Probe manufacture

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G01Q70/16

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GPHYSICS G01Measuring instruments G01QSCANNING-PROBE TECHNIQUES OR APPARATUS APPLICATIONS OF SCANNING-PROBE TECHNIQUES G01Q70/00General aspects of SPM probes, their manufacture or their related instrumentation, insofar as they are not specially adapted to a single SPM technique covered by group G01Q60/00

Current Industry

G01Q70/16Probe manufacture

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Nano robotic system for high throughput single cell DNA sequencing
- Patent number 12,163,979
- Issue date Dec 10, 2024
- Versitech Limited
- Ning Xi
- C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information Patent Grant
Micro probe array device and manufacturing method of the device
- Patent number 12,109,409
- Issue date Oct 8, 2024
- Industry-Academic Cooperation Foundation, Dankook University
- Jae-Hyoung Park
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Method of providing a MEMS device comprising a pyramidal protrusion...
- Patent number 12,013,415
- Issue date Jun 18, 2024
- SmartTip B.V.
- Edin Sarajlic
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Methods and devices for extending a time period until changing a me...
- Patent number 11,977,097
- Issue date May 7, 2024
- Carl Zeiss SMT GmbH
- Gabriel Baralia
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Metrology probe with built-in angle and method of fabrication thereof
- Patent number 11,719,719
- Issue date Aug 8, 2023
- Bruker Nano, Inc.
- Jeffrey Wong
- G01 - MEASURING TESTING
Information Patent Grant
Probe, method of manufacturing a probe and scanning probe microscop...
- Patent number 11,698,389
- Issue date Jul 11, 2023
- Nederlandse Organisatie voor toegepast-natuurwetenschappelijk onderzoek TNO
- Roelof Willem Herfst
- G01 - MEASURING TESTING
Information Patent Grant
Method for providing a probe device for scanning probe microscopy
- Patent number 11,480,588
- Issue date Oct 25, 2022
- Nanotools GmbH
- Bernd Irmer
- G01 - MEASURING TESTING
Information Patent Grant
Scanning probe and electron microscope probes and their manufacture
- Patent number 11,237,188
- Issue date Feb 1, 2022
- Tiptek, LLC
- Joseph W. Lyding
- G01 - MEASURING TESTING
Information Patent Grant
Scanning probe and electron microscope probes and their manufacture
- Patent number 11,169,177
- Issue date Nov 9, 2021
- Tiptek, LLC
- Joseph W. Lyding
- G01 - MEASURING TESTING
Information Patent Grant
Probe and manufacturing method of probe for scanning probe microscope
- Patent number 11,125,775
- Issue date Sep 21, 2021
- Kioxia Corporation
- See Kei Lee
- G01 - MEASURING TESTING
Information Patent Grant
Sharpening method for probe tip of atomic force microscope (AFM)
- Patent number 11,016,120
- Issue date May 25, 2021
- YANSHAN UNIVERSITY
- Jianchao Chen
- G01 - MEASURING TESTING
Information Patent Grant
Probe assembly and testing device
- Patent number 10,782,314
- Issue date Sep 22, 2020
- BOE Technology Group Co., Ltd.
- Pijian Cheng
- G01 - MEASURING TESTING
Information Patent Grant
Methods for designing and processing a microcantilever-based probe...
- Patent number 10,739,379
- Issue date Aug 11, 2020
- Southwest Jiaotong University
- Linmao Qian
- G01 - MEASURING TESTING
Information Patent Grant
Cantilever and manufacturing method for cantilever
- Patent number 10,545,172
- Issue date Jan 28, 2020
- National University Corporation Nagoya Institute of Technology
- Masaki Tanemura
- B05 - SPRAYING OR ATOMISING IN GENERAL APPLYING LIQUIDS OR OTHER FLUENT MATER...
Information Patent Grant
Measuring device for a scanning probe microscope, scanning probe mi...
- Patent number 10,539,591
- Issue date Jan 21, 2020
- Bruker Nano GmbH
- Detlef Knebel
- G01 - MEASURING TESTING
Information Patent Grant
Nanoprocessing and heterostructuring of silk
- Patent number 10,493,558
- Issue date Dec 3, 2019
- Indian Institute of Science Education and Research
- Kamal Priya Singh
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Method for manufacturing microcantilever
- Patent number 10,202,276
- Issue date Feb 12, 2019
- Industry-University Cooperation Foundation Sogang University
- Jung Chul Lee
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Scanning probe and electron microscope probes and their manufacture
- Patent number 10,060,948
- Issue date Aug 28, 2018
- Tiptek, LLC
- Joseph W. Lyding
- G01 - MEASURING TESTING
Information Patent Grant
Forming nanotips
- Patent number 9,966,253
- Issue date May 8, 2018
- International Business Machines Corporation
- Kangguo Cheng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Miniaturized cantilever probe for scanning probe microscopy and fab...
- Patent number 9,709,597
- Issue date Jul 18, 2017
- Bruker Nano, Inc.
- Weijie Wang
- G01 - MEASURING TESTING
Information Patent Grant
Probe configuration and method of fabrication thereof
- Patent number 9,612,258
- Issue date Apr 4, 2017
- IMEC
- Thomas Hantschel
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Methods and apparatus to detect a conductive object
- Patent number 9,612,265
- Issue date Apr 4, 2017
- Cypress Semiconductor Corporation
- Oleksandr Hoshtanar
- G01 - MEASURING TESTING
Information Patent Grant
Iridium tip, gas field ion source, focused ion beam apparatus, elec...
- Patent number 9,583,299
- Issue date Feb 28, 2017
- Hitachi High-Tech Science Corporation
- Tomokazu Kozakai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Hybrid microprobe for electrochemical and SERS monitoring, scanning...
- Patent number 9,519,006
- Issue date Dec 13, 2016
- Seoul National University R&DB Foundation
- Taek Dong Chung
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Probe unit for test tools and method of manufacturing the same
- Patent number 9,465,048
- Issue date Oct 11, 2016
- Inotera Memories, Inc.
- Wei-Chih Wang
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Method for making a 3D nanostructure having a nanosubstructure, and...
- Patent number 9,416,001
- Issue date Aug 16, 2016
- Universiteit Twente
- Johan Willem Berenschot
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Vertical embedded sensor and process of manufacturing thereof
- Patent number 9,389,244
- Issue date Jul 12, 2016
- Applied Nanostructures, Inc.
- Jeremy J. Goeckeritz
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Transferable probe tips
- Patent number 9,200,883
- Issue date Dec 1, 2015
- International Business Machines Corporation
- Paul S. Andry
- G01 - MEASURING TESTING
Information Patent Grant
Laser-enhanced chemical etching of nanotips
- Patent number 9,128,117
- Issue date Sep 8, 2015
- GLOBALFOUNDRIES Singapore Pte. Ltd.
- ZhiHong Mai
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Measurement of surface energy components and wettability of reservo...
- Patent number 9,110,094
- Issue date Aug 18, 2015
- Schlumberger Technology Corporation
- Ahmed Gmira
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Method For Producing A Substrate Comprising Scanning Probe Microsco...
- Publication number 20250067771
- Publication date Feb 27, 2025
- IMEC vzw
- Thomas Hantschel
- G01 - MEASURING TESTING
Information Patent Application
Atomic Force Microscopy Probe with Tilted Tip and Method of Fabrica...
- Publication number 20250052781
- Publication date Feb 13, 2025
- Bruker Nano, Inc.
- Jeffrey Wong
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF AND SYSTEM FOR REFURBISHING A PROBE FOR USE IN A SCANNING...
- Publication number 20240288468
- Publication date Aug 29, 2024
- Nearfield Instruments B.V.
- Hamed SADEGHIAN MARNANI
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND DEVICES FOR EXTENDING A TIME PERIOD UNTIL CHANGING A ME...
- Publication number 20240272198
- Publication date Aug 15, 2024
- Carl Zeiss SMT GMBH
- Gabriel Baralia
- G01 - MEASURING TESTING
Information Patent Application
Method for processing a measuring probe for recording surface prope...
- Publication number 20240241152
- Publication date Jul 18, 2024
- HELMHOLTZ-ZENTRUM BERLIN FÜR MATERIALIEN UND ENERGIE GMBH
- Christopher Seiji KLEY
- G01 - MEASURING TESTING
Information Patent Application
Method for Producing a Substrate Comprising Multiple Tips for Scann...
- Publication number 20240175896
- Publication date May 30, 2024
- IMEC vzw
- Thomas Hantschel
- G01 - MEASURING TESTING
Information Patent Application
A Method of Manufacturing a MEMS Device
- Publication number 20230416080
- Publication date Dec 28, 2023
- Cytosurge AG
- Edin SARAJLIC
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
NANO ROBOTIC SYSTEM FOR HIGH THROUGHPUT SINGLE CELL DNA SEQUENCING
- Publication number 20230358782
- Publication date Nov 9, 2023
- Versitech Limited
- Ning Xi
- C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information Patent Application
Detection Device for Scanning Probe Microscope
- Publication number 20230184809
- Publication date Jun 15, 2023
- Vmicro
- Benjamin WALTER
- G01 - MEASURING TESTING
Information Patent Application
PROBE, METHOD OF MANUFACTURING A PROBE AND SCANNING PROBE MICROSCOP...
- Publication number 20230160924
- Publication date May 25, 2023
- NEDERLANDSE ORGANISATIE VOOR TOEGEPAST- NATUURWETENSCHAPPELIJK ONDERZOEK TNO
- Roelof Willem HERFST
- G01 - MEASURING TESTING
Information Patent Application
A DIAMOND SCANNING ELEMENT, ESPECIALLY FOR IMAGING APPLICATION, AND...
- Publication number 20230113008
- Publication date Apr 13, 2023
- UNIVERSITAT BASEL
- Brendan SHIELDS
- C30 - CRYSTAL GROWTH
Information Patent Application
A METHOD OF PROVIDING A MEMS DEVICE COMPRISING A PYRAMIDAL PROTRUSI...
- Publication number 20220187336
- Publication date Jun 16, 2022
- SMARTTIP B.V.
- Edin SARAJLIC
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
Scanning Probe and Electron Microscope Probes and Their Manufacture
- Publication number 20220128595
- Publication date Apr 28, 2022
- Tiptek, LLC
- Joseph W. Lyding
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR PROVIDING A PROBE DEVICE FOR SCANNING PROBE MICROSCOPY
- Publication number 20210318351
- Publication date Oct 14, 2021
- NANOTOOLS GMBH
- Bernd Irmer
- G01 - MEASURING TESTING
Information Patent Application
MICRO PROBE ARRAY DEVICE AND MANUFACTURING METHOD OF THE DEVICE
- Publication number 20210311092
- Publication date Oct 7, 2021
- Industry-Academic Cooperation Foundation, Dankook University
- Jae-Hyoung Park
- G01 - MEASURING TESTING
Information Patent Application
PROBE AND MANUFACTURING METHOD OF PROBE FOR SCANNING PROBE MICROSCOPE
- Publication number 20210278437
- Publication date Sep 9, 2021
- KIOXIA Corporation
- See Kei LEE
- G01 - MEASURING TESTING
Information Patent Application
SHARPENING METHOD FOR PROBE TIP OF ATOMIC FORCE MICROSCOPE (AFM)
- Publication number 20210096153
- Publication date Apr 1, 2021
- Yanshan University
- Jianchao CHEN
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR PROVIDING A PROBE DEVICE FOR SCANNING PROBE MICROSCOPY
- Publication number 20200341028
- Publication date Oct 29, 2020
- NANOTOOLS GMBH
- Bernd Irmer
- G01 - MEASURING TESTING
Information Patent Application
Scanning Probe and Electron Microscope Probes and Their Manufacture
- Publication number 20190219611
- Publication date Jul 18, 2019
- Joseph W. Lyding
- G01 - MEASURING TESTING
Information Patent Application
METHODS FOR DESIGNING AND PROCESSING A MICROCANTILEVER-BASED PROBE...
- Publication number 20190204353
- Publication date Jul 4, 2019
- Southwest Jiaotong University
- Linmao QIAN
- G01 - MEASURING TESTING
Information Patent Application
Measuring Device for a Scanning Probe Microscope, Scanning Probe Mi...
- Publication number 20190170789
- Publication date Jun 6, 2019
- BRUKER NANO GMBH
- Detlef Knebel
- G01 - MEASURING TESTING
Information Patent Application
PROBE ASSEMBLY AND TESTING DEVICE
- Publication number 20190064212
- Publication date Feb 28, 2019
- BOE TECHNOLOGY GROUP CO., LTD.
- Pijian CHENG
- G01 - MEASURING TESTING
Information Patent Application
CANTILEVER AND MANUFACTURING METHOD FOR CANTILEVER
- Publication number 20190018042
- Publication date Jan 17, 2019
- National University Corporation Nagoya Institute of Technology
- Masaki TANEMURA
- B05 - SPRAYING OR ATOMISING IN GENERAL APPLYING LIQUIDS OR OTHER FLUENT MATER...
Information Patent Application
NANOPROCESSING AND HETEROSTRUCTURING OF SILK
- Publication number 20180354066
- Publication date Dec 13, 2018
- Indian Institute of Science Education and Research
- Kamal Priya SINGH
- B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information Patent Application
Scanning Probe and Electron Microscope Probes and Their Manufacture
- Publication number 20180328960
- Publication date Nov 15, 2018
- Tiptek, LLC
- Joseph W. Lyding
- G01 - MEASURING TESTING
Information Patent Application
MULTIFUNCTIONAL GRAPHENE COATED SCANNING TIPS
- Publication number 20150309073
- Publication date Oct 29, 2015
- Northwestern University
- Chad A. Mirkin
- G01 - MEASURING TESTING
Information Patent Application
PROBE CONFIGURATION AND METHOD OF FABRICATION THEREOF
- Publication number 20150185249
- Publication date Jul 2, 2015
- IMEC
- Thomas HANTSCHEL
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR MAKING A 3D NANOSTRUCTURE HAVING A NANOSUBSTRUCTURE, AND...
- Publication number 20150158724
- Publication date Jun 11, 2015
- Universiteit Twente
- Johan Willem Berenschot
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
MINIATURIZED CANTILEVER PROBE FOR SCANNING PROBE MICROSCOPY AND FAB...
- Publication number 20140366230
- Publication date Dec 11, 2014
- Weijie Wang
- G01 - MEASURING TESTING
Information Patent Application
Vertical Embedded Sensor and Process of Manufacturing Thereof
- Publication number 20140338075
- Publication date Nov 13, 2014
- APPLIED NANOSTRUCTURES, INC.
- Jeremy J. Goeckeritz
- B82 - NANO-TECHNOLOGY

Probe manufacture

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Nano robotic system for high throughput single cell DNA sequencing

Micro probe array device and manufacturing method of the device

Method of providing a MEMS device comprising a pyramidal protrusion...

Methods and devices for extending a time period until changing a me...

Metrology probe with built-in angle and method of fabrication thereof

Probe, method of manufacturing a probe and scanning probe microscop...

Method for providing a probe device for scanning probe microscopy

Scanning probe and electron microscope probes and their manufacture

Scanning probe and electron microscope probes and their manufacture

Probe and manufacturing method of probe for scanning probe microscope

Sharpening method for probe tip of atomic force microscope (AFM)

Probe assembly and testing device

Methods for designing and processing a microcantilever-based probe...

Cantilever and manufacturing method for cantilever

Measuring device for a scanning probe microscope, scanning probe mi...

Nanoprocessing and heterostructuring of silk

Method for manufacturing microcantilever

Scanning probe and electron microscope probes and their manufacture

Forming nanotips

Miniaturized cantilever probe for scanning probe microscopy and fab...

Probe configuration and method of fabrication thereof

Methods and apparatus to detect a conductive object

Iridium tip, gas field ion source, focused ion beam apparatus, elec...

Hybrid microprobe for electrochemical and SERS monitoring, scanning...

Probe unit for test tools and method of manufacturing the same

Method for making a 3D nanostructure having a nanosubstructure, and...

Vertical embedded sensor and process of manufacturing thereof

Transferable probe tips

Laser-enhanced chemical etching of nanotips

Measurement of surface energy components and wettability of reservo...

Patents Applicationslast 30 patents

Method For Producing A Substrate Comprising Scanning Probe Microsco...

Atomic Force Microscopy Probe with Tilted Tip and Method of Fabrica...

METHOD OF AND SYSTEM FOR REFURBISHING A PROBE FOR USE IN A SCANNING...

METHODS AND DEVICES FOR EXTENDING A TIME PERIOD UNTIL CHANGING A ME...

Method for processing a measuring probe for recording surface prope...

Method for Producing a Substrate Comprising Multiple Tips for Scann...

A Method of Manufacturing a MEMS Device

NANO ROBOTIC SYSTEM FOR HIGH THROUGHPUT SINGLE CELL DNA SEQUENCING

Detection Device for Scanning Probe Microscope

PROBE, METHOD OF MANUFACTURING A PROBE AND SCANNING PROBE MICROSCOP...

A DIAMOND SCANNING ELEMENT, ESPECIALLY FOR IMAGING APPLICATION, AND...

A METHOD OF PROVIDING A MEMS DEVICE COMPRISING A PYRAMIDAL PROTRUSI...

Scanning Probe and Electron Microscope Probes and Their Manufacture

METHOD FOR PROVIDING A PROBE DEVICE FOR SCANNING PROBE MICROSCOPY

MICRO PROBE ARRAY DEVICE AND MANUFACTURING METHOD OF THE DEVICE

PROBE AND MANUFACTURING METHOD OF PROBE FOR SCANNING PROBE MICROSCOPE

SHARPENING METHOD FOR PROBE TIP OF ATOMIC FORCE MICROSCOPE (AFM)

METHOD FOR PROVIDING A PROBE DEVICE FOR SCANNING PROBE MICROSCOPY

Scanning Probe and Electron Microscope Probes and Their Manufacture

METHODS FOR DESIGNING AND PROCESSING A MICROCANTILEVER-BASED PROBE...

Measuring Device for a Scanning Probe Microscope, Scanning Probe Mi...

PROBE ASSEMBLY AND TESTING DEVICE

CANTILEVER AND MANUFACTURING METHOD FOR CANTILEVER

NANOPROCESSING AND HETEROSTRUCTURING OF SILK

Scanning Probe and Electron Microscope Probes and Their Manufacture

MULTIFUNCTIONAL GRAPHENE COATED SCANNING TIPS

PROBE CONFIGURATION AND METHOD OF FABRICATION THEREOF

METHOD FOR MAKING A 3D NANOSTRUCTURE HAVING A NANOSUBSTRUCTURE, AND...

MINIATURIZED CANTILEVER PROBE FOR SCANNING PROBE MICROSCOPY AND FAB...

Vertical Embedded Sensor and Process of Manufacturing Thereof