Passive error reduction, i.e. not varying during measurement

Industry

CPC
G01B9/02056

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Parent Industries

GPHYSICS G01Measuring instruments G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS G01B9/00Instruments as specified in the subgroups and characterised by the use of optical measuring means

Current Industry

G01B9/02056Passive error reduction, i.e. not varying during measurement

Industries

Patents Grantslast 30 patents

Information Patent Grant
Laser interferometer having a vibrator to modulate light for displa...
- Patent number 11,879,730
- Issue date Jan 23, 2024
- Seiko Epson Corporation
- Jun Kitagawa
- G02 - OPTICS
Information Patent Grant
Temperature-insensitive Mach-Zehnder interferometer
- Patent number 11,796,738
- Issue date Oct 24, 2023
- Shanghai Institute of Microsystem and Information Technology, Chinese Academy...
- Chao Qiu
- G01 - MEASURING TESTING
Information Patent Grant
Laser interferometry systems and methods
- Patent number 11,703,315
- Issue date Jul 18, 2023
- Nordson Corporation
- Jerome Joseph Dapore
- G01 - MEASURING TESTING
Information Patent Grant
Optical measuring device
- Patent number 11,231,270
- Issue date Jan 25, 2022
- Omron Corporation
- Takahiro Okuda
- G01 - MEASURING TESTING
Information Patent Grant
Telecentric and broadband achromatic objective lens systems
- Patent number 11,092,425
- Issue date Aug 17, 2021
- University of Rochester
- Di Xu
- G01 - MEASURING TESTING
Information Patent Grant
Optical fiber distributed monitoring system and method
- Patent number 10,697,853
- Issue date Jun 30, 2020
- Laser Institute of Shandong Academy of Sciences
- Ying Shang
- G01 - MEASURING TESTING
Information Patent Grant
Optical measurement device having a plurality of rotary shafts and...
- Patent number 10,422,621
- Issue date Sep 24, 2019
- Adamant Namiki Precision Jewel Co., Ltd.
- Hiroshi Yamazaki
- G02 - OPTICS
Information Patent Grant
Line-field imaging systems and methods incorporating planar waveguides
- Patent number 10,113,856
- Issue date Oct 30, 2018
- Carl Zeiss Meditec, Inc.
- Matthew J. Everett
- G01 - MEASURING TESTING
Information Patent Grant
Processing data from a distributed fibre-optic interferometric sens...
- Patent number 10,001,362
- Issue date Jun 19, 2018
- Optoplan AS
- Erlend Ronnekleiv
- G01 - MEASURING TESTING
Information Patent Grant
Measuring system and measuring method
- Patent number 9,915,519
- Issue date Mar 13, 2018
- Semiconductor Manufacturing International (Shanghai) Corporation
- Qiang Wu
- G02 - OPTICS
Information Patent Grant
High-speed optical coherence tomography using multiple interferomet...
- Patent number 9,869,541
- Issue date Jan 16, 2018
- Medlumics S.L.
- Eduardo Margallo Balbás
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Method for reducing interference from scattered light/reflected lig...
- Patent number 9,658,052
- Issue date May 23, 2017
- Fudan University
- Bo Jia
- G02 - OPTICS
Information Patent Grant
Optical module and production method for same
- Patent number 9,557,555
- Issue date Jan 31, 2017
- Hamamatsu Photonics K.K.
- Yoshihisa Warashina
- G02 - OPTICS
Information Patent Grant
Production method for optical component and optical component
- Patent number 9,372,285
- Issue date Jun 21, 2016
- Hamamatsu Photonics K.K.
- Yoshihisa Warashina
- G01 - MEASURING TESTING
Information Patent Grant
Profile measuring instrument
- Patent number 9,115,973
- Issue date Aug 25, 2015
- Mitutoyo Corporation
- Yoshimasa Suzuki
- G01 - MEASURING TESTING
Information Patent Grant
Device for determining distance interferometrically
- Patent number 9,068,811
- Issue date Jun 30, 2015
- Dr. Johannes Heidenhain GmbH
- Wolfgang Holzapfel
- G01 - MEASURING TESTING
Information Patent Grant
Six-axis four-subdividing interferometer
- Patent number 9,036,155
- Issue date May 19, 2015
- Shanghai Institute of Optics And Fine Mechanics, Chinese Academy of Sciences
- Jianfang Chen
- G01 - MEASURING TESTING
Information Patent Grant
Four-axis four-subdividing interferometer
- Patent number 9,036,154
- Issue date May 19, 2015
- Shanghai Institute of Optics And Fine Mechanics, Chinese Academy of Sciences
- Zhaogu Cheng
- G01 - MEASURING TESTING
Information Patent Grant
Interferometric measurement with crosstalk suppression
- Patent number 9,025,158
- Issue date May 5, 2015
- Intuitive Surgical Operations, Inc.
- Mark E. Froggatt
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and methods for optical coherence tomography and confocal...
- Patent number 8,937,723
- Issue date Jan 20, 2015
- Thunder Bay Regional Research Institute
- Andrew T. Cenko
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
High resolution extended depth of field optical coherence tomography
- Patent number 8,860,948
- Issue date Oct 14, 2014
- Ben Gurion University of the Negev Research and Development Authority Ltd.; B...
- Ibrahim Abdulhalim
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
System and method for a virtual reference interferometer
- Patent number 8,797,539
- Issue date Aug 5, 2014
- Michael Galle
- G01 - MEASURING TESTING
Information Patent Grant
Coaxial interferometer and inspection probe
- Patent number 8,705,041
- Issue date Apr 22, 2014
- PROMET International, Inc.
- Ryan Elliot Eckman
- G01 - MEASURING TESTING
Information Patent Grant
High intensity Fabry-Perot sensor
- Patent number 8,432,552
- Issue date Apr 30, 2013
- Halliburton Energy Services, Inc.
- William N. Gibler
- G01 - MEASURING TESTING
Information Patent Grant
Optical sensor for extreme environments
- Patent number 8,035,822
- Issue date Oct 11, 2011
- Nusensors, Inc.
- Nabeel Agha Riza
- G01 - MEASURING TESTING
Information Patent Grant
Homodyne laser interferometer probe and displacement measurement sy...
- Patent number 7,847,953
- Issue date Dec 7, 2010
- Japan Science and Technology Agency
- Hideki Kawakatsu
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Optics system for an interferometer that uses a measuring mirror, a...
- Patent number 7,542,149
- Issue date Jun 2, 2009
- Dr. Johannes Heidenhain GmbH
- Erwin Spanner
- G01 - MEASURING TESTING
Information Patent Grant
Polarising interferometer
- Patent number 7,525,665
- Issue date Apr 28, 2009
- Renishaw PLC
- William Ernest Lee
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method of in situ and ex situ measurement of spatial...
- Patent number 7,508,527
- Issue date Mar 24, 2009
- Zetetic Institute
- Henry A. Hill
- G01 - MEASURING TESTING
Information Patent Grant
High precision interferometer apparatus employing a grating beamspl...
- Patent number 7,414,730
- Issue date Aug 19, 2008
- The Board of Trustees of the Leland Stanford Junior University
- Ke-Xun Sun
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
OPTICAL SYSTEM USING ENHANCED STATIC FRINGE CAPTURE
- Publication number 20230213334
- Publication date Jul 6, 2023
- BMV Optical Technologies Inc.
- Curtis Blake LaPlante
- G01 - MEASURING TESTING
Information Patent Application
TEMPERATURE-INSENSITIVE MACH-ZEHNDER INTERFEROMETER
- Publication number 20220120973
- Publication date Apr 21, 2022
- SHANGHAI INSTITUTE OF MICROSYSTEM AND INFORMATION TECHNOLOGY, CHINESE ACADEMY...
- Chao QIU
- G02 - OPTICS
Information Patent Application
LASER INTERFEROMETER
- Publication number 20220065613
- Publication date Mar 3, 2022
- SEIKO EPSON CORPORATION
- Jun KITAGAWA
- G01 - MEASURING TESTING
Information Patent Application
DIFFERENTIAL SINUSOIDAL PHASE MODULATION LASER INTERFEROMETRIC NANO...
- Publication number 20210199418
- Publication date Jul 1, 2021
- ZHEJIANG SCI-TECH UNIVERSITY
- Liping YAN
- G01 - MEASURING TESTING
Information Patent Application
LASER INTERFEROMETRY SYSTEMS AND METHODS
- Publication number 20210088320
- Publication date Mar 25, 2021
- NDC Technologies Inc.
- Jerome Joseph DAPORE
- G01 - MEASURING TESTING
Information Patent Application
Optical Fiber Distributed Monitoring System and Method
- Publication number 20200056959
- Publication date Feb 20, 2020
- Laser Institute of Shandong Academy of Sciences
- Ying Shang
- G01 - MEASURING TESTING
Information Patent Application
TELECENTRIC AND BROADBAND ACHROMATIC OBJECTIVE LENS SYSTEMS
- Publication number 20200011651
- Publication date Jan 9, 2020
- University of Rochester
- Di Xu
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL MEASURING DEVICE
- Publication number 20190277621
- Publication date Sep 12, 2019
- Omron Corporation
- Takahiro OKUDA
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL MEASUREMENT DEVICE, METHOD FOR REVISING OPTICAL MEASUREMENT...
- Publication number 20180143000
- Publication date May 24, 2018
- Adamant Namiki Precision Jewel Co., Ltd.
- Hiroshi YAMAZAKI
- G01 - MEASURING TESTING
Information Patent Application
MEASURING SYSTEM AND MEASURING METHOD
- Publication number 20170370698
- Publication date Dec 28, 2017
- Semiconductor Manufacturing International (Shanghai) Corporation
- QIANG WU
- G02 - OPTICS
Information Patent Application
SILLICON BASED PRESSURE AND ACCELERATION OPTICAL INTERFEROMETRIC SE...
- Publication number 20160273904
- Publication date Sep 22, 2016
- Kulite Semiconductor Products, Inc.
- Martin A. Sanzari
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR REDUCING INTERFERENCE FROM SCATTERED LIGHT/REFLECTED LIG...
- Publication number 20150377603
- Publication date Dec 31, 2015
- Fudan University
- Bo JIA
- G02 - OPTICS
Information Patent Application
Balanced-Detection Spectra Domain Optical Coherence Tomography System
- Publication number 20140198310
- Publication date Jul 17, 2014
- National Yang-Ming University
- Wen-Chuan KUO
- G01 - MEASURING TESTING
Information Patent Application
FOUR-AXIS FOUR-SUBDIVIDING INTERFEROMETER
- Publication number 20140160489
- Publication date Jun 12, 2014
- SHANGHAI MICRO ELECTRONICS EQUIPMENT Co., LTD.
- Zhaogu Cheng
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL MODULE AND PRODUCTION METHOD FOR SAME
- Publication number 20140139924
- Publication date May 22, 2014
- Hamamatsu Photonics K.K.
- Yoshihisa Warashina
- G02 - OPTICS
Information Patent Application
SIX-AXIS FOUR-SUBDIVIDING INTERFEROMETER
- Publication number 20140125989
- Publication date May 8, 2014
- SHANGHAI MICRO ELECTRONICS EQUIPMENT Co., LTD.
- Jianfang CHEN
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL COHERENCE TOMOGRAPHY APPARATUS AND OPTICAL COHERENCE TOMOGR...
- Publication number 20140125992
- Publication date May 8, 2014
- Canon Kabushiki Kaisha
- Takefumi Ota
- G01 - MEASURING TESTING
Information Patent Application
PRODUCTION METHOD FOR OPTICAL COMPONENT AND OPTICAL COMPONENT
- Publication number 20140104687
- Publication date Apr 17, 2014
- Hamamatsu Photonics K.K.
- Yoshihisa Warashina
- G02 - OPTICS
Information Patent Application
PROFILE MEASURING INSTRUMENT
- Publication number 20130321821
- Publication date Dec 5, 2013
- Yoshimasa SUZUKI
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL ELEMENT AND INTERFEROMETER
- Publication number 20130128273
- Publication date May 23, 2013
- Hamamatsu Photonics K.K.
- Asami Inoue
- G02 - OPTICS
Information Patent Application
Device for Determining Distance Interferometrically
- Publication number 20130057872
- Publication date Mar 7, 2013
- Wolfgang Holzapfel
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL INTERFEROMETER SYSTEM WITH DAMPED VIBRATION AND NOISE EFFEC...
- Publication number 20120307255
- Publication date Dec 6, 2012
- Chang Seok KIM
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHODS FOR OPTICAL COHERENCE TOMOGRAPHY AND CONFOCAL...
- Publication number 20120218558
- Publication date Aug 30, 2012
- THUNDER BAY REGIONAL RESEARCH INSTITUTE
- Andrew T. Cenko
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
COAXIAL INTERFEROMETER AND INSPECTION PROBE
- Publication number 20120133946
- Publication date May 31, 2012
- PROMET International, Inc.
- Ryan Elliot Eckman
- G02 - OPTICS
Information Patent Application
SYSTEM AND METHOD FOR A VIRTUAL REFERENCE INTERFEROMETER
- Publication number 20120013908
- Publication date Jan 19, 2012
- Michael Galle
- G01 - MEASURING TESTING
Information Patent Application
INTERFEROMETRIC MEASUREMENT WITH CROSSTALK SUPPRESSION
- Publication number 20110310378
- Publication date Dec 22, 2011
- Luna Innovations Incorporated
- Mark E. FROGGATT
- G01 - MEASURING TESTING
Information Patent Application
HIGH RESOLUTION EXTENDED DEPTH OF FIELD OPTICAL COHERENCE TOMOGRAPHY
- Publication number 20110181888
- Publication date Jul 28, 2011
- Ben Gurion University of the Negev Research and Development Authority Ltdd.
- Ibrahim Abdulhalim
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
HIGH INTENSITY FABRY-PEROT SENSOR
- Publication number 20110170112
- Publication date Jul 14, 2011
- Halliburton Energy Services, Inc.
- William N. Gibler
- G02 - OPTICS
Information Patent Application
Rotary Interferometer
- Publication number 20110157595
- Publication date Jun 30, 2011
- William S. Yerazunis
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL SENSOR FOR EXTREME ENVIRONMENTS
- Publication number 20100128284
- Publication date May 27, 2010
- Nabeel Agha Riza
- G01 - MEASURING TESTING

Passive error reduction, i.e. not varying during measurement

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Laser interferometer having a vibrator to modulate light for displa...

Temperature-insensitive Mach-Zehnder interferometer

Laser interferometry systems and methods

Optical measuring device

Telecentric and broadband achromatic objective lens systems

Optical fiber distributed monitoring system and method

Optical measurement device having a plurality of rotary shafts and...

Line-field imaging systems and methods incorporating planar waveguides

Processing data from a distributed fibre-optic interferometric sens...

Measuring system and measuring method

High-speed optical coherence tomography using multiple interferomet...

Method for reducing interference from scattered light/reflected lig...

Optical module and production method for same

Production method for optical component and optical component

Profile measuring instrument

Device for determining distance interferometrically

Six-axis four-subdividing interferometer

Four-axis four-subdividing interferometer

Interferometric measurement with crosstalk suppression

Apparatus and methods for optical coherence tomography and confocal...

High resolution extended depth of field optical coherence tomography

System and method for a virtual reference interferometer

Coaxial interferometer and inspection probe

High intensity Fabry-Perot sensor

Optical sensor for extreme environments

Homodyne laser interferometer probe and displacement measurement sy...

Optics system for an interferometer that uses a measuring mirror, a...

Polarising interferometer

Apparatus and method of in situ and ex situ measurement of spatial...

High precision interferometer apparatus employing a grating beamspl...

Patents Applicationslast 30 patents

OPTICAL SYSTEM USING ENHANCED STATIC FRINGE CAPTURE

TEMPERATURE-INSENSITIVE MACH-ZEHNDER INTERFEROMETER

LASER INTERFEROMETER

DIFFERENTIAL SINUSOIDAL PHASE MODULATION LASER INTERFEROMETRIC NANO...

LASER INTERFEROMETRY SYSTEMS AND METHODS

Optical Fiber Distributed Monitoring System and Method

TELECENTRIC AND BROADBAND ACHROMATIC OBJECTIVE LENS SYSTEMS

OPTICAL MEASURING DEVICE

OPTICAL MEASUREMENT DEVICE, METHOD FOR REVISING OPTICAL MEASUREMENT...

MEASURING SYSTEM AND MEASURING METHOD

SILLICON BASED PRESSURE AND ACCELERATION OPTICAL INTERFEROMETRIC SE...

METHOD FOR REDUCING INTERFERENCE FROM SCATTERED LIGHT/REFLECTED LIG...

Balanced-Detection Spectra Domain Optical Coherence Tomography System

FOUR-AXIS FOUR-SUBDIVIDING INTERFEROMETER

OPTICAL MODULE AND PRODUCTION METHOD FOR SAME

SIX-AXIS FOUR-SUBDIVIDING INTERFEROMETER

OPTICAL COHERENCE TOMOGRAPHY APPARATUS AND OPTICAL COHERENCE TOMOGR...

PRODUCTION METHOD FOR OPTICAL COMPONENT AND OPTICAL COMPONENT

PROFILE MEASURING INSTRUMENT

OPTICAL ELEMENT AND INTERFEROMETER

Device for Determining Distance Interferometrically

OPTICAL INTERFEROMETER SYSTEM WITH DAMPED VIBRATION AND NOISE EFFEC...

APPARATUS AND METHODS FOR OPTICAL COHERENCE TOMOGRAPHY AND CONFOCAL...

COAXIAL INTERFEROMETER AND INSPECTION PROBE

SYSTEM AND METHOD FOR A VIRTUAL REFERENCE INTERFEROMETER

INTERFEROMETRIC MEASUREMENT WITH CROSSTALK SUPPRESSION

HIGH RESOLUTION EXTENDED DEPTH OF FIELD OPTICAL COHERENCE TOMOGRAPHY

HIGH INTENSITY FABRY-PEROT SENSOR

Rotary Interferometer

OPTICAL SENSOR FOR EXTREME ENVIRONMENTS