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G01J2009/0261

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GPHYSICS G01Measuring instruments G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT COLORIMETRY RADIATION PYROMETRY

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G01J2009/0261polarised

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Patents Grantslast 30 patents

Information Patent Grant
Spectroscopic polarimeter and device for automatically adjusting op...
- Patent number 12,025,502
- Issue date Jul 2, 2024
- MGEN.CO., LTD
- Min Young Park
- G02 - OPTICS
Information Patent Grant
Metasurface imager for quantitative phase gradient detection
- Patent number 11,385,450
- Issue date Jul 12, 2022
- California Institute of Technology
- Hyounghan Kwon
- G01 - MEASURING TESTING
Information Patent Grant
Spectral phase interference device and system
- Patent number 11,029,209
- Issue date Jun 8, 2021
- Shenzhen University
- Shixiang Xu
- G01 - MEASURING TESTING
Information Patent Grant
Sine-cosine optical frequency encoder devices based on optical pola...
- Patent number 10,895,477
- Issue date Jan 19, 2021
- General Photonics Corporation
- Xiaotian Steve Yao
- G01 - MEASURING TESTING
Information Patent Grant
Light receiving device, method for fabricating light receiving device
- Patent number 10,823,610
- Issue date Nov 3, 2020
- Sumitomo Electric Industries, Ltd.
- Takamitsu Kitamura
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for determining wave characteristics using con...
- Patent number 10,274,378
- Issue date Apr 30, 2019
- Mesa Photonics, LLC
- Daniel James Kane
- G01 - MEASURING TESTING
Information Patent Grant
Color filter used with liquid-crystal polarization interferometer
- Patent number 10,175,116
- Issue date Jan 8, 2019
- Palo Alto Research Center Incorporated
- Alex Hegyi
- G02 - OPTICS
Information Patent Grant
Wavefront sensing apparatus, method and applications
- Patent number 9,500,531
- Issue date Nov 22, 2016
- University of Rochester
- Zhimin Shi
- G01 - MEASURING TESTING
Information Patent Grant
Apolarized interferometric system, and apolarized interferometric m...
- Patent number 8,953,169
- Issue date Feb 10, 2015
- IXBLUE
- Herve Lefevre
- G01 - MEASURING TESTING
Information Patent Grant
Wavelength shift measuring apparatus, optical source apparatus, int...
- Patent number 8,416,387
- Issue date Apr 9, 2013
- Canon Kabushiki Kaisha
- Ko Ishizuka
- G01 - MEASURING TESTING
Information Patent Grant
Scanning simultaneous phase-shifting interferometer
- Patent number 7,561,279
- Issue date Jul 14, 2009
- Engineering Synthesis Design, Inc.
- Raymond Castonguay
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for polarization-independent RF spectrum analy...
- Patent number 7,555,221
- Issue date Jun 30, 2009
- Alcatel-Lucent USA Inc.
- Christophe J Dorrer
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Polarising interferometer
- Patent number 7,525,665
- Issue date Apr 28, 2009
- Renishaw PLC
- William Ernest Lee
- G01 - MEASURING TESTING
Information Patent Grant
System and method for polarization characteristic measurement of op...
- Patent number 7,468,798
- Issue date Dec 23, 2008
- Canon Kabushiki Kaisha
- Yoshihiro Shiode
- G01 - MEASURING TESTING
Information Patent Grant
Elementary matrix based optical signal/network analyzer
- Patent number 7,466,425
- Issue date Dec 16, 2008
- Agilent Technologies, Inc.
- Bogdan Szafraniec
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for monitoring an interferometer
- Patent number 7,423,760
- Issue date Sep 9, 2008
- Agilent Technologies, Inc.
- Wolf Steffens
- G01 - MEASURING TESTING
Information Patent Grant
Scanning, self-referencing interferometer
- Patent number 7,420,688
- Issue date Sep 2, 2008
- The Boeing Company
- Douglas R. Jungwirth
- G01 - MEASURING TESTING
Information Patent Grant
Common-path point-diffraction phase-shifting interferometer
- Patent number 7,304,746
- Issue date Dec 4, 2007
- Interphase Technologies, Inc.
- William J. Cottrell
- G01 - MEASURING TESTING
Information Patent Grant
Interferometry systems and methods of using interferometry systems
- Patent number 7,280,223
- Issue date Oct 9, 2007
- Zygo Corporation
- Henry A. Hill
- G01 - MEASURING TESTING
Information Patent Grant
Interferometry systems and methods of using interferometry systems
- Patent number 7,280,224
- Issue date Oct 9, 2007
- Zygo Corporation
- Henry A. Hill
- G01 - MEASURING TESTING
Information Patent Grant
Differential interferometers creating desired beam patterns
- Patent number 7,212,290
- Issue date May 1, 2007
- Agilent Technologies, Inc.
- Kevin R. Fine
- G01 - MEASURING TESTING
Information Patent Grant
Differential interferometer with improved cyclic nonlinearity
- Patent number 7,196,797
- Issue date Mar 27, 2007
- Agilent Technologies, Inc.
- John J. Bockman
- G01 - MEASURING TESTING
Information Patent Grant
Fiber optic scanning interferometer using a polarization splitting...
- Patent number 7,136,167
- Issue date Nov 14, 2006
- Michael Failes
- G01 - MEASURING TESTING
Information Patent Grant
Common-path point-diffraction phase-shifting interferometer
- Patent number 7,106,456
- Issue date Sep 12, 2006
- Interphase Technologies, Inc.
- William J. Cottrell
- G01 - MEASURING TESTING
Information Patent Grant
Wavelength dispersion measuring apparatus and polarization dispersi...
- Patent number 5,995,228
- Issue date Nov 30, 1999
- Anritsu Corporation
- Akihito Otani
- G01 - MEASURING TESTING
Information Patent Grant
High efficiency polarization diversity receiver system
- Patent number 5,852,507
- Issue date Dec 22, 1998
- David B. Hall
- G01 - MEASURING TESTING
Information Patent Grant
Polarization interferometer apparatus using the polarization depend...
- Patent number 5,841,536
- Issue date Nov 24, 1998
- The United States of America as represented by the Director of the National S...
- Timothy E. Dimmick
- G01 - MEASURING TESTING
Information Patent Grant
Wide field of view coherent light detector and locator
- Patent number 5,838,441
- Issue date Nov 17, 1998
- The United States of America as represented by the National Security Agency
- Duane Satorius
- G01 - MEASURING TESTING
Information Patent Grant
Homodyne interferometric receiver and calibration method having imp...
- Patent number 5,663,793
- Issue date Sep 2, 1997
- Zygo Corporation
- Peter de Groot
- G01 - MEASURING TESTING
Information Patent Grant
Inspection method and apparatus for inspecting a particle, if any,...
- Patent number 5,486,919
- Issue date Jan 23, 1996
- Canon Kabushiki Kaisha
- Toshihiko Tsuji
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
METHOD AND SYSTEM FOR MEASURING THE CARRIER-ENVELOPE PHASE OFFSET O...
- Publication number 20240344892
- Publication date Oct 17, 2024
- Sphere Ultrafast Photonics, SA
- Chen Guo
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL WAVELENGTH MEASURING DEVICE USING ABSORPTION-TYPE OPTICAL F...
- Publication number 20240280412
- Publication date Aug 22, 2024
- GIST (Gwangju Institue of Science and Technology)
- Bok Hyeon KIM
- G01 - MEASURING TESTING
Information Patent Application
PHASE DIFFERENCE MEASURING DEVICE, BEAM OUTPUT APPARATUS AND PHASE...
- Publication number 20230152163
- Publication date May 18, 2023
- Mitsubishi Heavy Industries, Ltd.
- Koichi HAMAMOTO
- G02 - OPTICS
Information Patent Application
Entanglement-Enhanced Interferometers
- Publication number 20220373397
- Publication date Nov 24, 2022
- The Regents of the University of Colorado, a Body Corporate
- Juliet T. Gopinath
- G02 - OPTICS
Information Patent Application
Spectral Phase Interference Device and System
- Publication number 20200319032
- Publication date Oct 8, 2020
- Shenzhen University
- Shixiang XU
- G01 - MEASURING TESTING
Information Patent Application
WAVEFRONT SENSING APPARATUS, METHOD AND APPLICATIONS
- Publication number 20140285813
- Publication date Sep 25, 2014
- University of Rochester
- Zhimin Shi
- G01 - MEASURING TESTING
Information Patent Application
APOLARIZED INTERFEROMETRIC SYSTEM, AND APOLARIZED INTERFEROMETRIC M...
- Publication number 20130222810
- Publication date Aug 29, 2013
- Herve Lefevre
- G01 - MEASURING TESTING
Information Patent Application
WAVELENGTH SHIFT MEASURING APPARATUS, OPTICAL SOURCE APPARATUS, INT...
- Publication number 20100103403
- Publication date Apr 29, 2010
- Canon Kabushiki Kaisha
- Ko Ishizuka
- G01 - MEASURING TESTING
Information Patent Application
SCANNING SIMULTANEOUS PHASE-SHIFTING INTERFEROMETER
- Publication number 20080043224
- Publication date Feb 21, 2008
- Raymond Castonguay
- G01 - MEASURING TESTING
Information Patent Application
Polarising Interferometer
- Publication number 20070223005
- Publication date Sep 27, 2007
- William Ernest Lee
- G01 - MEASURING TESTING
Information Patent Application
Optical readhead
- Publication number 20070177157
- Publication date Aug 2, 2007
- RENISHAW PLC
- David Roberts McMurtry
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT METHOD
- Publication number 20070171427
- Publication date Jul 26, 2007
- Yoshihiro Shiode
- G01 - MEASURING TESTING
Information Patent Application
SCANNING, SELF-REFERENCING INTERFEROMETER
- Publication number 20070109547
- Publication date May 17, 2007
- THE BOEING COMPANY
- Douglas R. Jungwirth
- G01 - MEASURING TESTING
Information Patent Application
Common-path point-diffraction phase-shifting interferometer
- Publication number 20060274321
- Publication date Dec 7, 2006
- William J. Cottrell
- G01 - MEASURING TESTING
Information Patent Application
Elementary matrix based optical signal/network analyzer
- Publication number 20060238770
- Publication date Oct 26, 2006
- Bogdan Szafraniec
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for polarization-independent RF spectrum analy...
- Publication number 20060140638
- Publication date Jun 29, 2006
- Christophe J. Dorrer
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Interferometer monitoring
- Publication number 20060119857
- Publication date Jun 8, 2006
- Wolf Steffens
- G01 - MEASURING TESTING
Information Patent Application
Differential interferometers creating desired beam patterns
- Publication number 20060039005
- Publication date Feb 23, 2006
- Kevin R. Fine
- G01 - MEASURING TESTING
Information Patent Application
Differential interferometer with improved cyclic nonlinearity
- Publication number 20050264822
- Publication date Dec 1, 2005
- John J. Bockman
- G02 - OPTICS
Information Patent Application
Interferometry systems and methods of using interferometry systems
- Publication number 20050248772
- Publication date Nov 10, 2005
- Henry A. Hill
- G01 - MEASURING TESTING
Information Patent Application
Interferometry systems and methods of using interferometry systems
- Publication number 20050237536
- Publication date Oct 27, 2005
- Henry A. Hill
- G01 - MEASURING TESTING
Information Patent Application
Fiber optic scanning interferometer using a polarization splitting...
- Publication number 20050099633
- Publication date May 12, 2005
- Michael Failes
- G01 - MEASURING TESTING

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Spectroscopic polarimeter and device for automatically adjusting op...

Metasurface imager for quantitative phase gradient detection

Spectral phase interference device and system

Sine-cosine optical frequency encoder devices based on optical pola...

Light receiving device, method for fabricating light receiving device

Method and apparatus for determining wave characteristics using con...

Color filter used with liquid-crystal polarization interferometer

Wavefront sensing apparatus, method and applications

Apolarized interferometric system, and apolarized interferometric m...

Wavelength shift measuring apparatus, optical source apparatus, int...

Scanning simultaneous phase-shifting interferometer

Method and apparatus for polarization-independent RF spectrum analy...

Polarising interferometer

System and method for polarization characteristic measurement of op...

Elementary matrix based optical signal/network analyzer

Method and apparatus for monitoring an interferometer

Scanning, self-referencing interferometer

Common-path point-diffraction phase-shifting interferometer

Interferometry systems and methods of using interferometry systems

Interferometry systems and methods of using interferometry systems

Differential interferometers creating desired beam patterns

Differential interferometer with improved cyclic nonlinearity

Fiber optic scanning interferometer using a polarization splitting...

Common-path point-diffraction phase-shifting interferometer

Wavelength dispersion measuring apparatus and polarization dispersi...

High efficiency polarization diversity receiver system

Polarization interferometer apparatus using the polarization depend...

Wide field of view coherent light detector and locator

Homodyne interferometric receiver and calibration method having imp...

Inspection method and apparatus for inspecting a particle, if any,...

Patents Applicationslast 30 patents

METHOD AND SYSTEM FOR MEASURING THE CARRIER-ENVELOPE PHASE OFFSET O...

OPTICAL WAVELENGTH MEASURING DEVICE USING ABSORPTION-TYPE OPTICAL F...

PHASE DIFFERENCE MEASURING DEVICE, BEAM OUTPUT APPARATUS AND PHASE...

Entanglement-Enhanced Interferometers

Spectral Phase Interference Device and System

WAVEFRONT SENSING APPARATUS, METHOD AND APPLICATIONS

APOLARIZED INTERFEROMETRIC SYSTEM, AND APOLARIZED INTERFEROMETRIC M...

WAVELENGTH SHIFT MEASURING APPARATUS, OPTICAL SOURCE APPARATUS, INT...

SCANNING SIMULTANEOUS PHASE-SHIFTING INTERFEROMETER

Polarising Interferometer

Optical readhead

MEASUREMENT METHOD

SCANNING, SELF-REFERENCING INTERFEROMETER

Common-path point-diffraction phase-shifting interferometer

Elementary matrix based optical signal/network analyzer

Method and apparatus for polarization-independent RF spectrum analy...

Interferometer monitoring

Differential interferometers creating desired beam patterns

Differential interferometer with improved cyclic nonlinearity

Interferometry systems and methods of using interferometry systems

Interferometry systems and methods of using interferometry systems

Fiber optic scanning interferometer using a polarization splitting...