Membership
Tour
Register
Log in
of the detector
Follow
Industry
CPC
G01B9/02074
This industry / category may be too specific. Please go to a parent level for more data
Parent Industries
G
PHYSICS
G01
Measuring instruments
G01B
MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
G01B9/00
Instruments as specified in the subgroups and characterised by the use of optical measuring means
Current Industry
G01B9/02074
of the detector
Industries
Overview
Organizations
People
Information
Impact
Patents Grants
last 30 patents
Information
Patent Grant
Determination of measurement error in an etalon
Patent number
11,860,036
Issue date
Jan 2, 2024
Cymer, LLC
Russell Allen Burdt
G01 - MEASURING TESTING
Information
Patent Grant
Systems having light source with extended spectrum for semiconducto...
Patent number
11,454,491
Issue date
Sep 27, 2022
Yangtze Memory Technologies Co., Ltd.
Sicong Wang
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Ophthalmic apparatus
Patent number
11,369,265
Issue date
Jun 28, 2022
Tomey Corporation
Yuji Nozawa
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Grant
Common path mode fiber tip diffraction interferometer for wavefront...
Patent number
11,333,487
Issue date
May 17, 2022
KLA Corporation
Haifeng Huang
G01 - MEASURING TESTING
Information
Patent Grant
Real-time normalization apparatus and method of phase generated car...
Patent number
10,641,600
Issue date
May 5, 2020
Zhejiang Sci-Tech University
Liping Yan
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Combined workpiece holder and calibration profile configuration for...
Patent number
10,584,955
Issue date
Mar 10, 2020
Mitutoyo Corporation
Michael Nahum
G01 - MEASURING TESTING
Information
Patent Grant
Intensity noise reduction methods and apparatus for interferometric...
Patent number
10,006,753
Issue date
Jun 26, 2018
LightLab Imaging, Inc.
Joseph M. Schmitt
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
System and method for calibrated spectral domain optical coherence...
Patent number
9,506,740
Issue date
Nov 29, 2016
The Brigham and Women's Hospital
Mark Brezinski
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Grant
Calibration jig for optical tomographic imaging apparatus and metho...
Patent number
9,322,639
Issue date
Apr 26, 2016
Terumo Kabushiki Kaisha
Daisuke Watanabe
G01 - MEASURING TESTING
Information
Patent Grant
Position monitoring system with reduced noise
Patent number
9,115,975
Issue date
Aug 25, 2015
Zygo Corporation
Jan Liesener
G01 - MEASURING TESTING
Information
Patent Grant
Intensity noise reduction methods and apparatus for interferometric...
Patent number
8,948,613
Issue date
Feb 3, 2015
LightLab Imaging, Inc.
Joseph M. Schmitt
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Automatic calibration of fourier-domain optical coherence tomograph...
Patent number
8,921,767
Issue date
Dec 30, 2014
The Johns Hopkins University
Jin Kang
G01 - MEASURING TESTING
Information
Patent Grant
Calibration jig for optical tomographic imaging apparatus and metho...
Patent number
8,885,171
Issue date
Nov 11, 2014
Terumo Kabushiki Kaisha
Daisuke Watanabe
G01 - MEASURING TESTING
Information
Patent Grant
Calibration jig for optical tomographic imaging apparatus and metho...
Patent number
8,441,648
Issue date
May 14, 2013
FUJIFILM Corporation
Daisuke Watanabe
G01 - MEASURING TESTING
Information
Patent Grant
Method for calibrating interpixel gains of an interferometer
Patent number
8,345,256
Issue date
Jan 1, 2013
Centre National d'Etudes Spatiales
Elodie Cansot
G01 - MEASURING TESTING
Information
Patent Grant
Fiber optic interferometric sensor array with increased multiplexin...
Patent number
8,189,200
Issue date
May 29, 2012
Sercel
Sylvie Menezo
G01 - MEASURING TESTING
Information
Patent Grant
Interferometer with multiple modes of operation for determining cha...
Patent number
7,952,724
Issue date
May 31, 2011
Zygo Corporation
Xavier Colonna De Lega
G01 - MEASURING TESTING
Information
Patent Grant
Interferometry for determining characteristics of an object surface...
Patent number
7,884,947
Issue date
Feb 8, 2011
Zygo Corporation
Xavier Colonna De Lega
G01 - MEASURING TESTING
Information
Patent Grant
Partial coherence interferometer with measurement ambiguity resolution
Patent number
7,791,731
Issue date
Sep 7, 2010
Quality Vision International, Inc.
David B. Kay
G01 - MEASURING TESTING
Information
Patent Grant
Means and methods for signal validation for sizing spherical objects
Patent number
7,788,067
Issue date
Aug 31, 2010
Artium Technologies, Inc.
William D. Bachalo
G01 - MEASURING TESTING
Information
Patent Grant
Interferometer with multiple modes of operation for determining cha...
Patent number
7,616,323
Issue date
Nov 10, 2009
Zygo Corporation
Xavier Colonna De Lega
G01 - MEASURING TESTING
Information
Patent Grant
Interferometer for determining characteristics of an object surface
Patent number
7,446,882
Issue date
Nov 4, 2008
Zygo Corporation
Xavier Colonna De Lega
G01 - MEASURING TESTING
Information
Patent Grant
Interferometer for determining characteristics of an object surface...
Patent number
7,428,057
Issue date
Sep 23, 2008
Zygo Corporation
Xavier Colonna De Lega
G01 - MEASURING TESTING
Information
Patent Grant
Compensation for effects of beam misalignments in interferometer me...
Patent number
7,327,465
Issue date
Feb 5, 2008
Zygo Corporation
Henry A. Hill
G01 - MEASURING TESTING
Information
Patent Grant
Low coherence interferometry utilizing magnitude
Patent number
7,327,463
Issue date
Feb 5, 2008
Medrikon Corporation
Gerard A. Alphonse
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Grant
Enhanced lithographic displacement measurement system
Patent number
6,987,557
Issue date
Jan 17, 2006
ASML Netherlands B.V.
Wouter Onno Pril
G01 - MEASURING TESTING
Information
Patent Grant
Method for self-calibrated sub-aperture stitching for surface figur...
Patent number
6,956,657
Issue date
Oct 18, 2005
QED Technologies, Inc.
Donald Golini
G01 - MEASURING TESTING
Information
Patent Grant
Methods and apparatus for high speed longitudinal scanning in imagi...
Patent number
6,191,862
Issue date
Feb 20, 2001
Lightlab Imaging, LLC
Eric A. Swanson
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Grant
Quasi-static fiber pressure sensor
Patent number
6,078,706
Issue date
Jun 20, 2000
The United States of America as represented by the Secretary of the Navy
Gregory Nau
G01 - MEASURING TESTING
Information
Patent Grant
Point diffraction interferometer and pin mirror for use therewith
Patent number
5,822,066
Issue date
Oct 13, 1998
Ultratech Stepper, Inc.
Hwan J. Jeong
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
REFLECTIVE CO-AXIAL INTERFEROMETER SYSTEMS AND METHODS THEREOF
Publication number
20240426594
Publication date
Dec 26, 2024
OptiPro Systems, LLC
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR CALIBRATING ONE OR MORE OPTICAL SENSORS OF A LASER MACHI...
Publication number
20230133662
Publication date
May 4, 2023
Precitec GmbH & Co. KG
Rüdiger Moser
B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information
Patent Application
SYSTEMS HAVING LIGHT SOURCE WITH EXTENDED SPECTRUM FOR SEMICONDUCTO...
Publication number
20210262778
Publication date
Aug 26, 2021
YANGTZE MEMORY TECHNOLOGIES CO., LTD.
Sicong Wang
G01 - MEASURING TESTING
Information
Patent Application
COMMON PATH MODE FIBER TIP DIFFRACTION INTERFEROMETER FOR WAVEFRONT...
Publication number
20210123716
Publication date
Apr 29, 2021
KLA Corporation
Haifeng Huang
G01 - MEASURING TESTING
Information
Patent Application
OPHTHALMIC APPARATUS
Publication number
20200178791
Publication date
Jun 11, 2020
TOMEY CORPORATION
Yuji Nozawa
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Application
COMBINED WORKPIECE HOLDER AND CALIBRATION PROFILE CONFIGURATION FOR...
Publication number
20200003544
Publication date
Jan 2, 2020
MITUTOYO CORPORATION
Michael Nahum
G01 - MEASURING TESTING
Information
Patent Application
REAL-TIME NORMALIZATION APPARATUS AND METHOD OF PHASE GENERATED CAR...
Publication number
20190368860
Publication date
Dec 5, 2019
ZHEJIANG SCI-TECH UNIVERSITY
Liping YAN
G01 - MEASURING TESTING
Information
Patent Application
Intensity Noise Reduction Methods and Apparatus for Interferometric...
Publication number
20180306569
Publication date
Oct 25, 2018
LightLab Imaging, Inc.
Joseph M. Schmitt
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
POSITION MONITORING SYSTEM WITH REDUCED NOISE
Publication number
20140098375
Publication date
Apr 10, 2014
Jan Liesener
G01 - MEASURING TESTING
Information
Patent Application
CALIBRATION JIG FOR OPTICAL TOMOGRAPHIC IMAGING APPARATUS AND METHO...
Publication number
20130222813
Publication date
Aug 29, 2013
FUJIFILM Corporation
Daisuke WATANABE
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM AND METHOD FOR CALIBRATED SPECTRAL DOMAIN OPTICAL COHERENCE...
Publication number
20130182259
Publication date
Jul 18, 2013
Mark Brezinski
G01 - MEASURING TESTING
Information
Patent Application
AUTOMATIC CALIBRATION OF FOURIER-DOMAIN OPTICAL COHERENCE TOMOGRAPH...
Publication number
20130128267
Publication date
May 23, 2013
The Johns Hopkins University
Jin Kang
G01 - MEASURING TESTING
Information
Patent Application
Intensity Noise Reduction Methods and Apparatus for Interferometric...
Publication number
20110228280
Publication date
Sep 22, 2011
LightLab Imaging, Inc.
Joseph M. Schmitt
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
OPTICAL COHERENCE TOMOGRAPHIC IMAGING APPARATUS
Publication number
20110199615
Publication date
Aug 18, 2011
Canon Kabushiki Kaisha
Mitsuro Sugita
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Application
SWEPT SOURCE OPTICAL COHERENCE TOMOGRAPHY (SS-OCT) SYSTEM AND METHO...
Publication number
20110157597
Publication date
Jun 30, 2011
Industrial Technology Research Institute
Chih-Wei Lu
G01 - MEASURING TESTING
Information
Patent Application
FIBER OPTIC INTERFEROMETRIC SENSOR ARRAY WITH INCREASED MULTIPLEXIN...
Publication number
20100302549
Publication date
Dec 2, 2010
SERCEL
Sylvie Menezo
G01 - MEASURING TESTING
Information
Patent Application
INTERFEROMETER WITH MULTIPLE MODES OF OPERATION FOR DETERMINING CHA...
Publication number
20100134786
Publication date
Jun 3, 2010
Xavier Colonna De Lega
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR CALIBRATING INTERPIXEL GAINS OF AN INTERFEROMETER
Publication number
20100134800
Publication date
Jun 3, 2010
Centre National D'Etudes Spatiales
Elodie Cansot
G01 - MEASURING TESTING
Information
Patent Application
CALIBRATION JIG FOR OPTICAL TOMOGRAPHIC IMAGING APPARATUS AND METHO...
Publication number
20090261240
Publication date
Oct 22, 2009
Daisuke WATANABE
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
PARTIAL COHERENCE INTERFEROMETER WITH MEASUREMENT AMBIGUITY RESOLUTION
Publication number
20090153839
Publication date
Jun 18, 2009
Quality Vision International, Inc.
David B. Kay
G01 - MEASURING TESTING
Information
Patent Application
INTERFEROMETRY FOR DETERMINING CHARACTERISTICS OF AN OBJECT SURFACE...
Publication number
20080088849
Publication date
Apr 17, 2008
Zygo Corporation
Xavier Colonna De Lega
G01 - MEASURING TESTING
Information
Patent Application
Means and methods for signal validation for sizing spherical objects
Publication number
20070263215
Publication date
Nov 15, 2007
William D. Bachalo
G01 - MEASURING TESTING
Information
Patent Application
Interferometer for determining characteristics of an object surface...
Publication number
20060158657
Publication date
Jul 20, 2006
Xavier Colonna De Lega
G01 - MEASURING TESTING
Information
Patent Application
Interferometer with multiple modes of operation for determining cha...
Publication number
20060158658
Publication date
Jul 20, 2006
Xavier Colonna De Lega
G01 - MEASURING TESTING
Information
Patent Application
Interferometer for determining characteristics of an object surface
Publication number
20060158659
Publication date
Jul 20, 2006
Xavier Colonna De Lega
G01 - MEASURING TESTING
Information
Patent Application
Compensation for effects of beam misalignments in interferometer me...
Publication number
20060061771
Publication date
Mar 23, 2006
Henry A. Hill
G01 - MEASURING TESTING
Information
Patent Application
Low coherence interferometry utilizing magnitude
Publication number
20050254058
Publication date
Nov 17, 2005
Gerard A. Alphonse
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Application
Enhanced lithographic displacement measurement system
Publication number
20040169837
Publication date
Sep 2, 2004
ASML NETHERLANDS B.V.
Wouter Onno Pril
G01 - MEASURING TESTING
Information
Patent Application
Method for self-calibrated sub-aperture stitching for surface figur...
Publication number
20030117632
Publication date
Jun 26, 2003
QED Technologies Inc.
Donald Golini
G01 - MEASURING TESTING