Procedures; Software aspects

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CPC
G01R31/287

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GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R31/00Arrangements for testing electric properties Arrangements for locating electric faults Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

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G01R31/287Procedures; Software aspects

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Solid metal foam thermal interface material
- Patent number 12,300,567
- Issue date May 13, 2025
- Indium Corporation
- Ross B. Berntson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Current measuring circuit
- Patent number 12,292,469
- Issue date May 6, 2025
- Infineon Technologies AG
- Christian Djelassi-Tscheck
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for thermal control of devices in an electronics...
- Patent number 12,292,484
- Issue date May 6, 2025
- AEHR Test Systems
- Jovan Jovanovic
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Lifetime indicator system
- Patent number 12,282,059
- Issue date Apr 22, 2025
- Analog Devices International Unlimited Company
- Edward John Coyne
- G01 - MEASURING TESTING
Information Patent Grant
Electronic component handling apparatus and electronic component te...
- Patent number 12,282,057
- Issue date Apr 22, 2025
- Advantest Corporation
- Yuya Yamada
- G01 - MEASURING TESTING
Information Patent Grant
System for characterizing a transistor circuit
- Patent number 12,282,054
- Issue date Apr 22, 2025
- Melexis Technologies NV
- Francois Piette
- G01 - MEASURING TESTING
Information Patent Grant
Test circuit of semiconductor apparatus and test system including t...
- Patent number 12,283,533
- Issue date Apr 22, 2025
- SK Hynix Inc.
- Jong Seok Jung
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Integrated circuit pad failure detection
- Patent number 12,282,058
- Issue date Apr 22, 2025
- PROTEANTECS LTD.
- Eyal Fayneh
- G01 - MEASURING TESTING
Information Patent Grant
Coolant supplying apparatus, and temperature controlling apparatus...
- Patent number 12,276,694
- Issue date Apr 15, 2025
- Semes Co., Ltd.
- Young Joo Kim
- G01 - MEASURING TESTING
Information Patent Grant
Electronic component handling apparatus, electronic component testi...
- Patent number 12,276,693
- Issue date Apr 15, 2025
- Advantest Corporation
- Matthias Werner
- G01 - MEASURING TESTING
Information Patent Grant
Calibration arrangement and corresponding calibration method, and c...
- Patent number 12,276,692
- Issue date Apr 15, 2025
- ERS Electronic GmbH
- Klemens Reitinger
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for wafer-level testing
- Patent number 12,270,852
- Issue date Apr 8, 2025
- Taiwan Semiconductor Manufacturing Company Ltd.
- Jun He
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for thermal control of devices in electronics tester
- Patent number 12,265,136
- Issue date Apr 1, 2025
- AEHR Test Systems
- Jovan Jovanovic
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multiplexed thermal control wafer and coldplate
- Patent number 12,259,428
- Issue date Mar 25, 2025
- AEM SINGAPORE PTE. LTD.
- Samer Kabbani
- G01 - MEASURING TESTING
Information Patent Grant
Over the air test chamber with optimized air circulation
- Patent number 12,259,426
- Issue date Mar 25, 2025
- Rohde & Schwarz GmbH & Co. KG
- Ralf Meissner
- G01 - MEASURING TESTING
Information Patent Grant
Voltage tracking circuit and method of operating the same
- Patent number 12,259,429
- Issue date Mar 25, 2025
- Taiwan Semiconductor Manufacturing Company, Ltd
- Hsiang-Hui Cheng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Thermal head comprising a plurality of adapters for independent the...
- Patent number 12,259,427
- Issue date Mar 25, 2025
- AEM Singapore Pte, LTD.
- Thomas P. Jones
- G01 - MEASURING TESTING
Information Patent Grant
Pogo pin cooling system and method and electronic device testing ap...
- Patent number 12,253,541
- Issue date Mar 18, 2025
- CHROMA ATE INC.
- I-Shih Tseng
- G01 - MEASURING TESTING
Information Patent Grant
Estimation of life of switching devices
- Patent number 12,248,016
- Issue date Mar 11, 2025
- EATON INTELLIGENT POWER LIMITED
- Deepak Balaji Somayajula
- G01 - MEASURING TESTING
Information Patent Grant
Work press assembly for test handler
- Patent number 12,241,929
- Issue date Mar 4, 2025
- Taiwan Semiconductor Manufacturing Company, Ltd
- Yi-Neng Chang
- G01 - MEASURING TESTING
Information Patent Grant
Wafer test system and operating method thereof
- Patent number 12,241,930
- Issue date Mar 4, 2025
- SK hynix Inc.
- Dong Kil Kim
- G01 - MEASURING TESTING
Information Patent Grant
Heating structure and wafer test device
- Patent number 12,237,184
- Issue date Feb 25, 2025
- SEMIGHT INSTRUMENTS CO., LTD
- Zhe Lian
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Test system support component exchange system and method
- Patent number 12,235,315
- Issue date Feb 25, 2025
- ADVANTEST TEST SOLUTIONS, INC.
- Paul Ferrari
- G01 - MEASURING TESTING
Information Patent Grant
Temperature compensation of optically isolated probe
- Patent number 12,228,607
- Issue date Feb 18, 2025
- Teledyne LeCroy, Inc.
- Matthew Weinstein
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for testing virtual functions of a device under...
- Patent number 12,222,844
- Issue date Feb 11, 2025
- Advantest Corporation
- Srdjan Malisic
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Active thermal interposer device
- Patent number 12,216,154
- Issue date Feb 4, 2025
- ADVANTEST TEST SOLUTIONS, INC.
- Samer Kabbani
- G01 - MEASURING TESTING
Information Patent Grant
Testing method and testing system
- Patent number 12,216,155
- Issue date Feb 4, 2025
- Realtek Semiconductor Corporation
- Yi-Nan Kuo
- G01 - MEASURING TESTING
Information Patent Grant
Thermal array with gimbal features and enhanced thermal performance
- Patent number 12,210,056
- Issue date Jan 28, 2025
- ADVANTEST TEST SOLUTIONS, INC.
- Gregory Cruzan
- G01 - MEASURING TESTING
Information Patent Grant
Multi-input multi-zone thermal control for device testing
- Patent number 12,203,979
- Issue date Jan 21, 2025
- ADVANTEST TEST SOLUTIONS, INC.
- Karthik Ranganathan
- G01 - MEASURING TESTING
Information Patent Grant
System for scan mode exit and methods for scan mode exit
- Patent number 12,196,804
- Issue date Jan 14, 2025
- NXP B.V.
- Tarun Kumar Goyal
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
APPARATUS FOR TESTING SEMICONDUCTOR DEVICE TEST
- Publication number 20250155495
- Publication date May 15, 2025
- Byeong-gyu CHOI
- G01 - MEASURING TESTING
Information Patent Application
AGING PROFILE COMPONENTS
- Publication number 20250155494
- Publication date May 15, 2025
- Micron Technology, Inc.
- Leon Zlotnik
- G01 - MEASURING TESTING
Information Patent Application
FORCED EARLY FAILURE FOR MEMORY DEVICE
- Publication number 20250155493
- Publication date May 15, 2025
- SMART Modular Technologies, Inc.
- Fong-Long Lin
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR BURN-IN MACHINE COOLING SYSTEM
- Publication number 20250130275
- Publication date Apr 24, 2025
- Micro Control Company
- Aidan Michael Fawcett
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION METHOD AND METHOD OF MANUFACTURING IMAGING ELEMENT
- Publication number 20250130277
- Publication date Apr 24, 2025
- Panasonic Intellectual Property Management Co., Ltd.
- SHINICHI MACHIDA
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR BURN-IN BOARD
- Publication number 20250130274
- Publication date Apr 24, 2025
- Micro Control Company
- Aidan Michael Fawcett
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR TEST DEVICE AND METHOD OF MANUFACTURING THE SAME
- Publication number 20250123323
- Publication date Apr 17, 2025
- Samsung Electronics Co., Ltd.
- Haewook PARK
- G01 - MEASURING TESTING
Information Patent Application
DEVICE AND METHOD FOR CONTROLLING AIR PURGE EQUIPMENT
- Publication number 20250123324
- Publication date Apr 17, 2025
- Siliconware Precision Industries Co., Ltd.
- Cheng-Shao CHEN
- G01 - MEASURING TESTING
Information Patent Application
VARIABLE TEMPERATURE TEST SYSTEM AND OPERATION METHOD THEREOF
- Publication number 20250123322
- Publication date Apr 17, 2025
- Hefei Core Storage Electronic Limited
- Chih-Ling Wang
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR TESTING APPARATUS AND METHOD FOR TESTING SEMICONDUCTO...
- Publication number 20250116698
- Publication date Apr 10, 2025
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Ming-Hsuan CHANG
- G01 - MEASURING TESTING
Information Patent Application
TEST ENVIRONMENT CONTROL SYSTEM
- Publication number 20250116699
- Publication date Apr 10, 2025
- YISHI Industrial Co.,Ltd
- WEN-HSIN LEE
- G01 - MEASURING TESTING
Information Patent Application
METHODS, SYSTEMS, ARTICLES OF MANUFACTURE, AND APPARATUS FOR IMPROV...
- Publication number 20250110173
- Publication date Apr 3, 2025
- Intel Corporation
- Gregorio R. Murtagian
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHODS FOR THERMAL TESTING WITHIN ELECTRONIC COMPONE...
- Publication number 20250110174
- Publication date Apr 3, 2025
- QUALCOMM Incorporated
- Palkesh JAIN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MULTI-INPUT MULTI-ZONE THERMAL CONTROL FOR DEVICE TESTING
- Publication number 20250102565
- Publication date Mar 27, 2025
- ADVANTEST TEST SOLUTIONS, INC.
- Karthik Ranganathan
- G01 - MEASURING TESTING
Information Patent Application
MULTIPLE TILE TWO-LAYERED MOTHERBOARD TESTER
- Publication number 20250102564
- Publication date Mar 27, 2025
- Intelligent Memory Limited
- Peter Poechmueller
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF HAVING GOOD THERMAL ISOLATION IN WAFER TEST CASSETTE
- Publication number 20250093407
- Publication date Mar 20, 2025
- XINGR TECHNOLOGIES (ZHEJIANG) LIMITED
- CHOON LEONG LOU
- G01 - MEASURING TESTING
Information Patent Application
SHELL FOR WAFER LEVEL BURN-IN (WLBI) CHIP TEST, METHOD FOR LOADING...
- Publication number 20250093405
- Publication date Mar 20, 2025
- Microtest S.p.A.
- Giuseppe AMELIO
- G01 - MEASURING TESTING
Information Patent Application
ACTIVE THERMAL INTERPOSER DEVICE
- Publication number 20250093408
- Publication date Mar 20, 2025
- ADVANTEST TEST SOLUTIONS, INC.
- Samer Kabbani
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM FOR TESTING AN INTEGRATED CIRCUIT OF A DEVICE AND ITS METHOD...
- Publication number 20250085337
- Publication date Mar 13, 2025
- Aehr Test Systems
- Scott E. Lindsey
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM FOR TESTING AN INTEGRATED CIRCUIT OF A DEVICE AND ITS METHOD...
- Publication number 20250085338
- Publication date Mar 13, 2025
- Aehr Test Systems
- Scott E. Lindsey
- G01 - MEASURING TESTING
Information Patent Application
CIRCUIT FOR DETECTING DEFECTS
- Publication number 20250085340
- Publication date Mar 13, 2025
- Samsung Electronics Co., Ltd.
- Takuya FAUTATSUYAMA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR PACKAGE
- Publication number 20250076368
- Publication date Mar 6, 2025
- Yangtze Memory Technologies Co., Ltd.
- Zhiguo Li
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR WAFER HANDLING APPARATUS AND SEMICONDUCTOR WAFER TEST...
- Publication number 20250076367
- Publication date Mar 6, 2025
- Advantest Corporation
- Aritomo Kikuchi
- G01 - MEASURING TESTING
Information Patent Application
BUILT-IN SELF-TEST CIRCUIT AND TEMPERATURE MEASUREMENT CIRCUIT INCL...
- Publication number 20250076377
- Publication date Mar 6, 2025
- Samsung Electronics Co., Ltd.
- Junhee Shin
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
THERMAL CONTROL WAFER WITH INTEGRATED HEATING-SENSING ELEMENTS
- Publication number 20250067797
- Publication date Feb 27, 2025
- AEM SINGAPORE PTE. LTD.
- Carl L. OSTROWSKI
- G01 - MEASURING TESTING
Information Patent Application
PREDICTION DEVICE, TEST SYSTEM, PREDICTION METHOD, AND PREDICTION P...
- Publication number 20250060408
- Publication date Feb 20, 2025
- TOKYO ELECTRON LIMITED
- Hiroaki HAYASHI
- G01 - MEASURING TESTING
Information Patent Application
WAFER PROBE STATION AND METHOD FOR ESTABLISHING AN EVALUATION MODEL...
- Publication number 20250044346
- Publication date Feb 6, 2025
- MPI CORPORATION
- ANDREJ RUMIANTSEV
- G01 - MEASURING TESTING
Information Patent Application
TEST TRAY SYSTEM AND RELATED METHOD
- Publication number 20250035700
- Publication date Jan 30, 2025
- GLOBALFOUNDRIES U.S. Inc.
- Jae Hoon Kim
- G01 - MEASURING TESTING
Information Patent Application
TEMPERATURE ADJUSTMENT SYSTEM AND ELECTRONIC COMPONENT TESTING APPA...
- Publication number 20250027988
- Publication date Jan 23, 2025
- Advantest Corporation
- Yuya Yamada
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION SYSTEM WITH THERMAL INTERFACE, AND ELECTRONIC COMPONENT...
- Publication number 20250027987
- Publication date Jan 23, 2025
- CHROMA ATE INC.
- I-Shih Tseng
- G01 - MEASURING TESTING

Procedures; Software aspects

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Solid metal foam thermal interface material

Current measuring circuit

Method and system for thermal control of devices in an electronics...

Lifetime indicator system

Electronic component handling apparatus and electronic component te...

System for characterizing a transistor circuit

Test circuit of semiconductor apparatus and test system including t...

Integrated circuit pad failure detection

Coolant supplying apparatus, and temperature controlling apparatus...

Electronic component handling apparatus, electronic component testi...

Calibration arrangement and corresponding calibration method, and c...

Method and system for wafer-level testing

Method and system for thermal control of devices in electronics tester

Multiplexed thermal control wafer and coldplate

Over the air test chamber with optimized air circulation

Voltage tracking circuit and method of operating the same

Thermal head comprising a plurality of adapters for independent the...

Pogo pin cooling system and method and electronic device testing ap...

Estimation of life of switching devices

Work press assembly for test handler

Wafer test system and operating method thereof

Heating structure and wafer test device

Test system support component exchange system and method

Temperature compensation of optically isolated probe

Systems and methods for testing virtual functions of a device under...

Active thermal interposer device

Testing method and testing system

Thermal array with gimbal features and enhanced thermal performance

Multi-input multi-zone thermal control for device testing

System for scan mode exit and methods for scan mode exit

Patents Applicationslast 30 patents

APPARATUS FOR TESTING SEMICONDUCTOR DEVICE TEST

AGING PROFILE COMPONENTS

FORCED EARLY FAILURE FOR MEMORY DEVICE

SEMICONDUCTOR BURN-IN MACHINE COOLING SYSTEM

INSPECTION METHOD AND METHOD OF MANUFACTURING IMAGING ELEMENT

SEMICONDUCTOR BURN-IN BOARD

SEMICONDUCTOR TEST DEVICE AND METHOD OF MANUFACTURING THE SAME

DEVICE AND METHOD FOR CONTROLLING AIR PURGE EQUIPMENT

VARIABLE TEMPERATURE TEST SYSTEM AND OPERATION METHOD THEREOF

SEMICONDUCTOR TESTING APPARATUS AND METHOD FOR TESTING SEMICONDUCTO...

TEST ENVIRONMENT CONTROL SYSTEM

METHODS, SYSTEMS, ARTICLES OF MANUFACTURE, AND APPARATUS FOR IMPROV...

APPARATUS AND METHODS FOR THERMAL TESTING WITHIN ELECTRONIC COMPONE...

MULTI-INPUT MULTI-ZONE THERMAL CONTROL FOR DEVICE TESTING

MULTIPLE TILE TWO-LAYERED MOTHERBOARD TESTER

METHOD OF HAVING GOOD THERMAL ISOLATION IN WAFER TEST CASSETTE

SHELL FOR WAFER LEVEL BURN-IN (WLBI) CHIP TEST, METHOD FOR LOADING...

ACTIVE THERMAL INTERPOSER DEVICE

SYSTEM FOR TESTING AN INTEGRATED CIRCUIT OF A DEVICE AND ITS METHOD...

SYSTEM FOR TESTING AN INTEGRATED CIRCUIT OF A DEVICE AND ITS METHOD...

CIRCUIT FOR DETECTING DEFECTS

SEMICONDUCTOR PACKAGE

SEMICONDUCTOR WAFER HANDLING APPARATUS AND SEMICONDUCTOR WAFER TEST...

BUILT-IN SELF-TEST CIRCUIT AND TEMPERATURE MEASUREMENT CIRCUIT INCL...

THERMAL CONTROL WAFER WITH INTEGRATED HEATING-SENSING ELEMENTS

PREDICTION DEVICE, TEST SYSTEM, PREDICTION METHOD, AND PREDICTION P...

WAFER PROBE STATION AND METHOD FOR ESTABLISHING AN EVALUATION MODEL...

TEST TRAY SYSTEM AND RELATED METHOD

TEMPERATURE ADJUSTMENT SYSTEM AND ELECTRONIC COMPONENT TESTING APPA...

INSPECTION SYSTEM WITH THERMAL INTERFACE, AND ELECTRONIC COMPONENT...