Non-contact-making probes

Industry

CPC
G01R1/07

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Parent Industries

GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00

Current Industry

G01R1/07Non-contact-making probes

Industries

Patents Grantslast 30 patents

Information Patent Grant
Integrated circuit spike check probing apparatus and method
- Patent number 12,169,220
- Issue date Dec 17, 2024
- Texas Instruments Incorporated
- William Joshua Bush
- G01 - MEASURING TESTING
Information Patent Grant
Vertical probe pin and a probe card having same
- Patent number 12,169,211
- Issue date Dec 17, 2024
- TSE CO., LTD.
- Seok Ho Son
- G01 - MEASURING TESTING
Information Patent Grant
Probe head and probe card comprising same
- Patent number 12,169,212
- Issue date Dec 17, 2024
- POINT ENGINEERING CO., LTD.
- Bum Mo Ahn
- G01 - MEASURING TESTING
Information Patent Grant
Microbump cluster probing architecture for 2.5D and 3D dies
- Patent number 12,163,982
- Issue date Dec 10, 2024
- Intel Corporation
- Jagat Shakya
- G01 - MEASURING TESTING
Information Patent Grant
Probe card for testing power devices under high temperature and hig...
- Patent number 12,158,481
- Issue date Dec 3, 2024
- MAXONE SEMICONDUCTOR (SUZHOU) CO., LTD.
- Liangyu Zhao
- G01 - MEASURING TESTING
Information Patent Grant
Probe card assembly
- Patent number 12,158,482
- Issue date Dec 3, 2024
- Mediatek Inc.
- Tung-Hsien Hsieh
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for testing all test circuits on a wafer from...
- Patent number 12,153,087
- Issue date Nov 26, 2024
- IC ANALYTICA, LLC
- Patrick G. Drennan
- G01 - MEASURING TESTING
Information Patent Grant
Battery probing module
- Patent number 12,153,069
- Issue date Nov 26, 2024
- CHROMA ATE INC.
- Shih-Ching Tan
- G01 - MEASURING TESTING
Information Patent Grant
Multi-beam probes with decoupled structural and current carrying be...
- Patent number 12,146,898
- Issue date Nov 19, 2024
- Microfabrica Inc.
- Arun S. Veeramani
- G01 - MEASURING TESTING
Information Patent Grant
Vertical probe card having different probes
- Patent number 12,146,897
- Issue date Nov 19, 2024
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- Wei-Jhih Su
- G01 - MEASURING TESTING
Information Patent Grant
Modular wireless communication device testing system
- Patent number 12,146,913
- Issue date Nov 19, 2024
- T-Mobile USA, Inc.
- Syed Toaha Ahmad
- G01 - MEASURING TESTING
Information Patent Grant
Testing apparatus
- Patent number 12,140,623
- Issue date Nov 12, 2024
- Global Unichip Corporation
- Chih-Chieh Liao
- G01 - MEASURING TESTING
Information Patent Grant
Proximity detection for assessing sensing probe attachment state
- Patent number 12,135,337
- Issue date Nov 5, 2024
- The General Hospital Corporation
- Maria A. Franceschini
- G01 - MEASURING TESTING
Information Patent Grant
Probe head and probe card comprising same
- Patent number 12,135,338
- Issue date Nov 5, 2024
- POINT ENGINEERING CO., LTD.
- Bum Mo Ahn
- G01 - MEASURING TESTING
Information Patent Grant
Semi-automatic prober
- Patent number 12,135,335
- Issue date Nov 5, 2024
- QualiTau, Inc.
- Edward McCloud
- G01 - MEASURING TESTING
Information Patent Grant
Maintaining the shape of a circuit board
- Patent number 12,127,334
- Issue date Oct 22, 2024
- Dis Tech America, LLC
- Heng-Kit Too
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Detecting a via stripping issue in a printed circuit board
- Patent number 12,123,907
- Issue date Oct 22, 2024
- Dell Products L.P.
- Ching-Huei Chen
- G01 - MEASURING TESTING
Information Patent Grant
Test device
- Patent number 12,117,484
- Issue date Oct 15, 2024
- TECAT TECHNOLOGIES (SUZHOU) LIMITED
- Choon Leong Lou
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor substrate yield prediction based on spectra data from...
- Patent number 12,111,355
- Issue date Oct 8, 2024
- Onto Innovation Inc.
- Xin Song
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Modular vertical probe card
- Patent number 12,111,336
- Issue date Oct 8, 2024
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- Wei-Jhih Su
- G01 - MEASURING TESTING
Information Patent Grant
Circuit board and probe card
- Patent number 12,114,423
- Issue date Oct 8, 2024
- Kyocera Corporation
- Youichiro Honda
- G01 - MEASURING TESTING
Information Patent Grant
Coaxial probe
- Patent number 12,111,343
- Issue date Oct 8, 2024
- Xcerra Corporation
- Yukang Feng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electrical component inspection instrument
- Patent number 12,105,117
- Issue date Oct 1, 2024
- Japan Aviation Electronics Industry, Limited
- Junji Oosaka
- G01 - MEASURING TESTING
Information Patent Grant
Method for fabricating test socket
- Patent number 12,105,133
- Issue date Oct 1, 2024
- Leeno Industrial Inc.
- Seungha Baek
- G01 - MEASURING TESTING
Information Patent Grant
Testing substrate and manufacturing method thereof and probe card
- Patent number 12,108,543
- Issue date Oct 1, 2024
- Hermes Testing Solutions Inc.
- Chiao-Pei Chen
- G01 - MEASURING TESTING
Information Patent Grant
Method for determining material parameters of a multilayer test sample
- Patent number 12,105,136
- Issue date Oct 1, 2024
- KLA Corporation
- Alberto Cagliani
- G01 - MEASURING TESTING
Information Patent Grant
Electrical contactor and electrical connecting apparatus
- Patent number 12,105,119
- Issue date Oct 1, 2024
- Kabushiki Kaisha Nihon Micronics
- Tomoaki Kuga
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Test socket
- Patent number 12,105,138
- Issue date Oct 1, 2024
- Leeno Industrial Inc.
- Young taek Shin
- G01 - MEASURING TESTING
Information Patent Grant
Testing head with an improved contact between contact probes and gu...
- Patent number 12,105,118
- Issue date Oct 1, 2024
- Technoprobe S.p.A.
- Roberto Crippa
- G01 - MEASURING TESTING
Information Patent Grant
Probe card and wafer testing assembly thereof
- Patent number 12,099,078
- Issue date Sep 24, 2024
- MPI Corporation
- Yi-Chien Tsai
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR WAFER
- Publication number 20240410934
- Publication date Dec 12, 2024
- NANYA TECHNOLOGY CORPORATION
- Wei Zhong LI
- G01 - MEASURING TESTING
Information Patent Application
PROBE CARD STRUCTURE FOR HIGH FREQUENCY TEST AND TESTING METHOD THE...
- Publication number 20240410918
- Publication date Dec 12, 2024
- STAR TECHNOLOGIES, INC.
- CHOON LEONG LOU
- G01 - MEASURING TESTING
Information Patent Application
SPACE TRANSFORMERS CONFIGURED TO BE UTILIZED IN A PROBE SYSTEM, PRO...
- Publication number 20240410936
- Publication date Dec 12, 2024
- FormFactor, Inc.
- Ernest Gammon McReynolds
- G01 - MEASURING TESTING
Information Patent Application
PROBE SYSTEM FOR TESTING DEVICE UNDER TEST INTEGRATED IN SEMICONDUC...
- Publication number 20240402218
- Publication date Dec 5, 2024
- MPI CORPORATION
- CHIN-TIEN YANG
- G01 - MEASURING TESTING
Information Patent Application
PROBE SYSTEM FOR TESTING OF DEVICES UNDER TEST INTEGRATED ON A SEMI...
- Publication number 20240393368
- Publication date Nov 28, 2024
- MPI CORPORATION
- CHIN-TIEN YANG
- G01 - MEASURING TESTING
Information Patent Application
ROTATING BODY INSPECTION DEVICE FOR ELECTRIFICATION COMPONENT
- Publication number 20240393365
- Publication date Nov 28, 2024
- VIEWON CO., LTD.
- Young Wook YOON
- G01 - MEASURING TESTING
Information Patent Application
PROBE SYSTEM FOR TESTING OF DEVICES UNDER TEST INTEGRATED ON A SEMI...
- Publication number 20240393367
- Publication date Nov 28, 2024
- MPI CORPORATION
- CHIN-TIEN YANG
- G01 - MEASURING TESTING
Information Patent Application
CANTILEVER PROBE CARD DEVICE AND SOLDER RECEIVING PROBE
- Publication number 20240385223
- Publication date Nov 21, 2024
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- HAO-YEN CHENG
- G01 - MEASURING TESTING
Information Patent Application
CANTILEVER PROBE CARD DEVICE AND CLIMB-RESTRICTING PROBE
- Publication number 20240385217
- Publication date Nov 21, 2024
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- HAO-YEN CHENG
- G01 - MEASURING TESTING
Information Patent Application
CANTILEVER PROBE CARD DEVICE AND MICRO ELECTRO MECHANICAL SYSTEM (M...
- Publication number 20240385218
- Publication date Nov 21, 2024
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- HAO-YEN CHENG
- G01 - MEASURING TESTING
Information Patent Application
CANTILEVER PROBE CARD DEVICE AND LIGHT SCATTERING PROBE
- Publication number 20240385219
- Publication date Nov 21, 2024
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- HAO-YEN CHENG
- G01 - MEASURING TESTING
Information Patent Application
CANTILEVER PROBE CARD DEVICE AND LIGHT ABSORPTION PROBE
- Publication number 20240385221
- Publication date Nov 21, 2024
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- HAO-YEN CHENG
- G01 - MEASURING TESTING
Information Patent Application
CANTILEVER PROBE CARD DEVICE AND CANTILEVER PROBE MODULE
- Publication number 20240385222
- Publication date Nov 21, 2024
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- HAO-YEN CHENG
- G01 - MEASURING TESTING
Information Patent Application
SENSOR DEVICE, WATER AMOUNT MEASUREMENT DEVICE, WATER AMOUNT MEASUR...
- Publication number 20240377435
- Publication date Nov 14, 2024
- SONY GROUP CORPORATION
- Atsushi YAMADA
- G01 - MEASURING TESTING
Information Patent Application
PROBE CARD DEVICE AND TUNNEL-TYPE PROBE THEREOF
- Publication number 20240377436
- Publication date Nov 14, 2024
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- YU-JU LU
- G01 - MEASURING TESTING
Information Patent Application
TEST SOCKET AND PROBE WITH STEPPED COLLAR FOR SEMICONDUCTOR INTEGRA...
- Publication number 20240377433
- Publication date Nov 14, 2024
- Smiths Interconnect Americas, Inc.
- Jiachun Zhou
- G01 - MEASURING TESTING
Information Patent Application
MEMS PROBE MODULE STRUCTURE
- Publication number 20240377434
- Publication date Nov 14, 2024
- TAIWAN MASK CORPORATION
- SHANG-KUANG WU
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
VERTICAL PROBE CARD AND OPEN-TYPE PROBE THEREOF
- Publication number 20240377437
- Publication date Nov 14, 2024
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- YU-JU LU
- G01 - MEASURING TESTING
Information Patent Application
WAFER TEST SYSTEM, PROBE CARD REPLACING METHOD, AND PROBER
- Publication number 20240369623
- Publication date Nov 7, 2024
- TOKYO SEIMITSU CO., LTD.
- Akira YAMAGUCHI
- G01 - MEASURING TESTING
Information Patent Application
SUPPORTING DEVICE AND PROTECTIVE CASE FOR PROBE CARD
- Publication number 20240369596
- Publication date Nov 7, 2024
- GUDENG PRECISION INDUSTRIAL CO., LTD.
- MING-CHIEN CHIU
- G01 - MEASURING TESTING
Information Patent Application
PROBE CARD DEVICE
- Publication number 20240369599
- Publication date Nov 7, 2024
- Silicon Future Manufacturing Company Ltd.
- TIEN-CHIA LEE
- G01 - MEASURING TESTING
Information Patent Application
PROBE CARD FOR DEVICE UNDER TEST
- Publication number 20240369614
- Publication date Nov 7, 2024
- TEXAS INSTRUMENTS INCORPORATED
- TREVOR HUBBARD
- G01 - MEASURING TESTING
Information Patent Application
CIRCUIT STRUCTURE, ELECTRONIC DEVICE, AND MANUFACTURING METHOD OF E...
- Publication number 20240361353
- Publication date Oct 31, 2024
- InnoLux Corporation
- Kuang-Ming FAN
- G01 - MEASURING TESTING
Information Patent Application
MEMBRANE PROBE CARD, METHOD OF MAKING THE SAME AND METHOD OF MAKING...
- Publication number 20240361355
- Publication date Oct 31, 2024
- MPI Corporation
- YU-SHAN HU
- G01 - MEASURING TESTING
Information Patent Application
CURRENT SENSOR
- Publication number 20240361362
- Publication date Oct 31, 2024
- ALPS ALPINE CO., LTD.
- Manabu TAMURA
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR DETECTING CONTACT FORCE OF PROBE CARD
- Publication number 20240361354
- Publication date Oct 31, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Ming-Cheng HSU
- G01 - MEASURING TESTING
Information Patent Application
PROBE CARD
- Publication number 20240353445
- Publication date Oct 24, 2024
- NHK Spring Co., Ltd.
- Naruhiko Nishiwaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PROBE MODULE FOR TESTING OF ELECTRICAL RESISTIVITY OF CONDUCTIVE FI...
- Publication number 20240345131
- Publication date Oct 17, 2024
- NATIONAL INSTITUTE OF METROLOGY, CHINA
- Senlin JIN
- G01 - MEASURING TESTING
Information Patent Application
PROBE CARD MONITORING SYSTEM AND MONITORING METHOD THEREOF
- Publication number 20240345134
- Publication date Oct 17, 2024
- HERMES TESTING SOLUTIONS INC.
- Wei-Ting Chen
- G01 - MEASURING TESTING
Information Patent Application
Roller Tap Down Technique for Probe Arrays
- Publication number 20240345133
- Publication date Oct 17, 2024
- Sterling Tadashi Collins
- G01 - MEASURING TESTING

Non-contact-making probes

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Integrated circuit spike check probing apparatus and method

Vertical probe pin and a probe card having same

Probe head and probe card comprising same

Microbump cluster probing architecture for 2.5D and 3D dies

Probe card for testing power devices under high temperature and hig...

Probe card assembly

Apparatus and method for testing all test circuits on a wafer from...

Battery probing module

Multi-beam probes with decoupled structural and current carrying be...

Vertical probe card having different probes

Modular wireless communication device testing system

Testing apparatus

Proximity detection for assessing sensing probe attachment state

Probe head and probe card comprising same

Semi-automatic prober

Maintaining the shape of a circuit board

Detecting a via stripping issue in a printed circuit board

Test device

Semiconductor substrate yield prediction based on spectra data from...

Modular vertical probe card

Circuit board and probe card

Coaxial probe

Electrical component inspection instrument

Method for fabricating test socket

Testing substrate and manufacturing method thereof and probe card

Method for determining material parameters of a multilayer test sample

Electrical contactor and electrical connecting apparatus

Test socket

Testing head with an improved contact between contact probes and gu...

Probe card and wafer testing assembly thereof

Patents Applicationslast 30 patents

SEMICONDUCTOR WAFER

PROBE CARD STRUCTURE FOR HIGH FREQUENCY TEST AND TESTING METHOD THE...

SPACE TRANSFORMERS CONFIGURED TO BE UTILIZED IN A PROBE SYSTEM, PRO...

PROBE SYSTEM FOR TESTING DEVICE UNDER TEST INTEGRATED IN SEMICONDUC...

PROBE SYSTEM FOR TESTING OF DEVICES UNDER TEST INTEGRATED ON A SEMI...

ROTATING BODY INSPECTION DEVICE FOR ELECTRIFICATION COMPONENT

PROBE SYSTEM FOR TESTING OF DEVICES UNDER TEST INTEGRATED ON A SEMI...

CANTILEVER PROBE CARD DEVICE AND SOLDER RECEIVING PROBE

CANTILEVER PROBE CARD DEVICE AND CLIMB-RESTRICTING PROBE

CANTILEVER PROBE CARD DEVICE AND MICRO ELECTRO MECHANICAL SYSTEM (M...

CANTILEVER PROBE CARD DEVICE AND LIGHT SCATTERING PROBE

CANTILEVER PROBE CARD DEVICE AND LIGHT ABSORPTION PROBE

CANTILEVER PROBE CARD DEVICE AND CANTILEVER PROBE MODULE

SENSOR DEVICE, WATER AMOUNT MEASUREMENT DEVICE, WATER AMOUNT MEASUR...

PROBE CARD DEVICE AND TUNNEL-TYPE PROBE THEREOF

TEST SOCKET AND PROBE WITH STEPPED COLLAR FOR SEMICONDUCTOR INTEGRA...

MEMS PROBE MODULE STRUCTURE

VERTICAL PROBE CARD AND OPEN-TYPE PROBE THEREOF

WAFER TEST SYSTEM, PROBE CARD REPLACING METHOD, AND PROBER

SUPPORTING DEVICE AND PROTECTIVE CASE FOR PROBE CARD

PROBE CARD DEVICE

PROBE CARD FOR DEVICE UNDER TEST

CIRCUIT STRUCTURE, ELECTRONIC DEVICE, AND MANUFACTURING METHOD OF E...

MEMBRANE PROBE CARD, METHOD OF MAKING THE SAME AND METHOD OF MAKING...

CURRENT SENSOR

METHOD FOR DETECTING CONTACT FORCE OF PROBE CARD

PROBE CARD

PROBE MODULE FOR TESTING OF ELECTRICAL RESISTIVITY OF CONDUCTIVE FI...

PROBE CARD MONITORING SYSTEM AND MONITORING METHOD THEREOF

Roller Tap Down Technique for Probe Arrays