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G01B9/02074

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GPHYSICS G01Measuring instruments G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS G01B9/00Instruments as specified in the subgroups and characterised by the use of optical measuring means

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G01B9/02074of the detector

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Patents Grantslast 30 patents

Information Patent Grant
Determination of measurement error in an etalon
- Patent number 11,860,036
- Issue date Jan 2, 2024
- Cymer, LLC
- Russell Allen Burdt
- G01 - MEASURING TESTING
Information Patent Grant
Systems having light source with extended spectrum for semiconducto...
- Patent number 11,454,491
- Issue date Sep 27, 2022
- Yangtze Memory Technologies Co., Ltd.
- Sicong Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ophthalmic apparatus
- Patent number 11,369,265
- Issue date Jun 28, 2022
- Tomey Corporation
- Yuji Nozawa
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Common path mode fiber tip diffraction interferometer for wavefront...
- Patent number 11,333,487
- Issue date May 17, 2022
- KLA Corporation
- Haifeng Huang
- G01 - MEASURING TESTING
Information Patent Grant
Real-time normalization apparatus and method of phase generated car...
- Patent number 10,641,600
- Issue date May 5, 2020
- Zhejiang Sci-Tech University
- Liping Yan
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Combined workpiece holder and calibration profile configuration for...
- Patent number 10,584,955
- Issue date Mar 10, 2020
- Mitutoyo Corporation
- Michael Nahum
- G01 - MEASURING TESTING
Information Patent Grant
Intensity noise reduction methods and apparatus for interferometric...
- Patent number 10,006,753
- Issue date Jun 26, 2018
- LightLab Imaging, Inc.
- Joseph M. Schmitt
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
System and method for calibrated spectral domain optical coherence...
- Patent number 9,506,740
- Issue date Nov 29, 2016
- The Brigham and Women's Hospital
- Mark Brezinski
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Calibration jig for optical tomographic imaging apparatus and metho...
- Patent number 9,322,639
- Issue date Apr 26, 2016
- Terumo Kabushiki Kaisha
- Daisuke Watanabe
- G01 - MEASURING TESTING
Information Patent Grant
Position monitoring system with reduced noise
- Patent number 9,115,975
- Issue date Aug 25, 2015
- Zygo Corporation
- Jan Liesener
- G01 - MEASURING TESTING
Information Patent Grant
Intensity noise reduction methods and apparatus for interferometric...
- Patent number 8,948,613
- Issue date Feb 3, 2015
- LightLab Imaging, Inc.
- Joseph M. Schmitt
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Automatic calibration of fourier-domain optical coherence tomograph...
- Patent number 8,921,767
- Issue date Dec 30, 2014
- The Johns Hopkins University
- Jin Kang
- G01 - MEASURING TESTING
Information Patent Grant
Calibration jig for optical tomographic imaging apparatus and metho...
- Patent number 8,885,171
- Issue date Nov 11, 2014
- Terumo Kabushiki Kaisha
- Daisuke Watanabe
- G01 - MEASURING TESTING
Information Patent Grant
Calibration jig for optical tomographic imaging apparatus and metho...
- Patent number 8,441,648
- Issue date May 14, 2013
- FUJIFILM Corporation
- Daisuke Watanabe
- G01 - MEASURING TESTING
Information Patent Grant
Method for calibrating interpixel gains of an interferometer
- Patent number 8,345,256
- Issue date Jan 1, 2013
- Centre National d'Etudes Spatiales
- Elodie Cansot
- G01 - MEASURING TESTING
Information Patent Grant
Fiber optic interferometric sensor array with increased multiplexin...
- Patent number 8,189,200
- Issue date May 29, 2012
- Sercel
- Sylvie Menezo
- G01 - MEASURING TESTING
Information Patent Grant
Interferometer with multiple modes of operation for determining cha...
- Patent number 7,952,724
- Issue date May 31, 2011
- Zygo Corporation
- Xavier Colonna De Lega
- G01 - MEASURING TESTING
Information Patent Grant
Interferometry for determining characteristics of an object surface...
- Patent number 7,884,947
- Issue date Feb 8, 2011
- Zygo Corporation
- Xavier Colonna De Lega
- G01 - MEASURING TESTING
Information Patent Grant
Partial coherence interferometer with measurement ambiguity resolution
- Patent number 7,791,731
- Issue date Sep 7, 2010
- Quality Vision International, Inc.
- David B. Kay
- G01 - MEASURING TESTING
Information Patent Grant
Means and methods for signal validation for sizing spherical objects
- Patent number 7,788,067
- Issue date Aug 31, 2010
- Artium Technologies, Inc.
- William D. Bachalo
- G01 - MEASURING TESTING
Information Patent Grant
Interferometer with multiple modes of operation for determining cha...
- Patent number 7,616,323
- Issue date Nov 10, 2009
- Zygo Corporation
- Xavier Colonna De Lega
- G01 - MEASURING TESTING
Information Patent Grant
Interferometer for determining characteristics of an object surface
- Patent number 7,446,882
- Issue date Nov 4, 2008
- Zygo Corporation
- Xavier Colonna De Lega
- G01 - MEASURING TESTING
Information Patent Grant
Interferometer for determining characteristics of an object surface...
- Patent number 7,428,057
- Issue date Sep 23, 2008
- Zygo Corporation
- Xavier Colonna De Lega
- G01 - MEASURING TESTING
Information Patent Grant
Compensation for effects of beam misalignments in interferometer me...
- Patent number 7,327,465
- Issue date Feb 5, 2008
- Zygo Corporation
- Henry A. Hill
- G01 - MEASURING TESTING
Information Patent Grant
Low coherence interferometry utilizing magnitude
- Patent number 7,327,463
- Issue date Feb 5, 2008
- Medrikon Corporation
- Gerard A. Alphonse
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Enhanced lithographic displacement measurement system
- Patent number 6,987,557
- Issue date Jan 17, 2006
- ASML Netherlands B.V.
- Wouter Onno Pril
- G01 - MEASURING TESTING
Information Patent Grant
Method for self-calibrated sub-aperture stitching for surface figur...
- Patent number 6,956,657
- Issue date Oct 18, 2005
- QED Technologies, Inc.
- Donald Golini
- G01 - MEASURING TESTING
Information Patent Grant
Methods and apparatus for high speed longitudinal scanning in imagi...
- Patent number 6,191,862
- Issue date Feb 20, 2001
- Lightlab Imaging, LLC
- Eric A. Swanson
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Quasi-static fiber pressure sensor
- Patent number 6,078,706
- Issue date Jun 20, 2000
- The United States of America as represented by the Secretary of the Navy
- Gregory Nau
- G01 - MEASURING TESTING
Information Patent Grant
Point diffraction interferometer and pin mirror for use therewith
- Patent number 5,822,066
- Issue date Oct 13, 1998
- Ultratech Stepper, Inc.
- Hwan J. Jeong
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD FOR CALIBRATING ONE OR MORE OPTICAL SENSORS OF A LASER MACHI...
- Publication number 20230133662
- Publication date May 4, 2023
- Precitec GmbH & Co. KG
- Rüdiger Moser
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
SYSTEMS HAVING LIGHT SOURCE WITH EXTENDED SPECTRUM FOR SEMICONDUCTO...
- Publication number 20210262778
- Publication date Aug 26, 2021
- YANGTZE MEMORY TECHNOLOGIES CO., LTD.
- Sicong Wang
- G01 - MEASURING TESTING
Information Patent Application
COMMON PATH MODE FIBER TIP DIFFRACTION INTERFEROMETER FOR WAVEFRONT...
- Publication number 20210123716
- Publication date Apr 29, 2021
- KLA Corporation
- Haifeng Huang
- G01 - MEASURING TESTING
Information Patent Application
OPHTHALMIC APPARATUS
- Publication number 20200178791
- Publication date Jun 11, 2020
- TOMEY CORPORATION
- Yuji Nozawa
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
COMBINED WORKPIECE HOLDER AND CALIBRATION PROFILE CONFIGURATION FOR...
- Publication number 20200003544
- Publication date Jan 2, 2020
- MITUTOYO CORPORATION
- Michael Nahum
- G01 - MEASURING TESTING
Information Patent Application
REAL-TIME NORMALIZATION APPARATUS AND METHOD OF PHASE GENERATED CAR...
- Publication number 20190368860
- Publication date Dec 5, 2019
- ZHEJIANG SCI-TECH UNIVERSITY
- Liping YAN
- G01 - MEASURING TESTING
Information Patent Application
Intensity Noise Reduction Methods and Apparatus for Interferometric...
- Publication number 20180306569
- Publication date Oct 25, 2018
- LightLab Imaging, Inc.
- Joseph M. Schmitt
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
POSITION MONITORING SYSTEM WITH REDUCED NOISE
- Publication number 20140098375
- Publication date Apr 10, 2014
- Jan Liesener
- G01 - MEASURING TESTING
Information Patent Application
CALIBRATION JIG FOR OPTICAL TOMOGRAPHIC IMAGING APPARATUS AND METHO...
- Publication number 20130222813
- Publication date Aug 29, 2013
- FUJIFILM Corporation
- Daisuke WATANABE
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR CALIBRATED SPECTRAL DOMAIN OPTICAL COHERENCE...
- Publication number 20130182259
- Publication date Jul 18, 2013
- Mark Brezinski
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATIC CALIBRATION OF FOURIER-DOMAIN OPTICAL COHERENCE TOMOGRAPH...
- Publication number 20130128267
- Publication date May 23, 2013
- The Johns Hopkins University
- Jin Kang
- G01 - MEASURING TESTING
Information Patent Application
Intensity Noise Reduction Methods and Apparatus for Interferometric...
- Publication number 20110228280
- Publication date Sep 22, 2011
- LightLab Imaging, Inc.
- Joseph M. Schmitt
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
OPTICAL COHERENCE TOMOGRAPHIC IMAGING APPARATUS
- Publication number 20110199615
- Publication date Aug 18, 2011
- Canon Kabushiki Kaisha
- Mitsuro Sugita
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
SWEPT SOURCE OPTICAL COHERENCE TOMOGRAPHY (SS-OCT) SYSTEM AND METHO...
- Publication number 20110157597
- Publication date Jun 30, 2011
- Industrial Technology Research Institute
- Chih-Wei Lu
- G01 - MEASURING TESTING
Information Patent Application
FIBER OPTIC INTERFEROMETRIC SENSOR ARRAY WITH INCREASED MULTIPLEXIN...
- Publication number 20100302549
- Publication date Dec 2, 2010
- SERCEL
- Sylvie Menezo
- G01 - MEASURING TESTING
Information Patent Application
INTERFEROMETER WITH MULTIPLE MODES OF OPERATION FOR DETERMINING CHA...
- Publication number 20100134786
- Publication date Jun 3, 2010
- Xavier Colonna De Lega
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR CALIBRATING INTERPIXEL GAINS OF AN INTERFEROMETER
- Publication number 20100134800
- Publication date Jun 3, 2010
- Centre National D'Etudes Spatiales
- Elodie Cansot
- G01 - MEASURING TESTING
Information Patent Application
CALIBRATION JIG FOR OPTICAL TOMOGRAPHIC IMAGING APPARATUS AND METHO...
- Publication number 20090261240
- Publication date Oct 22, 2009
- Daisuke WATANABE
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PARTIAL COHERENCE INTERFEROMETER WITH MEASUREMENT AMBIGUITY RESOLUTION
- Publication number 20090153839
- Publication date Jun 18, 2009
- Quality Vision International, Inc.
- David B. Kay
- G01 - MEASURING TESTING
Information Patent Application
INTERFEROMETRY FOR DETERMINING CHARACTERISTICS OF AN OBJECT SURFACE...
- Publication number 20080088849
- Publication date Apr 17, 2008
- Zygo Corporation
- Xavier Colonna De Lega
- G01 - MEASURING TESTING
Information Patent Application
Means and methods for signal validation for sizing spherical objects
- Publication number 20070263215
- Publication date Nov 15, 2007
- William D. Bachalo
- G01 - MEASURING TESTING
Information Patent Application
Interferometer for determining characteristics of an object surface...
- Publication number 20060158657
- Publication date Jul 20, 2006
- Xavier Colonna De Lega
- G01 - MEASURING TESTING
Information Patent Application
Interferometer with multiple modes of operation for determining cha...
- Publication number 20060158658
- Publication date Jul 20, 2006
- Xavier Colonna De Lega
- G01 - MEASURING TESTING
Information Patent Application
Interferometer for determining characteristics of an object surface
- Publication number 20060158659
- Publication date Jul 20, 2006
- Xavier Colonna De Lega
- G01 - MEASURING TESTING
Information Patent Application
Compensation for effects of beam misalignments in interferometer me...
- Publication number 20060061771
- Publication date Mar 23, 2006
- Henry A. Hill
- G01 - MEASURING TESTING
Information Patent Application
Low coherence interferometry utilizing magnitude
- Publication number 20050254058
- Publication date Nov 17, 2005
- Gerard A. Alphonse
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
Enhanced lithographic displacement measurement system
- Publication number 20040169837
- Publication date Sep 2, 2004
- ASML NETHERLANDS B.V.
- Wouter Onno Pril
- G01 - MEASURING TESTING
Information Patent Application
Method for self-calibrated sub-aperture stitching for surface figur...
- Publication number 20030117632
- Publication date Jun 26, 2003
- QED Technologies Inc.
- Donald Golini
- G01 - MEASURING TESTING

of the detector

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Determination of measurement error in an etalon

Systems having light source with extended spectrum for semiconducto...

Ophthalmic apparatus

Common path mode fiber tip diffraction interferometer for wavefront...

Real-time normalization apparatus and method of phase generated car...

Combined workpiece holder and calibration profile configuration for...

Intensity noise reduction methods and apparatus for interferometric...

System and method for calibrated spectral domain optical coherence...

Calibration jig for optical tomographic imaging apparatus and metho...

Position monitoring system with reduced noise

Intensity noise reduction methods and apparatus for interferometric...

Automatic calibration of fourier-domain optical coherence tomograph...

Calibration jig for optical tomographic imaging apparatus and metho...

Calibration jig for optical tomographic imaging apparatus and metho...

Method for calibrating interpixel gains of an interferometer

Fiber optic interferometric sensor array with increased multiplexin...

Interferometer with multiple modes of operation for determining cha...

Interferometry for determining characteristics of an object surface...

Partial coherence interferometer with measurement ambiguity resolution

Means and methods for signal validation for sizing spherical objects

Interferometer with multiple modes of operation for determining cha...

Interferometer for determining characteristics of an object surface

Interferometer for determining characteristics of an object surface...

Compensation for effects of beam misalignments in interferometer me...

Low coherence interferometry utilizing magnitude

Enhanced lithographic displacement measurement system

Method for self-calibrated sub-aperture stitching for surface figur...

Methods and apparatus for high speed longitudinal scanning in imagi...

Quasi-static fiber pressure sensor

Point diffraction interferometer and pin mirror for use therewith

Patents Applicationslast 30 patents

METHOD FOR CALIBRATING ONE OR MORE OPTICAL SENSORS OF A LASER MACHI...

SYSTEMS HAVING LIGHT SOURCE WITH EXTENDED SPECTRUM FOR SEMICONDUCTO...

COMMON PATH MODE FIBER TIP DIFFRACTION INTERFEROMETER FOR WAVEFRONT...

OPHTHALMIC APPARATUS

COMBINED WORKPIECE HOLDER AND CALIBRATION PROFILE CONFIGURATION FOR...

REAL-TIME NORMALIZATION APPARATUS AND METHOD OF PHASE GENERATED CAR...

Intensity Noise Reduction Methods and Apparatus for Interferometric...

POSITION MONITORING SYSTEM WITH REDUCED NOISE

CALIBRATION JIG FOR OPTICAL TOMOGRAPHIC IMAGING APPARATUS AND METHO...

SYSTEM AND METHOD FOR CALIBRATED SPECTRAL DOMAIN OPTICAL COHERENCE...

AUTOMATIC CALIBRATION OF FOURIER-DOMAIN OPTICAL COHERENCE TOMOGRAPH...

Intensity Noise Reduction Methods and Apparatus for Interferometric...

OPTICAL COHERENCE TOMOGRAPHIC IMAGING APPARATUS

SWEPT SOURCE OPTICAL COHERENCE TOMOGRAPHY (SS-OCT) SYSTEM AND METHO...

FIBER OPTIC INTERFEROMETRIC SENSOR ARRAY WITH INCREASED MULTIPLEXIN...

INTERFEROMETER WITH MULTIPLE MODES OF OPERATION FOR DETERMINING CHA...

METHOD FOR CALIBRATING INTERPIXEL GAINS OF AN INTERFEROMETER

CALIBRATION JIG FOR OPTICAL TOMOGRAPHIC IMAGING APPARATUS AND METHO...

PARTIAL COHERENCE INTERFEROMETER WITH MEASUREMENT AMBIGUITY RESOLUTION

INTERFEROMETRY FOR DETERMINING CHARACTERISTICS OF AN OBJECT SURFACE...

Means and methods for signal validation for sizing spherical objects

Interferometer for determining characteristics of an object surface...

Interferometer with multiple modes of operation for determining cha...

Interferometer for determining characteristics of an object surface

Compensation for effects of beam misalignments in interferometer me...

Low coherence interferometry utilizing magnitude

Enhanced lithographic displacement measurement system

Method for self-calibrated sub-aperture stitching for surface figur...