object fixed source and detector move

Industry

CPC
G01N2223/3303

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Parent Industries

GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N2223/00Investigating materials by wave or particle radiation

Current Industry

G01N2223/3303object fixed source and detector move

Industries

Patents Grantslast 30 patents

Information Patent Grant
System and method for inspecting defects of structure by using X-ray
- Patent number 12,181,426
- Issue date Dec 31, 2024
- NEUF Inc.
- Myoung Chan Na
- G01 - MEASURING TESTING
Information Patent Grant
X-ray tomography systems and methods for imaging an aircraft part
- Patent number 12,174,129
- Issue date Dec 24, 2024
- The Boeing Company
- Donald Duane Palmer
- G01 - MEASURING TESTING
Information Patent Grant
X-ray weld inspection
- Patent number 12,163,902
- Issue date Dec 10, 2024
- Varex Imaging Sweden AB
- Tuomas Pantsar
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Seal element for a pipeline pig
- Patent number 12,163,591
- Issue date Dec 10, 2024
- Rosen Swiss AG
- Patrik Rosen
- F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...
Information Patent Grant
Systems and methods for x-ray computed tomography
- Patent number 12,163,901
- Issue date Dec 10, 2024
- Orimtech, Ltd.
- Boris S. Goldberg
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Automated circumferential pipe scanning system
- Patent number 12,135,297
- Issue date Nov 5, 2024
- Mistras Group, Inc.
- John Musgrave
- G01 - MEASURING TESTING
Information Patent Grant
Inspection system, determination processing apparatus, and inspecti...
- Patent number 12,105,033
- Issue date Oct 1, 2024
- JGC CORPORATION
- Teruaki Sano
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Radiography inspection and fail-safe mechanism for pipe traversing...
- Patent number 12,038,395
- Issue date Jul 16, 2024
- Arix Technologies, Inc.
- Bryan R. Duerfeldt
- G01 - MEASURING TESTING
Information Patent Grant
Medical x-ray imaging systems and methods
- Patent number 11,986,327
- Issue date May 21, 2024
- MOBIUS IMAGING, LLC
- Eugene A. Gregerson
- G01 - MEASURING TESTING
Information Patent Grant
Multi-source cone beam computed tomography
- Patent number 11,921,056
- Issue date Mar 5, 2024
- SHENZHEN XPECTVISION TECHNOLOGY CO., LTD.
- Peiyan Cao
- G01 - MEASURING TESTING
Information Patent Grant
Tolerance error estimating apparatus, method, program, reconstructi...
- Patent number 11,885,754
- Issue date Jan 30, 2024
- Rigaku Corporation
- Takumi Ota
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Tube weld X-ray inspection device comprising an X-ray source, an X-...
- Patent number 11,860,113
- Issue date Jan 2, 2024
- DIGIRAY CORP.
- Sang Sub Kong
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for X-ray computed tomography
- Patent number 11,846,592
- Issue date Dec 19, 2023
- Orimtech Ltd.
- Boris S. Goldberg
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Scanning systems with dynamically adjustable shielding systems and...
- Patent number 11,822,042
- Issue date Nov 21, 2023
- Analogic Corporation
- Steven Weed
- G01 - MEASURING TESTING
Information Patent Grant
System and method for inspecting defects of structure by using X-ray
- Patent number 11,821,854
- Issue date Nov 21, 2023
- NEUF Inc.
- Myoung Chan Na
- G01 - MEASURING TESTING
Information Patent Grant
Radiographic inspection system for pipes and other structures and m...
- Patent number 11,821,850
- Issue date Nov 21, 2023
- Varex Imaging Corporation
- Rajashekar Venkatachalam
- G01 - MEASURING TESTING
Information Patent Grant
Radiation inspection apparatus comprising a radiation inspection de...
- Patent number 11,822,043
- Issue date Nov 21, 2023
- Zhiqiang Chen
- G01 - MEASURING TESTING
Information Patent Grant
Diffraction analysis device and method for full-field x-ray fluores...
- Patent number 11,774,380
- Issue date Oct 3, 2023
- Sichuan University
- Yuanjun Xu
- G01 - MEASURING TESTING
Information Patent Grant
Radiography inspection and fail-safe mechanism for pipe traversing...
- Patent number 11,754,514
- Issue date Sep 12, 2023
- Arix Technologies, Inc.
- Bryan R. Duerfeldt
- G01 - MEASURING TESTING
Information Patent Grant
Method of non-destructive imaging of the internal structure and dev...
- Patent number 11,670,053
- Issue date Jun 6, 2023
- RADALYTICA A.S.
- Josef Uher
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Radiographic inspection system for pipes and other structures and m...
- Patent number 11,668,660
- Issue date Jun 6, 2023
- Varex Imaging Corporation
- David T Nisius
- G01 - MEASURING TESTING
Information Patent Grant
Automated circumferential pipe scanning system
- Patent number 11,639,905
- Issue date May 2, 2023
- Mistras Group, Inc.
- John Musgrave
- G01 - MEASURING TESTING
Information Patent Grant
Sample inspection system
- Patent number 11,624,717
- Issue date Apr 11, 2023
- The Nottingham Trent University
- Paul Evans
- G01 - MEASURING TESTING
Information Patent Grant
Energy-dispersive X-ray diffraction analyser comprising a substanti...
- Patent number 11,614,414
- Issue date Mar 28, 2023
- COMMONWEALTH SCIENTIFIC AND INDUSTRIAL RESEARCH ORGANISATION
- James Richard Tickner
- G01 - MEASURING TESTING
Information Patent Grant
Nondestructive testing system and nondestructive testing method
- Patent number 11,614,415
- Issue date Mar 28, 2023
- Topcon Corporation
- Shigenori Nagano
- G01 - MEASURING TESTING
Information Patent Grant
Back scattering inspection system and back scattering inspection me...
- Patent number 11,614,413
- Issue date Mar 28, 2023
- Jianmin Li
- G01 - MEASURING TESTING
Information Patent Grant
System and method for inspecting defects of structure by using x-ray
- Patent number 11,585,768
- Issue date Feb 21, 2023
- NEUF Inc.
- Myoung Chan Na
- G01 - MEASURING TESTING
Information Patent Grant
Stationary X-Ray source
- Patent number 11,534,118
- Issue date Dec 27, 2022
- The Regents of the University of California
- Paul R. Schwoebel
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Spectral CT-based 511 KeV for positron emission tomography
- Patent number 11,389,127
- Issue date Jul 19, 2022
- Siemens Healthcare GmbH
- Pooyan Sahbaee Bagherzadeh
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
X-ray phase imaging apparatus
- Patent number 11,311,260
- Issue date Apr 26, 2022
- Shimadzu Corporation
- Satoshi Sano
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING

Patents Applicationslast 30 patents

Information Patent Application
DEFECT DEPTH ESTIMATION FOR A SEMICONDUCTOR SPECIMEN
- Publication number 20240410841
- Publication date Dec 12, 2024
- APPLIED MATERIALS ISRAEL LTD.
- Vadim KUCHIK
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION SYSTEM AND INSPECTION METHOD
- Publication number 20240361257
- Publication date Oct 31, 2024
- Nuctech Company Limited
- Li ZHANG
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION SYSTEM
- Publication number 20240361258
- Publication date Oct 31, 2024
- VAREX IMAGING CORPORATION
- Rajashekar Venkatachalam
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
INSPECTION SYSTEM AND METHOD
- Publication number 20240345005
- Publication date Oct 17, 2024
- Nuctech Company Limited
- Li ZHANG
- G01 - MEASURING TESTING
Information Patent Application
RADIOGRAPHY INSPECTION AND FAIL-SAFE MECHANISM FOR PIPE TRAVERSING...
- Publication number 20240319119
- Publication date Sep 26, 2024
- ARIX TECHNOLOGIES, INC.
- Bryan R. Duerfeldt
- G01 - MEASURING TESTING
Information Patent Application
X-RAY INSPECTION SYSTEM AND CONTROL ARCHITECTURE FOR AN X-RAY INSPE...
- Publication number 20240302296
- Publication date Sep 12, 2024
- Smiths Detection France S.A.S.
- Jean-Michel FAUGIER
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION SYSTEM AND INSPECTION METHOD
- Publication number 20240219325
- Publication date Jul 4, 2024
- Nuctech Company Limited
- Li ZHANG
- G01 - MEASURING TESTING
Information Patent Application
SEAL ELEMENT FOR A PIPELINE PIG
- Publication number 20240200664
- Publication date Jun 20, 2024
- ROSEN SWISS AG
- Patrik Rosen
- F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...
Information Patent Application
Systems and Methods for X-Ray Computed Tomography
- Publication number 20240192150
- Publication date Jun 13, 2024
- Orimtech Ltd.
- Boris S. GOLDBERG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
X-RAY IMAGING APPARATUS
- Publication number 20240167967
- Publication date May 23, 2024
- Woorien Co., Ltd.
- Taehee HAN
- G01 - MEASURING TESTING
Information Patent Application
Procedure for generating fluoroscopic images for the reconstruction...
- Publication number 20240159691
- Publication date May 16, 2024
- Comet Yxlon GmbH
- Mareike Töpperwien
- G01 - MEASURING TESTING
Information Patent Application
RADIOGRAPHIC INSPECTION APPARATUS AND VEHICLE-MOUNTED SECURITY INSP...
- Publication number 20240151661
- Publication date May 9, 2024
- Nuctech Company Limited
- Li ZHANG
- G01 - MEASURING TESTING
Information Patent Application
X-RAY COMPUTED TOMOGRAPHY (CT) SCANNER
- Publication number 20240142392
- Publication date May 2, 2024
- MULTICT IMAGING LTD
- Nathan HERMONY
- G01 - MEASURING TESTING
Information Patent Application
DEVICE FOR ANALYZING A FLUID IN A SAMPLE AND RELATED METHOD
- Publication number 20240125715
- Publication date Apr 18, 2024
- TOTALENERGIES ONETECH
- Michel N'GUYEN
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR INSPECTING DEFECTS OF STRUCTURE BY USING X-RAY
- Publication number 20240102949
- Publication date Mar 28, 2024
- NEUF Inc.
- Myoung Chan NA
- G01 - MEASURING TESTING
Information Patent Application
HIGH RESOLUTION COMPUTED TOMOGRAPHY OBJECT SCANNING
- Publication number 20240102947
- Publication date Mar 28, 2024
- Baker Hughes Holdings LLC
- Nils Rothe
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
X-RAY REFLECTOMETRY APPARATUS AND METHOD THEREOF FOR MEASURING THRE...
- Publication number 20240094148
- Publication date Mar 21, 2024
- Industrial Technology Research Institute
- Bo-Ching HE
- G01 - MEASURING TESTING
Information Patent Application
System and Method for Tomographic Imaging of Core Samples
- Publication number 20240053284
- Publication date Feb 15, 2024
- Orimtech Ltd.
- Boris S. Goldberg
- G01 - MEASURING TESTING
Information Patent Application
MULTI-CHANNEL RADIOGRAPHIC INSPECTION DEVICE
- Publication number 20240027369
- Publication date Jan 25, 2024
- Nuctech Company Limited
- Li ZHANG
- G01 - MEASURING TESTING
Information Patent Application
RADIOGRAPHY INSPECTION AND FAIL-SAFE MECHANISM FOR PIPE TRAVERSING...
- Publication number 20230366837
- Publication date Nov 16, 2023
- ARIX TECHNOLOGIES, INC.
- Bryan R. Duerfeldt
- G01 - MEASURING TESTING
Information Patent Application
X-RAY WELD INSPECTION
- Publication number 20230349840
- Publication date Nov 2, 2023
- Direct Conversion AB
- Tuomas Pantsar
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
AUTOMATED CIRCUMFERENTIAL PIPE SCANNING SYSTEM
- Publication number 20230280289
- Publication date Sep 7, 2023
- Mistras Group, Inc.
- John Musgrave
- G01 - MEASURING TESTING
Information Patent Application
MOVABLE DETECTION DEVICE AND DETECTION METHOD
- Publication number 20230243763
- Publication date Aug 3, 2023
- Nuctech Company Limited
- Kejin GAO
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR INSPECTING DEFECTS OF STRUCTURE BY USING X-RAY
- Publication number 20230213461
- Publication date Jul 6, 2023
- NEUF Inc.
- Myoung Chan NA
- G01 - MEASURING TESTING
Information Patent Application
SCANNING SPECTRAL X-RAY IMAGING USING AN ALTERNATING HIGH VOLTAGE X...
- Publication number 20230152245
- Publication date May 18, 2023
- Teledyne Dalsa B.V.
- Jonathan E. Snyder
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR INSPECTING DEFECTS OF STRUCTURE BY USING X-RAY
- Publication number 20230066283
- Publication date Mar 2, 2023
- NEUF Inc.
- Myoung Chan NA
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATED CIRCUMFERENTIAL PIPE SCANNING SYSTEM
- Publication number 20230049542
- Publication date Feb 16, 2023
- Mistras Group, Inc.
- John Musgrave
- G01 - MEASURING TESTING
Information Patent Application
RADIOGRAPHY INSPECTION AND FAIL-SAFE MECHANISM FOR PIPE TRAVERSING...
- Publication number 20230050602
- Publication date Feb 16, 2023
- ARIX TECHNOLOGIES, INC.
- Bryan R. Duerfeldt
- G01 - MEASURING TESTING
Information Patent Application
MULTIPLE SECONDARY ELECTRON BEAM ALIGNMENT METHOD, MULTIPLE SECONDA...
- Publication number 20220365010
- Publication date Nov 17, 2022
- NuFlare Technology, Inc.
- Koichi ISHII
- G01 - MEASURING TESTING
Information Patent Application
X-RAY TOMOGRAPHY SYSTEMS AND METHODS FOR IMAGING AN AIRCRAFT PART
- Publication number 20220349842
- Publication date Nov 3, 2022
- The Boeing Company
- Donald Duane Palmer
- G01 - MEASURING TESTING

object fixed source and detector move

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

System and method for inspecting defects of structure by using X-ray

X-ray tomography systems and methods for imaging an aircraft part

X-ray weld inspection

Seal element for a pipeline pig

Systems and methods for x-ray computed tomography

Automated circumferential pipe scanning system

Inspection system, determination processing apparatus, and inspecti...

Radiography inspection and fail-safe mechanism for pipe traversing...

Medical x-ray imaging systems and methods

Multi-source cone beam computed tomography

Tolerance error estimating apparatus, method, program, reconstructi...

Tube weld X-ray inspection device comprising an X-ray source, an X-...

Systems and methods for X-ray computed tomography

Scanning systems with dynamically adjustable shielding systems and...

System and method for inspecting defects of structure by using X-ray

Radiographic inspection system for pipes and other structures and m...

Radiation inspection apparatus comprising a radiation inspection de...

Diffraction analysis device and method for full-field x-ray fluores...

Radiography inspection and fail-safe mechanism for pipe traversing...

Method of non-destructive imaging of the internal structure and dev...

Radiographic inspection system for pipes and other structures and m...

Automated circumferential pipe scanning system

Sample inspection system

Energy-dispersive X-ray diffraction analyser comprising a substanti...

Nondestructive testing system and nondestructive testing method

Back scattering inspection system and back scattering inspection me...

System and method for inspecting defects of structure by using x-ray

Stationary X-Ray source

Spectral CT-based 511 KeV for positron emission tomography

X-ray phase imaging apparatus

Patents Applicationslast 30 patents

DEFECT DEPTH ESTIMATION FOR A SEMICONDUCTOR SPECIMEN

INSPECTION SYSTEM AND INSPECTION METHOD

INSPECTION SYSTEM

INSPECTION SYSTEM AND METHOD

RADIOGRAPHY INSPECTION AND FAIL-SAFE MECHANISM FOR PIPE TRAVERSING...

X-RAY INSPECTION SYSTEM AND CONTROL ARCHITECTURE FOR AN X-RAY INSPE...

INSPECTION SYSTEM AND INSPECTION METHOD

SEAL ELEMENT FOR A PIPELINE PIG

Systems and Methods for X-Ray Computed Tomography

X-RAY IMAGING APPARATUS

Procedure for generating fluoroscopic images for the reconstruction...

RADIOGRAPHIC INSPECTION APPARATUS AND VEHICLE-MOUNTED SECURITY INSP...

X-RAY COMPUTED TOMOGRAPHY (CT) SCANNER

DEVICE FOR ANALYZING A FLUID IN A SAMPLE AND RELATED METHOD

SYSTEM AND METHOD FOR INSPECTING DEFECTS OF STRUCTURE BY USING X-RAY

HIGH RESOLUTION COMPUTED TOMOGRAPHY OBJECT SCANNING

X-RAY REFLECTOMETRY APPARATUS AND METHOD THEREOF FOR MEASURING THRE...

System and Method for Tomographic Imaging of Core Samples

MULTI-CHANNEL RADIOGRAPHIC INSPECTION DEVICE

RADIOGRAPHY INSPECTION AND FAIL-SAFE MECHANISM FOR PIPE TRAVERSING...

X-RAY WELD INSPECTION

AUTOMATED CIRCUMFERENTIAL PIPE SCANNING SYSTEM

MOVABLE DETECTION DEVICE AND DETECTION METHOD

SYSTEM AND METHOD FOR INSPECTING DEFECTS OF STRUCTURE BY USING X-RAY

SCANNING SPECTRAL X-RAY IMAGING USING AN ALTERNATING HIGH VOLTAGE X...

SYSTEM AND METHOD FOR INSPECTING DEFECTS OF STRUCTURE BY USING X-RAY

AUTOMATED CIRCUMFERENTIAL PIPE SCANNING SYSTEM

RADIOGRAPHY INSPECTION AND FAIL-SAFE MECHANISM FOR PIPE TRAVERSING...

MULTIPLE SECONDARY ELECTRON BEAM ALIGNMENT METHOD, MULTIPLE SECONDA...

X-RAY TOMOGRAPHY SYSTEMS AND METHODS FOR IMAGING AN AIRCRAFT PART