS OF ELECTRONIC DEVICES AND CORRESPONDI...
- Publication number 20250052783
- Publication date Feb 13, 2025
- TECHNOPROBE S.P.A.
- Riccardo VETTORI
- G01 - MEASURING TESTING
Information Patent Application
PROBE PIN AND PROBE CARD
- Publication number 20250052784
- Publication date Feb 13, 2025
- JAPAN ELECTRONIC MATERIALS CORPORATION
- Koki OKUMA
- G01 - MEASURING TESTING
Information Patent Application
PROBE CARD STRUCTURE
- Publication number 20250052785
- Publication date Feb 13, 2025
- STAR TECHNOLOGIES, INC.
- CHOON LEONG LOU
- G01 - MEASURING TESTING
Information Patent Application
ADJUSTABLE SUPPORTING DEVICE
- Publication number 20250044347
- Publication date Feb 6, 2025
- HERMES TESTING SOLUTIONS INC.
- Yi-Chun Yang
- G01 - MEASURING TESTING
Information Patent Application
FLEXIBLE SUBSTRATE AND TESTING JIG
- Publication number 20250048545
- Publication date Feb 6, 2025
- YOKOWO CO., LTD
- Chikara Miura
- G01 - MEASURING TESTING
Information Patent Application
WAFER PROBE STATION AND METHOD FOR ESTABLISHING AN EVALUATION MODEL...
- Publication number 20250044349
- Publication date Feb 6, 2025
- MPI CORPORATION
- ANDREJ RUMIANTSEV
- G01 - MEASURING TESTING
Information Patent Application
CONTACT PIN ASSEMBLY FOR KELVIN TEST AND KELVIN TEST DEVICE COMPRIS...
- Publication number 20250044321
- Publication date Feb 6, 2025
- POINT ENGINEERING CO., LTD.
- Bum Mo AHN
- G01 - MEASURING TESTING
Information Patent Application
CONTACT PROBE, PROBE HOLDER AND PROBE UNIT
- Publication number 20250035699
- Publication date Jan 30, 2025
- NHK Spring Co., Ltd.
- Tsuyoshi Inuma
- G01 - MEASURING TESTING
Information Patent Application
PROBE CARD
- Publication number 20250027973
- Publication date Jan 23, 2025
- JAPAN ELECTRONIC MATERIALS CORPORATION
- Chikaomi MORI
- G01 - MEASURING TESTING
Information Patent Application
ELECTRO-CONDUCTIVE CONTACT PIN, MANUFACTURING METHOD THEREFOR, AND...
- Publication number 20250020691
- Publication date Jan 16, 2025
- POINT ENGINEERING CO., LTD.
- Bum Mo AHN
- G01 - MEASURING TESTING
Information Patent Application
ADHERED MULTILAYER DIE UNIT AND PROBE HEAD, PROBE SEAT, PROBE CARD...
- Publication number 20250020692
- Publication date Jan 16, 2025
- MPI Corporation
- SHENG-YU LIN
- G01 - MEASURING TESTING
Information Patent Application
PROBE ASSEMBLY WITH DOWNWARD-PROTRUDING PROBE SHIELD AND METHODS OF...
- Publication number 20250020693
- Publication date Jan 16, 2025
- Taiwan Semiconductor Manufacturing Company Limited
- Ming-Cheng Hsu
- G01 - MEASURING TESTING
Information Patent Application
ANODIC OXIDATION FILM STRUCTURE
- Publication number 20250011939
- Publication date Jan 9, 2025
- POINT ENGINEERING CO., LTD.
- Bum Mo AHN
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
SYSTEM AND METHOD FOR TESTING AN INTEGRITY OF A FACE SEAL IN AN ELE...
- Publication number 20250012856
- Publication date Jan 9, 2025
- HAMILTON SUNDSTRAND CORPORATION
- Rajkumar Sengodan
- G01 - MEASURING TESTING

Non-contact-making probes

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Needle block for easy adjustment of tip length of needle unit

Systems and methods for detecting failure of spring contacts

Lidless BGA socket apparatus for testing semiconductor device

Clustered rigid wafer test probe

Method for producing a probe used for testing integrated electronic...

Membrane probe card and its probe head

Electrical connecting apparatus

Test apparatus

Wafer test system and operating method thereof

Probe card device and circuit protection assembly thereof

Substrate processing apparatus

Composite intermediary device using vertical probe for wafer testing

Wafer probe device

Contact pins for test sockets and test sockets comprising the same

MEMS probe card

Probe head and probe card having same

Tilt calibration for probe systems

Vascular sap measurement sensor

Method of manufacturing a probe tip and a probe tip manufactured by...

Illumination device, optical camera and method for monitoring an op...

Manufacturing fixture and process for electrode of neuromodulation...

Vertical probe card device and fence-like probe thereof

Contacting module for contacting optoelectronic chips

Probe assembly with multiple spacers and methods of assembling the...

Probes with planar unbiased spring elements for electronic componen...

Probes with planar unbiased spring elements for electronic componen...

Amplitude-modulating probe card and its probe and amplitude-modulat...

Method for testing light-emitting devices

Probe structure for micro device inspection

Contact probe, probe holder and probe unit

Patents Applicationslast 30 patents

METHOD OF HAVING GOOD THERMAL ISOLATION IN WAFER TEST CASSETTE

PROBER, PERFORMANCE BOARD, PROBE CARD, AND SUBSTRATE INSPECTING APP...

PROBE HEAD STRUCTURES FOR CIRCUIT PROBE TEST SYSTEMS AND METHODS OF...

WAFER TESTING CASSETTE

PROBE STRUCTURE FOR MICRO DEVICE INSPECTION

COMPOSITE PROBE, METHOD FOR ATTACHING PROBE, AND METHOD FOR MANUFAC...

LOW CROSS-TALK INTERCONNECTION DEVICE WITH IMPEDANCE-TUNED HYBRID S...

SEMICONDUCTOR MANUFACTURING APPARATUS

SEMICONDUCTOR WAFER HANDLING APPARATUS AND SEMICONDUCTOR WAFER TEST...

Apparatus, System and Method for Repairing a Test Contact Arrangement

INSPECTION METHOD AND INSPECTION APPARATUS

FLEXIBLE CIRCUIT BOARD

PROBE DEVICES AND PROBE CONTROL APPARATUS

MULTILAYER SUBSTRATE AND JIG

TESTING MODULE

TEST DEVICE FOR OPTOELECTRONIC INTEGRATED CIRCUIT

CONTACT PROBE FOR PROBE HEADS OF ELECTRONIC DEVICES AND CORRESPONDI...

PROBE PIN AND PROBE CARD

PROBE CARD STRUCTURE

ADJUSTABLE SUPPORTING DEVICE

FLEXIBLE SUBSTRATE AND TESTING JIG

WAFER PROBE STATION AND METHOD FOR ESTABLISHING AN EVALUATION MODEL...

CONTACT PIN ASSEMBLY FOR KELVIN TEST AND KELVIN TEST DEVICE COMPRIS...

CONTACT PROBE, PROBE HOLDER AND PROBE UNIT

PROBE CARD

ELECTRO-CONDUCTIVE CONTACT PIN, MANUFACTURING METHOD THEREFOR, AND...

ADHERED MULTILAYER DIE UNIT AND PROBE HEAD, PROBE SEAT, PROBE CARD...

PROBE ASSEMBLY WITH DOWNWARD-PROTRUDING PROBE SHIELD AND METHODS OF...

ANODIC OXIDATION FILM STRUCTURE

SYSTEM AND METHOD FOR TESTING AN INTEGRITY OF A FACE SEAL IN AN ELE...