Optical enhancement of defects or not directly visible states

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HELECTRICITY H01Electric elements H01LSEMICONDUCTOR DEVICES ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR H01L22/00Testing or measuring during manufacture or treatment; Reliability measurements

Current Industry

H01L22/24Optical enhancement of defects or not directly visible states

Industries

Patents Grantslast 30 patents

Information Patent Grant
Recessed structure capable of being conveniently monitored online a...
- Patent number 12,205,268
- Issue date Jan 21, 2025
- Shanghai IC R&D Center Co., Ltd.
- Xiaoxu Kang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor substrate processing apparatus and semiconductor subs...
- Patent number 12,165,933
- Issue date Dec 10, 2024
- Samsung Electronics Co., Ltd.
- Inkeun Baek
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor doping characterization method using photoneutralizat...
- Patent number 12,154,833
- Issue date Nov 26, 2024
- SEMILAB Semiconductor Physics Laboratory Co., Ltd.
- Marshall D. Wilson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electronic device including connecting pad and conductive portion
- Patent number 12,094,845
- Issue date Sep 17, 2024
- Innolux Corporation
- Jia-Yuan Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Plasma processing apparatus and control method
- Patent number 12,068,208
- Issue date Aug 20, 2024
- Tokyo Electron Limited
- Taro Ikeda
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Semiconductor device manufacture with in-line hotspot detection
- Patent number 12,057,355
- Issue date Aug 6, 2024
- Nova Ltd.
- Michael Shifrin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Repair techniques for micro-LED devices and arrays
- Patent number 12,051,359
- Issue date Jul 30, 2024
- VueReal Inc.
- Gholamreza Chaji
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor doping characterization method using photoneutralizat...
- Patent number 12,027,430
- Issue date Jul 2, 2024
- SEMILAB Semiconductor Physics Laboratory Co., Ltd.
- Marshall D. Wilson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Automated inspection tool
- Patent number 11,961,770
- Issue date Apr 16, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd
- Chia-Han Lin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of evaluating silicon wafer, method of evaluating silicon wa...
- Patent number 11,948,819
- Issue date Apr 2, 2024
- Sumco Corporation
- Keiichiro Mori
- B24 - GRINDING POLISHING
Information Patent Grant
Display optimization techniques for micro-LED devices and arrays
- Patent number 11,948,503
- Issue date Apr 2, 2024
- VueReal Inc.
- Gholamreza Chaji
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Grant
In-situ metrology and process control
- Patent number 11,908,718
- Issue date Feb 20, 2024
- Applied Materials, Inc.
- Ramesh Krishnamurthy
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electronic device and method for manufacturing electronic device
- Patent number 11,837,563
- Issue date Dec 5, 2023
- Innolux Corporation
- Jia-Yuan Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus for inspecting light emitting elements, method of inspect...
- Patent number 11,810,829
- Issue date Nov 7, 2023
- Samsung Display Co., Ltd.
- Seung Cheol Ko
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for detecting defects in thin film layers
- Patent number 11,740,185
- Issue date Aug 29, 2023
- MEMSSTAR LIMITED
- Anthony O'Hara
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for estimating twin defect density
- Patent number 11,733,177
- Issue date Aug 22, 2023
- The Industry & Academic Cooperation in Chungnam National University (IAC)
- Soon-ku Hong
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System and method to calibrate a plurality of wafer inspection syst...
- Patent number 11,703,459
- Issue date Jul 18, 2023
- Tokyo Electron Limited
- Michael Carcasi
- G01 - MEASURING TESTING
Information Patent Grant
Measuring buried layers
- Patent number 11,682,584
- Issue date Jun 20, 2023
- Camtek Ltd.
- Zehava Ben Ezer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Automatic detection method and automatic detection system for detec...
- Patent number 11,644,427
- Issue date May 9, 2023
- United Microelectronics Corp.
- Chia-Feng Hsiao
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Methods of defect inspection
- Patent number 11,624,985
- Issue date Apr 11, 2023
- Taiwan Semiconductor Manufacturing Co., Ltd
- Ta-Ching Yu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Display optimization techniques for micro-LED devices and arrays
- Patent number 11,610,535
- Issue date Mar 21, 2023
- VueReal Inc.
- Gholamreza Chaji
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Grant
Method of monitoring a semiconductor device fabrication process and...
- Patent number 11,605,567
- Issue date Mar 14, 2023
- Samsung Electronics Co., Ltd.
- Jitae Park
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electronic device and method for manufacturing the same
- Patent number 11,482,641
- Issue date Oct 25, 2022
- Innolux Corporation
- Jia-Yuan Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Piezoelectric substrate manufacturing device and piezoelectric subs...
- Patent number 11,437,566
- Issue date Sep 6, 2022
- Murata Manufacturing Co., Ltd.
- Koki Sai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Pressure-activated electrical interconnection with additive repair
- Patent number 11,393,730
- Issue date Jul 19, 2022
- X Display Company Technology Limited
- Ronald S. Cok
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Pressure-activated electrical interconnection with additive repair
- Patent number 11,387,153
- Issue date Jul 12, 2022
- X Display Company Technology Limited
- Ronald S. Cok
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Wafer table with dynamic support pins
- Patent number 11,302,566
- Issue date Apr 12, 2022
- Taiwan Semiconductor Manufacturing Co., Ltd
- Chi-Hung Liao
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Repair techniques for micro-LED devices and arrays
- Patent number 11,302,244
- Issue date Apr 12, 2022
- VueReal Inc.
- Gholamreza Chaji
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Grant
Testing of LED devices during pick and place operations
- Patent number 11,276,614
- Issue date Mar 15, 2022
- ASM Technology Singapore Pte. Ltd.
- Shun Yan Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electrically parallel fused LEDs
- Patent number 11,265,992
- Issue date Mar 1, 2022
- X Display Company Technology Limited
- Matthew Meitl
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Electric Device and Manufacturing Method thereof
- Publication number 20250183188
- Publication date Jun 5, 2025
- InnoLux Corporation
- Kuang-Ming FAN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
REPAIR TECHNIQUES FOR MICRO-LED DEVICES AND ARRAYS
- Publication number 20250174181
- Publication date May 29, 2025
- VueReal Inc.
- Gholamreza Chaji
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Application
OPTICAL METROLOGY
- Publication number 20250164410
- Publication date May 22, 2025
- TOKYO ELECTRON LIMITED
- Holger Tuitje
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
REPAIR TECHNIQUES FOR MICRO-LED DEVICES AND ARRAYS
- Publication number 20250166559
- Publication date May 22, 2025
- VueReal Inc.
- Gholamreza Chaji
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Application
MULTIDIRECTIONAL ILLUMINATION FOR HYBRID BONDING DEFECT DETECTION
- Publication number 20250076212
- Publication date Mar 6, 2025
- Applied Materials, Inc.
- Venkatakaushik VOLETI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SILICON CARBIDE SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING SI...
- Publication number 20250022953
- Publication date Jan 16, 2025
- Fuji Electric Co., Ltd.
- Takafumi UCHIDA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PROCESSING METHOD OF WAFER
- Publication number 20250014949
- Publication date Jan 9, 2025
- Disco Corporation
- Akira MIZUTANI
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
ELECTRONIC DEVICE
- Publication number 20240421110
- Publication date Dec 19, 2024
- InnoLux Corporation
- Jia-Yuan Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PATTERN INSPECTION DEVICE AND PATTERN INSPECTION METHOD
- Publication number 20240413024
- Publication date Dec 12, 2024
- Samsung Electronics Co., Ltd.
- Sangchul YEO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
APPARATUS AND METHODS FOR THREE DIMENSIONAL RETICLE DEFECT SMART RE...
- Publication number 20240379464
- Publication date Nov 14, 2024
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Po-Chien HUANG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND SYSTEM OF PRODUCING MICROSTRUCTURED COMPONENTS
- Publication number 20240367267
- Publication date Nov 7, 2024
- 3D-Micromac AG
- Torsten Leichsenring
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
REPAIR TECHNIQUES FOR MICRO-LED DEVICES AND ARRAYS
- Publication number 20240346994
- Publication date Oct 17, 2024
- VueReal Inc.
- Gholamreza Chaji
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Application
SEMICONDUCTOR DOPING CHARACTERIZATION METHOD USING PHOTONEUTRALIZAT...
- Publication number 20240347399
- Publication date Oct 17, 2024
- SEMILAB Semiconductor Physics Laboratory Co., Ltd.
- Marshall D. Wilson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
OPTIMIZATION METHOD OF OVERLAY MEASUREMENT DEVICE AND OVERLAY MEASU...
- Publication number 20240312847
- Publication date Sep 19, 2024
- AUROS TECHNOLOGY, INC.
- Seung Soo LEE
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
SYSTEM AND METHOD FOR AUTOMATIC WAFER MAP CLASSIFICATION
- Publication number 20240170348
- Publication date May 23, 2024
- Optimal Plus Ltd.
- Ofir Suranyi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Methods And Systems For Measurement Of Semiconductor Structures Wit...
- Publication number 20240162074
- Publication date May 16, 2024
- KLA Corporation
- Phalguna Rachinayani
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SUBSTRATE INSPECTION APPARATUS AND SUBSTRATE TREATMENT SYSTEM INCLU...
- Publication number 20240142389
- Publication date May 2, 2024
- SEMES CO., LTD.
- Jeong Hoon HAN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ENDPOINT OPTIMIZATION FOR SEMICONDUCTOR PROCESSES
- Publication number 20240128131
- Publication date Apr 18, 2024
- Applied Materials, Inc.
- Avishay Vaxman
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SUBSTRATE TEST APPARATUS AND METHOD
- Publication number 20240110879
- Publication date Apr 4, 2024
- SEMES CO., LTD.
- Gyunam PARK
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRONIC DEVICE
- Publication number 20240063157
- Publication date Feb 22, 2024
- InnoLux Corporation
- Jia-Yuan Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND SYSTEM FOR DETECTING SEMICONDUCTOR DEVICE
- Publication number 20240038597
- Publication date Feb 1, 2024
- Taiwan Semiconductor Manufacturing company Ltd.
- FAN HU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DEFECT REMOVAL DEVICE, DEFECT REMOVAL METHOD, PATTERN FORMING METHO...
- Publication number 20230395366
- Publication date Dec 7, 2023
- FUJIFILM CORPORATION
- Akihiko OHTSU
- G01 - MEASURING TESTING
Information Patent Application
SOLAR MODULE RECYCLING AND TESTING
- Publication number 20230343654
- Publication date Oct 26, 2023
- SOLARCYCLE, Inc.
- Pablo RIBEIRO DIAS
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IN-SITU DEFECT COUNT DETECTION IN POST CHEMICAL MECHANICAL POLISHING
- Publication number 20230298949
- Publication date Sep 21, 2023
- Taiwan Semiconductor Manufacturing Company Limited
- Chun-Hung LIAO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR MANUFACTURING APPARATUS, INSPECTION APPARATUS, AND MA...
- Publication number 20230215770
- Publication date Jul 6, 2023
- Fasford Technology Co., Ltd.
- Hideharu KOBASHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DISPLAY OPTIMIZATION TECHNIQUES FOR MICRO-LED DEVICES AND ARRAYS
- Publication number 20230206829
- Publication date Jun 29, 2023
- VueReal Inc.
- Gholamreza Chaji
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Application
INSPECTION DEVICE AND INSPECTION METHOD
- Publication number 20230154774
- Publication date May 18, 2023
- Hamamatsu Photonics K.K.
- Takeshi SAKAMOTO
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING SAME
- Publication number 20230071140
- Publication date Mar 9, 2023
- Kabushiki Kaisha Toshiba
- Katsuya SATO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF FORMING OPTICAL PROXIMITY CORRECTION MODEL AND METHOD OF...
- Publication number 20230062677
- Publication date Mar 2, 2023
- Samsung Electronics Co., Ltd.
- Sang Chul YEO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRONIC DEVICE AND METHOD FOR MANUFACTURING ELECTRONIC DEVICE
- Publication number 20230020588
- Publication date Jan 19, 2023
- InnoLux Corporation
- Jia-Yuan Chen
- H01 - BASIC ELECTRIC ELEMENTS

Optical enhancement of defects or not directly visible states

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Recessed structure capable of being conveniently monitored online a...

Semiconductor substrate processing apparatus and semiconductor subs...

Semiconductor doping characterization method using photoneutralizat...

Electronic device including connecting pad and conductive portion

Plasma processing apparatus and control method

Semiconductor device manufacture with in-line hotspot detection

Repair techniques for micro-LED devices and arrays

Semiconductor doping characterization method using photoneutralizat...

Automated inspection tool

Method of evaluating silicon wafer, method of evaluating silicon wa...

Display optimization techniques for micro-LED devices and arrays

In-situ metrology and process control

Electronic device and method for manufacturing electronic device

Apparatus for inspecting light emitting elements, method of inspect...

Method for detecting defects in thin film layers

Method for estimating twin defect density

System and method to calibrate a plurality of wafer inspection syst...

Measuring buried layers

Automatic detection method and automatic detection system for detec...

Methods of defect inspection

Display optimization techniques for micro-LED devices and arrays

Method of monitoring a semiconductor device fabrication process and...

Electronic device and method for manufacturing the same

Piezoelectric substrate manufacturing device and piezoelectric subs...

Pressure-activated electrical interconnection with additive repair

Pressure-activated electrical interconnection with additive repair

Wafer table with dynamic support pins

Repair techniques for micro-LED devices and arrays

Testing of LED devices during pick and place operations

Electrically parallel fused LEDs

Patents Applicationslast 30 patents

Electric Device and Manufacturing Method thereof

REPAIR TECHNIQUES FOR MICRO-LED DEVICES AND ARRAYS

OPTICAL METROLOGY

REPAIR TECHNIQUES FOR MICRO-LED DEVICES AND ARRAYS

MULTIDIRECTIONAL ILLUMINATION FOR HYBRID BONDING DEFECT DETECTION

SILICON CARBIDE SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING SI...

PROCESSING METHOD OF WAFER

ELECTRONIC DEVICE

PATTERN INSPECTION DEVICE AND PATTERN INSPECTION METHOD

APPARATUS AND METHODS FOR THREE DIMENSIONAL RETICLE DEFECT SMART RE...

METHOD AND SYSTEM OF PRODUCING MICROSTRUCTURED COMPONENTS

REPAIR TECHNIQUES FOR MICRO-LED DEVICES AND ARRAYS

SEMICONDUCTOR DOPING CHARACTERIZATION METHOD USING PHOTONEUTRALIZAT...

OPTIMIZATION METHOD OF OVERLAY MEASUREMENT DEVICE AND OVERLAY MEASU...

SYSTEM AND METHOD FOR AUTOMATIC WAFER MAP CLASSIFICATION

Methods And Systems For Measurement Of Semiconductor Structures Wit...

SUBSTRATE INSPECTION APPARATUS AND SUBSTRATE TREATMENT SYSTEM INCLU...

ENDPOINT OPTIMIZATION FOR SEMICONDUCTOR PROCESSES

SUBSTRATE TEST APPARATUS AND METHOD

ELECTRONIC DEVICE

METHOD AND SYSTEM FOR DETECTING SEMICONDUCTOR DEVICE

DEFECT REMOVAL DEVICE, DEFECT REMOVAL METHOD, PATTERN FORMING METHO...

SOLAR MODULE RECYCLING AND TESTING

IN-SITU DEFECT COUNT DETECTION IN POST CHEMICAL MECHANICAL POLISHING

SEMICONDUCTOR MANUFACTURING APPARATUS, INSPECTION APPARATUS, AND MA...

DISPLAY OPTIMIZATION TECHNIQUES FOR MICRO-LED DEVICES AND ARRAYS

INSPECTION DEVICE AND INSPECTION METHOD

SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING SAME

METHOD OF FORMING OPTICAL PROXIMITY CORRECTION MODEL AND METHOD OF...

ELECTRONIC DEVICE AND METHOD FOR MANUFACTURING ELECTRONIC DEVICE