Probe tip arrays

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CPC
G01Q70/06

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Parent Industries

GPHYSICS G01Measuring instruments G01QSCANNING-PROBE TECHNIQUES OR APPARATUS APPLICATIONS OF SCANNING-PROBE TECHNIQUES G01Q70/00General aspects of SPM probes, their manufacture or their related instrumentation, insofar as they are not specially adapted to a single SPM technique covered by group G01Q60/00

Current Industry

G01Q70/06Probe tip arrays

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Micro probe array device and manufacturing method of the device
- Patent number 12,109,409
- Issue date Oct 8, 2024
- Industry-Academic Cooperation Foundation, Dankook University
- Jae-Hyoung Park
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Rugged, single crystal wide-band-gap-material scanning-tunneling-mi...
- Patent number 12,078,654
- Issue date Sep 3, 2024
- Steven R. J. Brueck
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Cantilever, ultrasound acoustic microscopy device comprising the ca...
- Patent number 11,927,564
- Issue date Mar 12, 2024
- Nederlandse Organisatie voor toegepast-natuurwetenschappelijk onderzoek TNO
- Maarten Hubertus Van Es
- G01 - MEASURING TESTING
Information Patent Grant
Probe for scanning probe microscope and binary state scanning probe...
- Patent number 11,860,188
- Issue date Jan 2, 2024
- Industry-Academic Cooperation Foundation, Yonsei University
- Wooyoung Shim
- G01 - MEASURING TESTING
Information Patent Grant
Integrated dual-probe rapid in-situ switching measurement method an...
- Patent number 11,789,037
- Issue date Oct 17, 2023
- Shenyang Institute of Automation, Chinese Academy of Sciences
- Lianqing Liu
- G01 - MEASURING TESTING
Information Patent Grant
Device and method for analyzing a defect of a photolithographic mas...
- Patent number 11,733,186
- Issue date Aug 22, 2023
- Carl Zeiss SMT GmbH
- Gabriel Baralia
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for examining a measuring tip of a scanning pr...
- Patent number 11,680,963
- Issue date Jun 20, 2023
- Carl Zeiss SMT GmbH
- Kinga Kornilov
- G01 - MEASURING TESTING
Information Patent Grant
Probe card for characterizing processes of submicron semiconductor...
- Patent number 11,579,171
- Issue date Feb 14, 2023
- Meta Platforms Technologies, LLC
- Christopher Percival
- G02 - OPTICS
Information Patent Grant
Systems and methods for manufacturing nano-electro-mechanical-syste...
- Patent number 11,573,247
- Issue date Feb 7, 2023
- Xallent INC.
- Kwame Amponsah
- G01 - MEASURING TESTING
Information Patent Grant
Array atomic force microscopy for enabling simultaneous multi-point...
- Patent number 11,287,444
- Issue date Mar 29, 2022
- The Regents of the University of California
- Ratneshwar Lal
- G01 - MEASURING TESTING
Information Patent Grant
Method of and atomic force microscopy system for performing subsurf...
- Patent number 11,268,935
- Issue date Mar 8, 2022
- Nederlandse Organisatie voor toegepast-natuurwetenschappelijk onderzoek TNO
- Daniele Piras
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for examining a measuring tip of a scanning pr...
- Patent number 11,237,187
- Issue date Feb 1, 2022
- Carl Zeiss SMT GmbH
- Kinga Kornilov
- G01 - MEASURING TESTING
Information Patent Grant
Photodetector for scanning probe microscope
- Patent number 11,169,176
- Issue date Nov 9, 2021
- JERUSALEM COLLEGE OF TECHNOLOGY (JCT), LEV ACADEMIC CENTER
- Zeev Zalevsky
- G01 - MEASURING TESTING
Information Patent Grant
Assembly for detecting the intensity distribution of components of...
- Patent number 11,162,976
- Issue date Nov 2, 2021
- Norik Janunts
- G01 - MEASURING TESTING
Information Patent Grant
Scanning probe microscope using sensor molecules to improve photo-i...
- Patent number 11,150,267
- Issue date Oct 19, 2021
- MOLECULAR VISTA, INC.
- Thomas R. Albrecht
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for manufacturing nano-electro-mechanical-syste...
- Patent number 11,125,774
- Issue date Sep 21, 2021
- Xallent LLC
- Kwame Amponsah
- G01 - MEASURING TESTING
Information Patent Grant
Method for producing a probe suitable for scanning probe microscopy
- Patent number 11,035,880
- Issue date Jun 15, 2021
- Imec VZW
- Thomas Hantschel
- G01 - MEASURING TESTING
Information Patent Grant
Atomic force microscopy system, method for mapping one or more subs...
- Patent number 11,035,878
- Issue date Jun 15, 2021
- Nederlandse Organisatie voor toegepast-natuurwetenschappelijk onderzoek TNO
- Laurent Fillinger
- G01 - MEASURING TESTING
Information Patent Grant
Rugged, single crystal wide-band-gap-material scanning-tunneling-mi...
- Patent number 11,002,758
- Issue date May 11, 2021
- Steven R. J. Brueck
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method of positioning probe tips relative to pads
- Patent number 10,996,239
- Issue date May 4, 2021
- MPI CORPORATION
- Ingo Berg
- G01 - MEASURING TESTING
Information Patent Grant
Device and method for analysing a defect of a photolithographic mas...
- Patent number 10,983,075
- Issue date Apr 20, 2021
- Carl Zeiss SMT GmbH
- Gabriel Baralia
- G01 - MEASURING TESTING
Information Patent Grant
Device and method for measuring and/or modifying surface features o...
- Patent number 10,908,179
- Issue date Feb 2, 2021
- NEDERLANDSK ORGANISATIE VOOR TOEGEPAST-NATUURWETENSCHAPPELIJK ONDERZOEK TNO
- Hamed Sadeghian Marnani
- G01 - MEASURING TESTING
Information Patent Grant
Multiple integrated tips scanning probe microscope
- Patent number 10,895,585
- Issue date Jan 19, 2021
- Xallent, LLC
- Kwame Amponsah
- G01 - MEASURING TESTING
Information Patent Grant
Integrated measurement and micromechanical positioning apparatus fo...
- Patent number 10,828,785
- Issue date Nov 10, 2020
- Sensapex Oy
- Mikko Vähäsöyrinki
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Apparatus and methods for non-destructive inspection using microwav...
- Patent number 10,823,757
- Issue date Nov 3, 2020
- BOMBARDIER INC.
- Leandro Rufail
- G01 - MEASURING TESTING
Information Patent Grant
Method of fabricating nano-scale structures on the edge and nano-sc...
- Patent number 10,782,313
- Issue date Sep 22, 2020
- Hangzhou Tanzhen Nanotech. Co., Ltd.
- Shuo Zheng
- G01 - MEASURING TESTING
Information Patent Grant
Multiple integrated tips scanning probe microscope with pre-alignme...
- Patent number 10,663,484
- Issue date May 26, 2020
- Xallent, LLC
- Kwame Amponsah
- G01 - MEASURING TESTING
Information Patent Grant
Alignment system and method
- Patent number 10,663,874
- Issue date May 26, 2020
- Nederlandse Organisatie voor toegepast-natuurwetenschappelijk onderzoek TNO
- Hamed Sadeghian Marnani
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Coupled multiscale positioning of arrays of parallel, independently...
- Patent number 10,649,003
- Issue date May 12, 2020
- Board of Regents, The University of Texas System
- Michael A. Cullinan
- G01 - MEASURING TESTING
Information Patent Grant
Multiple integrated tips scanning probe microscope
- Patent number 10,613,115
- Issue date Apr 7, 2020
- Xallent, LLC
- Kwame Amponsah
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
RUGGED, SINGLE CRYSTAL WIDE-BAND-GAP-MATERIAL SCANNING-TUNNELING-MI...
- Publication number 20240402216
- Publication date Dec 5, 2024
- UNM Rainforest Innovations
- Steven R.J. BRUECK
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
LIGHTING SYSTEM FOR MULTI-PROBE MICROSCOPE
- Publication number 20240369595
- Publication date Nov 7, 2024
- INFINITESIMA LIMITED
- Andrew Humphris
- G01 - MEASURING TESTING
Information Patent Application
Method for Producing a Substrate Comprising Multiple Tips for Scann...
- Publication number 20240175896
- Publication date May 30, 2024
- IMEC vzw
- Thomas Hantschel
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR MANUFACTURING NANO-ELECTRO-MECHANICAL-SYSTE...
- Publication number 20230143037
- Publication date May 11, 2023
- Xallent Inc.
- Kwame Amponsah
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED DUAL-PROBE RAPID IN-SITU SWITCHING MEASUREMENT METHOD AN...
- Publication number 20230019239
- Publication date Jan 19, 2023
- Shenyang Institute of Automation, Chinese Academy of Sciences
- Lianqing LIU
- G01 - MEASURING TESTING
Information Patent Application
Probe for Scanning Probe Microscope and Binary State Scanning Probe...
- Publication number 20220308086
- Publication date Sep 29, 2022
- Industry-Academic Cooperation Foundation, Yonsei University
- Wooyoung Shim
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR EXAMINING A MEASURING TIP OF A SCANNING PR...
- Publication number 20220107340
- Publication date Apr 7, 2022
- Carl Zeiss SMT GMBH
- Kinga Kornilov
- G01 - MEASURING TESTING
Information Patent Application
ARRAY ATOMIC FORCE MICROSCOPY FOR ENABLING SIMULTANEOUS MULTI-POINT...
- Publication number 20210396783
- Publication date Dec 23, 2021
- The Regents of the University of California
- Ratneshwar Lal
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR MANUFACTURING NANO-ELECTRO-MECHANICAL-SYSTE...
- Publication number 20210389346
- Publication date Dec 16, 2021
- Xallent LLC
- Kwame Amponsah
- G01 - MEASURING TESTING
Information Patent Application
MICRO PROBE ARRAY DEVICE AND MANUFACTURING METHOD OF THE DEVICE
- Publication number 20210311092
- Publication date Oct 7, 2021
- Industry-Academic Cooperation Foundation, Dankook University
- Jae-Hyoung Park
- G01 - MEASURING TESTING
Information Patent Application
PHOTODETECTOR FOR SCANNING PROBE MICROSCOPE
- Publication number 20210278435
- Publication date Sep 9, 2021
- Bar-llan University
- Zeev ZALEVSKY
- G01 - MEASURING TESTING
Information Patent Application
RUGGED, SINGLE CRYSTAL WIDE-BAND-GAP-MATERIAL SCANNING-TUNNELING-MI...
- Publication number 20210263069
- Publication date Aug 26, 2021
- UNM Rainforest Innovations
- Steven R.J. BRUECK
- B82 - NANO-TECHNOLOGY
Information Patent Application
Assembly for Detecting the Intensity Distribution of Components of...
- Publication number 20210263070
- Publication date Aug 26, 2021
- Norik JANUNTS
- G01 - MEASURING TESTING
Information Patent Application
SCANNING PROBE MICROSCOPE USING SENSOR MOLECULES TO IMPROVE PHOTO-I...
- Publication number 20210208181
- Publication date Jul 8, 2021
- MOLECULAR VISTA, INC.
- Thomas R. ALBRECHT
- G01 - MEASURING TESTING
Information Patent Application
ATOMIC FORCE MICROSCOPY SYSTEM, METHOD FOR MAPPING ONE OR MORE SUBS...
- Publication number 20200309816
- Publication date Oct 1, 2020
- NEDERLANDSE ORGANISATIE VOOR TOEGEPAST- NATUURWETENSCHAPPELIJK ONDERZOEK TNO
- Laurent FILLINGER
- G01 - MEASURING TESTING
Information Patent Application
Method for Producing a Probe Suitable for Scanning Probe Microscopy
- Publication number 20200278379
- Publication date Sep 3, 2020
- IMEC vzw
- Thomas Hantschel
- G01 - MEASURING TESTING
Information Patent Application
MULTIPLE INTEGRATED TIPS SCANNING PROBE MICROSCOPE
- Publication number 20200191827
- Publication date Jun 18, 2020
- Xallent, LLC
- Kwame Amponsah
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR EXAMINING A MEASURING TIP OF A SCANNING PR...
- Publication number 20200141972
- Publication date May 7, 2020
- Carl Zeiss SMT GMBH
- Kinga Kornilov
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF AND ATOMIC FORCE MICROSCOPY SYSTEM FOR PERFORMING SUBSURF...
- Publication number 20200057028
- Publication date Feb 20, 2020
- NEDERLANDSE ORGANISATIE VOOR TOEGEPAST- NATUURWETENSCHAPPELIJK ONDERZOEK TNO
- Daniele Piras
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR MANUFACTURING NANO-ELECTRO-MECHANICAL-SYSTE...
- Publication number 20190383856
- Publication date Dec 19, 2019
- Xallent LLC
- Kwame Amponsah
- G01 - MEASURING TESTING
Information Patent Application
MULTIPLE INTEGRATED TIPS SCANNING PROBE MICROSCOPE WITH PRE-ALIGNME...
- Publication number 20190250186
- Publication date Aug 15, 2019
- Xallent, LLC
- Kwame Amponsah
- G01 - MEASURING TESTING
Information Patent Application
MULTIPLE INTEGRATED TIPS SCANNING PROBE MICROSCOPE
- Publication number 20190128919
- Publication date May 2, 2019
- Xallent, LLC
- Kwame Amponsah
- G01 - MEASURING TESTING
Information Patent Application
RUGGED, SINGLE CRYSTAL WIDE-BAND-GAP-MATERIAL SCANNING-TUNNELING-MI...
- Publication number 20190120873
- Publication date Apr 25, 2019
- STC.UNM
- Steven R.J. BRUECK
- B82 - NANO-TECHNOLOGY
Information Patent Application
Integrated measurement and micromechanical positioning apparatus fo...
- Publication number 20190077024
- Publication date Mar 14, 2019
- SENSAPEX OY
- Mikko VÄHÄSÖYRINKI
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
SCANNING PROBE MICROSCOPE
- Publication number 20190064211
- Publication date Feb 28, 2019
- Oxford Instruments Asylum Research, Inc.
- David A. Grigg
- G01 - MEASURING TESTING
Information Patent Application
MOTION SENSOR INTEGRATED NANO-PROBE N/MEMS APPARATUS, METHOD, AND A...
- Publication number 20190018039
- Publication date Jan 17, 2019
- Cornell University
- Amit Lal
- G01 - MEASURING TESTING
Information Patent Application
METROLOGY DEVICES AND METHODS FOR INDEPENDENTLY CONTROLLING A PLURA...
- Publication number 20180321276
- Publication date Nov 8, 2018
- Michael Cullinan
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF FABRICATING NANO-SCALE STRUCTURES ON THE EDGE AND NANO-SC...
- Publication number 20180217182
- Publication date Aug 2, 2018
- Shuo ZHENG
- G01 - MEASURING TESTING
Information Patent Application
ELECTRICAL CONTACT AUTO-ALIGNMENT STRATEGY FOR HIGHLY PARALLEL PEN...
- Publication number 20180217183
- Publication date Aug 2, 2018
- TERA-print, LLC
- Andrey IVANKIN
- G01 - MEASURING TESTING
Information Patent Application
COMPACT PROBE FOR ATOMIC-FORCE MICROSCOPY AND ATOMIC-FORCE MICROSCO...
- Publication number 20180203037
- Publication date Jul 19, 2018
- CENTRE NATIONAL DE LA RECHERCHE SCIENTIFIQUE
- Benjamin WALTER
- G01 - MEASURING TESTING

Probe tip arrays

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Micro probe array device and manufacturing method of the device

Rugged, single crystal wide-band-gap-material scanning-tunneling-mi...

Cantilever, ultrasound acoustic microscopy device comprising the ca...

Probe for scanning probe microscope and binary state scanning probe...

Integrated dual-probe rapid in-situ switching measurement method an...

Device and method for analyzing a defect of a photolithographic mas...

Method and apparatus for examining a measuring tip of a scanning pr...

Probe card for characterizing processes of submicron semiconductor...

Systems and methods for manufacturing nano-electro-mechanical-syste...

Array atomic force microscopy for enabling simultaneous multi-point...

Method of and atomic force microscopy system for performing subsurf...

Method and apparatus for examining a measuring tip of a scanning pr...

Photodetector for scanning probe microscope

Assembly for detecting the intensity distribution of components of...

Scanning probe microscope using sensor molecules to improve photo-i...

Systems and methods for manufacturing nano-electro-mechanical-syste...

Method for producing a probe suitable for scanning probe microscopy

Atomic force microscopy system, method for mapping one or more subs...

Rugged, single crystal wide-band-gap-material scanning-tunneling-mi...

Method of positioning probe tips relative to pads

Device and method for analysing a defect of a photolithographic mas...

Device and method for measuring and/or modifying surface features o...

Multiple integrated tips scanning probe microscope

Integrated measurement and micromechanical positioning apparatus fo...

Apparatus and methods for non-destructive inspection using microwav...

Method of fabricating nano-scale structures on the edge and nano-sc...

Multiple integrated tips scanning probe microscope with pre-alignme...

Alignment system and method

Coupled multiscale positioning of arrays of parallel, independently...

Multiple integrated tips scanning probe microscope

Patents Applicationslast 30 patents

RUGGED, SINGLE CRYSTAL WIDE-BAND-GAP-MATERIAL SCANNING-TUNNELING-MI...

LIGHTING SYSTEM FOR MULTI-PROBE MICROSCOPE

Method for Producing a Substrate Comprising Multiple Tips for Scann...

SYSTEMS AND METHODS FOR MANUFACTURING NANO-ELECTRO-MECHANICAL-SYSTE...

INTEGRATED DUAL-PROBE RAPID IN-SITU SWITCHING MEASUREMENT METHOD AN...

Probe for Scanning Probe Microscope and Binary State Scanning Probe...

METHOD AND APPARATUS FOR EXAMINING A MEASURING TIP OF A SCANNING PR...

ARRAY ATOMIC FORCE MICROSCOPY FOR ENABLING SIMULTANEOUS MULTI-POINT...

SYSTEMS AND METHODS FOR MANUFACTURING NANO-ELECTRO-MECHANICAL-SYSTE...

MICRO PROBE ARRAY DEVICE AND MANUFACTURING METHOD OF THE DEVICE

PHOTODETECTOR FOR SCANNING PROBE MICROSCOPE

RUGGED, SINGLE CRYSTAL WIDE-BAND-GAP-MATERIAL SCANNING-TUNNELING-MI...

Assembly for Detecting the Intensity Distribution of Components of...

SCANNING PROBE MICROSCOPE USING SENSOR MOLECULES TO IMPROVE PHOTO-I...

ATOMIC FORCE MICROSCOPY SYSTEM, METHOD FOR MAPPING ONE OR MORE SUBS...

Method for Producing a Probe Suitable for Scanning Probe Microscopy

MULTIPLE INTEGRATED TIPS SCANNING PROBE MICROSCOPE

METHOD AND APPARATUS FOR EXAMINING A MEASURING TIP OF A SCANNING PR...

METHOD OF AND ATOMIC FORCE MICROSCOPY SYSTEM FOR PERFORMING SUBSURF...

SYSTEMS AND METHODS FOR MANUFACTURING NANO-ELECTRO-MECHANICAL-SYSTE...

MULTIPLE INTEGRATED TIPS SCANNING PROBE MICROSCOPE WITH PRE-ALIGNME...

MULTIPLE INTEGRATED TIPS SCANNING PROBE MICROSCOPE

RUGGED, SINGLE CRYSTAL WIDE-BAND-GAP-MATERIAL SCANNING-TUNNELING-MI...

Integrated measurement and micromechanical positioning apparatus fo...

SCANNING PROBE MICROSCOPE

MOTION SENSOR INTEGRATED NANO-PROBE N/MEMS APPARATUS, METHOD, AND A...

METROLOGY DEVICES AND METHODS FOR INDEPENDENTLY CONTROLLING A PLURA...

METHOD OF FABRICATING NANO-SCALE STRUCTURES ON THE EDGE AND NANO-SC...

ELECTRICAL CONTACT AUTO-ALIGNMENT STRATEGY FOR HIGHLY PARALLEL PEN...

COMPACT PROBE FOR ATOMIC-FORCE MICROSCOPY AND ATOMIC-FORCE MICROSCO...