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Non-contact-making probes
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G01R1/07
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G
PHYSICS
G01
Measuring instruments
G01R
MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES
G01R1/00
Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
Current Industry
G01R1/07
Non-contact-making probes
Industries
Overview
Organizations
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Impact
Patents Grants
last 30 patents
Information
Patent Grant
Inspection jig
Patent number
11,977,100
Issue date
May 7, 2024
NIDEC READ CORPORATION
Michio Kaida
G01 - MEASURING TESTING
Information
Patent Grant
System for testing an integrated circuit of a device and its method...
Patent number
11,977,098
Issue date
May 7, 2024
AEHR Test Systems
Scott E. Lindsey
G01 - MEASURING TESTING
Information
Patent Grant
Probe head for a testing apparatus of electronic devices with enhan...
Patent number
11,971,449
Issue date
Apr 30, 2024
Technoprobe S.p.A.
Flavio Maggioni
G01 - MEASURING TESTING
Information
Patent Grant
Optical probe, optical probe array, optical probe card, and method...
Patent number
11,971,431
Issue date
Apr 30, 2024
Kabushiki Kaisha Nihon Micronics
Michitaka Okuta
G01 - MEASURING TESTING
Information
Patent Grant
Probe card device having a probe structure with a protrusion portion
Patent number
11,965,912
Issue date
Apr 23, 2024
XINGR TECHNOLOGIES (ZHEJIANG) LIMITED
Choon Leong Lou
G01 - MEASURING TESTING
Information
Patent Grant
Probe card
Patent number
11,959,941
Issue date
Apr 16, 2024
Industrial Technology Research Institute
Min-Chieh Chou
G01 - MEASURING TESTING
Information
Patent Grant
Probe card
Patent number
11,953,521
Issue date
Apr 9, 2024
BAO HONG SEMI TECHNOLOGY CO., LTD.
Chao-Cheng Ting
G01 - MEASURING TESTING
Information
Patent Grant
System and method for testing of wireless power equipment
Patent number
11,956,029
Issue date
Apr 9, 2024
nok9 AB
Laurens Swaans
H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information
Patent Grant
Probe head for reduced-pitch applications
Patent number
11,953,522
Issue date
Apr 9, 2024
Technoprobe S.p.A.
Roberto Crippa
G01 - MEASURING TESTING
Information
Patent Grant
Electro-optical circuit board for contacting photonic integrated ci...
Patent number
11,946,950
Issue date
Apr 2, 2024
Carl Zeiss SMT GmbH
Philipp Huebner
G01 - MEASURING TESTING
Information
Patent Grant
Contact probe and signal transmission method
Patent number
11,940,465
Issue date
Mar 26, 2024
NHK Spring Co., Ltd.
Kazuya Soma
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Particle measurement device, three-dimensional shape measurement de...
Patent number
11,940,463
Issue date
Mar 26, 2024
Tokyo Seimitsu Co., Ltd.
Natsumi Hayashi
G01 - MEASURING TESTING
Information
Patent Grant
Ceramic, probe guiding member, probe card, and socket for package i...
Patent number
11,940,466
Issue date
Mar 26, 2024
FERROTEC MATERIAL TECHNOLOGIES CORPORATION
Wataru Yamagishi
G01 - MEASURING TESTING
Information
Patent Grant
Inspection apparatus and inspection method
Patent number
11,940,485
Issue date
Mar 26, 2024
Tokyo Electron Limited
Naoki Akiyama
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Inspection jig, and inspection device
Patent number
11,933,837
Issue date
Mar 19, 2024
Nidec-Read Corporation
Minoru Kato
G01 - MEASURING TESTING
Information
Patent Grant
Portable probe card assembly
Patent number
11,933,816
Issue date
Mar 19, 2024
Celadon Systems, Inc.
William A. Funk
G01 - MEASURING TESTING
Information
Patent Grant
Probe card device and transmission structure
Patent number
11,933,817
Issue date
Mar 19, 2024
CHUNGHWA PRECISION TEST TECH. CO., LTD.
Wen-Tsung Lee
G01 - MEASURING TESTING
Information
Patent Grant
Probe test card and method of manufacturing the same
Patent number
11,933,818
Issue date
Mar 19, 2024
SK hynix Inc.
Gyung Jin Kim
G01 - MEASURING TESTING
Information
Patent Grant
Inspection apparatus and inspection method
Patent number
11,933,839
Issue date
Mar 19, 2024
Tokyo Electron Limited
Kentaro Konishi
G01 - MEASURING TESTING
Information
Patent Grant
Structure and method for process control monitoring for group III-V...
Patent number
11,929,442
Issue date
Mar 12, 2024
Newport Fab, LLC
Edward Preisler
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Multi-site concurrent wafer probe magnetic circuit testing
Patent number
11,927,604
Issue date
Mar 12, 2024
Texas Instruments Incorporated
Xinkun Huang
G01 - MEASURING TESTING
Information
Patent Grant
Inspection apparatus and inspection method
Patent number
11,927,539
Issue date
Mar 12, 2024
Tokyo Electron Limited
Naoki Akiyama
G01 - MEASURING TESTING
Information
Patent Grant
Testing head having improved frequency properties
Patent number
11,921,133
Issue date
Mar 5, 2024
Technoprobe S.p.A.
Flavio Maggioni
G01 - MEASURING TESTING
Information
Patent Grant
Fan-out buffer with skew control function, operating method thereof...
Patent number
11,921,158
Issue date
Mar 5, 2024
Samsung Electronics Co., Ltd.
Byung-Sung Kim
G01 - MEASURING TESTING
Information
Patent Grant
PD alloy, PD alloy material and probe pin for electric and electron...
Patent number
11,920,227
Issue date
Mar 5, 2024
Tokuriki Honten Co., Ltd.
Makoto Takahashi
C22 - METALLURGY FERROUS OR NON-FERROUS ALLOYS TREATMENT OF ALLOYS OR NON-FER...
Information
Patent Grant
Anisotropic conductive sheet, electrical inspection device and elec...
Patent number
11,921,132
Issue date
Mar 5, 2024
Mitsui Chemicals, Inc.
Katsunori Nishiura
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Cantilever probe card device and focusing probe thereof
Patent number
11,913,973
Issue date
Feb 27, 2024
CHUNGHWA PRECISION TEST TECH. CO., LTD.
Wei-Jhih Su
G01 - MEASURING TESTING
Information
Patent Grant
Compliant pin probes with flat extension springs, methods for makin...
Patent number
11,906,549
Issue date
Feb 20, 2024
Microfabrica Inc.
Ming Ting Wu
G01 - MEASURING TESTING
Information
Patent Grant
Probe system for QFP integrated circuit device test tooling
Patent number
11,906,550
Issue date
Feb 20, 2024
Essai, Inc.
Nasser Barabi
G01 - MEASURING TESTING
Information
Patent Grant
Test head connection method
Patent number
11,908,753
Issue date
Feb 20, 2024
CHROMA ATE INC.
Kao-Shan Yang
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
TEST APPARATUS FOR IMAGE SENSOR PACKAGE
Publication number
20240151769
Publication date
May 9, 2024
TSE CO., LTD
Min Cheol KIM
G01 - MEASURING TESTING
Information
Patent Application
TESTING HEAD HAVING IMPROVED FREQUENCY PROPERTIES
Publication number
20240151744
Publication date
May 9, 2024
Technoprobe S.p.A.
Flavio Maggioni
G01 - MEASURING TESTING
Information
Patent Application
COMPOSITE INTERMEDIARY DEVICE USING VERTICAL PROBE FOR WAFER TESTING
Publication number
20240151764
Publication date
May 9, 2024
SYU GUANG TECHNOLOGY CO., LTD.
KUN YU WU
G01 - MEASURING TESTING
Information
Patent Application
METHOD OF INSPECTING SEMICONDUCTOR DEVICE, SEMICONDUCTOR DEVICE, AN...
Publication number
20240142497
Publication date
May 2, 2024
RENESAS ELECTRONICS CORPORATION
Masaaki TANIMURA
G01 - MEASURING TESTING
Information
Patent Application
CONDUCTIVE PERFORATED PLATE FOR ELECTRICAL TEST
Publication number
20240142496
Publication date
May 2, 2024
TEXAS INSTRUMENTS INCORPORATED
Wolfgang Weiss
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
VOLTAGE PROBE DEVICE WITH ADJUSTABLE BIAS
Publication number
20240133921
Publication date
Apr 25, 2024
KEYSIGHT TECHNOLOGIES, INC.
Hal Robert Paver
G01 - MEASURING TESTING
Information
Patent Application
SEMICONDUCTOR WAFER CONFIGURED FOR SINGLE TOUCH-DOWN TESTING
Publication number
20240125846
Publication date
Apr 18, 2024
SANDISK TECHNOLOGIES LLC
Toru Miwa
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SEMICONDUCTOR WAFER CONFIGURED FOR SINGLE TOUCH-DOWN TESTING
Publication number
20240128132
Publication date
Apr 18, 2024
SANDISK TECHNOLOGIES LLC
Toru Miwa
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
VOICE COIL LEAF SPRING PROBER
Publication number
20240125847
Publication date
Apr 18, 2024
MACOM Technology Solutions Holdings, Inc.
Timothy James VANDERWERF
G01 - MEASURING TESTING
Information
Patent Application
TILT CALIBRATION FOR PROBE SYSTEMS
Publication number
20240125817
Publication date
Apr 18, 2024
The Boeing Company
Peter D. Brewer
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR SETTING UP TEST APPARATUS AND TEST APPARATUS
Publication number
20240118338
Publication date
Apr 11, 2024
TOKYO ELECTRON LIMITED
Shinjiro WATANABE
G01 - MEASURING TESTING
Information
Patent Application
PROBE CARD AND MANUFACTURING METHOD THEREOF
Publication number
20240118316
Publication date
Apr 11, 2024
MPI Corporation
Chin-Yi Lin
G01 - MEASURING TESTING
Information
Patent Application
GUIDE PLATE AND TEST DEVICE INCLUDING SAME
Publication number
20240118337
Publication date
Apr 11, 2024
POINT ENGINEERING CO., LTD.
Bum Mo AHN
G01 - MEASURING TESTING
Information
Patent Application
CRYOGENIC PROBE CARD
Publication number
20240118315
Publication date
Apr 11, 2024
Nielson Scientific, LLC
Gregory NIELSON
G01 - MEASURING TESTING
Information
Patent Application
PROBE HEAD HAVING SPRING PROBES
Publication number
20240118313
Publication date
Apr 11, 2024
MPI Corporation
WEI-CHENG KU
G01 - MEASURING TESTING
Information
Patent Application
PROBE CARD AND METHOD FOR REPAIRING PROBE CARD
Publication number
20240110974
Publication date
Apr 4, 2024
JAPAN ELECTRONIC MATERIALS CORPORATION
Yutaka TOMITA
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR FABRICATING TEST SOCKET
Publication number
20240110947
Publication date
Apr 4, 2024
LEENO INDUSTRIAL INC.
Seungha BAEK
G01 - MEASURING TESTING
Information
Patent Application
METHODS OF REINFORCING PLATED METAL STRUCTURES AND MODULATING MECHA...
Publication number
20240110943
Publication date
Apr 4, 2024
Microfabrica Inc.
Onnik Yaglioglu
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR PRODUCING A PROBE CARD
Publication number
20240110948
Publication date
Apr 4, 2024
Exaddon AG
Kun-Hsien LIN
G01 - MEASURING TESTING
Information
Patent Application
ALIGNMENT CHIP FOR PROBE CARD, PROBE CARD AND PROBE CARD REPAIR METHOD
Publication number
20240103071
Publication date
Mar 28, 2024
JAPAN ELECTRONIC MATERIALS CORPORATION
Takashi YOSHIDA
G01 - MEASURING TESTING
Information
Patent Application
Probes with Planar Unbiased Spring Elements for Electronic Componen...
Publication number
20240103042
Publication date
Mar 28, 2024
Microfabrica Inc.
Arun S. Veeramani
G01 - MEASURING TESTING
Information
Patent Application
Compliant Probes with Enhanced Pointing Stability and Including At...
Publication number
20240103038
Publication date
Mar 28, 2024
Microfabrica Inc.
Ming Ting Wu
G01 - MEASURING TESTING
Information
Patent Application
Multi-Beam Vertical Probes with Independent Arms Formed of a High C...
Publication number
20240103040
Publication date
Mar 28, 2024
Microfabrica Inc.
Uri Frodis
G01 - MEASURING TESTING
Information
Patent Application
INGESTIBLE IMPLANTABLE DEVICE TO MEASURE INTERNAL TTFIELD INTENSITY
Publication number
20240103041
Publication date
Mar 28, 2024
Novocure GmbH
Yoram Wasserman
G01 - MEASURING TESTING
Information
Patent Application
Multi-Beam Probes with Decoupled Structural and Current Carrying Be...
Publication number
20240094259
Publication date
Mar 21, 2024
Microfabrica Inc.
Arun S. Veeramani
G01 - MEASURING TESTING
Information
Patent Application
Compliant Probes Including Dual Independently Operable Probe Contac...
Publication number
20240094250
Publication date
Mar 21, 2024
Microfabrica Inc.
Ming Ting Wu
G01 - MEASURING TESTING
Information
Patent Application
PROBER CONTROLLING DEVICE, PROBER CONTROLLING METHOD, AND PROBER
Publication number
20240094254
Publication date
Mar 21, 2024
TOKYO SEIMITSU CO., LTD.
Tetsuo YOSHIDA
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Probes with Planar Unbiased Spring Elements for Electronic Componen...
Publication number
20240094255
Publication date
Mar 21, 2024
Microfabrica Inc.
Arun S. Veeramani
G01 - MEASURING TESTING
Information
Patent Application
Probes with Planar Unbiased Spring Elements for Electronic Componen...
Publication number
20240094256
Publication date
Mar 21, 2024
Microfabrica Inc.
Arun S. Veeramani
G01 - MEASURING TESTING
Information
Patent Application
Probes with Planar Unbiased Spring Elements for Electronic Componen...
Publication number
20240094257
Publication date
Mar 21, 2024
Microfabrica Inc.
Arun S. Veeramani
G01 - MEASURING TESTING