Polarimeters of separated-field type Polarimeters of half-shadow type

Industry

CPC
G01J4/02

This industry / category may be too specific. Please go to a parent level for more data

Parent Industries

GPHYSICS G01Measuring instruments G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT COLORIMETRY RADIATION PYROMETRY G01J4/00Measuring polarisation of light

Current Industry

G01J4/02Polarimeters of separated-field type Polarimeters of half-shadow type

Industries

Patents Grantslast 30 patents

Information Patent Grant
Polarization measuring device and method of fabricating semiconduct...
- Patent number 11,946,809
- Issue date Apr 2, 2024
- Samsung Electronics Co., Ltd.
- Ingi Kim
- G01 - MEASURING TESTING
Information Patent Grant
Single-shot Mueller matrix polarimeter
- Patent number 11,921,033
- Issue date Mar 5, 2024
- Oxford University Innovation Limited
- Martin Booth
- G01 - MEASURING TESTING
Information Patent Grant
Imaging spectropolarimeter
- Patent number 11,499,870
- Issue date Nov 15, 2022
- Bruker Nano, Inc.
- Mazen Zawaideh
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Reflective metasurfaces for broadband terahertz linear-to-circular...
- Patent number 11,460,620
- Issue date Oct 4, 2022
- Triad National Security, LLC
- Hou-Tong Chen
- G02 - OPTICS
Information Patent Grant
Optical gradation system and method
- Patent number 11,340,116
- Issue date May 24, 2022
- SHENZHEN LUBANG TECHNOLOGY CO., LTD.
- Yang Yang
- G01 - MEASURING TESTING
Information Patent Grant
Hybrid systems and methods for characterizing stress in chemically...
- Patent number 11,105,612
- Issue date Aug 31, 2021
- Corning Incorporated
- Ryan Claude Andrews
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and methods for measuring mode spectra for ion-exchanged...
- Patent number 11,079,280
- Issue date Aug 3, 2021
- Corning Incorporated
- Rostislav Vatchev Roussev
- G01 - MEASURING TESTING
Information Patent Grant
Antireflection film
- Patent number 10,962,686
- Issue date Mar 30, 2021
- LG Chem, Ltd.
- Jin Seok Byun
- C03 - GLASS MINERAL OR SLAG WOOL
Information Patent Grant
Antireflection film and method for preparing same
- Patent number 10,908,323
- Issue date Feb 2, 2021
- LG Chem, Ltd.
- Jin Seok Byun
- G01 - MEASURING TESTING
Information Patent Grant
Antireflection film and method for preparing same
- Patent number 10,877,185
- Issue date Dec 29, 2020
- LG Chem, Ltd.
- Jin Seok Byun
- G02 - OPTICS
Information Patent Grant
Antireflection film
- Patent number 10,823,883
- Issue date Nov 3, 2020
- LG Chem, Ltd.
- Jin Seok Byun
- G01 - MEASURING TESTING
Information Patent Grant
Polarization decorrelation time imaging
- Patent number 10,794,767
- Issue date Oct 6, 2020
- BAE Systems Information and Electronic Systems Integration Inc.
- Andrew N. Acker
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Systems and methods for thermal imaging of RF signals
- Patent number 10,458,851
- Issue date Oct 29, 2019
- Keysight Technologies, Inc.
- Gregory Steven Lee
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Image processing device and image processing method
- Patent number 10,460,422
- Issue date Oct 29, 2019
- Sony Corporation
- Teppei Kurita
- B60 - VEHICLES IN GENERAL
Information Patent Grant
Short wave infrared polarimeter
- Patent number 10,451,483
- Issue date Oct 22, 2019
- Polaris Sensor Technologies, Inc.
- J Larry Pezzaniti
- G01 - MEASURING TESTING
Information Patent Grant
Hyper-entangled photon server system and associated methods
- Patent number 10,439,737
- Issue date Oct 8, 2019
- The United States of America as represented by the Secretary of the Air Force
- David H. Hughes
- G01 - MEASURING TESTING
Information Patent Grant
Short wave infrared polarimeter
- Patent number 10,031,026
- Issue date Jul 24, 2018
- Polaris Sensor Technologies, Inc.
- J Larry Pezzaniti
- G02 - OPTICS
Information Patent Grant
Apparatus and methods for measuring mode spectra for ion-exchanged...
- Patent number 9,983,064
- Issue date May 29, 2018
- Corning Incorporated
- Rostislav Vatchev Roussev
- G02 - OPTICS
Information Patent Grant
Cavity enhanced polarimeter and related methods
- Patent number 9,903,805
- Issue date Feb 27, 2018
- Theodore Peter Rakitzis
- G01 - MEASURING TESTING
Information Patent Grant
Photon entanglement router
- Patent number 9,784,622
- Issue date Oct 10, 2017
- The United States of America as represented by the Secretary of the Air Force
- David H. Hughes
- G02 - OPTICS
Information Patent Grant
Intensity-independent optical computing device
- Patent number 9,709,696
- Issue date Jul 18, 2017
- Halliburton Energy Services, Inc.
- James M. Price
- G02 - OPTICS
Information Patent Grant
Cavity enhanced polarimeter and related methods
- Patent number 9,702,812
- Issue date Jul 11, 2017
- Theodore Peter Rakitzis
- G01 - MEASURING TESTING
Information Patent Grant
Light source with controllable linear polarization
- Patent number 9,651,426
- Issue date May 16, 2017
- Agilent Technologies, Inc.
- Adam Kleczewski
- G02 - OPTICS
Information Patent Grant
Wavefront-division polarimetric analysis method and device, spectro...
- Patent number 9,551,618
- Issue date Jan 24, 2017
- HORIBA Jobin Yvon SAS
- Olivier Acher
- G01 - MEASURING TESTING
Information Patent Grant
Polarization information acquisition unit, image pickup apparatus i...
- Patent number 9,506,806
- Issue date Nov 29, 2016
- Canon Kabushiki Kaisha
- Daisuke Sano
- G02 - OPTICS
Information Patent Grant
Multiple wavelength ellipsometer system and related method
- Patent number 9,354,118
- Issue date May 31, 2016
- Film Sense, LLC
- Blaine D. Johs
- G01 - MEASURING TESTING
Information Patent Grant
Measuring polarization crosstalk in optical birefringent materials...
- Patent number 9,041,935
- Issue date May 26, 2015
- General Photonics Corporation
- Xiaotian Steve Yao
- G01 - MEASURING TESTING
Information Patent Grant
System and method for polarization measurement
- Patent number 8,797,532
- Issue date Aug 5, 2014
- Yeda Research and Development Company Ltd.
- Nir Davidson
- G01 - MEASURING TESTING
Information Patent Grant
Circular birefringence refractometer: method and apparatus for meas...
- Patent number 7,961,318
- Issue date Jun 14, 2011
- President and Fellows of Harvard College
- Peer Fischer
- G01 - MEASURING TESTING
Information Patent Grant
System and method for setting and compensating errors in AOI and PO...
- Patent number 7,136,172
- Issue date Nov 14, 2006
- J. A. Woollam Co., Inc.
- Blaine D. Johs
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
MATRIX-BASED CHARACTERIZATION AND MEASUREMENTS FOR SEMICONDUCTOR TH...
- Publication number 20240003819
- Publication date Jan 4, 2024
- The Board of Trustees of the Leland Stanford Junior University
- Thaibao Phan
- G01 - MEASURING TESTING
Information Patent Application
POLARIZATION MEASURING DEVICE AND METHOD OF FABRICATING SEMICONDUCT...
- Publication number 20230068376
- Publication date Mar 2, 2023
- Samsung Electronics Co., Ltd.
- Ingi KIM
- G01 - MEASURING TESTING
Information Patent Application
SINGLE-SHOT MUELLER MATRIX POLARIMETER
- Publication number 20220026347
- Publication date Jan 27, 2022
- Oxford University Innovation Limited
- Martin BOOTH
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL GRADATION SYSTEM AND METHOD
- Publication number 20210215540
- Publication date Jul 15, 2021
- SHENZHEN LUBANG TECHNOLOGY CO., LTD.
- Yang YANG
- G01 - MEASURING TESTING
Information Patent Application
HYBRID SYSTEMS AND METHODS FOR CHARACTERIZING STRESS IN CHEMICALLY...
- Publication number 20200300615
- Publication date Sep 24, 2020
- Corning Incorporated
- Ryan Claude Andrews
- G01 - MEASURING TESTING
Information Patent Application
Short Wave Infrared Polarimeter
- Publication number 20190056273
- Publication date Feb 21, 2019
- Polaris Sensor Technologies, Inc.
- J Larry PEZZANITI
- G02 - OPTICS
Information Patent Application
APPARATUS AND METHODS FOR MEASURING MODE SPECTRA FOR ION-EXCHANGED...
- Publication number 20180252586
- Publication date Sep 6, 2018
- Corning Incorporated
- Rostislav Vatchev Roussev
- G01 - MEASURING TESTING
Information Patent Application
Hyper-Entangled Photon Server System and Associated Methods
- Publication number 20180241480
- Publication date Aug 23, 2018
- GOVERNMENT OF THE UNITED STATES AS REPRESENTED BY THE SECRETARY OF THE AIR FORCE
- David H. Hughes
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SHORT WAVE INFRARED POLARIMETER
- Publication number 20180094980
- Publication date Apr 5, 2018
- Polaris Sensor Technologies, Inc.
- J Larry PEZZANITI
- G02 - OPTICS
Information Patent Application
POLARIZATION-SELECTIVE SCATTERING ANTENNA ARRAYS BASED POLARIMETER
- Publication number 20180066991
- Publication date Mar 8, 2018
- President and Fellows of Harvard College
- Jan Philipp Balthasar MUELLER
- G01 - MEASURING TESTING
Information Patent Application
PHOTON ENTANGLEMENT ROUTER
- Publication number 20170146407
- Publication date May 25, 2017
- GOVERNMENT OF THE UNITED STATES AS REPRESETNED BY THE SECRETARY OF THE AIR FORCE
- DAVID H. HUGHES
- G02 - OPTICS
Information Patent Application
Light Source with Controllable Linear Polarization
- Publication number 20170003170
- Publication date Jan 5, 2017
- Agilent Technologies
- Adam Kleczewski
- G02 - OPTICS
Information Patent Application
Multiple Wavelength Ellipsometer System and Related Method
- Publication number 20150219497
- Publication date Aug 6, 2015
- Film Sense, LLC
- Blaine D. Johs
- G01 - MEASURING TESTING
Information Patent Application
WAVEFRONT-DIVISION POLARIMETRIC ANALYSIS METHOD AND DEVICE, SPECTRO...
- Publication number 20150204724
- Publication date Jul 23, 2015
- HORIBA JOBIN YVON SAS
- Olivier Acher
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHODS FOR MEASURING MODE SPECTRA FOR ION-EXCHANGED...
- Publication number 20150116713
- Publication date Apr 30, 2015
- Corning Incorporated
- Rostislav Vatchev Roussev
- G02 - OPTICS
Information Patent Application
MEASURING POLARIZATION CROSSTALK IN OPTICAL BIREFRINGENT MATERIALS...
- Publication number 20130321818
- Publication date Dec 5, 2013
- GENERAL PHOTONICS CORPORATION
- XIAOTIAN STEVE YAO
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR POLARIZATION MEASUREMENT
- Publication number 20130010295
- Publication date Jan 10, 2013
- Yeda Research and Development Co. Ltd.
- Nir Davidson
- G01 - MEASURING TESTING
Information Patent Application
Circular Birefringence Refractometer: Method And Apparatus For Meas...
- Publication number 20100231911
- Publication date Sep 16, 2010
- Peer Fischer
- G01 - MEASURING TESTING
Information Patent Application
Imaging polarimeter sensor with achromatic beam-splitting polarizer
- Publication number 20050062966
- Publication date Mar 24, 2005
- Chungte W. Chen
- G01 - MEASURING TESTING
Information Patent Application
Apparatus for measuring state of polarization of a lightwave
- Publication number 20030075676
- Publication date Apr 24, 2003
- Bernard Ruchet
- G01 - MEASURING TESTING
Information Patent Application
System for measuring polarimetric spectrum and other properties of...
- Publication number 20020008874
- Publication date Jan 24, 2002
- Shing Lee
- G01 - MEASURING TESTING

Polarimeters of separated-field type Polarimeters of half-shadow type

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Polarization measuring device and method of fabricating semiconduct...

Single-shot Mueller matrix polarimeter

Imaging spectropolarimeter

Reflective metasurfaces for broadband terahertz linear-to-circular...

Optical gradation system and method

Hybrid systems and methods for characterizing stress in chemically...

Apparatus and methods for measuring mode spectra for ion-exchanged...

Antireflection film

Antireflection film and method for preparing same

Antireflection film and method for preparing same

Antireflection film

Polarization decorrelation time imaging

Systems and methods for thermal imaging of RF signals

Image processing device and image processing method

Short wave infrared polarimeter

Hyper-entangled photon server system and associated methods

Short wave infrared polarimeter

Apparatus and methods for measuring mode spectra for ion-exchanged...

Cavity enhanced polarimeter and related methods

Photon entanglement router

Intensity-independent optical computing device

Cavity enhanced polarimeter and related methods

Light source with controllable linear polarization

Wavefront-division polarimetric analysis method and device, spectro...

Polarization information acquisition unit, image pickup apparatus i...

Multiple wavelength ellipsometer system and related method

Measuring polarization crosstalk in optical birefringent materials...

System and method for polarization measurement

Circular birefringence refractometer: method and apparatus for meas...

System and method for setting and compensating errors in AOI and PO...

Patents Applicationslast 30 patents

MATRIX-BASED CHARACTERIZATION AND MEASUREMENTS FOR SEMICONDUCTOR TH...

POLARIZATION MEASURING DEVICE AND METHOD OF FABRICATING SEMICONDUCT...

SINGLE-SHOT MUELLER MATRIX POLARIMETER

OPTICAL GRADATION SYSTEM AND METHOD

HYBRID SYSTEMS AND METHODS FOR CHARACTERIZING STRESS IN CHEMICALLY...

Short Wave Infrared Polarimeter

APPARATUS AND METHODS FOR MEASURING MODE SPECTRA FOR ION-EXCHANGED...

Hyper-Entangled Photon Server System and Associated Methods

SHORT WAVE INFRARED POLARIMETER

POLARIZATION-SELECTIVE SCATTERING ANTENNA ARRAYS BASED POLARIMETER

PHOTON ENTANGLEMENT ROUTER

Light Source with Controllable Linear Polarization

Multiple Wavelength Ellipsometer System and Related Method

WAVEFRONT-DIVISION POLARIMETRIC ANALYSIS METHOD AND DEVICE, SPECTRO...

APPARATUS AND METHODS FOR MEASURING MODE SPECTRA FOR ION-EXCHANGED...

MEASURING POLARIZATION CROSSTALK IN OPTICAL BIREFRINGENT MATERIALS...

SYSTEM AND METHOD FOR POLARIZATION MEASUREMENT

Circular Birefringence Refractometer: Method And Apparatus For Meas...

Imaging polarimeter sensor with achromatic beam-splitting polarizer

Apparatus for measuring state of polarization of a lightwave

System for measuring polarimetric spectrum and other properties of...