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G01B9/0205

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GPHYSICS G01Measuring instruments G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS G01B9/00Instruments as specified in the subgroups and characterised by the use of optical measuring means

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G01B9/0205of probe head

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Fault processing system for displacement sensor
- Patent number 12,241,734
- Issue date Mar 4, 2025
- Gree Electric Appliances, Inc. of Zhuhai
- Yusheng Hu
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Polarizing Fizeau interferometer
- Patent number 12,228,400
- Issue date Feb 18, 2025
- Mitutoyo Corporation
- Shimpei Matsuura
- G01 - MEASURING TESTING
Information Patent Grant
Frequency shifter for heterodyne interferometry measurements and de...
- Patent number 12,209,861
- Issue date Jan 28, 2025
- CHAMARTIN LABORATORIES LLC
- Richard Grote
- G01 - MEASURING TESTING
Information Patent Grant
Measuring apparatus, on-chip instrumentation device and measuring m...
- Patent number 12,181,278
- Issue date Dec 31, 2024
- Nippon Telegraph and Telephone Corporation
- Katsumasa Yoshioka
- G01 - MEASURING TESTING
Information Patent Grant
Optical device for heterodyne interferometry
- Patent number 12,181,279
- Issue date Dec 31, 2024
- CHAMARTIN LABORATORIES LLC
- Richard Grote
- G01 - MEASURING TESTING
Information Patent Grant
Mirror unit and optical module
- Patent number 12,152,878
- Issue date Nov 26, 2024
- Hamamatsu Photonics K.K.
- Tomofumi Suzuki
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Optical coherence tomography system
- Patent number 12,140,426
- Issue date Nov 12, 2024
- AIT Austrian Institute of Technology GmbH
- Rainer Hainberger
- G01 - MEASURING TESTING
Information Patent Grant
Device for measuring a substrate and method for correcting cyclic e...
- Patent number 12,135,211
- Issue date Nov 5, 2024
- Carl Zeiss SMT GmbH
- Stephan Zschaeck
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Surface metrology systems and methods thereof
- Patent number 12,123,701
- Issue date Oct 22, 2024
- Optipro Systems, LLC
- James Fredric Munro
- G01 - MEASURING TESTING
Information Patent Grant
Interometric optical system
- Patent number 12,104,897
- Issue date Oct 1, 2024
- Zygo Corporation
- Peter J. de Groot
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for optical coherence tomography within integrated optoel...
- Patent number 12,064,210
- Issue date Aug 20, 2024
- Nokia Technologies Oy
- Michael Eggleston
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
MEMS mirror for OCT probe and method of manufacturing such MEMS mirror
- Patent number 12,066,620
- Issue date Aug 20, 2024
- Scinvivo B.V.
- Hendrikus Wilhelmus Leonardus Antonius Maria Van Lierop
- G01 - MEASURING TESTING
Information Patent Grant
Calibration kit for an optical scanning device
- Patent number 12,044,844
- Issue date Jul 23, 2024
- QISDA Corporation
- Tzu-Huan Hsu
- G02 - OPTICS
Information Patent Grant
Miniature 3D position-to-optical displacement sensor
- Patent number 12,025,438
- Issue date Jul 2, 2024
- The Curators of the University of Missouri
- Genda Chen
- G01 - MEASURING TESTING
Information Patent Grant
Determining angular orientation for imaging
- Patent number 12,004,842
- Issue date Jun 11, 2024
- NINEPOINT MEDICAL, INC.
- Benedikt Graf
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Polarization-separated, phase-shifted interferometer
- Patent number 12,000,698
- Issue date Jun 4, 2024
- Massachusetts Institute of Technology
- Noah Gilbert
- G01 - MEASURING TESTING
Information Patent Grant
Full-field OCT method and system for generating an imaging of an oc...
- Patent number 11,986,242
- Issue date May 21, 2024
- VISOTEC GMBH
- Peter Koch
- G01 - MEASURING TESTING
Information Patent Grant
Interferometer and optical instrument with integrated optical compo...
- Patent number 11,933,609
- Issue date Mar 19, 2024
- Yokogawa Electric Corporation
- Nobuhide Yamada
- G01 - MEASURING TESTING
Information Patent Grant
Laser interferometer having a vibrator to modulate light for displa...
- Patent number 11,879,730
- Issue date Jan 23, 2024
- Seiko Epson Corporation
- Jun Kitagawa
- G02 - OPTICS
Information Patent Grant
Mirror unit and optical module
- Patent number 11,879,731
- Issue date Jan 23, 2024
- Hamamatsu Photonics K.K.
- Tomofumi Suzuki
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Optical systems with controlled mirror arrangements
- Patent number 11,841,223
- Issue date Dec 12, 2023
- Lockheed Martin Corporation
- Brian James Howley
- G01 - MEASURING TESTING
Information Patent Grant
Interferometry assembly having optical paths through different mate...
- Patent number 11,835,337
- Issue date Dec 5, 2023
- Lumentum Technology UK Limited
- Adrian Perrin Janssen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus with cantilever light guide
- Patent number 11,828,592
- Issue date Nov 28, 2023
- Nokia Technologies Oy
- David Bitauld
- G01 - MEASURING TESTING
Information Patent Grant
Waveguide enhanced analyte detection apparatus
- Patent number 11,808,569
- Issue date Nov 7, 2023
- Strike Photonics, Inc.
- Daniel Carothers
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Temperature-insensitive Mach-Zehnder interferometer
- Patent number 11,796,738
- Issue date Oct 24, 2023
- Shanghai Institute of Microsystem and Information Technology, Chinese Academy...
- Chao Qiu
- G01 - MEASURING TESTING
Information Patent Grant
Method for calibrating a measuring apparatus
- Patent number 11,774,237
- Issue date Oct 3, 2023
- Carl Zeiss SMT GmbH
- Jochen Hetzler
- G01 - MEASURING TESTING
Information Patent Grant
Multi-environment Rayleigh interferometer
- Patent number 11,761,750
- Issue date Sep 19, 2023
- Aaron Pung
- G01 - MEASURING TESTING
Information Patent Grant
Method, system, and apparatus for optical measurement
- Patent number 11,754,390
- Issue date Sep 12, 2023
- The Boeing Company
- Jerald A. Hull
- G01 - MEASURING TESTING
Information Patent Grant
Optical component for an ATR interferometric imaging device
- Patent number 11,747,134
- Issue date Sep 5, 2023
- Commissariat a l'Energie Atomique et Aux Energies Alternatives
- Cyrielle Monpeurt
- G01 - MEASURING TESTING
Information Patent Grant
Methods and apparatus for decomposition to account for imperfect be...
- Patent number 11,747,132
- Issue date Sep 5, 2023
- Xanadu Quantum Technologies Inc.
- Ish Dhand
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHODS AND SYSTEMS FOR CONFOCAL FUNCTION DETERMINATION AND CORRECT...
- Publication number 20250102289
- Publication date Mar 27, 2025
- HEIDELBERG ENGINEERING GMBH
- Johannes KÜBLER
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED ELECTRONIC SYSTEM FOR OPTICAL COHERENCE TOMOGRAPHY
- Publication number 20250067551
- Publication date Feb 27, 2025
- Myriad Advanced Technologies LLC
- Muhammad Al-Qaisi
- G01 - MEASURING TESTING
Information Patent Application
MIRROR UNIT AND OPTICAL MODULE
- Publication number 20250044074
- Publication date Feb 6, 2025
- HAMAMATSU PHOTONICS K. K.
- Tomofumi Suzuki
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
SEMICONDUCTOR MEASUREMENT APPARATUS
- Publication number 20250012556
- Publication date Jan 9, 2025
- Samsung Electronics Co., Ltd.
- Younguk Jin
- G01 - MEASURING TESTING
Information Patent Application
Relative intensity noise Cat's-eye swept source laser for OCT and s...
- Publication number 20240418497
- Publication date Dec 19, 2024
- KineoLabs, Inc.
- Walid A. Atia
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
SURFACE METROLOGY SYSTEMS AND METHODS THEREOF
- Publication number 20240401938
- Publication date Dec 5, 2024
- OptiPro Systems, LLC
- James Fredric Munro
- G01 - MEASURING TESTING
Information Patent Application
ABSOLUTE MEASUREMENT METHOD FOR THE PHASE OF THE COMPLEX COHERENCE...
- Publication number 20240401927
- Publication date Dec 5, 2024
- SHANGHAI INSTITUTE OF TECHNICAL PHYSICS, CHINESE ACADEMY OF SCIENCES
- Qinghua YU
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL COHERENCE TOMOGRAPH
- Publication number 20240393099
- Publication date Nov 28, 2024
- FURUKAWA ELECTRIC CO., LTD.
- Noritaka MATSUBARA
- G02 - OPTICS
Information Patent Application
ANGULAR AVERAGING CALIBRATION ON BARE WAFER METROLOGY TOOLS FOR ESF...
- Publication number 20240353219
- Publication date Oct 24, 2024
- KLA Corporation
- Haifeng Wang
- G01 - MEASURING TESTING
Information Patent Application
INTERFEROMETER FOR CARRYING OUT AN OPTICAL COHERENCE TOMOGRAPHY
- Publication number 20240337480
- Publication date Oct 10, 2024
- HEIDELBERG ENGINEERING GMBH
- Andreas FRITZ
- G01 - MEASURING TESTING
Information Patent Application
BULK GLASS INTERFEROMETER DESIGN WITH DISPERSION FOR COMPLEX CONJUG...
- Publication number 20240288264
- Publication date Aug 29, 2024
- LEICA MICROSYSTEMS NC, INC.
- Robert H. HART
- G01 - MEASURING TESTING
Information Patent Application
DETERMINING ANGULAR ORIENTATION FOR IMAGING
- Publication number 20240285169
- Publication date Aug 29, 2024
- NINEPOINT MEDICAL, INC.
- Benedikt GRAF
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
OPTICAL SAFETY DEVICE
- Publication number 20240245298
- Publication date Jul 25, 2024
- Canon U.S.A., Inc.
- Badr Elmaanaoui
- G01 - MEASURING TESTING
Information Patent Application
HIGH-RESOLUTION HANDHELD OCT IMAGING SYSTEM
- Publication number 20240230315
- Publication date Jul 11, 2024
- THE FIRST AFFILIATED HOSPITAL OF JINAN UNIVERSITY (GUANGZHOU OVERSEAS CHINESE
- Shuixing Zhang
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
PIEZOELECTRIC INTERFEROMETER
- Publication number 20240175673
- Publication date May 30, 2024
- Murata Manufacturing Co., Ltd.
- Ville KAAJAKARI
- G01 - MEASURING TESTING
Information Patent Application
On-Chip Opto-Digital Wavelength Meter
- Publication number 20240175672
- Publication date May 30, 2024
- Axalume, Inc.
- Yossef Ehrlichman
- G01 - MEASURING TESTING
Information Patent Application
HIGH-RESOLUTION HANDHELD OCT IMAGING SYSTEM
- Publication number 20240133674
- Publication date Apr 25, 2024
- THE FIRST AFFILIATED HOSPITAL OF JINAN UNIVERSITY (GUANGZHOU OVERSEAS CHINESE
- Shuixing Zhang
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
OPTICAL LOCKER
- Publication number 20240110778
- Publication date Apr 4, 2024
- Lumentum Technology UK Limited
- Adrian Perrin JANSSEN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MIRROR UNIT AND OPTICAL MODULE
- Publication number 20240110779
- Publication date Apr 4, 2024
- HAMAMATSU PHOTONICS K. K.
- Tomofumi Suzuki
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
ALIGNMENT METHOD, SHAPE MEASURING METHOD AND SHAPE MEASURING APPARATUS
- Publication number 20240077304
- Publication date Mar 7, 2024
- TOKYO SEIMITSU CO., LTD.
- Tasuku SHIMIZU
- G01 - MEASURING TESTING
Information Patent Application
CABIN ENTRY-AND-EXIT STRUCTURE OF ANALYSIS DEVICE, ANALYSIS DEVICE...
- Publication number 20240035802
- Publication date Feb 1, 2024
- Beijing BOE Technology Development Co., Ltd.
- Xiangguo MA
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL COHERENCE TOMOGRAPHY (OCT) SYSTEM WITH A MULTI-PASS DISPERS...
- Publication number 20240035805
- Publication date Feb 1, 2024
- Alfred E. Mann Institute for Biomedical Engineering at the University of Sout...
- Wihan Kim
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
QUANTUM SENSOR AND SYNXAPPS ARRAY
- Publication number 20240011763
- Publication date Jan 11, 2024
- Demond Adams
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD, MEASURING DEVICE, MACHINING SYSTEM AND COMPUTER PROGRAM PRO...
- Publication number 20230384083
- Publication date Nov 30, 2023
- Lessmüller Lasertechnik GmbH
- Eckhard Lessmüller
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
LASER PROCESSING SYSTEM HAVING OPTICAL DIFFRACTION TOMOGRAPHY FUNCTION
- Publication number 20230356324
- Publication date Nov 9, 2023
- INNOFOCUS PHOTONICS TECHNOLOGY PTY LTD
- Baohua JIA
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
OPTICAL INTERFEROMETRIC RANGE SENSOR
- Publication number 20230314122
- Publication date Oct 5, 2023
- Omron Corporation
- Masayuki HAYAKAWA
- G02 - OPTICS
Information Patent Application
OPTICAL INTERFERENCE RANGE SENSOR
- Publication number 20230288185
- Publication date Sep 14, 2023
- Omron Corporation
- Yusuke NAGASAKI
- G01 - MEASURING TESTING
Information Patent Application
Optical Coherence Tomography With Self-Inspecting Imaging Device
- Publication number 20230280153
- Publication date Sep 7, 2023
- LightLab Imaging, Inc.
- Steven M. Stromski
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL DEVICE
- Publication number 20230221106
- Publication date Jul 13, 2023
- HAMAMATSU PHOTONICS K. K.
- Tomofumi Suzuki
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
COMMON PATH WAVEGUIDES FOR STABLE OPTICAL COHERENCE TOMOGRAPHY IMAGING
- Publication number 20230218162
- Publication date Jul 13, 2023
- Alcon Inc.
- Guy Holland
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE

of probe head

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Fault processing system for displacement sensor

Polarizing Fizeau interferometer

Frequency shifter for heterodyne interferometry measurements and de...

Measuring apparatus, on-chip instrumentation device and measuring m...

Optical device for heterodyne interferometry

Mirror unit and optical module

Optical coherence tomography system

Device for measuring a substrate and method for correcting cyclic e...

Surface metrology systems and methods thereof

Interometric optical system

Apparatus for optical coherence tomography within integrated optoel...

MEMS mirror for OCT probe and method of manufacturing such MEMS mirror

Calibration kit for an optical scanning device

Miniature 3D position-to-optical displacement sensor

Determining angular orientation for imaging

Polarization-separated, phase-shifted interferometer

Full-field OCT method and system for generating an imaging of an oc...

Interferometer and optical instrument with integrated optical compo...

Laser interferometer having a vibrator to modulate light for displa...

Mirror unit and optical module

Optical systems with controlled mirror arrangements

Interferometry assembly having optical paths through different mate...

Apparatus with cantilever light guide

Waveguide enhanced analyte detection apparatus

Temperature-insensitive Mach-Zehnder interferometer

Method for calibrating a measuring apparatus

Multi-environment Rayleigh interferometer

Method, system, and apparatus for optical measurement

Optical component for an ATR interferometric imaging device

Methods and apparatus for decomposition to account for imperfect be...

Patents Applicationslast 30 patents

METHODS AND SYSTEMS FOR CONFOCAL FUNCTION DETERMINATION AND CORRECT...

INTEGRATED ELECTRONIC SYSTEM FOR OPTICAL COHERENCE TOMOGRAPHY

MIRROR UNIT AND OPTICAL MODULE

SEMICONDUCTOR MEASUREMENT APPARATUS

Relative intensity noise Cat's-eye swept source laser for OCT and s...

SURFACE METROLOGY SYSTEMS AND METHODS THEREOF

ABSOLUTE MEASUREMENT METHOD FOR THE PHASE OF THE COMPLEX COHERENCE...

OPTICAL COHERENCE TOMOGRAPH

ANGULAR AVERAGING CALIBRATION ON BARE WAFER METROLOGY TOOLS FOR ESF...

INTERFEROMETER FOR CARRYING OUT AN OPTICAL COHERENCE TOMOGRAPHY

BULK GLASS INTERFEROMETER DESIGN WITH DISPERSION FOR COMPLEX CONJUG...

DETERMINING ANGULAR ORIENTATION FOR IMAGING

OPTICAL SAFETY DEVICE

HIGH-RESOLUTION HANDHELD OCT IMAGING SYSTEM

PIEZOELECTRIC INTERFEROMETER

On-Chip Opto-Digital Wavelength Meter

HIGH-RESOLUTION HANDHELD OCT IMAGING SYSTEM

OPTICAL LOCKER

MIRROR UNIT AND OPTICAL MODULE

ALIGNMENT METHOD, SHAPE MEASURING METHOD AND SHAPE MEASURING APPARATUS

CABIN ENTRY-AND-EXIT STRUCTURE OF ANALYSIS DEVICE, ANALYSIS DEVICE...

OPTICAL COHERENCE TOMOGRAPHY (OCT) SYSTEM WITH A MULTI-PASS DISPERS...

QUANTUM SENSOR AND SYNXAPPS ARRAY

METHOD, MEASURING DEVICE, MACHINING SYSTEM AND COMPUTER PROGRAM PRO...

LASER PROCESSING SYSTEM HAVING OPTICAL DIFFRACTION TOMOGRAPHY FUNCTION

OPTICAL INTERFEROMETRIC RANGE SENSOR

OPTICAL INTERFERENCE RANGE SENSOR

Optical Coherence Tomography With Self-Inspecting Imaging Device

OPTICAL DEVICE

COMMON PATH WAVEGUIDES FOR STABLE OPTICAL COHERENCE TOMOGRAPHY IMAGING