of the integrated optical type

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GPHYSICS G01Measuring instruments G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT COLORIMETRY RADIATION PYROMETRY

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G01J2009/023of the integrated optical type

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Patents Grantslast 30 patents

Information Patent Grant
Totagraphy: coherent diffractive/digital information reconstruction...
- Patent number 12,031,868
- Issue date Jul 9, 2024
- Wavefront Analysis Systems LLC
- Okan Ersoy
- G01 - MEASURING TESTING
Information Patent Grant
Device and method for measuring wavelength for laser device
- Patent number 11,971,307
- Issue date Apr 30, 2024
- Beijing RSLaserOpto-Electronics Technology Co. Ltd
- Guangyi Liu
- G01 - MEASURING TESTING
Information Patent Grant
Integrated optic wavemeter and method for fiber optic gyroscopes sc...
- Patent number 11,320,267
- Issue date May 3, 2022
- KVH Industries, Inc.
- Liming Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Totagraphy: Coherent diffractive/digital information reconstruction...
- Patent number 11,237,059
- Issue date Feb 1, 2022
- Gerchberg Ophthalmic Dispensing, PLLC
- Okan Ersoy
- G01 - MEASURING TESTING
Information Patent Grant
High speed random access variable focusing and steering of a patter...
- Patent number 11,131,845
- Issue date Sep 28, 2021
- The Board of Trustees of the Leland Stanford Junior University
- Stephen S. Hamann
- G01 - MEASURING TESTING
Information Patent Grant
Coherent light detection system and method
- Patent number 11,047,742
- Issue date Jun 29, 2021
- The Boeing Company
- Thomas G. Chrien
- G01 - MEASURING TESTING
Information Patent Grant
Light receiving device, method for fabricating light receiving device
- Patent number 10,823,610
- Issue date Nov 3, 2020
- Sumitomo Electric Industries, Ltd.
- Takamitsu Kitamura
- G01 - MEASURING TESTING
Information Patent Grant
Spectroscope, wavelength measuring device, and spectrum measuring m...
- Patent number 10,801,893
- Issue date Oct 13, 2020
- Osaka University
- Tsuyoshi Konishi
- G01 - MEASURING TESTING
Information Patent Grant
Three-dimensional shape, displacement, and strain measurement devic...
- Patent number 10,655,954
- Issue date May 19, 2020
- National Institute of Advanced Industrial Science and Technology
- Qinghua Wang
- G01 - MEASURING TESTING
Information Patent Grant
Method and device for measuring wavefront using diffraction grating...
- Patent number 10,571,340
- Issue date Feb 25, 2020
- Nikon Corporation
- Katsura Otaki
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Ocular metrology employing spectral wavefront analysis of reflected...
- Patent number 10,470,655
- Issue date Nov 12, 2019
- Steven James Frisken
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Collimation evaluation device and collimation evaluation method
- Patent number 10,309,836
- Issue date Jun 4, 2019
- Hamamatsu Photonics K.K.
- Junji Okuma
- G01 - MEASURING TESTING
Information Patent Grant
Imprint apparatus, imprint method, detecting method, and method of...
- Patent number 10,303,050
- Issue date May 28, 2019
- Canon Kabushiki Kaisha
- Hiroshi Sato
- G01 - MEASURING TESTING
Information Patent Grant
Method and device for measuring wavefront using light-exit section...
- Patent number 10,288,489
- Issue date May 14, 2019
- Nikon Corporation
- Katsura Otaki
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Detection device and detection method
- Patent number 10,094,653
- Issue date Oct 9, 2018
- BOE Technology Group Co., Ltd.
- Yangkun Jing
- G01 - MEASURING TESTING
Information Patent Grant
Imprint apparatus to detect a contact state between a mold and a su...
- Patent number 10,042,249
- Issue date Aug 7, 2018
- Canon Kabushiki Kaisha
- Hiroshi Sato
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Ocular metrology employing spectral wavefront analysis of reflected...
- Patent number 9,913,579
- Issue date Mar 13, 2018
- Steven James Frisken
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Wavefront analyser
- Patent number 9,861,277
- Issue date Jan 9, 2018
- Trevor Bruce Anderson
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Uses of electromagnetic interference patterns
- Patent number 9,618,369
- Issue date Apr 11, 2017
- The University Court of the University of Glasgow
- Jonathan Mark Ralph Weaver
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Device and method for characterizing a light beam
- Patent number 9,243,957
- Issue date Jan 26, 2016
- Commissariat a l'Energie Atomique et Aux Energies Alternatives
- Fabien Quere
- G01 - MEASURING TESTING
Information Patent Grant
Apolarized interferometric system, and apolarized interferometric m...
- Patent number 8,953,169
- Issue date Feb 10, 2015
- IXBLUE
- Herve Lefevre
- G01 - MEASURING TESTING
Information Patent Grant
Surface shape measurement apparatus and method
- Patent number 8,294,903
- Issue date Oct 23, 2012
- Panasonic Corporation
- Hirotoshi Oikaze
- G01 - MEASURING TESTING
Information Patent Grant
Optical communications using spectral interferometry
- Patent number 7,796,268
- Issue date Sep 14, 2010
- Attochron, LLC
- John Cabaniss
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Aligned embossed diaphragm based fiber optic sensor
- Patent number 7,697,797
- Issue date Apr 13, 2010
- New Jersey Institute of Technology
- Ken K Chin
- G01 - MEASURING TESTING
Information Patent Grant
Phase shift amount measurement apparatus and transmittance measurem...
- Patent number 7,643,157
- Issue date Jan 5, 2010
- Lasertec Corporation
- Hideo Takizawa
- G01 - MEASURING TESTING
Information Patent Grant
Laser system
- Patent number 7,580,433
- Issue date Aug 25, 2009
- Sony Corporation
- Tomiji Tanaka
- G01 - MEASURING TESTING
Information Patent Grant
Phase shifting interferometry with multiple accumulation
- Patent number 7,564,568
- Issue date Jul 21, 2009
- Zygo Corporation
- Peter De Groot
- G01 - MEASURING TESTING
Information Patent Grant
Scanning simultaneous phase-shifting interferometer
- Patent number 7,561,279
- Issue date Jul 14, 2009
- Engineering Synthesis Design, Inc.
- Raymond Castonguay
- G01 - MEASURING TESTING
Information Patent Grant
Heterodyne array detector
- Patent number 7,359,063
- Issue date Apr 15, 2008
- The Boeing Company
- Douglas R. Jungwirth
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for feedback control of tunable laser wavelength
- Patent number 7,333,210
- Issue date Feb 19, 2008
- Fizeau Electro-Optic Systems, LLC
- James J. Snyder
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Integrated High-Extinction Ratio Unbalanced Mach Zehnder Interferom...
- Publication number 20240344891
- Publication date Oct 17, 2024
- The Regents of the University of California
- Kaikai Liu
- G02 - OPTICS
Information Patent Application
OPTICAL WAVELENGTH MEASURING DEVICE USING ABSORPTION-TYPE OPTICAL F...
- Publication number 20240280412
- Publication date Aug 22, 2024
- GIST (Gwangju Institue of Science and Technology)
- Bok Hyeon KIM
- G01 - MEASURING TESTING
Information Patent Application
LASER SYSTEM, SPECTRUM WAVEFORM CALCULATION METHOD, AND ELECTRONIC...
- Publication number 20230349762
- Publication date Nov 2, 2023
- Gigaphoton Inc.
- Natsuhiko KOUNO
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
DEVICE AND METHOD FOR MEASURING WAVELENGTH FOR LASER DEVICE
- Publication number 20230144290
- Publication date May 11, 2023
- Beijing Rslaser Opto-Electronics Technology Co., Ltd.
- Guangyi LIU
- G01 - MEASURING TESTING
Information Patent Application
COHERENT LIGHT DETECTION SYSTEM AND METHOD
- Publication number 20210148764
- Publication date May 20, 2021
- The Boeing Company
- THOMAS G. CHRIEN
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS FOR MEASURE OF COHERENCE OF LIGHT SOURCE FOR HOLOGRAPHIC...
- Publication number 20200182701
- Publication date Jun 11, 2020
- ELECTRONICS AND TELECOMMUNICATIONS RESEARCH INSTITUTE
- Jeho NAM
- G01 - MEASURING TESTING
Information Patent Application
SPECTROSCOPE, WAVELENGTH MEASURING DEVICE, AND SPECTRUM MEASURING M...
- Publication number 20190301938
- Publication date Oct 3, 2019
- OSAKA UNIVERSITY
- Tsuyoshi KONISHI
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND DEVICE FOR MEASURING WAVEFRONT, AND EXPOSURE METHOD AND...
- Publication number 20190219451
- Publication date Jul 18, 2019
- Nikon Corporation
- Katsura Otaki
- G01 - MEASURING TESTING
Information Patent Application
THREE-DIMENSIONAL SHAPE, DISPLACEMENT, AND STRAIN MEASUREMENT DEVIC...
- Publication number 20190212130
- Publication date Jul 11, 2019
- NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY
- Qinghua WANG
- G01 - MEASURING TESTING
Information Patent Application
IMPRINT APPARATUS, IMPRINT METHOD, DETECTING METHOD, AND METHOD OF...
- Publication number 20180292748
- Publication date Oct 11, 2018
- Canon Kabushiki Kaisha
- Hiroshi Sato
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
INTEGRATED OPTIC WAVEMETER AND METHOD FOR FIBER OPTIC GYROSCOPES SC...
- Publication number 20180274926
- Publication date Sep 27, 2018
- Liming Wang
- G01 - MEASURING TESTING
Information Patent Application
OCULAR METROLOGY EMPLOYING SPECTRAL WAVEFRONT ANALYSIS OF REFLECTED...
- Publication number 20180146851
- Publication date May 31, 2018
- Steven James Frisken
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
Detection Device and Detection Method
- Publication number 20170284791
- Publication date Oct 5, 2017
- BOE TECHNOLOGY GROUP CO., LTD.
- Yangkun JING
- G01 - MEASURING TESTING
Information Patent Application
COLLIMATION EVALUATION DEVICE AND COLLIMATION EVALUATION METHOD
- Publication number 20170199083
- Publication date Jul 13, 2017
- HAMAMATSU PHOTONICS K. K.
- Junji OKUMA
- G01 - MEASURING TESTING
Information Patent Application
Device And Method For Characterizing A Light Beam
- Publication number 20140098367
- Publication date Apr 10, 2014
- Commissariat A L'Energie Atomique et Aux Energies Alternatives
- Fabien Quere
- G01 - MEASURING TESTING
Information Patent Application
APOLARIZED INTERFEROMETRIC SYSTEM, AND APOLARIZED INTERFEROMETRIC M...
- Publication number 20130222810
- Publication date Aug 29, 2013
- Herve Lefevre
- G01 - MEASURING TESTING
Information Patent Application
Uses of Electromagnetic Interference Patterns
- Publication number 20110157599
- Publication date Jun 30, 2011
- THE UNIVERSITY COURT OF THE UNIVERSITY OF GLASGOW
- Jonathan Mark Ralph Weaver
- G01 - MEASURING TESTING
Information Patent Application
SURFACE SHAPE MEASUREMENT APPARATUS AND METHOD
- Publication number 20100309482
- Publication date Dec 9, 2010
- Hirotoshi Oikaze
- G01 - MEASURING TESTING
Information Patent Application
WAVEFRONT ABERRATION AND DISTANCE MEASUREMENT PHASE CAMERA
- Publication number 20100091146
- Publication date Apr 15, 2010
- UNIVERSIDAD DE LA LAGUNA
- José Manuel Rodriguez Ramos
- G02 - OPTICS
Information Patent Application
EVALUATION METHOD, EVALUATION APPARATUS, AND EXPOSURE APPARATUS
- Publication number 20090219494
- Publication date Sep 3, 2009
- Canon Kabushiki Kaisha
- Osamu Kakuchi
- G01 - MEASURING TESTING
Information Patent Application
ALIGNED EMBOSSED DIAPHRAGM BASED FIBER OPTIC SENSOR
- Publication number 20090086214
- Publication date Apr 2, 2009
- NEW JERSEY INSTITUTE OF TECHNOLOGY
- Ken K. Chin
- G01 - MEASURING TESTING
Information Patent Application
Optical Communications Using Spectral Interferometry
- Publication number 20090046293
- Publication date Feb 19, 2009
- John Cabaniss
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
LASER SYSTEM
- Publication number 20080180659
- Publication date Jul 31, 2008
- SONY CORPORATION
- Tomiji Tanaka
- G01 - MEASURING TESTING
Information Patent Application
Phase shift amount measurement apparatus and transmittance measurem...
- Publication number 20080174786
- Publication date Jul 24, 2008
- Hideo Takizawa
- G01 - MEASURING TESTING
Information Patent Application
ALIGNED EMBOSSED DIAPHRAGM BASED FIBER OPTIC SENSOR
- Publication number 20080075404
- Publication date Mar 27, 2008
- NEW JERSEY INSTITUTE OF TECHNOLOGY
- Ken K. Chin
- G01 - MEASURING TESTING
Information Patent Application
SCANNING SIMULTANEOUS PHASE-SHIFTING INTERFEROMETER
- Publication number 20080043224
- Publication date Feb 21, 2008
- Raymond Castonguay
- G01 - MEASURING TESTING
Information Patent Application
Phase Shifting Interferometry With Multiple Accumulation
- Publication number 20070206201
- Publication date Sep 6, 2007
- Peter de Groot
- G01 - MEASURING TESTING
Information Patent Application
Optical readhead
- Publication number 20070177157
- Publication date Aug 2, 2007
- RENISHAW PLC
- David Roberts McMurtry
- G01 - MEASURING TESTING
Information Patent Application
Heterodyne array detector
- Publication number 20070024854
- Publication date Feb 1, 2007
- The Boeing Company
- Douglas R. Jungwirth
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for feedback control of tunable laser wavelength
- Publication number 20060007447
- Publication date Jan 12, 2006
- James J. Snyder
- G01 - MEASURING TESTING

of the integrated optical type

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Totagraphy: coherent diffractive/digital information reconstruction...

Device and method for measuring wavelength for laser device

Integrated optic wavemeter and method for fiber optic gyroscopes sc...

Totagraphy: Coherent diffractive/digital information reconstruction...

High speed random access variable focusing and steering of a patter...

Coherent light detection system and method

Light receiving device, method for fabricating light receiving device

Spectroscope, wavelength measuring device, and spectrum measuring m...

Three-dimensional shape, displacement, and strain measurement devic...

Method and device for measuring wavefront using diffraction grating...

Ocular metrology employing spectral wavefront analysis of reflected...

Collimation evaluation device and collimation evaluation method

Imprint apparatus, imprint method, detecting method, and method of...

Method and device for measuring wavefront using light-exit section...

Detection device and detection method

Imprint apparatus to detect a contact state between a mold and a su...

Ocular metrology employing spectral wavefront analysis of reflected...

Wavefront analyser

Uses of electromagnetic interference patterns

Device and method for characterizing a light beam

Apolarized interferometric system, and apolarized interferometric m...

Surface shape measurement apparatus and method

Optical communications using spectral interferometry

Aligned embossed diaphragm based fiber optic sensor

Phase shift amount measurement apparatus and transmittance measurem...

Laser system

Phase shifting interferometry with multiple accumulation

Scanning simultaneous phase-shifting interferometer

Heterodyne array detector

Method and apparatus for feedback control of tunable laser wavelength

Patents Applicationslast 30 patents

Integrated High-Extinction Ratio Unbalanced Mach Zehnder Interferom...

OPTICAL WAVELENGTH MEASURING DEVICE USING ABSORPTION-TYPE OPTICAL F...

LASER SYSTEM, SPECTRUM WAVEFORM CALCULATION METHOD, AND ELECTRONIC...

DEVICE AND METHOD FOR MEASURING WAVELENGTH FOR LASER DEVICE

COHERENT LIGHT DETECTION SYSTEM AND METHOD

APPARATUS FOR MEASURE OF COHERENCE OF LIGHT SOURCE FOR HOLOGRAPHIC...

SPECTROSCOPE, WAVELENGTH MEASURING DEVICE, AND SPECTRUM MEASURING M...

METHOD AND DEVICE FOR MEASURING WAVEFRONT, AND EXPOSURE METHOD AND...

THREE-DIMENSIONAL SHAPE, DISPLACEMENT, AND STRAIN MEASUREMENT DEVIC...

IMPRINT APPARATUS, IMPRINT METHOD, DETECTING METHOD, AND METHOD OF...

INTEGRATED OPTIC WAVEMETER AND METHOD FOR FIBER OPTIC GYROSCOPES SC...

OCULAR METROLOGY EMPLOYING SPECTRAL WAVEFRONT ANALYSIS OF REFLECTED...

Detection Device and Detection Method

COLLIMATION EVALUATION DEVICE AND COLLIMATION EVALUATION METHOD

Device And Method For Characterizing A Light Beam

APOLARIZED INTERFEROMETRIC SYSTEM, AND APOLARIZED INTERFEROMETRIC M...

Uses of Electromagnetic Interference Patterns

SURFACE SHAPE MEASUREMENT APPARATUS AND METHOD

WAVEFRONT ABERRATION AND DISTANCE MEASUREMENT PHASE CAMERA

EVALUATION METHOD, EVALUATION APPARATUS, AND EXPOSURE APPARATUS

ALIGNED EMBOSSED DIAPHRAGM BASED FIBER OPTIC SENSOR

Optical Communications Using Spectral Interferometry

LASER SYSTEM

Phase shift amount measurement apparatus and transmittance measurem...

ALIGNED EMBOSSED DIAPHRAGM BASED FIBER OPTIC SENSOR

SCANNING SIMULTANEOUS PHASE-SHIFTING INTERFEROMETER

Phase Shifting Interferometry With Multiple Accumulation

Optical readhead

Heterodyne array detector

Method and apparatus for feedback control of tunable laser wavelength