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Processing for eliminating interfering spectra
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G01J2003/2843
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Parent Industries
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PHYSICS
G01
Measuring instruments
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MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT COLORIMETRY RADIATION PYROMETRY
Current Industry
G01J2003/2843
Processing for eliminating interfering spectra
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Patents Grants
last 30 patents
Information
Patent Grant
Method and system for element identification via optical emission s...
Patent number
12,140,478
Issue date
Nov 12, 2024
Agilent Technologies, Inc.
Daniel Finn McCarthy
G01 - MEASURING TESTING
Information
Patent Grant
Systems and methods for pH sensing in fluids
Patent number
12,007,324
Issue date
Jun 11, 2024
University of Maryland, College Park
Yang Tao
G01 - MEASURING TESTING
Information
Patent Grant
Systems and methods of imaging with multi-domain image sensor
Patent number
11,982,527
Issue date
May 14, 2024
QUALCOMM Incorporated
Yun-Chieh Chang
G01 - MEASURING TESTING
Information
Patent Grant
Temporal-spectral multiplexing sensor and method
Patent number
11,047,737
Issue date
Jun 29, 2021
Spectral Sciences, Inc.
Robert M. Shroll
G01 - MEASURING TESTING
Information
Patent Grant
Wavemeter system using a set of optical chips
Patent number
10,900,838
Issue date
Jan 26, 2021
Honeywell International Inc.
Hugh Podmore
G01 - MEASURING TESTING
Information
Patent Grant
Device and method for screening gemstones
Patent number
10,684,230
Issue date
Jun 16, 2020
Gemological Institute of America, Inc. (GIA)
Wuyi Wang
G01 - MEASURING TESTING
Information
Patent Grant
Signal-to-noise enhancement
Patent number
10,643,309
Issue date
May 5, 2020
Spectral Sciences, Inc.
Steven Adler-Golden
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Spectroscopic device and method for sample characterization
Patent number
10,444,142
Issue date
Oct 15, 2019
GREENTROPISM
Antoine Laborde
G01 - MEASURING TESTING
Information
Patent Grant
Raman spectrum detecting method for eliminating package interferenc...
Patent number
10,408,760
Issue date
Sep 10, 2019
Nuctech Company Limited
Hongqiu Wang
G01 - MEASURING TESTING
Information
Patent Grant
Measuring device and measuring method
Patent number
10,241,031
Issue date
Mar 26, 2019
Osaka University
Makoto Katsura
G01 - MEASURING TESTING
Information
Patent Grant
Signal processing method and apparatus
Patent number
5,379,238
Issue date
Jan 3, 1995
Edward W. Stark
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
On-line process control monitoring system
Patent number
5,131,746
Issue date
Jul 21, 1992
The United States of America as represented by the United States Department o...
Patrick E. O'Rourke
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
SPECTROSCOPIC ANALYSIS DEVICE AND INTERFERING LIGHT FORMATION MECHA...
Publication number
20240271999
Publication date
Aug 15, 2024
Tsubasa SAITO
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND SYSTEM FOR ELEMENT IDENTIFICATION VIA OPTICAL EMISSION S...
Publication number
20240053201
Publication date
Feb 15, 2024
Daniel Finn McCarthy
G01 - MEASURING TESTING
Information
Patent Application
SYSTEMS AND METHODS FOR PH SENSING IN FLUIDS
Publication number
20230008019
Publication date
Jan 12, 2023
University of Maryland, College Park
Yang TAO
G01 - MEASURING TESTING
Information
Patent Application
SYSTEMS AND METHODS FOR DIFFERENTIABLE PROGRAMMING FOR HYPERSPECTRA...
Publication number
20210396580
Publication date
Dec 23, 2021
ARIZONA BOARD OF REGENTS ON BEHALF OF ARIZONA STATE UNIVERSITY
John Janiczek
G01 - MEASURING TESTING
Information
Patent Application
Temporal-Spectral Multiplexing Sensor and Method
Publication number
20210123805
Publication date
Apr 29, 2021
Spectral Sciences, Inc.
Robert M. Shroll
G01 - MEASURING TESTING
Information
Patent Application
Signal-to-Noise Enhancement
Publication number
20190139196
Publication date
May 9, 2019
Spectral Science, Inc.
Steven Adler-Golden
G01 - MEASURING TESTING
Information
Patent Application
RAMAN SPECTRUM DETECTING METHOD FOR ELIMINATING PACKAGE INTERFERENC...
Publication number
20180164216
Publication date
Jun 14, 2018
Nuctech Company Limited
Hongqiu Wang
G01 - MEASURING TESTING
Information
Patent Application
MEASURING DEVICE AND MEASURING METHOD
Publication number
20170160190
Publication date
Jun 8, 2017
OSAKA UNIVERSITY
Makoto KATSURA
G02 - OPTICS