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GPHYSICS G01Measuring instruments G01QSCANNING-PROBE TECHNIQUES OR APPARATUS APPLICATIONS OF SCANNING-PROBE TECHNIQUES G01Q70/00General aspects of SPM probes, their manufacture or their related instrumentation, insofar as they are not specially adapted to a single SPM technique covered by group G01Q60/00

Current Industry

G01Q70/14Particular materials

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Nanoscale scanning sensors
- Patent number 12,169,209
- Issue date Dec 17, 2024
- President and Fellows of Harvard College
- Michael S. Grinolds
- G01 - MEASURING TESTING
Information Patent Grant
Rugged, single crystal wide-band-gap-material scanning-tunneling-mi...
- Patent number 12,078,654
- Issue date Sep 3, 2024
- Steven R. J. Brueck
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Self-packing three-arm thermal scanning probe for micro-nano manufa...
- Patent number 11,970,392
- Issue date Apr 30, 2024
- Zhejiang University
- Huan Hu
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Nanoscale scanning sensors
- Patent number 11,815,528
- Issue date Nov 14, 2023
- President and Fellows of Harvard College
- Michael S. Grinolds
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for measuring magnetic field strength
- Patent number 11,762,046
- Issue date Sep 19, 2023
- Taiwan Semiconductor Manufacturing Co., Ltd
- Baohua Niu
- G01 - MEASURING TESTING
Information Patent Grant
Atomic force microscopy cantilever, system and method
- Patent number 11,644,481
- Issue date May 9, 2023
- Nederlandse Organisatie voor toegepast-nataurwetenschappelijk onderzoek TNO
- Maarten Hubertus Van Es
- G01 - MEASURING TESTING
Information Patent Grant
Initiating and monitoring the evolution of single electrons within...
- Patent number 11,635,450
- Issue date Apr 25, 2023
- QUANTUM SILICON INC.
- Robert Wolkow
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Systems and methods for mechanosynthesis
- Patent number 11,592,463
- Issue date Feb 28, 2023
- CBN Nano Technologies Inc.
- Ralph C. Merkle
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Diamond probe hosting an atomic sized defect
- Patent number 11,592,462
- Issue date Feb 28, 2023
- President and Fellows of Harvard College
- Xu Zhou
- G01 - MEASURING TESTING
Information Patent Grant
Probe card for characterizing processes of submicron semiconductor...
- Patent number 11,579,171
- Issue date Feb 14, 2023
- Meta Platforms Technologies, LLC
- Christopher Percival
- G02 - OPTICS
Information Patent Grant
Systems and methods for manufacturing nano-electro-mechanical-syste...
- Patent number 11,573,247
- Issue date Feb 7, 2023
- Xallent INC.
- Kwame Amponsah
- G01 - MEASURING TESTING
Information Patent Grant
Atomic force microscope probes and methods of manufacturing probes
- Patent number 11,499,990
- Issue date Nov 15, 2022
- Nanosurf AG
- Dominik Ziegler
- G01 - MEASURING TESTING
Information Patent Grant
Method for providing a probe device for scanning probe microscopy
- Patent number 11,480,588
- Issue date Oct 25, 2022
- Nanotools GmbH
- Bernd Irmer
- G01 - MEASURING TESTING
Information Patent Grant
Scanning probe microscope with use of composite materials
- Patent number 11,467,182
- Issue date Oct 11, 2022
- Vladimir Zhizhimontov
- C01 - INORGANIC CHEMISTRY
Information Patent Grant
Scanning sensor having a spin defect
- Patent number 11,293,940
- Issue date Apr 5, 2022
- ETH Zurich
- Christian Degen
- G01 - MEASURING TESTING
Information Patent Grant
Method, atomic force microscopy system and computer program product
- Patent number 11,289,367
- Issue date Mar 29, 2022
- Nederlandse Organisatie voor toegepast-natuurwetenschappelijk onderzoek TNO
- Violeta Navarro Paredes
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for mechanosynthesis
- Patent number 11,148,944
- Issue date Oct 19, 2021
- CBN Nano Technologies Inc.
- Ralph C. Merkle
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Systems and methods for manufacturing nano-electro-mechanical-syste...
- Patent number 11,125,774
- Issue date Sep 21, 2021
- Xallent LLC
- Kwame Amponsah
- G01 - MEASURING TESTING
Information Patent Grant
Probe and manufacturing method of probe for scanning probe microscope
- Patent number 11,125,775
- Issue date Sep 21, 2021
- Kioxia Corporation
- See Kei Lee
- G01 - MEASURING TESTING
Information Patent Grant
Method and tip substrate for scanning probe microscopy
- Patent number 11,112,427
- Issue date Sep 7, 2021
- Imec VZW
- Thomas Hantschel
- G01 - MEASURING TESTING
Information Patent Grant
Initiating and monitoring the evolution of single electrons within...
- Patent number 11,047,877
- Issue date Jun 29, 2021
- QUANTUM SILICON INC.
- Robert Wolkow
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for producing a probe suitable for scanning probe microscopy
- Patent number 11,035,880
- Issue date Jun 15, 2021
- Imec VZW
- Thomas Hantschel
- G01 - MEASURING TESTING
Information Patent Grant
Sharpening method for probe tip of atomic force microscope (AFM)
- Patent number 11,016,120
- Issue date May 25, 2021
- YANSHAN UNIVERSITY
- Jianchao Chen
- G01 - MEASURING TESTING
Information Patent Grant
Rugged, single crystal wide-band-gap-material scanning-tunneling-mi...
- Patent number 11,002,758
- Issue date May 11, 2021
- Steven R. J. Brueck
- B82 - NANO-TECHNOLOGY
Information Patent Grant
High-sensitivity, low thermal deflection, stress-matched atomic for...
- Patent number 11,002,759
- Issue date May 11, 2021
- The United States of America as represented by the Secretary of the Army
- Darin J. Sharar
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for mechanosynthesis
- Patent number 10,822,229
- Issue date Nov 3, 2020
- CBN Nano Technologies Inc.
- Ralph C. Merkle
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Probe assembly and testing device
- Patent number 10,782,314
- Issue date Sep 22, 2020
- BOE Technology Group Co., Ltd.
- Pijian Cheng
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for nano-tribological manufacturing of nanostru...
- Patent number 10,768,202
- Issue date Sep 8, 2020
- The Trustees of the University of Pennsylvania
- Robert W. Carpick
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method and apparatus for measuring magnetic field strength
- Patent number 10,753,990
- Issue date Aug 25, 2020
- Taiwan Semiconductor Manufacturing Co., Ltd
- Baohua Niu
- G01 - MEASURING TESTING
Information Patent Grant
Micromechanical structure and method for manufacturing the same
- Patent number 10,710,874
- Issue date Jul 14, 2020
- Infineon Technologies AG
- Tobias Frischmuth
- B81 - MICRO-STRUCTURAL TECHNOLOGY

Patents Applicationslast 30 patents

Information Patent Application
METROLOGY DEVICE AND METHOD
- Publication number 20240410962
- Publication date Dec 12, 2024
- NEDERLANDSE ORGANISATIE VOOR TOEGEPAST- NATUURWETENSCHAPPELIJK ONDERZOEK TNO
- Abbas MOHTASHAMI
- G01 - MEASURING TESTING
Information Patent Application
RUGGED, SINGLE CRYSTAL WIDE-BAND-GAP-MATERIAL SCANNING-TUNNELING-MI...
- Publication number 20240402216
- Publication date Dec 5, 2024
- UNM Rainforest Innovations
- Steven R.J. BRUECK
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
DETECTION PROBE, PROBE MICROSCOPE, AND SAMPLE TEMPERATURE MEASURING...
- Publication number 20240280606
- Publication date Aug 22, 2024
- Hitachi, Ltd
- Masanari KOGUCHI
- G01 - MEASURING TESTING
Information Patent Application
Method for processing a measuring probe for recording surface prope...
- Publication number 20240241152
- Publication date Jul 18, 2024
- HELMHOLTZ-ZENTRUM BERLIN FÜR MATERIALIEN UND ENERGIE GMBH
- Christopher Seiji KLEY
- G01 - MEASURING TESTING
Information Patent Application
SCANNING PROBE MICROSCOPE
- Publication number 20240126061
- Publication date Apr 18, 2024
- Hitachi, Ltd
- Masanari Koguchi
- G01 - MEASURING TESTING
Information Patent Application
OPTOMECHANICAL TRANSDUCER
- Publication number 20240094240
- Publication date Mar 21, 2024
- Centre National de la Recherche Scientifique
- Cyprien LEMOUCHI
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
NANOSCALE SCANNING SENSORS
- Publication number 20240044938
- Publication date Feb 8, 2024
- President and Fellows of Harvard College
- Michael S. GRINOLDS
- G01 - MEASURING TESTING
Information Patent Application
SELF-PACKING THREE-ARM THERMAL SCANNING PROBE FOR MICRO-NANO MANUFA...
- Publication number 20240002220
- Publication date Jan 4, 2024
- ZHEJIANG UNIVERSITY
- Huan HU
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
CONTROLLED CREATION OF SUB-50 NM DEFECTS IN 2D MATERIALS AT LOW TEM...
- Publication number 20230417795
- Publication date Dec 28, 2023
- University of Central Florida Research Foundation, Inc.
- Laurene Tetard
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR MEASURING MAGNETIC FIELD STRENGTH
- Publication number 20230358829
- Publication date Nov 9, 2023
- Taiwan Semiconductor Manufacturing company Ltd.
- Baohua NIU
- G01 - MEASURING TESTING
Information Patent Application
SCANNING PROBE MICROSCOPE (SPM) TIP
- Publication number 20230204625
- Publication date Jun 29, 2023
- NEXT-TIP, S.L.
- Belén SANZ SANZ
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR MANUFACTURING NANO-ELECTRO-MECHANICAL-SYSTE...
- Publication number 20230143037
- Publication date May 11, 2023
- Xallent Inc.
- Kwame Amponsah
- G01 - MEASURING TESTING
Information Patent Application
A DIAMOND SCANNING ELEMENT, ESPECIALLY FOR IMAGING APPLICATION, AND...
- Publication number 20230113008
- Publication date Apr 13, 2023
- UNIVERSITAT BASEL
- Brendan SHIELDS
- C30 - CRYSTAL GROWTH
Information Patent Application
NANOSCALE SCANNING SENSORS
- Publication number 20220413007
- Publication date Dec 29, 2022
- President and Fellows of Harvard College
- Michael S. GRINOLDS
- G01 - MEASURING TESTING
Information Patent Application
PROBE PRODUCTION METHOD AND SURFACE OBSERVATION METHOD
- Publication number 20220050125
- Publication date Feb 17, 2022
- SHOWA DENKO K.K.
- Tsuyoshi KATO
- G01 - MEASURING TESTING
Information Patent Application
ATOMIC FORCE MICROSCOPY CANTILEVER, SYSTEM AND METHOD
- Publication number 20220026464
- Publication date Jan 27, 2022
- NEDERLANDSE ORGANISATIE VOOR TOEGEPAST- NATUURWETENSCHAPPELIJK ONDERZOEK TNO
- Maarten Hubertus van Es
- G01 - MEASURING TESTING
Information Patent Application
Systems and Methods for Mechanosynthesis
- Publication number 20210403322
- Publication date Dec 30, 2021
- CBN Nano Technologies Inc.
- Ralph C. Merkle
- B82 - NANO-TECHNOLOGY
Information Patent Application
SYSTEMS AND METHODS FOR MANUFACTURING NANO-ELECTRO-MECHANICAL-SYSTE...
- Publication number 20210389346
- Publication date Dec 16, 2021
- Xallent LLC
- Kwame Amponsah
- G01 - MEASURING TESTING
Information Patent Application
INITIATING AND MONITORING THE EVOLUTION OF SINGLE ELECTRONS WITHIN...
- Publication number 20210325429
- Publication date Oct 21, 2021
- Quantum Silicon Inc.
- Robert Wolkow
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD FOR PROVIDING A PROBE DEVICE FOR SCANNING PROBE MICROSCOPY
- Publication number 20210318351
- Publication date Oct 14, 2021
- NANOTOOLS GMBH
- Bernd Irmer
- G01 - MEASURING TESTING
Information Patent Application
PROBE AND MANUFACTURING METHOD OF PROBE FOR SCANNING PROBE MICROSCOPE
- Publication number 20210278437
- Publication date Sep 9, 2021
- KIOXIA Corporation
- See Kei LEE
- G01 - MEASURING TESTING
Information Patent Application
RUGGED, SINGLE CRYSTAL WIDE-BAND-GAP-MATERIAL SCANNING-TUNNELING-MI...
- Publication number 20210263069
- Publication date Aug 26, 2021
- UNM Rainforest Innovations
- Steven R.J. BRUECK
- B82 - NANO-TECHNOLOGY
Information Patent Application
Scanning Sensor Having a Spin Defect
- Publication number 20210140996
- Publication date May 13, 2021
- ETH Zurich
- Christian Degen
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND TIP SUBSTRATE FOR SCANNING PROBE MICROSCOPY
- Publication number 20210116476
- Publication date Apr 22, 2021
- IMEC vzw
- Thomas Hantschel
- G01 - MEASURING TESTING
Information Patent Application
SHARPENING METHOD FOR PROBE TIP OF ATOMIC FORCE MICROSCOPE (AFM)
- Publication number 20210096153
- Publication date Apr 1, 2021
- Yanshan University
- Jianchao CHEN
- G01 - MEASURING TESTING
Information Patent Application
Systems and Methods for Mechanosynthesis
- Publication number 20210047178
- Publication date Feb 18, 2021
- CBN Nano Technologies Inc.
- Ralph C. Merkle
- B82 - NANO-TECHNOLOGY
Information Patent Application
METHOD AND APPARATUS FOR MEASURING MAGNETIC FIELD STRENGTH
- Publication number 20200386832
- Publication date Dec 10, 2020
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Baohua NIU
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR PROVIDING A PROBE DEVICE FOR SCANNING PROBE MICROSCOPY
- Publication number 20200341028
- Publication date Oct 29, 2020
- NANOTOOLS GMBH
- Bernd Irmer
- G01 - MEASURING TESTING
Information Patent Application
Method for Producing a Probe Suitable for Scanning Probe Microscopy
- Publication number 20200278379
- Publication date Sep 3, 2020
- IMEC vzw
- Thomas Hantschel
- G01 - MEASURING TESTING
Information Patent Application
INITIATING AND MONITORING THE EVOLUTION OF SINGLE ELECTRONS WITHIN...
- Publication number 20200249256
- Publication date Aug 6, 2020
- Quantum Silicon Inc.
- Robert Wolkow
- G06 - COMPUTING CALCULATING COUNTING

Particular materials

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Nanoscale scanning sensors

Rugged, single crystal wide-band-gap-material scanning-tunneling-mi...

Self-packing three-arm thermal scanning probe for micro-nano manufa...

Nanoscale scanning sensors

Method and apparatus for measuring magnetic field strength

Atomic force microscopy cantilever, system and method

Initiating and monitoring the evolution of single electrons within...

Systems and methods for mechanosynthesis

Diamond probe hosting an atomic sized defect

Probe card for characterizing processes of submicron semiconductor...

Systems and methods for manufacturing nano-electro-mechanical-syste...

Atomic force microscope probes and methods of manufacturing probes

Method for providing a probe device for scanning probe microscopy

Scanning probe microscope with use of composite materials

Scanning sensor having a spin defect

Method, atomic force microscopy system and computer program product

Systems and methods for mechanosynthesis

Systems and methods for manufacturing nano-electro-mechanical-syste...

Probe and manufacturing method of probe for scanning probe microscope

Method and tip substrate for scanning probe microscopy

Initiating and monitoring the evolution of single electrons within...

Method for producing a probe suitable for scanning probe microscopy

Sharpening method for probe tip of atomic force microscope (AFM)

Rugged, single crystal wide-band-gap-material scanning-tunneling-mi...

High-sensitivity, low thermal deflection, stress-matched atomic for...

Systems and methods for mechanosynthesis

Probe assembly and testing device

Systems and methods for nano-tribological manufacturing of nanostru...

Method and apparatus for measuring magnetic field strength

Micromechanical structure and method for manufacturing the same

Patents Applicationslast 30 patents

METROLOGY DEVICE AND METHOD

RUGGED, SINGLE CRYSTAL WIDE-BAND-GAP-MATERIAL SCANNING-TUNNELING-MI...

DETECTION PROBE, PROBE MICROSCOPE, AND SAMPLE TEMPERATURE MEASURING...

Method for processing a measuring probe for recording surface prope...

SCANNING PROBE MICROSCOPE

OPTOMECHANICAL TRANSDUCER

NANOSCALE SCANNING SENSORS

SELF-PACKING THREE-ARM THERMAL SCANNING PROBE FOR MICRO-NANO MANUFA...

CONTROLLED CREATION OF SUB-50 NM DEFECTS IN 2D MATERIALS AT LOW TEM...

METHOD AND APPARATUS FOR MEASURING MAGNETIC FIELD STRENGTH

SCANNING PROBE MICROSCOPE (SPM) TIP

SYSTEMS AND METHODS FOR MANUFACTURING NANO-ELECTRO-MECHANICAL-SYSTE...

A DIAMOND SCANNING ELEMENT, ESPECIALLY FOR IMAGING APPLICATION, AND...

NANOSCALE SCANNING SENSORS

PROBE PRODUCTION METHOD AND SURFACE OBSERVATION METHOD

ATOMIC FORCE MICROSCOPY CANTILEVER, SYSTEM AND METHOD

Systems and Methods for Mechanosynthesis

SYSTEMS AND METHODS FOR MANUFACTURING NANO-ELECTRO-MECHANICAL-SYSTE...

INITIATING AND MONITORING THE EVOLUTION OF SINGLE ELECTRONS WITHIN...

METHOD FOR PROVIDING A PROBE DEVICE FOR SCANNING PROBE MICROSCOPY

PROBE AND MANUFACTURING METHOD OF PROBE FOR SCANNING PROBE MICROSCOPE

RUGGED, SINGLE CRYSTAL WIDE-BAND-GAP-MATERIAL SCANNING-TUNNELING-MI...

Scanning Sensor Having a Spin Defect

METHOD AND TIP SUBSTRATE FOR SCANNING PROBE MICROSCOPY

SHARPENING METHOD FOR PROBE TIP OF ATOMIC FORCE MICROSCOPE (AFM)

Systems and Methods for Mechanosynthesis

METHOD AND APPARATUS FOR MEASURING MAGNETIC FIELD STRENGTH

METHOD FOR PROVIDING A PROBE DEVICE FOR SCANNING PROBE MICROSCOPY

Method for Producing a Probe Suitable for Scanning Probe Microscopy

INITIATING AND MONITORING THE EVOLUTION OF SINGLE ELECTRONS WITHIN...