Probes, their manufacture, or their related instrumentation

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G01Q60/54

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GPHYSICS G01Measuring instruments G01QSCANNING-PROBE TECHNIQUES OR APPARATUS APPLICATIONS OF SCANNING-PROBE TECHNIQUES G01Q60/00Particular type of SPM [Scanning Probe Microscopy] or microscopes Essential components thereof

Current Industry

G01Q60/54Probes, their manufacture, or their related instrumentation

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Nanoscale scanning sensors
- Patent number 12,169,209
- Issue date Dec 17, 2024
- President and Fellows of Harvard College
- Michael S. Grinolds
- G01 - MEASURING TESTING
Information Patent Grant
Nanoscale scanning sensors
- Patent number 11,815,528
- Issue date Nov 14, 2023
- President and Fellows of Harvard College
- Michael S. Grinolds
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for aligning a probe for scanning probe micros...
- Patent number 11,549,963
- Issue date Jan 10, 2023
- Imec VZW
- Kristof Paredis
- G01 - MEASURING TESTING
Information Patent Grant
System and method for performing scanning tunneling microscopy on c...
- Patent number 10,976,344
- Issue date Apr 13, 2021
- University of Maryland, College Park
- Ting Xie
- G01 - MEASURING TESTING
Information Patent Grant
Resonance suppression structure of a wideband near-field magnetic p...
- Patent number 10,234,479
- Issue date Mar 19, 2019
- Beihang University
- Zhaowen Yan
- G01 - MEASURING TESTING
Information Patent Grant
Cantilever for a scanning type probe microscope
- Patent number 10,203,354
- Issue date Feb 12, 2019
- National University Corporation Nagoya Institute of Technology
- Masashi Kitazawa
- G01 - MEASURING TESTING
Information Patent Grant
Micro magnetic trap and process for evaluating forces with pico New...
- Patent number 10,073,057
- Issue date Sep 11, 2018
- Universidad de Santiago de Chile
- Francisco Esteban Melo Hurtado
- G01 - MEASURING TESTING
Information Patent Grant
Nanoscale scanning sensors
- Patent number 10,041,971
- Issue date Aug 7, 2018
- President and Fellows of Harvard College
- Michael S. Grinolds
- G01 - MEASURING TESTING
Information Patent Grant
Magnetic field value measuring device and method for measuring magn...
- Patent number 9,482,692
- Issue date Nov 1, 2016
- Akita University
- Hitoshi Saito
- G01 - MEASURING TESTING
Information Patent Grant
Magnetic profile measuring device and method for measuring magnetic...
- Patent number 9,222,914
- Issue date Dec 29, 2015
- Akita University
- Hitoshi Saito
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Cantilever for magnetic force microscope and method of manufacturin...
- Patent number 8,621,659
- Issue date Dec 31, 2013
- Hitachi High-Technologies Corporation
- Kaifeng Zhang
- G01 - MEASURING TESTING
Information Patent Grant
Magnetic field observation device and magnetic field observation me...
- Patent number 8,621,658
- Issue date Dec 31, 2013
- Akita University
- Hitoshi Saito
- G01 - MEASURING TESTING
Information Patent Grant
Surface state measuring device, and surface state measuring method...
- Patent number 8,490,209
- Issue date Jul 16, 2013
- Akita University
- Hitoshi Saito
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Magnetic device inspection apparatus and magnetic device inspection...
- Patent number 8,359,661
- Issue date Jan 22, 2013
- Hitachi High-Technologies Corporation
- Takehiro Tachizaki
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Magnetic sensor and scanning microscope
- Patent number 8,104,093
- Issue date Jan 24, 2012
- EMPIRE TECHNOLOGY DEVELOPMENT LLC
- Adarsh Sandhu
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Plastic cantilevers for force microscopy
- Patent number 7,691,298
- Issue date Apr 6, 2010
- Wisconsin Alumni Research Foundation
- Daniel W. van der Weide
- B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information Patent Grant
Carbon thin line probe
- Patent number 7,543,482
- Issue date Jun 9, 2009
- Olympus Corporation
- Masashi Kitazawa
- C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information Patent Grant
Cantilever probes for nanoscale magnetic and atomic force microscopy
- Patent number 7,462,270
- Issue date Dec 9, 2008
- The Trustees of Boston College
- Michael J. Naughton
- G01 - MEASURING TESTING
Information Patent Grant
Probe for a scanning microscope
- Patent number 7,398,678
- Issue date Jul 15, 2008
- Daiken Chemical Co., Ltd.
- Yoshikazu Nakayama
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for controlling and adjusting the magnetic state of a mag...
- Patent number 7,355,396
- Issue date Apr 8, 2008
- National Tisng Hau University
- Cheng-Chung Chi
- G01 - MEASURING TESTING
Information Patent Grant
Hybrid squid microscope with magnetic flux-guide for high resolutio...
- Patent number 7,262,597
- Issue date Aug 28, 2007
- Neocera, LLC
- Solomon I. Woods
- G01 - MEASURING TESTING
Information Patent Grant
Cantilever probes for nanoscale magnetic and atomic force microscopy
- Patent number 7,214,303
- Issue date May 8, 2007
- The Trustees of Boston College
- Michael J. Naughton
- G01 - MEASURING TESTING
Information Patent Grant
Nanotube arrangements and methods therefor
- Patent number 7,170,055
- Issue date Jan 30, 2007
- The Board of Trustees of the Leland Stanford Junior University
- Zhifeng Deng
- G01 - MEASURING TESTING
Information Patent Grant
Scanning magnetic microscope having improved magnetic sensor
- Patent number 7,145,330
- Issue date Dec 5, 2006
- Brown University Research Foundation
- Gang Xiao
- G01 - MEASURING TESTING
Information Patent Grant
Nanotube probe and method for manufacturing same
- Patent number 7,138,627
- Issue date Nov 21, 2006
- Daiken Chemical Co., Ltd.
- Yoshikazu Nakayama
- G01 - MEASURING TESTING
Information Patent Grant
Magnetic carbon nanotube
- Patent number 7,109,703
- Issue date Sep 19, 2006
- Hitachi, Ltd.
- Shuichi Suzuki
- G11 - INFORMATION STORAGE
Information Patent Grant
High frequency scanning SQUID microscope and method of measuring hi...
- Patent number 7,106,057
- Issue date Sep 12, 2006
- University of Maryland
- John Matthews
- G01 - MEASURING TESTING
Information Patent Grant
Spatially resolved electromagnetic property measurement
- Patent number 7,078,896
- Issue date Jul 18, 2006
- The Trustees of the University of Pennsylvania
- Dawn A. Bonnell
- G01 - MEASURING TESTING
Information Patent Grant
Coated nanotube surface signal probe
- Patent number 7,064,341
- Issue date Jun 20, 2006
- Daiken Chemical Co., Ltd.
- Yoshikazu Nakayama
- G01 - MEASURING TESTING
Information Patent Grant
Magnetic imaging microscope test system and its application for cha...
- Patent number 7,023,204
- Issue date Apr 4, 2006
- International Business Machine Corporation
- Vladimir Nikitin
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
METROLOGY DEVICE AND METHOD
- Publication number 20240410962
- Publication date Dec 12, 2024
- NEDERLANDSE ORGANISATIE VOOR TOEGEPAST- NATUURWETENSCHAPPELIJK ONDERZOEK TNO
- Abbas MOHTASHAMI
- G01 - MEASURING TESTING
Information Patent Application
NANOSCALE SCANNING SENSORS
- Publication number 20240044938
- Publication date Feb 8, 2024
- President and Fellows of Harvard College
- Michael S. GRINOLDS
- G01 - MEASURING TESTING
Information Patent Application
A DIAMOND SCANNING ELEMENT, ESPECIALLY FOR IMAGING APPLICATION, AND...
- Publication number 20230113008
- Publication date Apr 13, 2023
- UNIVERSITAT BASEL
- Brendan SHIELDS
- C30 - CRYSTAL GROWTH
Information Patent Application
NANOSCALE SCANNING SENSORS
- Publication number 20220413007
- Publication date Dec 29, 2022
- President and Fellows of Harvard College
- Michael S. GRINOLDS
- G01 - MEASURING TESTING
Information Patent Application
MAGNETORESISTIVE STACK WITHOUT RADIATED FIELD, SENSOR AND MAGNETIC...
- Publication number 20220384715
- Publication date Dec 1, 2022
- Commissariat A L'Energie Atomique et Aux Energies Alternatives
- Claude FERMON
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and Apparatus for Aligning a Probe for Scanning Probe Micros...
- Publication number 20220065895
- Publication date Mar 3, 2022
- IMEC vzw
- Kristof Paredis
- G01 - MEASURING TESTING
Information Patent Application
NANOSCALE SCANNING SENSORS
- Publication number 20180246143
- Publication date Aug 30, 2018
- President and Fellows of Harvard College
- Michael S. GRINOLDS
- G01 - MEASURING TESTING
Information Patent Application
CANTILEVER
- Publication number 20180136253
- Publication date May 17, 2018
- National University Corporation Nagoya Institute o f Technology
- Masashi KITAZAWA
- G01 - MEASURING TESTING
Information Patent Application
Micro Magnetic Trap And Process For Evaluating Forces With Pico New...
- Publication number 20170356932
- Publication date Dec 14, 2017
- Universidad de Santiago de Chile
- Francisco Esteban MELO HURTADO
- G01 - MEASURING TESTING
Information Patent Application
Resonance suppression structure of a wideband near-field magnetic p...
- Publication number 20170212146
- Publication date Jul 27, 2017
- BEIHANG UNIVERSITY
- ZHAOWEN YAN
- G01 - MEASURING TESTING
Information Patent Application
MAGNETIC PROFILE MEASURING DEVICE AND METHOD FOR MEASURING MAGNETIC...
- Publication number 20150323562
- Publication date Nov 12, 2015
- AKITA UNIVERSITY
- Hitoshi SAITO
- G01 - MEASURING TESTING
Information Patent Application
NANOSCALE SCANNING SENSORS
- Publication number 20150253355
- Publication date Sep 10, 2015
- President and Fellows of Harvard College
- Michael S. Grinolds
- G01 - MEASURING TESTING
Information Patent Application
MAGNETIC PROFILE MEASURING DEVICE AND METHOD FOR MEASURING MAGNETIC...
- Publication number 20140218016
- Publication date Aug 7, 2014
- Akita University
- Hitoshi Saito
- B82 - NANO-TECHNOLOGY
Information Patent Application
INSPECTION APPARATUS AND METHOD FOR A MAGNETIC HEAD
- Publication number 20130263332
- Publication date Oct 3, 2013
- Hitachi High-Technologies Corporation
- Shinji KAWAMOTO
- B82 - NANO-TECHNOLOGY
Information Patent Application
MAGNETIC FIELD OBSERVATION DEVICE AND MAGNETIC FIELD OBSERVATION ME...
- Publication number 20130174302
- Publication date Jul 4, 2013
- AKITA UNIVERSITY
- Hitoshi Saito
- B82 - NANO-TECHNOLOGY
Information Patent Application
METHOD AND ITS APPARATUS FOR INSPECTING A MAGNETIC HEAD DEVICE
- Publication number 20130063139
- Publication date Mar 14, 2013
- Hitachi High-Technologies Corporation
- Teruaki TOKUTOMI
- B82 - NANO-TECHNOLOGY
Information Patent Application
CANTILEVER FOR MAGNETIC FORCE MICROSCOPE AND METHOD OF MANUFACTURIN...
- Publication number 20120291161
- Publication date Nov 15, 2012
- Kaifeng ZHANG
- G01 - MEASURING TESTING
Information Patent Application
PROBE, METHOD FOR MANUFACTURING PROBE, PROBE MICROSCOPE, MAGNETIC H...
- Publication number 20120121935
- Publication date May 17, 2012
- National University Corporation Hokkaido University
- Akira Ishibashi
- G01 - MEASURING TESTING
Information Patent Application
METHOD TO MEASURE 3 COMPONENT OF THE MAGNETIC FIELD VECTOR AT NANOM...
- Publication number 20120079632
- Publication date Mar 29, 2012
- Ahmet Oral
- G01 - MEASURING TESTING
Information Patent Application
MAGNETIC SENSOR AND SCANNING MICROSCOPE
- Publication number 20120079636
- Publication date Mar 29, 2012
- Empire Technology Development LLC
- Adarsh Sandhu
- G01 - MEASURING TESTING
Information Patent Application
METHOD TO MEASURE 3 COMPONENT OF THE MAGNETIC FIELD VECTOR AT NANOM...
- Publication number 20110061139
- Publication date Mar 10, 2011
- Ahmet Oral
- G01 - MEASURING TESTING
Information Patent Application
SURFACE STATE MEASURING DEVICE, AND SURFACE STATE MEASURING METHOD...
- Publication number 20110030109
- Publication date Feb 3, 2011
- AKITA UNIVERSITY
- Hitoshi SAITO
- G01 - MEASURING TESTING
Information Patent Application
MAGNETIC DEVICE INSPECTION APPARATUS AND MAGNETIC DEVICE INSPECTION...
- Publication number 20100205699
- Publication date Aug 12, 2010
- Takehiro TACHIZAKI
- G01 - MEASURING TESTING
Information Patent Application
MAGNETIC SENSOR AND SCANNING MICROSCOPE
- Publication number 20100154088
- Publication date Jun 17, 2010
- Adarsh Sandhu
- G01 - MEASURING TESTING
Information Patent Application
Apparatus for detecting magnetic signals and signals of electric tu...
- Publication number 20070268016
- Publication date Nov 22, 2007
- Cheng-Chung Chi
- G01 - MEASURING TESTING
Information Patent Application
Cantilever probes for nanoscale magnetic and atomic force microscopy
- Publication number 20070235340
- Publication date Oct 11, 2007
- The Trustees of Boston College
- Michael J. Naughton
- G01 - MEASURING TESTING
Information Patent Application
Carbon thin line probe
- Publication number 20070204681
- Publication date Sep 6, 2007
- OLYMPUS CORPORATION
- Masashi Kitazawa
- G01 - MEASURING TESTING
Information Patent Application
Methods and systems for attaching a magnetic nanowire to an object...
- Publication number 20070014148
- Publication date Jan 18, 2007
- The University of North Carolina at Chapel Hill
- Otto Z. Zhou
- G01 - MEASURING TESTING
Information Patent Application
Plastic cantilevers for force microscopy
- Publication number 20060163767
- Publication date Jul 27, 2006
- WISCONSIN ALUMNI RESEARCH FOUNDATION
- Daniel W. van der Weide
- B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information Patent Application
Probe for a scanning microscope
- Publication number 20060150720
- Publication date Jul 13, 2006
- YOSHIKAZU NAKAYAMA
- Yoshikazu Nakayama
- G01 - MEASURING TESTING

Probes, their manufacture, or their related instrumentation

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Nanoscale scanning sensors

Nanoscale scanning sensors

Method and apparatus for aligning a probe for scanning probe micros...

System and method for performing scanning tunneling microscopy on c...

Resonance suppression structure of a wideband near-field magnetic p...

Cantilever for a scanning type probe microscope

Micro magnetic trap and process for evaluating forces with pico New...

Nanoscale scanning sensors

Magnetic field value measuring device and method for measuring magn...

Magnetic profile measuring device and method for measuring magnetic...

Cantilever for magnetic force microscope and method of manufacturin...

Magnetic field observation device and magnetic field observation me...

Surface state measuring device, and surface state measuring method...

Magnetic device inspection apparatus and magnetic device inspection...

Magnetic sensor and scanning microscope

Plastic cantilevers for force microscopy

Carbon thin line probe

Cantilever probes for nanoscale magnetic and atomic force microscopy

Probe for a scanning microscope

Apparatus for controlling and adjusting the magnetic state of a mag...

Hybrid squid microscope with magnetic flux-guide for high resolutio...

Cantilever probes for nanoscale magnetic and atomic force microscopy

Nanotube arrangements and methods therefor

Scanning magnetic microscope having improved magnetic sensor

Nanotube probe and method for manufacturing same

Magnetic carbon nanotube

High frequency scanning SQUID microscope and method of measuring hi...

Spatially resolved electromagnetic property measurement

Coated nanotube surface signal probe

Magnetic imaging microscope test system and its application for cha...

Patents Applicationslast 30 patents

METROLOGY DEVICE AND METHOD

NANOSCALE SCANNING SENSORS

A DIAMOND SCANNING ELEMENT, ESPECIALLY FOR IMAGING APPLICATION, AND...

NANOSCALE SCANNING SENSORS

MAGNETORESISTIVE STACK WITHOUT RADIATED FIELD, SENSOR AND MAGNETIC...

Method and Apparatus for Aligning a Probe for Scanning Probe Micros...

NANOSCALE SCANNING SENSORS

CANTILEVER

Micro Magnetic Trap And Process For Evaluating Forces With Pico New...

Resonance suppression structure of a wideband near-field magnetic p...

MAGNETIC PROFILE MEASURING DEVICE AND METHOD FOR MEASURING MAGNETIC...

NANOSCALE SCANNING SENSORS

MAGNETIC PROFILE MEASURING DEVICE AND METHOD FOR MEASURING MAGNETIC...

INSPECTION APPARATUS AND METHOD FOR A MAGNETIC HEAD

MAGNETIC FIELD OBSERVATION DEVICE AND MAGNETIC FIELD OBSERVATION ME...

METHOD AND ITS APPARATUS FOR INSPECTING A MAGNETIC HEAD DEVICE

CANTILEVER FOR MAGNETIC FORCE MICROSCOPE AND METHOD OF MANUFACTURIN...

PROBE, METHOD FOR MANUFACTURING PROBE, PROBE MICROSCOPE, MAGNETIC H...

METHOD TO MEASURE 3 COMPONENT OF THE MAGNETIC FIELD VECTOR AT NANOM...

MAGNETIC SENSOR AND SCANNING MICROSCOPE

METHOD TO MEASURE 3 COMPONENT OF THE MAGNETIC FIELD VECTOR AT NANOM...

SURFACE STATE MEASURING DEVICE, AND SURFACE STATE MEASURING METHOD...

MAGNETIC DEVICE INSPECTION APPARATUS AND MAGNETIC DEVICE INSPECTION...

MAGNETIC SENSOR AND SCANNING MICROSCOPE

Apparatus for detecting magnetic signals and signals of electric tu...

Cantilever probes for nanoscale magnetic and atomic force microscopy

Carbon thin line probe

Methods and systems for attaching a magnetic nanowire to an object...

Plastic cantilevers for force microscopy

Probe for a scanning microscope