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G01J3/1804
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PHYSICS
G01
Measuring instruments
G01J
MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT COLORIMETRY RADIATION PYROMETRY
G01J3/00
Spectrometry Spectrophotometry Monochromators Measuring colour
Current Industry
G01J3/1804
Plane gratings
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Patents Grants
last 30 patents
Information
Patent Grant
Modulator, imaging apparatus, and design method
Patent number
12,222,243
Issue date
Feb 11, 2025
Sony Group Corporation
Tuo Zhuang
G01 - MEASURING TESTING
Information
Patent Grant
Spectral feature control apparatus
Patent number
12,124,053
Issue date
Oct 22, 2024
Cymer, LLC
Eric Anders Mason
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Spectrometer
Patent number
12,117,341
Issue date
Oct 15, 2024
Answeray Inc.
Seong Ho Cho
G01 - MEASURING TESTING
Information
Patent Grant
Spectral feature control apparatus
Patent number
11,561,407
Issue date
Jan 24, 2023
Cymer, LLC
Eric Anders Mason
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Spectrally-resolved raman water lidar
Patent number
11,402,511
Issue date
Aug 2, 2022
Wuhan University
Fuchao Liu
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Hybrid laser-induced breakdown spectroscopy system
Patent number
11,385,182
Issue date
Jul 12, 2022
National Research Council of Canada
Paul Bouchard
G01 - MEASURING TESTING
Information
Patent Grant
High resolution and high throughput spectrometer
Patent number
11,385,101
Issue date
Jul 12, 2022
National Research Council of Canada
Paul Bouchard
G01 - MEASURING TESTING
Information
Patent Grant
Coma-elimination broadband high-resolution spectrograph
Patent number
11,293,803
Issue date
Apr 5, 2022
Liangyao Chen
G01 - MEASURING TESTING
Information
Patent Grant
Monolithic assembly of reflective spatial heterodyne spectrometer
Patent number
11,237,056
Issue date
Feb 1, 2022
California Institute of Technology
Seyedeh Sona Hosseini
G01 - MEASURING TESTING
Information
Patent Grant
System and method for serum based cancer detection
Patent number
11,145,411
Issue date
Oct 12, 2021
ChemImage Corporation
Patrick Treado
G01 - MEASURING TESTING
Information
Patent Grant
Photovoltaic module comprising a concentration optic with subwavele...
Patent number
11,031,518
Issue date
Jun 8, 2021
Thales
Mane-Si Laure Lee-Bouhours
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Spectrometer
Patent number
10,983,002
Issue date
Apr 20, 2021
ANVAJO GMBH
Stefan Fraedrich
G01 - MEASURING TESTING
Information
Patent Grant
Multi-bandwidth spectrally encoded endoscope
Patent number
10,898,068
Issue date
Jan 26, 2021
Canon U.S.A., Inc.
Mitsuhiro Ikuta
G01 - MEASURING TESTING
Information
Patent Grant
Spectral feature control apparatus
Patent number
10,845,610
Issue date
Nov 24, 2020
Cymer, LLC
Eric Anders Mason
G02 - OPTICS
Information
Patent Grant
Spectrometer and method for measuring the spectral characteristics...
Patent number
10,837,832
Issue date
Nov 17, 2020
TESTRIGHT NANOSYSTEMS PVT. LTD.
Shubham Rathore
G01 - MEASURING TESTING
Information
Patent Grant
Compact wideband VUV spectrometer
Patent number
10,753,798
Issue date
Aug 25, 2020
RnD-ISAN, Ltd
Dmitriy Borisovich Abramenko
G01 - MEASURING TESTING
Information
Patent Grant
System for analyzing electromagnetic radiation, and device for prod...
Patent number
10,739,198
Issue date
Aug 11, 2020
Fraunhofer-Gesellschaft zur Foerderung der angewandten Forschung e.V.
Heinrich Grueger
G01 - MEASURING TESTING
Information
Patent Grant
Light modulating device and spectral detection system
Patent number
10,697,831
Issue date
Jun 30, 2020
BOE Technology Group Co., Ltd.
Xiandong Meng
G01 - MEASURING TESTING
Information
Patent Grant
Sagnac fourier spectrometer (SAFOS)
Patent number
10,571,442
Issue date
Feb 25, 2020
Matthias Lenzner
G01 - MEASURING TESTING
Information
Patent Grant
Multichannel ultra-sensitive optical spectroscopic detection
Patent number
10,451,479
Issue date
Oct 22, 2019
The Curators of the University of Missouri
Zhi Xu
G01 - MEASURING TESTING
Information
Patent Grant
Spectral feature control apparatus
Patent number
10,416,471
Issue date
Sep 17, 2019
Cymer, LLC
Eric Anders Mason
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Spectrometer including light filter
Patent number
10,393,580
Issue date
Aug 27, 2019
Samsung Electronics Co., Ltd.
Hyochul Kim
G01 - MEASURING TESTING
Information
Patent Grant
Spectral detector and spectral detecting method using the same
Patent number
10,393,585
Issue date
Aug 27, 2019
Samsung Electronics Co., Ltd.
Sookyoung Roh
G01 - MEASURING TESTING
Information
Patent Grant
Wideband spectrograph
Patent number
10,386,234
Issue date
Aug 20, 2019
KLA-Tencor Corporation
Kenneth P. Gross
G01 - MEASURING TESTING
Information
Patent Grant
Optical arrangement for a spectral analysis system, method for its...
Patent number
10,247,607
Issue date
Apr 2, 2019
Fraunhofer-Gesellschaft zur Föderung der angewandten Forschung e.V.
Heinrich Grueger
G01 - MEASURING TESTING
Information
Patent Grant
Data blending multiple dispersive range monochromator
Patent number
10,215,635
Issue date
Feb 26, 2019
Westco Scientific Instruments, Inc.
Jerome J. Workman
G01 - MEASURING TESTING
Information
Patent Grant
Optical sensor having external cavity laser outputting sensing and...
Patent number
10,211,596
Issue date
Feb 19, 2019
Electronics and Telecommunications Research Institute
Kwang Ryong Oh
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Optical module, in particular opto-electronic module, and method of...
Patent number
10,180,235
Issue date
Jan 15, 2019
Heptagon Micro Optics Pte. Ltd.
Hartmut Rudmann
G02 - OPTICS
Information
Patent Grant
Multi-band spectrum division device
Patent number
10,126,472
Issue date
Nov 13, 2018
National Applied Research Laboratories
Jyh-Rou Sze
G01 - MEASURING TESTING
Information
Patent Grant
Spectrometer
Patent number
10,082,426
Issue date
Sep 25, 2018
ANDOR TECHNOLOGY LIMITED
Tristan Haldane
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
SPECTROSCOPIC ANALYZER
Publication number
20250102358
Publication date
Mar 27, 2025
HAMAMATSU PHOTONICS K. K.
Tatsuo DOUGAKIUCHI
G01 - MEASURING TESTING
Information
Patent Application
SPECTRAL FEATURE CONTROL APPARATUS
Publication number
20250013066
Publication date
Jan 9, 2025
CYMER, LLC
Eric Anders Mason
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
SYSTEMS AND METHODS TO ACQUIRE THREE DIMENSIONAL IMAGES USING SPECT...
Publication number
20240288307
Publication date
Aug 29, 2024
Yissum Research Development Company of the Hebrew University of Jerusalem Ltd.
Uriel LEVY
G01 - MEASURING TESTING
Information
Patent Application
SPECTROSCOPIC ANALYSIS DEVICE AND INTERFERING LIGHT FORMATION MECHA...
Publication number
20240271999
Publication date
Aug 15, 2024
Tsubasa SAITO
G01 - MEASURING TESTING
Information
Patent Application
Serpentine Integrated Grating and Associated Devices
Publication number
20240264460
Publication date
Aug 8, 2024
The Regents of the University of Colorado, a Body Corporate
Kelvin Wagner
G01 - MEASURING TESTING
Information
Patent Application
SPECTRAL FEATURE CONTROL APPARATUS
Publication number
20230124587
Publication date
Apr 20, 2023
CYMER, LLC
Eric Anders Mason
G02 - OPTICS
Information
Patent Application
MODULATOR, IMAGING APPARATUS, AND DESIGN METHOD
Publication number
20230090261
Publication date
Mar 23, 2023
SONY GROUP CORPORATION
TUO ZHUANG
G01 - MEASURING TESTING
Information
Patent Application
GRATING SPECTROMETER HAVING V-SHAPED PROJECTION LIGHT AND CAPABLE O...
Publication number
20230069726
Publication date
Mar 2, 2023
Fudan University
Liangyao Chen
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL FILTER AND SPECTROMETER INCLUDING SUB-WAVELENGTH DOUBLE GRA...
Publication number
20210255037
Publication date
Aug 19, 2021
Samsung Electronics Co., Ltd.
Chanwook BAIK
G01 - MEASURING TESTING
Information
Patent Application
HIGH RESOLUTION AND HIGH THROUGHPUT SPECTROMETER
Publication number
20210148756
Publication date
May 20, 2021
National Research Council of Canada
Paul BOUCHARD
G01 - MEASURING TESTING
Information
Patent Application
HYBRID LASER-INDUCED BREAKDOWN SPECTROSCOPY SYSTEM
Publication number
20210072159
Publication date
Mar 11, 2021
National Research Council of Canada
Paul BOUCHARD
G01 - MEASURING TESTING
Information
Patent Application
SPECTRAL FEATURE CONTROL APPARATUS
Publication number
20210011302
Publication date
Jan 14, 2021
CYMER, LLC
Eric Anders Mason
G02 - OPTICS
Information
Patent Application
COMA-ELIMINATION BROADBAND HIGH-RESOLUTION SPECTROGRAPH
Publication number
20200348174
Publication date
Nov 5, 2020
Fudan University
Liangyao Chen
G01 - MEASURING TESTING
Information
Patent Application
COMPACT WIDEBAND VUV SPECTROMETER
Publication number
20200173853
Publication date
Jun 4, 2020
RND-ISAN, LTD
Dmitriy Borisovich ABRAMENKO
G01 - MEASURING TESTING
Information
Patent Application
LIGHT MODULATING DEVICE AND SPECTRAL DETECTION SYSTEM
Publication number
20200088578
Publication date
Mar 19, 2020
BOE TECHNOLOGY GROUP CO., LTD.
Xiandong Meng
G02 - OPTICS
Information
Patent Application
SPECTROMETER
Publication number
20200041339
Publication date
Feb 6, 2020
ANVAJO GMBH
Stefan FRAEDRICH
G01 - MEASURING TESTING
Information
Patent Application
Spectrometer and Method for Measuring the Spectral Characteristics...
Publication number
20190368934
Publication date
Dec 5, 2019
TESTRIGHT NANOSYSTEMS PVT. LTD.
Shubham RATHORE
G01 - MEASURING TESTING
Information
Patent Application
SPECTRAL FEATURE CONTROL APPARATUS
Publication number
20190353920
Publication date
Nov 21, 2019
CYMER, LLC
Eric Anders Mason
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
MULTICHANNEL ULTRA-SENSITIVE OPTICAL SPECTROSCOPIC DETECTION
Publication number
20180266884
Publication date
Sep 20, 2018
THE CURATORS OF THE UNIVERSITY OF MISSOURI
Zhi Xu
G01 - MEASURING TESTING
Information
Patent Application
Optical Arrangement for a Spectral Analysis System, Method for its...
Publication number
20180087963
Publication date
Mar 29, 2018
Fraunhofer Gesellschaft zur Foerderung der angewandten Forschung e.V.
Heinrich Grueger
G01 - MEASURING TESTING
Information
Patent Application
SPECTROMETER
Publication number
20170211974
Publication date
Jul 27, 2017
Tristan Haldane
G01 - MEASURING TESTING
Information
Patent Application
SPECTROMETER COMPRISING A PLURALITY OF DIFFRACTION GRATINGS
Publication number
20160187200
Publication date
Jun 30, 2016
Commissariat A L'Energie Atomique et Aux Energies Alternatives
Jacques LUCE
G01 - MEASURING TESTING
Information
Patent Application
ANGLE LIMITING REFLECTOR AND OPTICAL DISPERSIVE DEVICE INCLUDING TH...
Publication number
20160025567
Publication date
Jan 28, 2016
JDSU Deutschland GmbH
Eberhard Loecklin
G01 - MEASURING TESTING
Information
Patent Application
NANOSTRUCTURE DIFFRACTION GRATINGS FOR INTEGRATED SPECTROSCOPY AND...
Publication number
20150177140
Publication date
Jun 25, 2015
Junpeng Guo
G02 - OPTICS
Information
Patent Application
VISIBLE-INFRARED PLANE GRATING IMAGING SPECTROMETER
Publication number
20150021480
Publication date
Jan 22, 2015
Michael P. Chrisp
G01 - MEASURING TESTING
Information
Patent Application
DISPERSIVE DEVICE AND WAVELENGTH SELECTIVE SWITCH
Publication number
20140368916
Publication date
Dec 18, 2014
Manabu SHIOZAKI
G02 - OPTICS
Information
Patent Application
SPECTRAL APPARATUS, DETECTION APPARATUS, LIGHT SOURCE APPARATUS, RE...
Publication number
20140363338
Publication date
Dec 11, 2014
Canon Kabushiki Kaisha
Takashi SUKEGAWA
G02 - OPTICS
Information
Patent Application
Linearized Variable-Dispersion Spectrometers and Related Assemblies
Publication number
20140313509
Publication date
Oct 23, 2014
Christopher Saxer
G01 - MEASURING TESTING
Information
Patent Application
HIGH RESOLUTION FAST TUNABLE FILTER USING A TUNABLE COMB FILTER
Publication number
20140209795
Publication date
Jul 31, 2014
OPTOPLEX CORPORATION
Yung-Chieh Hsieh
G02 - OPTICS
Information
Patent Application
EFFICIENCY OF A DEEP GRATING
Publication number
20140211314
Publication date
Jul 31, 2014
OPTOPLEX CORPORATION
Yung-Chieh Hsieh
G02 - OPTICS