Non-contact-making probes

Industry

CPC
G01R1/07

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Parent Industries

GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00

Current Industry

G01R1/07Non-contact-making probes

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Contact pins for test sockets and test sockets comprising the same
- Patent number 12,222,367
- Issue date Feb 11, 2025
- Okins Electronics Co., Ltd.
- Jin Kook Jun
- G01 - MEASURING TESTING
Information Patent Grant
MEMS probe card
- Patent number 12,222,369
- Issue date Feb 11, 2025
- MAXONE SEMICONDUCTOR CO., LTD.
- Liangyu Zhao
- G01 - MEASURING TESTING
Information Patent Grant
Probe head and probe card having same
- Patent number 12,222,370
- Issue date Feb 11, 2025
- POINT ENGINEERING CO., LTD.
- Bum Mo Ahn
- G01 - MEASURING TESTING
Information Patent Grant
Tilt calibration for probe systems
- Patent number 12,216,140
- Issue date Feb 4, 2025
- The Boeing Company
- Peter D. Brewer
- G01 - MEASURING TESTING
Information Patent Grant
Vascular sap measurement sensor
- Patent number 12,216,076
- Issue date Feb 4, 2025
- National University Corporation Kagawa University
- Fusao Shimokawa
- G01 - MEASURING TESTING
Information Patent Grant
Method of manufacturing a probe tip and a probe tip manufactured by...
- Patent number 12,210,038
- Issue date Jan 28, 2025
- TSE CO., LTD.
- Young Min Lee
- C25 - ELECTROLYTIC OR ELECTROPHORETIC PROCESSES APPARATUS THEREFOR
Information Patent Grant
Illumination device, optical camera and method for monitoring an op...
- Patent number 12,213,229
- Issue date Jan 28, 2025
- Infineon Technologies AG
- Thomas Thurner
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Manufacturing fixture and process for electrode of neuromodulation...
- Patent number 12,203,960
- Issue date Jan 21, 2025
- Industrial Technology Research Institute
- Jo-Ping Lee
- G01 - MEASURING TESTING
Information Patent Grant
Vertical probe card device and fence-like probe thereof
- Patent number 12,203,961
- Issue date Jan 21, 2025
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- Wei-Jhih Su
- G01 - MEASURING TESTING
Information Patent Grant
Contacting module for contacting optoelectronic chips
- Patent number 12,203,983
- Issue date Jan 21, 2025
- Jenoptik Optical Systems GmbH
- Robert Buettner
- G01 - MEASURING TESTING
Information Patent Grant
Probe assembly with multiple spacers and methods of assembling the...
- Patent number 12,196,780
- Issue date Jan 14, 2025
- Taiwan Semiconductor Manufacturing Company Limited
- Ming-Cheng Hsu
- G01 - MEASURING TESTING
Information Patent Grant
Probes with planar unbiased spring elements for electronic componen...
- Patent number 12,196,782
- Issue date Jan 14, 2025
- Microfabrica Inc.
- Arun S. Veeramani
- G01 - MEASURING TESTING
Information Patent Grant
Probes with planar unbiased spring elements for electronic componen...
- Patent number 12,196,781
- Issue date Jan 14, 2025
- Microfabrica Inc.
- Arun S. Veeramani
- G01 - MEASURING TESTING
Information Patent Grant
Amplitude-modulating probe card and its probe and amplitude-modulat...
- Patent number 12,188,962
- Issue date Jan 7, 2025
- MAXONE SEMICONDUCTOR CO., LTD.
- Ailin Wang
- G01 - MEASURING TESTING
Information Patent Grant
Method for testing light-emitting devices
- Patent number 12,188,974
- Issue date Jan 7, 2025
- Epistar Corporation
- Sheng Jie Hsu
- G01 - MEASURING TESTING
Information Patent Grant
Probe structure for micro device inspection
- Patent number 12,188,978
- Issue date Jan 7, 2025
- VueReal Inc.
- Gholamreza Chaji
- G01 - MEASURING TESTING
Information Patent Grant
Contact probe, probe holder and probe unit
- Patent number 12,188,977
- Issue date Jan 7, 2025
- NHK Spring Co., Ltd.
- Tsuyoshi Inuma
- G01 - MEASURING TESTING
Information Patent Grant
Cantilever probe card and probe module thereof
- Patent number 12,181,496
- Issue date Dec 31, 2024
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- Wei-Jhih Su
- G01 - MEASURING TESTING
Information Patent Grant
Probe sheet with contact tip on stacked multi-layer and method of m...
- Patent number 12,181,494
- Issue date Dec 31, 2024
- PROTEC MEMS TECHNOLOGY INC
- Yong Ho Cho
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Compliant probes including dual independently operable probe contac...
- Patent number 12,181,493
- Issue date Dec 31, 2024
- Microfabrica Inc.
- Ming Ting Wu
- G01 - MEASURING TESTING
Information Patent Grant
Lead guides having a recessed face
- Patent number 12,181,516
- Issue date Dec 31, 2024
- Texas Instruments Incorporated
- Chi-Tsung Lee
- G01 - MEASURING TESTING
Information Patent Grant
Heater substrate, probe card substrate, and probe card
- Patent number 12,174,220
- Issue date Dec 24, 2024
- Kyocera Corporation
- Hitoshi Tega
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Integrated circuit spike check probing apparatus and method
- Patent number 12,169,220
- Issue date Dec 17, 2024
- Texas Instruments Incorporated
- William Joshua Bush
- G01 - MEASURING TESTING
Information Patent Grant
Vertical probe pin and a probe card having same
- Patent number 12,169,211
- Issue date Dec 17, 2024
- TSE CO., LTD.
- Seok Ho Son
- G01 - MEASURING TESTING
Information Patent Grant
Probe head and probe card comprising same
- Patent number 12,169,212
- Issue date Dec 17, 2024
- POINT ENGINEERING CO., LTD.
- Bum Mo Ahn
- G01 - MEASURING TESTING
Information Patent Grant
Microbump cluster probing architecture for 2.5D and 3D dies
- Patent number 12,163,982
- Issue date Dec 10, 2024
- Intel Corporation
- Jagat Shakya
- G01 - MEASURING TESTING
Information Patent Grant
Probe card for testing power devices under high temperature and hig...
- Patent number 12,158,481
- Issue date Dec 3, 2024
- MAXONE SEMICONDUCTOR (SUZHOU) CO., LTD.
- Liangyu Zhao
- G01 - MEASURING TESTING
Information Patent Grant
Probe card assembly
- Patent number 12,158,482
- Issue date Dec 3, 2024
- Mediatek Inc.
- Tung-Hsien Hsieh
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for testing all test circuits on a wafer from...
- Patent number 12,153,087
- Issue date Nov 26, 2024
- IC ANALYTICA, LLC
- Patrick G. Drennan
- G01 - MEASURING TESTING
Information Patent Grant
Battery probing module
- Patent number 12,153,069
- Issue date Nov 26, 2024
- CHROMA ATE INC.
- Shih-Ching Tan
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
CONTACT PROBE FOR PROBE HEADS OF ELECTRONIC DEVICES AND CORRESPONDI...
- Publication number 20250052783
- Publication date Feb 13, 2025
- TECHNOPROBE S.P.A.
- Riccardo VETTORI
- G01 - MEASURING TESTING
Information Patent Application
PROBE PIN AND PROBE CARD
- Publication number 20250052784
- Publication date Feb 13, 2025
- JAPAN ELECTRONIC MATERIALS CORPORATION
- Koki OKUMA
- G01 - MEASURING TESTING
Information Patent Application
PROBE CARD STRUCTURE
- Publication number 20250052785
- Publication date Feb 13, 2025
- STAR TECHNOLOGIES, INC.
- CHOON LEONG LOU
- G01 - MEASURING TESTING
Information Patent Application
ADJUSTABLE SUPPORTING DEVICE
- Publication number 20250044347
- Publication date Feb 6, 2025
- HERMES TESTING SOLUTIONS INC.
- Yi-Chun Yang
- G01 - MEASURING TESTING
Information Patent Application
WAFER PROBE STATION AND METHOD FOR ESTABLISHING AN EVALUATION MODEL...
- Publication number 20250044349
- Publication date Feb 6, 2025
- MPI CORPORATION
- ANDREJ RUMIANTSEV
- G01 - MEASURING TESTING
Information Patent Application
FLEXIBLE SUBSTRATE AND TESTING JIG
- Publication number 20250048545
- Publication date Feb 6, 2025
- YOKOWO CO., LTD
- Chikara Miura
- G01 - MEASURING TESTING
Information Patent Application
CONTACT PIN ASSEMBLY FOR KELVIN TEST AND KELVIN TEST DEVICE COMPRIS...
- Publication number 20250044321
- Publication date Feb 6, 2025
- POINT ENGINEERING CO., LTD.
- Bum Mo AHN
- G01 - MEASURING TESTING
Information Patent Application
CONTACT PROBE, PROBE HOLDER AND PROBE UNIT
- Publication number 20250035699
- Publication date Jan 30, 2025
- NHK Spring Co., Ltd.
- Tsuyoshi Inuma
- G01 - MEASURING TESTING
Information Patent Application
PROBE CARD
- Publication number 20250027973
- Publication date Jan 23, 2025
- JAPAN ELECTRONIC MATERIALS CORPORATION
- Chikaomi MORI
- G01 - MEASURING TESTING
Information Patent Application
ELECTRO-CONDUCTIVE CONTACT PIN, MANUFACTURING METHOD THEREFOR, AND...
- Publication number 20250020691
- Publication date Jan 16, 2025
- POINT ENGINEERING CO., LTD.
- Bum Mo AHN
- G01 - MEASURING TESTING
Information Patent Application
ADHERED MULTILAYER DIE UNIT AND PROBE HEAD, PROBE SEAT, PROBE CARD...
- Publication number 20250020692
- Publication date Jan 16, 2025
- MPI Corporation
- SHENG-YU LIN
- G01 - MEASURING TESTING
Information Patent Application
PROBE ASSEMBLY WITH DOWNWARD-PROTRUDING PROBE SHIELD AND METHODS OF...
- Publication number 20250020693
- Publication date Jan 16, 2025
- Taiwan Semiconductor Manufacturing Company Limited
- Ming-Cheng Hsu
- G01 - MEASURING TESTING
Information Patent Application
ANODIC OXIDATION FILM STRUCTURE
- Publication number 20250011939
- Publication date Jan 9, 2025
- POINT ENGINEERING CO., LTD.
- Bum Mo AHN
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
SYSTEM AND METHOD FOR TESTING AN INTEGRITY OF A FACE SEAL IN AN ELE...
- Publication number 20250012856
- Publication date Jan 9, 2025
- HAMILTON SUNDSTRAND CORPORATION
- Rajkumar Sengodan
- G01 - MEASURING TESTING
Information Patent Application
PROBE CARD STRUCTURE INCLUDING PROBE SETS WITH DIFFERENT LENGTHS
- Publication number 20250004012
- Publication date Jan 2, 2025
- teCat Technologies (Suzhou) Limited
- CHOON LEONG LOU
- G01 - MEASURING TESTING
Information Patent Application
PROBE CARD STRUCTURE
- Publication number 20250004013
- Publication date Jan 2, 2025
- teCat Technologies (Suzhou) Limited
- CHOON LEONG LOU
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS OF MULTIFREQUENCY ELECTROMAGNETIC RESONATORS INDUCTIVELY...
- Publication number 20250007176
- Publication date Jan 2, 2025
- UNIVERSITE PARIS-SACLAY
- Pierre-Yves JOUBERT
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
VERTICAL PROBE CARD
- Publication number 20240426871
- Publication date Dec 26, 2024
- POINT ENGINEERING CO., LTD.
- Bum Mo AHN
- G01 - MEASURING TESTING
Information Patent Application
SPACE TRANSFORMER SUPPORT STRUCTURE AND AN ELECTRICAL CONNECTION DE...
- Publication number 20240426874
- Publication date Dec 26, 2024
- Kabushiki Kaisha Nihon Micronics
- Ken HASEGAWA
- G01 - MEASURING TESTING
Information Patent Application
BATTERY TEST APPARATUS
- Publication number 20240429473
- Publication date Dec 26, 2024
- CONTEMPORARY AMPEREX TECHNOLOGY CO., LIMITED
- Jiawu CHENG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TEST APPARATUS AND BATTERY PRODUCTION LINE
- Publication number 20240426873
- Publication date Dec 26, 2024
- CONTEMPORARY AMPEREX TECHNOLOGY CO., LIMITED
- Jun YANG
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR WAFER
- Publication number 20240410934
- Publication date Dec 12, 2024
- NANYA TECHNOLOGY CORPORATION
- Wei Zhong LI
- G01 - MEASURING TESTING
Information Patent Application
PROBE CARD STRUCTURE FOR HIGH FREQUENCY TEST AND TESTING METHOD THE...
- Publication number 20240410918
- Publication date Dec 12, 2024
- STAR TECHNOLOGIES, INC.
- CHOON LEONG LOU
- G01 - MEASURING TESTING
Information Patent Application
SPACE TRANSFORMERS CONFIGURED TO BE UTILIZED IN A PROBE SYSTEM, PRO...
- Publication number 20240410936
- Publication date Dec 12, 2024
- FormFactor, Inc.
- Ernest Gammon McReynolds
- G01 - MEASURING TESTING
Information Patent Application
PROBE SYSTEM FOR TESTING DEVICE UNDER TEST INTEGRATED IN SEMICONDUC...
- Publication number 20240402218
- Publication date Dec 5, 2024
- MPI CORPORATION
- CHIN-TIEN YANG
- G01 - MEASURING TESTING
Information Patent Application
PROBE SYSTEM FOR TESTING OF DEVICES UNDER TEST INTEGRATED ON A SEMI...
- Publication number 20240393368
- Publication date Nov 28, 2024
- MPI CORPORATION
- CHIN-TIEN YANG
- G01 - MEASURING TESTING
Information Patent Application
ROTATING BODY INSPECTION DEVICE FOR ELECTRIFICATION COMPONENT
- Publication number 20240393365
- Publication date Nov 28, 2024
- VIEWON CO., LTD.
- Young Wook YOON
- G01 - MEASURING TESTING
Information Patent Application
PROBE SYSTEM FOR TESTING OF DEVICES UNDER TEST INTEGRATED ON A SEMI...
- Publication number 20240393367
- Publication date Nov 28, 2024
- MPI CORPORATION
- CHIN-TIEN YANG
- G01 - MEASURING TESTING
Information Patent Application
CANTILEVER PROBE CARD DEVICE AND SOLDER RECEIVING PROBE
- Publication number 20240385223
- Publication date Nov 21, 2024
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- HAO-YEN CHENG
- G01 - MEASURING TESTING
Information Patent Application
CANTILEVER PROBE CARD DEVICE AND CLIMB-RESTRICTING PROBE
- Publication number 20240385217
- Publication date Nov 21, 2024
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- HAO-YEN CHENG
- G01 - MEASURING TESTING

Non-contact-making probes

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Contact pins for test sockets and test sockets comprising the same

MEMS probe card

Probe head and probe card having same

Tilt calibration for probe systems

Vascular sap measurement sensor

Method of manufacturing a probe tip and a probe tip manufactured by...

Illumination device, optical camera and method for monitoring an op...

Manufacturing fixture and process for electrode of neuromodulation...

Vertical probe card device and fence-like probe thereof

Contacting module for contacting optoelectronic chips

Probe assembly with multiple spacers and methods of assembling the...

Probes with planar unbiased spring elements for electronic componen...

Probes with planar unbiased spring elements for electronic componen...

Amplitude-modulating probe card and its probe and amplitude-modulat...

Method for testing light-emitting devices

Probe structure for micro device inspection

Contact probe, probe holder and probe unit

Cantilever probe card and probe module thereof

Probe sheet with contact tip on stacked multi-layer and method of m...

Compliant probes including dual independently operable probe contac...

Lead guides having a recessed face

Heater substrate, probe card substrate, and probe card

Integrated circuit spike check probing apparatus and method

Vertical probe pin and a probe card having same

Probe head and probe card comprising same

Microbump cluster probing architecture for 2.5D and 3D dies

Probe card for testing power devices under high temperature and hig...

Probe card assembly

Apparatus and method for testing all test circuits on a wafer from...

Battery probing module

Patents Applicationslast 30 patents

CONTACT PROBE FOR PROBE HEADS OF ELECTRONIC DEVICES AND CORRESPONDI...

PROBE PIN AND PROBE CARD

PROBE CARD STRUCTURE

ADJUSTABLE SUPPORTING DEVICE

WAFER PROBE STATION AND METHOD FOR ESTABLISHING AN EVALUATION MODEL...

FLEXIBLE SUBSTRATE AND TESTING JIG

CONTACT PIN ASSEMBLY FOR KELVIN TEST AND KELVIN TEST DEVICE COMPRIS...

CONTACT PROBE, PROBE HOLDER AND PROBE UNIT

PROBE CARD

ELECTRO-CONDUCTIVE CONTACT PIN, MANUFACTURING METHOD THEREFOR, AND...

ADHERED MULTILAYER DIE UNIT AND PROBE HEAD, PROBE SEAT, PROBE CARD...

PROBE ASSEMBLY WITH DOWNWARD-PROTRUDING PROBE SHIELD AND METHODS OF...

ANODIC OXIDATION FILM STRUCTURE

SYSTEM AND METHOD FOR TESTING AN INTEGRITY OF A FACE SEAL IN AN ELE...

PROBE CARD STRUCTURE INCLUDING PROBE SETS WITH DIFFERENT LENGTHS

PROBE CARD STRUCTURE

APPARATUS OF MULTIFREQUENCY ELECTROMAGNETIC RESONATORS INDUCTIVELY...

VERTICAL PROBE CARD

SPACE TRANSFORMER SUPPORT STRUCTURE AND AN ELECTRICAL CONNECTION DE...

BATTERY TEST APPARATUS

TEST APPARATUS AND BATTERY PRODUCTION LINE

SEMICONDUCTOR WAFER

PROBE CARD STRUCTURE FOR HIGH FREQUENCY TEST AND TESTING METHOD THE...

SPACE TRANSFORMERS CONFIGURED TO BE UTILIZED IN A PROBE SYSTEM, PRO...

PROBE SYSTEM FOR TESTING DEVICE UNDER TEST INTEGRATED IN SEMICONDUC...

PROBE SYSTEM FOR TESTING OF DEVICES UNDER TEST INTEGRATED ON A SEMI...

ROTATING BODY INSPECTION DEVICE FOR ELECTRIFICATION COMPONENT

PROBE SYSTEM FOR TESTING OF DEVICES UNDER TEST INTEGRATED ON A SEMI...

CANTILEVER PROBE CARD DEVICE AND SOLDER RECEIVING PROBE

CANTILEVER PROBE CARD DEVICE AND CLIMB-RESTRICTING PROBE