Procedures; Software aspects

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CPC
G01R31/287

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GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R31/00Arrangements for testing electric properties Arrangements for locating electric faults Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

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G01R31/287Procedures; Software aspects

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Substrate inspection apparatus and substrate inspection method
- Patent number 12,352,808
- Issue date Jul 8, 2025
- Samsung Electronics Co., Ltd.
- Sekye Jeon
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for burn-in board alignment and sealing betwee...
- Patent number 12,352,809
- Issue date Jul 8, 2025
- MSV SYSTEMS & SERVICES PTE LTD
- Teck Huat Tan
- G01 - MEASURING TESTING
Information Patent Grant
System for testing performance of device in temperature load test
- Patent number 12,352,810
- Issue date Jul 8, 2025
- ATECO INC.
- Taek Seon Lee
- G01 - MEASURING TESTING
Information Patent Grant
Downhole fault detection in well system using spread spectrum time...
- Patent number 12,352,158
- Issue date Jul 8, 2025
- Halliburton Energy Services, Inc.
- Jonathon N. Joubran
- E21 - EARTH DRILLING MINING
Information Patent Grant
Integrated test cell using active thermal interposer (ATI) with par...
- Patent number 12,345,756
- Issue date Jul 1, 2025
- ADVANTEST TEST SOLUTIONS, INC.
- Karthik Ranganathan
- G01 - MEASURING TESTING
Information Patent Grant
Burn-in system with multiple plugs on the test board
- Patent number 12,345,758
- Issue date Jul 1, 2025
- Meritech CO., Ltd.
- Byung Gook Chang
- G01 - MEASURING TESTING
Information Patent Grant
Built-in self-test circuit and temperature measurement circuit incl...
- Patent number 12,345,762
- Issue date Jul 1, 2025
- Samsung Electronics Co., Ltd.
- Junhee Shin
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Method and device for adapting temperatures of semiconductor compon...
- Patent number 12,339,312
- Issue date Jun 24, 2025
- Robert Bosch GmbH
- Karl Oberdieck
- G01 - MEASURING TESTING
Information Patent Grant
Electrical testing method for semiconductor device
- Patent number 12,339,313
- Issue date Jun 24, 2025
- Renesas Electronics Corporation
- Osamu Mizoguchi
- G01 - MEASURING TESTING
Information Patent Grant
Testing device and testing method thereof
- Patent number 12,332,300
- Issue date Jun 17, 2025
- Winbond Electronics Corp.
- Kuan-Cheng Chang
- G01 - MEASURING TESTING
Information Patent Grant
Heat exchange method using fluorinated compounds having a low GWP
- Patent number 12,325,819
- Issue date Jun 10, 2025
- Solvay Specialty Polymers Italy S.p.A.
- Emanuela Antenucci
- C09 - DYES PAINTS POLISHES NATURAL RESINS ADHESIVES MISCELLANEOUS COMPOSITION...
Information Patent Grant
System for testing an integrated circuit of a device and its method...
- Patent number 12,326,472
- Issue date Jun 10, 2025
- AEHR Test Systems
- Scott E. Lindsey
- G01 - MEASURING TESTING
Information Patent Grant
Protecting method for preventing solder crack failure in electronic...
- Patent number 12,328,827
- Issue date Jun 10, 2025
- SOLID STATE STORAGE TECHNOLOGY CORPORATION
- Tsung-Lung Lin
- G01 - MEASURING TESTING
Information Patent Grant
System and method of testing for RF-induced electromigration in sem...
- Patent number 12,313,672
- Issue date May 27, 2025
- Power Technology Solutions LLC
- Stephen Ludvik
- G01 - MEASURING TESTING
Information Patent Grant
Small-sized fast cold and hot shock test devices
- Patent number 12,313,674
- Issue date May 27, 2025
- HITOP INSTRUMENT (JIANGSU) CO., LTD.
- Dongxi Liu
- G01 - MEASURING TESTING
Information Patent Grant
Method and device for wafer-level testing
- Patent number 12,313,675
- Issue date May 27, 2025
- Taiwan Semiconductor Manufacturing Company Ltd.
- Jun He
- G01 - MEASURING TESTING
Information Patent Grant
Thermal mitigation for an electronic speaker device and associated...
- Patent number 12,317,460
- Issue date May 27, 2025
- Google LLC
- Emil Rahim
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Solid metal foam thermal interface material
- Patent number 12,300,567
- Issue date May 13, 2025
- Indium Corporation
- Ross B. Berntson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Current measuring circuit
- Patent number 12,292,469
- Issue date May 6, 2025
- Infineon Technologies AG
- Christian Djelassi-Tscheck
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for thermal control of devices in an electronics...
- Patent number 12,292,484
- Issue date May 6, 2025
- AEHR Test Systems
- Jovan Jovanovic
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Lifetime indicator system
- Patent number 12,282,059
- Issue date Apr 22, 2025
- Analog Devices International Unlimited Company
- Edward John Coyne
- G01 - MEASURING TESTING
Information Patent Grant
Electronic component handling apparatus and electronic component te...
- Patent number 12,282,057
- Issue date Apr 22, 2025
- Advantest Corporation
- Yuya Yamada
- G01 - MEASURING TESTING
Information Patent Grant
System for characterizing a transistor circuit
- Patent number 12,282,054
- Issue date Apr 22, 2025
- Melexis Technologies NV
- Francois Piette
- G01 - MEASURING TESTING
Information Patent Grant
Test circuit of semiconductor apparatus and test system including t...
- Patent number 12,283,533
- Issue date Apr 22, 2025
- SK Hynix Inc.
- Jong Seok Jung
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Integrated circuit pad failure detection
- Patent number 12,282,058
- Issue date Apr 22, 2025
- PROTEANTECS LTD.
- Eyal Fayneh
- G01 - MEASURING TESTING
Information Patent Grant
Coolant supplying apparatus, and temperature controlling apparatus...
- Patent number 12,276,694
- Issue date Apr 15, 2025
- Semes Co., Ltd.
- Young Joo Kim
- G01 - MEASURING TESTING
Information Patent Grant
Electronic component handling apparatus, electronic component testi...
- Patent number 12,276,693
- Issue date Apr 15, 2025
- Advantest Corporation
- Matthias Werner
- G01 - MEASURING TESTING
Information Patent Grant
Calibration arrangement and corresponding calibration method, and c...
- Patent number 12,276,692
- Issue date Apr 15, 2025
- ERS Electronic GmbH
- Klemens Reitinger
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for wafer-level testing
- Patent number 12,270,852
- Issue date Apr 8, 2025
- Taiwan Semiconductor Manufacturing Company Ltd.
- Jun He
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for thermal control of devices in electronics tester
- Patent number 12,265,136
- Issue date Apr 1, 2025
- AEHR Test Systems
- Jovan Jovanovic
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
PROBE SYSTEM, METHOD OF UTILIZING PROBE SYSTEM, METHOD OF TESTING U...
- Publication number 20250237696
- Publication date Jul 24, 2025
- MPI CORPORATION
- STOJAN KANEV
- G01 - MEASURING TESTING
Information Patent Application
TESTING SEMICONDUCTOR MODULES
- Publication number 20250224438
- Publication date Jul 10, 2025
- Samsung Electronics Co., Ltd.
- Sunhee Kim
- G01 - MEASURING TESTING
Information Patent Application
Two-Phase Helium Convection Loop for Cryogenic Cooling
- Publication number 20250224441
- Publication date Jul 10, 2025
- Massachusetts Institute of Technology
- John CUMMINGS
- G01 - MEASURING TESTING
Information Patent Application
Dynamic Voltage Stress Condition Optimization Method and Dynamic Vo...
- Publication number 20250224442
- Publication date Jul 10, 2025
- MEDIATEK INC.
- Yu-Lin Yang
- G01 - MEASURING TESTING
Information Patent Application
BURN-IN BOARD AND BURN-IN TEST METHOD USING THE SAME
- Publication number 20250224440
- Publication date Jul 10, 2025
- Samsung Electronics Co., Ltd.
- Seonhaeng LEE
- G01 - MEASURING TESTING
Information Patent Application
Dynamic Voltage Stress Condition Optimization Method and Dynamic Vo...
- Publication number 20250224443
- Publication date Jul 10, 2025
- MEDIATEK INC.
- Yu-Lin Yang
- G01 - MEASURING TESTING
Information Patent Application
VOLTAGE TRACKING CIRCUIT AND METHOD OF OPERATING THE SAME
- Publication number 20250224444
- Publication date Jul 10, 2025
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Hsiang-Hui CHENG
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION APPARATUS
- Publication number 20250224445
- Publication date Jul 10, 2025
- TOKYO ELECTRON LIMITED
- Shigeru KASAI
- G01 - MEASURING TESTING
Information Patent Application
CHIP COOLING MODULE AND CHIP TESTING APPARATUS HAVING SAME
- Publication number 20250216445
- Publication date Jul 3, 2025
- CHROMA ATE INC.
- Yu-Wei Chuang
- G01 - MEASURING TESTING
Information Patent Application
ANTI-CONDENSATION LOW-TEMPERATURE TESTING MODULE AND CHIP TESTING A...
- Publication number 20250216444
- Publication date Jul 3, 2025
- CHROMA ATE INC.
- Yu-Wei Chuang
- G01 - MEASURING TESTING
Information Patent Application
SOCKET ASSEMBLY AND ELECTRONIC COMPONENT TEST APPARATUS
- Publication number 20250216442
- Publication date Jul 3, 2025
- Advantest Corporation
- Natsuki Shiota
- G01 - MEASURING TESTING
Information Patent Application
MULTI ZONE TEMPERATURE CONTROL FOR DEVICES UNDER TEST
- Publication number 20250208197
- Publication date Jun 26, 2025
- Intel Corporation
- Gregorio R. MURTAGIAN
- G01 - MEASURING TESTING
Information Patent Application
Tamper-Aware Age Sensor
- Publication number 20250208199
- Publication date Jun 26, 2025
- IMEC vzw
- Javier Diaz Fortuny
- G01 - MEASURING TESTING
Information Patent Application
ELECTRONIC COMPONENT INSPECTION DEVICE AND ELECTRONIC COMPONENT INS...
- Publication number 20250208198
- Publication date Jun 26, 2025
- CENTRUM TECHNOLOGY CORP.
- Tong-Yi CHUANG
- G01 - MEASURING TESTING
Information Patent Application
WORK PRESS ASSEMBLY FOR TEST HANDLER
- Publication number 20250199059
- Publication date Jun 19, 2025
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Yi-Neng Chang
- G01 - MEASURING TESTING
Information Patent Application
INTERPOSER PACKAGE, MOUNTING METHOD, AND BURN-IN TEST APPARATUS
- Publication number 20250199060
- Publication date Jun 19, 2025
- KIOXIA Corporation
- Masaki YOSHIMURA
- G01 - MEASURING TESTING
Information Patent Application
WAFER TEST SYSTEM AND OPERATING METHOD THEREOF
- Publication number 20250180637
- Publication date Jun 5, 2025
- SK HYNIX INC.
- Dong Kil KIM
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATED TEST EQUIPMENT, METHOD FOR TESTING A DEVICE UNDER TEST AN...
- Publication number 20250180638
- Publication date Jun 5, 2025
- Advantest Corporation
- Natan CHEJANOVSKY
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATED TEST EQUIPMENT, METHOD FOR TESTING A DEVICE UNDER TEST AN...
- Publication number 20250180633
- Publication date Jun 5, 2025
- Advantest Corporation
- Natan CHEJANOVSKY
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR TESTING THERMAL CONDITIONING OF AN INTEGRAT...
- Publication number 20250172608
- Publication date May 29, 2025
- SMART Modular Technologies, Inc.
- Reuben Chang
- G01 - MEASURING TESTING
Information Patent Application
PROBE TESTING APPARATUS, PROBE TESTING SYSTEM AND PROBE CARD
- Publication number 20250172609
- Publication date May 29, 2025
- RENESAS ELECTRONICS CORPORATION
- Hisayoshi HANAI
- G01 - MEASURING TESTING
Information Patent Application
COOLING PLATE, WIRING BOARD ASSEMBLY AND DEVICE TESTING APPARATUS
- Publication number 20250164549
- Publication date May 22, 2025
- Advantest Corporation
- Yasufumi Yoda
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS FOR TESTING SEMICONDUCTOR DEVICE TEST
- Publication number 20250155495
- Publication date May 15, 2025
- Byeong-gyu CHOI
- G01 - MEASURING TESTING
Information Patent Application
AGING PROFILE COMPONENTS
- Publication number 20250155494
- Publication date May 15, 2025
- Micron Technology, Inc.
- Leon Zlotnik
- G01 - MEASURING TESTING
Information Patent Application
FORCED EARLY FAILURE FOR MEMORY DEVICE
- Publication number 20250155493
- Publication date May 15, 2025
- SMART Modular Technologies, Inc.
- Fong-Long Lin
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR BURN-IN MACHINE COOLING SYSTEM
- Publication number 20250130275
- Publication date Apr 24, 2025
- Micro Control Company
- Aidan Michael Fawcett
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION METHOD AND METHOD OF MANUFACTURING IMAGING ELEMENT
- Publication number 20250130277
- Publication date Apr 24, 2025
- Panasonic Intellectual Property Management Co., Ltd.
- SHINICHI MACHIDA
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR BURN-IN BOARD
- Publication number 20250130274
- Publication date Apr 24, 2025
- Micro Control Company
- Aidan Michael Fawcett
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR TEST DEVICE AND METHOD OF MANUFACTURING THE SAME
- Publication number 20250123323
- Publication date Apr 17, 2025
- Samsung Electronics Co., Ltd.
- Haewook PARK
- G01 - MEASURING TESTING
Information Patent Application
DEVICE AND METHOD FOR CONTROLLING AIR PURGE EQUIPMENT
- Publication number 20250123324
- Publication date Apr 17, 2025
- Siliconware Precision Industries Co., Ltd.
- Cheng-Shao CHEN
- G01 - MEASURING TESTING

Procedures; Software aspects

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Substrate inspection apparatus and substrate inspection method

Apparatus and method for burn-in board alignment and sealing betwee...

System for testing performance of device in temperature load test

Downhole fault detection in well system using spread spectrum time...

Integrated test cell using active thermal interposer (ATI) with par...

Burn-in system with multiple plugs on the test board

Built-in self-test circuit and temperature measurement circuit incl...

Method and device for adapting temperatures of semiconductor compon...

Electrical testing method for semiconductor device

Testing device and testing method thereof

Heat exchange method using fluorinated compounds having a low GWP

System for testing an integrated circuit of a device and its method...

Protecting method for preventing solder crack failure in electronic...

System and method of testing for RF-induced electromigration in sem...

Small-sized fast cold and hot shock test devices

Method and device for wafer-level testing

Thermal mitigation for an electronic speaker device and associated...

Solid metal foam thermal interface material

Current measuring circuit

Method and system for thermal control of devices in an electronics...

Lifetime indicator system

Electronic component handling apparatus and electronic component te...

System for characterizing a transistor circuit

Test circuit of semiconductor apparatus and test system including t...

Integrated circuit pad failure detection

Coolant supplying apparatus, and temperature controlling apparatus...

Electronic component handling apparatus, electronic component testi...

Calibration arrangement and corresponding calibration method, and c...

Method and system for wafer-level testing

Method and system for thermal control of devices in electronics tester

Patents Applicationslast 30 patents

PROBE SYSTEM, METHOD OF UTILIZING PROBE SYSTEM, METHOD OF TESTING U...

TESTING SEMICONDUCTOR MODULES

Two-Phase Helium Convection Loop for Cryogenic Cooling

Dynamic Voltage Stress Condition Optimization Method and Dynamic Vo...

BURN-IN BOARD AND BURN-IN TEST METHOD USING THE SAME

Dynamic Voltage Stress Condition Optimization Method and Dynamic Vo...

VOLTAGE TRACKING CIRCUIT AND METHOD OF OPERATING THE SAME

INSPECTION APPARATUS

CHIP COOLING MODULE AND CHIP TESTING APPARATUS HAVING SAME

ANTI-CONDENSATION LOW-TEMPERATURE TESTING MODULE AND CHIP TESTING A...

SOCKET ASSEMBLY AND ELECTRONIC COMPONENT TEST APPARATUS

MULTI ZONE TEMPERATURE CONTROL FOR DEVICES UNDER TEST

Tamper-Aware Age Sensor

ELECTRONIC COMPONENT INSPECTION DEVICE AND ELECTRONIC COMPONENT INS...

WORK PRESS ASSEMBLY FOR TEST HANDLER

INTERPOSER PACKAGE, MOUNTING METHOD, AND BURN-IN TEST APPARATUS

WAFER TEST SYSTEM AND OPERATING METHOD THEREOF

AUTOMATED TEST EQUIPMENT, METHOD FOR TESTING A DEVICE UNDER TEST AN...

AUTOMATED TEST EQUIPMENT, METHOD FOR TESTING A DEVICE UNDER TEST AN...

SYSTEMS AND METHODS FOR TESTING THERMAL CONDITIONING OF AN INTEGRAT...

PROBE TESTING APPARATUS, PROBE TESTING SYSTEM AND PROBE CARD

COOLING PLATE, WIRING BOARD ASSEMBLY AND DEVICE TESTING APPARATUS

APPARATUS FOR TESTING SEMICONDUCTOR DEVICE TEST

AGING PROFILE COMPONENTS

FORCED EARLY FAILURE FOR MEMORY DEVICE

SEMICONDUCTOR BURN-IN MACHINE COOLING SYSTEM

INSPECTION METHOD AND METHOD OF MANUFACTURING IMAGING ELEMENT

SEMICONDUCTOR BURN-IN BOARD

SEMICONDUCTOR TEST DEVICE AND METHOD OF MANUFACTURING THE SAME

DEVICE AND METHOD FOR CONTROLLING AIR PURGE EQUIPMENT