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Passive error reduction, i.e. not varying during measurement
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G01B9/02056
This industry / category may be too specific. Please go to a parent level for more data
Parent Industries
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PHYSICS
G01
Measuring instruments
G01B
MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
G01B9/00
Instruments as specified in the subgroups and characterised by the use of optical measuring means
Current Industry
G01B9/02056
Passive error reduction, i.e. not varying during measurement
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Patents Grants
last 30 patents
Information
Patent Grant
Laser interferometer having a vibrator to modulate light for displa...
Patent number
11,879,730
Issue date
Jan 23, 2024
Seiko Epson Corporation
Jun Kitagawa
G02 - OPTICS
Information
Patent Grant
Temperature-insensitive Mach-Zehnder interferometer
Patent number
11,796,738
Issue date
Oct 24, 2023
Shanghai Institute of Microsystem and Information Technology, Chinese Academy...
Chao Qiu
G01 - MEASURING TESTING
Information
Patent Grant
Laser interferometry systems and methods
Patent number
11,703,315
Issue date
Jul 18, 2023
Nordson Corporation
Jerome Joseph Dapore
G01 - MEASURING TESTING
Information
Patent Grant
Optical measuring device
Patent number
11,231,270
Issue date
Jan 25, 2022
Omron Corporation
Takahiro Okuda
G01 - MEASURING TESTING
Information
Patent Grant
Telecentric and broadband achromatic objective lens systems
Patent number
11,092,425
Issue date
Aug 17, 2021
University of Rochester
Di Xu
G01 - MEASURING TESTING
Information
Patent Grant
Optical fiber distributed monitoring system and method
Patent number
10,697,853
Issue date
Jun 30, 2020
Laser Institute of Shandong Academy of Sciences
Ying Shang
G01 - MEASURING TESTING
Information
Patent Grant
Optical measurement device having a plurality of rotary shafts and...
Patent number
10,422,621
Issue date
Sep 24, 2019
Adamant Namiki Precision Jewel Co., Ltd.
Hiroshi Yamazaki
G02 - OPTICS
Information
Patent Grant
Line-field imaging systems and methods incorporating planar waveguides
Patent number
10,113,856
Issue date
Oct 30, 2018
Carl Zeiss Meditec, Inc.
Matthew J. Everett
G01 - MEASURING TESTING
Information
Patent Grant
Processing data from a distributed fibre-optic interferometric sens...
Patent number
10,001,362
Issue date
Jun 19, 2018
Optoplan AS
Erlend Ronnekleiv
G01 - MEASURING TESTING
Information
Patent Grant
Measuring system and measuring method
Patent number
9,915,519
Issue date
Mar 13, 2018
Semiconductor Manufacturing International (Shanghai) Corporation
Qiang Wu
G02 - OPTICS
Information
Patent Grant
High-speed optical coherence tomography using multiple interferomet...
Patent number
9,869,541
Issue date
Jan 16, 2018
Medlumics S.L.
Eduardo Margallo Balbás
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Grant
Method for reducing interference from scattered light/reflected lig...
Patent number
9,658,052
Issue date
May 23, 2017
Fudan University
Bo Jia
G02 - OPTICS
Information
Patent Grant
Optical module and production method for same
Patent number
9,557,555
Issue date
Jan 31, 2017
Hamamatsu Photonics K.K.
Yoshihisa Warashina
G02 - OPTICS
Information
Patent Grant
Production method for optical component and optical component
Patent number
9,372,285
Issue date
Jun 21, 2016
Hamamatsu Photonics K.K.
Yoshihisa Warashina
G01 - MEASURING TESTING
Information
Patent Grant
Profile measuring instrument
Patent number
9,115,973
Issue date
Aug 25, 2015
Mitutoyo Corporation
Yoshimasa Suzuki
G01 - MEASURING TESTING
Information
Patent Grant
Device for determining distance interferometrically
Patent number
9,068,811
Issue date
Jun 30, 2015
Dr. Johannes Heidenhain GmbH
Wolfgang Holzapfel
G01 - MEASURING TESTING
Information
Patent Grant
Six-axis four-subdividing interferometer
Patent number
9,036,155
Issue date
May 19, 2015
Shanghai Institute of Optics And Fine Mechanics, Chinese Academy of Sciences
Jianfang Chen
G01 - MEASURING TESTING
Information
Patent Grant
Four-axis four-subdividing interferometer
Patent number
9,036,154
Issue date
May 19, 2015
Shanghai Institute of Optics And Fine Mechanics, Chinese Academy of Sciences
Zhaogu Cheng
G01 - MEASURING TESTING
Information
Patent Grant
Interferometric measurement with crosstalk suppression
Patent number
9,025,158
Issue date
May 5, 2015
Intuitive Surgical Operations, Inc.
Mark E. Froggatt
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus and methods for optical coherence tomography and confocal...
Patent number
8,937,723
Issue date
Jan 20, 2015
Thunder Bay Regional Research Institute
Andrew T. Cenko
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Grant
High resolution extended depth of field optical coherence tomography
Patent number
8,860,948
Issue date
Oct 14, 2014
Ben Gurion University of the Negev Research and Development Authority Ltd.; B...
Ibrahim Abdulhalim
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Grant
System and method for a virtual reference interferometer
Patent number
8,797,539
Issue date
Aug 5, 2014
Michael Galle
G01 - MEASURING TESTING
Information
Patent Grant
Coaxial interferometer and inspection probe
Patent number
8,705,041
Issue date
Apr 22, 2014
PROMET International, Inc.
Ryan Elliot Eckman
G01 - MEASURING TESTING
Information
Patent Grant
High intensity Fabry-Perot sensor
Patent number
8,432,552
Issue date
Apr 30, 2013
Halliburton Energy Services, Inc.
William N. Gibler
G01 - MEASURING TESTING
Information
Patent Grant
Optical sensor for extreme environments
Patent number
8,035,822
Issue date
Oct 11, 2011
Nusensors, Inc.
Nabeel Agha Riza
G01 - MEASURING TESTING
Information
Patent Grant
Homodyne laser interferometer probe and displacement measurement sy...
Patent number
7,847,953
Issue date
Dec 7, 2010
Japan Science and Technology Agency
Hideki Kawakatsu
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Optics system for an interferometer that uses a measuring mirror, a...
Patent number
7,542,149
Issue date
Jun 2, 2009
Dr. Johannes Heidenhain GmbH
Erwin Spanner
G01 - MEASURING TESTING
Information
Patent Grant
Polarising interferometer
Patent number
7,525,665
Issue date
Apr 28, 2009
Renishaw PLC
William Ernest Lee
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus and method of in situ and ex situ measurement of spatial...
Patent number
7,508,527
Issue date
Mar 24, 2009
Zetetic Institute
Henry A. Hill
G01 - MEASURING TESTING
Information
Patent Grant
High precision interferometer apparatus employing a grating beamspl...
Patent number
7,414,730
Issue date
Aug 19, 2008
The Board of Trustees of the Leland Stanford Junior University
Ke-Xun Sun
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
OPTICAL SYSTEM USING ENHANCED STATIC FRINGE CAPTURE
Publication number
20230213334
Publication date
Jul 6, 2023
BMV Optical Technologies Inc.
Curtis Blake LaPlante
G01 - MEASURING TESTING
Information
Patent Application
TEMPERATURE-INSENSITIVE MACH-ZEHNDER INTERFEROMETER
Publication number
20220120973
Publication date
Apr 21, 2022
SHANGHAI INSTITUTE OF MICROSYSTEM AND INFORMATION TECHNOLOGY, CHINESE ACADEMY...
Chao QIU
G02 - OPTICS
Information
Patent Application
LASER INTERFEROMETER
Publication number
20220065613
Publication date
Mar 3, 2022
SEIKO EPSON CORPORATION
Jun KITAGAWA
G01 - MEASURING TESTING
Information
Patent Application
DIFFERENTIAL SINUSOIDAL PHASE MODULATION LASER INTERFEROMETRIC NANO...
Publication number
20210199418
Publication date
Jul 1, 2021
ZHEJIANG SCI-TECH UNIVERSITY
Liping YAN
G01 - MEASURING TESTING
Information
Patent Application
LASER INTERFEROMETRY SYSTEMS AND METHODS
Publication number
20210088320
Publication date
Mar 25, 2021
NDC Technologies Inc.
Jerome Joseph DAPORE
G01 - MEASURING TESTING
Information
Patent Application
Optical Fiber Distributed Monitoring System and Method
Publication number
20200056959
Publication date
Feb 20, 2020
Laser Institute of Shandong Academy of Sciences
Ying Shang
G01 - MEASURING TESTING
Information
Patent Application
TELECENTRIC AND BROADBAND ACHROMATIC OBJECTIVE LENS SYSTEMS
Publication number
20200011651
Publication date
Jan 9, 2020
University of Rochester
Di Xu
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL MEASURING DEVICE
Publication number
20190277621
Publication date
Sep 12, 2019
Omron Corporation
Takahiro OKUDA
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL MEASUREMENT DEVICE, METHOD FOR REVISING OPTICAL MEASUREMENT...
Publication number
20180143000
Publication date
May 24, 2018
Adamant Namiki Precision Jewel Co., Ltd.
Hiroshi YAMAZAKI
G01 - MEASURING TESTING
Information
Patent Application
MEASURING SYSTEM AND MEASURING METHOD
Publication number
20170370698
Publication date
Dec 28, 2017
Semiconductor Manufacturing International (Shanghai) Corporation
QIANG WU
G02 - OPTICS
Information
Patent Application
SILLICON BASED PRESSURE AND ACCELERATION OPTICAL INTERFEROMETRIC SE...
Publication number
20160273904
Publication date
Sep 22, 2016
Kulite Semiconductor Products, Inc.
Martin A. Sanzari
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR REDUCING INTERFERENCE FROM SCATTERED LIGHT/REFLECTED LIG...
Publication number
20150377603
Publication date
Dec 31, 2015
Fudan University
Bo JIA
G02 - OPTICS
Information
Patent Application
Balanced-Detection Spectra Domain Optical Coherence Tomography System
Publication number
20140198310
Publication date
Jul 17, 2014
National Yang-Ming University
Wen-Chuan KUO
G01 - MEASURING TESTING
Information
Patent Application
FOUR-AXIS FOUR-SUBDIVIDING INTERFEROMETER
Publication number
20140160489
Publication date
Jun 12, 2014
SHANGHAI MICRO ELECTRONICS EQUIPMENT Co., LTD.
Zhaogu Cheng
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL MODULE AND PRODUCTION METHOD FOR SAME
Publication number
20140139924
Publication date
May 22, 2014
Hamamatsu Photonics K.K.
Yoshihisa Warashina
G02 - OPTICS
Information
Patent Application
SIX-AXIS FOUR-SUBDIVIDING INTERFEROMETER
Publication number
20140125989
Publication date
May 8, 2014
SHANGHAI MICRO ELECTRONICS EQUIPMENT Co., LTD.
Jianfang CHEN
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL COHERENCE TOMOGRAPHY APPARATUS AND OPTICAL COHERENCE TOMOGR...
Publication number
20140125992
Publication date
May 8, 2014
Canon Kabushiki Kaisha
Takefumi Ota
G01 - MEASURING TESTING
Information
Patent Application
PRODUCTION METHOD FOR OPTICAL COMPONENT AND OPTICAL COMPONENT
Publication number
20140104687
Publication date
Apr 17, 2014
Hamamatsu Photonics K.K.
Yoshihisa Warashina
G02 - OPTICS
Information
Patent Application
PROFILE MEASURING INSTRUMENT
Publication number
20130321821
Publication date
Dec 5, 2013
Yoshimasa SUZUKI
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL ELEMENT AND INTERFEROMETER
Publication number
20130128273
Publication date
May 23, 2013
Hamamatsu Photonics K.K.
Asami Inoue
G02 - OPTICS
Information
Patent Application
Device for Determining Distance Interferometrically
Publication number
20130057872
Publication date
Mar 7, 2013
Wolfgang Holzapfel
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL INTERFEROMETER SYSTEM WITH DAMPED VIBRATION AND NOISE EFFEC...
Publication number
20120307255
Publication date
Dec 6, 2012
Chang Seok KIM
G01 - MEASURING TESTING
Information
Patent Application
APPARATUS AND METHODS FOR OPTICAL COHERENCE TOMOGRAPHY AND CONFOCAL...
Publication number
20120218558
Publication date
Aug 30, 2012
THUNDER BAY REGIONAL RESEARCH INSTITUTE
Andrew T. Cenko
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Application
COAXIAL INTERFEROMETER AND INSPECTION PROBE
Publication number
20120133946
Publication date
May 31, 2012
PROMET International, Inc.
Ryan Elliot Eckman
G02 - OPTICS
Information
Patent Application
SYSTEM AND METHOD FOR A VIRTUAL REFERENCE INTERFEROMETER
Publication number
20120013908
Publication date
Jan 19, 2012
Michael Galle
G01 - MEASURING TESTING
Information
Patent Application
INTERFEROMETRIC MEASUREMENT WITH CROSSTALK SUPPRESSION
Publication number
20110310378
Publication date
Dec 22, 2011
Luna Innovations Incorporated
Mark E. FROGGATT
G01 - MEASURING TESTING
Information
Patent Application
HIGH RESOLUTION EXTENDED DEPTH OF FIELD OPTICAL COHERENCE TOMOGRAPHY
Publication number
20110181888
Publication date
Jul 28, 2011
Ben Gurion University of the Negev Research and Development Authority Ltdd.
Ibrahim Abdulhalim
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Application
HIGH INTENSITY FABRY-PEROT SENSOR
Publication number
20110170112
Publication date
Jul 14, 2011
Halliburton Energy Services, Inc.
William N. Gibler
G02 - OPTICS
Information
Patent Application
Rotary Interferometer
Publication number
20110157595
Publication date
Jun 30, 2011
William S. Yerazunis
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL SENSOR FOR EXTREME ENVIRONMENTS
Publication number
20100128284
Publication date
May 27, 2010
Nabeel Agha Riza
G01 - MEASURING TESTING