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G01B9/0205
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Parent Industries
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PHYSICS
G01
Measuring instruments
G01B
MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
G01B9/00
Instruments as specified in the subgroups and characterised by the use of optical measuring means
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G01B9/0205
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Patents Grants
last 30 patents
Information
Patent Grant
Interferometer and optical instrument with integrated optical compo...
Patent number
11,933,609
Issue date
Mar 19, 2024
Yokogawa Electric Corporation
Nobuhide Yamada
G01 - MEASURING TESTING
Information
Patent Grant
Laser interferometer having a vibrator to modulate light for displa...
Patent number
11,879,730
Issue date
Jan 23, 2024
Seiko Epson Corporation
Jun Kitagawa
G02 - OPTICS
Information
Patent Grant
Mirror unit and optical module
Patent number
11,879,731
Issue date
Jan 23, 2024
Hamamatsu Photonics K.K.
Tomofumi Suzuki
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Optical systems with controlled mirror arrangements
Patent number
11,841,223
Issue date
Dec 12, 2023
Lockheed Martin Corporation
Brian James Howley
G01 - MEASURING TESTING
Information
Patent Grant
Interferometry assembly having optical paths through different mate...
Patent number
11,835,337
Issue date
Dec 5, 2023
Lumentum Technology UK Limited
Adrian Perrin Janssen
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Apparatus with cantilever light guide
Patent number
11,828,592
Issue date
Nov 28, 2023
Nokia Technologies Oy
David Bitauld
G01 - MEASURING TESTING
Information
Patent Grant
Waveguide enhanced analyte detection apparatus
Patent number
11,808,569
Issue date
Nov 7, 2023
Strike Photonics, Inc.
Daniel Carothers
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Temperature-insensitive Mach-Zehnder interferometer
Patent number
11,796,738
Issue date
Oct 24, 2023
Shanghai Institute of Microsystem and Information Technology, Chinese Academy...
Chao Qiu
G01 - MEASURING TESTING
Information
Patent Grant
Method for calibrating a measuring apparatus
Patent number
11,774,237
Issue date
Oct 3, 2023
Carl Zeiss SMT GmbH
Jochen Hetzler
G01 - MEASURING TESTING
Information
Patent Grant
Multi-environment Rayleigh interferometer
Patent number
11,761,750
Issue date
Sep 19, 2023
Aaron Pung
G01 - MEASURING TESTING
Information
Patent Grant
Method, system, and apparatus for optical measurement
Patent number
11,754,390
Issue date
Sep 12, 2023
The Boeing Company
Jerald A. Hull
G01 - MEASURING TESTING
Information
Patent Grant
Optical component for an ATR interferometric imaging device
Patent number
11,747,134
Issue date
Sep 5, 2023
Commissariat a l'Energie Atomique et Aux Energies Alternatives
Cyrielle Monpeurt
G01 - MEASURING TESTING
Information
Patent Grant
Methods and apparatus for decomposition to account for imperfect be...
Patent number
11,747,132
Issue date
Sep 5, 2023
Xanadu Quantum Technologies Inc.
Ish Dhand
G01 - MEASURING TESTING
Information
Patent Grant
Optical pressure sensor assembly
Patent number
11,723,538
Issue date
Aug 15, 2023
Avinger, Inc.
Peter H. Smith
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Grant
Heterodyne photonic integrated circuit for absolute metrology
Patent number
11,703,317
Issue date
Jul 18, 2023
Raytheon Company
Richard Lee Kendrick
G01 - MEASURING TESTING
Information
Patent Grant
Homodyne encoder system with adaptive path length matching
Patent number
11,703,318
Issue date
Jul 18, 2023
United States of America as represented by the Secretary of the Navy
Kyle Robert Drexler
G01 - MEASURING TESTING
Information
Patent Grant
Multi-fiber optical probe and optical coherence tomography system
Patent number
11,701,004
Issue date
Jul 18, 2023
SYNAPTIVE MEDICAL INC.
Siu Wai Jacky Mak
G01 - MEASURING TESTING
Information
Patent Grant
Laser interferometry systems and methods
Patent number
11,703,315
Issue date
Jul 18, 2023
Nordson Corporation
Jerome Joseph Dapore
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus for monitoring the output of an optical system
Patent number
11,681,110
Issue date
Jun 20, 2023
Lumentum Technology UK Limited
Adrian Perrin Janssen
G01 - MEASURING TESTING
Information
Patent Grant
Optical coherence tomography with graded index fiber for biological...
Patent number
11,647,905
Issue date
May 16, 2023
Avinger, Inc.
Manish Kankaria
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Grant
Optical module
Patent number
11,635,290
Issue date
Apr 25, 2023
Hamamatsu Photonics K.K.
Tomofumi Suzuki
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Optical device
Patent number
11,629,947
Issue date
Apr 18, 2023
Hamamatsu Photonics K.K.
Tomofumi Suzuki
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Optical interferometry proximity sensor with optical path extender
Patent number
11,629,948
Issue date
Apr 18, 2023
Apple Inc.
Nathan Shou
G01 - MEASURING TESTING
Information
Patent Grant
Mirror unit and optical module
Patent number
11,629,946
Issue date
Apr 18, 2023
Hamamatsu Photonics K.K.
Tomofumi Suzuki
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Mirror unit and optical module
Patent number
11,624,605
Issue date
Apr 11, 2023
Hamamatsu Photonics K.K.
Tomofumi Suzuki
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Common path waveguides for stable optical coherence tomography imaging
Patent number
11,602,271
Issue date
Mar 14, 2023
Alcon Inc.
Guy Holland
G02 - OPTICS
Information
Patent Grant
Integrated optical system with wavelength tuning and spatial switching
Patent number
11,579,356
Issue date
Feb 14, 2023
Eric Swanson
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Grant
Systems, devices, methods, apparatus and computer-accessible media...
Patent number
11,553,841
Issue date
Jan 17, 2023
The General Hospital Corporation
Guillermo J. Tearney
G01 - MEASURING TESTING
Information
Patent Grant
Chamber for vibrational and environmental isolation of thin wafers
Patent number
11,555,791
Issue date
Jan 17, 2023
Corning Incorporated
John Weston Frankovich
G01 - MEASURING TESTING
Information
Patent Grant
Analysis apparatus, analysis method, and interference measurement s...
Patent number
11,536,562
Issue date
Dec 27, 2022
Mitutoyo Corp.
Shimpei Matsuura
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
HIGH-RESOLUTION HANDHELD OCT IMAGING SYSTEM
Publication number
20240133674
Publication date
Apr 25, 2024
THE FIRST AFFILIATED HOSPITAL OF JINAN UNIVERSITY (GUANGZHOU OVERSEAS CHINESE
Shuixing Zhang
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
OPTICAL LOCKER
Publication number
20240110778
Publication date
Apr 4, 2024
Lumentum Technology UK Limited
Adrian Perrin JANSSEN
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
MIRROR UNIT AND OPTICAL MODULE
Publication number
20240110779
Publication date
Apr 4, 2024
HAMAMATSU PHOTONICS K. K.
Tomofumi Suzuki
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
ALIGNMENT METHOD, SHAPE MEASURING METHOD AND SHAPE MEASURING APPARATUS
Publication number
20240077304
Publication date
Mar 7, 2024
TOKYO SEIMITSU CO., LTD.
Tasuku SHIMIZU
G01 - MEASURING TESTING
Information
Patent Application
CABIN ENTRY-AND-EXIT STRUCTURE OF ANALYSIS DEVICE, ANALYSIS DEVICE...
Publication number
20240035802
Publication date
Feb 1, 2024
Beijing BOE Technology Development Co., Ltd.
Xiangguo MA
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL COHERENCE TOMOGRAPHY (OCT) SYSTEM WITH A MULTI-PASS DISPERS...
Publication number
20240035805
Publication date
Feb 1, 2024
Alfred E. Mann Institute for Biomedical Engineering at the University of Sout...
Wihan Kim
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Application
QUANTUM SENSOR AND SYNXAPPS ARRAY
Publication number
20240011763
Publication date
Jan 11, 2024
Demond Adams
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
METHOD, MEASURING DEVICE, MACHINING SYSTEM AND COMPUTER PROGRAM PRO...
Publication number
20230384083
Publication date
Nov 30, 2023
Lessmüller Lasertechnik GmbH
Eckhard Lessmüller
B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information
Patent Application
LASER PROCESSING SYSTEM HAVING OPTICAL DIFFRACTION TOMOGRAPHY FUNCTION
Publication number
20230356324
Publication date
Nov 9, 2023
INNOFOCUS PHOTONICS TECHNOLOGY PTY LTD
Baohua JIA
B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information
Patent Application
OPTICAL INTERFEROMETRIC RANGE SENSOR
Publication number
20230314122
Publication date
Oct 5, 2023
Omron Corporation
Masayuki HAYAKAWA
G02 - OPTICS
Information
Patent Application
OPTICAL INTERFERENCE RANGE SENSOR
Publication number
20230288185
Publication date
Sep 14, 2023
Omron Corporation
Yusuke NAGASAKI
G01 - MEASURING TESTING
Information
Patent Application
Optical Coherence Tomography With Self-Inspecting Imaging Device
Publication number
20230280153
Publication date
Sep 7, 2023
LightLab Imaging, Inc.
Steven M. Stromski
G01 - MEASURING TESTING
Information
Patent Application
COMMON PATH WAVEGUIDES FOR STABLE OPTICAL COHERENCE TOMOGRAPHY IMAGING
Publication number
20230218162
Publication date
Jul 13, 2023
Alcon Inc.
Guy Holland
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Application
OPTICAL DEVICE
Publication number
20230221106
Publication date
Jul 13, 2023
HAMAMATSU PHOTONICS K. K.
Tomofumi Suzuki
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
OPTICAL SYSTEM USING ENHANCED STATIC FRINGE CAPTURE
Publication number
20230213334
Publication date
Jul 6, 2023
BMV Optical Technologies Inc.
Curtis Blake LaPlante
G01 - MEASURING TESTING
Information
Patent Application
DISTANCE DETERMINING SYSTEM AND PROXIMITY SENSOR
Publication number
20230175836
Publication date
Jun 8, 2023
PixArt Imaging Inc.
En-Feng Hsu
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR CALIBRATION OF AN OPTICAL MEASUREMENT SYSTEM AND OPTICAL...
Publication number
20230168077
Publication date
Jun 1, 2023
ASML NETHERLANDS B.V.
Maarten Jozef JANSEN
G01 - MEASURING TESTING
Information
Patent Application
MINIATURE 3D POSITION-TO-OPTICAL DISPLACEMENT SENSOR
Publication number
20230160685
Publication date
May 25, 2023
THE CURATORS OF THE UNIVERSITY OF MISSOURI
Genda CHEN
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND DEVICE FOR CHARACTERIZING THE SURFACE SHAPE OF AN OPTICA...
Publication number
20230108466
Publication date
Apr 6, 2023
Carl Zeiss SMT GMBH
Regina CHRIST
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL INTERFERENCE RANGE SENSOR
Publication number
20230090501
Publication date
Mar 23, 2023
Omron Corporation
Yusuke NAGASAKI
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL INTERFERENCE RANGE SENSOR
Publication number
20230084871
Publication date
Mar 16, 2023
Omron Corporation
Kazuya KIMURA
G01 - MEASURING TESTING
Information
Patent Application
Measuring Apparatus, On-Chip Instrumentation Device and Measuring M...
Publication number
20230077185
Publication date
Mar 9, 2023
Nippon Telegraph and Telephone Corporation
Katsumasa Yoshioka
G01 - MEASURING TESTING
Information
Patent Application
POLARIZING FIZEAU INTERFEROMETER
Publication number
20230068859
Publication date
Mar 2, 2023
Mitutoyo Corporation
Shimpei Matsuura
G01 - MEASURING TESTING
Information
Patent Application
In-Situ Residual Intensity Noise Measurement Method And System
Publication number
20230049259
Publication date
Feb 16, 2023
KVH Industries, Inc.
Jan Amir Khan
G01 - MEASURING TESTING
Information
Patent Application
FREQUENCY SHIFTER FOR HETERODYNE INTERFEROMETRY MEASUREMENTS AND DE...
Publication number
20230046152
Publication date
Feb 16, 2023
ROCKLEY PHOTONICS LIMITED
Richard GROTE
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL COHERENCE TOMOGRAPHY RECEIVER
Publication number
20230021386
Publication date
Jan 26, 2023
Alcon Inc.
Muhammad K. Al-Qaisi
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL DEVICE FOR HETERODYNE INTERFEROMETRY
Publication number
20230019946
Publication date
Jan 19, 2023
ROCKLEY PHOTONICS LIMITED
Richard GROTE
G02 - OPTICS
Information
Patent Application
MIRROR UNIT AND OPTICAL MODULE
Publication number
20230003504
Publication date
Jan 5, 2023
HAMAMATSU PHOTONICS K. K.
Tomofumi Suzuki
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
MEASURING APPARATUS FOR INTERFEROMETRIC SHAPE MEASUREMENT
Publication number
20220349700
Publication date
Nov 3, 2022
Carl Zeiss SMT GMBH
Jochen HETZLER
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL SYSTEM AND INTERFERENCE OBJECTIVE MODULE THEROF
Publication number
20220349701
Publication date
Nov 3, 2022
Apollo Medical Optics, Ltd.
Tuan-Shu Ho
G01 - MEASURING TESTING